Reliability Report-CPC5001G Qualification No: 2012-010 Reliability Report Reliability Data for CPC5001G Report Title: Reliability Data for CPC5001G Report Number: 2012-010 Date: 7/20/12 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-272-5273, WWW.IXYSIC.COM Page 1 of 6 Reliability Report-CPC5001G Qualification No: 2012-010 Introduction: This report summarizes the Reliability data of IXYS Integrated Circuits Division CPC5001G. The Reliability data presented here were collected during IXYS IC Division product qualification. The purpose of this qualification was to verify the IXYS IC Division Quality and Reliability requirements as outlined in IXYS IC Division internal specifications. The CPC5001G silicon is foundered at ON-SEMI and assembled at Atec in the Philippines. The ON-SEMI process is D3N (reference qual by comparison for CPC5002G, CPC5750, CPC5902G). Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on IXYS IC Division internal specifications and with the approval of the product development team and quality assurance. Table 1: Product CPC5001G Reliability Tests Stress Test HTOL Applicable Stress Specs Conditions Mil-Std-883 125°C, 80% Product/ Package CPC5902G 8 Pin Dip THB JESD22, A101 CPC5902G 8 Pin Dip 3 77 231 Thermal Mil-Std-883, 0 to 100°C, 10/10 Shock (T/S) M1011 dwells, 15 cycles CPC5902G 8 Pin Dip 3 55 165 Temp Cycle Mil-Std-883, -55 to 125°C, 10/10 (T/C) N1010, “B” dwells, 300 cycles High Temp JESD22150°C, 168hrs Storage A103C CPC5902G 8 Pin Dip 3 55 165 CPC5001G 8 Pin Dip 3 50 250 85°C, 85% 1000hrs Number Sample Total of Lots Size (SS) SS 1 105 105 MSL J-STD020D.1 IR Reflow, Level 1 CPC5902G 8 Pin Dip 3 50 150 ESD HBM JESD22, A114-E 1.5kΩ, 100pF CPC5001G 8 Pin Dip 1 18 18 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-272-5273, WWW.IXYSIC.COM Page 2 of 6 Reliability Report-CPC5001G Qualification No: 2012-010 Reliability Test Results: The stress tests and associated results for the product CPC5001G qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: Product CPC5001G Reliability Test Results Stress Test HTOL THB Product/Kit Number CPC5902 TE3097 CPC5902 TE3078 1115 THB CPC5902 TE3079 1118 THB CPC5902 TE3093 1121 Thermal Shock CPC5902 TE3078 1115 Thermal Shock CPC5902 TE3079 1118 Thermal Shock CPC5902 TE3093 1121 Temp Cycle CPC5902 TE3078 1115 Temp Cycle CPC5902 TE3079 1118 Readpoint / (Reject/ SS) 1000 hrs. Comments Qual Lot#1 Data 0/105* 1000 hrs. Qual Lot#1 Data 0/76 1000 hrs. Qual Lot#2 Data 0/77 1000 hrs. Qual Lot#3 Data 0/77 15 Cycles Qual Lot#1 Data 0/55 15 Cycles Qual Lot#2 Data 0/33 15 Cycles Qual Lot#3 Data 0/55* 300 Cycles Qual Lot#1 Data 0/55 300 Cycles 0/33 Qual Lot#2 Data *Note: I/O leakage, output voltage and timing failures reported, however, Failure Analysis Report FA11-106 results showed these failures to be related to a process anomaly with preventative action defined and initiated. IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-272-5273, WWW.IXYSIC.COM Page 3 of 6 Reliability Report-CPC5001G Qualification No: 2012-010 Stress Test Temp Cycle Product/Kit Number CPC5902 TE3093 1121 Readpoint / (Reject/ SS) 300 Cycles Comments Qual Lot#3 Data 0/54 High Temp Storage CPC5001 TE3194 1216 168 hrs. High Temp Storage CPC5001 TE3195 1216 168 hrs. High Temp Storage CPC5001 TE3196 1216 MSL CPC5902 TE3097 IR Reflow Level 1 CPC5902 TE3121 0/50 IR Reflow Level 1 Qual Lot#5 Data CPC5902 TE3122 0/50 IR Reflow Level 1 Qual Lot#6 Data MSL MSL Qual Lot#1 Data 0/50 Qual Lot#2 Data 0/50 168 hrs. Qual Lot# 3 Data 0/50 Qual Lot#4 Data 0/50 ESD Testing Results: As part of this qualification, the product CPC5001G was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are summarized in Table 3. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed after +/-6000V testing. Table3: Product CPC5001G ESD Characterization Results ESD Product/Kit Package ESD Test RC Highest Class Model Number Spec Network Passed HBM CPC5001G 8 Pin Dip JESD22, 6000V 3A 1.5kΩ, TE3194 A114-E 100pF IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-272-5273, WWW.IXYSIC.COM Page 4 of 6 Reliability Report-CPC5001G Qualification No: 2012-010 FIT (Failure in Time) Rate on the Product CPC5001G: Table 4 summarizes the number of devices used for the product CPC5001G reliability stress with associated failures. Using the HTOL data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 125°C test temperature and 40°C use temperatures. For THB stress, FITs were calculated based on the 85°C /85% RH test condition with 40°C/60% RH ambient use conditions at the activation energy of 0.7eV. The calculated FITs from the reliability stress came out to be 34.31 and 35.20 for HTOL and THB respectively. Table 4: Product CPC5001G FIT Rate Summary Qual# Stress Product/Kit # of # of Hours Act. Acc. Number Devices Fails Tested Energy Factor 1 1 HTOL CPC5902G TE3097 105 THB 230 CPC5902G TE3078, TE 3079, TE3093 0 1000 0.7 Equivalent FIT Rate Dev. Hours @ 60% CL 26,817,627 34.31 255.41 0 1000 0.7 1.1363E +02 26,133,978 Conclusion: The qualification of the product CPC5001G has been successfully completed for the production release. The reliability and process data for D3N is available as part of Quality files associated with IXYS IC Division internal specification documents and are available upon request. IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-272-5273, WWW.IXYSIC.COM Page 5 of 6 35.20 Reliability Report-CPC5001G Qualification No: 2012-010 APPROVAL: Prepared by: _Martha W. Brandt* Martha W. Brandt Quality Engineer 7/20/12 Date Approved by: Ana Maria Pinto Stack*_____________________________ 7/23/12 Ana Maria Pinto Stack Date Product Engineer Approved by: Ronald P. Clark*_________________________________ Ronald P. Clark Director of Quality 7/23/12 Date Approved by: _ James Archibald* 7/24/12 James Archibald Director of Development Engineering Date *Signature on File IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-272-5273, WWW.IXYSIC.COM Page 6 of 6