Reliability Report: CPC1540 6 Pin DIP Qualification Report No.: 2010-017 Reliability Report Reliability Data for CPC1540 6 Pin DIP Product Report Title: Reliability Data for CPC1540 6 Pin DIP Product Report Number: 2010-017 Date: 9/19/11 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, www.ixysic.com Page 1 of 5 Reliability Report: CPC1540 6 Pin DIP Qualification Report No.: 2010-017 Introduction: This report summarizes the Reliability data of Clare’s CPC1540. The Reliability data presented here were collected during Clare’s product qualification. The purpose of this qualification was to verify Clare’s Quality and Reliability requirements as outlined in Clare’s internal specifications. The CPC1540 Gate Driver is manufactured at Clare and assembled at ATEC in the Philippines. The process is Clare P10 and CPC1540 is available in a 6 Pin DIP package type. Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on the Clare’s specification P-04-25-WW, “Reliability, Risk Analysis and Qualification Procedure” and with the approval of the product development team and quality assurance. Table 1: CPC1540 Reliability Tests Product Package Stress Test CPC1540 6 Pin DIP CPC1540 6 Pin DIP CPC1540 6 Pin DIP CPC1540 6 Pin DIP CPC1540 6 Pin DIP CPC1540 6 Pin DIP CPC1540 6 Pin DIP Applicable Specs and Readpoints JESD22-A108 Stress # Lots Sample Size Conditions HTRB 125C, 80% 3 90 WVDC, 1000 hrs 1 77 THB JESD22, 85°C, 85% A101 1000 hrs Thermal Shock Mil-Std-883, 1 55 0 to 100°C, M1011 10/10 dwells, 15 cycles 3 55 Temp Cycle Mil-Std-883, N1010,-55 to 125°C, “B” 10/10 dwells, 300 cycles MSL J-STD-020D.1 IR Reflow, 2 50 Level 1, Level 3 High JESD22-A103C 1 50 125°C, Temp Storage 1000hrs ESD JESD22, 3 6 1.5kΩ, 100pF HBM A114-E IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, www.ixysic.com Page 2 of 5 Total 270 77 55 165 100 50 18 Reliability Report: CPC1540 6 Pin DIP Qualification Report No.: 2010-017 Reliability Test Results: The stress tests and associated results for CPC1540 qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: CPC1540 Reliability Test Results Product/ Package Stress/ Kits CPC1540 6 Pin DIP CPC1540 6 Pin DIP CPC1540 6 Pin DIP CPC1540 6 Pin DIP CPC1540 6 Pin DIP HTRB TE3089 HTRB TE3113 HTRB TE3114 THB TE3089 Thermal Shock TE3089 Temp Cycle TE3089 Temp Cycle TE3113 Temp Cycle TE3114 CPC1540 6 Pin DIP CPC1540 6 Pin DIP CPC1540 6 Pin DIP CPC1540 6 Pin DIP MSL 1 TE3089 CPC1540 6 Pin DIP MSL 3 TE3089 CPC1540 6 Pin DIP High Temp Storage TE3089 Readpoint 1 Readpoint 2 Readpoint 3 / Reject/ / Reject/ / Reject/ SS SS SS 168 hrs. 500 hrs. 1000 hrs. 0/90 0/90 0/90 168 hrs. 500 hrs. 1000 hrs. 0/90 0/90 0/90 168 hrs. 500 hrs. 1000 hrs. 0/90 0/90 0/90 168 hrs. 0/77 15 Cycles 0/55 Comments 300 Cycles 0/55 300 Cycles 0/55 (3) Failures: Ball Bond break at neck Ref Report FA11-114 300 Cycles 3/55 IR Reflow Level 1 0/50 IR Reflow Level 2 0/50 168 hrs. 0/50 500 hrs. 0/50 1000 hrs. 0/50 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, www.ixysic.com Page 3 of 5 Reliability Report: CPC1540 6 Pin DIP Qualification Report No.: 2010-017 ESD Testing Results: As part of this qualification, the product CPC1540 was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are summarized in Table 3. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed after +/- 8000V zapping. ESD Model HBM Table3: Product CPC1540 ESD Characterization Results Kit Package ESD Test RC Highest Class Number Spec Network Passed CPC1540 6 Pin Dip 8000V 3A JESD22, 1.5kΩ, TE3034 A114-E 100pF TE3113 TE3114 FIT (Failure in Time) Rate of CPC1540 Table 4 below summarizes the FIT rate from the HTRB data. Using the Reliability HTRB data, FIT rate was calculated based on the equivalent device hours at use condition of 40°C and stressed condition of 125°C at 0.7eV of activation energy according to the Clare’s procedure P-04-25-WW. The FIT rate came out to be 13.34 FITs. Product/ Stress CPC1540/ HTRB Table 4: CPC1540 FIT Rate Summary Lot # of # of Hours Test Number Devices Failed Tested Temp (°° C) TE3089 270 0 1000 125 TE3113 TE3114 Eq. Device Hours 68,959,611 Conclusion: The qualification of the product CPC1540 has been successfully completed for the production release. IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, www.ixysic.com Page 4 of 5 FITs @ 60% CL 13.34 Reliability Report: CPC1540 6 Pin DIP Qualification Report No.: 2010-017 APPROVAL: Prepared by: _Martha W. Brandt*_______________9/19/11_______ Martha W. Brandt Quality Engineer Date Approved by: __Ronald P. Clark*________________9/22/11_______ Ronald P. Clark Director of Quality Date Approved by: _Eirik Gude* 9/22/11_______ Date Eirik Gude Sr. Design Engineer Approved by: _James Archibald*____________ ___ 9/22/11_______ James Archibald Date Director of Development Engineering *Signature on File IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, www.ixysic.com Page 5 of 5