International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 QUALIFICATION REPORT Title Product/Part # * Qualification Level Silicon Technology Mositure Sensitivity SOT-223 Pb free Qualification SOT-223 devices Q101 (or current qualification level) FET MSL1 @ 260°C REVISION HISTORY # A Date 12/2/03 Author Rel Engr Description of Changes Initial release INTRODUCTION In compliance with worldwide Industry initiative of “Lead Free” material for semiconductor fabrication, International Rectifier is proposing the conversion of the existing 85Sn/15Pb solder plating process to a Pb-free 100%Sn plating process for the assembly of SOT-223 devices. SUMMARY/CONCLUSION Based on the results of reliability stress testing, the SOT-223 100%Sn plating process is qualified. This qualification has been performed to the Q101 qualification level and allows qualification of currently Q101, Industrial and Consumer level qualified SOT-223 devices. The reflow temperature during surface mount of these devices should not exceed 260°C. Reliability Engineer Page 1 International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 QUALIFICATION TEST RESULTS Part Type Tests IRFL014 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2561A4 -55°C/150°C 1000 cycles 1 lot x 77 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2561B4 85°C/85%RH/48V 1000 hours 1 lot x 77 devices 0 failures Autoclave 2561F4 121°C/100%RH/15psig 96 hours 1 lot x 77 devices 0 failures Part Type Tests IRFL9014 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2561A5 -55°C/150°C 1000 cycles 1 lot x 77 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2561B2 85°C/85%RH/-48V 1000 hours 1 lot x 77 devices 0 failures Autoclave 2561F2 121°C/100%RH/15psig 96 hours 1 lot x 77 devices 0 failures Page 2 International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 Part Type Tests IRLL2705 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2561A6 -55°C/150°C 1000 cycles 1 lot x 77 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2705B6 85°C/85%RH/44V 1000 hours 1 lot x 77 devices 0 failures Autoclave 2561F6 121°C/100%RH/15psig 96 hours 1 lot x 77 devices 0 failures Part Type Tests IRFL214 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2561A7 -55°C/150°C 1000 cycles 1 lot x 77 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2561B7 85°C/85%RH/100V 1000 hours 1 lot x 77 devices 0 failures High Temperature Reverse Bias 2561C7 150°C/200V 1000 hours 1 lot x 77 devices 0 failures High Temperature Gate Bias 2561D7 150°C/20V 1000 hours 1 lot x 77 devices 0 failures Autoclave 2561F7 121°C/100%RH/15psig 96 hours 1 lot x 77 devices 0 failures Page 3 International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 Part Type Tests IRLL3303 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2561A8-11 -55°C/150°C 1000 cycles 4 lots x 77 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2561B8-11 85°C/85%RH/24V 1000 hours 4 lots x 77 devices 0 failures High Temperature Reverse Bias 2561C8-11 150°C/24V 1000 hours 3 lots x 77 devices 0 failures High Temperature Gate Bias 2561D8-11 150°C/16V 1000 hours 4 lots x 77 devices 0 failures Intermittent Operating Life (Power Cycling) 2561E9-11 ∆Tj = 100°C 15,000 cycles 3 lots x 77 devices 0 failures Autoclave 2797F1-3 121°C/100%RH/15psig 96 hours 3 lots x 77 devices 0 failures Page 4