3D10000 - Data Delay Devices, Inc.

3D10000
5-BIT ADJUSTABLE, HIGH B.W.
PASSIVE DELAY LINE
(SERIES 3D10000)
FEATURES
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PACKAGE
Delay adjustable in 31 steps
Delay step sizes of 0.5ns to 3ns available
Fast rise time for high frequency applications
I/O reversible
F-type female connectors
Meets or exceeds MIL-D-23859C
FUNCTIONAL DESCRIPTION
PIN DESCRIPTIONS
The 3D10000 device is a single-input, single-output, passive delay line.
IN
Signal Input (BNC)
The signal input (IN) is reproduced at the output (OUT), shifted by a time
OUT Signal Output (BNC)
(TD) which can be adjusted via five binary-weighted switches. The value
of these switches, multiplied by the device dash number, determines the
device delay (referenced to the delay with all the switches off). The characteristic impedance of the device
is nominally 75-ohms.
SERIES SPECIFICATIONS
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DASH NUMBER SPECIFICATIONS
Total Delay Tolerance: 3%
Minimum Delay
(all switches off):
12ns
Impedance:
75Ω
Ripple in pass-band: Approx. 0.2dB
Dielectric breakdown: 100 VDC
Operating temp:
-65C to +125C
Temperature coeff:
<100 PPM/C
Case dimensions:
17” x 13” x 5-1/4”
(43.2cm x 33.0cm x 13.3cm)
Part
Number
3D10000-0.5
3D10000-1
3D10000-1.4
3D10000-2
3D10000-3
Delay
Step
(ns)
0.5
1.0
1.4
2.0
3.0
Delay
Range
(ns)
15.5
31.0
43.4
62.0
93.0
Impedance
(Ω)
75
75
75
75
75
3dB
B.W.
(MHz)
380
380
380
380
380
Notes: 3db BW measured at maximum delay
Larger dash numbers are available in
larger form factors. Please contact factory
for details.
2015 Data Delay Devices
Doc #15001
1/5/2015
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
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3D10000
PASSIVE DELAY LINE TEST SPECIFICATIONS
TEST CONDITIONS
INPUT:
Ambient Temperature:
Input Pulse:
Source Impedance:
Rise/Fall Time:
Pulse Width:
Period:
25 C  3 C
High = +0.5V typical
Low = -0.5V typical
50 Max.
3.0 ns Max. (measured
at 10% and 90% levels)
PW IN = 100ns
PERIN = 1000ns
o
o
OUTPUT:
Rload:
Cload:
Threshold:
10M
10pf
50% (Rising & Falling)
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
RIN
OUT
PULSE
GENERATOR
IN
DEVICE UNDER
TEST (DUT)
IN
OUT
TRIG
TRIG
50 
RIN = ROUT = ZLINE
OSCILLOSCOPE
ROUT
Test Setup (Delay Measurements)
OUT
RF
IN R
Coax
IN A
Coax
50-OHM
SIGNAL
DIVIDER
OUT R (HP 35676
-66301)
OUT A
OUT B
IN
Coax
NETWORK
ANALYZER
(HP 3577A)
IN B
IMPEDANCE
MATCHING
NETWORK
IMPEDANCE
MATCHING
NETWORK
Coax
IN
GND
DEVICE
UNDER
TEST
OUT
GND
Test Setup (Frequency Response)
Doc #15001
1/5/2015
DATA DELAY DEVICES, INC.
Tel: 973-773-2299
Fax: 973-773-9672
http://www.datadelay.com
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