TLP2631 TOSHIBA photocoupler GaAℓAs IRed & Photo IC TLP2631 Isolated Line Receiver Simplex / Multiplex Data Transmission Computer-Peripheral Interface Microprocessor System Iinterface Digital Isolation For A / D, D / A Conversion Unit in mm The TOSHIBA TLP2631 dual photocoupler consists of a pair of GaAℓAs light emitting diode and integrated high gain, high speed photodetector. This unit is 8-lead DIP. The output of the detector circuit is an open collector, Schottky clamped transistor. A Faraday shield integrated on the photodetector chip reduces the effects of capacitive coupling between the input LED emitter and the high gain stages of the detector. This provides an effective common mode transient immunity of 1000V / μs. • Input current threshold: IF = 5mA(max.) • Switching speed: 10MBd(typ.) • Common mode transient immunity: ±1000V / μs(min.) • Guaranteed performance over temperature: 0~70°C • Isolation voltage: 2500Vrms(min.) • UL recognized: UL1577, file no. E67349 TOSHIBA Weight: 0.54g Truth Table (positive logic) Input Output H L L H 11−10C4 Pin Configuration (top view) VCC 1 8 2 7 A 0.01 to 0.1μF bypass capacitor must 3 6 connected between pins 8 and 5(see Note 1). 4 GND Shield 5 1 : Anode 1 2 : Cathode 1 3 : Cathode 2 4 : Anode 2 5 : GND 6 : VO2 (Output 2) 7 : VO1 (Output 1) 8 : VCC Schematic + VF1 − + VF2 − 1 I 1 F1 Shield ICC 8 IO1 7 2 4 IF2 IO2 6 VCC VO1 VO2 3 5 GND 2007-10-01 TLP2631 Absolute Maximum Ratings (no derating required up to 70°C) Characteristic Symbol Rating Unit IF 20 mA IFP 30 mA Reverse voltage (each channel) VR 5 V Output current (each channel) IO 16 mA Output voltage (each channel) VO −0.5~7 V VCC 7 V PO 40 mW Operating temperature range Tstg −55~125 °C Storage temperature range Topr −40~85 °C Tsol 260 °C BVS 2500 Vrms Detector LED Forward current (each channel) Pulse forward current (each channel)* Supply voltage (1 minute maximum) Output collector power dissipation (each channel) Lead soldering temperature (10s)** Isolation voltage (AC, 1 min., R.H.≤ 60%, Note 3) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). * t ≤ 1 msec duration. ** 2mm below seating plane. Recommended Operating Conditions Characteristic Symbol Min. Typ. Max. Unit Input current, low level, each channel IFL 0 ― 250 μA Input current, high level, each channel IFH 6.3* ― 20 mA Supply voltage**, output VCC 4.5 5 5.5 V N ― ― 8 Topr 0 ― 70 Fan out (TTL load, each channel) Operating temperature °C Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. *6.3mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value is 5.0mA or less. **This item denotes operating ranges, not meaning of recommended operating conditions. 2 2007-10-01 TLP2631 Electrical Characteristics (Ta = 0~70°C unless otherwise noted) Characteristic Input forward voltage (each channel) Symbol VF Input diode temperature coefficient (each channel) ΔVF / ΔTa Input reverse breakdown voltage (each channel) BVR Test Condition Min. Typ. * Max. Unit IF = 10mA, Ta = 25°C ― 1.65 1.75 V IF = 10mA ― −2.0 ― mV / °C IR = 10μA, Ta = 25°C 5 ― ― V Input capacitance (each channel) CT VF = 0, f = 1MHz ― 45 ― pF High level output current (each channel) IOH VCC = 5.5V, VO = 5.5V IF = 250μA ― 1 250 μA Low level output voltage (each channel) VOL VCC = 5.5V, IF = 5mA IOL(sinking) = 13mA ― 0.4 0.6 V High level supply current (both channels) ICCH VCC = 5.5V, IF = 0 ― 14 30 mA Low level supply current (both channels) ICCL VCC = 5.5V, IF = 10mA ― 24 38 mA Isolation voltage RS VS = 500V, R.H. ≤ 60% (Note 3) 5×10 10 ― Ω Capacitance (input−output) CS f = 1MHz (Note 3) ― 0.6 ― pF Input−input leakage current II−I R.H. ≤ 60%, t = 5s VI−I = 500V (Note 6) ― 0.005 ― μA Resistance (input−input) RI−I VI−I = 500V (Note 6) ― 10 11 ― Ω Capacitance (input−input) CI−I f = 1MHZ (Note 6) ― 0.25 ― pF 10 14 * All typical values are at VCC = 5V, Ta = 25°C. 3 2007-10-01 TLP2631 Switching Characteristics (Ta = 25°C, VCC = 5V) Symbol Test Circuit Propagation delay time to low output level tpHL 1 Propagation delay time to high output level tpLH Output rise time, output fall time (10~90%) tr, tf Characteristic Test Condition Min. Typ. Max. Unit IF = 0→7.5mA, RL = 350Ω CL = 15pF (each channel) ― 60 75 ns 1 IF = 7.5mA→0, RL = 350Ω CL = 15pF (each channel) ― 60 75 ns 1 IF = 0 7.5mA, RL = 350Ω CL = 15pF (each channel) ― 30 ― ns 1000 10000 ― V / μs −1000 −10000 ― V / μs Common mode transient immunity at high output level CMH 2 IF = 0, RL = 350Ω VCM = 400V, VO(min.) = 2V (each channel, Note 4) Common mode transient immunity at low output level CML 2 IF = 7.5mA, RL = 350Ω VCM = 400V VO(max.) = 0.8V (each channel, Note 5) (Note 1) 2mm below seating plane (Note 2) The VCC supply voltage to each TLP2631 isolator must be bypassed by a 0.01μF capacitor or larger. This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins each device. (Note 3) Device considered a two−terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted together. (Note 4) CMH･the maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e., VOUT > 2.0V). Measured in volts per microsecond (V / μs). Volts/ microsecond can be translated to sinusoidial voltages: V / μs = (dVCM) Max. = fCM VCM (p.p.) dt Example: VCM = 319Vpp when fCM = 1MHz using CML and CMH = 1000V / μs data sheet specified minimum. (Note 5) CML･the maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state (i.e., VOUT > 0.8V). Measured in volts per microsecond (V / μs). (Note 6) Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together. 4 2007-10-01 TLP2631 Test Circuit 1. tpHL and tpLH 5V 100Ω IF Monitor VCC 1 2 7 3 6 4 GND 5 7.5mA 3.75mA 0mA IF 8 0.1μF Pulse input PW = 10μs Duty cycle = 1/10 RL 350Ω tr tf 5V VO Monitor CL VO tpHL * CL is approximately 15pF which includes probe and stray wiring capacitance. 4.5V 1.5V 0.5V VOL tpLH Test Circuit 2. Transient Immunity And Typical Waveforms. VCC 1 2 B A VFF 7 3 6 4 GND 5 + VCM 5V 8 0.1μF IF CL 10% tr VO Monitor VO (IF = 0mA) − 0V tf 5V 2V 0.8V VO Pulse generator VOL (IF = 7.5mA) ZO = 50Ω CMH = VCM RL 350Ω 400V 90% 320(V) 320(V) , CML = t r (μs ) t r (μs ) * CL is approximately 15pF which includes probe and stray wiring capacitance. 5 2007-10-01 TLP2631 IF – VF Ta = 25 °C 10 1 0.1 0.01 1.0 1.2 1.4 IOH (μA) 6 High level output current (V) −1.6 1 0.3 3 10 30 50 (mA) IOH – Ta Ta = 25 °C Output voltage VO −1.8 100 VCC = 5 V RL = 350Ω 1kΩ 4kΩ 2 2 −2.0 Forward current IF VO – IF 1 −2.2 (V) 8 0 0 −2.4 −1.4 0.1 2.0 1.8 1.6 Forward voltage VF 4 ΔVF / ΔTa – IF −2.6 Forward voltage temperature coefficient ΔVF / ΔTa (mV / °C) Forward current IF (mA) 100 3 4 Forward current IF 5 IF = 250 μA VCC = 5.5 V 50 VO = 5.5 V 30 10 5 3 6 1 (mA) 10 0 20 30 40 50 60 70 Ambient temperature Ta (°C) VOL – Ta VO – IF 10 IF = 5 mA VOL (V) VCC = 5 V RL = 350Ω 8 Low level output voltage Output voltage VO (V) RL = 4kΩ 6 Ta = 70°C 4 0°C 2 VCC = 5.5 V 0.5 VE = 2 V IOL=16mA 0.4 12.8mA 9.6mA 6.4mA 0.3 0.2 0 0 0 1 2 3 Forward current IF 4 5 20 40 60 80 Ambient temperature Ta (°C) 6 (mA) 6 2007-10-01 TLP2631 tpHL, tpLH – IF tpHL, tpLH – Ta 120 120 RL = 4kΩ RL = 4kΩ tpLH tpLH 100 tpLH 1kΩ tpHL 350Ω 350Ω 80 60 1kΩ 4kΩ 40 350kΩ 1kΩ tpLH 80 350Ω 60 1kΩ 4kΩ tpHL 40 Ta = 25 °C 20 0 5 Propagation delay time tpHL, tpLH (ns) Propagation delay time tpHL, tpLH (ns) 100 VCC = 5 V 7 9 11 13 Forward current IF 15 VCC = 5 V 20 19 17 IF = 7.5 mA 0 0 (mA) 10 20 30 40 50 60 70 Ambient temperature Ta (°C) tr, tf – Ta 320 VCC = 5 V IF = 7.5 mA Rise, fall time tr, tf (ns) 300 RL = 4kΩ tf 280 80 tf 1kΩ tf 350Ω tr 350Ω 60 40 20 0 0 1kΩ 4kΩ 10 20 30 40 50 60 70 Ambient temperature Ta (°C) 7 2007-10-01 TLP2631 RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01