MAXIM MAX3831UCB

19-1534; Rev 1; 10/99
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
Features
♦ +3.3V Single Supply
♦ 1.45W Power Dissipation (MAX3831)
♦ 4-Channel Mux/Demux with Fully Integrated
2.488GHz Clock Generator
♦ Frame Detection Maintains Channel Assignment
♦ ±7.5ns Elastic Store Range
♦ 2.5ps RMS Serial-Data Output Random Jitter
♦ 8ps Serial-Data Output Deterministic Jitter
♦ 622Mbps LVDS Parallel Input/Output
♦ 2.488Gbps Serial CML Input/Output
♦ On-Chip Pattern Generator Provides
High-Speed BIST
♦ System Test Flexibility: System Loopback,
Line Loopback
♦ Loss-of-Frame Indicator
The MAX3831/MAX3832 are 4:1 multiplexers (muxes)
and 1:4 demultiplexers (demuxes) with automatic channel assignment. Operating from a single +3.3V supply,
the mux receives four parallel, 622Mbps SDH/SONET
channels. These channels are bit interleaved to generate a serial data stream of 2.488Gbps for interfacing to
an optical or an electrical driver. A 10-bit-wide elastic
buffer tolerates up to ±7.5ns skew between any parallel
data input and the reference clock. An external
155MHz reference clock is required for the on-chip PLL
to synthesize a high-frequency 2.488GHz clock for timing the outgoing data streams.
The MAX3831/MAX3832’s demux receives 2.488Gbps
serial data and the 2.488GHz clock from an external
clock/data recovery device (MAX3876), converting it to
four 622Mbps LVDS outputs. The MAX3831 provides a
622MHz LVDS clock output, and the MAX3832 provides a 155MHz LVDS clock output. An internal frame
detector looks for a 622Mbps SDH/SONET framing pattern and rolls the demux to maintain proper channel
assignment at the outputs.
These devices also include an embedded pattern generator that enables a full-speed, built-in self-test (BIST).
Two different loopback modes provide system test flexibility. A TTL loss-of-frame monitor is included. The
MAX3831/MAX3832 are available in 64-pin TQFP-EP
(exposed paddle) packages and are specified over the
upper commercial (0°C to +85°C) temperature range.
Applications
SDH/SONET Backplanes
High-Speed Parallel Links
ATM Switching Networks
Line Extenders
Intrarack/Subrack
Interconnects
Dense Digital CrossConnects
Ordering Information
Pin Configuration appears at end of data sheet.
PART
TEMP. RANGE
MAX3831UCB
MAX3832UCB
0°C to +85°C
0°C to +85°C
PIN-PACKAGE
64 TQFP-EP
64 TQFP-EP
Typical Application Circuit
TTL
0.33µF
+3.3V
TTL
TTL
TTL
TEST
LOF
PLBEN
0.1µF
RSETES
155MHz REF
CLOCK INPUT
LVDS
4
4 LVDS
CMOS
OVERHEAD
FIL-
LVDS 4
VCC
RCLKI+
SCLKI-
RCLKIPDI1+ TO PDI4+
SCLKI+
CML
SDI-
PDI1- TO PDI44
LVDS
FIL+
MAX3831
MAX3832
PDO1+ TO PDO4+
SDI+
CML
SDO-
PCLKO+
LBEN
TTL
RSETFR
TTL
TRIEN
GND
2.5Gbps
OPTICAL
TRANSCEIVER
SDO+
PDO1- TO PDO4-
PCLKO-
MAX3876
2.5Gbps
CDR
TTL
________________________________________________________________ Maxim Integrated Products
1
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For small orders, phone 1-800-835-8769.
MAX3831/MAX3832
General Description
MAX3831/MAX3832
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
ABSOLUTE MAXIMUM RATINGS
Positive Supply Voltage (VCC)...............................-0.5V to +5.0V
Input Voltage (LVDS, TTL)..........................-0.5V to (VCC + 0.5V)
CML Input Voltage ..........................(VCC - 0.8V) to (VCC + 0.5V)
FIL+, FIL- Voltage.......................................-0.5V to (VCC + 0.5V)
TTL Output Voltage ....................................-0.5V to (VCC + 0.5V)
LVDS Output Voltage ..................................-0.5V to (VCC +0.5V)
CML Output Currents..........................................................22mA
Continuous Power Dissipation (TA = +85°C) (Note 1)
64-Pin TQFP-EP (derate 40.0mW/°C above +85°C) .........2.6W
Operating Temperature Range...............................0°C to +85°C
Storage Temperature Range .............................-60°C to +150°C
Lead Temperature (soldering, 10sec) .............................+300°C
Note 1: Based on empirical data from the MAX3831/MAX3832 evaluation kit.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
DC ELECTRICAL CHARACTERISTICS
(VCC = +3.0V to +3.6V, LVDS differential load = 100Ω ±1%, CML load = 50Ω ±1% to VCC, all TTL inputs are open, TA = 0°C to
+85°C, unless otherwise noted. Typical values are at TA = +25°C and VCC = +3.3V.)
PARAMETER
Supply Current
SYMBOL
ICC
CONDITIONS
CML inputs and outputs open,
LVDS input VOS = 1.2V (Note 2)
TYP
MAX
MAX3831
MIN
440
580
MAX3832
480
614
UNITS
mA
LVDS INPUTS AND OUTPUTS
Input Voltage Range
VIN
0
Differential Input Threshold
VIDTH
-100
Threshold Hysteresis
VHYST
Input Impedance
RIN
Input Common-Mode Current
IOS
Output Voltage High
VOH
Output Voltage Low
VOL
Differential Output Voltage
Change in Magnitude of
Differential Output Voltage for
Complementary States
Output Offset Voltage
Change in Magnitude of Output
Offset Voltage for Complementary
States
VOD
85
LVDS input, VOS = 1.2V
+100
mV
100
mV
115
270
Figure 1
1.475
V
400
mV
±25
mV
1.275
V
±25
mV
V
250
1.125
∆VOS
TRIEN = GND
TRIEN = VCC
Ω
µA
0.925
VOS
Output Current
mV
90
∆VOD
Differential Output Impedance
2400
>1
80
Short outputs together (Note 3)
MΩ
120
Ω
12
mA
CML INPUTS AND OUTPUTS
Differential Output Voltage
VODp-p
Differential Output Impedance
640
800
1000
mVp-p
85
100
115
Ω
Output Common-Mode Voltage
Single-Ended Input Voltage Range
Differential Input Voltage Swing
Differential Input Impedance
2
VCC - 0.2
VCC 0.6
VIS
Figure 2
400
85
100
_______________________________________________________________________________________
V
VCC +
0.4
V
1200
mVp-p
115
Ω
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
(VCC = +3.0V to +3.6V, LVDS differential load = 100Ω ±1%, CML load = 50Ω ±1% to VCC, all TTL inputs are open, TA = 0°C to
+85°C, unless otherwise noted. Typical values are at TA = +25°C and VCC = +3.3V.)
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
TTL INPUTS AND OUTPUTS
Input Voltage High
VIH
Input Voltage Low
VIL
2.0
Input Current High
IIH
VIH = 2.0V
Input Current Low
IIL
VIL = 0
Output Voltage High
VOH
IOH = 20µA
Output Voltage Low
VOL
IOL = 2mA
V
-250
-50
µA
-550
-100
µA
2.4
V
0.4
TRIEN = GND
Output Impedance
V
0.8
6
V
kΩ
Note 2: When TEST = GND, the pattern generator will consume an additional 30mA.
Note 3: Guaranteed by design and characterization.
AC ELECTRICAL CHARACTERISTICS
(VCC = +3.0V to +3.6V, LVDS differential load = 100Ω ±1%, CML load = 50Ω ±1% to VCC, all TTL inputs are open, TA = 0°C to
+85°C, unless otherwise noted. Typical values are at TA = +25°C and VCC = +3.3V.) (Note 4)
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
4:1 MULTIPLEXER WITH CLOCK GENERATOR
Parallel Input Data Rate
Maximum Parallel Input Skew
622.08
tes
(Note 5)
Serial-Data Output Rate
Serial-Data Output Rise/Fall Time
tr, tf
Mbps
±7.5
ns
2.48832
Gbps
20% to 80%
120
ps
3.5
psRMS
40
psp-p
18
psp-p
Serial-Data Output Random Jitter
SRJ
(Note 6)
Serial-Data Output Deterministic
Jitter
SDJ
(Note 7)
Serial-Data Setup Time
tSU
Figure 3
100
ps
Serial-Data Hold Time
tH
Figure 3
100
ps
8
1:4 DEMULTIPLEXER
Serial-Data Input Rate
Parallel-Data Output Rate
Parallel-Clock Output Frequency
PCLKO to PDO_ Delay
2.48832
PDO±
PCLKO±
tCLK-Q
LVDS Output Rise/Fall Time
622.08
MAX3831
622.08
MAX3832
155.52
MAX3831, Figure 3
ps
350
ps
65
ps
Any differential pair
LVDS Channel-to-Channel Skew
tSKEW2
PDO1± to PDO4±
Note 4:
Note 5:
Note 6:
Note 7:
90
MHz
300
tSKEW1
-100
Mbps
20% to 80%
LVDS Differential Skew
LVDS Three-State Enable Time
Gbps
<100
ps
30
ns
AC characteristics are guaranteed by design and characterization.
Relative to the positive edge of the 155MHz reference clock. PDI1 to PDI4 aligned to RCLKI at reset.
Measured with a reference clock jitter of <1psRMS.
Deterministic jitter is the arithmetic sum of pattern-dependent jitter and pulse-width distortion.
_______________________________________________________________________________________
3
MAX3831/MAX3832
DC ELECTRICAL CHARACTERISTICS (continued)
MAX3831/MAX3832
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
PDO+
V
RL = 100Ω
D
VOD
PDOVPDO-
VOH
|VOD|
SINGLE-ENDED OUTPUT
VPDO+
VOS
VOL
+VOD
DIFFERENTIAL OUTPUT
0V
0V (DIFF)
VODp-p = VPDO+ - VPDO-VOD
Figure 1. Definition of the LVDS Output
SDI+
200mV MIN
600mV MAX
SDI-
(SDI+) - (SDI-)
VID
400mVp-p MIN
1200mVp-p MAX
Figure 2. Definition of the CML Input
tSCLK = 1 / fSCLK
SCLKI
tSU
tH
SDI
PCLKO
tCLK-Q
PDO1–PDO4
NOTE: SIGNAL SHOWN IS DIFFERENTIAL. FOR EXAMPLE, SCLKI = (SCLKI+) - (SCLKI-).
Figure 3. Timing Parameters
4
_______________________________________________________________________________________
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
SERIAL-DATA OUTPUT JITTER
SUPPLY CURRENT vs. TEMPERATURE
SUPPLY CURRENT (mA)
MAX3831/2 toc01
MAX3832
500
223-1 PRBS PATTERN
WIDEBAND RMS
JITTER = 2.48ps
MAX3831/2 toc03
600
MAX3831/2 toc02
SERIAL-DATA OUTPUT EYE DIAGRAM
MAX3831
400
300
200
100
0
5ps/div
50ps/div
-50
-25
0
25
50
75
100
TEMPERATURE (°C)
SERIAL-DATA HOLD TIME
8
6
2
ERROR-FREE OPERATION
0
80
HOLD TIME (ps)
4
-2
60
40
20
-4
CHANNEL ALIGNED TO RCLKI
-6
0
-8
-20
-10
0.2
0.4
0.6
0.8
1.0
1.2
1.4
-50
1.6
-25
0
25
50
75
100
DATA TO RCLKI DELAY AT RESET (ns)
TEMPERATURE (°C)
SERIAL-DATA SETUP TIME
MAX3831
PARALLEL CLOCK-TO-DATA OUTPUT
PROPAGATION DELAY vs. TEMPERATURE
80
60
40
20
300
MAX3831/2 toc07
MAX3831/2 toc06
100
PCLKO TO PDO_ PROPAGATION DELAY (ps)
0
SETUP TIME (ps)
MAX3831/2 toc05
100
MAX3831/2 toc04
VARIATION OF DATA DELAY AFTER RESET (ns)
ELASTIC STORE RANGE
10
250
200
150
100
50
0
0
-50
-25
0
25
50
TEMPERATURE (°C)
75
100
-50
-25
0
25
50
75
100
TEMPERATURE (°C)
_______________________________________________________________________________________
5
MAX3831/MAX3832
Typical Operating Characteristics
(VCC = +3.3V, TA = +25°C, unless otherwise noted.)
MAX3831/MAX3832
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
Pin Description
PIN
NAME
1, 16, 25, 28,
29, 32, 43, 48,
49, 60, 63
GND
Supply Ground
2, 5, 10, 13,
17, 24, 38, 55,
59, 64
VCC
+3.3V Supply Voltage
3
SDO-
Negative CML Serial-Data Output, 2.488Gbps
4
SDO+
Positive CML Serial-Data Output, 2.488Gbps
6
LBEN
Line Loopback Enable. When this TTL input is forced low, the CML serial-data inputs (SDI±)
route directly to the CML serial-data outputs (SDO±). No other inputs or outputs are affected.
An internal 15kΩ pull-up resistor pulls LBEN high for normal operation. See Test Loopbacks.
7
TEST
Self-Test Enable. When this TTL input is forced low, the built-in pattern generator generates
a standard OC-12 SONET-like frame of 12 A1s, 12 A2s, and 9696 bytes of 27 - 1 pseudorandom bits. This also enables an internal serial-system-loopback path. The CML inputs
(SDI± and the SCLK±) and the LVDS inputs are ignored in this mode. An internal 15kΩ pullup resistor pulls TEST high for normal operation.
8
SDI+
Positive CML Serial-Data Input, 2.488Gbps
9
SDI-
Negative CML Serial-Data Input, 2.488Gbps
11
SCLKI+
Positive CML Serial-Clock Input, 2.488GHz
12
SCLKI-
Negative CML Serial-Clock Input, 2.488GHz
14
PCLKO-
Negative LVDS Parallel-Clock Output, 622.08MHz (MAX3831); 155.52MHz (MAX3832)
Positive LVDS Parallel-Clock Output, 622.08MHz (MAX3831); 155.52MHz (MAX3832)
6
15
PCLKO+
18–23, 26, 27
N.C.
30
RSETFR
31
LOF
33
TRIEN
FUNCTION
No Connection
Frame Reset. When this TTL input is forced low, the frame detector and pattern generator
are reset. The LOF output is also asserted low. An internal 15kΩ pull-up resistor pulls
RSETFR high for normal operation.
TTL Loss-of-Frame Output. Asserts low in a loss-of-frame condition.
3-State Enable. When this TTL input is forced low, all TTL and LVDS outputs go into a highimpedance state. An internal 15kΩ pull-up resistor pulls TRIEN high for normal operation.
34, 36, 39, 41
PDO4- to PDO1-
Negative LVDS Parallel-Data Output, 622Mbps
35, 37, 40, 42
PDO4+ to PDO1+
Positive LVDS Parallel-Data Output, 622Mbps
44, 46, 50, 52
PDI4- to PDI1-
Negative LVDS Parallel-Data Input, 622Mbps
45, 47, 51, 53
PDI4+ to PDI1+
Positive LVDS Parallel-Data Input, 622Mbps
54
PLBEN
Parallel System Loopback Enable. When this TTL input is forced low, the LVDS parallel
inputs route through the elastic store to the LVDS parallel outputs. This bypasses the highspeed mux and demux. An internal 15kΩ pull-up resistor pulls PLBEN high for normal operation.
56
RCLKI-
Negative LVDS Reference Clock Input, 155.52MHz
57
RCLKI+
Positive LVDS Reference Clock Input, 155.52MHz
_______________________________________________________________________________________
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
PIN
NAME
FUNCTION
58
RSETES
Elastic Store Reset. The elastic buffer is centered on a rising edge of RSETES, maximizing
the elastic store range. Data must be present for 10µs before applying a pulse of at least
10ns. An internal 15kΩ pull-up resistor pulls RSETES high for normal operation.
61
FIL-
Negative PLL Filter Capacitor Input. Connect a 0.33µF capacitor between FIL+ and FIL-.
62
FIL+
Positive PLL Filter Capacitor Input. Connect a 0.33µF capacitor between FIL+ and FIL-.
EP
Exposed Paddle
Ground. This must be soldered to a circuit board for proper thermal performance (see
Package Information).
_______________Detailed Description
The MAX3831/MAX3832 use a 4:1 mux and 1:4 demux
with an elastic store buffer to simplify SDH/SONET
interconnect I/O routing. The 622Mbps low-voltage differential signal (LVDS) parallel inputs pass through the
10-bit elastic store buffer, which accommodates ±7.5ns
skew on any single input relative to the 155MHz reference clock input RCLKI. This reference clock is
required to synthesize the internal 2.488GHz clock
used to drive the elastic store and 4:1 multiplexer. All
TTL and LVDS outputs can be placed in a high-impedance state. See Figure 4 for a functional diagram.
The 4:1 mux bit-interleaves the parallel data, providing
a 2.488Gbps CML serial output to the optical or electrical driver. The CML serial input receives the
2.488Gbps data, the demux deinterleaves it to
622Mbps and sends the data to the frame detector.
The frame detector monitors one 622Mbps channel and
rolls the demux into the proper channel assignment.
The MAX3831/MAX3832 include high-speed, built-in
self-test (BIST), which also allows testing of the
622Mbps parallel-system loopback and the 2.488Gbps
line loopback.
Elastic Store Buffer
Each parallel-data input, PDI1 to PDI4, passes through
its respective 10-bit elastic store buffer. Following an
elastic store reset, this buffer accommodates ±7.5ns of
skew on any input relative to the 155MHz reference
clock. Figure 5 illustrates the elastic store buffer relationship with RCLKI. The Elastic Store Range graph in
the Typical Operating Characteristics shows the
amount of data skew tolerated.
Following a 10µs power-up period, the locations of the
individual data-channel bit transitions are acquired,
guaranteeing data preservation. The output of this
block passes directly into the 4:1 mux. After power-up,
the elastic store buffer must be reset by applying a low
pulse on RSETES for at least 10ns.
Due to the inherent uncertainty of the data transitions
between the parallel-data inputs there is no bit or frame
alignment between these inputs. However, the demux
ensures proper channel assignment is maintained.
Bit-Interleaved Multiplexer/
Demultiplexer
The MAX3831/MAX3832 use a bit interleave/deinterleave
mux/demux. To guarantee channel assignment, one of
the four channels is inverted before multiplexing to provide a reference for the frame detector during demultiplexing. After demultiplexing, the same channel is
inverted back to the original data format.
Frame Detector
After a 2.5Gbps serial data is bit deinterleaved into four
622Mbps channels, an SDH/SONET frame detector
monitors the fourth channel, looking for the 32-bit pattern (A1A1A2A2) in the OC-12 header. To maintain correct channel assignment, the demux outputs rotate until
this 32-bit overhead pattern is reliably detected. A lossof-frame output, LOF, indicates when the received data
is in or out of frame. When LOF goes high, the frame
pattern is detected and the demux outputs are correctly assigned. When LOF is low, the frame detection circuitry is searching for the correct frame. A RSETFR
(TTL, active low) is included to reset the frame detector
when necessary.
The frame detector uses an algorithm to detect an inframe condition and a loss-of-frame condition; this algorithm is implemented to meet the SONET in-frame and
false-frame specs. The frame_search state will occur
upon start-up or reset. In this state, the frame detector
scans through the incoming serial data searching for the
framing pattern in the channel 4 output of the demux.
While in this state, if the framing pattern is not found
within 250µs, the demux channels are shifted (rolled)
and the frame search continues (Figure 6).
In-frame will be declared if two consecutive framing
patterns are found at the correct byte locations within
the SONET frame (9720 bytes). If this pattern is not pre-
_______________________________________________________________________________________________________
7
MAX3831/MAX3832
Pin Description (continued)
MAX3831/MAX3832
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
TEST
RSETES
(155MHz)
RCLKI+
RCLKI-
FIL+
TRIEN
FIL-
155MHz
LVDS
622MHz
PATTERN
GENERATOR
MAX3831
MAX3832
FREQUENCY
GENERATOR
2.488GHz
LBEN
CK
PDI1+
PDI1PDI2+
ES
LVDS
SDO+
4:1
MUX
ES
SDO-
LVDS
PDI2-
LINE LOOPBACK
PDI3+
PDI3-
ES
LVDS
2.488Gbps
SYSTEM LOOPBACK
TEST
PDI4+
PDI4-
ES
LVDS
622Mbps PARALLEL LOOPBACK
PDO1+
PDO1-
LVDS
D
PDO2+
PDO2-
2.488Gbps
1:4
DEMUX
LVDS
SDI+
SDI-
PDO3+
PDO3-
LVDS
CK
PDO4+
PDO4-
LVDS
SCLKI+
SCLKI-
ROTATE
FRAME
DETECTOR
PLBEN
PCLKO+
PCLKO-
2.488GHz
LVDS
622MHz
CLOCK
GENERATOR
*
RSETFR
*MAX3831: fPCLKO = 622MHz, MAX3832: fPCLKO = 155MHz
LOF
Figure 4. Functional Diagram
DATA INPUT
PDI1
PDI2
A1
A0
B0
B1
B2
PDI4
B1
C1
C0
PDI3
DATA OUTPUT OF ELASTIC STORE
AT t = to
A0
D0
C0
D1
D1
RSETES
≥10ns
Built-In Self-Test
with On-Chip Serial Loopback
RCLKI
+tes
A0
PDI1
PDI2
PDI3
PDI4
-tes
B1
C0
A1
DATA OUTPUT OF ELASTIC STORE
AT t > to
A0
B2
C1
D0
sent at the correct location (false frame), the state
machine will return to the frame_search state described
above. While in the in_frame state, each frame will be
checked for a framing pattern at the correct location.
Four consecutive false frames will cause the state
machine to return to the frame_search state described
above. The false-frame counter is reset with three or
fewer consecutive false frames.
B1
C0
D1
D1
An on-chip pattern generator can be enabled to produce a 622Mbps SDH/SONET-like transport overhead
followed by a pseudorandom bit sequence. This consists
of 12 A1s, 12 A2s, and a pseudorandom bit stream
(PRBS = 27 - 1). When TEST is low, this pattern is distributed to all parallel inputs, bypassing the LVDS input
buffers. Note, this pattern is skewed by one 622MHz
Figure 5. Example of Elastic Store Function
8
_______________________________________________________________________________________
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
MAX3831/MAX3832
FRAME DETECT
START-UP OR RESET
START 250µs TIMER
FRAME_SEARCH
NO
TIMER
TIMED OUT?
LOF = 0
FRAME
PATTERN
DETECTED?
YES
ROLL DATA
NO
YES
1 FRAME DETECTED
RESET BYTE
AND FRAME
FRAME
PATTERN
DETECTED?
NO
NO
YES
FRAME
PATTERN
DETECTED?
YES
IN_FRAME
NO
FRAME
PATTERN
DETECTED?
LOF = 1
YES
NO
FRAME
PATTERN
DETECTED?
NO
FRAME
PATTERN
DETECTED?
YES
YES
Figure 6. Frame Detection Flow Diagram
_______________________________________________________________________________________
9
MAX3831/MAX3832
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
clock cycle between each channel. In this test mode, serial data is internally looped back to the demux. All frame
detect logic is exercised using this mode. The CML
inputs (SDI± and SCLKI±) and LVDS inputs (PDI_±) are
ignored in this mode. After the BIST mode is enabled, the
loss-of-frame flag LOF goes high, indicating that the selftest has passed. In normal operation, TEST is left open
(internally pulled high), disabling the pattern generator
and accepting data from the parallel input channels.
VCC
VCC
50Ω
50Ω
50Ω
50Ω
SDO+ SDI+
Test Loopbacks
Two additional test loopbacks are provided: parallel
system loopback and serial line loopback.
Parallel System Loopback
In parallel system loopback, four 622Mbps parallel
input channels are phase aligned by an associated 10bit elastic store and routed to the output LVDS buffers.
This loopback is controlled by setting PLBEN low.
Normal data transmission is resumed when PLBEN
goes high (internally pulled high).
Serial Line Loopback
Serial line loopback is used for testing the performance
of the optical transceiver and the transmission link. The
received 2.488Gbps data stream is routed to the transmit CML output buffer. Line loopback is enabled when
LBEN is asserted low. When LBEN is left open (internally
pulled high), normal serial-data transmission resumes.
LVDS Parallel Interface
The MAX3831 parallel interface includes four OC-12
data inputs, a 155MHz reference clock input, four
622Mbps parallel-data outputs, and a 622MHz parallelclock output (MAX3832, fPCLKO = 155MHz). All parallel
inputs and outputs are LVDS compatible to minimize
power dissipation, speed transition time, and improve
noise immunity. The 155MHz input signal at RCLKI
requires a duty cycle between 40% and 60%.
The LVDS outputs go into a high-impedance state when
TRIEN is forced low. This simplifies system checks by
allowing vectors to be forced on the LVDS outputs.
CML Serial Interface
The MAX3831/MAX3832 provide a 2.488Gbps serialdata stream to a driver and accept 2.488Gbps serial
data and a 2.488GHz clock signal from an external
clock and data recovery device (MAX3876). The highspeed interface is CML compatible, resulting in lower
system power dissipation and excellent performance
(Figure 7).
10
SDO-
SDI-
MAX3831
MAX3832
MAX3876
Figure 7. CML-to-CML Interface
__________Applications Information
Low-Voltage Differential
Signal Inputs/Outputs
The MAX3831/MAX3832 have LVDS inputs and outputs
for interfacing with high-speed digital circuitry. All LVDS
inputs and outputs are compatible with the IEEE-1596.3
LVDS specification. This technology uses 250mV to
400mV differential low-voltage amplitudes to achieve
fast transition times, minimize power dissipation, and
improve noise immunity.
For proper operation, the parallel clock and data LVDS
outputs (PCLKO+, PCLKO-, PDO_+, PDO_-) require
100Ω differential DC termination between the inverting
and noninverting outputs. Do not terminate these outputs to ground. The parallel-data LVDS inputs (PDI_+,
PDI_-) are internally terminated with 100Ω differential
input resistance and therefore do not require external
termination.
Interfacing with PECL/ECL
Input Levels
When interfacing with differential PECL input levels, it is
important to attenuate the signal while still maintaining
50Ω termination (Figures 8 and 9). Observe the common-mode input voltage specifications. AC-coupling is
required if a VCC other than 3.3V is used to maintain the
input common-mode level (Figure 8).
______________________________________________________________________________________
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
MAX3831/MAX3832
VCC
VCC = 3.3V
50Ω
0.1µF
25Ω
PECL
LEVELS
VCC = 3.3V
50Ω
50Ω
SDI+
82Ω
50Ω
SDI+
RT*
82Ω
100Ω
0.1µF
RT*
PECL
OUTPUT
25Ω
82Ω
SDI-
SDI82Ω
MAX3831
MAX3832
MAX3831
MAX3832
*SELECT RT SUCH THAT THE CORRECT PECL COMMON-MODE LEVEL
IS ACHIEVED (TYPICAL PECL OUTPUT CURRENT = 14mA).
Figure 8. PECL-to-CML Interface
Figure 9. Direct Coupling of a PECL Output into the MAX3831/
MAX3832
Layout Techniques
For best performance, use good high-frequency layout
techniques. Filter voltage supplies, keep ground connections short, and use multiple vias where possible.
Use controlled-impedance transmission lines to interface with the MAX3831/MAX3832 high-speed inputs
and outputs.
Place power-supply decoupling as close to VCC as
possible. To reduce feedthrough, take care to isolate
the input signals from the output signals.
______________________________________________________________________________________
11
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
GND
PDI2-
PDI2+
PDI1-
PLBEN
PDI1+
VCC
RCLKI-
RCLKI+
RSETES
VCC
GND
63 62 61 60 59 58
FIL-
GND
64
FIL+
TOP VIEW
VCC
MAX3831/MAX3832
Pin Configuration
57 56 55 54 53 52 51 50 49
GND
1
48 GND
VCC
2
47 PDI3+
SDO-
3
46 PDI3-
SDO+
4
45 PDI4+
VCC
5
44 PDI4-
LBEN
6
43 GND
TEST
7
42 PDO1+
SDI+
8
41 PDO1-
SDI-
9
MAX3831
MAX3832
VCC 10
40 PDO2+
39 PDO2-
SCLKI+ 11
38 VCC
SCLKI- 12
37 PDO3+
VCC 13
36 PDO3-
PCLKO- 14
35 PDO4+
PCLKO+ 15
34 PDO4-
GND 16
33 TRIEN
GND
LOF
GND
RSETFR
GND
N.C.
N.C.
GND
VCC
N.C.
N.C.
N.C.
N.C.
N.C.
VCC
N.C.
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
TQFP-EP
___________________Chip Information
TRANSISTOR COUNT: 14,134
12
______________________________________________________________________________________
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
64L, TQFP.EPS
______________________________________________________________________________________
13
MAX3831/MAX3832
Package Information
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
MAX3831/MAX3832
Package Information (continued)
14
______________________________________________________________________________________
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
MAX3831/MAX3832
NOTES
______________________________________________________________________________________
15
MAX3831/MAX3832
+3.3V, 2.5Gbps, SDH/SONET, 4-Channel
Interconnect Mux/Demux ICs with Clock Generator
NOTES
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are
implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
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Printed USA
is a registered trademark of Maxim Integrated Products.