Data Sheet

HT93LC46
CMOS 1K 3-Wire Serial EEPROM
Features
General Description
• Operating voltage: 1.8V~5.5V
The HT93LC46 is a 1K-bit low voltage nonvolatile,
serial electrically erasable programmable read only
memory device using the CMOS floating gate process.
Its 1024 bits of memory are organized into 64 words of
16 bits each when the ORG pin is connected to VCC or
organized into 128 words of 8 bits each when it is tied to
VSS. The device is optimized for use in many industrial
and commercial applications where low power and low
voltage operation are essential. By popular microcontroller, the versatile serial interface including chip select
(CS), serial clock (SK), data input (DI) and data output
(DO) can be easily controlled.
• Low power consumption
–– Operating: 5mA max.
–– Standby: 2µA max.
• User selectable internal organization
–– 1K: 128×8 or 64×16
• 3-wire Serial Interface
• Write cycle time: 5ms max.
• Automatic erase-before-write operation
• Word/chip erase and write operation
• Write operation with built-in timer
• Software controlled write protection
• 40-year data retention
• 106 rewrite cycles per word
• Industrial temperature range (−40°C to +85°C)
• 8-pin DIP/SOP/TSSOP package
Block Diagram
 
      ­  € Pin Assignment
Rev. 2.10
1
January 16, 2014
HT93LC46
Pin Description
Pin Name
I/O
Description
CS
I
Chip select input
SK
I
Serial clock input
DI
I
Serial data input
DO
O
Serial data output
VSS
—
Negative power supply, ground
ORG
I
Internal Organization
When ORG is connected to VDD or ORG is floated, the (×16) memory organization is selected.
When ORG is tied to VSS, the (×8) memory organization is selected. There is an internal pull-up
resistor on the ORG pin.
NC
—
No connection
VCC
—
Positive power supply
Absolute Maximum Ratings
Supply Voltage .......................... VSS−0.3V to VSS+6.0V
Storage Temperature............................−50°C to 125°C
Input Voltage............................. VSS−0.3V to VCC+0.3V
Operating Temperature..........................−40°C to 85°C
Note: These are stress ratings only. Stresses exceeding the range specified under ″Absolute Maximum Ratings″
may cause substantial damage to the device. Functional operation of this device at other conditions beyond
those listed in the specification is not implied and prolonged exposure to extreme conditions may affect
device reliability.
D.C. Characteristics
Symbol
Parameter
Ta=-40°C~+85°C
Test Conditions
VCC
Conditions
Min.
Typ.
Max.
Unit
VCC
Operating Voltage
—
−40°C to +85°C
1.8
—
5.5
V
ICC1
Operating Current (TTL)
5V
DO unload, SK=1MHz
—
—
5
mA
5V
DO unload, SK=1MHz
—
—
5
mA
ICC2
Operating Current (CMOS)
DO unload,
1.8V~5.5V
SK=250kHz
—
—
5
mA
1.8V~5.5V CS=SK=DI=0V
ISTB
Standby Current (CMOS)
—
—
2
µA
ILI
Input Leakage Current
5V
VIN=VSS~VCC
0
—
1
µA
ILO
Output Leakage Current
5V
VOUT=VSS~VCC, CS=0V
0
—
1
µA
5V
—
0
—
0.8
V
1.8V~5.5V —
0
—
0.1VCC
V
2
—
VCC
V
0.9VCC
—
VCC
V
VIL
Input Low Voltage
5V
VIH
Input High Voltage
VOL
Output Low Voltage
VOH
Output High Voltage
CIN
Input Capacitance (see note)
—
COUT
Output Capacitance (see note)
—
—
1.8V~5.5V —
IOL=2.1mA
—
—
0.4
V
1.8V~5.5V IOL=100µA
—
—
0.2
V
V
5V
5V
IOH=−400µA
2.4
—
—
VCC−0.2
—
—
V
VIN=0V, f=250kHz
—
—
5
pF
VOUT=0V, f=250kHz
—
—
5
pF
1.8V~5.5V IOH=−100µA
Note: These parameters are periodically sampled but not 100% tested.
Rev. 2.10
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January 16, 2014
HT93LC46
A.C. Characteristics
Symbol
Ta=-40°C~+85°C
VCC=5V±10%
Parameter
VCC=3V±10%
Min.
Max.
VCC=1.8V
Min.
Max.
Min.
Max.
Unit
fSK
Clock Frequency
0
2000
0
1000
0
500
kHz
tSKH
SK High Time
250
—
500
—
1000
—
ns
tSKL
SK Low Time
250
—
500
—
1000
—
ns
tCSS
CS Setup Time
50
—
100
—
100
—
ns
tCSH
CS Hold Time
0
—
0
—
0
—
ns
tCDS
CS Deselect Time
250
—
250
—
500
—
ns
tDIS
DI Setup Time
100
—
150
—
200
—
ns
tDIH
DI Hold Time
100
—
150
—
200
—
ns
tPD1
DO Delay to ″1″
—
250
—
500
—
1000
ns
tPD0
DO Delay to ″0″
—
250
—
500
—
1000
ns
tSV
Status Valid Time
—
250
—
250
—
250
ns
tHZ
DO Disable Time
—
100
—
200
—
400
ns
tPR
Write Cycle Time
—
5
—
5
—
5
ms
Endurance 25°C, Page Mode, 5.0V
Write
Cycles
1,000,000
Note: These parameters are periodically sampled but not 100% tested.
For relative timing, refer to timing diagrams.
A.C. Test Conditions
Input rise and fall time: 5ns (1V to 2V)
Input and output timing reference levels: 1.5V
Output load: See Figure right
V C C = 1 .9 5 2 V
8 0 0 D O
1 0 0 p F *
* ln c lu d in g s c o p e a n d jig
Output Load Circuit
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HT93LC46
Functional Description
ERASE
The HT93LC46 is accessed via a three-wire serial
communication interface. The device is arranged into
64 words by 16 bits or 128 words by 8 bits depending
whether the ORG pin is connected to VCC or VSS.
The HT93LC46 contains seven instructions: READ,
ERASE, WRITE, EWEN, EWDS, ERAL and WRAL.
When the user selectable internal organization is
arranged into 64×16 (128×8), these instructions are all
made up of 9(10) bits data: 1 start bit, 2 op code bits and
6(7) address bits.
The ERASE instruction erases data at the specified
addresses in the programming enable mode. After
the ERASE op-code and the specified address have
been issued, the data erase is activated by the falling
edge of CS. Since the internal auto-timing generator
provides all timing signals for the internal erase,
so the SK clock is not required. During the internal
erase, we can verify the busy/ready status if CS is
high. The DO pin will remain low but when the
operation is over, the DO pin will return to high and
further instructions can be executed.
By using the control signal CS, SK and data input
signal DI, these instructions can be given to the
HT93LC46. These serial instruction data presented
at the DI input will be written into the device at the
rising edge of SK. During the READ cycle, DO pin
acts as the data output and during the WRITE or
ERASE cycle, DO pin indicates the BUSY/READY
status. When the DO pin is active for read data or as
a BUSY/READY indicator the CS pin must be high;
otherwise DO pin will be in a high-impedance state.
For successful instructions, CS must be low once
after the instruction is sent. After power on, the device
is by default in the EWDS state. And, an EWEN
instruction must be performed before any ERASE or
WRITE instruction can be executed. The following
are the functional descriptions and timing diagrams of
all seven instructions.
WRITE
The WRITE instruction writes data into the device
at the specified addresses in the programming enable
mode. After the WRITE op-code and the specified
address and data have been issued, the data writing is
activated by the falling edge of CS. Since the internal
auto-timing generator provides all timing signal for
the internal writing, so the SK clock is not required.
The auto-timing write cycle includes an automatic
erase-before-write capability. So, it is not necessary to
erase data before the WRITE instruction. During the
internal writing, we can verify the busy/ready status if
CS is high. The DO pin will remain low but when the
operation is over, the DO pin will return to high and
further instructions can be executed.
READ
ERAL
The READ instruction will stream out data at a
specified address on the DO pin. The data on DO pin
changes during the low-to-high edge of SK signal. The
8 bits or 16 bits data stream is preceded by a logical ″0″
dummy bit. Irrespective of the condition of the EWEN
or EWDS instruction, the READ command is always
valid and independent of these two instructions. After
the data word has been read the internal address will
be automatically incremented by 1 allowing the next
consecutive data word to be read out without entering
further address data. The address will wrap around with
CS High until CS returns to LOW.
The ERAL instruction erases the entire 64×16
or 128×8 memory cells to logical ″1″ state in the
programming enable mode. After the erase-all
instruction set has been issued, the data erase feature
is activated by the falling edge of CS. Since the
internal auto-timing generator provides all timing
signal for the erase-all operation, so the SK clock is
not required. During the internal erase-all operation,
we can verify the busy/ready status if CS is high.
The DO pin will remain low but when the operation
is over, the DO pin will return to high and further
instruction can be executed.
EWEN/EWDS
WRAL
The EWEN/EWDS instruction will enable or disable
the programming capabilities. At both the power on
and power off state the device automatically entered
the disable mode. Before a WRITE, ERASE, WRAL
or ERAL instruction is given, the programming enable
instruction EWEN must be issued, otherwise the
ERASE/WRITE instruction is invalid. After the EWEN
instruction is issued, the programming enable condition
remains until power is turned off or a EWDS instruction
is given. No data can be written into the device in the
programming disabled state. By so doing, the internal
memory data can be protected.
Rev. 2.10
The WRAL instruction writes data into the entire
64×16 or 128×8 memory cells in the programming
enable mode. After the write-all instruction set has
been issued, the data writing is activated by the falling
edge of CS. Since the internal auto-timing generator
provides all timing signals for the write-all operation,
so the SK clock is not required. During the internal
write-all operation, we can verify the busy/ready
status if CS is high. The DO pin will remain low but
when the operation is over the DO pin will return to
high and further instruction can be executed.
4
January 16, 2014
HT93LC46
Timing Diagrams
READ



      ­  ‚ 
€
­

€
ƒ
EWEN/EWDS
WRITE
 
  
  
  
ERASE
Rev. 2.10

 
 

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January 16, 2014
HT93LC46
ERAL
tC
C S
D S
v e r ify
S ta n d b y
S K
D I
0
(1 )
S ta r t b it
0
1
0
tS
H ig h Z
D O
tP
tH
V
Z
re a d y
b u s y
R
WRAL
 Instruction Set Summary
Instruction
Comments
Start Bit
Op Code
Address
ORG=0 ORG=1
×8 ×16
Data
ORG=0 ORG=1
×8 ×16
D7~D0
READ
Read data
1
10
A6~A0 A5~A0
ERASE
Erase data
1
11
A6~A0 A5~A0
D15~D0
—
WRITE
Write data
1
01
A6~A0 A5~A0
EWEN
Erase/Write Enable
1
00
11XXXXX 11XXXX
D7~D0
—
D15~D0
EWDS
Erase/Write Disable
1
00
00XXXXX 00XXXX
—
ERAL
Erase All
1
00
10XXXXX 10XXXX
WRAL
Write All
1
00
01XXXXX 01XXXX
—
D7~D0
D15~D0
Note: ″X″ stands for ″don′t care″
Data should be written to the EEPROM in the format (8-bit or 16-bit mode) in which it is to be read.
Rev. 2.10
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January 16, 2014
HT93LC46
Package Information
Note that the package information provided here is for consultation purposes only. As this information may be
updated at regular intervals users are reminded to consult the Holtek website for the latest version of the package
information.
Additional supplementary information with regard to packaging is listed below. Click on the relevant section to be
transferred to the relevant website page.
• Further Package Information (include Outline Dimensions, Product Tape and Reel Specifications)
• Packing Meterials Information
• Carton information
Rev. 2.10
7
January 16, 2014
HT93LC46
8-pin DIP (300mil) Outline Dimensions
Symbol
Min.
Nom.
Max.
A
0.355
0.365
0.400
B
0.240
0.250
0.280
C
0.115
0.130
0.195
D
0.115
0.130
0.150
E
0.014
0.018
0.022
0.070
F
0.045
0.060
G
—
0.100 BSC
—
H
0.300
0.310
0.325
I
—
—
0.430
Symbol
Rev. 2.10
Dimensions in inch
Dimensions in mm
Min.
Nom.
Max.
10.16
A
9.02
9.27
B
6.10
6.35
7.11
C
2.92
3.30
4.95
D
2.92
3.30
3.81
E
0.36
0.46
0.56
F
1.14
1.52
1.78
G
—
2.54 BSC
—
H
7.26
7.87
8.26
I
—
—
10.92
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January 16, 2014
HT93LC46
8-pin SOP (150mil) Outline Dimensions
Symbol
A
Dimensions in inch
Min.
Nom.
Max.
—
0.236 BSC
—
B
—
0.154 BSC
—
C
0.012
—
0.020
C′
—
0.193 BSC
—
D
—
—
0.069
E
—
0.050 BSC
—
F
0.004
—
0.010
G
0.016
—
0.050
H
0.004
—
0.010
α
0°
—
8°
Symbol
Rev. 2.10
Dimensions in mm
Min.
Nom.
Max.
A
—
6.00 BSC
—
B
—
3.90 BSC
—
C
0.31
—
0.51
C′
—
4.90 BSC
—
D
—
—
1.75
E
—
1.27 BSC
—
F
0.10
—
0.25
G
0.40
—
1.27
H
0.10
—
0.25
α
0°
—
8°
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January 16, 2014
HT93LC46
8-pin TSSOP Outline Dimensions
Symbol
Dimensions in inch
Min.
Nom.
Max.
A
—
—
0.047
A1
0.002
—
0.006
A2
0.031
0.039
0.041
B
0.007
—
0.012
C
0.004
—
0.006
D
0.114
0.118
0.122
E
—
0.252 BSC
—
E1
0.169
0.173
0.177
e
—
0.026 BSC
—
L
0.018
0.024
0.030
L1
—
0.039 BSC
—
y
—
0.004
—
θ
0°
—
8°
Symbol
Rev. 2.10
Dimensions in mm
Min.
Nom.
Max.
A
—
—
1.20
A1
0.05
—
0.15
A2
0.80
1
1.05
B
0.19
—
0.30
C
0.09
—
0.16
D
2.90
3.00
3.10
E
—
6.40 BSC
—
E1
4.30
4.40
4.50
e
—
0.65 BSC
—
L
0.45
0.60
0.75
L1
—
1.0 BSC
—
y
—
0.10
—
θ
0°
—
8°
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January 16, 2014
HT93LC46
Copyright© 2014 by HOLTEK SEMICONDUCTOR INC.
The information appearing in this Data Sheet is believed to be accurate at the time
of publication. However, Holtek assumes no responsibility arising from the use of
the specifications described. The applications mentioned herein are used solely
for the purpose of illustration and Holtek makes no warranty or representation that
such applications will be suitable without further modification, nor recommends
the use of its products for application that may present a risk to human life due to
malfunction or otherwise. Holtek's products are not authorized for use as critical
components in life support devices or systems. Holtek reserves the right to alter
its products without prior notification. For the most up-to-date information, please
visit our web site at http://www.holtek.com.tw.
Rev. 2.10
11
January 16, 2014