Designed and Manufactured in Germany Specification Oscillator type: Rev.: 1 Date: 2014-07-09 AXIOM30-15 High Stability Miniature OCXO with HCMOS Output Parameter min. Nominal frequency Frequency stability Initial tolerance @ +25°C vs. operating temperature range operating temperature range vs. supply voltage variation vs. load change Long term (aging) per day st Long term (aging) 1 year Frequency adjustment range Electronic Frequency Control (EFC) EFC voltage VC EFC slope (∆f / ∆VC) EFC input impedance Reference voltage VRef RF output Signal waveform Load Rise & decay time Symmetry (duty cycle) Warm-up time Supply voltage VS Current consumption (steady state) Current consumption (warm-up) Operable temperature range Storage temperature range Enclosure (see drawing) (LxWxH) Weight Packing ESD Sensitivity typ. max. Unit 12.800 MHz ±500 ppb ppb °C ppb ppb ppb ppb -10 ±1 ±0.8 0V ±10 +60 ± 10 ± 10 ±2 ±100 Condition @ VC = VRef/2 steady state ±5% ±5% after 30 days operation after 30 days operation ppm VRef Positive 100 3.8 4.0 4.2 kΩ V 10 60 5 5.25 200 500 +70 +85 pF ns % min V mA mA °C °C HCMOS 15 40 4.75 5.0 -20 -40 20.5x20.5x12 max. 10 Palette 1500 ∆ffinal/f0 < ± 0.1 ppm @ +25°C mm g IEC 60679-3 CO 41 V HBM as in IEC 61000-4-2 Notes: 1. Terminology and test conditions are according to IEC standard IEC60679-1, unless otherwise stated Ordering Code: Model (Specification) AXIOM30-15 GmbH & Co. KG Roemerring 9 D-74821 Mosbach Germany Revision Rev.1 Frequency [MHz] 12.800 AXIOM30-15 Rev.1 Drawing D1 Page 1(2) www.axtal.com fon: +49 (6261) 939834 fax: +49 (6261) 939836 E-mail: [email protected] Designed and Manufactured in Germany Enclosure drawing Pin connections Pin # 1 2 3 4 5 Symbol Vs RF OUT GND VC VRef Function Supply Voltage RF Output Ground Control Voltage (EFC) Reference Voltage Environmental conditions Test Sealing tests (if applicable) Solderability Resistance to soldering heat Shock* Vibration, sinusoidal* Vibration, random* Endurance tests - ageing - extended aging IEC 60068 Part … 2-17 IEC 60679-1 Clause 5.6.2 MIL-STD202G Method 112E MIL-STD810F Method MIL-PRF55310D Clause 3.6.1.2 2-20 2-58 5.6.3 208H 210F 2-27 5.6.8 213B 516.4 3.6.40 2-6 5.6.7.1 516.4-4 2-64 5.6.7.3 201A 204D 214A 3.6.38.1 3.6.38.2 3.6.38.3 3.6.38.4 3.6.52 3.6.48 514.5 Test conditions (IEC) Gross leak: Test Qc, Fine leak: Test Qk Test Ta Method 1 Test Td1 Method 2 Test Td2 Method 2 Test Ea, 3 x per axes 100g, 6 ms half-sine pulse Test Fc, 30 min per axes, 10 Hz - 55 Hz 0,75mm; 55 Hz - 2 kHz, 10g Test Fdb 108A 5.7.1 5.7.2 4.8.35 30 days @ 85°C, OCXO @25°C 1000h, 2000h, 8000h @85°C Revision History Rev. Drawing Date [dd.mm.yyyy] 1 1 D0 D1 04.03.2008 09.07.2014 GmbH & Co. KG Roemerring 9 D-74821 Mosbach Germany Remarks First issue Editorial changes AXIOM30-15 Rev.1 Drawing D1 Page 2(2) Author Checked BN HH BN HH www.axtal.com fon: +49 (6261) 939834 fax: +49 (6261) 939836 E-mail: [email protected]