Reliability Report-CPC5902G Qualification No: 2011-005 Reliability Report Reliability Data for CPC5902G Report Title: Reliability Data for CPC5902G Report Number: 2011-005 Date: 10/18/11 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 1 of 6 Reliability Report-CPC5902G Qualification No: 2011-005 Introduction: This report summarizes the Reliability data of IXYS IC Division CPC5902G. The Reliability data presented here were collected during IXYS IC Division product qualification. The purpose of this qualification was to verify IXYS IC Division Quality and Reliability requirements as outlined in IXYS IC Division internal specifications. The CPC5902G silicon is foundered at ON-SEMI and assembled at Atec in the Philippines. The ON-SEMI process is D3N (reference qual by comparison for CPC5750, CPC5002). Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on IXYS IC Division internal specifications and with the approval of the product development team and quality assurance. Table 1: Product CPC5902G Reliability Tests Stress Test Applicable Specs Stress Conditions HTOL Mil-Std-883 125°C, 80% Product/ Package CPC5902G 8 Pin Dip THB JESD22, CPC5902G 85°C, 85% A101 8 Pin Dip 1000hrs Thermal Mil-Std-883, 0 to 100°C, 10/10 CPC5902G Shock (T/S) M1011 dwells, 15 cycles 8 Pin Dip Temp Cycle Mil-Std-883, -55 to 125°C, 10/10 CPC5902G (T/C) N1010, “B” dwells, 8 Pin Dip 300 cycles High Temp JESD22CPC5902G 125°C, 1000hrs Storage A103C 8 Pin Dip MSL J-STDIR Reflow, CPC5902G 020D.1 Level 1 8 Pin Dip MSL J-STDIR Reflow, CPC5902G 020D.1 Level 3 8 Pin Dip ESD JESD22, CPC5902G 1.5kΩ, 100pF HBM A114-E 8 Pin Dip Number Sample Total of Lots Size (SS) SS 1 105 105 3 77 231 3 55 165 3 55 165 5 50 250 3 50 150 3 50 150 2 3 6 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 2 of 6 Reliability Report-CPC5902G Qualification No: 2011-005 Reliability Test Results: The stress tests and associated results for the product CPC5902G qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: Product CPC5902G Reliability Test Results Stress Test HTOL THB Product/Kit Number CPC5902 TE3097 CPC5902 TE3078 1115 THB CPC5902 TE3079 1118 THB CPC5902 TE3093 1121 Thermal Shock CPC5902 TE3078 1115 Thermal Shock CPC5902 TE3079 1118 Thermal Shock CPC5902 TE3093 1121 Temp Cycle CPC5902 TE3078 1115 Temp Cycle CPC5902 TE3079 1118 Readpoint / (Reject/ SS) 1000 hrs. Comments Qual Lot#1 Data 0/105* 1000 hrs. Qual Lot#1 Data 0/76 1000 hrs. Qual Lot#2 Data 0/77 1000 hrs. Qual Lot#3 Data 0/77 15 Cycles Qual Lot#1 Data 0/55 15 Cycles Qual Lot#2 Data 0/33 15 Cycles Qual Lot#3 Data 0/55* 300 Cycles Qual Lot#1 Data 0/55 300 Cycles Qual Lot#2 Data 0/33 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 3 of 6 Reliability Report-CPC5902G Qualification No: 2011-005 Stress Test Temp Cycle High Temp Storage High Temp Storage High Temp Storage High Temp Storage Product/Kit Number CPC5902 TE3093 1121 CPC5902 TE3078 1115 CPC5902 TE3079 1118 CPC5902 TE3093 1121 CPC5902 TE3136 Readpoint / (Reject/ SS) 300 Cycles Comments Qual Lot#3 Data 0/54 1000 hrs. Qual Lot#1 Data 0/50 1000 hrs. Qual Lot#2 Data 0/33* 1000 hrs. Qual Lot# 3 Data 0/50* 1000 hrs. Qual Lot# 4 Data 0/50 High Temp Storage CPC5902 TE3137 1000 hrs. Qual Lot# 5 Data 0/50 MSL CPC5902 TE3078 1115 IR Reflow Level 3 Qual Lot#1 Data 0/50 MSL CPC5902 TE3079 1118 IR Reflow Level 3 0/41 Qual Lot#2 Data MSL CPC5902 TE3093 1121 IR Reflow Level 3 Qual Lot#3 Data 0/51 MSL CPC5902 TE3097 IR Reflow Level 1 0/50 Qual Lot#4 Data MSL CPC5902 TE3121 IR Reflow Level 1 0/50 Qual Lot#5 Data IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 4 of 6 Reliability Report-CPC5902G Qualification No: 2011-005 Stress Test Product/Kit Number MSL CPC5902 TE3122 Readpoint / (Reject/ SS) IR Reflow Level 1 0/50 Comments Qual Lot#6 Data *Note: I/O leakage, output voltage and timing failures reported, however, Failure Analysis Report FA11-106 results showed these failures to be related to a process anomaly with preventative action defined and initiated. ESD Testing Results: As part of this qualification, the product CPC5902G was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are summarized in Table 3. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed after +/-6000V testing. Table3: Product CPC5902G ESD Characterization Results ESD Product/Kit Package ESD Test RC Highest Class Model Number Spec Network Passed HBM CPC5902G 8 Pin Dip JESD22, 6000V 3A 1.5kΩ, TE3063 A114-E 100pF TE3094 FIT (Failure in Time) Rate on the Product CPC5902G: Table 4 summarizes the number of devices used for the product CPC5902G reliability stress with associated failures. Using the HTOL data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 125°C test temperature and 40°C use temperatures. For THB stress, FITs were calculated based on the 85°C /85% RH test condition with 40°C/60% RH ambient use conditions at the activation energy of 0.7eV. The calculated FITs from the reliability stress came out to be 34.31 and 35.20 for HTOL and THB respectively. Table 4: Product CPC5902G FIT Rate Summary Qual# Stress Product/Kit # of # of Hours Act. Acc. Number Devices Fails Tested Energy Factor 1 1 HTOL CPC5902G TE3097 105 THB 230 CPC5902G TE3078, TE 3079, TE3093 0 1000 0.7 Equivalent FIT Rate Dev. Hours @ 60% CL 26,817,627 34.31 255.41 0 1000 0.7 1.1363E +02 26,133,978 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 5 of 6 35.20 Reliability Report-CPC5902G Qualification No: 2011-005 Conclusion: The qualification of the product CPC5902G has been successfully completed for the production release. The reliability and process data for D3N can be found at S:/REED/Projects/New Process Information/On-Semi. APPROVAL: Prepared by: _Martha W. Brandt*_________________________________10/18/11____ Martha W. Brandt Date Quality Engineer Approved by: Ana Maria Pinto Stack*______________________________10/19/11_____ Ana Maria Pinto Stack Date Product Engineer Approved by: Ronald P. Clark*___________________________________10/19/11______ Ronald P. Clark Date Director of Quality Approved by: James Archibald*____________________________________10/19/11_____ James Archibald Date Director of Development Engineering *Signature on File IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 6 of 6