Reliability Report-Form A Relay VHV (500V – 800V) Qualification No: 2013-004 Reliability Report Reliability Data for Form A Relay VHV (500V – 800V) Report Title: Reliability Data for Form A Relay VHV (500V – 800V) Report Number: 2013-004 Date: 2/13/13 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-272-5273, WWW.IXYSIC.COM Page 1 of 4 Reliability Report-Form A Relay VHV (500V – 800V) Qualification No: 2013-004 Introduction: This report summarizes the Reliability data of IXYS Integrated Circuits Division. The Reliability data presented here were collected during IXYS IC Division product qualification. The purpose of this qualification was to verify the IXYS IC Division Quality and Reliability requirements as outlined in IXYS IC Division internal specifications. The Form A Relay VHV (represented by CPC1983Y/PLA170/PLA171/PLA192/PLA193) silicon is manufactured at IXYS IC Division in Beverly, MA and assembled at ATEC in the Philippines. Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on the IXYS Integrated Circuits Division internal specification and with the approval of the product development team and quality assurance. Table 1: Product Form A Relay VHV Reliability Tests Stress Test Applicable Specs HTRB JESD22A108 HTRB JESD22A108 HTRB JESD22A108 HTRB JESD22A108 Temp Cycle JESD22A104 IOL Mil-Std-750 Method 1037 Autoclave JESD22A102 High Temp JESD22Storage A103C Stress Conditions Product/ Package Number Sample Total of Lots Size (SS) SS 125°C, 80% WVDC, 1000hrs 125°C, 80% WVDC, 1000hrs 125°C, 80% WVDC, 1000hrs 125°C, 80% WVDC, 1000hrs -55°C to 125°C, 1000 cycles Ta = 25°C, Delta Tj > 100°C, 15,000 cycles 2 min on/2 min off Ta = 121°C, RH = 100% 15 psig, 96 hrs 125°C, 1000 hrs CPC1983Y Power SIP PLA170 6-Pin DIP PLA192 6-Pin DIP PLA193 6-Pin DIP PLA171 8-SMT PLA171 8-SMT 1 105 105 1 135 135 1 77 77 1 105 105 2 77 154 2 77 154 PLA171 8-SMT 2 77 154 PLA171 8-SMT 2 77 154 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-272-5273, WWW.IXYSIC.COM Page 2 of 4 Reliability Report-Form A Relay VHV (500V – 800V) Qualification No: 2013-004 Reliability Test Results: The stress tests and associated results for the product Form A Relay VHV qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: Product Form A Relay VHV Reliability Test Results Stress Test HTRB HTRB Product/Kit Number CPC1983Y TE2906 PLA170 TE2873 TE2908 PLA192 TE2744 HTRB HTRB PLA193 TE2620 Temp Cycle Temp Cycle IOL IOL Autoclave Autoclave High Temp Storage High Temp Storage PLA171 TE3016 PLA171 TE3038 PLA171 TE3016 PLA171 TE3038 PLA171 TE3016 PLA171 TE3038 PLA171 TE3016 PLA171 TE3038 Readpoint / (Reject/ SS) 1000 hrs. Qual Lot#1 Data 0/105 1000 hrs Qual Lot#1 Data Comments 0/135 1000 hrs Qual Lot#1 Data 0/77 1000 hrs. Qual Lot#1 Data 1/105 1000 cycles 0/77 1000 cycles 0/77 15,000 cycles 0/77 15,000 cycles 0/77 96 hrs 0/77 96 hrs 0/77 1000 hrs 0/77 1000 hrs 0/77 Qual Lot#1 Data Qual Lot#2 Data Qual Lot#1 Data Qual Lot#2 Data Qual Lot#1 Data Qual Lot#2 Data Qual Lot#1 Data Qual Lot#2 Data IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-272-5273, WWW.IXYSIC.COM Page 3 of 4 Reliability Report-Form A Relay VHV (500V – 800V) Qualification No: 2013-004 FIT (Failure in Time) Rate on the Product Form A Relay VHV: Table 3 summarizes the number of devices used for the product Form A Relay VHV reliability stress with associated failures. Using the HTRB data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 125°C test temperature and 40°C use temperatures. The calculated FITs from the reliability stress came out to be 18.83 for HTRB. Table 3: Product Form A Relay VHV FIT Rate Summary Qual# Stress Product/Kit # of # of Hours Act. Acc. Number Devices Fails Tested Energy Factor 1 HTRB CPC1983Y TE2906 PLA170 TE2873 TE2908 PLA192 TE2774 PLA193 TE2620 422 0 1000 0.7 Equivalent FIT Rate Dev. Hours @ 60% CL 107,781,318 18.83 255.41 Conclusion: The qualification of the product Form A Relay VHV has been successfully completed for the production release. IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-272-5273, WWW.IXYSIC.COM Page 4 of 4