ONSEMI MBRAF2H100G

MBRAF2H100T3G
Surface Mount
Schottky Power Rectifier
This device employs the Schottky Barrier principle in a large area
metal−to−silicon power diode. State−of−the−art geometry features
epitaxial construction with oxide passivation and metal overlay
contact. Ideally suited for low voltage, high frequency rectification, or
as free wheeling and polarity protection diodes in surface mount
applications where compact size and weight are critical to the system.
Features
•
•
•
•
•
•
Low Profile Package for Space Constrained Applications
Rectangular Package for Automated Handling
Highly Stable Oxide Passivated Junction
150°C Operating Junction Temperature
Guard−Ring for Stress Protection
These are Pb−Free and Halide−Free Devices
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SCHOTTKY BARRIER
RECTIFIER
2.0 AMPERE
100 VOLTS
Mechanical Charactersistics
• Case: Epoxy, Molded, Epoxy Meets UL 94, V−0
• Weight: 95 mg (approximately)
• Finish: All External Surfaces Corrosion Resistant and Terminal
SMA−FL
CASE 403AA
STYLE 6
Leads are Readily Solderable
• Lead and Mounting Surface Temperature for Soldering Purposes:
•
•
•
MARKING DIAGRAM
260°C Max. for 10 Seconds
Cathode Polarity Band
Device Meets MSL 1 Requirements
ESD Ratings: Machine Model = C
ESD Ratings: Human Body Model = 3B
AYWW
RAAG
G
RAA
= Specific Device Code
A
= Assembly Location
Y
= Year
WW
= Work Week
G
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
Device
Package
Shipping†
MBRAF2H100G
SMA−FL
(Pb−Free)
5000 / Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
© Semiconductor Components Industries, LLC, 2012
July, 2012 − Rev. 0
1
Publication Order Number:
MBRAF2H100/D
MBRAF2H100T3G
MAXIMUM RATINGS
Rating
Peak Repetitive Reverse Voltage
Working Peak Reverse Voltage
DC Blocking Voltage
Average Rectified Forward Current
(TL = 140°C)
Symbol
Value
Unit
VRRM
VRWM
VR
100
V
IO
2.0
4.0
A
Peak Repetitive Forward Current
(Rated VR, Square Wave, 20 kHz) TL = 145°C
IFRM
Non−Repetitive Peak Surge Current
(Surge Applied at Rated Load Conditions Halfwave, Single Phase, 60 Hz)
IFSM
Storage Temperature Range
Tstg
−65 to +175
°C
Operating Junction Temperature (Note 1)
TJ
−65 to +175
°C
130
A
A
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The heat generated must be less than the thermal conductivity from Junction−to−Ambient: dPD/dTJ < 1/RqJA.
THERMAL CHARACTERISTICS
Characteristic
Symbol
Value
Unit
Thermal Resistance, Junction−to−Lead (Note 2)
YJCL
TBD
°C/W
Thermal Resistance, Junction−to−Ambient (Note 2)
RqJA
TBD
°C/W
TJ = 25°C
TJ = 125°C
Unit
0.79
0.65
0.050
9.0
2. 1 inch square pad size (1 × 0.5 inch) for each lead on FR4 board.
ELECTRICAL CHARACTERISTICS
Value
Characteristic
Symbol
Maximum Instantaneous Forward Voltage (Note 3)
(iF = 2.0 A)
vF
Maximum Instantaneous Reverse Current (Note 3)
(VR = 100 V)
IR
3. Pulse Test: Pulse Width ≤ 380 ms, Duty Cycle ≤ 2.0%.
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2
V
mA
MBRAF2H100T3G
TYPICAL CHARACTERISTICS
100
150°C
25°C
125°C
10
IF, FORWARD CURRENT (A)
IF, FORWARD CURRENT (A)
100
1
0.1
0.2 0.3
0.4
0.5
0.6
0.7
0.8
1.0
0.9
1.1
150°C
25°C
1
0.3
0.5
0.7
0.9
1.1
1.3
1.5
VF, INSTANTANEOUS FORWARD VOLTAGE (V)
VF, INSTANTANEOUS FORWARD VOLTAGE (V)
Figure 1. Typical Forward Voltage
Figure 2. Maximum Forward Voltage
10
IR, REVERSE CURRENT (mA)
150°C
1
125°C
0.1
0.01
0.001
25°C
0.0001
0
10
20
30
40
50
60
70
80
90
100
150°C
1
125°C
0.1
0.01
25°C
0.001
0
10
20
VR, REVERSE VOLTAGE (V)
30
400
TJ = 25°C
f = 1 MHz
350
300
250
200
150
100
50
0
10
20
50
60
70
80
Figure 4. Maximum Reverse Current
450
0
40
VR, REVERSE VOLTAGE (V)
Figure 3. Typical Reverse Current
C, CAPACITANCE (pF)
IR, REVERSE CURRENT (mA)
125°C
0.1
1.2
10
0.00001
10
30
40
50
60
70
80
VR, REVERSE VOLTAGE (V)
Figure 5. Typical Capacitance
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3
90
100
90 100
R(t), TYPICAL TRANSIENT THERMAL
RESISTANCE (°C/W)
MBRAF2H100T3G
100
10
1
50% Duty Cycle
10%
20%
5%
2%
1%
0.1
0.01
Single Pulse
0.001
0.0000001 0.000001
0.00001
0.0001
0.001
0.01
0.1
1
10
t, PULSE TIME (S)
Figure 6. Typical Transient Thermal Response, Junction−to−Ambient
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4
100
1000
MBRAF2H100T3G
PACKAGE DIMENSIONS
SMA−FL
CASE 403AA
ISSUE O
E
E1
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
D
DIM
A
b
c
D
E
E1
L
TOP VIEW
A
c
RECOMMENDED
SOLDER FOOTPRINT*
C
SIDE VIEW
SEATING
PLANE
1.76
2X
MILLIMETERS
MIN
MAX
0.90
1.10
1.25
1.65
0.15
0.30
2.40
2.80
4.80
5.40
4.00
4.60
0.70
1.10
5.56
b
1.30
2X
L
BOTTOM VIEW
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks,
copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. SCILLC
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limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications
and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC
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For additional information, please contact your local
Sales Representative
MBRAF2H100/D