IDT 74FCT162244TPVGB

IDT54/74FCT162244T/AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
FAST CMOS 16-BIT
BUFFER/LINE DRIVER
IDT54/74FCT162244T/AT/CT/ET
FEATURES:
DESCRIPTION:
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The FCT162244T 16-Bit Buffer/Line Driver is for bus interface or signal
buffering applications requiring high speed and low power dissipation. These
devices have a flow through pin organization, and shrink packaging to simplify
board layout. All inputs are designed with hysteresis for improved noise margin.
The three-state controls allow independent 4-bit, 8-bit or combined 16-bit
operation. These parts are plug in replacements for 54/74ABT16244 where
higher speed, lower noise or lower power dissipation levels are desired.
The FCT162244T has balanced output current levels and current limiting
resistors. These offer low ground bounce, minimal undershoot, and controlled
output fall times, reducing the need for external series terminating resistors while
still providing very high speed operation for loads of less than 200pF.
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0.5 MICRON CMOS Technology
High-speed, low-power CMOS replacement for ABT functions
Typical tSK(o) (Output Skew) < 250ps
Low input and output leakage ≤ 1µA (max.)
ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
Balanced Output Drivers:
– ±24mA (industrial)
– ±16mA (military)
Reduced system switching noise
Typical VOLP (Output Ground Bounce) < 0.6V at VCC = 5V,
TA = 25°C
Available in the following packages:
– Industrial: SSOP, TSSOP
– Military: CERPACK
FUNCTIONAL BLOCK DIAGRAM
1OE
3OE
1A1
1Y1
1A2
1Y2
1A3
1Y3
3A3
1Y4
3A4
1A4
2OE
3A1
3Y1
3A2
3Y2
3Y3
3Y4
4OE
2A1
2Y1
2A2
2Y2
2A3
2A4
4A1
4Y1
4A2
4Y2
2Y3
4A3
4Y3
2Y4
4A4
4Y4
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
SEPTEMBER 2009
1
© 2009 Integrated Device Technology, Inc.
DSC-5461/9
IDT54/74FCT162244T/AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
ABSOLUTE MAXIMUM RATINGS(1)
PIN CONFIGURATION
1OE
1
48
Symbol
Description
Max
Unit
VTERM(2)
Terminal Voltage with Respect to GND
–0.5 to +7
V
2OE
VTERM(3)
Terminal Voltage with Respect to GND
–0.5 to VCC+0.5
V
TSTG
Storage Temperature
–65 to +150
°C
IOUT
DC Output Current
–60 to +120
mA
1Y1
2
47
1A1
1Y2
3
46
1A2
GND
4
45
GND
1Y3
5
44
1A3
1Y4
6
43
1A4
VCC
7
42
VCC
2Y1
8
41
2A1
2Y2
9
40
2A2
Symbol
10
39
GND
CIN
Input Capacitance
VIN = 0V
3.5
6
pF
COUT
Output Capacitance
VOUT = 0V
3.5
8
pF
GND
2Y3
11
38
2A3
2Y4
12
37
2A4
3Y1
13
36
3A1
3Y2
14
35
3A2
GND
15
34
GND
3Y3
16
33
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXXT Output and I/O terminals.
3. Output and I/O terminals terminals for FCT162XXXT and FCT166XXXT.
CAPACITANCE (TA = +25°C, F = 1.0MHz)
Parameter(1)
Conditions
Typ.
Max.
NOTE:
1. This parameter is measured at characterization but not tested.
PIN DESCRIPTION
Pin Names
Description
xOE
3-State Output Enable Inputs (Active LOW)
3A3
xAx
Data Inputs
xYx
3-State Outputs
3Y4
17
32
3A4
VCC
18
31
VCC
4Y1
19
30
4A1
4Y2
20
29
4A2
GND
21
28
GND
4Y3
22
27
4A3
4Y4
23
26
4A4
4OE
24
25
3OE
FUNCTION TABLE(1)
Inputs
xOE
xAx
xYx
L
L
L
L
H
H
H
X
Z
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High-Impedance
SSOP/ TSSOP/ CERPACK
TOP VIEW
2
Outputs
Unit
IDT54/74FCT162244T/AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10%; Military: TA = –55°C to +125°C, VCC = 5.0V ±10%
Symbol
Test Conditions(1)
Parameter
Min.
Typ.(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2
—
—
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
—
0.8
V
IIH
Input HIGH Current (Input pins)(5)
VCC = Max.
—
—
±1
µA
—
—
±1
—
—
±1
—
—
±1
VO = 2.7V
—
—
±1
VO = 0.5V
—
—
±1
—
–0.7
–1.2
V
–80
–140
–250
mA
—
100
—
mV
—
5
500
µA
Min.
60
–60
2.4
Typ.(2)
115
–115
3.3
Max.
200
–200
—
Unit
mA
mA
V
—
0.3
0.55
V
VI = VCC
Input HIGH Current (I/O pins)(5)
IIL
Input LOW Current (Input pins)(5)
VI = GND
Input LOW Current (I/O pins)(5)
IOZH
High Impedance Output Current
IOZL
(3-State Output pins)(5)
VIK
Clamp Diode Voltage
IOS
Short Circuit Current
VH
Input Hysteresis
ICCL
ICCH
ICCZ
Quiescent Power Supply Current
VCC = Max.
VCC = Min., IIN = –18mA
VCC = Max., VO =
GND(3)
—
VCC = Max.
VIN = GND or VCC
µA
µA
OUTPUT DRIVE CHARACTERISTICS
Symbol
IODL
IODH
VOH
VOL
Parameter
Output LOW Current
Output HIGH Current
Output HIGH Voltage
Output LOW Voltage
Test Conditions(1)
VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3)
VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3)
VCC = Min
IOH = –16mA MIL
VIN = VIH or VIL
IOH = –24mA COM'L
VCC = Min
IOH = 16mA MIL
VIN = VIH or VIL
IOH = 24mA COM'L
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. This test limit for this parameter is ±5µA at TA = –55°C.
3
IDT54/74FCT162244T/AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
—
0.5
1.5
mA
VIN = VCC
VIN = GND
—
60
100
µA/
MHz
VCC = Max.
Outputs Open
fi = 10MHz
VIN = VCC
VIN = GND
—
0.6
1.5
mA
50% Duty Cycle
xOE = GND
One Bit Toggling
VIN = 3.4V
VIN = GND
—
0.9
2.3
VCC = Max.
Outputs Open
fi = 2.5MHz
VIN = VCC
VIN = GND
—
2.4
4.5(5)
50% Duty Cycle
xOE = GND
Sixteen Bits Toggling
VIN = 3.4V
VIN = GND
—
6.4
16.5(5)
Symbol
Parameter
ΔICC
Quiescent Power Supply Current
TTL Inputs HIGH
VCC = Max.
VIN = 3.4V(3)
ICCD
Dynamic Power Supply
Current(4)
VCC = Max.
Outputs Open
xOE = GND
One Input Toggling
50% Duty Cycle
Total Power Supply Current(6)
IC
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ΔICC DHNT + ICCD (fCPNCP/2 + fiNi)
ICC = Quiescent Current (ICCL, ICCH and ICCZ)
ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
NCP = Number of Clock Inputs at fCP
fi = Input Frequency
Ni = Number of Inputs at fi
4
IDT54/74FCT162244T/AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
74FCT162244AT
74FCT162244CT
74FCT162244ET
Symbol
Parameter
Condition(1)
Min.(2)
Max.
Min.(2)
Max.
Min.(2)
Max.
Unit
tPLH
tPHL
Propagation Delay
xAx to xYx
CL = 50pF
RL = 500Ω
1.5
4.8
1.5
4.1
1.5
3.2
ns
tPZH
tPZL
Output Enable Time
1.5
6.2
1.5
5.8
1.5
4.4
ns
tPHZ
tPLZ
Output Disable Time
1.5
5.6
1.5
5.2
1.5
3.6
ns
tSK(o)
Output Skew(3)
—
0.5
—
0.5
—
0.5
ns
54FCT162244T
Min.(2)
54FCT162244AT
54FCT162244CT
Symbol
Parameter
Condition(1)
Max.
Min.(2)
Max.
Min.(2)
tPLH
tPHL
Propagation Delay
xAx to xYx
CL = 50pF
RL = 500Ω
Max.
Unit
1.5
7
1.5
5.1
1.5
4.6
ns
tPZH
tPZL
Output Enable Time
1.5
8.5
1.5
6.5
1.5
6.5
ns
tPHZ
tPLZ
Output Disable Time
1.5
7.5
1.5
5.9
1.5
5.7
ns
tSK(o)
Output Skew(3)
—
0.5
—
0.5
—
0.5
ns
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs, of the same package, switching in the same direction. This parameter is guaranteed by design.
5
IDT54/74FCT162244T/AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
V CC
SWITCH POSITION
7.0V
500Ω
V OUT
VIN
Pulse
Generator
50pF
Switch
Closed
All Other Tests
Open
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
D.U.T.
RT
Test
Open Drain
Disable Low
Enable Low
500Ω
CL
Test Circuit for All Outputs
DATA
INPUT
tH
tSU
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
tREM
tSU
3V
1.5V
0V
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
1.5V
tW
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
3V
1.5V
0V
tH
Pulse Width
Set-up, Hold, and Release Times
ENABLE
SAME PHASE
INPUT TRANSITION
tPLH
tPHL
OUTPUT
tPLH
OPPOSITE PHASE
INPUT TRANSITION
tPHL
3V
1.5V
0V
VOH
1.5V
VOL
DISABLE
3V
CONTROL
INPUT
tPZL
OUTPUT
NORMALLY
LOW
3V
1.5V
0V
SWITCH
CLOSED
tPLZ
3.5V
1.5V
tPZH
OUTPUT
NORMALLY
HIGH
Propagation Delay
SWITCH
OPEN
1.5V
0V
3.5V
0.3V
VOL
tPHZ
0.3V
1.5V
0V
VOH
0V
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
6
IDT54/74FCT162244T/AT/CT/ET
FAST CMOS 16-BIT BUFFER/LINE DRIVER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
ORDERING INFORMATION
XX
Temp. Range
FCT
XXX
Family
XXXX
Device Type
XX
Package
X
Process
Blank
B
Industrial
MIL-STD-883, Class B
PVG
PAG
Industrial Options
Shrink Small Outline Package - Green
Thin Shrink Small Outline Package - Green
E
Military Options
CERPACK
244T
244AT
244CT
244ET
16-Bit Buffer/Line Driver
162
Double-Density, 5 Volt, Balanced Drive
54
74
55 C to +125 C
40 C to +85 C
Datasheet Document History
09/06/09 Pg.6
Updated the ordering information by removing the "IDT" notation and non RoHS part.
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7
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