MONOLITHIC CLOCK SYNCHRONIZER (SERIES 3D6701)

3D6701
MONOLITHIC CLOCK
SYNCHRONIZER
(SERIES 3D6701)
FEATURES
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PINOUT
Synchronizes free-running clock to external gate signal
Input frequency range: 30MHz through 100MHz
Phase resolution: 200ps typical
Output frequency: Programmable from FIN to FIN/256
Output period jitter: Equal to jitter of clock source
All-silicon, low-power CMOS technology
TTL/CMOS compatible inputs and outputs
Vapor phase, IR and wave solderable
Auto-insertable (DIP pkg.)
VDD
1
16
VDD
FOUT
2
15
SEL
D0
3
14
D1
D2
4
13
D3
D4
5
12
D5
D6
6
11
D7
GIN
7
10
FIN
GND
8
9
GND
3D6701
DIP-16
3D6701R SOIC-16
For mechanical dimensions, click here.
For package marking details, click here.
FUNCTIONAL DESCRIPTION
PIN DESCRIPTIONS
One major drawback to using a crystal oscillator for frequency generation
is that the phase of the generated clock signal cannot be synchronized to
an external timing event. A delay-line oscillator (eg, the 3D7701), while
supporting this feature, cannot provide the stability and jitter performance
of a crystal. The 3D6701 clock synchronizer provides the best of both
worlds. The device accepts two inputs – a stable frequency source and a
gate signal – and matches the phase of the clock to the gate. It also
provides 8 bits of frequency scaling at the device output. The 3D6701
can be operated at 5V or 3.3V, and is offered in both a 16-pin DIP and a
space-saving 16-pin SOIC package.
FIN
Clock Input
GIN
Gate Input
D0-D7 Divisor Inputs
SEL VDD Select Input
FOUT Sync Oscillator Out
VDD +3.3 or +5 Volts
GND Ground
FIN
(Async)
GIN
DINH
TRES
OUT
(D=0)
OUT
(D=1)
OUT
(D=2)
Figure 1: Timing Diagram
2014 Data Delay Devices
Doc #14015
6/9/2014
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
1
3D6701
THEORY OF OPERATION
The 3D6701 clock synchronizer architecture is
shown in Figure 2. The FIN input is assumed to
come from a stable clock source, such as a
crystal oscillator. A rising edge on the GIN input
initiates the phase detection process. Once the
phase of the clock with respect to the gate has
been resolved, a delay line is adjusted to match
the phases of the two signals.
There is a finite resolution to the phase detection
process (typically under 500ps), so that, from one
gate trigger to the next, there will remain some
residual gate-to-output jitter. However, for a given
gate, the jitter from one clock cycle to the next is
equal to the jitter of the reference clock itself.
The 3D6701 also contains a programmable
divider that reduces the output frequency by an
amount given by the D7:0 inputs. FOUT is given by
FIN / (D+1), so that the output frequency may
range from FIN (D=0) to FIN / 256 (D=255). When
GIN returns low, the output returns to a low level
and remains there until the next rising edge of
GIN.
The performance of CMOS integrated circuits is
strongly dependent on power supply stability. It is
essential that the power supply pins be
adequately bypassed and filtered. In addition, the
power bus should be of as low an impedance
construction as possible. Power planes are
preferred.
When operating at 3.3V, tie the SEL input to
GND. When operating at 5.0V, tie the SEL
input to VDD.
GIN
Phase
Resolver
Programmable
Delay Line
FIN
8-Bit
Divider
FOUT
D7:0
Figure 2: 3D6701 Functional Block Diagram
DEVICE SPECIFICATIONS
TABLE 1: ABSOLUTE MAXIMUM RATINGS
PARAMETER
DC Supply Voltage
Input Pin Voltage
Input Pin Current
Storage Temperature
Lead Temperature
Doc #14015
6/9/2014
SYMBOL
VDD
VIN
IIN
TSTRG
TLEAD
MIN
-0.3
-0.3
-1.0
-55
MAX
7.0
VDD+0.3
1.0
150
300
UNITS
V
V
mA
C
C
NOTES
25C
10 sec
DATA DELAY DEVICES, INC.
Tel: 973-773-2299
Fax: 973-773-9672
http://www.datadelay.com
2
3D6701
DEVICE SPECIFICATIONS (Cont’d)
TABLE 2: DC ELECTRICAL CHARACTERISTICS
(-40C to 85C, 3.0V to 5.25V)
PARAMETER
Static Supply Current*
High Level Input Voltage
Low Level Input Voltage
High Level Input Current
Low Level Input Current
High Level Output Current
Low Level Output Current
SYMBOL
IDD
VIH
VIL
IIH
IIL
IOH
IOL
MIN
TYP
20.0
MAX
UNITS
mA
V
V
A
A
mA
mA
2.0
4.0
-35.0
15.0
0.8
1.0
1.0
-4.0
NOTES
VIH = VDD
VIL = 0V
VDD=4.75V, VOH=2.4V
VDD=4.75V, VOL=0.4V
*IDD will vary slightly for different input clock frequencies
TABLE 3: AC ELECTRICAL CHARACTERISTICS
(-40C to 85C, 3.0V to 3.6V)
PARAMETER
Input Frequency
Duty Cycle
Gate Frequency
Gate Inactive (Low)
Gate-to-Out Delay
SYMBOL
FIN
DC(FIN)
GIN
GIN,LOW
DINH
Gate-to-Out Delay
Jitter
ΔDINH
FOUT Period Jitter
Reset Time
MIN
30
40
TYP
MAX
80
60
1
200
157
136
120
420
460
780
50
TRES
10
UNITS
MHz
%
MHz
ns
ns
ns
ns
ps
ps
ps
ps
ns
NOTES
FIN=50MHz
FIN=62MHz
FIN=80MHz
FIN=50MHz
FIN=62MHz
FIN=80MHz
TABLE 4: AC ELECTRICAL CHARACTERISTICS
(-40C to 85C, 4.75V to 5.25V)
PARAMETER
Input Frequency
Duty Cycle
Gate Frequency
Gate Inactive (Low)
Gate-to-Out Delay
SYMBOL
FIN
DC(FIN)
GIN
GIN,LOW
DINH
Gate-to-Out Delay
Jitter
ΔDINH
FOUT Period Jitter
Reset Time
Doc #14015
6/9/2014
MIN
50
40
TYP
MAX
100
60
2
125
138
118
106
640
700
520
50
TRES
10
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
UNITS
MHz
%
MHz
ns
ns
ns
ns
ps
ps
ps
ps
ns
NOTES
FIN=50MHz
FIN=62MHz
FIN=80MHz
FIN=50MHz
FIN=62MHz
FIN=80MHz
3
3D6701
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
o
o
Ambient Temperature: 25 C  3 C
Supply Voltage (Vcc): 5.0V  0.1V
Input Pulse:
High = 3.0V  0.1V
Low = 0.0V  0.1V
Source Impedance:
50 Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6 and 2.4V)
OUTPUT:
Rload:
Cload:
Threshold:
Device
Under
Test
10K  10%
5pf  10%
1.5V (Rising & Falling)
Digital
Scope
10K
5pf
470
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
PRINTER
COMPUTER
SYSTEM
REF
PULSE
GENERATOR
GIN
FIN
OUT
TRIG
DEVICE UNDER
TEST (DUT)
FOUT
IN
TRIG
FREQUENCY/
TIME INTERVAL COUNTER
FREQ SOURCE
Figure 3: Test Setup
TRISE
TFALL
VIH
2.4V
1.5V
0.6V
GIN
1/FOSC
DINH
FOUT
2.4V
1.5V
0.6V
1.5V
VIL
TRES
1.5V
1.5V
Figure 4: Timing Diagram
Doc #14015
6/9/2014
DATA DELAY DEVICES, INC.
Tel: 973-773-2299
Fax: 973-773-9672
http://www.datadelay.com
4