International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 QUALIFICATION REPORT Title Product/Part # * Qualification Level MSL Silicon Technology Micro-3 Pb free plating Qualification Gen-5 and Gen-8 Micro3 devices Consumer MSL1@260°C FET REVISION HISTORY # A Date 3/15/04 Author Rel Engr. Description of Changes Initial Draft INTRODUCTION In compliance with worldwide Industry initiative of “Lead Free” material for semiconductor fabrication, IR is proposing the conversion of the existing 70-90Sn, Bal=Pb solder plating process to a more environment friendly 100% Sn plating process for the assembly of Micro-3 devices. SUMMARY/CONCLUSION Based on the results of reliability stress testing, the Micro-3 devices assembled with 100%Sn plating are qualified to Consumer Level. The surface mount reflow temperature for these devices should not exceed 260°C. Reliability Engineer Page 1 International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 QUALIFICATION TEST RESULTS Part Type Tests IRLML5103 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2804A3 -55°C/150°C 1000 cycles 1 lot x 55 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2804B3 85°C/85%RH/-24V 1000 hours 1 lot x 55 devices 0 failures High Temperature Reverse Bias 2804C3 150°C/-24V 1000 hours 1 lot x 55 devices 0 failures High Temperature Gate Bias 2804D3 150°C/-16V 1000 hours 1 lot x 55 devices 0 failures Page 2 International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 Part Type Tests IRLML2804 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2804A4 -55°C/150°C 1000 cycles 1 lot x 55 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2804B4 85°C/85%RH/24V 1000 hours 1 lot x 55 devices 0 failures High Temperature Reverse Bias 2804C4 150°C/24V 1000 hours 1 lot x 55 devices 0 failures High Temperature Gate Bias 2804D4 150°C/16V 1000 hours 1 lot x 55 devices 0 failures Page 3 International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 Part Type Tests IRLML2502 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2804A1 -55°C/150°C 1000 cycles 1 lot x 55 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2804B1 85°C/85%RH/16V 1000 hours 1 lot x 55 devices 0 failures High Temperature Reverse Bias 2804C1 150°C/16V 1000 hours 1 lot x 55 devices 0 failures High Temperature Gate Bias 2804D1 150°C/9.6V 1000 hours 1 lot x 55 devices 0 failures Page 4 International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 Part Type Tests IRLML6401 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2804A2 -55°C/150°C 1000 cycles 1 lot x 55 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2804B2 85°C/85%RH/-9.6V 1000 hours 1 lot x 55 devices 0 failures High Temperature Reverse Bias 2804C2 150°C/-9.6V 1000 hours 1 lot x 55 devices 0 failures High Temperature Gate Bias 2804D2 150°C/-9.6V 1000 hours 1 lot x 55 devices 0 failures Page 5 International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 Part Type Tests IRLML2402 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2804A5 -55°C/150°C 1000 cycles 1 lot x 55 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2804B5 85°C/85%RH/16V 1000 hours 1 lot x 55 devices 0 failures High Temperature Reverse Bias 2804C5 150°C/16V 1000 hours 1 lot x 55 devices 0 failures High Temperature Gate Bias 2804D5 150°C/16V 1000 hours 1 lot x 55 devices 0 failures Page 6 International Rectifier – Temecula Reliability Laboratory QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154 Part Type Tests IRLML6402 Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Test: R#: Conditions: Duration: Quantity: Failures: Temperature Cycling 2804A6 -55°C/150°C 1000 cycles 1 lot x 55 devices 0 failures High Humidity, High Temperature Reverse Bias (H3TRB) 2804B6 85°C/85%RH/-16V 1000 hours 1 lot x 55 devices 0 failures High Temperature Reverse Bias 2804C6 150°C/-16V 1000 hours 1 lot x 55 devices 0 failures High Temperature Gate Bias 2804D6 150°C/-9.6V 1000 hours 1 lot x 55 devices 0 failures Page 7