TLP113 TOSHIBA Photocoupler GaAℓAs IRed & Photo−IC TLP113 Isolated Line Receiver Simplex / Multiplex Data Transmission Computer−Peripheral Interface Microprocessor System Interface Digital Isolation For A / D, D / A Conversion Unit in mm The TOSHIBA mini flat coupler TLP113 is a small outline coupler, suitable for surface mount assembly. TLP113 consists of a GaAℓAs light emitting diode, optically coupled to an integrated high gain, high speed photodetector whose output is an open collector, schottky clamped transistor. Input current thresholds: IF=10mA(max.) Switching speed: 10MBd(typ.) TTL / LSTTL compatible: VCC=5V Guaranteed performance over temp.: 0~70°C Isolation voltage: 2500Vrms(min.) UL recognized: UL1577 file no. E67349 z z z z z z TOSHIBA Weight: 0.09g Schematic IF ICC Pin Configuration(top view) VCC 1 6 IO VF VCC 1 5 VO 6 5 GND 3 11−4C2 GND 3 4 (Note) A 0.1μF bypass capacitor must be connected between pins 4 and 6. 4 1 : Anode 3 : Cathode 4 : GND 5 : Output (Open collector) 6 : VCC TRUTH TABLE (Positive Logic) INPUT 1 OUTPUT H L L H 2007-10-01 TLP113 Absolute Maximum Ratings (Ta = 25°C) Characteristic Forward current Symbol Rating Unit IF 20 mA (Note 1) IFP 40 mA Peak transient forward current (Note 2) IFPT 1 A Reverse voltage VR 5 V Output current IO 25 mA Output voltage VO 7 V Supply voltage (1 minute maximum) VCC 7 V Output power dissipation PO 40 mW Operating temperature range Topr −40~85 °C Storage temperature range Tstg −55~125 °C Lead solder temperature (10s) Tsol 260 °C BVS 2500 Vrms Detector LED Pulse forward current Isolation voltage (AC, 1 min., RH ≤ 60%, Note 4) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) 50% duty cycle, 1ms pulse width. (Note 2) Pulse width≤1μs, 300pps. Recommended Operating Conditions Characteristic Symbol Min. Typ. Max. Unit Input voltage, low level VFL −3 0 1.0 V Input current, high level IFH 13* 16 20 mA Supply voltage** VCC 4.5 5 5.5 V N ― ― 8 ― Topr 0 ― 70 °C Fan out (TTL load, each channel) Operating temperature Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. * 13mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value is 10mA or less. **This item denotes operating ranges, not meaning of recommended operating conditions. 2 2007-10-01 TLP113 Electrical Characteristics(unless otherwise specified, Ta=0~70°C, VCC=4.5~5.5V, VFL≤ 1.0V) Characteristic Forward voltage Forward voltage temperature coefficient Reverse current Capacitance between terminals Symbol Min. Typ. Max. Unit IF=10mA, Ta=25°C ― 1.65 1.80 V IF=10mA ― −2 ― mV / °C IR VR=5V, Ta=25°C ― ― 10 μA CT VF=0, f=1MHz, Ta=25°C ― 45 ― pF VF=1.0, VO=5.5V ― ― 250 VF=1.0, VO=5.5V, Ta=25°C ― 0.5 10 ― 0.4 0.6 V ― ― 10 mA VF VF / Ta High level output current IOH Low level output voltage VOL "H level output→ L level output" input current IFH Test Condition IF=10mA IOL=13mA(sinking) IOL=13mA(sinking) VOL=0.6V μA High level supply current ICCH VCC=5.5V, IF=0 ― 7 15 mA Low level supply current ICCL VCC=5.5V, IF=16mA ― 12 18 mA ― ― 100 μA ― Ω ― pF Input−output insulation leakage current Isolation resistance Stray capacitance between input to output IS RS CS VS=3540V, t=5s Ta=25°C (Note 4) R.H. ≤ 60%, VS=500V DC Ta=25℃ (Note 4) VS=0, f=1MHz Ta=25℃ (Note 4) 5×10 ― 10 10 14 0.8 * All typical values are VCC=5V, Ta=25°C 3 2007-10-01 TLP113 Switching Characteristics (VCC=5V, Ta=25°C) Characteristic Propagation delay time (H→L) Propagation delay time (L→H) Output rise−fall time (10−90%) Symbol Test Cir− cuit tpHL 1 tpLH 1 tr, tf 2 CMH 2 CML 2 Common mode transient imunity at high output level level Min. Typ. Max. Unit ― 60 120 ns ― 60 120 ns ― 30 ― ns ― 200 ― V / μs ― −500 ― V / μs IF=0→16mA CL=15pF, RL=350Ω IF=16→0mA CL=15pF, RL=350Ω RL=350Ω, CL=15pF IF=0 16mA IF=0mA, VCM=200Vp−p VO(min)=2V, RL=350Ω IF=16mA, VCM=200Vp−p Common mode transient imunity at low output Test Condition VO(max)=0.8V, RL=350Ω (Note 4) Device considered a two−terminal device: Pins 1 and 3 shorted together, and pins 4, 5 and 6 shorted together. (Note 5) The VCC supply voltage to each TLP113 isolator must be bypassed by 0.1μF capacitor, this can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to package VCC and GND pins of each device. (Note 6) Maximum electrostatic discharge voltage for any pins: 180V(C=200pF, R=0) 4 2007-10-01 TLP113 Test Circuit 1: Switching Time Test Circuit VCC CL GND 350Ω Pulse input PW = 100μs Duty ratio = 1 / 10 IF monitor 0.1μF VCC = 5V 16mA 8mA 0mA IF tf VO Output monitor tr 5V 4.5V VO 1.5V 0.5V VOL tpLH tpHL CL is approximately 15pF which includes probe and stray wiring capacitance. Test Circuit 2: Common Mode Transient Immunity Test Circuit VCC GND CL VCM Pulse gen ZO = 50Ω 350Ω VCC = 5V 0.1μF IF VO Output monitor 90% VCM tr 10% tf VO (IF = 0mA) VO (IF = 10mA) 200V 0V 5V 2V 0.8V VOL 160(V) 160(V) CΜΗ = , CΜL = t f (μs) t r (μs) CL is approximately 15pF which includes probe and stray wiring capacitance. 5 2007-10-01 TLP113 ΔVF / ΔTa − IF IF − VF −4.0 Forward voltage temperature coefficient ΔVF / ΔTa (mV / °C ) 10 Forward current IF (mA) 100 1 Ta = 70°C 25°C 0°C 0.1 1.2 1.4 1.8 1.6 Forward voltage VF 0−25°C −2.4 25−70°C −1.6 −0.8 0.1 0.01 1 −3.2 2.0 0.3 (V) 0.5 1 3 Forward current V O − IF IF (mA) IOH − Ta 10 10 VCC = 5V VF = 1.0V 5 8 High level output current IOH (μA) VO (V) Ta = 25°C Output voltage 30 10 5 6 RL = 350Ω 4 1kΩ 4kΩ 2 VCC = 5.5V VO = 5.5V 3 1 0.5 0.3 0.1 0 0 2 0.05 4 6 Forward current 8 10 −20 (mA) IF 0 VOL (V) RL = 350Ω 8 RL = 4kΩ (V) 6 Low level output voltage VO Ta 80 (°C) VO L − Ta VCC = 5V Output voltage 60 0.50 10 Ta = 70°C 4 Ta = 0°C 2 0 40 Ambient temperature V O − IF 0 20 2 4 Forward current 6 IF 8 IF = 10mA VCC = 5.5V 0.45 IOL = 16mA 0.40 12.8mA 9.6mA 0.35 6.4mA 0.30 −20 10 (mA) 0 20 40 Ambient temperature 6 60 Ta 80 (°C) 2007-10-01 TLP113 tr, tf − Ta tpHL , tpLH − IF 300 120 RL = 4kΩ (ns) (ns) RL = 4kΩ tr, tf 80 Rise, fall time Propagation delay time tpHL, tpLH 100 1kΩ 350Ω 60 RL = 350Ω 1kΩ 40 IF=16mA VCC = 5V 220 tf tr RL = 350Ω 120 1kΩ 4kΩ 1kΩ 80 Ta = 25°C VCC = 5V 4kΩ 20 10 260 350Ω 40 tpHL tpLH 0 12 18 16 14 Forward current IF −20 20 (mA) 0 20 Ambient temperature 80 60 40 Ta (°C) tpHL , tpLH − Ta 120 Propagation delay time tpHL, tpLH (ns) RL = 4kΩ 100 1kΩ 80 350Ω 60 RL = 350Ω 40 1kΩ 4kΩ IF = 16mA VCC = 5V tpHL tpLH 20 0 −20 0 20 60 40 Ambient temperature Ta 80 (°C) 7 2007-10-01 TLP113 RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01