AOS Semiconductor Product Reliability Report

AOS Semiconductor
Product Reliability Report
AOZ3013PI
Rev 1.0
Plastic Encapsulated Device
ALPHA & OMEGA Semiconductor, Inc
475 Oakmead Pkwy
Sunnyvale, CA 94085
U.S.
Tel: (408) 830-9742
www.aosmd.com
Oct 8, 2013
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This AOS product reliability report summarizes the qualification result for AOZ3013PI (epad SO8
package).
Review of the electrical test results confirm that AOZ3013PI passed AOS quality and reliability
requirements for product manufacturing release (RTM). The continuous qualification testing and
reliability monitoring program ensure that all outgoing products will continue to meet AOS quality and
reliability standards.
Table of Contents:
I.
II.
III.
IV.
V.
VI.
I.
Product Description
Package and Die information
Qualification Test Requirements
Qualification Tests Result
Reliability Evaluation
Revision History
Product Description:
AOZ3013PI is high efficiency, simple to use, 3A synchronous buck regulator.
AOZ3013PI are Au&Cu mixed bonding wire version of AOZ3011PI product. Both are derivatives of AOZ105x
product family and AOZ103x product family with improved manufacturability – updated LX pad location to
eliminate down bonding.
AOZ3013PI works from a 4.5V to 18V input voltage range, and output voltage adjustable down to 0.8V. It is
offered in epad SO-8 package.
Absolute Maximum Ratings
Parameter
Supply Voltage (VIN)
LX to AGND
LX to AGND
EN to AGND
FB to AGND
COMP to AGND
PGND to AGND
Junction Temperature (TJ)
Storage Temperature (TS)
Thermal Characteristics
Package Thermal Resistance (ΘJA)
II.
20V
-0.7V to VIN+0.3 V
-5V to 22V(20ns)
-0.3V to VIN+0.3 V
-0.3V to 6 V
-0.3V to 6 V
-0.3V to 0.3 V
+150°C
-65°C to +150°C
50°C/W (typ.)
Package and Die Information:
Product ID
Process
Lead Frame
Die Attach
Bond wire
Mold Material
MSL
AOZ3013PI (epad SO-8)
UMC 5V/20V 2P3M 23BV
A194FH
8006NS(WBC)/ 84-3J (controller IC) / 84-1 LMISR4
Au&Cu
G630AY
Level 2
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III.
•
•
•
•
IV.
Qualification Tests Requirement
1 lot of AOZ3013PI 168-hr Burn-in (HTOL)
1 lot of AOZ3013PI ESD test
17 lots of HTOL results (including previously released products with same processing) for final release
to manufacturing.
4 lots of package qual testing for SO8_EP1 for final release to manufacturing.
Qualification Tests Results
Test Item Test Condition Sample Size
HTOL
Per
JESD 22-A108_B
Temp = 125 °C
Result
Comment
1 lot of AOZ3013PI
Passed
1 AOZ3013PI lot (BA014) passed 168hrs.
3 lots of AOZ3011PI
Passed
2 AOZ3011PI lots (BA001) passed 500 hrs.
1 AOZ3011PI lot (BA004) passed 500 hrs.
1 lot of AOZ3017PI
Passed
1 AOZ3017PI lot (BA002) passed 500hrs.
1 lot AOZ1051PI
Passed
1 AOZ1051PI lot (BA004) passed 500 hrs.
1 lot AOZ1051PI
Passed
1 AOZ1051PI lot (BA007) passed 168 hrs.
Passed
1 AOZ1096PI lot (BAB01) passed 168 hrs.
Passed
1 AOZ1033AI lot (BA001) passed 168 hrs.
Passed
Passed
1 AOZ1034PI lot (BA011) passed 168 hrs.
1 AOZ1034PI lot (BA013) passed 1000 hrs.
Passed
1 AOZ1036PI lot (BA020) passed 168 hrs.
Passed
1 AOZ1038PI lot (BA006) passed 168 hrs.
Passed
3 AOZ1037PI lots (BA003/BA006/BA011)
passed 500 hrs.
Passed
1 AOZ1037PI lot (BA013) passed 168 hrs.
Passed
1 AOZ1031AI lots (BA030) passed 168 hrs.
1 lot AOZ1096PI
1 lot AOZ1033AI
1 lot AOZ1034PI
1 lot AOZ1034PI
1 lot AOZ1036PI
1 lot AOZ1038PI
3 lots AOZ1037PI
1 lot AOZ1037PI
1 lot AOZ1031AI
ESD
(HBM, MM,
CDM)
Per
JESD 22-A114,
JESD 22-A115-A,
1 AOZ3013PI lot
1 AOZ3013PI lot
1 AOZ3013PI lot
Passed
Passed
Passed
1 AOZ3013PI lot (BA014) passed 2KV HBM
1 AOZ3013PI lot (BA014) passed 200V MM
1 AOZ3013PI lot (BA014) passed 1000V CDM
Latch-up
Per JESD 78
1 AOZ3013PI lot
Passed
1 AOZ3013PI lot (BA014) passed Latch-up
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SO8_EP1 Package Qual Data
HTOL
Per JESD 22-A108_B
Temp = 125 °C
4 lots
Passed
4 AOZ3013PI lots
(BA003/BA004/BA005/BA007) passed 500hr.
BI.
PreConditioning
Per JESD 22-A113
0
85 C /85%RH, 3 cyc
0
[email protected] C
4 lots
Passed
4 AOZ3013PI lots
(BA003/BA004/BA005/BA007) passed
preconditioning.
HAST
130±2°C, 85%RH,
33.3PSI, at Vcc min
power dissipation
4 lots
Passed
4 AOZ3013PI lots
(BA003/BA004/BA005/BA007) passed HAST
100 hrs.
Temperature
Cycle
-65°C to +150°C
air to air (2cyc/hr)
4 lots
Passed
4 AOZ3013PI lots
(BA003/BA004/BA005/BA007) passed TC 500.
Pressure Pot
121°C, 15±1 PSIG,
RH= 100%
4 lots
Passed
4 AOZ3013PI lots
(BA003/BA004/BA005/BA007) passed PCT
96hr.
V.
Reliability Evaluation
The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in sample size of
the product. Failure Rate Determination is based on JEDEC Standard JESD 85. FIT means one failure per
billion hours.
FIT rate (per billion): 10.8
MTTF = 92.59 million hrs.
The failure rate (λ) is calculated as follows:
λ=
χ 2 [CL, (2 f + 2)]
2
×
1
SS × t × AF
……..
[Equation 1]
Where CL = % of confidence level
f = number of failure
SS = sample size
t = stress time
Looking up the
χ2
2
table for zero failure (in HTOL) with 60% confidence, the value of
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χ 2 [CL, (2 f + 2)]
2
is 0.92.
The Acceleration Factor (AF) is calculated from the following formula:
 E   1
1 
− 
AF = exp  A  • 
 k   TO TS 
……..
[Equation 2]
Where EA = activation energy
k = Boltzmann constant
TO = operating TJ
TS = stress TJ
Applying typical operating environment, TO = 55°C; EA = 0.7eV and TS = 140°C

1
1
0.7

 
−
AF = exp 
 = 164
•
 8.617 E − 5   273 + 55 273 + 140 
Taking the result of HTOL (AOZ3013 Lot and previous similar products - see HTOL results in section IV), the
total device stress time
Substituting the values in equation 1, we have
λ = 0.92 ×
1
-1
= 1.08E-8 hr
or 10.8 FIT
(1 × 80 × 168 + 8 × 80 × 168 + 8 × 80 × 500 + 1 × 80 × 1000) × 164
MTTF = (1/ λ) = 92.59 million hours or 10570 years
The calculation shows that under typical operating environment, the device failure rate is less than 10.8 FIT or
an MTTF of over 92.59 million hour.
The qualification test results confirm that AOZ3013PI passed AOS quality and reliability
requirements for product manufacturing release (RTM).
VI.
Revision
1.0
Revision History
Release Date
Oct 8, 2013
Comments
Initial Release
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