Reliability Report: CPC10XXN-4 Pin SOP Product (Low Voltage 60v – 150v) Qualification Report No.: 2010-004 Reliability Report Reliability Data for CPC10XXN-4 Pin SOP Product (Low Voltage 60v – 150v) Report Title: Reliability Data for CPC10XXN-4 Pin SOP Product (Low Voltage 60v – 150v) Report Number: 2010-004 Date: 11/15/12 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 1 of 5 Reliability Report: CPC10XXN-4 Pin SOP Product (Low Voltage 60v – 150v) Qualification Report No.: 2010-004 Introduction This report summarizes the Reliability data of Clare’s CPC10XXN 4-Pin SOP family products. The Reliability data presented here were collected during Clare’s product qualification and ongoing monthly Reliability Monitoring Program (RMP). The silicon die level data collected on multiple product types, but share the same process technology and design rules (DMOS P27) wafer fabrication facility and subcontract assembly location. The 4-Pin SOP package data were included from CPC102XN, CPC103XN, and CPC123XN since the package construction materials, leadframe and subcontract assembly location are the same for these 4-pin SOP products. Reliability Tests: Table 1 below outlined Reliability stresses performed on various products that are transferable to CPC10XXN, CPC12XXN and certain CPC2XXXN products. Table 1: CPC10XXN Reliability Tests Product/ Package Stress CPC1008N/ 4-SOP CPC1017N/ 4-SOP CPC1008N/ 4-SOP CPC1008N/ CPC1017N/ CPC1035N/ 4-SOP HTRB Applicable Specs Stress Conditions JESD22-A108 125C, 80% WVDC, 1000 hrs HTRB JESD22-A108 125C, 80% WVDC, 1000 hrs THB JESD22-A101 85C/85% RH, Biased 1000 hrs Thermal Shock Mil-Std-883, 0 to 100°C, 10/10 dwells (T/S) M1011 15 cycles CPC1008N/ Temp Cycle CPC1017N/ (T/C) CPC1035N/ 4-SOP Mil-Std-883 M1010, “B” -55 to 125°C, 10/10 dwells, 300 cycles # of Sample Total Kits Size SS (SS) 3 100 300 3 1 3 55 129 48 144 4 55 220 4 55 220 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 2 of 5 294 Reliability Report: CPC10XXN-4 Pin SOP Product (Low Voltage 60v – 150v) Qualification Report No.: 2010-004 Product/ Package Stress CPC1035N/ CPC1008N/ 4-SOP CPC1035N/ CPC1017N/ 4-SOP CPC1230N/ 4-SOP ESDHBM Applicable Specs ESD Assoc. STM5.1 Construction Analysis NA Solder Heat Resistance (SHRT) CPC1001N/ Cold Storage 4-SOP Test # of Sample Total Kits Size SS (SS) 1 15 15 Stress Conditions 1.5kΩ, 100pF Die coat, Bond quality, Die attach, Bondline JESD22-A112 Bake: 24 hrs 125°C, Soak: MSL Level-3, IR Reflow: 260°C (max.), 3X JESD22-A119 -55C, 1000hrs 2 5 10 1 25 25 1 55 55 Reliability Test Results: Table 2 below provides the Reliability results from the stress tests that were performed on the CPC10XXNfamily products. Table 2: CPC10XXN Reliability Test Results Product/ Package Stress/ Kits CPC1017N/ 4-SOP CPC1008N 4-SOP HTRB/ T38953 HTRB/ TE2190 TE2228 TE2232 CPC1008N THB/ 4-SOP TE2190 TE2228 TE2232 CPC1008N T/S / 4-SOP TE2190 TE2228 CPC1008N T/C / 4-SOP TE2190 TE2228 CPC1017N/ T/S / 4-SOP T38953 CPC1017N/ T/C / 4-SOP T38953 Readpoint 1 Readpoint 2 Readpoint 3 / Reject/ / Reject/ / Reject/ SS SS SS 168 hrs. 500 hrs. 750 hrs. 0/294 0/294 0/294 168 hrs. 500 hrs. 750 hrs. 0/300 0/300 0/300 168 hrs. 0/144 500 hrs. 0/144 750 hrs. 0/144 Readpoint 4 / Reject/ SS 1000 hrs. 0/294 1000 hrs. 0/300 1000 hrs. 0/144 15 Cycles 0/110 300 Cycles 0/110 15 Cycles 0/55 300 Cycles 0/55 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 3 of 5 Comments Reliability Report: CPC10XXN-4 Pin SOP Product (Low Voltage 60v – 150v) Qualification Report No.: 2010-004 Product/ Package Stress/ Kits CPC1035/ 4-SOP CPC1035/ 4-SOP CPC1230/ 4-SOP T/S / T21031 T/C / T21031 SHRT TE2291 Readpoint 1 Readpoint 2 Readpoint 3 Readpoint 4 / Reject/ / Reject/ / Reject/ / Reject/ SS SS SS SS 15 Cycles 0/55 300 Cycles 0/55 125°C, 24 hrs Bake, Soak @ MSL 3, 260°C Max, Reflow 3X 0/25 CPC1017N/ T38953 4-SOP Die Coat, Bond Quality, Die Attach, Bondline Thickness CPC1035/ T21031 4-SOP CPC1001N/ Cold 4-SOP Storage Die Coat, Bond Quality, Die Attach, Bondline Thickness 0/5 -55C, 1000hrs 0/55 Comments Same parts as T/S Lead Free Reflow 0/5 ESD Testing Results: CPC10XXN was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using the KeyTek Zapmaster test system. The results are summarized in Table 3. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed 8000V. ESD Model Product/ Kit HBM CPC1008N/ TE2228 Table3: CPC10XXN ESD Results Package ESD Test RC Spec Network 4-SOP JESD22, A114-B 1.5kΩ, 100pF Highest Tested 8KV (passed) IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 4 of 5 Class 3B Reliability Report: CPC10XXN-4 Pin SOP Product (Low Voltage 60v – 150v) Qualification Report No.: 2010-004 FIT (Failure in Time) Rate on CPC10XXN-4 Pin SOP Product: Table 4 below summarizes the FIT rate from the HTRB and THB data. Using the Reliability HTRB data, FIT rate was calculated at Activation Energy (AE) of 0.7 eV based on the equivalent device hours at use condition of 40°C and stressed condition of 125°C. For THB stress, FITs were calculated based on the 85°C /85% RH test condition with 40°C/60% RH ambient use conditions at the activation energy of 0.7 eV and equivalent device hours. The FIT rate came out to be 6.06 and 56.23 for HTRB and THB, respectively. Product/ Stress Table 4: CPC10XXN-4 Pin SOP Product FIT Rate Summary Lot # of # of Hours Eq. Device FITs Number Devices Failed Tested Hours @ 60% CL CPC1017N/ HTRB CPC1008N/ HTRB CPC1008N/ THB T38953 TE2190 TE2228 TE2232 TE2190 TE2228 TE2232 594 0 1000 151,711,144 6.06 144 0 1000 16,362,143 56.23 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 5 of 5