CYPRESS CY7C1006BN-15VC

CY7C106BN
CY7C1006BN
256K x 4 Static RAM
Features
Functional Description
The CY7C106BN and CY7C1006BN are high-performance
CMOS static RAMs organized as 262,144 words by 4 bits.
Easy memory expansion is provided by an active LOW Chip
Enable (CE), an active LOW Output Enable (OE), and
three-state drivers. These devices have an automatic
power-down feature that reduces power consumption by more
than 65% when the devices are deselected.
• High speed
— tAA = 15 ns
• CMOS for optimum speed/power
• Low active power
— 495 mW
• Low standby power
Writing to the devices is accomplished by taking Chip Enable
(CE) and Write Enable (WE) inputs LOW. Data on the four I/O
pins (I/O0 through I/O3) is then written into the location
specified on the address pins (A0 through A17).
— 275 mW
• 2.0V data retention (optional)
• Automatic power-down when deselected
• TTL-compatible inputs and outputs
Reading from the devices is accomplished by taking Chip
Enable (CE) and Output Enable (OE) LOW while forcing Write
Enable (WE) HIGH. Under these conditions, the contents of
the memory location specified by the address pins will appear
on the four I/O pins.
The four input/output pins (I/O0 through I/O3) are placed in a
high-impedance state when the devices are deselected (CE
HIGH), the outputs are disabled (OE HIGH), or during a write
operation (CE and WE LOW).
The CY7C106BN is available in a standard 400-mil-wide SOJ;
the CY7C1006BN is available in a standard 300-mil-wide SOJ.
Logic Block Diagram
Pin Configuration
SOJ
Top View
512 x 512 x 4
ARRAY
I/O3
SENSE AMPS
A1
A2
A3
A4
A5
A6
A7
A8
A9
ROW DECODER
INPUT BUFFER
I/O2
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
CE
OE
GND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
VCC
A17
A16
A15
A14
A13
A12
A11
NC
I/O3
I/O2
I/O1
I/O0
WE
I/O1
I/O0
A0
POWER
DOWN
CE
WE
A10
A11
A12
A13
A14
A15
A16
A17
COLUMN
DECODER
Cypress Semiconductor Corporation
Document #: 001-06429 Rev. **
OE
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised February 1, 2006
CY7C106BN
CY7C1006BN
Selection Guide
7C106BN-15
7C1006BN-15
7C106BN-20
7C1006BN-20
Maximum Access Time (ns)
15
20
Maximum Operating Current (mA)
80
75
Maximum Standby Current (mA)
30
30
Maximum Ratings
Current into Outputs (LOW)......................................... 20 mA
(Above which the useful life may be impaired. For user guidelines, not tested.)
Static Discharge Voltage ........................................... >2001V
(per MIL-STD-883, Method 3015)
Storage Temperature ................................–65×C to +150×C
Latch-Up Current ..................................................... >200 mA
Ambient Temperature with
Power Applied............................................–55×C to +125×C
Operating Range
Supply Voltage on VCC Relative to
GND[1] .... –0.5V
to +7.0V
DC Voltage Applied to Outputs
in High Z State[1] ....................................–0.5V to VCC + 0.5V
DC Input Voltage[1] .................................–0.5V to VCC + 0.5V
Ambient
Temperature[2]
0°C to +70°C
–45°C to +85°C
Range
Commercial
Industrial
VCC
5V ± 10%
Electrical Characteristics Over the Operating Range
7C106BN-15
7C1006BN-15
Parameter
Description
Test Conditions
Min.
7C106BN-20
7C1006BN-20
Max.
Min.
Max.
Unit
VOH
Output HIGH Voltage
VCC = Min., IOH = –4.0 mA
VOL
Output LOW Voltage
VCC = Min., IOL = 8.0 mA
VIH
Input HIGH Voltage
2.2
VCC + 0.3
2.2
VCC + 0.3
V
VIL
Input LOW Voltage[1]
–0.3
0.8
–0.3
0.8
V
IIX
Input Leakage Current
GND < VI < VCC
–1
+1
–1
+1
mA
IOZ
Output Leakage Current
GND < VI < VCC, Output
Disabled
–5
+5
–5
+5
mA
IOS
Output Short
Circuit Current[3]
VCC = Max., VOUT = GND
–300
–300
mA
ICC
VCC Operating Supply
Current
VCC = Max., IOUT = 0 mA,
f = fMAX = 1/tRC
80
75
mA
ISB1
Automatic CE Power-Down
Current —TTL Inputs
Max. VCC, CE > VIH, VIN > VIH or
VIN < VIL, f = fMAX
30
30
mA
ISB2
Automatic CE Power-Down
Current —CMOS Inputs
Max. VCC,
CE > VCC – 0.3V,
VIN > VCC – 0.3V
or VIN < 0.3V, f=0
10
10
mA
2.4
2.4
0.4
Com’l
V
0.4
V
Capacitance[4]
Parameter
CIN: Addresses
CIN: Controls
COUT
Description
Input Capacitance
Test Conditions
TA = 25×C, f = 1 MHz,
VCC = 5.0V
Output Capacitance
Max.
7
10
10
Unit
pF
pF
pF
Notes:
1. VIL (min.) = –2.0V for pulse durations of less than 20 ns.
2. TA is the “instant on” case temperature.
3. Not more than 1 output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
4. Tested initially and after any design or process changes that may affect these parameters.
Document #: 001-06429 Rev. **
Page 2 of 8
CY7C106BN
CY7C1006BN
AC Test Loads and Waveforms
R1 480Ω
R1 480Ω
5V
5V
OUTPUT
OUTPUT
R2
255Ω
30 pF
90%
INCLUDING
JIG AND
SCOPE
(a)
Equivalent to:
90%
10%
10%
R2
GND
255Ω
5 pF
INCLUDING
JIG AND
SCOPE
ALL INPUT PULSES
3.0V
Rise Time < 1V/ns
Fall Time < 1V/ns
(b)
THÉVENIN EQUIVALENT
167Ω
OUTPUT
1.73V
Switching Characteristics Over the Operating Range[5]
7C106B-15
7C1006B-15
Parameter
Description
Min.
Max.
7C106B-20
7C1006B-20
Min.
Max.
Unit
READ CYCLE
tRC
Read Cycle Time
tAA
Address to Data Valid
tOHA
Data Hold from Address Change
tACE
CE LOW to Data Valid
tDOE
OE LOW to Data Valid
tLZOE
OE LOW to Low Z
tHZOE
OE HIGH to High Z[6, 7]
tLZCE
CE LOW to Low Z[7]
tHZCE
CE HIGH to High Z[6, 7]
tPU
CE LOW to Power-Up
tPD
CE HIGH to Power-Down
15
20
15
ns
20
ns
15
20
ns
7
8
ns
8
ns
3
3
0
ns
0
7
3
ns
3
7
0
ns
8
0
15
ns
ns
20
ns
WRITE CYCLE[8, 9]
tWC
Write Cycle Time
15
20
ns
tSCE
CE LOW to Write End
12
15
ns
tAW
Address Set-Up to Write End
12
15
ns
tHA
Address Hold from Write End
0
0
ns
tSA
Address Set-Up to Write Start
0
0
ns
tPWE
WE Pulse Width
12
15
ns
tSD
Data Set-Up to Write End
8
10
ns
tHD
Data Hold from Write End
0
0
ns
3
3
ns
tLZWE
tHZWE
WE HIGH to Low
Z[7]
WE LOW to High
Z[6, 7]
7
8
ns
Notes:
5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
IOL/IOH and 30–pF load capacitance.
6. tHZOE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
7. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
8. The internal write time of the memory is defined by the overlap of CE and WE LOW. CE and WE must be LOW to initiate a write, and the transition of either of
these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.
9. The minimum write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
Document #: 001-06429 Rev. **
Page 3 of 8
CY7C106BN
CY7C1006BN
Data Retention Characteristics Over the Operating Range
Parameter
VDR
tR
Min.
VCC for Data Retention
ICCDR
tCDR
Conditions[10]
Description
Data Retention Current
[4]
VCC = VDR = 2.0V,
CE > VCC – 0.3V,
VIN > VCC – 0.3V or
VIN < 0.3V
Chip Deselect to Data Retention Time
[4]
Max.
2.0
Operation Recovery Time
Unit
V
250
µA
0
ns
200
ms
Data Retention Waveform
DATA RETENTION MODE
4.5V
VCC
4.5V
VDR > 2V
tCDR
tR
CE
Switching Waveforms
Read Cycle No.1[11, 12]
1
tRC
ADDRESS
tOHA
DATA OUT
tAA
PREVIOUS DATA VALID
DATA VALID
Read Cycle No. 2 (OE Controlled)[12, 13]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
DATA OUT
tLZOE
HIGH IMPEDANCE
tLZCE
VCC
SUPPLY
CURRENT
tHZCE
HIGH
IMPEDANCE
DATA VALID
tPD
tPU
50%
ICC
50%
ISB
Notes:
10. No input may exceed VCC +0.5V.
11. Device is continuously selected, OE and CE = VIL.
12. WE is HIGH for read cycle.
13. Address valid prior to or coincident with CE transition LOW.
Document #: 001-06429 Rev. **
Page 4 of 8
CY7C106BN
CY7C1006BN
Switching Waveforms (continued)
Write Cycle No. 1 (CE Controlled)[14, 15]
tWC
ADDRESS
tSCE
CE
tSA
tAW
tHA
tPWE
WE
tSD
DATA I/O
tHD
DATA VALID
Write Cycle No. 2 (WE Controlled, OE HIGH During Write)[14, 15]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
OE
tSD
DATA I/O
tHD
DATA VALID
tHZOE
Notes:
14. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
15. Data I/O is high impedance if OE = VIH.
Document #: 001-06429 Rev. **
Page 5 of 8
CY7C106BN
CY7C1006BN
Switching Waveforms (continued)
Write Cycle No. 3 (WE Controlled, OE LOW)[9, 15]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
tSD
DATA I/O
tHD
DATA VALID
tLZWE
tHZWE
Truth Table
CE
OE
WE
Input/Output
Mode
Power
H
X
X
High Z
Power-Down
Standby (ISB)
L
L
H
Data Out
Read
Active (ICC)
L
X
L
Data In
Write
Active (ICC)
L
H
H
High Z
Selected, Outputs Disabled
Active (ICC)
Ordering Information
Speed
(ns)
15
20
Ordering Code
CY7C106BN-15VC
CY7C1006BN-15VC
CY7C106BN-20VC
Package
Diagram
51-85032
51-85031
51-85032
Package Type
28-Lead (400-Mil) Molded SOJ
28-Lead (300-Mil) Molded SOJ
28-Lead (400-Mil) Molded SOJ
Operating
Range
Commercial
Commercial
Please contact local sales representative regarding availability of these parts.
Document #: 001-06429 Rev. **
Page 6 of 8
CY7C106BN
CY7C1006BN
Package Diagrams
28-pin (300-Mil) Molded SOJ (51-85031)
NOTE :
1. JEDEC STD REF MO088
2. BODY LENGTH DIMENSION DOES NOT INCLUDE MOLD PROTRUSION/END FLASH
MOLD PROTRUSION/END FLASH SHALL NOT EXCEED 0.006 in (0.152 mm) PER SIDE
MIN.
MAX.
3. DIMENSIONS IN INCHES
DETAIL
A
EXTERNAL LEAD DESIGN
PIN 1 ID
14
1
0.291
0.300
15
0.330
0.350
0.026
0.032
0.013
0.019
28
0.014
0.020
OPTION 1
0.697
0.713
OPTION 2
SEATING PLANE
0.120
0.140
0.007
0.013
A
0.050
TYP.
0.004
0.025 MIN.
0.262
0.272
51-85031-*C
28-Lead (400-Mil) Molded SOJ (51-85032)
PIN 1 I.D
14
1
.395
.405
15
MIN.
MAX.
DIMENSIONS IN INCHES
.435
.445
28
.720
.730
SEATING PLANE
.128
.148
.026
.032
.050
TYP.
.015
.020
.007
.013
0.004
.025 MIN.
.360
.380
51-85032.*B
All product or company names mentioned in this document may be the trademarks of their respective holders.
Document #: 001-06429 Rev. **
Page 7 of 8
© Cypress Semiconductor Corporation, 2006. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be
used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its
products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
CY7C106BN
CY7C1006BN
Document History Page
Document Title: CY7C106BN/CY7C1006BN 256K x 4 Static RAM
Document Number: 001-06429
REV.
ECN NO.
Issue
Date
Orig. of
Change
Description of Change
**
423847
See ECN
NXR
New Data sheet
Document #: 001-06429 Rev. **
Page 8 of 8