TS9414VA Datasheet

TS9414VA
www.vishay.com
Vishay Semiconductors
Specification of High Power IR Emitting Diode Chip
FEATURES
• Package type: chip
• Package form: single chip
• Technology: surface emitter
• Dimensions chip (L x W x H in mm):
0.355 x 0.355 x 0.17
• Peak wavelength: λ = 940 nm
• Material categorization:
for definitions of compliance please see
www.vishay.com/doc?99912
DESCRIPTION
TS9414VA is a high power infrared, 940 nm surface emitting
diode in GaAlAs technology with high radiant power and
high speed. Polarity configuration is “n-up”.
GENERAL INFORMATION
The datasheet is based on Vishay optoelectronics sample testing under certain predetermined and assumed conditions, and is
provided for illustration purpose only. Customers are encouraged to perform testing in actual proposed packaged and used
conditions. Vishay optoelectronics die products are tested using Vishay optoelectronics based quality assurance procedures
and are manufactured using Vishay optoelectronics established processes. Estimates such as those described and set forth in
this datasheet for semiconductor die will vary depending on a number of packaging, handling, use, and other factors. Therefore
sold die may not perform on an equivalent basis to standard package products.
PRODUCT SUMMARY
COMPONENT
φe (mW)
Ie (mW/sr)
ϕ (deg)
λp (nm)
tr (ns)
35
10
60
940
10
TS9414VA
Note
• Test condition see table “Basic Characteristics”
ORDERING INFORMATION
ORDERING CODE
TS9414VA-SF-F
PACKAGING
REMARKS
PACKAGE FORM
wafer sawn on foil
MOQ: 25 000 pcs
chip
Note
• MOQ: minimum order quantity
ABSOLUTE MAXIMUM RATINGS (Tamb = 25 °C, unless otherwise specified)
PARAMETER
TEST CONDITION
Forward current
Reverse voltage
Surge forward current
Junction temperature
tp/T = 0.1, tp = 100 μs
SYMBOL
VALUE
UNIT
IF
100
mA
VR
5
V
IFSM
1
A
Tj
100
°C
Operating temperature range
Tamb
-40 to +85
°C
Storage temperature range chip
Tstg1
-40 to +85
°C
Storage temperature range on foil
Tstg2
-40 to +40
°C
Rev. 1.0, 19-Feb-15
Document Number: 84275
1
For technical questions, contact: [email protected]
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
TS9414VA
www.vishay.com
Vishay Semiconductors
BASIC CHARACTERISTICS (Tamb = 25 °C, unless otherwise specified)
PARAMETER
Forward voltage
Radiant power
TEST CONDITION
SYMBOL
IF = 100 mA, tp = 20 ms
VF
IF = 100 mA
φe
IF = 100 mA
Ie
IR = 5 μA
VR
10
V
IF = 100 mA
ϕ
± 60
deg
(1)
Radiant intensity (2)
Reverse voltage
Angle of half intensity
MIN.
TYP.
MAX.
UNIT
1.45
1.8
V
15
mW/sr
35
5
mW
10
Peak wavelength
IF = 100 mA
λp
Spectral bandwidth
IF = 1000 mA
Δλ
40
nm
Rise time / fall time
IF = 100 mA, 20 % to 80 %
t r , tf
10
ns
920
940
960
nm
Notes
(1) The measurements are based on samples of die which are mounted on a TO-18 gold header without resin coating
(2) The radiant intensity, I , is measured on the geometric axis of the TO-18 header
e
BASIC CHARACTERISTICS (Tamb = 25 °C, unless otherwise specified)
0°
0.7
0.6
0.5
0.4
0.3
0.2
0.1
850
20°
30°
0.8
0.0
800
10°
900
950
1000
40°
1.0
0.9
50°
0.8
60°
70°
0.7
ϕ - Angular Displacement
0.9
IF = 100 mA
Ie, rel - Relative Radiant Intensity
Ie - Relative Radiant Intensity (%)
1.0
80°
1050
0.6
λ - Wavelength (nm)
0.4
0.2
0
948013-1
Fig. 1 - Relative Radiant Intensity vs. Wavelength
Fig. 2 - Relative Radiant Intensity vs. Angular Displacement
MECHANICAL DIMENSIONS
PARAMETER
SYMBOL
MIN.
TYP.
MAX.
UNIT
Length of chip edge (x-direction)
Lx
0.355
mm
Length of chip edge (y-direction)
Ly
0.355
mm
Die height
H
0.17
mm
Diameter of bondpad
d
0.100
mm
ADDITIONAL INFORMATION
Frontside metallization, cathode
gold alloy
Backside metallization, anode
gold alloy
Dicing
Die bonding technology
sawing
epoxy bonding
Note
• All chips are checked in accordance with the Vishay Semiconductor, specification of visual inspection FVOV6870.
The visual inspection shall be made in accordance with the “specification of visual inspection as referenced”. The visual inspection of chip
backside is performed with stereo microscope with incident light and 40x to 80x magnification.
The quality inspection (final visual inspection) is performed by production. An additional visual inspection step as special release procedure
by QM is not installed.
Rev. 1.0, 19-Feb-15
Document Number: 84275
2
For technical questions, contact: [email protected]
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
TS9414VA
www.vishay.com
Vishay Semiconductors
HANDLING AND STORAGE CONDITIONS
• The hermetically sealed shipment lots shall be opened in temperature and moisture controlled cleanroom environment only.
It is mandatory to follow the rules for disposition of material that can be hazardous for humans and environment.
• Product must be handled only at ESD safe workstations. Standard ESD precautions and safe work environments are as
defined in MIL-HDBK-263.
• Singulated die are not to be handled with tweezers. A vacuum wand with non metallic ESD protected tip should be used.
PACKING
Chips are fixed on adhesive foil. Upon request the foils can be mounted on plastic frame or disco frame. For shipment, the
wafers are arranged to stacks and hermetically sealed in plastic bags to ensure protection against environmental influence
(humidity and contamination).
Use for recycling reliable operators only. We can help getting in touch with your nearest sales office. By agreement we will take
back packing material, if it is sorted. You will have to bear the costs of transport. We will invoice you for any costs incurred for
packing material that is returned unsorted or which we are not obliged to accept.
Rev. 1.0, 19-Feb-15
Document Number: 84275
3
For technical questions, contact: [email protected]
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
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www.vishay.com
Vishay
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definitions and restrictions defined under Directive 2011/65/EU of The European Parliament and of the Council
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Revision: 02-Oct-12
1
Document Number: 91000