Reliability Report-LCB7XX DIP Style Package (Low Voltage 60V – 100V, Form B) Qualification No: 2012-007B Reliability Report Reliability Data for LCB7XX DIP Style Package (Low Voltage 60V – 100V, Form B) Report Title: Reliability Data for LCB7XX DIP Style Package (Low Voltage 60V – 100V, Form B) Report Number: 2012-007B Date: 5/9/12 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.IXYSIC.COM Page 1 of 5 Reliability Report-LCB7XX DIP Style Package (Low Voltage 60V – 100V, Form B) Qualification No: 2012-007B Introduction: This report summarizes the Reliability data of IXYS Integrated Circuits Division LCB7XX. The Reliability data presented here were collected during IXYS product qualification. The purpose of this qualification was to verify the IXYS Quality and Reliability requirements as outlined in IXYS internal specifications. The LCB7XX silicon is manufactured at IXYS Integrated Circuits Division in Beverly, MA USA and assembled at Atec in the Philippines. Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on the IXYS internal specification and with the approval of the product development team and quality assurance. Table 1: Product LCB7XX Reliability Tests Stress Test Applicable Specs Stress Conditions Mil-Std-883 125°C, 80% Product/ Package LCB716S HTRB 8 Pin SOP THB JESD22, LCB716S 85°C, 85% A101 8 Pin SOP 1000hrs Thermal Mil-Std-883, 0 to 100°C, 10/10 LCB716S Shock (T/S) M1011 dwells, 15 cycles 8 Pin SOP Temp Cycle Mil-Std-883, -55 to 125°C, 10/10 LCB716S (T/C) N1010, “B” dwells, 8 Pin SOP 300 cycles High Temp JESD22LCB716S 125°C, 1000hrs Storage A103C 8 Pin SOP MSL J-STDIR Reflow, LCB716S 020D.1 Level 1 8 Pin SOP ESD JESD22, LCB716S 1.5kΩ, 100pF HBM A114-E 8 Pin SOP Number Sample Total of Lots Size (SS) SS 2 3 129 150 77 231 1 55 55 1 55 55 1 50 50 1 50 50 1 3 3 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.IXYSIC.COM Page 2 of 5 279 Reliability Report-LCB7XX DIP Style Package (Low Voltage 60V – 100V, Form B) Qualification No: 2012-007B Reliability Test Results: The stress tests and associated results for the product LCB7XX qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: Product LCB7XX Reliability Test Results Stress Test HTRB HTRB THB THB THB Product/Kit Number LCB716S T50164 LCB716S TE2690 LCB716S TE2690 LCB716S TE2824 LCB716S TE2825 Thermal Shock LCB716S T50164 Readpoint / (Reject/ SS) 1000 hrs. Comments Qual Lot#1 Data 0/129 1000 hrs. Qual Lot#2 Data 0/150 1000 hrs. Qual Lot#1 Data 0/77 1000 hrs. Qual Lot#2Data 0/77 1000 hrs. Qual Lot#3 Data 0/77 15 Cycles Qual Lot#1Data 0/55 Temp Cycle LCB716S T50164 300 Cycles High Temp Storage LCB716S T50164 1000 hrs. MSL LCB716S T50164 IR Reflow Level 1 Qual Lot#1 Data 0/55 Qual Lot#1 Data 0/50 Qual Lot#1 Data 0/50 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.IXYSIC.COM Page 3 of 5 Reliability Report-LCB7XX DIP Style Package (Low Voltage 60V – 100V, Form B) Qualification No: 2012-007B ESD Testing Results: As part of this qualification, the product LCB7XX was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are summarized in Table 3. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed after +/-8000V testing. Table3: Product LCB7XX ESD Characterization Results ESD Product/Kit Package ESD Test RC Highest Class Model Number Spec Network Passed HBM LCB716S 8 Pin SOP JESD22, 8000V 3B 1.5kΩ, T50164 A114-E 100pF FIT (Failure in Time) Rate on the Product LCB7XX: Table 4 summarizes the number of devices used for the product LCB7XX reliability stress with associated failures. Using the HTRB data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 125°C test temperature and 40°C use temperatures. For THB stress, FITs were calculated based on the 85°C /85% RH test condition with 40°C/60% RH ambient use conditions at the activation energy of 0.7 eV and equivalent device hours. The calculated FITs from the reliability stress came out to be 12.91 and 35.05 for HTRB and THB, respectively. Table 4: Product LCB7XX FIT Rate Summary Qual# Stress Product/Kit # of # of Hours Act. Acc. Number Devices Fails Tested Energy Factor 1 1 HTRB LCB716S T50164 279 THB 231 LCB716S TE2690 TE2824 TE2825 0 1000 Equivalent Dev. Hours FIT Rate @ 60% CL 71,258,265 12.91 1.1363E+ 26,247,604 02 35.05 0.7 255.41 0 1000 0.7 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.IXYSIC.COM Page 4 of 5 Reliability Report-LCB7XX DIP Style Package (Low Voltage 60V – 100V, Form B) Qualification No: 2012-007B Conclusion: The qualification of the product LCB7XX has been successfully completed for the production release. APPROVAL: Prepared by: _Martha W. Brandt*________________________________5/9/12___________ Martha W. Brandt Date Quality Engineer Approved by: _Michael Stanton*__________________________________5/15/12__________ Michael Stanton Date Product Engineer Approved by: _Ronald P. Clark*__________________________________5/15/12___________ Ronald P. Clark Date Director of Quality *Signature on File IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-27-CLARE, WWW.IXYSIC.COM Page 5 of 5