MICROCIRCUIT DATA SHEET Original Creation Date: 10/21/98 Last Update Date: 11/12/98 Last Major Revision Date: 10/21/98 CN54F38-X REV 0A0 QUAD 2-INPUT NAND BUFFER (OPEN COLLECTOR) General Description The device contains four independent gates, each of which performs the logic NAND function. The open-collector outputs require external pull-up resistors for proper logical operation. Industry Part Number NS Part Numbers 54F38 54F38DC Prime Die M038 Processing Subgrp Description (blank) 1 2 3 4 5 6 7 8A 8B 9 10 11 Quality Conformance Inspection (blank) 1 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at Temp ( oC) +25 +70 0 +25 +70 0 +25 +70 0 +25 +70 0 MICROCIRCUIT DATA SHEET CN54F38-X REV 0A0 (Absolute Maximum Ratings) (Note 1) Storage Temperature -65 C to +150 C Ambient Temperature under Bias -55 C to +125 C Junction Temperature under Bias -55 C to +175 C Vcc Pin Potential to Ground Pin -0.5V to +7.0V Input Voltage (Note 2) -0.5V to +7.0V Input Current (Note 2) -30 mA to +5.0mA Voltage Applied to Output in HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied to Output in LOW State (Max) -0.5V to Vcc -0.5V to +5.5V twice the rated Iol(mA) ESD Last Passing Voltage (Min) 4000V Note 1: Note 2: Absolute Maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Either voltage limit or current limit is sufficient to protect inputs. Recommended Operating Conditions Free Air Ambient Temperature 0 C to +70 C Supply Voltage +4.5V to +5.5V 2 MICROCIRCUIT DATA SHEET CN54F38-X REV 0A0 Electrical Characteristics DC PARAMETER (The following conditions apply to all the following parameters, unless otherwise specified.) DC: VCC 4.5V to 5.5V, Temp range: 0C to +70C SYMBOL PARAMETER CONDITIONS NOTES PINNAME MIN MAX UNIT SUBGROUPS IIH Input High Current VCC=5.5V, VM=2.7V, VINH=5.5V, VINL=0.0V 1, 2 INPUTS 5.0 uA 1, 2, 3 IBVI Input High Current VCC=5.5V, VM=7.0V, VINH=5.5V, VINL=0.0V 1, 2 INPUTS 7.0 uA 1, 2, 3 IIL Input LOW Current VCC=5.5V, VM=0.5V, VINH=5.5V, VINL=0.0V 1, 2 INPUTS -1.2 mA 1, 2, 3 IOH Open Collector Output VCC=4.5V, VM=4.5V, VIL=0.8V, VINH=5.5V 1, 2 OUTPUTS 250 uA 1, 2, 3 VOLB Output LOW Voltage VCC=4.5V, VIL=0.8V, VIH=2.0V, IOLB=64mA, VINH=5.5V 1, 2 OUTPUTS 0.55 V 1, 2, 3 VCD Input Clamp Diode Voltage VCC=4.5V, IM=-18mA, VINH=5.5V 1, 2 INPUTS -1.2 V 1, 2, 3 VID Input Leakage Test VCC=0V, IID=1.9uA, All other pins grounded 1, 2 INPUTS V 1, 2, 3 IOD Output Leakage Circuit Current VCC=0V, VIOD=150mV, All other pins grounded 1, 2 OUTPUTS uA 1, 2, 3 VIH Input HIGH Voltage Recognized as a HIGH signal 4 INPUTS V 1, 2, 3 VIL Input LOW Voltage Recognized as a LOW signal 4 INPUTS 0.8 V 1, 2, 3 ICCH Supply Current VCC=5.5V, VINL=0.0V, VINH=5.5V 1, 2 VCC 7.0 mA 1, 2, 3 ICCL Supply Current VCC=5.5V, VINL=0.0V, VINH=5.5V 1, 2 VCC 30.0 mA 1, 2, 3 4.75 4.75 2.0 AC PARAMETER (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns tpLH tpHL Propagation Delay Propagation Delay Note 1: Note 2: Note 3: Note 4: VCC=5.0V @25C, VCC=4.5V & 5.5V @ 0C/ +70C VCC=5.0V @25C, VCC=4.5V & 5.5V @ 0C/ +70C 1, 2 An/Bn to On 6.5 12.5 ns 9 1, 2 An/Bn to On 6.5 13.0 ns 10, 11 1, 2 An/Bn to On 1.0 5.0 ns 9 1, 2 An/Bn to On 1.0 5.5 ns 10, 11 Screen tested 100% on each device at +75C temperature only, subgroups 2, 8A & 10. Sample tested (Method 5005, Table 1) on each MFG. lot at +75C temperature only, subgroups 2, 8A & 10. Guaranteed, but not tested. Guaranteed by applying specific input condition and testing VOLB & IOH. 3 MICROCIRCUIT DATA SHEET CN54F38-X REV 0A0 Revision History Rev ECN # 0A0 M0003057 11/12/98 Rel Date Originator Changes Donald B. Miller Initial MDS Release 4