SHENZHENFREESCALE AOK42S60

AOK42S60
600V 39A α MOS TM Power Transistor
General Description
TM
The AOK42S60 has been fabricated using the advanced αMOS high voltage process that is designed to deliver
high levels of performance and robustness in switching applications.
By providing low RDS(on), Qg and EOSS along with guaranteed avalanche capability this device can be
adopted quickly into new and existing offline power supply designs.
Features
VDS @ Tj,max
700V
IDM
166A
RDS(ON),max
0.099Ω
Qg,typ
40nC
Eoss @ 400V
9.2µJ
D
G
S
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Symbol
Drain-Source Voltage
VDS
Gate-Source Voltage
Continuous Drain
Current
VGS
TC=25°C
TC=100°C
IDM
±30
V
25
A
166
Avalanche Current C
IAR
11
A
Repetitive avalanche energy C
EAR
234
mJ
Single pulsed avalanche energy G
TC=25°C
Power Dissipation B Derate above 25oC
MOSFET dv/dt ruggedness
Peak diode recovery dv/dt H
Junction and Storage Temperature Range
EAS
1345
mJ
PD
dv/dt
TJ, TSTG
Maximum lead temperature for soldering
purpose, 1/8" from case for 5 seconds J
TL
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A,D
Symbol
RθJA
Maximum Case-to-sink A
Maximum Junction-to-Case
1/6
Units
V
39
ID
Pulsed Drain Current C
AOK42S60
600
RθCS
RθJC
417
W
3.3
100
20
-55 to 150
W/ oC
300
°C
AOK42S60
Units
V/ns
°C
40
°C/W
0.5
0.3
°C/W
°C/W
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AOK42S60
600V 39A α MOS TM Power Transistor
Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
ID=250µA, VGS=0V, TJ=25°C
600
-
-
ID=250µA, VGS=0V, TJ=150°C
650
700
-
V
µA
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
IDSS
Zero Gate Voltage Drain Current
VDS=600V, VGS=0V
-
-
1
VDS=480V, TJ=150°C
-
10
-
IGSS
Gate-Body leakage current
VDS=0V, VGS=±30V
-
-
±100
VGS(th)
Gate Threshold Voltage
VDS=5V,ID=250µA
2.5
3.2
3.8
nΑ
V
RDS(ON)
Static Drain-Source On-Resistance
VSD
Diode Forward Voltage
VGS=10V, ID=21A, TJ=25°C
-
0.085
0.099
Ω
VGS=10V, ID=21A, TJ=150°C
-
0.24
0.28
Ω
IS=21A,VGS=0V, TJ=25°C
-
0.84
-
V
IS
Maximum Body-Diode Continuous Current
-
-
39
A
ISM
Maximum Body-Diode Pulsed Current
-
-
166
A
-
2154
-
pF
-
135
-
pF
-
103
-
pF
-
344
-
pF
VGS=0V, VDS=100V, f=1MHz
-
2.7
-
pF
VGS=0V, VDS=0V, f=1MHz
-
1.7
-
Ω
DYNAMIC PARAMETERS
Input Capacitance
Ciss
Coss
Output Capacitance
Co(er)
Effective output capacitance, energy
related H
Crss
Effective output capacitance, time
related I
Reverse Transfer Capacitance
Rg
Gate resistance
Co(tr)
VGS=0V, VDS=100V, f=1MHz
VGS=0V, VDS=0 to 480V, f=1MHz
SWITCHING PARAMETERS
Total Gate Charge
Qg
Qgs
Gate Source Charge
VGS=10V, VDS=480V, ID=21A
-
40
-
nC
-
11.7
-
nC
Qgd
Gate Drain Charge
-
11.9
-
nC
tD(on)
Turn-On DelayTime
-
38.5
-
ns
tr
Turn-On Rise Time
-
53
-
ns
tD(off)
Turn-Off DelayTime
-
136
-
ns
tf
trr
Turn-Off Fall Time
-
46
-
ns
VGS=10V, VDS=400V, ID=21A,
RG=25Ω
IF=21A,dI/dt=100A/µs,VDS=400V
-
473
-
ns
IF=21A,dI/dt=100A/µs,VDS=400V
-
38.5
-
Body Diode Reverse Recovery Charge IF=21A,dI/dt=100A/µs,VDS=400V
-
10.5
-
A
µC
Irm
Body Diode Reverse Recovery Time
Peak Reverse Recovery Current
Qrr
A. The value of R θJA is measured with the device in a still air environment with T A =25°C.
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper dissipation
limit for cases where additional heatsinking is used.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C, Ratings are based on low frequency and duty cycles to keep initial TJ
=25°C.
D. The R θJA is the sum of the thermal impedance from junction to case R θJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a
maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse ratin g.
G. L=60mH, IAS=6.7A, VDD=150V, Starting TJ=25°C
H. Co(er) is a fixed capacitance that gives the same stored energy as Coss while VDS is rising from 0 to 80% V(BR)DSS.
I. Co(tr) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% V(BR)DSS.
J. Wavesoldering only allowed at leads.
2/6
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AOK42S60
600V 39A α MOS TM Power Transistor
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
60
80
10V
10V
70
7V
50
60
6V
ID (A)
ID (A)
50
6V
7V
40
40
5.5V
30
5.5V
30
5V
20
20
10
5V
VGS=4.5V
10
VGS=4.5V
0
0
0
5
10
15
0
20
5
VDS (Volts)
Figure 1: On-Region Characteristics@25°C
1000
20
0.30
0.25
100
125°C
RDS(ON) (Ω )
0.20
ID(A)
10
1
25°C
0.1
VGS=10V
0.15
0.10
0.05
0.00
0.01
2
3
4
5
6
7
8
9
0
10
15
30
45
60
75
90
ID (A)
Figure 4: On-Resistance vs. Drain Current and
Gate Voltage
VGS(Volts)
Figure 3: Transfer Characteristics
1.2
3
2.5
VGS=10V
ID=21A
BVDSS (Normalized)
Normalized On-Resistance
15
-55°C
VDS=20V
2
1.5
1
1.1
1
0.9
0.5
0
-100
-50
0
50
100
150
Temperature (°C)
Figure 5: On-Resistance vs. Junction Temperature
3/6
10
VDS (Volts)
Figure 2: On-Region Characteristics@125°C
200
0.8
-100
-50
0
50
100
150
200
TJ (oC)
Figure 6: Break Down vs. Junction Temperature
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AOK42S60
600V 39A α MOS TM Power Transistor
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
1.0E+02
15
125°C
1.0E+01
12
VDS=480V
ID=21A
1.0E+00
25°C
VGS (Volts)
IS (A)
1.0E-01
1.0E-02
1.0E-03
9
6
3
1.0E-04
1.0E-05
0.0
0.2
0.4
0.6
0.8
0
1.0
0
VSD (Volts)
Figure 7: Body-Diode Characteristics (Note E)
15
30
45
60
Qg (nC)
Figure 8: Gate-Charge Characteristics
10000
20
Ciss
16
Eoss(uJ)
Capacitance (pF)
1000
Coss
100
Eoss
12
8
Crss
10
4
0
1
0
100
200
300
400
500
VDS (Volts)
Figure 9: Capacitance Characteristics
600
0
100
200
300
400
VDS (Volts)
Figure 10: Coss stroed Energy
500
600
1000
ID (Amps)
100
10µs
RDS(ON)
limited
10
100µs
1ms
10ms
1s
1
DC
TJ(Max)=150°C
TC=25°C
0.1
0.01
0.1
1
10
VDS (Volts)
100
1000
Figure 11: Maximum Forward Biased Safe
Operating Area for AOK42S60(Note F)
4/6
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AOK42S60
600V 39A α MOS TM Power Transistor
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
1500
40
35
Current rating ID(A)
EAS(mJ)
1200
900
600
300
30
25
20
15
10
5
0
0
25
50
75
100
125
150
175
0
TCASE (°C)
Figure 12: Avalanche energy
25
50
75
100
125
TCASE (°C)
Figure 13: Current De-rating (Note B)
150
Zθ JC Normalized Transient
Thermal Resistance
10
1
In
Indescending
descendingorder
order
D=0.5,
D=0.5,0.3,
0.3,0.1,
0.1,0.05,
0.05,0.02,
0.02,0.01,
0.01,single
singlepulse
pulse
D=Ton
on/T
TJ,PK
J,PK=TC
C+PDM
DM.ZθJC
θJC.RθJC
θJC
RθJC
=0.3°C/W
θJC=2.5°C/W
0.1
PD
0.01
Ton
T
Single Pulse
Pulse
Single
0.001
0.000001
0.00001
0.00001
0.0001
0.0001
0.001
0.001
0.01
0.01
0.1
0.1
1
10
1
100
10
Pulse
Pulse Width
Width (s)
(s)
Figure 14:
15: Normalized Maximum Transient Thermal Impedance for AOK42S60(Note
AOTF42S60(NoteF)F)
5/6
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AOK42S60
600V 39A α MOS TM Power Transistor
Gate Charge Test Circuit & Waveform
Vgs
Qg
10V
+
+ Vds
VDC
-
Qgs
Qgd
VDC
DUT
-
Vgs
Ig
Charge
Res istive Switching Test Circuit & Waveforms
RL
Vds
Vds
DUT
Vgs
+
VDC
90%
Vdd
-
Rg
10%
Vgs
Vgs
t d(on)
tr
t d(off)
t on
tf
t off
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
L
EAR= 1/2 LI
Vds
2
AR
BVDSS
Vds
Id
+ Vdd
Vgs
Vgs
I AR
VDC
-
Rg
Id
DUT
Vgs
Vgs
Diode Recovery Tes t Circuit & Waveforms
Qrr = - Idt
Vds +
DUT
Vgs
Vds -
Isd
Vgs
Ig
6/6
L
Isd
+
VDC
-
IF
trr
dI/dt
IRM
Vdd
Vdd
Vds
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