AD AT45DB321D_12

AT45DB321D
32Mb, 2.5V or 2.7V
DataFlash
DATASHEET
Features
● Single 2.5V - 3.6V or 2.7V - 3.6V supply
● RapidS™ serial interface: 66MHz maximum clock frequency
● SPI compatible modes 0 and 3
● User configurable page size
● 512 bytes per page
● 528 bytes per page
● Page size can be factory preconfigured for 512 bytes
● Page program operation
● Intelligent programming operation
● 8,192 pages (512/528 bytes/page) main memory
● Flexible erase options
●
●
●
●
Page erase (512 bytes)
Block erase (4KB)
Sector erase (64KB)
Chip erase (32Mb)
● Two SRAM data buffers (512/528 bytes)
● Allows receiving data while reprogramming the flash array
● Continuous read capability through entire array
● Ideal for code shadowing applications
● Low power dissipation
● 7mA active read current ,typical
● 25μA standby current, typical
● 15μA deep power down, typical
● Hardware and software data protection features
● Individual sector
● Sector lockdown for secure code and data storage
● Individual sector
● Security: 128-byte security register
● 64-byte user programmable space
● Unique 64-byte device identifier
● JEDEC standard manufacturer and device ID read
● 100,000 program/erase cycles per page, minimum
● Data retention: 20 years
● Industrial temperature range
● Green (Pb/halide-free/RoHS compliant) packaging options
3597R–DFLASH–11/2012
1.
Description
The AT45DB321D is a 2.5V or 2.7V, serial interface, sequential access flash memory ideally suited for a wide variety of digital
voice-, image-, program code-, and data-storage applications. The AT45DB321D supports the RapidS serial interface for
applications requiring very high speed operations. The RapidS serial interface is SPI compatible for frequencies up to 66MHz.
The 34,603,008-bits of memory are organized as 8,192 pages of 512 bytes or 528 bytes each. In addition to the main memory,
the AT45DB321D also contains two SRAM buffers of 512/528 bytes each. These buffers allow the receiving of data while a
page in the main memory is being reprogrammed, as well as the writing of a continuous data stream. EEPROM (electrically
erasable and programmable read-only memory) emulation (bit or byte alterability) is easily handled with a self-contained,
three-step read-modify-write operation. Unlike conventional flash memories, which are accessed randomly with multiple
address lines and a parallel interface, DataFlash® devices use a RapidS serial interface to sequentially access its data. The
simple sequential access dramatically reduces active pin count, facilitates hardware layout, increases system reliability,
minimizes switching noise, and reduces package size. The device is optimized for use in many commercial and industrial
applications where high density, low pin count, low voltage and low power are essential.
To allow for simple, in-system reprogrammability, the AT45DB321D does not require high input voltages for programming. The
device operates from a single power supply, 2.7V to 3.6V, for both the program and read operations. The AT45DB321D is
enabled through the chip select pin (CS) and accessed via a three-wire interface consisting of the serial input (SI), serial output
(SO), and serial clock (SCK) lines.
All programming and erase cycles are self timed.
Figure 1-1. Pin configurations and pinouts.
MLF(1) (VDFN)
Top View
SI
SCK
RESET
CS
Note:
1.
SOIC
Top View
SO
GND
6 VCC
5 WP
1
8
2
7
3
4
SI
SCK
RESET
CS
8
7
6
5
SO
GND
VCC
WP
The metal pad on the bottom of
the MLF package is floating.
This pad can be a “No Connect” or
connected to GND.
BGA Package Ball-out
Top View
1
TSOP: Type 1
Top View
2
3
4
5
NC
NC
NC
NC
NC
SCK
GND
VCC
NC
NC
CS
RDY/BSY WP
NC
NC
SO
SI
RESET
NC
NC
NC
NC
NC
NC
A
B
1
2
3
4
C
D
E
RDY/BUSY
RESET
WP
NC
NC
VCC
GND
NC
NC
NC
CS
SCK
SI
SO
Note:
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
TSOP package is not recommended for new designs.
Future die shrinks will support 8-pin packages only.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
2
Table 1-1.
Symbol
CS
Pin Configurations
Name and Function
Chip Select: Asserting the CS pin selects the device. When the CS pin is deasserted, the
device will be deselected and normally be placed in the standby mode (not deep powerdown mode), and the output pin (SO) will be in a high-impedance state. When the device
is deselected, data will not be accepted on the input pin (SI).
Asserted
State
Type
Low
Input
A high-to-low transition on the CS pin is required to start an operation, and a low-to-high
transition is required to end an operation. When ending an internally self-timed operation
such as a program or erase cycle, the device will not enter the standby mode until the
completion of the operation.
SCK
Serial Clock: This pin is used to provide a clock to the device, and is used to control the
flow of data to and from the device. Command, address, and input data present on the SI
pin are always latched on the rising edge of SCK, while output data on the SO pin are
always clocked out on the falling edge of SCK.
–
Input
SI
Serial Input: The SI pin is used to shift data into the device. The SI pin is used for all data
input, including command and address sequences. Data on the SI pin are always latched
on the rising edge of SCK.
–
Input
SO
Serial Output: The SO pin is used to shift data out from the device. Data on the SO pin
are always clocked out on the falling edge of SCK.
–
Output
WP
Write Protect: When the WP pin is asserted, all sectors specified for protection by the
sector protection register will be protected against program and erase operations,
regardless of whether the enable sector protection command has been issued or not. The
WP pin functions independently of the software controlled protection method. After the
WP pin goes low, the content of the sector protection register cannot be modified.
Low
Input
Low
Input
–
Output
–
Power
–
Ground
If a program or erase command is issued to the device while the WP pin is asserted, the
device will simply ignore the command and perform no operation. The device will return to
the idle state once the CS pin has been deasserted. The enable sector protection
command and sector lockdown command, however, will be recognized by the device
when the WP pin is asserted.
The WP pin is internally pulled high, and may be left floating if hardware controlled
protection will not be used. However, it is recommended that the WP pin also be
externally connected to VCC whenever possible.
RESET
Reset: A low state on the reset pin (RESET) will terminate the operation in progress and
reset the internal state machine to an idle state. The device will remain in the reset
condition as long as a low level is present on the RESET pin. Normal operation can
resume once the RESET pin is brought back to a high level.
The device incorporates an internal power-on reset circuit, and so there are no restrictions
on the RESET pin during power-on sequences. If this pin and feature are not utilized, it is
recommended that the RESET pin be driven high externally.
RDY/BUSY
Ready/Busy: This open drain output pin will be driven low when the device is busy in an
internally self-timed operation. This pin, which is normally in a high state (through
an external pull-up resistor), will be pulled low during programming/erase operations,
compare operations, and page-to-buffer transfers.
The busy status indicates that the flash memory array and one of the buffers cannot be
accessed; read and write operations to the other buffer can still be performed.
VCC
Device Power Supply: The VCC pin is used to supply the source voltage to the device.
Operations at invalid VCC voltages may produce spurious results and should not be
attempted.
GND
Ground: The ground reference for the power supply. GND should be connected to the
system ground.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
3
Figure 1-2. Block Diagram
Flash Memory Array
WP
Page (512-/528-bytes)
Buffer 1 (512-/528-bytes)
SCK
CS
RESET
VCC
GND
RDY/BUSY
I/O Interface
SI
SO
Memory Array
To provide optimal flexibility, the AT45DB321D memory array is divided into three levels of granularity comprising sectors,
blocks, and pages. The “Memory Architecture Diagram” illustrates the breakdown of each level, and details the number of
pages per sector and block. All program operations to the DataFlash device occur on a page-by-page basis. The erase
operations can be performed at the chip, sector, block, or page level.
Figure 2-1. Memory Architecture Diagram
Sector Architecture
BLOCK 0
8 Pages
PAGE 0
BLOCK 2
PAGE 1
BLOCK 0
BLOCK 1
SECTOR 1 = 128 Pages
65,536-/67,584-bytes
PAGE 6
PAGE 7
BLOCK 62
PAGE 8
BLOCK 63
BLOCK 64
SECTOR 2 = 128 Pages
65,536-/67,584-bytes
Page Architecture
BLOCK 65
PAGE 9
BLOCK 1
SECTOR 0b = 120 Pages
61,440-/63,360-bytes
SECTOR 0a
SECTOR 0b
SECTOR 0a = 8 Pages
4,096-/4,224-bytes
Block Architecture
SECTOR 1
2.
Buffer 2 (512-/528-bytes)
PAGE 14
PAGE 15
BLOCK 126
PAGE 16
BLOCK 127
PAGE 17
BLOCK 128
PAGE 18
SECTOR 62 = 128 Pages
65,536-/67,584-bytes
BLOCK 129
SECTOR 63 = 128 Pages
65,536-/67,586-bytes
BLOCK 1,022
BLOCK 1,023
Block = 4,096-/4,224-bytes
PAGE 8,190
PAGE 8,191
Page = 512-/528-bytes
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
4
3.
Device Operation
The device operation is controlled by instructions from the host processor. The list of instructions and their associated opcodes
are contained in Table 13-1 on page 24 through Table 13-7 on page 27. A valid instruction starts with the falling edge of CS,
followed by the appropriate 8-bit opcode and the desired buffer or main memory address location. While the CS pin is low,
toggling the SCK pin controls the loading of the opcode and the desired buffer or main memory address location through the SI
(serial input) pin. All instructions, addresses, and data are transferred with the most-significant bit (msb) first.
Buffer addressing for the standard DataFlash page size (528 bytes) is referenced in the datasheet using the terminology BFA9
- BFA0 to denote the ten address bits required to designate a byte address within a buffer. Main memory addressing is
referenced using the terminology PA12 - PA0 and BA9 - BA0, where PA12 - PA0 denotes the 13 address bits required to
designate a page address and BA9 - BA0 denotes the ten address bits required to designate a byte address within the page.
For a “power of two” binary page size (512 bytes), the buffer addressing is referenced in the datasheet using the conventional
terminology BFA8 - BFA0 to denote the nine address bits required to designate a byte address within a buffer. Main memory
addressing is referenced using the terminology A21 - A0, where A21 - A9 denotes the 13 address bits required to designate a
page address and A8 - A0 denotes the nine address bits required to designate a byte address within a page.
4.
Read Commands
By specifying the appropriate opcode, data can be read from the main memory or from either one of the two SRAM data buffers.
The DataFlash device supports RapidS protocols for Mode 0 and Mode 3. Please refer to Section 22., Detailed Bit-level Read
Waveform – RapidS Serial Interface Mode 0/Mode 3 diagrams in this datasheet for details on the clock cycle sequences for
each mode.
4.1
Continuous Array Read (Legacy Command: E8H): Up to 66MHz
By supplying an initial starting address for the main memory array, the continuous array read command can be utilized to
sequentially read a continuous stream of data from the device by simply providing a clock signal; no additional addressing
information or control signals need to be provided. The DataFlash device incorporates an internal address counter that will
automatically increment on every clock cycle, allowing one continuous read operation without the need of additional address
sequences. To perform a continuous read from the standard DataFlash page size (528 bytes), an opcode of E8H must be
clocked into the device, followed by three address bytes (which comprise the 24-bit page and byte address sequence) and four
“don’t care” bytes. The first 13 bits (PA12 - PA0) of the 23-bit address sequence specify which page of the main memory array
to read, and the last 10 bits (BA9 - BA0) of the 23-bit address sequence specify the starting byte address within the page. To
perform a continuous read from the binary page size (512-bytes), the opcode (E8H) must be clocked into the device followed by
three address bytes and four don’t care bytes. The first 13 bits (A21 - A9) of the 22-bit sequence specify which page of the main
memory array to read, and the last 9 bits (A8 - A0) of the 22-bit address sequence specify the starting byte address within the
page. The don’t care bytes that follow the address bytes are needed to initialize the read operation. Following the don’t care
bytes, additional clock pulses on the SCK pin will result in data being output on the SO (serial output) pin.
The CS pin must remain low during the loading of the opcode, the address bytes, the don’t care bytes, and the reading of data.
When the end of a page in main memory is reached during a continuous array read, the device will continue reading at the
beginning of the next page, with no delays incurred during the page boundary crossover (the crossover from the end of one
page to the beginning of the next page). When the last bit in the main memory array has been read, the device will continue
reading back at the beginning of the first page of memory. As with crossing over page boundaries, no delays will be incurred
when wrapping around from the end of the array to the beginning of the array.
A low-to-high transition on the CS pin will terminate the read operation and tri-state the output pin (SO). The maximum SCK
frequency allowable for the continuous array read is defined by the fCAR1 specification. The continuous array read bypasses
both data buffers and leaves the contents of the buffers unchanged.
4.2
Continuous Array Read (High Frequency Mode: 0BH): Up to 66MHz
This command can be used with the serial interface to read the main memory array sequentially in high-speed mode for any
clock frequency up to the maximum specified by fCAR1. To perform a continuous read array with the page size set to 528 bytes,
CS must first be asserted, and then a 0BH opcode must be clocked into the device, followed by three address bytes and a
dummy byte. The first 13 bits (PA12 - PA0) of the 23-bit address sequence specify which page of the main memory array to
read, and the last 10 bits (BA9 - BA0) of the 23-bit address sequence specify the starting byte address within the page. To
perform a continuous read with the page size set to 512 bytes, the 0BH opcode must be clocked into the device, followed by
three address bytes (A21 - A0) and a dummy byte. Following the dummy byte, additional clock pulses on the SCK pin will result
in data being output on the SO (serial output) pin.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
5
The CS pin must remain low during the loading of the opcode, the address bytes, and the reading of data. When the end of a
page in the main memory is reached during a continuous array read, the device will continue reading at the beginning of the
next page, with no delays incurred during the page boundary crossover (the crossover from the end of one page to the
beginning of the next page). When the last bit in the main memory array has been read, the device will continue reading back at
the beginning of the first page of memory. As with crossing over page boundaries, no delays will be incurred when wrapping
around from the end of the array to the beginning of the array. A low-to-high transition on the CS pin will terminate the read
operation and tri-state the output pin (SO). The maximum SCK frequency allowable for the continuous array read is defined by
the fCAR1 specification. The continuous array read bypasses both data buffers and leaves the contents of the buffers unchanged.
4.3
Continuous Array Read (Low Frequency Mode: 03H): Up to 33MHz
This command can be used with the serial interface to read the main memory array sequentially without a dummy byte up to the
maximum frequency specified by fCAR2. To perform a continuous read array with the page size set to 528 bytes, the CS must
first be asserted, and then a 03H opcode must be clocked into the device, followed by three address bytes (which comprise the
24-bit page and byte address sequence). The first 13 bits (PA12 - PA0) of the 23-bit address sequence specify which page of
the main memory array to read, and the last 10 bits (BA9 - BA0) of the 23-bit address sequence specify the starting byte
address within the page. To perform a continuous read with the page size set to 512 bytes, the 03H opcode must be clocked
into the device, followed by three address bytes (A21 - A0). Following the address bytes, additional clock pulses on the SCK pin
will result in data being output on the SO (serial output) pin.
The CS pin must remain low during the loading of the opcode, the address bytes, and the reading of data. When the end of a
page in the main memory is reached during a continuous array read, the device will continue reading at the beginning of the
next page with no delays incurred during the page boundary crossover (the crossover from the end of one page to the beginning
of the next page). When the last bit in the main memory array has been read, the device will continue reading back at the
beginning of the first page of memory. As with crossing over page boundaries, no delays will be incurred when wrapping around
from the end of the array to the beginning of the array. A low-to-high transition on the CS pin will terminate the read operation
and tri-state the output pin (SO). The continuous array read bypasses both data buffers and leaves the contents of the buffers
unchanged.
4.4
Main Memory Page Read
A main memory page read allows the user to read data directly from any one of the 8,192 pages in the main memory, bypassing
both of the data buffers and leaving the contents of the buffers unchanged. To start a page read from the standard DataFlash
page size (528 bytes), an opcode of D2H must be clocked into the device, followed by three address bytes (which comprise the
24-bit page and byte address sequence) and four don’t care bytes. The first 13 bits (PA12 - PA0) of the 23-bit address
sequence specify the page in main memory to be read, and the last 10 bits (BA9 - BA0) of the 23-bit address sequence specify
the starting byte address within that page. To start a page read from the binary page size (512 bytes), the D2H opcode must be
clocked into the device, followed by three address bytes and four don’t care bytes. The first 13 bits (A21 - A9) of the 22-bit
sequence specify which page of the main memory array to read, and the last 9 bits (A8 - A0) of the 22-bit address sequence
specify the starting byte address within the page. The don’t care bytes that follow the address bytes are sent to initialize the
read operation. Following the don’t care bytes, additional pulses on SCK result in data being output on the SO (serial output)
pin. The CS pin must remain low during the loading of the opcode, the address bytes, the don’t care bytes, and the reading of
data. When the end of a page in main memory is reached, the device will continue reading back at the beginning of the same
page. A low-to-high transition on the CS pin will terminate the read operation and tri-state the output pin (SO). The maximum
SCK frequency allowable for the main memory page read is defined by the fSCK specification. The main memory page read
bypasses both data buffers and leaves the contents of the buffers unchanged.
4.5
Buffer Read
The SRAM data buffers can be accessed independently of the main memory array, and utilizing the buffer read command
allows data to be sequentially read directly from the buffers. Four opcodes, D4H or D1H for buffer 1 and D6H or D3H for buffer
2, can be used for the buffer read command. The use of each opcode depends on the maximum SCK frequency that will be
used to read data from the buffer. The D4H and D6H opcodes can be used at any SCK frequency, up to the maximum specified
by fCAR1. The D1H and D3H opcodes can be used for lower frequency read operations, up to the maximum specified by fCAR2.
To perform a buffer read from the standard DataFlash buffer (528 bytes), the opcode must be clocked into the device, followed
by three address bytes comprised of 14 don’t care bits and 10 buffer address bits (BFA9 - BFA0). To perform a buffer read from
the binary buffer (512 bytes), the opcode must be clocked into the device, followed by three address bytes comprised of 15
don’t care bits and 9 buffer address bits (BFA8 - BFA0). Following the address bytes, one don’t care byte must be clocked in to
initialize the read operation. The CS pin must remain low during the loading of the opcode, the address bytes, the don’t care
byte, and the reading of data. When the end of a buffer is reached, the device will continue reading back at the beginning of the
buffer. A low-to-high transition on the CS pin will terminate the read operation and tri-state the output pin (SO).
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
6
5.
Program and Erase Commands
5.1
Buffer Write
Data can be clocked in from the input pin (SI) into either buffer 1 or buffer 2. To load data into the standard DataFlash buffer
(528 bytes), a 1-byte opcode, 84H for buffer 1 or 87H for buffer 2, must be clocked into the device, followed by three address
bytes comprised of 14 don’t care bits and 10 buffer address bits (BFA9 - BFA0). The 10 buffer address bits specify the first byte
in the buffer to be written. To load data into the binary buffers (512 bytes each), a 1-byte 84H opcode for buffer 1 or 87H opcode
for buffer 2 must be clocked into the device, followed by three address bytes comprised of 15 don’t care bits and 9 buffer
address bits (BFA8 - BFA0). The nine buffer address bits specify the first byte in the buffer to be written. After the last address
byte has been clocked into the device, data can then be clocked in on subsequent clock cycles. If the end of the data buffer is
reached, the device will wrap around back to the beginning of the buffer. Data will continue to be loaded into the buffer until a
low-to-high transition is detected on the CS pin.
5.2
Buffer to Main Memory Page Program with Built-in Erase
Data written into either buffer 1 or buffer 2 can be programmed into the main memory. A 1-byte opcode, 83H for buffer 1 or 86H
for buffer 2, must be clocked into the device. For the standard DataFlash page size (528 bytes), the opcode must be followed by
three address bytes consist of 1 don’t care bit, 13 page address bits (PA12 - PA0) that specify the page in the main memory to
be written, and 10 don’t care bits. To perform a buffer to main memory page program with built-in erase for the binary page size
(512 bytes), the 83H opcode for buffer 1 or 86H opcode for buffer 2 must be clocked into the device, followed by three address
bytes consisting of 2 don’t care bits, 13 page address bits (A21 - A9) that specify the page in the main memory to be written, and
9 don’t care bits. When a low-to-high transition occurs on the CS pin, the part will first erase the selected page in main memory
(the erased state is a logic one) and then program the data stored in the buffer into the specified page in main memory. The
erase and the programming of the page are internally self-timed, and should take place in a maximum time of tEP. During this
time, the status register and the RDY/BUSY pin will indicate that the part is busy.
5.3
Buffer to Main Memory Page Program without Built-in Erase
A previously-erased page within main memory can be programmed with the contents of either buffer 1 or buffer 2. A one-byte
opcode, 88H for buffer 1 or 89H for buffer 2, must be clocked into the device. For the standard DataFlash page size (528 bytes),
the opcode must be followed by three address bytes that consist of 1 don’t care bit, 13 page address bits (PA12 - PA0) that
specify the page in the main memory to be written, and 10 don’t care bits. To perform a buffer to main memory page program
without built-in erase for the binary page size (512 bytes), the 88H opcode for buffer 1 or 89H opcode for buffer 2 must be
clocked into the device, followed by three address bytes consisting of 2 don’t care bits, 13 page address bits (A21 - A9) that
specify the page in the main memory to be written, and 9 don’t care bits. When a low-to-high transition occurs on the CS pin, the
part will program the data stored in the buffer into the specified page in the main memory. It is necessary that the page in main
memory being programmed has been previously erased using one of the erase commands (page erase or block erase). The
programming of the page is internally self-timed, and should take place in a maximum time of tP. During this time, the status
register and the RDY/BUSY pin will indicate that the part is busy.
5.4
Page Erase
The page erase command can be used to individually erase any page in the main memory array, allowing the buffer to main
memory page program to be utilized at a later time. To perform a page erase in the standard DataFlash page size (528 bytes),
an opcode of 81H must be loaded into the device, followed by three address bytes comprised of 1 don’t care bit, 13 page
address bits (PA12 - PA0) that specify the page in the main memory to be erased, and 10 don’t care bits. To perform a page
erase in the binary page size (512 bytes), the 81H opcode must be loaded into the device, followed by three address bytes
consisting of 2 don’t care bits, 13 page address bits (A21 - A9) that specify the page in the main memory to be erased, and 9
don’t care bits. When a low-to-high transition occurs on the CS pin, the part will erase the selected page (the erased state is a
logical 1). The erase operation is internally self-timed, and should take place in a maximum time of tPE. During this time, the
status register and the RDY/BUSY pin will indicate that the part is busy.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
7
5.5
Block Erase
A block of eight pages can be erased at one time. This command is useful when large amounts of data have to be written into
the device. This will avoid using multiple page erase commands. To perform a block erase for the standard DataFlash page size
(528-bytes), an opcode of 50H must be loaded into the device, followed by three address bytes comprised of 1 don’t care bit,
10 page address bits (PA12-PA3), and 13 don’t care bits. The 10 page address bits are used to specify which block of eight
pages is to be erased. To perform a block erase for the binary page size (512 bytes), the 50H opcode must be loaded into the
device, followed by three address bytes consisting of 2 don’t care bits, 10 page address bits (A21 - A12), and 12 don’t care bits.
The 10 page address bits are used to specify which block of eight pages is to be erased. When a low-to-high transition occurs
on the CS pin, the part will erase the selected block of eight pages. The erase operation is internally self-timed, and should take
place in a maximum time of tBE. During this time, the status register and the RDY/BUSY pin will indicate that the part is busy.
Table 5-1.
5.6
Block Erase Addressing
PA12/
A21
PA11/
A20
PA10/
A19
PA9/
A18
PA8/
A17
PA7/
A16
PA6/
A15
PA5/
A14
PA4/
A13
PA3/
A12
PA2/
A11
PA1/
A10
PA0/
A9
Block
0
0
0
0
0
0
0
0
0
0
X
X
X
0
0
0
0
0
0
0
0
0
0
1
X
X
X
1
0
0
0
0
0
0
0
0
1
0
X
X
X
2
0
0
0
0
0
0
0
0
1
1
X
X
X
3
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
1
1
1
1
1
1
1
1
0
0
X
X
X
1020
1
1
1
1
1
1
1
1
0
1
X
X
X
1021
1
1
1
1
1
1
1
1
1
0
X
X
X
1022
1
1
1
1
1
1
1
1
1
1
X
X
X
1023
Sector Erase
The sector erase command can be used to individually erase any sector in the main memory. There are 64 sectors, and only
one sector can be erased at a time. To perform a sector 0a or sector 0b erase for the standard DataFlash page size (528 bytes),
an opcode of 7CH must be loaded into the device, followed by three address bytes comprised of 1 don’t care bit, 10 page
address bits (PA12 - PA3), and 13 don’t care bits. To perform a sector 1-63 erase, the 7CH opcode must be loaded into the
device, followed by three address bytes comprised of 1 don’t care bit, 6 page address bits (PA12 - PA7), and 17 don’t care bits.
To perform a sector 0a or sector 0b erase for the binary page size (512 bytes), an opcode of 7CH must be loaded into the
device, followed by three address bytes comprised of 2 don’t care bits, 10 page address bits (A21 - A12), and 12 don’t care bits.
To perform a sector 1-63 erase, the 7CH opcode must be loaded into the device, followed by three address bytes comprised of
2 don’t care bits, 6 page address bits (A21 - A16), and 16 don’t care bits. The page address bits are used to specify any valid
address location within the sector to be erased. When a low-to-high transition occurs on the CS pin, the part will erase the
selected sector. The erase operation is internally self-timed, and should take place in a maximum time of tSE. During this time,
the status register and the RDY/BUSY pin will indicate that the part is busy.
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Table 5-2.
5.7
Sector Erase Addressing
PA12/
A21
PA11/
A20
PA10/
A19
PA9/
A18
PA8/
A17
PA7/
A16
PA6/
A15
PA5/
A14
PA4/
A13
PA3/
A12
PA2/
A11
PA1/
A10
PA0/
A9
Sector
0
0
0
0
0
0
0
0
0
0
X
X
X
0a
0
0
0
0
0
0
0
0
0
1
X
X
X
0b
0
0
0
0
0
1
X
X
X
X
X
X
X
1
0
0
0
0
1
0
X
X
X
X
X
X
X
2
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
1
1
1
1
0
0
X
X
X
X
X
X
X
60
1
1
1
1
0
1
X
X
X
X
X
X
X
61
1
1
1
1
1
0
X
X
X
X
X
X
X
62
1
1
1
1
1
1
X
X
X
X
X
X
X
63
Chip Erase(1)
The entire main memory can be erased at one time by using the chip erase command.
To execute the chip erase command, a four-byte command sequence, C7H, 94H, 80H, and 9AH, must be clocked into the
device. Since the entire memory array is to be erased, no address bytes need to be clocked into the device, and any data
clocked in after the opcode will be ignored. After the last bit of the opcode sequence has been clocked in, the CS pin can be
deasserted to start the erase process. The erase operation is internally self-timed, and should take place in a time of tCE. During
this time, the status register will indicate that the device is busy.
The chip erase command will not affect sectors that are protected or locked down; the contents of those sectors will remain
unchanged. Only those sectors that are not protected or locked down will be erased.
Note:
1.
Refer to the errata regarding chip erase on page 51.
The WP pin can be asserted while the device is erasing, but protection will not be activated until the internal erase cycle
completes.
Table 5-3.
Chip Erase Command
Command
Byte 1
Byte 2
Byte 3
Byte 4
Chip erase
C7H
94H
80H
9AH
Figure 5-1. Chip Erase
CS
Opcode
Byte 1
SI
Opcode
Byte 2
Opcode
Byte 3
Opcode
Byte 4
Each transition
represents 8 bits
Note:
1.
Refer to the errata regarding chip erase on page 51.
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5.8
Main Memory Page Program through Buffer
This operation is a combination of the buffer write and buffer to main memory page program with built-in erase operations. Data
are first clocked into buffer 1 or buffer 2 from the input pin (SI), and then programmed into a specified page in the main memory.
To perform a main memory page program through buffer for the standard DataFlash page size (528 bytes), a one-byte opcode,
82H for buffer 1 or 85H for buffer 2, must first be clocked into the device, followed by three address bytes. The address bytes
are comprised of 1 don’t care bit, 13 page address bits, (PA12 - PA0) that select the page in the main memory where data is to
be written, and 10 buffer address bits (BFA9 - BFA0) that select the first byte in the buffer to be written. To perform a main
memory page program through buffer for the binary page size (512 bytes), the 82H opcode for buffer 1 or 85H opcode for buffer
2 must be clocked into the device, followed by three address bytes consisting of 2 don’t care bits, 13 page address bits (A21 A9) that specify the page in the main memory to be written, and 9 buffer address bits (BFA8 - BFA0) that select the first byte in
the buffer to be written. After all address bytes are clocked in, the part will take data from the input pins and store them in the
specified data buffer. If the end of the buffer is reached, the device will wrap around back to the beginning of the buffer. When
there is a low-to-high transition on the CS pin, the part will first erase the selected page in main memory to all ones, and then
program the data stored in the buffer into that memory page. Both the erase and the programming of the page are internally
self-timed, and should take place in a maximum time of tEP. During this time, the status register and the RDY/BUSY pin will
indicate that the part is busy.
6.
Sector Protection
Two protection methods, hardware and software controlled, are provided for protection against inadvertent or erroneous
program and erase cycles. The software controlled method relies on the use of software commands to enable and disable
sector protection, while the hardware controlled method employs the use of the write protect (WP) pin. The selection of which
sectors are to be protected or unprotected against program and erase operations is specified in the nonvolatile sector protection
register. The status of whether or not sector protection has been enabled or disabled by either the software or the hardware
controlled methods can be determined by checking the status register.
6.1
Software Sector Protection
6.1.1
Enable Sector Protection Command
Sectors specified for protection in the sector protection register can be protected from program and erase operations by issuing
the enable sector protection command. To enable sector protection using the software controlled method, the CS pin must first
be asserted, as it would be with any other command. Once the CS pin has been asserted, the appropriate four-byte command
sequence must be clocked in via the input pin (SI). After the last bit of the command sequence has been clocked in, the CS pin
must be deasserted, after which the sector protection will be enabled.
Table 6-1.
Enable Sector Protection Command
Command
Enable Sector Protection
Byte 1
Byte 2
Byte 3
Byte 4
3DH
2AH
7FH
A9H
Figure 6-1. Enable Sector Protection
CS
SI
Opcode
Byte 1
Opcode
Byte 2
Opcode
Byte 3
Opcode
Byte 4
Each transition
represents 8 bits
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6.1.2
Disable Sector Protection Command
To disable sector protection using the software controlled method, the CS pin must first be asserted, as it would be with any
other command. Once the CS pin has been asserted, the appropriate four-byte sequence for the disable sector protection
command must be clocked in via the input pin (SI). After the last bit of the command sequence has been clocked in, the CS pin
must be deasserted, after which the sector protection will be disabled. The WP pin must be in the deasserted state; otherwise,
the disable sector protection command will be ignored.
Table 6-2.
Disenable Sector Protection Command
Command
Disable sector protection
Byte 1
Byte 2
Byte 3
Byte 4
3DH
2AH
7FH
9AH
Figure 6-2. Disable Sector Protection
CS
SI
Opcode
Byte 1
Opcode
Byte 2
Opcode
Byte 3
Opcode
Byte 4
Each transition
represents 8 bits
6.1.3
Various Aspects About Software Controlled Protection
Software controlled protection is useful in applications in which the WP pin is not or cannot be controlled by a host processor. In
such instances, the WP pin may be left floating (the WP pin is internally pulled high), and sector protection can be controlled
using the enable sector protection and disable sector protection commands.
If the device is power cycled, then the software controlled protection will be disabled. Once the device is powered up, the enable
sector protection command should be reissued if sector protection is desired and if the WP pin is not used.
7.
Hardware Controlled Protection
Sectors specified in the sector protection register for protection, and the sector protection register itself, can be protected from
program and erase operations by asserting the WP pin and keeping the pin in its asserted state. The sector protection register
and any sector specified for protection cannot be erased or reprogrammed as long as the WP pin is asserted. In order to modify
the sector protection register, the WP pin must be deasserted. If the WP pin is permanently connected to GND, then the content
of the sector protection register cannot be changed. If the WP pin is deasserted or permanently connected to VCC, then the
content of the sector protection register can be modified.
The WP pin will override the software controlled protection method, but only for protecting the sectors. For example, if the
sectors were not previously protected by the enable sector protection command, then simply asserting the WP pin would enable
sector protection within the maximum specified tWPE time. However, when the WP pin is deasserted, sector protection would no
longer be enabled (after the maximum specified tWPD time) as long as the enable sector protection command was not issued
while the WP pin was asserted. If the enable sector protection command was issued before or while the WP pin was asserted,
then simply deasserting the WP pin would not disable sector protection. In this case, the disable sector protection command
would need to be issued while the WP pin is deasserted to disable sector protection. The disable sector protection command is
also ignored whenever the WP pin is asserted.
A noise filter is incorporated to help protect against spurious noise that may inadvertently assert or deassert the WP pin.
The table below details the sector protection status for various scenarios of the WP pin, the enable sector protection command,
and the disable sector protection command.
Figure 7-1. WP Pin and Protection Status
1
2
3
WP
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Table 7-1.
WP Pin and Protection Status
Enable Sector Protection
Command
Disable Sector
Protection Command
Sector
Protection
Status
Sector
Protection
Register
High
Command not issued previously
–
Issue command
X
Issue command
–
Disabled
Disabled
Enabled
Read/write
Read/write
Read/write
2
Low
X
X
Enabled
Read only
3
High
Command issued during period 1 or 2
Not issued yet
issue command
–
Enabled
Disabled
Enabled
Read/write
Read/write
Read/write
Time
Period
WP Pin
1
–
Issue command
7.1
Sector Protection Register
The nonvolatile sector protection register specifies which sectors are to be protected or unprotected with either the software or
hardware controlled protection method. The sector protection register contains 64 bytes of data, in which byte locations 0
through 63 contain values that specify whether sectors 0 through 63 will be protected or unprotected. The sector protection
register is user modifiable, and must first be erased before it can be reprogrammed. Table 7-3 illustrates the format of the sector
protection register.
Table 7-2.
Sector Protection Register
Sector Number
0 (0a, 0b)
Protected
00H
Sector 0 (0a, 0b)
0a
0b
(Pages 0-7)
(Pages 8-127)
Bit 7, 6
Bit 5, 4
Bit 3, 2
Bit 1, 0
Data
Value
Sectors 0a, 0b unprotected
00
00
xx
xx
0xH
Protect sector 0a (pages 0-7)
11
00
xx
xx
CxH
00
11
xx
xx
3xH
11
11
xx
xx
FxH
Protect sector 0b (pages 8-127)
Protect sectors 0a (pages 0-7), 0b (pages 8-127)
Note:
7.1.1
FFH
See Table 7-3
Unprotected
Table 7-3.
1 to 63
1.
(1)
®
The default value for bytes 0 through 63 when shipped from Adesto is 00H.
x = don’t care.
Erase Sector Protection Register Command
In order to modify and change the value of the sector protection register, it must first be erased using the erase sector protection
register command.
To erase the sector protection register, the CS pin must first be asserted, as it would be with any other command. Once the CS
pin has been asserted, the appropriate four-byte opcode sequence must be clocked into the device via the SI pin. The four-byte
opcode sequence must start with 3DH, and be followed by 2AH, 7FH, and CFH. After the last bit of the opcode sequence has
been clocked in, the CS pin must be deasserted to initiate the internally self-timed erase cycle. The erasing of the sector
protection register should take place in a maximum time of tPE, during which time the status register will indicate that the device
is busy. If the device is powered down before the completion of the erase cycle, then the contents of the sector protection
register cannot be guaranteed.
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The sector protection register can be erased with sector protection enabled or disabled. Since the erased state (FFH) of each
byte in the sector protection register is used to indicate that a sector is specified for protection, leaving sector protection enabled
during the erasing of the register allows the protection scheme to be more effective in the prevention of accidental programming
or erasing of the device. If for some reason an erroneous program or erase command is sent to the device immediately after
erasing the sector protection register and before the register can be reprogrammed, then the erroneous program or erase
command will not be processed because all sectors will be protected.
Table 7-4.
Erase Sector Protection Register Command
Command
Byte 1
Byte 2
Byte 3
Byte 4
3DH
2AH
7FH
CFH
Erase sector protection register
Figure 7-2. Erase Sector Protection Register
CS
Opcode
byte 1
SI
Opcode
byte 2
Opcode
byte 3
Opcode
byte 4
Each transition
represents 8 bits
7.1.2
Program Sector Protection Register Command
Once the sector protection register has been erased, it can be reprogrammed using the program sector protection register
command.
To program the sector protection register, the CS pin must first be asserted, and then the appropriate four-byte opcode
sequence must be clocked into the device via the SI pin. The four-byte opcode sequence must start with 3DH, and be followed
by 2AH, 7FH, and FCH. After the last bit of the opcode sequence has been clocked into the device, the data for the contents of
the sector protection register must be clocked in. As described in Section 7.1, the sector protection register contains 64 bytes of
data, and so 64 bytes must be clocked into the device. The first byte of data corresponds to sector 0, the second byte
corresponds to sector 1, and so on, with the last byte of data corresponding to sector 63.
After the last data byte has been clocked in, the CS pin must be deasserted to initiate the internally self-timed program cycle.
The programming of the sector protection register should take place in a maximum time of tP, during which the status register
will indicate that the device is busy. If the device is powered down during the program cycle, the contents of the sector
protection register cannot be guaranteed.
If the proper number of data bytes is not clocked in before the CS pin is deasserted, then the protection status of the sectors
corresponding to the bytes not clocked in can not be guaranteed. For example, if only the first two bytes are clocked in instead
of the complete 62 bytes, then the protection status of the last 62 sectors cannot be guaranteed. Furthermore, if more than 64
bytes of data are clocked into the device, then the data will wrap back around to the beginning of the register. For instance, if 65
bytes of data are clocked in, then the 65th byte will be stored at byte location 0 of the sector protection register.
If a value other than 00H or FFH is clocked into a byte location of the sector protection register, then the protection status of the
sector corresponding to that byte location cannot be guaranteed. For example, if a value of 17H is clocked into byte location 2 of
the sector protection register, then the protection status of sector 2 cannot be guaranteed.
The sector protection register can be reprogrammed while sector protection is enabled or disabled. Being able to reprogram the
sector protection register with sector protection enabled allows the user to temporarily disable the sector protection of an
individual sector rather than disabling sector protection completely.
The program sector protection register command utilizes the internal SRAM buffer 1 for processing. Therefore, the contents of
buffer 1 will be altered from its previous state when this command is issued.
Table 7-5.
Program Sector Protection Register Command
Command
Program sector protection register
Byte 1
Byte 2
Byte 3
Byte 4
3DH
2AH
7FH
FCH
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Figure 7-3. Program Sector Protection Register
CS
Opcode
byte 1
SI
Opcode
byte 2
Opcode
byte 3
Opcode
byte 4
Data byte
n
Data byte
n+1
Data byte
n + 63
Each transition
represents 8 bits
7.1.3
Read Sector Protection Register Command
To read the sector protection register, the CS pin must first be asserted. Once the CS pin has been asserted, an opcode of 32H
and three dummy bytes must be clocked in via the SI pin. After the last bit of the opcode and dummy bytes has been clocked in,
any additional clock pulses on the SCK pins will result in data for the content of the sector protection register being output on the
SO pin. The first byte corresponds to sector 0 (0a, 0b), the second byte corresponds to sector 1, and the last byte (byte 64)
corresponds to sector 63. Once the last byte of the sector protection register has been clocked out, any additional clock pulses
will result in undefined data being output on the SO pin. The CS pin must be deasserted to terminate the read sector protection
register operation and put the output into a high-impedance state.
Table 7-6.
Read Sector Protection Register Command
Command
Read sector protection register
Note:
Byte 1
Byte 2
Byte 3
Byte 4
32H
xxH
xxH
xxH
xx = Dummy byte
Figure 7-4. Read Sector Protection Register
CS
SI
Opcode
X
X
X
Data byte
n
SO
Data byte
n+1
Data byte
n + 63
Each transition
represents 8 bits
7.1.4
Various Aspects About the Sector Protection Register
The sector protection register is subject to a limit of 10,000 erase/program cycles. Users are encouraged to carefully evaluate
the number of times the sector protection register will be modified during the course of the application’s life cycle. If the
application requires the sector protection register to be modified more than the specified limit of 10,000 cycles because the
application needs to temporarily unprotect individual sectors (sector protection remains enabled while the sector protection
register is reprogrammed), then the application will need to limit this practice. Instead, a combination of temporarily unprotecting
individual sectors, along with disabling sector protection completely, will need to be implemented by the application to ensure
that the limit of 10,000 cycles is not exceeded.
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8.
Security Features
8.1
Sector Lockdown
The device incorporates a sector lockdown mechanism that allows each individual sector to be permanently locked so that it
becomes read only. This is useful for applications that require the ability to permanently protect a number of sectors against
malicious attempts at altering program code or security information. Once a sector is locked down, it can never be erased or
programmed, and it can never be unlocked.
To issue the sector lockdown command, the CS pin must first be asserted, as it would be for any other command. Once the CS
pin has been asserted, the appropriate four-byte opcode sequence must be clocked into the device in the correct order. The
four-byte opcode sequence must start with 3DH, and be followed by 2AH, 7FH, and 30H. After the last byte of the command
sequence has been clocked in, three address bytes specifying any address within the sector to be locked down must be clocked
into the device. After the last address bit has been clocked in, the CS pin must be deasserted to initiate the internally self-timed
lockdown sequence.
The lockdown sequence should take place in a maximum time of tP, during which the status register will indicate that the device
is busy. If the device is powered down before the completion of the lockdown sequence, then the lockdown status of the sector
cannot be guaranteed. In this case, it is recommended that the user read the sector lockdown register to determine the status of
the appropriate sector lockdown bits or bytes and reissue the sector lockdown command, if necessary.
Table 8-1.
Sector Lockdown
Command
Sector lockdown
Byte 1
Byte 2
Byte 3
Byte 4
3DH
2AH
7FH
30H
Figure 8-1. Sector Lockdown
CS
Opcode
byte 1
SI
Opcode
byte 2
Opcode
byte 3
Opcode
byte 4
Address
bytes
Address
bytes
Address
bytes
Each transition
represents 8 bits
8.1.1
Sector Lockdown Register
The nonvolatile sector lockdown register contains 64 bytes of data, as shown below:
Table 8-2.
Sector Lockdown Register
Sector Number
0 (0a, 0b)
Locked
FFH
See Table 8-3
Unlocked
Table 8-3.
1 to 63
00H
Sector 0 (0a, 0b)
0a
(Pages 0-7)
Bit 7, 6
0b
(Pages 8-127)
Bit 5, 4
Bit 3, 2
Bit 1, 0
Data
Value
Sectors 0a, 0b unlocked
00
00
00
00
00H
Sector 0a locked (pages 0-7)
11
00
00
00
C0H
Sector 0b locked (pages 8-127)
00
11
00
00
30H
Sectors 0a, 0b locked (pages 0-127)
11
11
00
00
F0H
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8.1.2
Reading the Sector Lockdown Register
The sector lockdown register can be read to determine which sectors in the memory array are permanently locked down. To
read the sector lockdown register, the CS pin must first be asserted. Once the CS pin has been asserted, an opcode of 35H and
three dummy bytes must be clocked into the device via the SI pin. After the last bit of the opcode and dummy bytes has been
clocked in, the data for the content of the sector lockdown register will be clocked out on the SO pin. The first byte corresponds
to sector 0 (0a, 0b) the second byte corresponds to sector 1, and the last byte (byte 16) corresponds to sector 15. After the last
byte of the sector lockdown register has been read, additional pulses on the SCK pin will simply result in undefined data being
output on the SO pin.
Deasserting the CS pin will terminate the read sector lockdown register operation and put the SO pin into a high-impedance
state.
Table 8-4 details the values read from the sector lockdown register.
Table 8-4.
Sector Lockdown Register
Command
Read sector lockdown register
Note:
Byte 1
Byte 2
Byte 3
Byte 4
35H
xxH
xxH
xxH
xx = Dummy byte.
Figure 8-2. Read Sector Lockdown Register
CS
SI
Opcode
X
X
X
Data byte
n
SO
Data byte
n + 63
Data byte
n+1
Each transition
represents 8 bits
8.2
Security Register
The device contains a specialized security register that can be used for purposes such as unique device serialization or locked
key storage. The register is comprised of a total of 128 bytes that are divided into two portions. The first 64 bytes (byte locations
0 through 63) of the security register are allocated as a one-time user programmable space. Once these 64 bytes have been
programmed, they cannot be reprogrammed. The remaining 64 bytes of the register (byte locations 64 through 127) are factory
programmed by Adesto, and contain a unique value for each device. The factory programmed data are fixed and cannot be
changed.
Table 8-5.
Security Register
Security Register Byte Number
0
Data type
1
···
62
One-time user programmable
63
64
65
···
126
127
Adesto factory programmed
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8.2.1
Programming the Security Register
The user programmable portion of the security register does not need to be erased before it is programmed.
To program the security register, the CS pin must first be asserted, and then the appropriate four-byte opcode sequence must
be clocked into the device in the correct order. The four-byte opcode sequence must start with 9BH, and be followed by 00H,
00H, and 00H. After the last bit of the opcode sequence has been clocked into the device, the data for the content of the 64-byte
user programmable portion of the security register must be clocked in.
After the last data byte has been clocked in, the CS pin must be deasserted to initiate the internally self-timed program cycle.
The programming of the security register should take place in a maximum time of tP, during which the status register will indicate
that the device is busy. If the device is powered down during the program cycle, then the contents of the 64-byte user
programmable portion of the security register cannot be guaranteed.
If the full 64 bytes of data are not clocked in before the CS pin is deasserted, then the values of the byte locations not clocked in
cannot be guaranteed. For example, if only the first two bytes are clocked in instead of the complete 64 bytes, then the
remaining 62 bytes of the user programmable portion of the security register cannot be guaranteed. Furthermore, if more than
64 bytes of data are clocked into the device, then the data will wrap back around to the beginning of the register. For instance, if
65 bytes of data are clocked in, then the 65th byte will be stored at byte location 0 of the security register.
The user programmable portion of the security register can be programmed only once. Therefore, it is not possible to program
only the first two bytes of the register and then program the remaining 62 bytes at a later time.
The program security register command utilizes the internal SRAM buffer 1 for processing. Therefore, the contents of buffer 1
will be altered from its previous state when this command is issued.
Figure 8-3. Program Security Register
CS
SI
Opcode
byte 1
Opcode
byte 2
Opcode
byte 3
Opcode
byte 4
Data byte
n
Data byte
n+1
Data byte
n+x
Each transition
represents 8 bits
8.2.2
Reading the Security Register
The security register can be read by first asserting the CS pin and then clocking in an opcode of 77H, followed by three dummy
bytes. After the last don't care bit has been clocked in, the content of the security register can be clocked out on the SO pin.
After the last byte of the security register has been read, additional pulses on the SCK pin will simply result in undefined data
being output on the SO pin.
Deasserting the CS pin will terminate the read security register operation and put the SO pin into a high-impedance state.
Figure 8-4. Read Security Register
CS
SI
Opcode
X
X
X
Data byte
n
SO
Data byte
n+1
Data byte
n+x
Each transition
represents 8 bits
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9.
Additional Commands
9.1
Main Memory Page to Buffer Transfer
A page of data can be transferred from the main memory to either buffer 1 or buffer 2. To start the operation for the standard
DataFlash page size (528 bytes), a one-byte opcode, 53H for buffer 1 or 55H for buffer 2, must be clocked into the device,
followed by three address bytes comprised of 1 don’t care bit, 13 page address bits (PA12 - PA0) that specify the page in main
memory that is to be transferred, and 10 don’t care bits. To perform a main memory page to buffer transfer for the binary page
size (512 bytes), the 53H opcode for buffer 1 or 55H opcode for buffer 2 must be clocked into the device, followed by three
address bytes consisting of 2 don’t care bits, 13 page address bits (A21 - A9) that specify the page in the main memory that is
to be transferred, and 9 don’t care bits. The CS pin must be low while toggling the SCK pin to load the opcode and the address
bytes from the input pin (SI). The transfer of page of data from the main memory to the buffer will begin when the CS pin
transitions from a low to a high state. During the transfer of a page of data (tXFR), the status register can be read or the
RDY/BUSY can be monitored to determine whether the transfer has been completed.
9.2
Main Memory Page to Buffer Compare
A page of data in the main memory can be compared to the data in buffer 1 or buffer 2. To initiate the operation for a standard
DataFlash page size (528 bytes), a one-byte opcode, 60H for buffer 1 or 61H for buffer 2, must be clocked into the device,
followed by three address bytes consisting of 1 don’t care bit, 13 page address bits (PA12 - PA0) that specify the page in the
main memory that is to be compared to the buffer, and 10 don’t care bits. To start a main memory page to buffer compare for a
binary page size (512 bytes), the 60H opcode for buffer 1 or 61H opcode for buffer 2 must be clocked into the device, followed
by three address bytes consisting of 2 don’t care bits, 13 page address bits (A21 - A9) that specify the page in the main memory
that is to be compared to the buffer, and 9 don’t care bits. The CS pin must be low while toggling the SCK pin to load the opcode
and the address bytes from the input pin (SI). On the low-to-high transition of the CS pin, the data bytes in the selected main
memory page will be compared with the data bytes in buffer 1 or buffer 2. During this time (tCOMP), the status register and the
RDY/BUSY pin will indicate that the part is busy. On completion of the compare operation, bit 6 of the status register is updated
with the result of the compare.
9.3
Auto Page Rewrite
This mode is needed only when multiple bytes within a page or multiple pages of data are modified in a random fashion within a
sector. This mode is a combination of two operations:
1. Main memory page to buffer transfer, and
2.
Buffer to main memory page program, with built-in erase.
A page of data is first transferred from the main memory to buffer 1 or buffer 2, and then the same data (from buffer 1 or buffer
2) are programmed back into their original page of main memory. To start the rewrite operation for the standard DataFlash page
size (528 bytes), a one-byte opcode, 58H for buffer 1 or 59H for buffer 2, must be clocked into the device, followed by three
address bytes comprised of 1 don’t care bit, 13 page address bits (PA12-PA0) that specify the page in main memory to be
rewritten, and 10 don’t care bits. To initiate an auto page rewrite for a binary page size (512 bytes), the 58H opcode for buffer 1
or 59H opcode for buffer 2 must be clocked into the device, followed by three address bytes consisting of 2 don’t care bits, 13
page address bits (A21 - A9) that specify the page in the main memory that is to be written, and 9 don’t care bits. When a lowto-high transition occurs on the CS pin, the part will first transfer data from the page in main memory to a buffer and then
program the data from the buffer back into same page of main memory. The operation is internally self-timed, and should take
place in a maximum time of tEP. During this time, the status register and the RDY/BUSY pin will indicate that the part is busy.
If a sector is programmed or reprogrammed sequentially page by page, then the programming algorithm shown in Figure 23-1,
page 41 is recommended. Otherwise, if multiple bytes in a page or several pages are programmed randomly in a sector, then
the programming algorithm shown in Figure 23-2, page 42 is recommended. Each page within a sector must be
updated/rewritten at least once within every 20,000 cumulative page erase/program operations in that sector. Please contact
Adesto for availability of devices that are specified to exceed the 20,000 cycle cumulative limit.
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9.4
Status Register Read
The status register can be used to determine the device’s ready/busy status, page size, a main memory page to buffer compare
operation result, the sector protection status, or the device density. The status register can be read at any time, including during
an internally self-timed program or erase operation. To read the status register, the CS pin must be asserted and the opcode of
D7H must be loaded into the device. After the opcode is clocked in, the one-byte status register will be clocked out on the output
pin (SO), starting with the next clock cycle. The data in the status register, starting with the msb (bit 7), will be clocked out on the
SO pin during the next eight clock cycles. After the one byte of the status register has been clocked out, the sequence will
repeat itself (as long as CS remains low and SCK is being toggled). The data in the status register is constantly updated, and so
each repeating sequence will output new data.
Ready/busy status is indicated using bit 7 of the status register. If bit 7 is a one, then the device is not busy and is ready to
accept the next command. If bit 7 is a zero, then the device is in a busy state. Since the data in the status register is constantly
updated, the user must toggle the SCK pin to check the ready/busy status.
There are several operations that can cause the device to be in a busy state:
● Main memory page to buffer transfer
●
●
●
●
●
Main memory page to buffer compare
Buffer to main memory page program
Main memory page program through buffer
Page erase, block erase, sector erase, and chip erase
Auto page rewrite
The result of the most recent main memory page to buffer compare operation is indicated using bit 6 of the status register. If bit
6 is a zero, then the data in the main memory page matches the data in the buffer. If bit 6 is a one, then at least one bit of the
data in the main memory page does not match the data in the buffer.
Bit 1 of the status register is used to provide information to the user whether sector protection has been enabled or disabled,
either by the software-controlled or hardware-controlled method. A logic one indicates that sector protection has been enabled,
and logic zero indicates that sector protection has been disabled.
Bit 0 o the status register indicates whether the page size of the main memory array is configured for a “power of two” binary
page size (512 bytes) or a standard DataFlash page size (528 bytes). If bit 0 is a one, then the page size is set to 512 bytes. If
bit 0 is a zero, then the page size is set to 528 bytes.
The device density is indicated using bits 5, 4, 3, and 2 of the status register. For the AT45DB321D, the four bits are 1101. The
decimal value of these four binary bits does not equate to the device density — the four bits represent a combinational code
relating to differing densities of DataFlash devices. The device density is not the same as the density code indicated in the
JEDEC device ID information. The device density is provided only for backward compatibility.
Table 9-1.
Status Register Format
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
RDY/BUSY
COMP
1
1
0
1
Protect
Page size
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10.
Deep Power-down
After an initial power-up, the device will default to standby mode. The deep power-down command allows the device to enter
into the lowest power-consumption mode. To enter the deep power-down mode, the CS pin must first be asserted. Once the CS
pin has been asserted, an opcode of B9H must be clocked in via the input pin (SI). After the last bit of the command has been
clocked in, the CS pin must be deasserted to initiate deep power-down operation. After the CS pin is deasserted, the device will
enter the deep power-down mode within a maximum time of tEDPD. Once the device has entered the deep power-down mode, all
instructions are ignored, except for the resume from deep power-down commands.
Table 10-1. Deep Power-down
Command
Opcode
Deep power-down
B9H
Figure 10-1. Deep Power-down
CS
SI
Opcode
Each transition
represents 8 bits
10.1
Resume from Deep Power-down
The resume from deep power-down command takes the device out of the deep power-down mode and returns it to the normal
standby mode. To resume from deep power-down mode, the CS pin must first be asserted, and an opcode of ABH must be
clocked in via the input pin (SI). After the last bit of the command has been clocked in, the CS pin must be deasserted to
terminate the deep power-down mode. After the CS pin is deasserted, the device will return to the normal standby mode within
a maximum time of tRDPD. The CS pin must remain high during the tRDPD time before the device can receive any commands.
After resuming from deep power-down, the device will return to the normal standby mode.
Table 10-2. Resume from Deep Power-down
Command
Opcode
Resume from deep power-down
ABH
Figure 10-2. Resume from Deep Power-Down
CS
SI
Opcode
Each transition
represents 8 bits
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11.
“Power of Two” Binary Page Size Option
“Power of two” binary page size configuration register is a user programmable, nonvolatile register that allows the page size of
the main memory to be configured for binary page size (512 bytes) or standard DataFlash page size (528 bytes). The power of
two page size is a one-time programmable configuration register, and once the device is configured for power of two page size,
it cannot be reconfigured again. The devices are initially shipped with the page size set to 528 bytes. The user has the option of
ordering binary page size (512-byte) devices from the factory. For details, please refer to Section 24., “Ordering Information” on
page 43.
For the binary power of two page size to become effective, the following steps must be followed:
1. Program the one-time programmable configuration resister using the opcode sequence: 3DH, 2AH, 80H, and A6H
(see Section 11.1).
2.
Power cycle the device (i.e., power down and power up again).
3.
The page for the binary page size can now be programmed.
If the above steps to set the page size prior to page programming are not followed, incorrect data during a read operation may
be encountered.
11.1
Programming the Configuration Register
To program the configuration register for power of two binary page size, the CS pin must first be asserted, as it would be with
any other command. Once the CS pin has been asserted, the appropriate four-byte opcode sequence must be clocked into the
device in the correct order. The four-byte opcode sequence must start with 3DH, followed by 2AH, 80H, and A6H. After the last
bit of the opcode sequence has been clocked in, the CS pin must be deasserted to initiate the internally self-timed program
cycle. The programming of the configuration register should take place in a maximum time of tP, during which time the status
register will indicate that the device is busy. The device must be power cycled after the completion of the program cycle to set
the power of two page size. If the device is powered-down before the completion of the program cycle, then setting the
configuration register cannot be guaranteed. However, the user should check bit 0 of the status register to see whether the
page size was configured for binary page size or not. If not, the command can be issued again.
Table 11-1. Programming the Configuration Register
Command
Power of two page size
Byte 1
Byte 2
Byte 3
Byte 4
3DH
2AH
80H
A6H
Figure 11-1. Erase Sector Protection Register
CS
SI
Opcode
byte 1
Opcode
byte 2
Opcode
byte 3
Opcode
byte 4
Each transition
represents 8 bits
12.
Manufacturer and Device ID Read
Identification information can be read from the device to enable systems to electronically query and identify the device while it is
in the system. The identification method and the command opcode comply with the JEDEC standard for “Manufacturer and
Device ID Read Methodology for SPI Compatible Serial Interface Memory Devices.” The type of information that can be read
from the device includes the JEDEC-defined manufacturer ID, the vendor-specific device ID, and the vendor-specific extended
device information.
To read the identification information, the CS pin must first be asserted, and then the opcode of 9FH must be clocked into the
device. After the opcode has been clocked in, the device will begin outputting the identification data on the SO pin during the
subsequent clock cycles. The first byte to be output will be the manufacturer ID, followed by two bytes of device ID information.
The fourth byte output will be the extended device information string length, which will be 00H to indicate that no extended
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device information follows. As indicated in the JEDEC standard, reading the extended device information string length and any
subsequent data is optional.
Deasserting the CS pin will terminate the manufacturer and device ID read operation and put the SO pin into a high-impedance
state. The CS pin can be deasserted at any time, and does not require that a full byte of data be read.
12.1
Manufacturer and Device ID Information
12.1.1 Byte 1 – Manufacturer ID
JEDEC Assigned Code
Hex
Value
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
1FH
0
0
0
1
1
1
1
1
Manufacturer ID
1FH = Adesto
12.1.2 Byte 2 – Device ID (Part 1)
Family Code
Density Code
Hex
Value
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
Family code
27H
0
0
1
0
0
1
1
1
Density code
001 = DataFlash
00111 = 32Mb
12.1.3 Byte 3 – Device ID (Part 2)
MLC Code
Product Version Code
Hex
Value
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
00H
0
0
0
0
0
0
0
1
MLC code
000 = 1-bit/cell technology
Product version
00001 = Second version
Byte count
00H = 0 bytes of Information
12.1.4 Byte 4 – Extended Device Information String Length
Byte Count
Hex
Value
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
00H
0
0
0
0
0
0
0
0
CS
SI
9FH
Opcode
SO
Each transition
represents 8 bits
Note:
1FH
27H
00H
01H
Data
Data
Manufacturer ID
Byte 1
Device ID
Byte 2
Device ID
Byte 3
Extended
device
information
string length
Extended
device
information
Byte x
Extended
device
information
Byte x + 1
This information would only be output
if the extended device information string length
value was something other than 00H
Based on JEDEC publication 106 (JEP106), manufacturer ID data can be comprised of any number of bytes.
Some manufacturers may have manufacturer ID codes that are two, three, or even four bytes long, with the first
byte(s) in the sequence being 7FH. A system should detect code 7FH as a “continuation code” and continue to
read manufacturer ID bytes. The first non-7FH byte would signify the last byte of manufacturer ID data. For Adesto
(and some other manufacturers), the manufacturer ID data is comprised of only one byte.
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12.2
Operation Mode Summary
The commands described previously can be grouped into four different categories to make clearer which commands can be
executed at what times.
Group A commands consist of:
1. Main memory page read
2.
Continuous array read
3.
Read sector protection register
4.
Read sector lockdown register
5.
Read security register
Group B commands consist of:
1. Page erase
2.
Block erase
3.
Sector erase
4.
Chip erase
5.
Main memory page to buffer 1 (or 2) transfer
6.
Main memory page to buffer 1 (or 2) compare
7.
Buffer 1 (or 2) to main memory page program, with built-in erase
8.
Buffer 1 (or 2) to main memory page program, without built-in erase
9.
Main memory page program through buffer 1 (or 2)
10. Auto page rewrite
Group C commands consist of:
1. Buffer 1 (or 2) read
2.
Buffer 1 (or 2) write
3.
Status register read
4.
Manufacturer and device ID read
Group D commands consist of:
1. Erase sector protection register
2.
Program sector protection register
3.
Sector lockdown
4.
Program security register
If a group A command is in progress (not fully completed), then another command from group A, B, C, or D should not be
started. However, during the internally self-timed portion of group B commands, any command in group C can be executed. The
group B commands using buffer 1 should use group C commands using buffer 2, and vice versa. Finally, during the internally
self-timed portion of a group D command, only the status register read command should be executed.
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13.
Command Tables
Table 13-1. Read Commands
Command
Opcode
Main memory page read
D2H
Continuous array read (legacy command)
E8H
Continuous array read (low frequency)
03H
Continuous array read (high frequency)
0BH
Buffer 1 read (low frequency)
D1H
Buffer 2 read (low frequency)
D3H
Buffer 1 read
D4H
Buffer 2 read
D6H
Table 13-2. Program and Erase Commands
Command
Opcode
Buffer 1 write
84H
Buffer 2 write
87H
Buffer 1 to main memory page program, with built-in erase
83H
Buffer 2 to main memory page program, with built-in erase
86H
Buffer 1 to main memory page program, without built-in erase
88H
Buffer 2 to main memory page program, without built-in erase
89H
Page erase
81H
Block erase
50H
Sector erase
7CH
Chip erase
C7H, 94H, 80H, 9AH
Main memory page program through buffer 1
82H
Main memory page program through buffer 2
85H
Table 13-3. Protection and Security Commands
Command
Opcode
Enable sector protection
3DH + 2AH + 7FH + A9H
Disable sector protection
3DH + 2AH + 7FH + 9AH
Erase sector protection register
3DH + 2AH + 7FH + CFH
Program sector protection register
3DH + 2AH + 7FH + FCH
Read sector protection register
Sector lockdown
Read sector lockdown register
Program security register
Read security register
32H
3DH + 2AH + 7FH + 30H
35H
9BH + 00H + 00H + 00H
77H
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Table 13-4. Additional Commands
Command
Opcode
Main memory page to buffer 1 transfer
53H
Main memory page to buffer 2 transfer
55H
Main memory page to buffer 1 compare
60H
Main memory page to buffer 2 compare
61H
Auto page rewrite through buffer 1
58H
Auto page rewrite through buffer 2
59H
Deep power-down
B9H
Resume from deep power-down
ABH
Status register read
D7H
Manufacturer and device ID read
9FH
Table 13-5. Legacy Commands(1)
Command
Opcode
Buffer 1 read
54H
Buffer 2 read
56H
Main memory page read
52H
Continuous array read
68H
Status register read
57H
Note:
1.
These legacy commands are not recommended for new designs.
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Table 13-6. Detailed Bit-level Addressing Sequence for Binary Page Size (512 Bytes)
Address Byte
Address Byte
x
x A A A A A A A A A A A A A A A A A A A A A A
1
50h
0
1
0
1
0
0
0
0
x
x A A A A A A A A A A x
x
x
x
x
x
x
x
x
x
N/A
53h
0
1
0
1
0
0
1
1
x
x A A A A A A A A A A A A A x
x
x
x
x
x
x
x
x
N/A
55h
0
1
0
1
0
1
0
1
x
x A A A A A A A A A A A A A x
x
x
x
x
x
x
x
x
N/A
58h
0
1
0
1
1
0
0
0
x
x A A A A A A A A A A A A A x
x
x
x
x
x
x
x
x
N/A
59h
0
1
0
1
1
0
0
1
x
x A A A A A A A A A A A A A x
x
x
x
x
x
x
x
x
N/A
60h
0
1
1
0
0
0
0
0
x
x A A A A A A A A A A A A A x
x
x
x
x
x
x
x
x
N/A
61h
0
1
1
0
0
0
0
1
x
x A A A A A A A A A A A A A x
x
x
x
x
x
x
x
x
N/A
77h
0
1
1
1
0
1
1
1
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
N/A
7Ch
0
1
1
1
1
1
0
0
x
x A A A A A A x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
N/A
81h
1
0
0
0
0
0
0
1
x
x A A A A A A A A A A A A A x
x
x
x
x
x
x
x
x
N/A
82h
1
0
0
0
0
0
1
0
x
x A A A A A A A A A A A A A A A A A A A A A A
N/A
83h
1
0
0
0
0
0
1
1
x
x A A A A A A A A A A A A A x
x
N/A
84h
1
0
0
0
0
1
0
0
x
x
x A A A A A A A A A
N/A
85h
1
0
0
0
0
1
0
1
x
x A A A A A A A A A A A A A A A A A A A A A A
N/A
86h
1
0
0
0
0
1
1
0
x
x A A A A A A A A A A A A A x
x
N/A
87h
1
0
0
0
0
1
1
1
x
x
x A A A A A A A A A
N/A
88h
1
0
0
0
1
0
0
0
x
x A A A A A A A A A A A A A x
x
x
x
x
x
x
x
x
N/A
89h
1
0
0
0
1
0
0
1
x
x A A A A A A A A A A A A A x
x
x
x
x
x
x
x
x
N/A
9Fh
1
0
0
1
1
1
1
1
N/A
N/A
N/A
N/A
B9h
1
0
1
1
1
0
0
1
N/A
N/A
N/A
N/A
ABh
1
0
1
0
1
0
1
1
N/A
N/A
N/A
N/A
D1h
1
1
0
1
0
0
0
1
x
x
D2h
1
1
0
1
0
0
1
0
x
x A A A A A A A A A A A A A A A A A A A A A A
D3h
1
1
0
1
0
0
1
1
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x A A A A A A A A A
N/A
D4h
1
1
0
1
0
1
0
0
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x A A A A A A A A A
1
D6h
1
1
0
1
0
1
1
0
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x A A A A A A A A A
1
D7h
1
1
0
1
0
1
1
1
E8h
1
1
1
0
1
0
0
0
Note:
x
x
x
x
x
x
x
x
x
x
x
x
N/A
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
N/A
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
A0
1
A1
1
A2
0
A3
1
A4
0
A5
0
A6
0
A7
0
A8
0Bh
A9
N/A
A10
x A A A A A A A A A A A A A A A A A A A A A A
A11
x
A12
1
A13
1
A14
0
A15
0
A16
0
A17
0
A18
0
A19
0
Opcode
A20
03h
Opcode
A21
Reserved
Address Byte
Reserved
Page Size = 512-bytes
Additional
Don’t Care
Bytes
x A A A A A A A A A
N/A
x A A A A A A A A A A A A A A A A A A A A A A
N/A
4
N/A
4
x = Don’t care.
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Table 13-7. Detailed Bit-level Addressing Sequence for Standard DataFlash Page Size (528 Bytes)
BA0
BA1
BA2
BA3
BA4
BA5
BA6
BA7
BA8
Address Byte
BA9
PA0
PA1
PA2
PA3
PA4
PA6
PA5
Address Byte
PA7
PA8
PA10
PA9
PA11
Opcode
PA12
Opcode
Address Byte
Reserved
Page Size = 528-bytes
Additional
Don’t Care
Bytes
03h
0
0
0
0
0
0
1
1
x P P P P P P P P P P P P P B B B B B B B B B B
N/A
0Bh
0
0
0
0
1
0
1
1
x P P P P P P P P P P P P P B B B B B B B B B B
1
50h
0
1
0
1
0
0
0
0
x P P P P P P P P P P x
x
x
x
x
x
x
x
x
x
x
N/A
53h
0
1
0
1
0
0
1
1
x P P P P P P P P P P P P P x
x
x
x
x
x
x
x
x
x
N/A
55h
0
1
0
1
0
1
0
1
x P P P P P P P P P P P P P x
x
x
x
x
x
x
x
x
x
N/A
58h
0
1
0
1
1
0
0
0
x P P P P P P P P P P P P P x
x
x
x
x
x
x
x
x
x
N/A
59h
0
1
0
1
1
0
0
1
x P P P P P P P P P P P P P x
x
x
x
x
x
x
x
x
x
N/A
60h
0
1
1
0
0
0
0
0
x P P P P P P P P P P P P P x
x
x
x
x
x
x
x
x
x
N/A
61h
0
1
1
0
0
0
0
1
x P P P P P P P P P P P P P x
x
x
x
x
x
x
x
x
x
N/A
77h
0
1
1
1
0
1
1
1
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
N/A
7Ch
0
1
1
1
1
1
0
0
x P P P P P P x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
N/A
81h
1
0
0
0
0
0
0
1
x P P P P P P P P P P P P P x
x
x
x
x
x
x
x
x
x
N/A
82h
1
0
0
0
0
0
1
0
x P P P P P P P P P P P P P B B B B B B B B B B
N/A
83h
1
0
0
0
0
0
1
1
x P P P P P P P P P P P P P x
x
N/A
84h
1
0
0
0
0
1
0
0
x
x B B B B B B B B B B
N/A
85h
1
0
0
0
0
1
0
1
x P P P P P P P P P P P P P B B B B B B B B B B
N/A
86h
1
0
0
0
0
1
1
0
x P P P P P P P P P P P P P x
x
N/A
87h
1
0
0
0
0
1
1
1
x
x B B B B B B B B B B
N/A
88h
1
0
0
0
1
0
0
0
x P P P P P P P P P P P P P x
x
x
x
x
x
x
x
x
x
N/A
89h
1
0
0
0
1
0
0
1
x P P P P P P P P P P P P P x
x
x
x
x
x
x
x
x
x
N/A
9Fh
1
0
0
1
1
1
1
1
N/A
N/A
N/A
N/A
B9h
1
0
1
1
1
0
0
1
N/A
N/A
N/A
N/A
ABh
1
0
1
0
1
0
1
1
N/A
N/A
N/A
N/A
D1h
1
1
0
1
0
0
0
1
x
D2h
1
1
0
1
0
0
1
0
x P P P P P P P P P P P P P B B B B B B B B B B
D3h
1
1
0
1
0
0
0
1
x
x
x
x
x
x
x
x
x
x
x
x
x
x B B B B B B B B B B
N/A
D4h
1
1
0
1
0
1
0
0
x
x
x
x
x
x
x
x
x
x
x
x
x
x B B B B B B B B B B
1
D6h
1
1
0
1
0
1
1
0
x
x
x
x
x
x
x
x
x
x
x
x
x
x B B B B B B B B B B
1
D7h
1
1
0
1
0
1
1
1
E8h
1
1
1
0
1
0
0
0
Note:
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
N/A
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
N/A
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x B B B B B B B B B B
N/A
x P P P P P P P P P P P P P B B B B B B B B B B
N/A
4
N/A
4
P = Page address bit.
B = Byte/buffer address bit.
x = Don’t care.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
27
14.
Power-on/Reset State
When power is first applied to the device, or when recovering from a reset condition, the device will default to Mode 3. In
addition, the output pin (SO) will be in a high-impedance state, and a high-to-low transition on the CS pin will be required to start
a valid instruction. The mode (Mode 3 or Mode 0) will be automatically selected on every falling edge of CS by sampling the
inactive clock state.
14.1
Initial Power-up/Reset Timing Restrictions
At power-up, the device must not be selected until the supply voltage reaches VCC (min.) and a further delay of tVCSL. During
power-up, the internal power-on reset circuitry keeps the device in reset mode until VCC rises above the power-on reset
threshold value (VPOR). At this time, all operations are disabled and the device does not respond to any commands. After powerup is applied and VCC is at the minimum operating voltage, VCC (min.), the tVCSL delay is required before the device can be
selected in order to perform a read operation.
Similarly, the tPUW delay is required after VCC rises above the power-on reset threshold value (VPOR) before the device can
perform a write (program or erase) operation. After initial power-up, the device will default to standby mode.
Table 14-1. Initial Power-up/Reset Timing Restrictions
15.
Symbol
Parameter
tVCSL
VCC (min.) to chip select low
tPUW
Power-up device delay before write allowed
VPOR
Power-on reset voltage
Min
Typ
Max
Unit
70
1.5
μs
20
ms
2.5
V
System Considerations
The RapidS serial interface is controlled by the SCK clock, SI serial input, and CS chip select pins. These signals must rise and
fall monotonically and be free from noise. Excessive noise or ringing on these pins can be misinterpreted as multiple edges and
cause improper operation of the device. The PC board traces must be kept to a minimum distance or appropriately terminated
to ensure proper operation. If necessary, decoupling capacitors can be added on these pins to provide filtering against noise
glitches.
As system complexity continues to increase, voltage regulation is becoming more important. A key element of any voltage
regulation scheme is its current sourcing capability. Like all flash memories, the peak current for a DataFlash device occurs
during the programming and erase operation. The regulator needs to supply this peak current requirement. An under-specified
regulator can cause current starvation. Besides increasing system noise, current starvation during programming or erase can
lead to improper operation and possible data corruption.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
28
16.
Electrical Specifications
Temperature under bias . . . . . . . . -55C to +125C
*Notice:
Storage temperature . . . . . . . . . . . -65C to +150C
All input voltages (except VCC but including NC pins)
with respect to ground . . . . . . . . . . . -0.6V to +6.25V
All output voltages
with respect to ground . . . . . . . . -0.6V to VCC + 0.6V
Stresses beyond those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. The
"Absolute Maximum Ratings" are stress ratings only, and
functional operation of the device at these or any other
conditions beyond those indicated in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability. Voltage Extremes referenced in the "Absolute
Maximum Ratings" are intended to accommodate short
duration undershoot/overshoot conditions and does not imply
or guarantee functional device operation at these levels for any
extended period of time.
Table 16-1. DC and AC Operating Range
Operating temperature (case)
VCC power supply
AT45DB321D (2.5V Version)
AT45DB321D
-40°C to 85°C
-40C to 85C
2.5V to 3.6V
2.7V to 3.6V
Table 16-2. DC Characteristics
Symbol
Parameter
Condition
Min
Typ
Max
Unit
IDP
Deep power-down current
CS, RESET, WP = VIH,
all inputs at CMOS levels
15
25
μA
ISB
Standby current
CS, RESET, WP = VIH,
all inputs at CMOS levels
25
50
μA
f = 20MHz; IOUT = 0mA;
VCC = 3.6V
7
10
mA
f = 33MHz; IOUT = 0mA;
VCC = 3.6V
8
12
mA
f = 50MHz; IOUT = 0mA;
VCC = 3.6V
10
14
mA
f = 66MHz; IOUT = 0mA;
VCC = 3.6V
11
15
mA
12
17
mA
ICC1
(1)
Active current, read operation
ICC2
Active current, program/erase
operation
VCC = 3.6V
ILI
Input load current
VIN = CMOS levels
1
μA
ILO
Output leakage current
VI/O = CMOS levels
1
μA
VIL
Input low voltage
VCC × 0.3
V
VIH
Input high voltage
VOL
Output low voltage
IOL = 1.6mA; VCC = 2.7V
VOH
Output high voltage
IOH = -100μA
Notes:
VCC × 0.7
V
0.4
VCC - 0.2V
V
V
1.
ICC1 during a buffer read is 20mA, maximum, @ 20MHz.
2.
All inputs (SI, SCK, CS#, WP#, and RESET#) are guaranteed by design to be 5V tolerant.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
29
Table 16-3. AC Characteristics – RapidS / Serial Interface
AT45DB321D
(2.5V Version)
Symbol
Parameter
Min
Typ
AT45DB321D
Max
Min
Typ
Max
Unit
fSCK
SCK frequency
50
66
MHz
fCAR1
SCK frequency for continuous array read
50
66
MHz
fCAR2
SCK frequency for continuous array read
(Low frequency)
33
33
MHz
tWH
SCK high time
6.8
6.8
ns
tWL
SCK low time
6.8
6.8
ns
tSCKR(1)
SCK rise time, peak-to-peak (slew rate)
0.1
0.1
V/ns
tSCKF(1)
SCK fall time, peak-to-peak (slew rate)
0.1
0.1
V/ns
tCS
Minimum CS high time
50
50
ns
tCSS
CS setup time
5
5
ns
tCSH
CS hold time
5
5
ns
tCSB
CS high to RDY/BUSY low
tSU
Data in setup time
2
2
ns
tH
Data in hold time
3
3
ns
tHO
Output hold time
0
0
ns
tDIS
Output disable time
tV
Output valid
tWPE
100
27
100
35
35
ns
8
6
ns
WP low to protection enabled
1
1
μs
tWPD
WP high to protection disabled
1
1
μs
tEDPD
CS high to deep power-down mode
3
3
μs
tRDPD
CS high to standby mode
35
35
μs
tXFR
Page to buffer transfer time
300
300
μs
tcomp
Page to buffer compare time
300
300
μs
tEP
Page erase and programming time
(512-/528-bytes)
17
40
17
40
ms
tP
Page programming time (512/528 bytes)
3
6
3
6
ms
tPE
Page erase time (512/528 bytes)
15
35
15
35
ms
tBE
Block erase time (4,096/4,224 bytes)
45
100
45
100
ms
tSE
Sector erase time (131,072/135,168 bytes)
1.6
5
1.6
5
s
tCE
Chip erase time
TBD
TBD
TBD
TBD
s
tRST
RESET pulse width
tREC
RESET recovery time
10
27
ns
10
1
μs
1
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
μs
30
17.
Input Test Waveforms and Measurement Levels
AC
Driving
Levels
2.4V
AC
Measurement
Level
1.5V
0.45V
tR, tF < 2ns (10% to 90%)
18.
Output Test Load
Device
under
test
30pF
19.
AC Waveforms
Six different timing waveforms are shown on page 31. Waveform 1 shows the SCK signal being low when CS makes a high-tolow transition, and waveform 2 shows the SCK signal being high when CS makes a high-to-low transition. In both cases, output
SO becomes valid while the SCK signal is still low (SCK low time is specified as tWL). Timing waveforms 1 and 2 conform to
RapidS serial interface, but for frequencies up to 66MHz. Waveforms 1 and 2 are compatible with SPI Mode 0 and SPI Mode 3,
respectively.
Waveform 3 and waveform 4 illustrate general timing diagram for RapidS serial interface. These are similar to waveform 1 and
waveform 2, except that output SO is not restricted to become valid during the tWL period. These timing waveforms are valid
over the full frequency range (maximum frequency = 66MHz) of the RapidS serial case.
Table 19-1. Waveform 1 – SPI Mode 0 Compatible (for frequencies up to 66MHz)
tCS
CS
tWH
tCSS
tWL
tCSH
SCK
tHO
tV
SO
High impedance
tSU
SI
Valid out
tDIS
High impedance
tH
Valid in
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
31
Table 19-2. Waveform 2 – SPI Mode 3 Compatible (for frequencies up to 66MHz)
tCS
CS
tCSS
tWL
tWH
tCSH
SCK
tV
SO
tHO
High Z
tDIS
High impedance
Valid out
tSU
tH
Valid in
SI
Table 19-3. Waveform 3 – RapidS Mode 0 (FMAX = 66MHz)
tCS
CS
tWH
tCSS
tWL
tCSH
SCK
tHO
tV
SO
High impedance
Valid out
tSU
SI
tDIS
High impedance
tH
Valid in
Table 19-4. Waveform 4 – RapidS Mode 3 (FMAX = 66MHz)
tCS
CS
tCSS
tWL
tWH
tCSH
SCK
tV
SO
tHO
High Z
Valid out
tSU
SI
tDIS
High impedance
tH
Valid in
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
32
19.1
Utilizing the RapidS Function
To take advantage of the RapidS function's ability to operate at higher clock frequencies, a full clock cycle must be used to
transmit data back and forth across the serial bus. The DataFlash device is designed to always clock its data out on the falling
edge of the SCK signal and clock data in on the rising edge of SCK.
For full clock cycle operation to be achieved when the DataFlash device is clocking data out on the falling edge of SCK, the host
controller should wait until the next falling edge of SCK to latch the data in. Similarly, the host controller should clock its data out
on the rising edge of SCK in order to give the DataFlash device a full clock cycle to latch the incoming data in on the next rising
edge of SCK.
Figure 19-1. RapidS Mode
Slave CS
1
8
2
3
4
5
6
1
8
7
2
3
4
5
6
1
7
SCK
B
A
MOSI
E
C
D
MSB
LSB
BYTE-MOSI
H
G
I
F
MISO
MSB
LSB
BYTE-SO
MOSI = Master Out, Slave In
MISO = Master In, Slave Out
The Master is the host controller and the Slave is the DataFlash
The Master always clocks data out on the rising edge of SCK and always clocks data in on the falling edge of SCK.
The Slave always clocks data out on the falling edge of SCK and always clocks data in on the rising edge of SCK.
A.
B.
C.
D.
E.
F.
G.
H.
I.
Master clocks out first bit of BYTE-MOSI on the rising edge of SCK
Slave clocks in first bit of BYTE-MOSI on the next rising edge of SCK
Master clocks out second bit of BYTE-MOSI on the same rising edge of SCK
Last bit of BYTE-MOSI is clocked out from the Master
Last bit of BYTE-MOSI is clocked into the slave
Slave clocks out first bit of BYTE-SO
Master clocks in first bit of BYTE-SO
Slave clocks out second bit of BYTE-SO
Master clocks in last bit of BYTE-SO
Figure 19-2. Reset Timing
CS
tREC
tCSS
SCK
tRST
RESET
SO (OUTPUT)
High impedance
High impedance
SI (INPUT)
Note:
The CS signal should be in the high state before the RESET signal is deasserted.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
33
Figure 19-3. Command Sequence for Read/Write Operations for a 512-Byte Page Size
(Except Status Register Read, Manufacturer, and Device ID Read)
SI (INPUT)
CMD
XX
MSB
8-bits
8-bits
8-bits
XXXXX XXXXXXXXX
Don’t care
bits
Page address
(A21 - A9)
XXXX XXXX
LSB
Byte/Buffer address
(A8 - A0/BFA8 - BFA0)
Figure 19-4. Command Sequence for Read/Write Operations for a 528-Byte Page Size
(Except Status Register Read, Manufacturer, and Device ID Read)
CMD
SI (INPUT)
8-bits
8-bits
8-bits
X X X XX X X X X X X X X X X X
MSB
1 Don’t care Page address
bit
(PA12 - PA0)
20.
XXXX XXXX
LSB
Byte/Buffer address
(BA9 - BA0/BFA9 - BFA0)
Write Operations
The following block diagram and waveforms illustrate the various write sequences available.
Figure 20-1. Block Diagram
Flash Memory Array
Page (512-/528-bytes)
Buffer 1 to
Main Memory
Page Program
Buffer 2 to
Main Memory
Page Program
Buffer 1 (512-/528-bytes)
Buffer 2 (512-/528-bytes)
Buffer 2
WRITE
Buffer 1
WRITE
I/O Interface
SI
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
34
Figure 20-2. Buffer Write
Completes writing into selected buffer
CS
Binary Page Size
15 don't care + BFA8-BFA0
SI (INPUT)
CMD
X
X···X, BFA9-8
BFA7-0
n
n+1
Last byte
Figure 20-3. Buffer to Main Memory Page Program (Data from Buffer Programmed into Flash Page)
Starts self-timed erase/program operation
CS
Binary Page Size
A21-A9 + 9 don't care bits
SI (INPUT)
CMD
PA12-6
Each transition
represents 8 bits
21.
PA5-0, XX
XXXX XX
n = 1st byte read
n+1 = 2nd byte read
Read Operations
The following block diagram and waveforms illustrate the various read sequences available.
Figure 21-1. Block Diagram
Flash Memory Array
Page (512-/528-bytes)
Main Memory
Page to
Buffer 2
Main Memory
Page to
Buffer 1
Buffer 1 (512-/528-bytes)
Buffer 2 (512-/528-bytes)
Buffer 1
Read
Main Memory
Page Read
Buffer 2
Read
I/O Interface
SO
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
35
Figure 21-2. Main Memory Page Read
CS
Address for Binary Page Size
A15-A8
A21-A16
A7-A0
SI (INPUT)
CMD
PA12-6
PA5-0, BA9-8
BA7-0
X
X
4 Dummy bytes
SO (OUTPUT)
n
n+1
Figure 21-3. Main Memory Page to Buffer Transfer (Data from Flash Page Read into Buffer)
Starts reading page data into buffer
CS
Binary Page Size
A21-a9 + 9 Don't care bits
SI (INPUT)
CMD
PA12-6
PA5-0, XX
XXXX XXXX
SO (OUTPUT)
Figure 21-4. Buffer Read
CS
Binary Page Size
15 Don't care + Bfa8-bfa0
SI (INPUT)
CMD
X
X..X, BFA9-8
BFA7- 0
X
No dummy byte (opcodes D1H and D3H)
1 dummy byte (opcodes D4H and D6H)
SO (OUTPUT)
n
n+1
Each transition
represents 8 bits
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
36
22.
Detailed Bit-level Read Waveform –
RapidS Serial Interface Mode 0/Mode 3
Figure 22-1. Continuous Array Read (Legacy Opcode E8H)
CS
0
1
2
3
4
5
6
7
8
9
10 11 12
29 30 31 32 33 34
62 63 64 65 66 67 68 69 70 71 72
SCK
OPCODE
SI
1
1
1
0
1
Address bits
0
0
0
MSB
A
A
A
A
A
A
32 Don't care bits
A
A
A
MSB
X
X
X
X
X
X
MSB
Data byte 1
SO
High-impedance
D
D
D
D
D
D
D
D
MSB
D
D
MSB
Bit 0 of
Page N+1
Bit 4095/4223
of Page N
Figure 22-2. Continuous Array Read (Opcode 0BH)
CS
0
1
2
3
4
5
6
7
8
9
29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48
10 11 12
SCK
OPCODE
SI
0
0
0
0
1
Address bits a21 - a0
0
1
1
MSB
A
A
A
A
A
A
Don't care
A
A
A
MSB
X
X
X
X
X
X
X
X
MSB
Data byte 1
SO
High-impedance
D
D
D
MSB
D
D
D
D
D
D
D
MSB
Figure 22-3. Continuous Array Read (Low Frequency: Opcode 03H)
CS
0
1
2
3
4
5
6
7
8
9
10 11 12
29 30 31 32 33 34 35 36 37 38 39 40
SCK
OPCODE
SI
0
0
0
0
0
MSB
Address bits a21-a0
0
1
1
A
A
A
A
A
A
A
A
A
MSB
Data byte 1
SO
High-impedance
D
MSB
D
D
D
D
D
D
D
D
D
MSB
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
37
Figure 22-4. Main Memory Page Read (Opcode: D2H)
CS
0
1
2
3
4
5
6
7
8
9
10 11 12
29 30 31 32 33 34
62 63 64 65 66 67 68 69 70 71 72
SCK
OPCODE
SI
1
1
0
1
0
Address bits
0
1
A
0
MSB
A
A
A
A
A
32 don't care bits
A
A
A
MSB
X
X
X
X
X
X
MSB
Data byte 1
SO
High-impedance
D
D
D
D
D
D
D
D
MSB
D
D
MSB
Figure 22-5. Buffer Read (Opcode D4H or D6H)
CS
0
1
2
3
4
5
6
7
8
9
10 11 12
29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48
SCK
Address bits
Binary page size = 15 don't care + BFA8-BFA0
Standard dataflash page size =
14 don't care + BFA9-BFA0
OPCODE
SI
1
1
0
1
0
1
0
0
MSB
X
X
X
X
X
X
A
A
Don't care
A
MSB
X
X
X
X
X
X
X
X
MSB
Data byte 1
SO
High-impedance
D
D
D
MSB
D
D
D
D
D
D
D
MSB
Figure 22-6. Buffer Read (Low Frequency: Opcode D1H or D3H)
CS
0
1
2
3
4
5
6
7
8
9
10 11 12
29 30 31 32 33 34 35 36 37 38 39 40
SCK
Address bits
Binary page size = 15 don't care + BFA8-BFA0
Standard Dataflash page size =
14 don't care + BFA9-BFA0
OPCODE
SI
1
1
0
1
0
MSB
0
0
1
X
X
X
X
X
X
A
A
A
MSB
Data byte 1
SO
High-impedance
D
MSB
D
D
D
D
D
D
D
D
D
MSB
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
38
Figure 22-7. Read Sector Protection Register (Opcode 32H)
CS
0
1
2
3
4
5
6
7
8
9
10 11 12
29 30 31 32 33 34 35 36 37 38 39 40
SCK
OPCODE
SI
0
0
1
1
0
Don't care
0
1
0
MSB
X
X
X
X
X
X
X
X
X
MSB
Data byte 1
SO
High-impedance
D
D
D
D
D
D
D
D
MSB
D
MSB
Figure 22-8. Read Sector Lockdown Register (Opcode 35H)
CS
0
1
2
3
4
5
6
7
8
9
10 11 12
29 30 31 32 33 34 35 36 37 38 39 40
SCK
OPCODE
SI
0
0
1
1
0
Don't care
1
0
1
MSB
X
X
X
X
X
X
X
X
X
MSB
Data byte 1
SO
High-impedance
D
D
D
D
D
D
D
D
MSB
D
MSB
Figure 22-9. Read Security Register (Opcode 77H)
CS
0
1
2
3
4
5
6
7
8
9
10 11 12
29 30 31 32 33 34 35 36 37 38 39 40
SCK
OPCODE
SI
0
1
1
1
0
MSB
Don't care
1
1
1
X
X
X
X
X
X
X
X
X
MSB
Data byte 1
SO
High-impedance
D
MSB
D
D
D
D
D
D
D
D
MSB
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
39
Figure 22-10.Status Register Read (Opcode D7H)
CS
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
SCK
OPCODE
SI
1
1
0
1
0
1
1
1
MSB
Status register data
SO
High-impedance
D
D
D
D
D
D
D
Status register data
D
MSB
D
D
D
D
D
D
D
MSB
D
D
D
MSB
Figure 22-11.Manufacturer and Device Read (Opcode 9FH)
CS
0
6
7
8
14 15 16
22 23 24
30 31 32
38
SCK
OPCODE
SI
SO
9FH
High-impedance
Note: Each transition
1FH
Device Id byte 1
Device Id byte 2
00H
shown for SI and SO represents one byte (8 bits)
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
40
23.
Auto Page Rewrite Flowchart
Figure 23-1. Algorithm for Programming or Reprogramming of the Entire Array Sequentially
START
Provide Address
and Data
Buffer Write
(84h, 87h)
Main Memory Page Program
through Buffer
(82h, 85h)
Buffer to Main
Memory Page Program
(83h, 86h)
END
Notes:
1.
This type of algorithm is used for applications in which the entire array is programmed sequentially, filling the array
page by page.
2.
A page can be written using either a main memory page program operation, or a buffer write operation followed by
a buffer to main memory page program operation.
3.
The algorithm above shows the programming of a single page. The algorithm will be repeated sequentially for
each page within the entire array.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
41
Figure 23-2. Algorithm for Randomly Modifying Data
START
provide address of
page to modify
Main Memory Page
to Buffer Transfer
(53h, 55h)
If planning to modify multiple
bytes currently stored within
a page of the Flash array
Buffer Write
(84h, 87h)
Main Memory Page Program
through Buffer
(82h, 85h)
Buffer to Main
Memory Page Program
(83h, 86h)
Auto Page Rewrite
(58h, 59h)
(2)
Increment Page
(2)
Address Pointer
END
Notes:
1.
To preserve data integrity, each page of an DataFlash sector must be updated/rewritten at least once within every
20,000 cumulative page erase and program operations.
2.
A page address pointer must be maintained to indicate which page is to be rewritten. The auto page rewrite command must use the address specified by the page address pointer.
3.
Other algorithms can be used to rewrite portions of the flash array. Low-power applications may choose to wait
until 20,000 cumulative page erase and program operations have accumulated before rewriting all pages of the
sector. See application note AN-4 (“Using Serial DataFlash”) for more details.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
42
24.
Ordering Information
Ordering Code Detail
A T 4 5 D B 3 2 1 D – MW U
Designator
Product Family
Device Grade
U = Matte Sn lead finish, industrial
temperature range (-40°C to +85°C)
Package Option
Device Density
M
MW
S
T
C
32 = 32-megabit
Interface
1 = Serial
=
=
=
=
=
8-pad, 6 x 5 x 1mm MLF (VDFN)
8-pad, 8 x 6 x 1mm MLF (VDFN)
8-lead, 0.209" wide SOIC
28-lead, TSOP
24 Ball BGA
Device Revision
Green Package Options (Pb/Halide-free/RoHS Compliant)
Ordering Code(1)(2)
AT45DB321D-MU
AT45DB321D-MU-SL954(3)
AT45DB321D-MU-SL955(4)
Package
Operating
Voltage
fSCK (MHz)
Matte Sn
2.7V to 3.6V
66
Matte Sn
2.7V to 3.6V
66
Matte Sn
2.5V to 3.6V
50
Operation Range
8M1-A
AT45DB321D-MWU
AT45DB321D-MWU-SL954(3)
AT45DB321D-MWU-SL955(4)
8MW
AT45DB321D-SU
AT45DB321D-SU-SL954(3)
AT45DB321D-SU-SL955(4)
8S2
AT45DB321D-TU
28T
AT45DB321D-CU
24C3
AT45DB321D-MU-2.5
8M1-A
AT45DB321D-SU-2.5
8S2
Notes:
Lead Finish
Industrial
(-40C to 85C)
2.7V to 3.6V
1.
The shipping carrier option is not marked on the devices.
2.
Standard parts are shipped with the page size set to 528 bytes.
The user is able to configure these parts to a 512-byte page size, if desired.
3.
Parts ordered with suffix SL954 are shipped in bulk, with the page size set to 512 bytes.
Parts will have “954” or “SL954” marked on them.
4.
Parts ordered with suffix SL955 are shipped in tape and reel, with the page size set to 512 bytes.
Parts will have “955” or “SL955” marked on them.
Package Type
8M1-A
8-pad, 6 x 5 x 1.0mm, very thin micro lead-frame package MLF™ (VDFN)
8MW
8-pad, 8 x 6 x 1.0mm, very thin micro lead-frame package MLF (VDFN)
8S2
8-lead, 0.209in-wide, plastic gull wing small outline package (EIAJ SOIC)
28T
28-lead, 8mm x 13.4mm, plastic thin small outline package, type I (TSOP)
24C3
24-ball, 6mm x 8mm x 1.4mm ball grid array with a 1mm pitch 5 x 5 ball matrix
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
43
25.
Packaging Information
8M1-A – MLF (VDFN)
D
D1
0
Pin 1 ID
E
E1
SIDE VIEW
TOP VIEW
A3
A2
A1
A
0.08 C
Pin #1 Notch
(0.20 R)
e
COMMON DIMENSIONS
(Unit of Measure = mm)
0.45
D2
E2
SYMBOL
MIN
NOM
MAX
A
–
0.85
1.00
A1
–
–
0.05
A2
0.65 TYP
A3
b
L
K
BOTTOM VIEW
NOTE
0.20 TYP
b
0.35
0.40
0.48
D
5.90
6.00
6.10
D1
5.70
5.75
5.80
D2
3.20
3.40
3.60
E
4.90
5.00
5.10
E1
4.70
4.75
4.80
E2
3.80
4.00
4.20
e
1.27
L
0.50
0.60
0.75
0
–
–
12o
K
0.25
–
–
8/28/08
Package Drawing Contact:
contact@adestotech.com
TITLE
8M1-A, 8-pad, 6 x 5 x 1.00mm Body, Thermally
Enhanced Plastic Very Thin Dual Flat No
Lead Package (VDFN)
GPC
YBR
DRAWING NO.
8M1-A
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
REV.
D
44
8MW – MLF (VDFN)
D
Pin 1 ID
SIDE VIEW
E
A1
TOP VIEW
A
D1
Pin #1 ID
COMMON DIMENSIONS
(Unit of Measure = mm)
1
Option A
Pin #1
Chamfer
(C 0.30)
E1
SYMBOL
MIN
NOM
MAX
A
–
–
1.00
0.05
A1
e
Option B
b
L
K
BOTTOM VIEW
Pin #1
Notch
(0.20 R)
–
–
b
0.35
0.40
0.48
D
7.90
8.00
8.10
D1
6.30
6.40
6.50
E
5.90
6.00
6.10
E1
4.70
4.80
4.90
e
L
K
NOTE
1.27
0.45
0.50
0.55
0.30 REF
5/25/06
DRAWING NO.
TITLE
Package Drawing Contact: 8MW, 8-pad, 8 x 6 x 1.0mm Body, Very Thin Dual Flat Package
8MW
contact@adestotech.com
No Lead (MLF)
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
REV.
B
45
8S2 – EIAJ SOIC
C
1
E
E1
L
N
q
TOP VIEW
END VIEW
e
b
COMMON DIMENSIONS
(Unit of Measure = mm)
A
SYMBOL
A1
D
SIDE VIEW
MAX
NOM
A
1.70
2.16
A1
0.05
0.25
NOTE
b
0.35
0.48
4
C
0.15
0.35
4
D
5.13
5.35
E1
5.18
5.40
E
7.70
8.26
L
0.51
0.85
q
0°
e
Notes: 1.
2.
3.
4.
MIN
2
8°
1.27 BSC
3
This drawing is for general information only; refer to EIAJ Drawing EDR-7320 for additional information.
Mismatch of the upper and lower dies and resin burrs aren't included.
Determines the true geometric position.
Values b,C apply to plated terminal. The standard thickness of the plating layer shall measure between 0.007 to .021 mm.
Package Drawing Contact:
contact@adestotech.com
TITLE
8S2, 8-lead, 0.208” Body, Plastic Small
Outline Package (EIAJ)
GPC
STN
4/15/08
DRAWING NO. REV.
8S2
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
F
46
28T – TSOP, Type 1
PIN 1
0º ~ 5º
c
Pin 1 Identifier Area
D1 D
L
b
e
L1
A2
E
A
GAGE PLANE
SEATING PLANE
COMMON DIMENSIONS
(Unit of Measure = mm)
A1
Notes:
1. This package conforms to JEDEC reference MO-183.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15mm per side and on D1 is 0.25mm per side.
3. Lead coplanarity is 0.10mm maximum.
SYMBOL
MIN
NOM
MAX
A
–
–
1.20
A1
0.05
–
0.15
NOTE
A2
0.90
1.00
1.05
D
13.20
13.40
13.60
D1
11.70
11.80
11.90
Note 2
E
7.90
8.00
8.10
Note 2
L
0.50
0.60
0.70
L1
0.25 BASIC
b
0.17
0.22
0.27
c
0.10
–
0.21
e
0.55 BASIC
12/06/02
TITLE
Package Drawing Contact:
28T, 28-lead (8 x 13.4mm) Plastic Thin Small Outline
contact@adestotech.com
Package, Type I (TSOP)
DRAWING NO.
REV.
28T
C
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
47
24C3 – CBGA
E
A1 Ball ID
D
Top View
A1
A
A1 Ball Corner
E1
1.00 REF
Side View
e
2.00 REF
A
COMMON DIMENSIONS
(Unit of Measure = mm)
B
C
D1
D
SYMBOL
E
E
MIN
NOM
MAX
5.90
6.00
6.10
E1
e
5
4
3
2
Øb
Bottom View
1
D
NOTE
4.0 TYP
7.90
D1
8.00
8.10
4.0 TYP
A
–
–
1.20
A1
0.25
–
–
e
1.00 BSC
b
0.40 TYP
9/10/04
TITLE
Package Drawing Contact: 24C3, 24-ball (5 x 5 Array), 1.0 mm Pitch, 6 x 8 x 1.20 mm,
contact@adestotech.com
Chip-scale Ball Grid Array Package (CBGA)
DRAWING NO.
24C3
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
REV.
A
48
26.
Revision History
Doc. Rev.
Date
Comments
3597R
11/2012
Update to Adesto.
3597Q
06/2011
In Table 16-3,
- Increased tXFR, page to buffer transfer time and tCOMP, page to buffer compare time max
values from 200us to 300us
- Changed tCE typical time and max time are TBD, see errata
- Changed tSE typical time is 1.6s and the max time is 5s
Replace 24C1 with 24C3
Updated template
3597P
05/2010
Changed tSE (Typ) 1.6 to 0.7 and (Max) 5 to 1.3
Changed from 10,000 to 20,000 cumulative page erase/program operations and added the
please contact Adesto statement in section 11.3
3597O
10/2009
Added the 2.5V VCC option
Removed AT45DB321D-MWU-2.5 and AT45DB321D-TU-2.5 from the ordering Information table
3597N
04/2009
Updated Absolute Maximum Ratings
Added 24C1 24 Ball BGA package Option
Deleted DataFlash Card Package Option
3597M
03/2009
Changed deep power-down current values
- Increased typical value from 5μA to 15μA
- Increased maximum value from 15μA to 25μA
3597L
02/2009
Changed tDIS (Typ and Max) to 27ns and 35ns, respectively
3597K
09/2008
Corrected typographical errors in Sector Erase section.
Corrected A17+A16 from x (Don’t care) to A for opcode 7Ch in Table 15-6
Corrected PA8+PA7 from x (Don’t care) to P for opcode 7Ch in Table 15-7
3597J
04/2008
Added part number ordering code details for suffixes SL954/955
Added ordering code details
3597I
08/2007
Added additional text to “power of two” binary page size option
Changed tVSCL from 50μs to 70μs
Changed tRDPD from 30μs to 35μs
Changed tXFR and tCOMP values from 400μs to 200μs
Removed AT45DB321D-CNU from ordering information and corresponding 8CN3 package
3597H
02/2007
Added AT45DB321D-CNU to ordering information and corresponding 8CN3 package
Removed “not recommended for new designs” comment from 8MW package drawing
3597G
09/2006
Removed “not recommended for new designs” note from ordering information for 8MW package
3597F
08/2006
Added errata regarding Chip Erase
Added AT45DB321D-SU to ordering information and corresponding 8S2 package
3597E
07/2006
Corrected typographical errors
3597D
04/2006
Added 8 x 6mm MLF (VDFN) package
Changed the sector size of 0a and 0b to 8 pages and 120 pages respectively
Changed the Product Version Code to 00001
3597C
03/2006
Added preliminary
Changed the sector size from 256-Kbytes to 64-Kbytes
Added the “Legacy Commands” table
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
49
Doc. Rev.
Date
3597B
01/2006
Added 6 x 5mm MLF (VDFN) package
Added text, in “Programming the Configuration Register”, to indicate that power cycling is
required to switch to “power of two” page size after the opcode enable has been executed.
Corrected typographical error regarding the opcode for chip erase in “Program and Erase
Commands” table
3597A
11/2005
Initial release
27.
Errata
27.1
Chip Erase
Comments
27.1.1 Issue
In a certain percentage of units, the chip erase feature may not function correctly and may adversely affect device operation.
Therefore, it is recommended that the chip erase commands (opcodes C7H, 94H, 80H, and 9AH) not be used.
27.1.2 Workaround
Use block erase (opcode 50H) as an alternative. The block erase function is not affected by the chip erase issue.
27.1.3 Resolution
The chip erase feature may be fixed with a new revision of the device. Please contact Adesto for the estimated availability of
devices with the fix.
AT45DB321D [DATASHEET]
3597R–DFLASH–11/2012
50
Corporate Office
California | USA
Adesto Headquarters
1250 Borregas Avenue
Sunnyvale, CA 94089
Phone: (+1) 408.400.0578
Email: contact@adestotech.com
© 2012 Adesto Technologies. All rights reserved. / Rev.: 3597R–DFLASH–11/2012
Adesto®, the Adesto logo, CBRAM®, and DataFlash® are registered trademarks or trademarks of Adesto Technologies. All other marks are the property of their respective
owners.
Disclaimer: Adesto Technologies Corporation makes no warranty for the use of its products, other than those expressly contained in the Company's standard warranty which is detailed in Adesto's Terms
and Conditions located on the Company's web site. The Company assumes no responsibility for any errors which may appear in this document, reserves the right to change devices or specifications
detailed herein at any time without notice, and does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Adesto are granted by the
Company in connection with the sale of Adesto products, expressly or by implication. Adesto's products are not authorized for use as critical components in life support devices or systems.