RENESAS HAT2058R

HAT2058R/HAT2058RJ
Silicon N Channel Power MOS FET
High Speed Power Switching
ADE-208-934 (Z)
1st. Edition
Mar. 2001
Features
•
•
•
•
•
Low on-resistance
Capable of 4 V gate drive
Low drive current
High density mounting
“J” is for Automotive application
High temperature D-S leakage guarantee
Avalanche rating
Outline
SOP-8
8
5
7 6
3
1 2
4
5 6
D D
7 8
D D
4
G
2
G
S1
MOS1
S3
MOS2
1, 3
Source
2, 4
Gate
5, 6, 7, 8 Drain
HAT2058R/HAT2058RJ
Absolute Maximum Ratings (Ta = 25°C)
Ratings
Item
Symbol
HAT2058R
HAT2058RJ
Unit
Drain to source voltage
VDSS
100
100
V
Gate to source voltage
VGSS
±20
±20
V
Drain current
ID
4
4
A
32
32
A
4
4
A
—
4
A
Drain peak current
I D (pulse)
Body-drain diode reverse drain
current
I DR
Avalanche current
I AP
Avalanche energy
Channel dissipation
Note4
EAR
Note4
Note1
—
1.6
mJ
Pch
Note2
2
2
W
Pch
Note3
3
3
W
Channel temperature
Tch
150
150
°C
Storage temperature
Tstg
–55 to +150
–55 to +150
°C
Notes: 1.
2.
3.
4.
2
PW ≤ 10 µs, duty cycle ≤ 1%
1 Drive operation; When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW ≤ 10 s
2 Drive operation; When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW ≤ 10 s
Value at Tch = 25°C, Rg ≥ 50 Ω
HAT2058R/HAT2058RJ
Electrical Characteristics (Ta = 25°C)
Item
Symbol Min
Typ
Max
Unit
Test conditions
Drain to source breakdown
voltage
V(BR)DSS
100
—
—
V
I D = 10 mA, VGS = 0
Gate to source breakdown
voltage
V(BR)GSS
±20
—
—
V
I G = ±100 µA, VDS = 0
Zero gate voltage
HAT2058R
I DSS
—
—
1
µA
VDS = 100 V, VGS = 0
drain current
HAT2058RJ I DSS
—
—
0.1
µA
Zero gate voltage
HAT2058R
I DSS
—
—
—
µA
VDS = 80 V, VGS = 0
drain current
HAT2058RJ I DSS
—
—
10
µA
Ta = 125°C
Gate to source cutoff voltage
I GSS
—
—
±10
µA
VGS = ±16 V, V DS = 0
Static drain to source on state
resistance
VGS(off)
1.0
—
2.5
V
VDS = 10 V, ID = 1 mA
Forward transfer admittance
|yfs|
3
5
—
S
I D = 2 A*1, VDS = 10 V
Static drain to source on state
RDS(on)
—
120
145
mΩ
I D = 2 A*1, VGS = 10 V
resistance
RDS(on)
—
150
180
mΩ
I D = 2 A*1, VGS = 4 V
Input capacitance
Ciss
—
420
—
pF
VDS = 10 V, VGS = 0
Output capacitance
Coss
—
180
—
pF
f = 1 MHz
Reverse transfer capacitance
Crss
—
100
—
pF
Turn-on delay time
td(on)
—
10
—
ns
VGS = 10 V, ID = 2 A
Rise time
tr
—
30
—
ns
VDD ≅ 30 V
Turn-off delay time
td(off)
—
110
—
ns
Fall time
tf
—
60
—
ns
Body-drain diode forward voltage VDF
—
0.85
1.1
V
I F = 4 A, VGS = 0*1
Body-drain diode reverse
recovery time
—
75
—
ns
I F = 4 A, VGS = 0
diF/dt = 50 A/µs
Note:
trr
1. Pulse test
3
HAT2058R/HAT2058RJ
Main Characteristics
Power vs. Temperature Derating
Test condition :
When using the glass epoxy board
(FR4 40 x 40 x 1.6 mm), PW < 10 s
100
ID (A)
3.0
er
n
Op
tio
ra
ive
pe
Dr
1.0
0
50
0µ
10
Drain Current
O
1
10 µs
10
DC
3
ive
Dr
2.0
Maximum Safe Operation Area
30
2
Channel Dissipation
Pch (W)
4.0
at
ion
100
150
Ambient Temperature
Op
er
1
Operation in
0.3 this area is
0.1
PW
=
ati
on
Ta (°C)
m
s
10
ms
(P No
W te
<
limited by RDS(on)
Ta = 25°C
0.03 1 shot Pulse
1 Drive Operation
0.01
0.1 0.3
1
3
10
Drain to Source Voltage
200
s
1
10
5
s)
30
100
VDS (V)
Note 6:
When using the glass epoxy board
(FR4 40 x 40 x 1.6 mm)
Typical Transfer Characteristics
Typical Output Characteristics
20
10
Pulse Test
6V
4.0 V
12
Drain Current
Drain Current
ID (A)
16
V DS = 10 V
ID (A)
10 V
8
4
8
6
4
2
Tc = 75°C
V GS = 2.0 V
0
4
2
4
6
Drain to Source Voltage
8
10
VDS (V)
Pulse Test
0
25°C
-25°C
1
2
3
Gate to Source Voltage
4
5
VGS (V)
HAT2058R/HAT2058RJ
Static Drain to Source on State Resistance
vs. Drain Current
Drain to Source Saturation Voltage
VDS(on) (V)
1
Drain to Source on State Resistance
RDS(on) (Ω)
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
Pulse Test
0.8
0.6
ID=4A
0.5
0.2
VGS = 4 V
0.1
10 V
0.05
0.4
2A
0.2
0.02
1A
Pulse Test
0.01
12
4
8
Gate to Source Voltage
Static Drain to Source on State Resistance
vs. Temperature
0.5
Pulse Test
0.4
4A
I D =1, 2 A
0.3
0.2
V GS = 4 V
4A
1, 2A
0.1
10 V
0
-40
0.1 0.2
16
20
VGS (V)
0
40
80
120
Case Temperature Tc (°C)
160
0.5
1
2
5
50
10 20
50
ID (A)
Drain Current
Forward Transfer Admittance |yfs| (S)
Static Drain to Surce on State Resistance
RDS(on) (Ω)
0
Forward Transfer Admittance vs.
Drain Current
20
Tc = -25°C
10
25°C
5
75°C
2
V DS = 10 V
Pulse Test
1
0.5
0.1
0.3
1
3
Drain Current
10
30
100
ID (A)
5
HAT2058R/HAT2058RJ
Typical Capacitance vs.
Drain to Source Voltage
Body-Drain Diode Reverse
Recovery Time
5000
di / dt = 50 A / µs
V GS = 0, Ta = 25°C
500
2000
Capacitance C (pF)
Reverse Recovery Time trr (ns)
1000
200
100
50
1000
Ciss
500
200
Coss
100
50
20
Crss
VGS = 0
f = 1 MHz
20
10
0.1
10
0
0.3
1
3
10
30
100
Reverse Drain Current IDR (A)
10
20
30
Drain to Source Voltage
Dynamic Input Characteristics
V GS
12
V DS
80
8
40
0
4
VDD = 80V
50V
25V
8
16
Gate Charge
6
16
V DD = 80 V
50 V
25 V
24
32
Qg (nc)
0
40
1000
300
Switching Time t (ns)
120
ID=4A
Switching Characteristics
VGS (V)
160
20
Gate t o Source Voltage
Drain to Source Voltage
VDS (V)
200
40
50
VDS (V)
t d(off)
100
tf
30
tr
10
3
1
0.1
t d(on)
V GS = 10 V, V DD = 30 V
PW = 5 µs, duty < 1 %
0.3
1
3
10
30
Drain Current ID (A)
100
HAT2058R/HAT2058RJ
Reverse Drain Current vs.
Source to Drain Voltage
EAR (mJ)
Maximum Avalanche Energy vs.
Channel Temperature Derating
Pulse Test
8
Repetive Avalanche Energy
Reverse Drain Current
IDR (A)
10
6
10 V
4
5V
V GS = 0, -5 V
2
0
0.4
0.8
1.2
Source to Drain Voltage
2.5
I AP = 4 A
V DD = 50 V
L = 100 µH
duty < 0.1 %
Rg > 50 Ω
2.0
1.5
1.0
0.5
1.6
2.0
VSD (V)
0
25
50
75
100
Channel Temperature
Avalanche Test Circuit
Avalanche Waveform
1
2
• L • IAP •
2
EAR =
L
V DS
Monitor
125
150
Tch (°C)
VDSS
VDSS — VDD
I AP
Monitor
V (BR)DSS
I AP
Rg
V DS
VDD
D. U. T
ID
Vin
15 V
50Ω
0
VDD
Switching Time Test Circuit
Switching Time Waveform
90%
Vout
Monitor
Vin Monitor
D.U.T.
RL
Vin
Vout
Vin
10 V
50Ω
V DD
= 30 V
10%
10%
90%
td(on)
tr
10%
90%
td(off)
tf
7
HAT2058R/HAT2058RJ
Normalized Transient Thermal Impedance vs. Pulse Width (1 Drive Operation)
Normalized Transient Thermal Impedance
γ s (t)
10
1
D=1
0.5
0.2
0.1
0.1
0.05
0.02
0.01
θ ch-f(t) =γ s (t)• θ ch - f
θ ch-f = 125°C/W, Ta = 25°C
When using the glass epoxy board
(FR4 40 x 40 x 1.6 mm)
0.01
e
uls
p
ot
PDM
h
0.001
1s
D=
PW
T
PW
T
0.0001
10 µ
100 µ
1m
10 m
100 m
Pulse Width
1
10
100
1000
10000
PW (S)
Normalized Transient Thermal Impedance vs. Pulse Width (2 Drive Operation)
Normalized Transient Thermal Impedance
γ s (t)
10
1
D=1
0.5
0.2
0.1
0.01
0.1
0.05
θ ch-f(t) = γ s (t) • θch - f
θ ch-f = 166°C/W, Ta = 25°C
When using the glass epoxy board
(FR4 40 x 40 x 1.6 mm)
0.02
0.01
e
uls
0.001
PDM
p
ot
D=
h
1s
PW
T
PW
T
0.0001
10 µ
100 µ
1m
10 m
100 m
Pulse Width
8
1
PW (S)
10
100
1000
10000
HAT2058R/HAT2058RJ
Package Dimensions
Unit: mm
2
4
0.15max.
1.27max.
0.4min.
5
6.2max.
5.8min.
4.0max.
3.8min.
8
0~8°
5.0max.
4.8min.
7
6
0.25max.
0.19min.
1.75max.
1.35min.
0.75max.
1.27typ.
3
0.51max.
0.33min.
0.15
0.25max.
0.10min.
Pin No. 1
0.25 M
Hitachi Code
JEDEC
EIAJ
FP-8DA
—
—
9
HAT2058R/HAT2058RJ
Cautions
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received the latest product standards or specifications before final design, purchase or use.
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contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
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Copyright © Hitachi, Ltd., 2001. All rights reserved. Printed in Japan.
Colophon 4.0
10