1103 GA35XCP12-247 - GeneSiC Semiconductor

GA35XCP12-247
IGBT/SiC Diode Co-pack
Features
Package
• Optimal Punch Through (OPT) technology
• SiC freewheeling diode
• Positive temperature coefficient for easy paralleling
• Extremely fast switching speeds
• Temperature independent switching behavior of SiC rectifier
• Best RBSOA/SCSOA capability in the industry
• High junction temperature
• Industry standard packaging
• RoHS Compliant
VCES
=
1200 V
ICM
VCE(SAT)
=
35 A
=
3.0 V
2
1
1
2
3
3
TO – 247AB
Advantages
Applications
• Industry's highest switching speeds
• High temperature operation
• Improved circuit efficiency
• Low switching losses
• Solar Inverters
• Aerospace Actuators
• Server Power Supplies
• Resonant Inverters > 100 kHz
• Inductive Heating
• Electronic Welders
Maximum Ratings, at Tj = 150 °C, unless otherwise specified
Parameter
Symbol
IGBT
Collector-Emitter Voltage
DC-Collector Current
Gate Emitter Peak Voltage
Operating Temperature
Storage Temperature
VCES
ICM
VGES
Tvj
Tstg
Free-wheeling diode
DC-Forward Current
Non Repetitive Peak Forward Current
Surge Non Repetitive Forward Current
IF
IFM
IF,SM
RthJC
RthJC
Conditions
Values
Unit
1200
35
± 20
-40 to +150
-40 to +150
V
A
V
ºC
ºC
tP = 10 ms, half sine, Tc = 25 ºC
35
tbd
tbd
A
A
A
IGBT
SiC diode
0.34
0.31
K/W
K/W
Tc ≤ 105 ºC
Tc ≤ 105 ºC
Tc = 25 ºC, tP = 10 μs
Thermal Characteristics
Th. Resistance Junction to Case
Th. Resistance Junction to Case
Mechanical Properties
Mounting Torque
min.
1.5
Md
Values
typ.
max.
2
Nm
http://www.genesicsemi.com/index.php/sic-products/copack
January 2011
Preliminary Datasheet
http://www.genesicsemi.com
Page 1 of 5
GA35XCP12-247
Electrical Characteristics
Parameter
IGBT
Gate Threshold Voltage
Collector-Emitter Leakage Current
Gate-Leakage Current
Collector-Emitter Threshold Voltage
Collector-Emitter Slope Resistance
Collector-Emitter Saturation Voltage
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Charge
Reverse Bias Safe Operating Area
Short Circuit Current
Short Circuit Duration
Rise Time
Fall Time
Turn On Delay Time
Turn Off Delay Time
Turn-On Energy Loss Per Pulse
Turn-Off Energy Loss Per Pulse
Symbol
Conditions
VGE(th)
ICES,25
ICES,150
IGES
VCE(TO)
RCE,25
RCE,150
VCE(SAT)
Cies
Coes
Cres
QG
RBSOA
Isc
tsc
tr
tf
td(on)
td(off)
Eon
Eoff
VGE = VCE, IC = 0.6 mA, Tj = 25 ºC
VGE = 0 V, VCE = VCES, Tj = 25 ºC
VGE = 0 V, VCE = VCES, Tj = 150 ºC
VCE = 0 V, VGE = 20 V, Tj = 25 ºC
Tj= 25ºC
VGE = 15 V, Tj = 25 ºC
VGE = 15 V, Tj = 150 ºC
IC = 35 A, VGE = 15 V, Tj = 25 ºC(150 ºC)
min.
VCC= 800 V, IC = 35 A,
Rgon = Rgoff = 22 Ω,
VGE(0n)= 15 V, VGE(0ff)= -8 V,
Tj= 125 ºC
VF
IF = 35 A, VGE = 0 V, Tj = 25 ºC (150 ºC )
2.6(3.5)
V
VD(TO)
Irrm
trr
Tj = 25 ºC
0.8
3.01
36
V
A
ns
190
A/μs
Tj = 125 ºC, Rg = 56Ω,
VCC = 900 V, VGE = ±15 V
6.5
0.2
Unit
85
205
40
232
2.66
4.35
VCC= 800 V, IC = 35 A, VGE= 15V
Tj=125 ºC, Rg=56Ω, VCC=1200 V, VGE=15 V
6
0.02
0.3
max.
V
mA
mA
nA
V
mΩ
mΩ
V
nF
nF
nF
nC
A
A
μs
ns
ns
ns
ns
mJ
mJ
VGE = 0 V, VCE = 25 V, f = 1 MHz
5.5
Values
typ.
500
1.1
50
87.5
3.0(3.9)
tbd
tbd
tbd
50
45
60
10
Free-wheeling diode
Forward Voltage
Threshold Voltage at Diode
Peak Reverse Recovery Current
Reverse Recovery Time
Diode peak rate of fall of reverse recovery current
during tb
Figure 1: Typical Output Characteristics at 25 oC
January 2011
dIrr/dt
IF = 35 A, VGE = 0 V, VR = 650 V
-dIF/dt = 300 A/μs, Tj = 125 ºC
Figure 2: Typical Output Characteristics at 150 oC
Preliminary Datasheet
http://www.genesicsemi.com
Page 2 of 5
GA35XCP12-247
Figure 3: Typical Transfer Characteristics
Figure 4: Typical Blocking Characteristics
Figure 5: Typical FWD Forward Characteristics
Figure 6: Typical Turn On Gate Charge
Figure 7: Typical Turn On Energy Losses and Switching Times
Figure 8: Typical Turn Off Energy Losses and Switching Times
January 2011
Preliminary Datasheet
http://www.genesicsemi.com
Page 3 of 5
GA35XCP12-247
Figure 9: Typical Reverse Recovery Currents and Times
Package Dimensions:
TO-247AB
PACKAGE OUTLINE
NOTE
1. CONTROLLED DIMENSION IS INCH. DIMENSION IN BRACKET IS MILLIMETER.
2. DIMENSIONS DO NOT INCLUDE END FLASH, MOLD FLASH, MATERIAL PROTRUSIONS
January 2011
Preliminary Datasheet
http://www.genesicsemi.com
Page 4 of 5
GA35XCP12-247
Revision History
Date
2011/01/06
Revision
1
Comments
First generation release
Supersedes
Published by
GeneSiC Semiconductor, Inc.
43670 Trade Center Place Suite 155
Dulles, VA 20166
GeneSiC Semiconductor, Inc. reserves right to make changes to the product specifications and data in this document without notice.
GeneSiC disclaims all and any warranty and liability arising out of use or application of any product. No license, express or implied to any
intellectual property rights is granted by this document.
Unless otherwise expressly indicated, GeneSiC products are not designed, tested or authorized for use in life-saving, medical, aircraft
navigation, communication, air traffic control and weapons systems, nor in applications where their failure may result in death, personal injury
and/or property damage.
January 2011
Preliminary Datasheet
http://www.genesicsemi.com
Page 5 of 5