Features • • • • • • • • • • Contactless Power Supply Contactless Read/Write Data Transmission Radio Frequency fRF from 100 kHz to 150 kHz Basic Mode or Extended Mode Compatible with T5557, ATA5567 Replacement for e5551/T5551 in Most Common Operation Modes Configurable for ISO/IEC 11784/785 Compatibility Total 363 Bits EEPROM Memory: 11 Blocks (32 Bits + 1 Lock Bit) High Q-antenna Tolerance Due to Build in Options Adaptable to Different Applications: Access Control, Animal ID and Waste Management • On-chip Trimmed Antenna Capacitor • Pad Options – ATA5577M1 • 100 µm × 100 µm for Wire Bonding or Flip Chip – ATA5577M2 • 200 µm × 400 µm for Direct Coil Bonding Read/Write LF RFID IDIC 100 to 150 kHz ATA5577 Summary 1. Description ® The ATA5577 is a contactless read/write identification IC (IDIC ) for applications in the 125-kHz or 134-kHz frequency band. A single coil connected to the chip serves as the IC’s power supply and bi-directional communication interface. The antenna and chip together form a transponder or tag. Preliminary The on-chip 363-bit EEPROM (11 blocks with 33 bits each) can be read and written block-wise from a base station (reader). Data is transmitted from the IDIC (uplink) using load modulation. This is achieved by damping the RF field with a resistive load between the two terminals Coil 1 and Coil 2. The IC receives and decodes serial base station commands (downlink), which are encoded as 100% amplitude modulated (OOK) pulse-interval-encoded bit streams. A complete datasheet with further technical data is available on request. Please contact your local sales office. NOTE: This is a summary document. The complete document is available. For more information, please contact your local Atmel sales office. 4967DS–RFID–10/08 2. Compatibility The ATA5577 is designed to be compatible with the T5557/ATA5567. The structure of the configuration register is identical. The two modes, Basic mode and Extended mode, are also available. The ATA5577 is able to replace the e5551/T5551 in most common operation modes. In all applications, the correct functionality of the replacements must be evaluated and proved. For further details, refer to Atmel®’s web site for product-relevant application notes. 3. System Block Diagram Figure 3-1. RFID System Using ATA5577 Tag Data 1) Controller Power Reader or Base station Coil interface Transponder Memory ATA5577 1) Mask option 4. ATA5577 - Functional Blocks Figure 4-1. Block Diagram Option register POR 1) Mode register Write decoder Coil 1 Analog front end Modulator Memory (363-bit EEPROM) Data-rate generator Controller Coil 2 Input register Test logic HV generator 1) Mask option 2 ATA5577 [Preliminary] 4967DS–RFID–10/08 ATA5577 [Preliminary] 4.1 Analog Front End (AFE) The AFE includes all circuits that are directly connected to the coil terminals. It generates the IC's power supply and handles the bi-directional data communication with the reader. It consists of the following blocks: • Rectifier to generate a DC supply voltage from the AC coil voltage • Clock extractor • Switchable load between Coil 1 and Coil 2 for data transmission from the tag to the reader • Field-gap detector for data transmission from the base station to the tag • ESD-protection circuitry 4.2 Data-rate Generator The data rate is binary programmable to operate at any even-numbered data rate between RF/2 and RF/128 or to any of the fixed Basic mode data rates (RF/8, RF/16, RF/32, RF/40, RF/50, RF/64, RF/100 and RF/128). 4.3 Write Decoder The write decoder detects the write gaps and verifies the validity of the data stream according to the Atmel e555x downlink protocol (pulse interval encoding). 4.4 HV Generator This on-chip charge pump circuit generates the high voltage required to program the EEPROM. 4.5 DC Supply Power is externally supplied to the IDIC via the two coil connections. The IC rectifies and regulates this RF source and uses it to generate its supply voltage. 4.6 Power-On Reset (POR) The power-on reset circuit blocks the voltage supply to the IDIC until an acceptable voltage threshold has been reached. 4.7 Clock Extraction The clock extraction circuit uses the external RF signal as its internal clock source. 4.8 Controller The control logic module executes the following functions: • Load mode register with configuration data from EEPROM block 0 after power-on and during reading • Load option register with the settings for the analog front end stored in EEPROM page 1 block 3 after power-on and during reading • Control all EEPROM memory read/write access and data protection • Handles the downlink command decoding detecting protocol violations and error conditions 3 4967DS–RFID–10/08 4.9 Mode Register The mode register maintains a readable shadow copy of the configuration data held in block 0 of the EEPROM. It is continually refreshed during read mode and (re-)loaded after every POR event or reset command. On delivery, the mode register is pre-programmed with default values (see full version of the datasheet). 4.10 Modulator The modulator encodes the serialized EEPROM data for transmission to a tag reader or base station. Several types of modulation are available including Manchester, bi-phase, FSK, PSK, and NRZ. 4.11 Memory Page 0 Page 1 Figure 4-2. Memory Map 0 1.........................................................................................32 L Analog front end option set-up Block 3 1 Traceability data Block 2 1 Traceability data Block 1 L Page 0 configuration data Block 0 L User data or password Block 7 L User data Block 6 L User data Block 5 L User data Block 4 L User data Block 3 L User data Block 2 L User data Block 1 L Configuration data Block 0 32 bits Not transmitted The memory is a 363-bit EEPROM, which is arranged in 11 blocks of 33 bits each. Each block includes a single Lock bit, which is responsible for write-protecting the associated block. Programming takes place on a block basis, so a complete block (including lock bit) can be programmed with a single command. The memory is subdivided into two page areas. Page 0 contains 8 blocks and page 1 contains 4 blocks. All 33 bits of a block, including the lock bit, are programmed simultaneously. 4 ATA5577 [Preliminary] 4967DS–RFID–10/08 ATA5577 [Preliminary] Block 0 of page 0 contains the mode/configuration data, which is not transmitted during regular read operations. Addressing block 0 will always affect block 0 of page 0 regardless of the page selector. Block 7 of page 0 may be used as a write-protection password. Block 3 of page 1 contains the option register, which is not transmitted during regular-read operation. Bit 0 of every block is the lock bit for that block. Once locked, the block (including the lock bit itself) is not re-programmable via the RF field. Blocks 1 and 2 of page 1 contain traceability data and are transmitted with the modulation parameters defined in the configuration register after the opcode “11” is issued by the reader. The traceability data blocks are programmed and locked by Atmel. 5. Absolute Maximum Ratings Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Parameters Symbol Value Unit Maximum DC current into Coil1/Coil2 Icoil 20 (TBD) mA Maximum AC current into Coil1/Coil2, f = 125 kHz Icoil p 20 (TBD) mA Power dissipation (die) (free-air condition, time of application: 1s) Ptot 100 (TBD) mW Electrostatic discharge maximum to ANSI/ESD-STM5.1-2001 standard (HBM) Vmax 2000 (TBD) V Operating ambient temperature range Tamb –40 to +85 °C Storage temperature range (data retention reduced) Tstg –40 to +150 °C 5 4967DS–RFID–10/08 6. Electrical Characteristics Tamb = +25°C; fcoil = 125 kHz; unless otherwise specified No. 1 Parameters RF frequency range 2.3 Supply current (without Read - full temperature current consumed by the range external LC tank circuit) Programming - full temperature range Coil voltage (AC supply) Read mode and write command(2) 3.3 Program EEPROM(2) Start-up time Vcoil pp = 6V 5.1 5.3 5.4 3-mA current into Clamp voltage (depends Coil1/Coil2 on settings in option register) 20-mA current into Coil1/Coil2 6.1 6.2 6.3 Modulation parameters (depends on settings in option register) 6.4 6.5 Thermal stability 7.1 Clock detection level (depends on settings in option register) 7.2 7.3 7.4 Typ. Max. Unit fRF 100 125 150 kHz 1.5 TBD µA T 2 TBD µA Q 25 TBD µA Q 3.6 TBD V Q Vclamp V Q IDD POR threshold (50-mV hysteresis) 3.2 5.2 Min. Tamb = 25°C 3.1 4 Symbol (1) 2.1 2.2 Test Conditions TBD Vcoil pp 6 8 tstartup V Q TBD ms Q TBD 11 TBD V Q Vpp clamp med TBD 13 TBD V Q Vpp clamp hi TBD 17 TBD V T Vpp clamp med TBD 15 TBD V T 3-mA current into Coil1/Coil2 and modulation ON Vpp mod lo TBD 3 TBD V T Vpp mod med TBD 5 TBD V Q Vpp mod hi TBD 7 TBD V Q 20 mA current into Coil1/Coil2 and modulation ON Vpp mod med TBD 7.5 TBD V T mV/°C Q Vmod lo/Tamb Vcoil pp = 8V –1 Vclkdet lo TBD 250 TBD mV Q Vclkdet med TBD 550 TBD mV T Vclkdet hi TBD 800 TBD mV Q Vgapdet lo TBD 250 TBD mV Q Vgapdet med TBD 550 TBD mV T Vgapdet hi TBD 850 TBD mV Q 5.7 6 ms T Cycles Q Vcoil pp = 8 V 8 Programming time From last command gap to re-enter read mode (64 + 648 internal clocks) Tprog 5 9 Endurance Erase all/Write all(3) ncycle 100000 7.6 Vclamp 2.5 Vpp clamp lo Gap detection level (depends on settings in option register) 7.5 Type* *) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data Notes: 1. IDD measurement set-up R = 100kΩ; VCLK = Vcoil = 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation defeat. IDD = (VOUTmax – VCLK) / R 2. Current into Coil1/Coil2 is limited to 10 mA. 3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on uncut wafer) delivery. 6 ATA5577 [Preliminary] 4967DS–RFID–10/08 ATA5577 [Preliminary] 6. Electrical Characteristics (Continued) Tamb = +25°C; fcoil = 125 kHz; unless otherwise specified No. Parameters Test Conditions 10.1 10.2 Top = 55°C Data retention (3) Min. Typ. Max. Unit Type* 20 50 Years Q tretention 10 (3) tretention 96 hrs T (3) tretention 24 hrs Q Top = 150°C 10.3 Symbol Top = 250°C 11.1 11.2 11.3 Resonance capacitor 11.4 Mask option Vcoil pp = 1V Cr 11.5 12.1 12.2 Micromodule capacitor parameters 320 330 340 242 250 258 TBD 130 TBD TBD 75 TBD TBD 10 TBD T pF Q Capacitance tolerance Tamb Cr 320 330 340 pF T Temperature coefficient TBD TBD TBD TBD TBD TBD *) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data Notes: 1. IDD measurement set-up R = 100kΩ; VCLK = Vcoil = 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation defeat. IDD = (VOUTmax – VCLK) / R 2. Current into Coil1/Coil2 is limited to 10 mA. 3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on uncut wafer) delivery. 7. Revision History Please note that the following page numbers referred to in this section refer to the specific revision mentioned, not to this document. Revision No. History 4967DS-RFID-10/08 • Features on page 1 changed 4967CS-RFID-01/08 • Features on page 1 changed • Section 2 “Compatibility” on page 2 changed • Section 4.9 “Mode Register” on page 4 changed 4967BS-RFID-09/07 • • • • Put datasheet in a new template Section 4.2 “Data-rate Generator” on page 3 changed Figure 4-2 “Memory Map” on page 5 changed Section 6 “Electrical Characteristics” numbers 2.1, 2.2 and 2.3 on page 6 changed 7 4967DS–RFID–10/08 Headquarters International Atmel Corporation 2325 Orchard Parkway San Jose, CA 95131 USA Tel: 1(408) 441-0311 Fax: 1(408) 487-2600 Atmel Asia Room 1219 Chinachem Golden Plaza 77 Mody Road Tsimshatsui East Kowloon Hong Kong Tel: (852) 2721-9778 Fax: (852) 2722-1369 Atmel Europe Le Krebs 8, Rue Jean-Pierre Timbaud BP 309 78054 Saint-Quentin-en-Yvelines Cedex France Tel: (33) 1-30-60-70-00 Fax: (33) 1-30-60-71-11 Atmel Japan 9F, Tonetsu Shinkawa Bldg. 1-24-8 Shinkawa Chuo-ku, Tokyo 104-0033 Japan Tel: (81) 3-3523-3551 Fax: (81) 3-3523-7581 Technical Support [email protected] Sales Contact www.atmel.com/contacts Product Contact Web Site www.atmel.com Literature Requests www.atmel.com/literature Disclaimer: The information in this document is provided in connection with Atmel products. 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