5078 data sheet(English)

5078 series
VCXO Module ICs with Built-in Varicap
OVERVIEW
The 5078 series are CMOS output VCXO ICs that provide a wide frequency pulling range. They employ bipolar oscillator circuit and
recently developed varicap diode fabrication process that provides a low phase noise characteristic and a wide frequency pulling range
without any external components. The 5078 series are ideal for wide pulling range, low phase noise, VCXO modules.
FEATURES
▪ VCXO with recently developed varicap diode built-in
▪ -40 to +105°C operating temperature range
▪ Oscillator: Fundamental frequency oscillation
▪ CMOS output
▪ Output frequency: 30 to 170MHz
▪ Frequency divider built-in
▪ Operating supply voltage range: 2.97 to 3.63V
Selectable by version: fOSC, fOSC/2
▪ Oscillator frequency range (for fundamental oscillation):
▪ Standby function
60 to 100MHz (Ax version)
High impedance in standby mode, oscillator stops
100 to 170MHz (Bx version)
▪ 15pF output load capacitance
▪ Frequency pulling range: ±[email protected] version, VC=1.65±1.65V, f=77.76MHz (γ=290, C0=2.4pF)
±[email protected] version, VC=1.65±1.65V, f=155.52MHz (γ=330, C0=1.5pF)
▪ Low phase noise: [email protected] version, 1kHz Offset, f=77.76MHz (γ=290, C0=2.4pF)
[email protected] version, 10MHz Offset, f=77.76MHz
[email protected] version, 1kHz Offset, f=155.52MHz (γ=330, C0=1.5pF)
[email protected] version, 10kHz Offset, f=155.52MHz
APPLICATIONS
SONET/SDH, Ethernet, Fibre Channel, LTE
SERIES CONFIGURATION
Version Name
Recommended operating frequency range (fOSC)*1[MHz]
5078A1
60MHz to 100MHz
fOSC
5078A2
60MHz to 100MHz
fOSC/2
5078B1
100MHz to 170MHz
fOSC
5078B2
100MHz to 170MHz
fOSC/2
Output frequency (fOUT)
*1. The recommended oscillation frequency is a yardstick value derived from the resonator used for NPC characteristics authentication. However, the
oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to resonator characteristics and mounting conditions, so
the oscillation characteristics of components must be carefully evaluated.
The recommended characteristics for the crystal element are:
A versions: R1 < 20Ω, C0 < 1.5pF
B versions: R1 < 20Ω, C0 < 1.5pF
ORDERING INFORMATION
Device
Package
WF5078xx-4
Wafer form
Version name
WF5078□□-4
Form WF: Wafer form
CF: Chip(Die) form
CF5078xx-4
Chip form
Frequency divider function
Oscillation frequency range
SEIKO NPC CORPORATION - 1
5078 series
PAD LAYOUT
(Unit: μm)
VDD
Q (450,450)
7
XT
6
1
(0,0)
Y
XTN
2
(-450,-450)
3
4
VC
INHN
5
VSS
X
Chip size: 0.9mm×0.9mm
Chip thickness: 130μm
PAD size: 80μm×80μm (PAD No.1, 2, 3, 4, 6, 7 pins)
80μm×160μm (PAD No.5 pin)
Chip base: VSS potential
PIN DESCRIPTION and PAD COORDINATES
No.
Pin
I/O*1
Description
Pad Coordinates (Unit : μm)
X
Y
-345.0
177.0
-345.0
-98.0
-75.4
-345.0
93.2
-345.0
1
XT
I
2
XTN
O
3
VC
I
4
INHN
I
5
VSS
-
(-) ground
337.0
-305.0
6
Q
O
Output one of fOSC, fOSC/2
331.9
345.0
7
VDD
-
(+) supply voltage
50.1
345.0
*1. I: Input pin
Crystal connection pin
Control voltage input pin
Input pin controlled output state(oscillator stops when LOW),
Power-saving pull-up resistor built-in
O: Output pin
SEIKO NPC CORPORATION - 2
5078 series
BLOCK DIAGRAM
VDD
INHN
XT
RPU1, RPU2
RVC1
CVC1
XTN
RVC2
OSC
Level
Shifter
1/N
Divider
CMOS
Q
N=1,2
(Mask Option)
CVC2
VC
VSS
SEIKO NPC CORPORATION - 3
5078 series
SPECIFICATIONS
Absolute Maximum Ratings
VSS=0V
Parameter
Symbol
*1
VDD
*1*2
VIN
Supply voltage range
Input voltage range
*1*2
Output voltage range
VOUT
Junction temperature*3
Tj
Condition
Rating
Unit
VDD pin
-0.3 to +5.0
V
Input pins
-0.3 to VDD+0.3
V
Output pins
-0.3 to VDD+0.3
V
+125
°C
-55 to +125
°C
Ta = -40 ~ +85°C
±20
mA
Ta = -40 ~ +105°C
±10
mA
Storage temperature range*4
TSTG
Wafer, Chip form
Output current*3
IOUT
Q pin
*1. This parameter rating is the values that must never exceed even for a moment. This product may suffer breakdown if this parameter rating is exceeded.
Operation and characteristics are guaranteed only when the product is operated at recommended operating conditions.
*2. VDD is a VDD value of recommended operating conditions.
*3. Do not exceed the absolute maximum ratings. If they are exceeded, a characteristic and reliability will be degraded.
*4. When stored in nitrogen or vacuum atmosphere applied to IC itself only (excluding packaging materials).
Recommended Operating Conditions
VSS=0V
Parameter
Symbol
Conditions
Operating supply voltage
VDD
Between VDD and VSS pins*2
Input voltage
VIN
INHN, VC pins
Operating temperature
Ta
Output load capacitance
CL
Oscillator frequency range*1
fOSC
Output frequency range
fOUT
Rating
Unit
MIN
TYP
MAX
2.97
3.3
3.63
V
0
VDD
V
-40
+105
°C
15
pF
5078Ax
60
100
5078Bx
100
170
5078A1
60
100
5078A2
30
50
5078B1
100
170
5078B2
50
85
MHz
MHz
*1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency
range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation
characteristics of components must be carefully evaluated.
*2. Mount a ceramic chip capacitor that is larger than 0.01μF proximal to IC (within approximately 3mm) between VDD and VSS in order to obtain stable
operation of 5078 series. In addition, the wiring pattern between IC and capacitor should be as wide as possible.
Note. Since it may influence the reliability if it is used out of range of recommended operating conditions, this product should be used within this range.
SEIKO NPC CORPORATION - 4
5078 series
Electrical Characteristics
A1, A2 version
VDD=2.97 to 3.63V, VC=0.5VDD, VSS=0V, Ta= -40 to +105°C unless otherwise noted.
Parameter
Current consumption
A1 version: fOSC
Current consumption
A2 version: fOSC/2
Symbol
IDD
IDD
Rating
Conditions
MIN
measurement circuit 1, no load, INHN=Open
VDD=3.3V, fOSC=77.76MHz, fOUT=77.76MHz
measurement circuit 1, no load, INHN=Open
VDD=3.3V, fOSC=77.76MHz, fOUT=38.88MHz
MAX
5.2
8.0
mA
4.2
7.0
mA
measurement circuit 1,
Ta = -40 ~ +85°C
10
μA
INHN=0V
Ta = -40 ~ +105°C
100
μA
Standby current
ISTB
High-level output voltage
VOH
measurement circuit 2, Q pin, IOH=-4mA
Low-level output voltage
VOL
measurement circuit 2, Q pin, IOL=4mA
VDD-0.4
V
V
1
μA
IZ
High-level input voltage
VIH
measurement circuit 4, INHN pin
Low-level input voltage
VIL
measurement circuit 4, INHN pin
Pull-up resistance 1
RPU1
measurement circuit 5, INHN pin, INHN=0V
1
Pull-up resistance 2
RPU2
measurement circuit 5, INHN pin, INHN=0.7VDD
50
Oscillator block built-in
RVC1
measurement circuit 6, between VC and XT
100
200
300
resistance
RVC2
measurement circuit 6, between VC and XTN
100
200
300
Input leakage resistance*1
RVIN
measurement circuit 7, VC pin, Ta=25°C
CVC1
Oscillator block built-in
capacitance
CVC2
measurement circuit 3, Q pin, INHN=0V, Ta=25°C
0.7VDD
FM
V
0.3VDD
V
4
9
MΩ
100
200
kΩ
10
kΩ
MΩ
Design value (a monitor pattern on a
VC =0.3V
5.88
6.53
7.18
wafer is tested), Excluding parasitic
VC =1.65V
3.51
4.13
4.75
capacitance.
VC =3.0V
1.80
2.25
2.70
Design value (a monitor pattern on a
VC =0.3V
8.82
9.80
10.78
wafer is tested), Excluding parasitic
VC =1.65V
5.27
6.20
7.13
capacitance.
VC =3.0V
2.70
3.38
4.06
20
50
-3dB frequency, Ta=25°C
VDD=3.3V, VC=1.65V±1.65V,
frequency
measurement circuit 8, Crystal : 77.76MHz
*1. These prescriptions indicate the following contents.
Oscillator block built-in resistance: Resistance between VC - XT or XTN
Input leakage resistance: Resistance between VC - VSS (DC characteristic)
Refer to pg.22 for VC Terminal Input Impedance.
Maximum modulation
-1
0.4
Output leakage current
*1
Unit
TYP
pF
pF
kHz
SEIKO NPC CORPORATION - 5
5078 series
B1, B2 version
VDD=2.97 to 3.63V, VC=0.5VDD, VSS=0V, Ta= -40 to +105°C unless otherwise noted.
Parameter
Current consumption
B1 version: fOSC
Current consumption
B2 version: fOSC/2
Symbol
IDD
IDD
Rating
Conditions
MIN
MAX
10
15
mA
8.1
12
mA
Ta = -40 ~ +85°C
10
μA
Ta = -40 ~ +105°C
100
μA
measurement circuit 1, no load, INHN=Open
VDD=3.3V, fOSC=155.52MHz, fOUT=155.52MHz
measurement circuit 1, no load, INHN=Open
VDD=3.3V, fOSC=155.52MHz, fOUT=77.76MHz
measurement circuit 1,
Standby current
ISTB
High-level output voltage
VOH
measurement circuit 2, Q pin, IOH=-8mA
Low-level output voltage
VOL
measurement circuit 2, Q pin, IOH=8mA
INHN=0V
VDD-0.4
Output leakage current
IZ
High-level input voltage
VIH
measurement circuit 4, INHN pin
Low-level input voltage
VIL
measurement circuit 4, INHN pin
Pull-up resistance 1
RPU1
measurement circuit 5, INHN pin, INHN=0V
1
Pull-up resistance 2
RPU2
measurement circuit 5, INHN pin, INHN=0.7VDD
Oscillator block built-in
RVC1
resistance*1
RVC2
Input leakage resistance*1
RVIN
measurement circuit 3, Q pin, INHN=0V, Ta=25°C
V
-1
0.4
V
1
μA
0.7VDD
V
0.3VDD
V
4
9
MΩ
50
100
200
kΩ
measurement circuit 6, between VC and XT
100
200
300
measurement circuit 6, between VC and XTN
100
200
300
measurement circuit 7, VC pin, Ta=25°C
10
Design value (a monitor pattern on a
VC =0.3V
4.38
4.86
5.35
wafer is tested), Excluding parasitic
VC =1.65V
2.62
3.08
3.55
capacitance.
VC =3.0V
1.38
1.72
2.06
capacitance
Design value (a monitor pattern on a
VC =0.3V
6.24
6.94
7.63
wafer is tested), Excluding parasitic
VC =1.65V
3.70
4.36
5.01
capacitance.
VC =3.0V
1.89
2.36
2.83
20
50
CVC2
-3dB frequency, Ta=25°C
VDD=3.3V, VC=1.65V±1.65V,
frequency
measurement circuit 8, Crystal : 155.52MHz
*1. These prescriptions indicate the following contents.
Oscillator block built-in resistance: Resistance between VC - XT or XTN
Input leakage resistance: Resistance between VC - VSS (DC characteristic)
Refer to pg.22 for VC Terminal Input Impedance.
Maximum modulation
FM
kΩ
MΩ
Oscillator block built-in
CVC1
Unit
TYP
pF
pF
kHz
SEIKO NPC CORPORATION - 6
5078 series
Switching Characteristics
A1, A2 version
VDD = 2.97 to 3.63V, VC=0.5VDD, VSS= 0V, Ta = -40 to +105°C unless otherwise noted
Parameter
Symbol
Conditions
AC “H” level output voltage
VTOP
measurement circuit 9, CL=15pF
AC “L” level output voltage
VBASE
measurement circuit 9, CL=15pF
Duty cycle
Duty
measurement circuit 9, Ta=25°C, VDD=3.3V
Rating
MIN
TYP
MAX
0.9VDD
Unit
V
45
0.1VDD
V
55
%
Output rise time
tr
measurement circuit 9, CL=15pF, 0.1VDD→0.9VDD
1.5
3.0
ns
Output fall time
tf
measurement circuit 9, CL=15pF, 0.9VDD→0.1VDD
1.5
3.0
ns
2
ms
200
ns
Output enable propagation delay
tOE
Output disable propagation delay
tOD
measurement circuit 10, Ta=25°C
INHN= “Low”→“High”
measurement circuit 10, Ta=25°C
INHN= “High”→“Low”
Note. The ratings are measured by using the NPC standard crystal and jig. They may vary due to crystal characteristics, so they must be carefully evaluated.
The recommended crystal element characteristics are R1 < 20Ω and C0 < 1.5pF.
B1, B2 version
VDD = 2.97 to 3.63V, VC=0.5VDD, VSS= 0V, Ta = -40 to +105°C unless otherwise noted
Parameter
Symbol
Conditions
AC “H” level output voltage
VTOP
measurement circuit 9, CL=15pF
AC “L” level output voltage
VBASE
measurement circuit 9, CL=15pF
Duty cycle
Duty
measurement circuit 9, Ta=25°C, VDD=3.3V
Rating
MIN
TYP
MAX
0.9VDD
Unit
V
45
0.1VDD
V
55
%
Output rise time
tr
measurement circuit 9, CL=15pF, 0.1VDD→0.9VDD
1.2
2.4
ns
Output fall time
tf
measurement circuit 9, CL=15pF, 0.9VDD→0.1VDD
1.2
2.4
ns
2
ms
200
ns
Output enable propagation delay
tOE
Output disable propagation delay
tOD
measurement circuit 10, Ta=25°C
INHN= “Low”→“High”
measurement circuit 10, Ta=25°C
INHN= “High”→“Low”
Note. The ratings are measured by using the NPC standard crystal and jig. They may vary due to crystal characteristics, so they must be carefully evaluated.
The recommended crystal element characteristics are R1 < 20Ω and C0 < 1.5pF.
SEIKO NPC CORPORATION - 7
5078 series
Timing chart
0.9V DD
0.9VDD
Q
0.1VDD
0.1VDD
Tw
T
tr
DUTY measurement
voltage 0.5VDD
DUTY = Tw/T×100 (%)
tf
Figure 1. Output switching waveform
VDD
INHN
VIH
VIL
VSS
tOD
tOE
0.1V
VTOP
Q
0.5VDD
VBASE
0.1V
fOUT
Hi-Z
Low
fOUT
Figure 2. Output disable and oscillation start timing chart
SEIKO NPC CORPORATION - 8
5078 series
FUNCTIONAL DESCRIPTION
INHN Function
Q output is stopped and becomes high impedance.
INHN
Q
Oscillator
HIGH or Open
fOUT
Operating
LOW
Hi-Z
Stopped
Power Saving Pull-up Resistor
The INHN pin pull-up resistance changes its value to RPU1 or RPU2 in response to the input level (HIGH or LOW).
When INHN is tied to LOW level, the pull-up resistance becomes large (RPU1), thus reducing the current consumed by the resistance.
When INHN is left open circuit or tied to HIGH level, the pull-up resistance becomes small (RPU2), thus internal circuit of INHN becomes
HIGH level.
Consequently, the IC is less susceptible to the effects of noise, helping to avoid problems such as the output stopping suddenly.
Oscillation Detection Function
The 5078 series have an oscillation detection circuit.
The oscillation detection circuit disables the output until crystal oscillation becomes stable when oscillation circuit starts up. This function
avoids the abnormal oscillation in the initial power up and in a reactivation by INHN.
Boot function
It becomes easy to start oscillation by making XTN pin potential to VDD level when oscillation starts up. A current flows into VC pin when
the voltage below a VDD level is being applied to VC pin. A boot function is canceled after an oscillation start.
SEIKO NPC CORPORATION - 9
5078 series
MEASUREMENT CIRCUITS
These are measurement circuits for electrical characteristics and switching characteristics.
■ Note: Bypass capacitors specified in each measurement circuit below should be connected between VDD and VSS. If the bypass
capacitors are not connected, the required characteristics may not be realized.
Circuit wiring of bypass capacitors and load capacitors should be connected as short as possible (within approximately 3mm). If
the circuit wiring is long, the required characteristics may not be realized.
* The capacitor used in measurement circuits below;
GRM188B11H103K (MURATA)
0.01μF
MEASUREMENT CIRCUIT 1
Measurement Parameter: IDD, ISTB
IDD, ISTB
A
0.01μF(Ceramic Chip Capacitor)
VDD
XT
5078xx
XTN
VC
INHN
Q
VSS
IDD1:INHN=Open
IDD2:INHN=Low
SEIKO NPC CORPORATION - 10
5078 series
MEASUREMENT CIRCUIT 2
Measurement Parameter: VOH, VOL
0.01μF(Ceramic Chip Capacitor)
XT input signal:
1.5VP-P sine wave
Signal
Generator
VDD
XT
0.01μF
50Ω
5078xx
XTN
50Ω
Q
VC
INHN
VOH
VS
ΔV
Q
VSS
V
0.1μF
Q
VS adjusted so that ΔV=50×IOH
VS
VOH
VOL
ΔV
VS
VOL
VS adjusted so that ΔV=50×IOL
MEASUREMENT CIRCUIT 3
Measurement Parameter: IZ
0.01μF(Ceramic Chip Capacitor)
VDD
XT
5078xx
XTN
VC
INHN
Q
A
IZ
VSS
SEIKO NPC CORPORATION - 11
5078 series
MEASUREMENT CIRCUIT 4
Measurement Parameter: VIH, VIL
0.01μF(Ceramic Chip Capacitor)
VDD
XT
5078xx
XTN
Q
VC
INHN
VIH
VIL
V
VSS
CL=15pF
(Including probe capacitance)
VIH: VSS→VDD , voltage that changes enable output state
VIL: VDD→VSS , voltage that changes disable output state
MEASUREMENT CIRCUIT 5
Measurement Parameter: RPU1, RPU2
0.01μF(Ceramic Chip Capacitor)
VDD
XT
5078xx
XTN
VC
INHN
IINHN
VINHN
V
Q
VSS
A
RPU1= (VDD-VINHN)/IINHN, VINHN= 0V
RPU2= (VDD-VINHN)/IINHN, VINHN= 0.7VDD
SEIKO NPC CORPORATION - 12
5078 series
MEASUREMENT CIRCUIT 6
Measurement Parameter: RVC1, RVC2
0.01μF(Ceramic Chip Capacitor)
IXT
A
VDD
0.01μF(Ceramic Chip Capacitor)
VDD
XT
XT
IXTN
5078xx
A
5078xx
XTN
XTN
Q
VC
INHN
VC
VSS
INHN
Q
VSS
RVC1 = VDD / IXT
RVC2 = VDD / IXTN
MEASUREMENT CIRCUIT 7
Measurement Parameter: RVIN
0.01μF(Ceramic Chip Capacitor)
VDD
XT
5078xx
XTN
IVIN
A
VC
INHN
Q
VSS
RVIN = VDD / IVIN
SEIKO NPC CORPORATION - 13
5078 series
MEASUREMENT CIRCUIT 8
Measurement Parameter: FM
0.01μF(Ceramic Chip Capacitor)
VDD
XT
5078xx
XTN
VC input signal:
sine wave, 0 to VDD
VC
Function
Generator
Q
CL=15pF
(Including probe capacitance)
50Ω
INHN
VSS
200Ω
0.01μF
EXT Trigger In
Signal Source
Analyzer
(E5052B)
MEASUREMENT CIRCUIT 9
Measurement Parameter: Duty, tr, tf, VTOP, VBASE
0.01μF(Ceramic Chip Capacitor)
VDD
XT
5078xx
XTN
VC
INHN
Q
VSS
CL=15pF
(Including probe capacitance)
SEIKO NPC CORPORATION - 14
5078 series
MEASUREMENT CIRCUIT 10
Measurement Parameter: tOE, tOD
0.01μF(Ceramic Chip Capacitor)
VDD
XT
5078xx
1kΩ
XTN
VC
INHN
Function
Generator
50Ω
Q
VSS
1kΩ
CL=15pF
(Including probe capacitance)
SEIKO NPC CORPORATION - 15
5078 series
REFERENCE DATA
The following characteristics are measured using the crystal below. Note that the characteristics will vary with the crystal used.
Crystal used for measurement
Crystal parameters
Parameter
A1
B1
fOSC(MHz)
77.76
155.52
C0(pF)
2.4
1.5
γ(=C0/C1)
290
330
R1(Ω)
7.0
9.3
C1
L1
R1
C0
Pulling Range
[Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C
[5078Ax] fOSC =77.76MHz
[5078Bx] fOSC =155.52MHz
150
200
Pulling Range[ppm]VC =1.65V standard
Pulling Range[ppm]VC =1.65V standard
150
100
50
0
-50
-100
-150
-200
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
3.0
100
50
0
-50
-100
-150
3.3
0.0
VC [V]
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
3.0
3.3
VC [V]
[Measurement circuit diagram]
0.01μF(Ceramic Chip Capacitor)
VDD
XT
5078xx
XTN
VC
INHN
0.01μF
Q
200Ω
VSS
Signal Source
Analyzer
(E5052B)
CL=15pF
SEIKO NPC CORPORATION - 16
5078 series
Phase Noise
[Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C
[5078A1] fOSC =77.76MHz, fOUT =77.76MHz
[5078A2] fOSC =77.76MHz, fOUT =38.88MHz
-60
-60
VC=0V
VC=0V
-80
VC=1.65V
VC=3.3V
-100
Phase Noise[dBc/Hz]
Phase Noise[dBc/Hz]
-80
Rms jitter(12kHz~20MHz)
VC=0V : 100fs
VC=1.65V : 77fs
VC=3.3V : 71fs
-120
-140
-160
-180
1.E+01
VC=1.65V
VC=3.3V
-100
Rms jitter(12kHz~20MHz)
VC=0V : 181fs
VC=1.65V : 140fs
VC=3.3V : 130fs
-120
-140
-160
1.E+02
1.E+03
1.E+04
1.E+05
1.E+06
1.E+07
-180
1.E+01
1.E+08
1.E+02
1.E+03
Offset Frequency[Hz]
[5078B1] fOSC =155.52MHz, fOUT =155.52MHz
1.E+06
1.E+07
1.E+08
-60
VC=0V
-80
VC=0V
-80
VC=1.65V
VC=3.3V
-100
Phase Noise[dBc/Hz]
Phase Noise[dBc/Hz]
1.E+05
[5078B2] fOSC =155.52MHz, fOUT =77.76MHz
-60
Rms jitter(12kHz~20MHz)
VC=0V : 72fs
VC=1.65V : 51fs
VC=3.3V : 46fs
-120
-140
-160
-180
1.E+01
1.E+04
Offset Frequency[Hz]
VC=1.65V
VC=3.3V
-100
Rms jitter(12kHz~20MHz)
VC=0V : 140fs
VC=1.65V : 106fs
VC=3.3V : 97fs
-120
-140
-160
1.E+02
1.E+03
1.E+04
1.E+05
1.E+06
1.E+07
-180
1.E+01
1.E+08
1.E+02
Offset Frequency[Hz]
1.E+03
1.E+04
1.E+05
1.E+06
1.E+07
1.E+08
Offset Frequency[Hz]
[Measurement circuit diagram]
0.01μF(Ceramic Chip Capacitor)
VDD
XT
5078xx
XTN
VC
INHN
0.01μF
Q
200Ω
VSS
Signal Source
Analyzer
(E5052B)
CL=15pF
SEIKO NPC CORPORATION - 17
5078 series
Modulation Bandwidth
[Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C
[5078A2] fOSC =77.76MHz, fOUT =38.88MHz
3
3
0
0
-3
-3
Fm[dB] 1kHz standard
Fm[dB] 1kH z standard
[5078A1] fOSC =77.76MHz, fOUT =77.76MHz
-6
-9
-6
-9
-12
-12
-15
-15
-18
-18
1
10
100
1
VC Input Frequency[kHz]
3
3
0
0
-3
-3
-6
-9
-6
-9
-12
-12
-15
-15
-18
10
VC Input Frequency[kHz]
100
[5078B2] fOSC =155.52MHz, fOUT =77.76MHz
Fm[dB] 1kHz standard
Fm[dB] 1kHz standard
[5078B1] fOSC =155.52MHz, fOUT =155.52MHz
1
10
VC Input Frequency[kHz]
100
-18
1
100
10
VC Input Frequency[kHz]
[Measurement circuit diagram] Measurement circuit 8
SEIKO NPC CORPORATION - 18
5078 series
Negative Resistance
[Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C, C0=0pF
[5078Ax] After boot release
0
0
-100
-100
-200
-200
-300
-300
Negative Resistance[Ω]
Negativ e Resistance[Ω]
[5078Ax] Boot
-400
-500
-600
-700
VC=0V
-800
VC=1.65V
-900
VC=3.3V
-1000
-500
-600
-700
VC=0V
-800
VC=1.65V
-900
VC=3.3V
-1000
0
50
100
Frequency[MHz]
150
200
[5078Bx] Boot
0
50
100
Frequency[MHz]
150
200
[5078Bx] After boot release
0
0
-100
-100
-200
-200
-300
-300
Negative Resistance[Ω]
Negative Resistance[Ω]
-400
-400
-500
-600
-700
-400
-500
-600
-700
VC=0V
-800
-900
VC=0V
-800
VC=1.65V
VC=1.65V
-900
VC=3.3V
-1000
VC=3.3V
-1000
0
50
100
Frequency[MHz]
150
200
0
50
100
Frequency[MHz]
150
200
At the time of oscillation start, negative resistance becomes deep by boot function.
The boot function is released when the oscillation is steady, and oscillation starts.
[Measurement circuit diagram]
0.01μF(Ceramic Chip Capacitor)
VDD
Network-Analyzer
(Agilent 4396B)
S-Parameter Test Set
(Agilent 85046A)
XT
5078xx
XTN
VC
INHN
Q
VSS
Measurement results using 4396B Agilent analyzer on NPC test jig.
Measurements will vary with test jig and measurement environment.
SEIKO NPC CORPORATION - 19
5078 series
Drive Level
[Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C
[5078Ax] fOSC =77.76MHz
200
DL [uW]
150
100
50
0
0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
3
3.3
2.1
2.4
2.7
3
3.3
VC [V]
[5078Bx] fOSC =155.52MHz
200
DL [uW]
150
100
50
0
0
0.3
0.6
0.9
1.2
1.5
1.8
VC [V]
[Measurement circuit diagram]
0.01μF(Ceramic Chip Capacitor)
VDD
XT
Tektronix CT-6
Current Probe
DL = (IX' tal) 2 × Re
5078xx
IX'tal: Current though Crystal (RMS)
Re: Crystal’s effective resistance
XTN
VC
INHN
Q
VSS
CL=15pF
SEIKO NPC CORPORATION - 20
5078 series
Oscillator CL Characteristics
[Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C
[5078Ax] fOSC =77.76MHz
7.0
6.0
CLOSC [pF]
5.0
4.0
3.0
2.0
1.0
0.0
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
3.0
3.3
2.7
3.0
3.3
VC [V]
[5078Bx] fOSC =155.52MHz
7.0
6.0
CLOSC [pF]
5.0
4.0
3.0
2.0
1.0
0.0
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
VC [V]
[Measurement circuit diagram]
0.01μF(Ceramic Chip Capacitor)
VDD
CLOSC: Oscillator circuit equivalent capacitance
determined by oscillator frequency
XT
5078xx
CLosc =
XTN
VC
INHN
0.01μF
Q
200Ω
VSS
CL=15pF
Signal Source
Analyzer
(E5052B)
C1
⎛ f OSC
⎜⎜
⎝ fs
2
⎞
⎟⎟ − 1
⎠
− C0
C1: Crystal element equivalent series capacitance
C0: Crystal element equivalent parallel capacitance
fs: Crystal element series resonance frequency
SEIKO NPC CORPORATION - 21
5078 series
VC Terminal Input Impedance
[Measurement conditions] Ta=25°C, VC=0V
[5078Ax]
600
VC Input Impedance[kΩ]
500
400
300
200
100
0
0
10
20
30
40
50
60
70
80
90
10 0
70
80
90
10 0
VC Input Frequency[kHz]
[5078Bx]
600
VC Input I mpedance[kΩ ]
500
400
300
200
100
0
0
10
20
30
40
50
60
VC Input Frequency[kHz]
[Measurement circuit diagram]
VDD
XT
5078xx
XTN
Impedance
Analyzer
(HP 4194A)
VC
INHN
Q
VSS
SEIKO NPC CORPORATION - 22
5078 series
Current Consumption
[Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C
[5078Ax]
14
12
IDD[mA]
10
8
A1
6
A2
4
VC =0V
VC =1.65V
VC =3.3V
2
0
20
30
40
50
60
70
80
90
100
Output Frequency[MHz]
[5078Bx]
14
12
B1
10
IDD[mA]
B2
8
6
VC=0V
VC=1.65V
VC=3.3V
4
2
0
40
60
80
100
120
140
160
180
Output Frequency[MHz]
[Measurement circuit diagram] Measurement circuit 1
SEIKO NPC CORPORATION - 23
5078 series
Output Waveform
[Measurement conditions] VDD=3.3V, VSS=0V, VC=1.65V, Ta=25°C
[5078A1] fOSC =77.76MHz, fOUT=77.76MHz
[5078A2] fOSC=77.76MHz, fOUT=38.88MHz
[5078B1] fOSC =155.52MHz, fOUT=155.52MHz
[5078B2] fOSC =155.52MHz, fOUT=77.76MHz
[Measurement circuit diagram] Measurement circuit 9
Measurement equipment: Oscilloscope DSO80604B(Agilent), Differential probe 1134A (Probe head E2678A)
SEIKO NPC CORPORATION - 24
5078 series
Please pay your attention to the following points at time of using the products shown in this document.
1. The products shown in this document (hereinafter ”Products”) are designed and manufactured to the generally accepted standards of
reliability as expected for use in general electronic and electrical equipment, such as personal equipment, machine tools and
measurement equipment. The Products are not designed and manufactured to be used in any other special equipment requiring
extremely high level of reliability and safety, such as aerospace equipment, nuclear power control equipment, medical equipment,
transportation equipment, disaster prevention equipment, security equipment. The Products are not designed and manufactured to be
used for the apparatus that exerts harmful influence on the human lives due to the defects, failure or malfunction of the Products.
If you wish to use the Products in that apparatus, please contact our sales section in advance.
In the event that the Products are used in such apparatus without our prior approval, we assume no responsibility whatsoever for any
damages resulting from the use of that apparatus.
2. NPC reserves the right to change the specifications of the Products in order to improve the characteristics or reliability thereof.
3. The information described in this document is presented only as a guide for using the Products. No responsibility is assumed by us for any
infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise
under any patents or other rights of the third parties. Then, we assume no responsibility whatsoever for any damages resulting from that
infringements.
4. The constant of each circuit shown in this document is described as an example, and it is not guaranteed about its value of the mass
production products.
5. In the case of that the Products in this document falls under the foreign exchange and foreign trade control law or other applicable laws and
regulations, approval of the export to be based on those laws and regulations are necessary. Customers are requested appropriately take
steps to obtain required permissions or approvals from appropriate government agencies.
SEIKO NPC CORPORATION
1-9-9, Hatchobori, Chuo-ku,
Tokyo 104-0032, Japan
Telephone: +81-3-5541-6501
Facsimile: +81-3-5541-6510
http://www.npc.co.jp/
Email:[email protected]
ND13015-E-01 2013.06
SEIKO NPC CORPORATION - 25