FAIRCHILD RMPA61810

RMPA61810
Single Channel 6-18 GHz 1 Watt Power Amplifier MMIC
General Description
Features
The Fairchild Semiconductor RMPA61810 is a fully
monolithic power amplifier operating over the 6.0 to 18.0
GHz frequency band. The amplifier uses a 0.25 micron
Pseudomorphic High Electron Mobility Transistor (PHEMT)
process to maximize efficiency and output power. The chip
configuration incorporates two stages of reactively
combined amplifiers at the output preceded by an input
amplifier stage. This single channel amplifier provides
typically, 21dB small signal gain and 31dBm output power
at 1dB gain compression.
• 21dB Typical Small Signal Gain
• 2.0:1 Typical Input VSWR, 2.5:1 Typical Output VSWR
• 31dBm Output Power at 1dB Gain Compression
• 32dBm Output Power at 3dB Gain Compression
• 22% Typical Power Added Efficiency at 1dB Gain
Compression
• Chip size: 6.55mm x 2.67mm x 0.1mm
Device
Absolute Ratings
Symbol
Vd
Vg
Vdg
Pin
Id
TSTG
Tc
RJC
Parameter
Positive Drain DC Voltage
Negative DC Voltage
Simultaneous (Vd–Vg)
RF CW Input Power (50Ω source)
Drain Current
Storage Temperature
Operating Baseplate Temperature
Thermal Resistance (Channel to Backside)
Ratings
8.5
-2
+10.5
27
1.2
-55 to +125
-40 to +85
12
Units
V
V
V
dBm
A
°C
°C
°C/W
Electrical Characteristics (Operated at 25°C, 50Ω system, Vd = +8V, quiescent current (Idq = 600 mA)
Parameter
Frequency Range
Small Signal Gain
P1dB Compression
P3dB Compression
PAE at 1dB Gain Compression
Input Return Loss
Output Return Loss
Gate Voltage (Vg)1
Gain vs. Temp. 0 ~ 85°C
Min
6.0
15
28
30
12
Typ
21
31
32
22
9.5
7.4
-0.4
-0.025
Max
18.0
Units
GHz
dB
dBm
dBm
%
dB
dB
V
dB/°C
Note:
1. Typical range of the negative gate voltage is -1 to 0V to set a typical Idq of 600 mA.
©2004 Fairchild Semiconductor Corporation
RMPA61810 Rev. B
RMPA61810
March 2004
CAUTION: THIS IS AN ESD SENSITIVE DEVICE
Chip carrier material should be selected to have GaAs
compatible thermal coefficient of expansion and high
thermal conductivity such as copper molybdenum or
copper tungsten. The chip carrier should be machined,
finished flat, plated with gold over nickel and should be
capable of withstanding 325°C for 15 minutes.
Die attachment for power devices should utilize Gold/Tin
(80/20) eutectic alloy solder and should avoid hydrogen
environment for PHEMT devices. Note that the backside of
the chip is gold plated and is used as RF and DC Ground.
These GaAs devices should be handled with care and
stored in dry nitrogen environment to prevent
contamination of bonding surfaces. These are ESD
sensitive devices and should be handled with appropriate
precaution including the use of wrist-grounding straps. All
die attach and wire/ribbon bond equipment must be well
grounded to prevent static discharges through the device.
Recommended wire bonding uses 3 mils wide and 0.5 mil
thick gold ribbon with lengths as short as practical allowing
for appropriate stress relief. The RF input and output bonds
should be typically 0.012" long corresponding to a typical 2
mil gap between the chip and the substrate material.
Vd
Vg
RF OUT
RF IN
Vg
Vd
2.4
8.0
249.3
254.8
Figure 1. Functional Block Diagram
105.3
101.8
94.4
VG
59.5
RF
IN
48.1
13.2
5.8
101.8
94.4
VD
RMPA61810
VG
59.5
RF
OUT
48.1
13.2
5.8
VD
258.0
249.3
254.8
Dimension in mils
3.3
8.7
0.0
0.0
Figure 2. Chip Layout and Bond Pad Locations
(Chip size = 6.55mm x 2.67mm x 100µm. Back of Chip is RF and DC Ground)
©2004 Fairchild Semiconductor Corporation
RMPA61810 Rev. B
RMPA61810
Application Information
Scope:
(3) Vg: Gate Voltage (negative) input terminal for amplifier
stages. For best results, the gate supply should have a
source resistance less than 100Ω.
This application note briefly describes the procedure for
evaluating the Fairchild Semiconductor RMPA61810, high
efficiency 0.25µm PHEMT Single-Channel Amplifier. The
chip configuration incorporates two stages of reactively
combined amplifiers at the output preceded by an input
amplifier stage.
(4) Vd: Drain Voltage (positive) input terminal for amplifier
stages.
(5) Vg and Vd on both sides of the MMIC must be biased to
insure proper operation.
Carrier Assembly:
(6) Bias decoupling capacitors of 0.01 µF (multilayer) and
100 pF (single layer) are used on the carrier.
The attached drawing shows a recommended off chip bias
scheme for the RMPA61810. The MMIC is mounted on a
Cu shim or ridge, which in turn blazed to Cu-Mo-Cu, or CuW, or Mo carrier with alumina 50Ω microstrip lines for in/out
RF connections and off-chip DC bias components. The
drawing shows the placement of components and bond
wire connections. The following should be noted:
(7) Close placement of external components is essential to
stability.
(8) The test fixture may require a pair of 25µF capacitor on
the drain and gate(optional) bias terminals to prevent
oscillations caused by the test fixture connections.
(1) 1 mil gold bond wires are used on the carrier assembly.
(9) For Laboratory testing, use good power supplies. Set
current limits on supplies to RF drive-up current level.
Keep supply wire/leads as short as possible and if
required use additional bypass capacitors at the fixture
terminals.
(2) Use 3-1 mil gold wires about 25 mils in length for
optimum RF performance.
DRAIN SUPPLY
(Vd = +8V)*
10,000pF
100pF
L
Bond Wire Ls
L
MMIC CHIP
RF IN
RF OUT
L
GROUND 100pF
(Back of Chip)
L
Bond Wire Ls
10,000pF
GATE SUPPLY (Vg)*
*Vg and Vd on both sides of the MMIC must be biased to insure proper operation.
Figure 3. Recommended Application Schematic Circuit Diagram
©2004 Fairchild Semiconductor Corporation
RMPA61810 Rev. B
RMPA61810
Application Note
0.001" x 0.005" or 0.002" x 0.004" Au Ribbon,
4 Places
VD
100pF Capacitor, 0.015" x 0.015" x 0.005",
4 Places
0.020" x 0.050" x 0.005" Stand-Off,
4 Places
0.01µF Capacitor, 0.063" x 0.031" x 0.031",
4 Places
VD
VG
RF IN
RF
IN
RMPA61810
VG
RF
OUT
RF OUT
VD
0.001" Dia. Au Wire, Typ.
50Ω, 0.015" TH Alumina Substrate,
2 Places
0.010" TH Cu Shim or Ridge
VG
0.025" TH Cu-Mo-Cu or Cu-W Carrier
VD
Figure 4. Recommended Assembly and Bonding Diagram
Recommended Procedure for Biasing and Operation
CAUTION: LOSS OF GATE VOLTAGE (Vg) WHILE DRAIN VOLTAGE (Vd) IS PRESENT MAY DAMAGE THE
AMPLIFIER. THIS AMPLIFIER IS AN ESD SENSITIVE DEVICE.
The following procedure must be followed to properly test
the amplifier:
Step 1: Slowly apply Gate Voltage (typical Vpinch-off =
-1.5V) to terminal Vg.
Step 2: Slowly apply Drain Voltage at Vd (<+5 volts) and
monitor drain current Ids. Adjust negative voltage Vg to set
the drain current (Ids) to approximately 600 mA. Adjust the
drain voltage Vg to nominal +8 volts (adjust Gate Voltage
Vg, if needed, to maintain the drain current at Ids.
©2004 Fairchild Semiconductor Corporation
Step 3: After the bias condition is established, RF input
signal may now be applied at the appropriate frequency
band.
Step 4: Follow Turn-off sequence:
(i) RF input power = off,
(ii) Vd = off,
(iii) Vg = off.
RMPA61810 Rev. B
RMPA61810
VG
RMPA61810
Typical Characteristics
Small Signal Gain
Vd = 8.0V, Idq = 600mA
Power Added Efficiency @ P1dB
Vd = 8.0V, Idq = 600mA
25
30
20
25
20
15
15
10
10
5
5
0
0
4
6
8
10
12
14
FREQUENCY (GHz)
16
18
20
4
6
8
Output Power @ 1dB Compression
Vd = 8.0V, Idq = 600mA
10
12
14
FREQUENCY (dB)
16
18
20
18
20
Input & Output Return Loss
Vd = 8.0V, Idq = 600mA
0
35
34
5
33
S22
10
32
31
15
30
20
29
25
28
30
27
S11
35
26
25
40
4
6
8
10
12
14
FREQUENCY (GHz)
16
18
20
4
6
8
10
12
14
FREQUENCY (GHz)
16
The above data is derived from fixtured measurements which includes 3 parallel, 1 mil diameter, 15 mil long, gold bond wires
connected to the RF input and output.
The Id @ 1 dB compression increases to approximately 1A. The DC supply should be able to support the required current
to achieve the above performance.
©2004 Fairchild Semiconductor Corporation
RMPA61810 Rev. B
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As used herein:
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support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I9