RAD Electrical Testing Procedure for the UC1856

TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Radiation Lot Acceptance Testing (RLAT) of the RH1498MW Dual Rail-toRail Input and Output Precision C-Load Op Amp for Linear Technology
Customer: Linear Technology, PO# 71928L
RAD Job Number: 15-0091
Part Type Tested: RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp, Linear
Technology RH1498M Datasheet Revision F.
Traceability Information: Fab Lot Number: W1403645.3, Lot Number: 759406.1, Wafer Number: 10,
Date Code: 1422A. See photograph of unit under test in Appendix A.
Quantity of Units: 12 units received, 5 units for biased irradiation, 5 units for unbiased irradiation and 2
units for control. Serial numbers 680, 681, 682, 683 and 684 were biased during irradiation, serial
numbers 685, 686, 688, 689 and 690 were unbiased during irradiation and serial numbers 691 and 692
were used as control. See Appendix B for the radiation bias connection table.
Radiation and Electrical Test Increments: 50rad(Si)/s ionizing radiation with electrical test
increments: pre-irradiation, 20krad(Si), 50krad(Si), 100krad(Si) and 200krad(Si).
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD
Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a
168-hour 100°C anneal. Both anneals were performed in the same electrical bias condition as the
irradiations. Electrical measurements were made following each anneal increment.
Radiation Test Standard: MIL-STD-750 TM1019 and/or MIL-STD-883 TM1019 Condition A and
Linear Technology RH1498M Datasheet Revision F.
Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS04, Calibration Date:
4/30/2014, Calibration Due: 4/30/2015. LTS2101 Family Board, Entity ID FB02. LTS0600 Test Fixture,
Entity ID TF03. RH1498 DUT Board. Test Program: RH1498X.SRC
Facility and Radiation Source: Aeroflex RAD's, Colorado Springs, CO. Gamma rays provided by
JLSA 81-24 Co60 source. Dosimetry performed by Air Ionization Chamber (AIC) traceable to NIST.
Aeroflex RAD's dosimetry has been audited by DLA and Aeroflex RAD has been awarded Laboratory
Suitability for MIL-STD-750 and MIL-STD-883 TM 1019.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and
MIL-STD-750.
RLAT Test Result:
 PASSED the total ionizing dose test to the 200krad(Si) dose level
 PASSED following 24-hour room temperature anneal
 PASSED following 168-hour 100°C anneal
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TID Report
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Aeroflex RAD
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is
frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage
will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to
ensure a worst-case test condition MIL-STD-883H TM1019 calls out a dose rate of 50 to 300rad(Si)/s as
Condition A and further specifies that the time from the end of an incremental radiation exposure and
electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to
the beginning of the next incremental radiation step should be 2-hours or less. The work described in
this report was performed to meet MIL-STD-883H TM1019 Condition A.
2.0. Radiation Test Apparatus
The total ionizing dose testing described in this final report was performed using the facilities at
Aeroflex RAD's Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose
(TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are
held in the base of the irradiator heavily shielded by lead. During the radiation exposures the rod is
raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this
irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 300rad(Si)/s,
determined by the distance from the source. For high-dose rate experiments the bias boards are placed in
a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required
dose rate. The irradiator calibration is maintained by Aeroflex RAD Longmire Laboratories using air
ionization chamber (AIC) equipment calibrated with traceability to the National Institute of Standards
and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at
Aeroflex RAD's Longmire Laboratory facility.
Aeroflex RAD is currently certified by the Defense Supply Center Columbus (DLA) for Laboratory
Suitability under MIL STD 750 and MIL-STD-883H. Additional details regarding Aeroflex RAD
dosimetry for TM1019 Condition A testing are available in Aeroflex RAD's report to DLA entitled:
"Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation
Assured Devices".
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TID Report
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Aeroflex RAD
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(719) 531-0800
Figure 2.1. Aeroflex RAD's high dose rate Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately
300rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet.
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TID Report
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Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
3.0. Radiation Test Conditions
The RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp described in this final
report were irradiated using a split +/-15V supply and with all pins tied to ground, that is biased and
unbiased. See the TID Bias Table in Appendix B for the full bias circuits. In our opinion, this bias circuit
satisfies the requirements of MIL-STD-883H TM1019 Section 3.9.3 Bias and Loading Conditions which
states "The bias applied to the test devices shall be selected to produce the greatest radiation induced
damage or the worst-case damage for the intended application, if known. While maximum voltage is
often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load
current) exhibit more degradation with 0 V bias."
The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental
readings at 20krad(Si), 50krad(Si) and 100krad(Si). Electrical testing occurred within one hour
following the end of each irradiation segment. For intermediate irradiations, the parts were tested and
returned to total dose exposure within two hours from the end of the previous radiation increment.
The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s
and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MILSTD-883H TM1019 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al) container. Test
specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm
Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and
for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1)
initially, (2) when the source is changed, or (3) when the orientation or configuration of the source,
container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g.,
a TLD) in the device-irradiation container at the approximate test-device position. If it can be
demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors
due to dose enhancement, the Pb/Al container may be omitted."
The final dose rate within the high dose rate lead-aluminum enclosure was determined using calibration
calculations based on air ionization chamber (AIC) dosimetry performed just prior to beginning the total
dose irradiations. The final dose rate for this work was 54.25rad(Si)/s with a precision of ±5%.
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TID Report
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4.0. Tested Parameters
During the total ionizing dose characterization testing the following electrical parameters were measured
pre- and post-irradiation:
1.
2.
3.
4.
5.
6.
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28.
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30.
31.
32.
33.
34.
35.
36.
37.
+Supply Current 15V (A) @ VS=+/-15V
-Supply Current 15V (A) @ VS=+/-15V
Input Offset Voltage1_1 15V (V) @ VS=+/-15V, VCM=0V
Input Offset Voltage1_2 15V (V) @ VS=+/-15V, VCM=0V
Input Offset Current1_1 15V (A) @ VS=+/-15V, VCM=0V
Input Offset Current1_2 15V (A) @ VS=+/-15V, VCM=0V
+Input Bias Current1_1 15V (A) @ VS=+/-15V, VCM=0V
+Input Bias Current1_2 15V (A) @ VS=+/-15V, VCM=0V
-Input Bias Current1_1 15V (A) @ VS=+/-15V, VCM=0V
-Input Bias Current1_2 15V (A) @ VS=+/-15V, VCM=0V
Input Offset Voltage2_1 15V (V) @ VS=+/-15V, VCM=15V
Input Offset Voltage2_2 15V (V) @ VS=+/-15V, VCM=15V
Input Offset Current2_1 15V (A) @ VS=+/-15V, VCM=15V
Input Offset Current2_2 15V (A) @ VS=+/-15V, VCM=15V
+Input Bias Current2_1 15V (A) @ VS=+/-15V, VCM=15V
+Input Bias Current2_2 15V (A) @ VS=+/-15V, VCM=15V
-Input Bias Current2_1 15V (A) @ VS=+/-15V, VCM=15V
-Input Bias Current2_2 15V (A) @ VS=+/-15V, VCM=15V
Input Offset Voltage3_1 15V (V) @ VS=+/-15V, VCM=-15V
Input Offset Voltage3_2 15V (V) @ VS=+/-15V, VCM=-15V
Input Offset Current3_1 15V (A) @ VS=+/-15V, VCM=-15V
Input Offset Current3_2 15V (A) @ VS=+/-15V, VCM=-15V
+Input Bias Current3_1 15V (A) @ VS=+/-15V, VCM=-15V
+Input Bias Current3_2 15V (A) @ VS=+/-15V, VCM=-15V
-Input Bias Current3_1 15V (A) @ VS=+/-15V, VCM=-15V
-Input Bias Current3_2 15V (A) @ VS=+/-15V, VCM=-15V
Output Voltage Swing High1_1 15V (V) @ VS=+/-15V, IL=0mA
Output Voltage Swing High1_2 15V (V) @ VS=+/-15V, IL=0mA
Output Voltage Swing High2_1 15V (V) @ VS=+/-15V, IL=1mA
Output Voltage Swing High2_2 15V (V) @ VS=+/-15V, IL=1mA
Output Voltage Swing High3_1 15V (V) @ VS=+/-15V, IL=10mA
Output Voltage Swing High3_2 15V (V) @ VS=+/-15V, IL=10mA
Output Voltage Swing Low1_1 15V (V) @ VS=+/-15V, IL=0mA
Output Voltage Swing Low1_2 15V (V) @ VS=+/-15V, IL=0mA
Output Voltage Swing Low2_1 15V (V) @ VS=+/-15V, IL=1mA
Output Voltage Swing Low2_2 15V (V) @ VS=+/-15V, IL=1mA
Output Voltage Swing Low3_1 15V (V) @ VS=+/-15V, IL=10mA
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38.
39.
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79.
Aeroflex RAD
5030 Centennial Blvd.
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(719) 531-0800
Output Voltage Swing Low3_2 15V (V) @ VS=+/-15V, IL=10mA
Large Signal Voltage Gain1_1 15V (V/mV) @ VS=+/-15V, VO=+/-14.5V, RL=10kΩ
Large Signal Voltage Gain1_2 15V (V/mV) @ VS=+/-15V, VO=+/-14.5V, RL=10kΩ
Large Signal Voltage Gain2_1 15V (V/mV) @ VS=+/-15V, VO=+/-10V, RL=2kΩ
Large Signal Voltage Gain2_2 15V (V/mV) @ VS=+/-15V, VO=+/-10V, RL=2kΩ
Common Mode Rejection Ratio1_1 15V (dB) @ VS=+/-15V, VCM=+/-15V
Common Mode Rejection Ratio1_2 15V (dB) @ VS=+/-15V, VCM=+/-15V
CMRR Match1 15V (dB) @ VS=+/-15V, VCM=+/-15V
Power Supply Rejection Ratio1_1 (dB) @ VS=+/-2V to +/-16V
Power Supply Rejection Ratio1_2 (dB) @ VS=+/-2V to +/-16V
PSRR Match1 15V (dB) @ VS=+/-2V to +/-16V
+Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V
+Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V
-Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V
-Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V
Gain-Bandwidth Product1_1 15V (MHz) @ VS=+/-15V, f=100kHz
Gain-Bandwidth Product1_2 15V (MHz) @ VS=+/-15V, f=100kHz
+Slew Rate1_1 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ
+Slew Rate1_2 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ
-Slew Rate1_1 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ
-Slew Rate1_2 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ
+Supply Current 5V (A) @ VS=+5V
-Supply Current 5V (A) @ VS=+5V
Input Offset Voltage1_1 5V (V) @ VS=+5V, VCM=0V
Input Offset Voltage1_2 5V (V) @ VS=+5V, VCM=0V
Input Offset Current1_1 5V (A) @ VS=+5V, VCM=0V
Input Offset Current1_2 5V (A) @ VS=+5V, VCM=0V
+Input Bias Current1_1 5V (A) @ VS=+5V, VCM=0V
+Input Bias Current1_2 5V (A) @ VS=+5V, VCM=0V
-Input Bias Current1_1 5V (A) @ VS=+5V, VCM=0V
-Input Bias Current1_2 5V (A) @ VS=+5V, VCM=0V
Input Offset Voltage2_1 5V (V) @ VS=+5V, VCM=5V
Input Offset Voltage2_2 5V (V) @ VS=+5V, VCM=5V
Input Offset Current2_1 5V (A) @ VS=+5V, VCM=5V
Input Offset Current2_2 5V (A) @ VS=+5V, VCM=5V
+Input Bias Current2_1 5V (A) @ VS=+5V, VCM=5V
+Input Bias Current2_2 5V (A) @ VS=+5V, VCM=5V
-Input Bias Current2_1 5V (A) @ VS=+5V, VCM=5V
-Input Bias Current2_2 5V (A) @ VS=+5V, VCM=5V
Output Voltage Swing High1_1 5V (V) @ VS=+5V, IL=0mA
Output Voltage Swing High1_2 5V (V) @ VS=+5V, IL=0mA
Output Voltage Swing High2_1 5V (V) @ VS=+5V, IL=1mA
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80.
81.
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Output Voltage Swing High2_2 5V (V) @ VS=+5V, IL=1mA
Output Voltage Swing High3_1 5V (V) @ VS=+5V, IL=2.5mA
Output Voltage Swing High3_2 5V (V) @ VS=+5V, IL=2.5mA
Output Voltage Swing Low1_1 5V (V) @ VS=+5V, IL=0mA
Output Voltage Swing Low1_2 5V (V) @ VS=+5V, IL=0mA
Output Voltage Swing Low2_1 5V (V) @ VS=+5V, IL=1mA
Output Voltage Swing Low2_2 5V (V) @ VS=+5V, IL=1mA
Output Voltage Swing Low3_1 5V (V) @ VS=+5V, IL=2.5mA
Output Voltage Swing Low3_2 5V (V) @ VS=+5V, IL=2.5mA
Large Signal Voltage Gain1_1 5V (V/mV) @ VS=+5V, VO=75mV TO 4.8V, RL=10kΩ
Large Signal Voltage Gain1_2 5V (V/mV) @ VS=+5V, VO=75mV TO 4.8V, RL=10kΩ
Common Mode Rejection Ratio1_1 5V (dB) @ VS=+5V, VCM=0 TO 5V
Common Mode Rejection Ratio1_2 5V (dB) @ VS=+5V, VCM=0 TO 5V
CMRR Match1 5V (dB) @ VS=+5V
Power Supply Rejection Ratio1_1 5V (dB) @ VS=+4.5V TO +12V
Power Supply Rejection Ratio1_2 5V (dB) @ VS=+4.5V TO +12V
PSRR Match1 5V (dB) @ VS=+4.5V to +12V
+Short-Circuit Current1_1 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY
+Short-Circuit Current1_2 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY
-Short-Circuit Current1_1 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY
-Short-Circuit Current1_2 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY
+Slew Rate1_1 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ
+Slew Rate1_2 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ
-Slew Rate1_1 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ
-Slew Rate1_2 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the total ionizing dose test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet
specification limits, then the lot could be logged as a failure.
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5.0. Total Ionizing Dose Test Results
Based on this criterion the RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp
(from the lot traceability information provided on the first page of this test report) the units-under-test:
 PASSED the total ionizing dose test to the 200krad(Si) dose level
 PASSED following 24-hour room temperature anneal
 PASSED following 168-hour 100°C anneal
Figures 5.1 through 5.104 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 - 5.104 show the corresponding raw data for each of these parameters. In the data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the sample irradiated in the biased condition while the shaded lines
(solid or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
The control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained in control throughout the duration of the tests and the
observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section
to facilitate the location of a particular parameter.
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Figure 5.1. Plot of +Supply Current 15V (A) @ VS=+/-15V versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
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Table 5.1. Raw data for +Supply Current 15V (A) @ VS=+/-15V versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
+Supply Current 15V (A)
@ VS=+/-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
0
3.61E-03
3.58E-03
3.72E-03
3.51E-03
3.66E-03
3.56E-03
3.58E-03
3.80E-03
3.60E-03
3.62E-03
3.63E-03
3.59E-03
Total Dose (krad(Si))
20
50
100
3.56E-03 3.49E-03 3.53E-03
3.51E-03 3.46E-03 3.42E-03
3.66E-03 3.61E-03 3.58E-03
3.44E-03 3.39E-03 3.34E-03
3.60E-03 3.55E-03 3.50E-03
3.53E-03 3.49E-03 3.44E-03
3.54E-03 3.50E-03 3.46E-03
3.78E-03 3.76E-03 3.73E-03
3.57E-03 3.54E-03 3.51E-03
3.63E-03 3.54E-03 3.49E-03
3.63E-03 3.62E-03 3.63E-03
3.59E-03 3.59E-03 3.59E-03
200
3.38E-03
3.37E-03
3.54E-03
3.31E-03
3.47E-03
3.39E-03
3.40E-03
3.69E-03
3.45E-03
3.41E-03
3.63E-03
3.59E-03
24-hr
Anneal
225
3.40E-03
3.39E-03
3.54E-03
3.31E-03
3.47E-03
3.40E-03
3.43E-03
3.71E-03
3.48E-03
3.44E-03
3.63E-03
3.60E-03
168-hr
Anneal
250
3.49E-03
3.46E-03
3.60E-03
3.39E-03
3.55E-03
3.48E-03
3.51E-03
3.76E-03
3.53E-03
3.53E-03
3.63E-03
3.59E-03
Biased Statistics
Average Biased
3.61E-03 3.55E-03 3.50E-03 3.48E-03 3.41E-03 3.42E-03 3.50E-03
Std Dev Biased
7.92E-05 8.21E-05 8.34E-05 9.26E-05 8.97E-05 8.76E-05 8.08E-05
Ps90%/90% (+KTL) Biased
3.83E-03 3.78E-03 3.73E-03 3.73E-03 3.66E-03 3.66E-03 3.72E-03
Ps90%/90% (-KTL) Biased
3.40E-03 3.33E-03 3.27E-03 3.22E-03 3.17E-03 3.18E-03 3.28E-03
Un-Biased Statistics
Average Un-Biased
3.63E-03 3.61E-03 3.56E-03 3.53E-03 3.47E-03 3.49E-03 3.56E-03
Std Dev Un-Biased
9.85E-05 1.05E-04 1.11E-04 1.18E-04 1.27E-04 1.26E-04 1.13E-04
Ps90%/90% (+KTL) Un-Biased
3.90E-03 3.90E-03 3.87E-03 3.85E-03 3.82E-03 3.84E-03 3.87E-03
Ps90%/90% (-KTL) Un-Biased
3.36E-03 3.32E-03 3.26E-03 3.20E-03 3.12E-03 3.15E-03 3.25E-03
Specification MAX
5.00E-03 5.00E-03 5.00E-03 5.00E-03 5.00E-03 5.00E-03 5.00E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
10
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.2. Plot of -Supply Current 15V (A) @ VS=+/-15V versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence
limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s)
are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DLA Certified Company
11
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.2. Raw data for -Supply Current 15V (A) @ VS=+/-15V versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
-Supply Current 15V (A)
@ VS=+/-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
0
-3.62E-03
-3.59E-03
-3.73E-03
-3.52E-03
-3.67E-03
-3.56E-03
-3.58E-03
-3.81E-03
-3.61E-03
-3.62E-03
-3.64E-03
-3.60E-03
Biased Statistics
Average Biased
-3.62E-03
Std Dev Biased
7.96E-05
Ps90%/90% (+KTL) Biased
-3.41E-03
Ps90%/90% (-KTL) Biased
-3.84E-03
Un-Biased Statistics
Average Un-Biased
-3.64E-03
Std Dev Un-Biased
9.79E-05
Ps90%/90% (+KTL) Un-Biased -3.37E-03
Ps90%/90% (-KTL) Un-Biased
-3.90E-03
Specification MIN
-5.00E-03
Status
PASS
Total Dose (krad(Si))
20
50
100
-3.56E-03 -3.50E-03 -3.54E-03
-3.52E-03 -3.47E-03 -3.43E-03
-3.67E-03 -3.62E-03 -3.58E-03
-3.45E-03 -3.40E-03 -3.35E-03
-3.61E-03 -3.56E-03 -3.51E-03
-3.53E-03 -3.49E-03 -3.45E-03
-3.55E-03 -3.51E-03 -3.47E-03
-3.79E-03 -3.77E-03 -3.74E-03
-3.58E-03 -3.55E-03 -3.52E-03
-3.64E-03 -3.54E-03 -3.50E-03
-3.64E-03 -3.63E-03 -3.64E-03
-3.60E-03 -3.60E-03 -3.60E-03
200
-3.39E-03
-3.38E-03
-3.54E-03
-3.31E-03
-3.47E-03
-3.40E-03
-3.40E-03
-3.70E-03
-3.46E-03
-3.41E-03
-3.64E-03
-3.60E-03
24-hr
Anneal
225
-3.41E-03
-3.39E-03
-3.55E-03
-3.32E-03
-3.48E-03
-3.41E-03
-3.44E-03
-3.72E-03
-3.48E-03
-3.45E-03
-3.64E-03
-3.60E-03
168-hr
Anneal
250
-3.50E-03
-3.47E-03
-3.61E-03
-3.40E-03
-3.55E-03
-3.49E-03
-3.51E-03
-3.77E-03
-3.54E-03
-3.54E-03
-3.64E-03
-3.60E-03
-3.56E-03 -3.51E-03 -3.48E-03 -3.42E-03 -3.43E-03 -3.51E-03
8.19E-05 8.35E-05 9.08E-05 8.98E-05 8.90E-05 8.07E-05
-3.34E-03 -3.28E-03 -3.23E-03 -3.17E-03 -3.19E-03 -3.28E-03
-3.79E-03 -3.74E-03 -3.73E-03 -3.67E-03 -3.67E-03 -3.73E-03
-3.62E-03
1.05E-04
-3.33E-03
-3.91E-03
-5.00E-03
PASS
-3.57E-03
1.12E-04
-3.26E-03
-3.88E-03
-5.00E-03
PASS
-3.54E-03
1.17E-04
-3.22E-03
-3.86E-03
-5.00E-03
PASS
-3.47E-03
1.28E-04
-3.12E-03
-3.82E-03
-5.00E-03
PASS
An ISO 9001:2008 and DLA Certified Company
12
-3.50E-03
1.26E-04
-3.16E-03
-3.85E-03
-5.00E-03
PASS
-3.57E-03
1.13E-04
-3.26E-03
-3.88E-03
-5.00E-03
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.3. Plot of Input Offset Voltage1_1 15V (V) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
13
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.3. Raw data for Input Offset Voltage1_1 15V (V) @ VS=+/-15V, VCM=0V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage1_1 15V (V)
@ VS=+/-15V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.04E-04
-3.10E-04
-1.99E-04
7.34E-06
8.43E-05
1.05E-04
7.70E-05
-2.37E-04
1.96E-04
8.33E-05
-1.84E-04
-3.34E-04
Total Dose (krad(Si))
20
50
100
2.99E-04 3.03E-04 3.21E-04
-3.31E-04 -3.34E-04 -3.35E-04
-2.15E-04 -2.23E-04 -2.24E-04
6.13E-06 1.13E-05 2.18E-05
7.89E-05 8.65E-05 9.19E-05
9.69E-05 7.96E-05 6.81E-05
6.86E-05 6.25E-05 6.07E-05
-2.60E-04 -2.66E-04 -2.74E-04
1.73E-04 1.65E-04 1.50E-04
6.13E-05 5.27E-05 4.35E-05
-1.84E-04 -1.84E-04 -1.83E-04
-3.33E-04 -3.33E-04 -3.34E-04
200
3.00E-04
-3.40E-04
-2.32E-04
2.82E-05
8.97E-05
6.71E-05
5.53E-05
-2.88E-04
1.51E-04
4.17E-05
-1.83E-04
-3.33E-04
24-hr
Anneal
225
2.97E-04
-3.42E-04
-2.29E-04
1.62E-05
8.48E-05
5.65E-05
4.56E-05
-2.89E-04
1.37E-04
3.36E-05
-1.84E-04
-3.34E-04
168-hr
Anneal
250
2.91E-04
-3.23E-04
-2.15E-04
9.76E-06
8.34E-05
5.84E-05
3.88E-05
-2.69E-04
1.48E-04
3.18E-05
-1.84E-04
-3.34E-04
-2.25E-05 -3.24E-05 -3.13E-05 -2.51E-05 -3.09E-05 -3.47E-05 -3.10E-05
2.41E-04 2.48E-04 2.53E-04 2.61E-04 2.57E-04 2.54E-04 2.44E-04
6.38E-04 6.47E-04 6.62E-04 6.89E-04 6.73E-04 6.63E-04 6.37E-04
-6.83E-04 -7.12E-04 -7.24E-04 -7.39E-04 -7.35E-04 -7.32E-04 -6.99E-04
4.49E-05
1.65E-04
4.96E-04
-4.07E-04
-8.00E-04
PASS
8.00E-04
PASS
2.79E-05
1.67E-04
4.86E-04
-4.30E-04
-9.50E-04
PASS
9.50E-04
PASS
1.87E-05
1.65E-04
4.72E-04
-4.35E-04
-9.50E-04
PASS
9.50E-04
PASS
9.80E-06
1.64E-04
4.59E-04
-4.39E-04
-9.50E-04
PASS
9.50E-04
PASS
5.36E-06
1.70E-04
4.70E-04
-4.60E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DLA Certified Company
14
-3.15E-06
1.65E-04
4.49E-04
-4.55E-04
-9.50E-04
PASS
9.50E-04
PASS
1.74E-06
1.58E-04
4.36E-04
-4.32E-04
-9.50E-04
PASS
9.50E-04
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.4. Plot of Input Offset Voltage1_2 15V (V) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
15
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.4. Raw data for Input Offset Voltage1_2 15V (V) @ VS=+/-15V, VCM=0V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage1_2 15V (V)
@ VS=+/-15V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-5.34E-05
3.89E-05
-9.87E-05
3.86E-05
2.41E-04
3.35E-04
1.20E-04
1.94E-04
1.36E-04
1.75E-04
-8.42E-05
1.96E-04
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
20
50
100
200
225
250
-5.94E-05 -4.84E-05 -5.01E-05 -4.41E-05 -5.25E-05 -6.35E-05
2.93E-05 3.44E-05 3.36E-05 3.67E-05 3.90E-05 2.49E-05
-1.12E-04 -1.04E-04 -1.00E-04 -9.29E-05 -9.91E-05 -1.12E-04
2.52E-05 2.71E-05 3.05E-05 3.16E-05 2.46E-05 3.50E-05
2.34E-04 2.33E-04 2.33E-04 2.38E-04 2.33E-04 2.42E-04
3.17E-04 2.96E-04 2.73E-04 2.73E-04 2.72E-04 2.88E-04
1.02E-04 8.61E-05 7.31E-05 5.88E-05 6.05E-05 7.23E-05
1.70E-04 1.58E-04 1.49E-04 1.46E-04 1.41E-04 1.49E-04
1.23E-04 1.20E-04 1.09E-04 1.10E-04 1.03E-04 1.02E-04
1.59E-04 1.28E-04 1.21E-04 1.26E-04 1.06E-04 1.23E-04
-8.66E-05 -8.78E-05 -8.48E-05 -8.70E-05 -8.64E-05 -9.46E-05
1.94E-04 1.95E-04 1.93E-04 1.95E-04 1.94E-04 1.91E-04
3.33E-05 2.33E-05 2.84E-05 2.93E-05 3.39E-05 2.91E-05 2.52E-05
1.31E-04 1.32E-04 1.28E-04 1.27E-04 1.27E-04 1.27E-04 1.36E-04
3.92E-04 3.84E-04 3.79E-04 3.77E-04 3.81E-04 3.78E-04 3.98E-04
-3.25E-04 -3.38E-04 -3.22E-04 -3.19E-04 -3.13E-04 -3.20E-04 -3.47E-04
1.92E-04
8.51E-05
4.25E-04
-4.14E-05
-8.00E-04
PASS
8.00E-04
PASS
1.74E-04
8.45E-05
4.06E-04
-5.72E-05
-9.50E-04
PASS
9.50E-04
PASS
1.58E-04
8.12E-05
3.80E-04
-6.51E-05
-9.50E-04
PASS
9.50E-04
PASS
1.45E-04
7.65E-05
3.55E-04
-6.44E-05
-9.50E-04
PASS
9.50E-04
PASS
1.43E-04
7.98E-05
3.61E-04
-7.59E-05
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DLA Certified Company
16
1.37E-04
8.08E-05
3.58E-04
-8.49E-05
-9.50E-04
PASS
9.50E-04
PASS
1.47E-04
8.38E-05
3.76E-04
-8.31E-05
-9.50E-04
PASS
9.50E-04
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.5. Plot of Input Offset Current1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
17
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.5. Raw data for Input Offset Current1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current1_1 15V (A)
@ VS=+/-15V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
2.31E-09
-4.41E-09
-1.16E-09
1.70E-09
-7.40E-10
-2.68E-09
-1.83E-09
-2.54E-09
3.33E-09
-2.87E-09
-2.01E-09
-6.89E-09
Total Dose (krad(Si))
20
50
100
2.23E-09 1.53E-09 -2.40E-09
-4.50E-09 -5.20E-09 -4.53E-09
-1.31E-09 -1.67E-09 -2.35E-09
2.23E-09 3.27E-09 4.55E-09
-9.00E-10 0.00E+00 -3.00E-10
-2.77E-09 -3.47E-09 -4.56E-09
-1.50E-09 -1.51E-09 -1.60E-09
-3.00E-09 -3.20E-09 -3.67E-09
2.90E-09 4.35E-09 3.16E-09
-3.60E-09 -2.95E-09 -1.24E-09
-2.08E-09 -2.19E-09 -2.30E-09
-6.91E-09 -7.02E-09 -7.08E-09
200
0.00E+00
-4.37E-09
-3.37E-09
4.27E-09
-2.00E-10
-4.88E-09
-1.30E-09
-6.00E-09
2.20E-09
-1.50E-10
-2.38E-09
-7.13E-09
24-hr
Anneal
225
2.00E-11
-6.59E-09
-4.07E-09
1.37E-09
-1.74E-09
-6.03E-09
-4.58E-09
-6.16E-09
3.20E-10
-4.67E-09
-2.41E-09
-7.18E-09
168-hr
Anneal
250
1.71E-09
-4.24E-09
-1.85E-09
1.78E-09
-2.00E-10
-2.90E-09
-2.01E-09
-3.54E-09
3.40E-09
-3.84E-09
-2.51E-09
-7.17E-09
-4.60E-10 -4.50E-10 -4.14E-10 -1.01E-09 -7.34E-10 -2.20E-09 -5.60E-10
2.67E-09 2.82E-09 3.24E-09 3.45E-09 3.39E-09 3.19E-09 2.55E-09
6.86E-09 7.27E-09 8.47E-09 8.45E-09 8.57E-09 6.54E-09 6.43E-09
-7.78E-09 -8.17E-09 -9.30E-09 -1.05E-08 -1.00E-08 -1.09E-08 -7.55E-09
-1.32E-09
2.63E-09
5.89E-09
-8.52E-09
-7.00E-08
PASS
7.00E-08
PASS
-1.59E-09
2.63E-09
5.61E-09
-8.80E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.36E-09
3.28E-09
7.63E-09
-1.03E-08
-1.00E-07
PASS
1.00E-07
PASS
-1.58E-09
2.99E-09
6.62E-09
-9.79E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.03E-09
3.39E-09
7.26E-09
-1.13E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DLA Certified Company
18
-4.22E-09
2.64E-09
3.03E-09
-1.15E-08
-1.00E-07
PASS
1.00E-07
PASS
-1.78E-09
2.98E-09
6.39E-09
-9.94E-09
-1.00E-07
PASS
1.00E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.6. Plot of Input Offset Current1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
19
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.6. Raw data for Input Offset Current1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current1_2 15V (A)
@ VS=+/-15V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-4.80E-10
3.60E-10
-4.60E-10
-2.10E-09
4.18E-09
3.66E-09
-1.55E-09
1.21E-09
1.34E-09
-1.00E-09
-5.21E-09
-1.18E-09
Total Dose (krad(Si))
20
50
100
9.00E-10 9.00E-10 -3.19E-09
-3.00E-11 -9.80E-10 -1.38E-09
-2.70E-10 -3.90E-10 -2.60E-10
-1.80E-09 -1.87E-09 -7.90E-10
4.29E-09 4.92E-09 4.63E-09
3.35E-09 2.35E-09 1.51E-09
-9.20E-10 -5.10E-10 -7.00E-10
7.30E-10 1.70E-09 1.89E-09
1.70E-09 1.99E-09 -1.90E-10
-1.34E-09 -3.31E-09 -2.54E-09
-5.26E-09 -5.37E-09 -5.41E-09
-1.19E-09 -1.28E-09 -1.31E-09
200
7.50E-10
1.00E-11
1.59E-09
-1.80E-10
4.13E-09
3.39E-09
-1.66E-09
2.01E-09
2.04E-09
-3.44E-09
-5.48E-09
-1.38E-09
24-hr
Anneal
225
-2.65E-09
-2.75E-09
-1.97E-09
-2.87E-09
1.38E-09
-2.30E-10
-4.26E-09
-7.60E-10
-1.10E-10
-6.27E-09
-5.55E-09
-1.35E-09
168-hr
Anneal
250
-5.20E-10
-1.05E-09
-1.22E-09
-3.30E-10
4.91E-09
2.87E-09
-1.60E-09
6.40E-10
9.00E-10
-2.48E-09
-5.64E-09
-1.41E-09
3.00E-10 6.18E-10 5.16E-10 -1.98E-10 1.26E-09 -1.77E-09 3.58E-10
2.35E-09 2.27E-09 2.66E-09 2.92E-09 1.75E-09 1.80E-09 2.57E-09
6.73E-09 6.84E-09 7.81E-09 7.80E-09 6.06E-09 3.15E-09 7.41E-09
-6.13E-09 -5.61E-09 -6.78E-09 -8.19E-09 -3.54E-09 -6.70E-09 -6.69E-09
7.32E-10
2.08E-09
6.45E-09
-4.98E-09
-7.00E-08
PASS
7.00E-08
PASS
7.04E-10
1.92E-09
5.98E-09
-4.57E-09
-1.00E-07
PASS
1.00E-07
PASS
4.44E-10
2.38E-09
6.96E-09
-6.07E-09
-1.00E-07
PASS
1.00E-07
PASS
-6.00E-12
1.79E-09
4.90E-09
-4.92E-09
-1.00E-07
PASS
1.00E-07
PASS
4.68E-10
2.88E-09
8.37E-09
-7.43E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DLA Certified Company
20
-2.33E-09
2.79E-09
5.31E-09
-9.97E-09
-1.00E-07
PASS
1.00E-07
PASS
6.60E-11
2.13E-09
5.91E-09
-5.77E-09
-1.00E-07
PASS
1.00E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.7. Plot of +Input Bias Current1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
21
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.7. Raw data for +Input Bias Current1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
+Input Bias Current1_1 15V (A)
@ VS=+/-15V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.11E-07
-3.08E-07
-3.27E-07
-2.89E-07
-3.11E-07
-2.92E-07
-3.08E-07
-3.00E-07
-2.78E-07
-3.10E-07
-3.02E-07
-3.05E-07
Total Dose (krad(Si))
20
50
100
-3.21E-07 -3.34E-07 -3.50E-07
-3.19E-07 -3.33E-07 -3.53E-07
-3.40E-07 -3.60E-07 -3.77E-07
-3.00E-07 -3.14E-07 -3.29E-07
-3.24E-07 -3.40E-07 -3.62E-07
-3.05E-07 -3.24E-07 -3.50E-07
-3.22E-07 -3.40E-07 -3.63E-07
-3.17E-07 -3.36E-07 -3.70E-07
-2.94E-07 -3.12E-07 -3.33E-07
-3.17E-07 -3.50E-07 -3.69E-07
-3.02E-07 -3.03E-07 -3.02E-07
-3.04E-07 -3.05E-07 -3.05E-07
200
-3.73E-07
-3.76E-07
-4.03E-07
-3.54E-07
-3.84E-07
-3.81E-07
-3.98E-07
-4.06E-07
-3.73E-07
-3.99E-07
-3.03E-07
-3.05E-07
24-hr
Anneal
225
-3.55E-07
-3.56E-07
-3.80E-07
-3.31E-07
-3.65E-07
-3.69E-07
-3.85E-07
-3.92E-07
-3.61E-07
-3.90E-07
-3.03E-07
-3.05E-07
168-hr
Anneal
250
-3.24E-07
-3.22E-07
-3.48E-07
-3.03E-07
-3.27E-07
-3.18E-07
-3.33E-07
-3.33E-07
-3.07E-07
-3.39E-07
-3.02E-07
-3.05E-07
-3.09E-07 -3.21E-07 -3.36E-07 -3.54E-07 -3.78E-07 -3.57E-07 -3.25E-07
1.36E-08 1.40E-08 1.64E-08 1.76E-08 1.76E-08 1.79E-08 1.61E-08
-2.72E-07 -2.82E-07 -2.91E-07 -3.06E-07 -3.30E-07 -3.08E-07 -2.80E-07
-3.46E-07 -3.59E-07 -3.81E-07 -4.03E-07 -4.26E-07 -4.06E-07 -3.69E-07
-2.98E-07
1.29E-08
-2.62E-07
-3.33E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.11E-07
1.14E-08
-2.80E-07
-3.42E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.32E-07
1.48E-08
-2.92E-07
-3.73E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.57E-07
1.54E-08
-3.15E-07
-3.99E-07
-9.15E-07
PASS
9.15E-07
PASS
-3.92E-07
1.39E-08
-3.54E-07
-4.30E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DLA Certified Company
22
-3.80E-07
1.36E-08
-3.42E-07
-4.17E-07
-9.65E-07
PASS
9.65E-07
PASS
-3.26E-07
1.31E-08
-2.90E-07
-3.62E-07
-9.65E-07
PASS
9.65E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.8. Plot of +Input Bias Current1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
23
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.8. Raw data for +Input Bias Current1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
+Input Bias Current1_2 15V (A)
@ VS=+/-15V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.10E-07
-3.05E-07
-3.27E-07
-2.91E-07
-3.04E-07
-2.86E-07
-3.09E-07
-3.04E-07
-2.81E-07
-3.05E-07
-3.06E-07
-2.96E-07
Total Dose (krad(Si))
20
50
100
-3.20E-07 -3.34E-07 -3.50E-07
-3.17E-07 -3.32E-07 -3.53E-07
-3.39E-07 -3.58E-07 -3.75E-07
-3.02E-07 -3.16E-07 -3.30E-07
-3.16E-07 -3.31E-07 -3.52E-07
-2.99E-07 -3.15E-07 -3.36E-07
-3.23E-07 -3.40E-07 -3.63E-07
-3.21E-07 -3.39E-07 -3.68E-07
-2.95E-07 -3.12E-07 -3.32E-07
-3.12E-07 -3.40E-07 -3.66E-07
-3.06E-07 -3.07E-07 -3.06E-07
-2.96E-07 -2.96E-07 -2.96E-07
200
-3.75E-07
-3.74E-07
-3.97E-07
-3.52E-07
-3.73E-07
-3.68E-07
-3.97E-07
-4.06E-07
-3.68E-07
-4.01E-07
-3.07E-07
-2.96E-07
24-hr
Anneal
225
-3.56E-07
-3.54E-07
-3.77E-07
-3.31E-07
-3.55E-07
-3.60E-07
-3.83E-07
-3.90E-07
-3.56E-07
-3.89E-07
-3.07E-07
-2.96E-07
168-hr
Anneal
250
-3.23E-07
-3.20E-07
-3.47E-07
-3.03E-07
-3.19E-07
-3.12E-07
-3.33E-07
-3.35E-07
-3.08E-07
-3.35E-07
-3.07E-07
-2.96E-07
-3.07E-07 -3.19E-07 -3.34E-07 -3.52E-07 -3.74E-07 -3.55E-07 -3.23E-07
1.30E-08 1.32E-08 1.54E-08 1.60E-08 1.59E-08 1.64E-08 1.56E-08
-2.72E-07 -2.83E-07 -2.92E-07 -3.08E-07 -3.31E-07 -3.10E-07 -2.80E-07
-3.43E-07 -3.55E-07 -3.76E-07 -3.96E-07 -4.18E-07 -4.00E-07 -3.66E-07
-2.97E-07
1.28E-08
-2.62E-07
-3.32E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.10E-07
1.27E-08
-2.75E-07
-3.45E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.29E-07
1.43E-08
-2.90E-07
-3.68E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.53E-07
1.76E-08
-3.05E-07
-4.01E-07
-9.15E-07
PASS
9.15E-07
PASS
-3.88E-07
1.85E-08
-3.37E-07
-4.39E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DLA Certified Company
24
-3.76E-07
1.64E-08
-3.31E-07
-4.21E-07
-9.65E-07
PASS
9.65E-07
PASS
-3.25E-07
1.36E-08
-2.87E-07
-3.62E-07
-9.65E-07
PASS
9.65E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.9. Plot of -Input Bias Current1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
25
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.9. Raw data for -Input Bias Current1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
-Input Bias Current1_1 15V (A)
@ VS=+/-15V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.14E-07
-3.04E-07
-3.26E-07
-2.91E-07
-3.10E-07
-2.89E-07
-3.06E-07
-2.98E-07
-2.82E-07
-3.07E-07
-3.01E-07
-2.99E-07
Total Dose (krad(Si))
20
50
100
-3.24E-07 -3.36E-07 -3.50E-07
-3.15E-07 -3.29E-07 -3.52E-07
-3.39E-07 -3.60E-07 -3.77E-07
-3.03E-07 -3.18E-07 -3.34E-07
-3.24E-07 -3.40E-07 -3.64E-07
-3.03E-07 -3.20E-07 -3.40E-07
-3.21E-07 -3.38E-07 -3.64E-07
-3.14E-07 -3.34E-07 -3.65E-07
-2.97E-07 -3.16E-07 -3.36E-07
-3.14E-07 -3.49E-07 -3.69E-07
-3.01E-07 -3.01E-07 -3.00E-07
-2.98E-07 -2.98E-07 -2.98E-07
200
-3.76E-07
-3.71E-07
-4.00E-07
-3.60E-07
-3.87E-07
-3.77E-07
-3.96E-07
-4.00E-07
-3.75E-07
-4.04E-07
-3.01E-07
-2.98E-07
24-hr
Anneal
225
-3.57E-07
-3.52E-07
-3.76E-07
-3.33E-07
-3.65E-07
-3.65E-07
-3.81E-07
-3.86E-07
-3.62E-07
-3.88E-07
-3.01E-07
-2.98E-07
168-hr
Anneal
250
-3.26E-07
-3.18E-07
-3.48E-07
-3.05E-07
-3.27E-07
-3.15E-07
-3.31E-07
-3.29E-07
-3.11E-07
-3.36E-07
-3.00E-07
-2.98E-07
-3.09E-07 -3.21E-07 -3.37E-07 -3.55E-07 -3.79E-07 -3.57E-07 -3.25E-07
1.30E-08 1.31E-08 1.55E-08 1.61E-08 1.53E-08 1.62E-08 1.55E-08
-2.74E-07 -2.85E-07 -2.94E-07 -3.11E-07 -3.37E-07 -3.12E-07 -2.82E-07
-3.45E-07 -3.57E-07 -3.79E-07 -4.00E-07 -4.21E-07 -4.01E-07 -3.67E-07
-2.97E-07
1.09E-08
-2.67E-07
-3.27E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.10E-07
9.55E-09
-2.84E-07
-3.36E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.31E-07
1.34E-08
-2.95E-07
-3.68E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.55E-07
1.56E-08
-3.12E-07
-3.98E-07
-9.15E-07
PASS
9.15E-07
PASS
-3.90E-07
1.34E-08
-3.54E-07
-4.27E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DLA Certified Company
26
-3.76E-07
1.20E-08
-3.43E-07
-4.09E-07
-9.65E-07
PASS
9.65E-07
PASS
-3.25E-07
1.09E-08
-2.95E-07
-3.54E-07
-9.65E-07
PASS
9.65E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.10. Plot of -Input Bias Current1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
27
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.10. Raw data for -Input Bias Current1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
-Input Bias Current1_2 15V (A)
@ VS=+/-15V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.10E-07
-3.06E-07
-3.27E-07
-2.89E-07
-3.09E-07
-2.90E-07
-3.08E-07
-3.06E-07
-2.82E-07
-3.05E-07
-3.02E-07
-2.96E-07
Total Dose (krad(Si))
20
50
100
-3.22E-07 -3.36E-07 -3.50E-07
-3.18E-07 -3.31E-07 -3.53E-07
-3.39E-07 -3.60E-07 -3.78E-07
-3.01E-07 -3.14E-07 -3.30E-07
-3.21E-07 -3.36E-07 -3.60E-07
-3.02E-07 -3.18E-07 -3.38E-07
-3.22E-07 -3.40E-07 -3.65E-07
-3.21E-07 -3.40E-07 -3.73E-07
-2.97E-07 -3.14E-07 -3.32E-07
-3.12E-07 -3.37E-07 -3.66E-07
-3.02E-07 -3.02E-07 -3.01E-07
-2.95E-07 -2.95E-07 -2.95E-07
200
-3.77E-07
-3.76E-07
-4.01E-07
-3.55E-07
-3.79E-07
-3.72E-07
-3.96E-07
-4.09E-07
-3.72E-07
-3.98E-07
-3.02E-07
-2.95E-07
24-hr
Anneal
225
-3.56E-07
-3.54E-07
-3.77E-07
-3.29E-07
-3.59E-07
-3.62E-07
-3.82E-07
-3.93E-07
-3.57E-07
-3.84E-07
-3.01E-07
-2.95E-07
168-hr
Anneal
250
-3.23E-07
-3.20E-07
-3.41E-07
-3.03E-07
-3.24E-07
-3.15E-07
-3.32E-07
-3.36E-07
-3.09E-07
-3.33E-07
-3.01E-07
-2.95E-07
-3.08E-07 -3.20E-07 -3.35E-07 -3.54E-07 -3.78E-07 -3.55E-07 -3.22E-07
1.34E-08 1.35E-08 1.62E-08 1.73E-08 1.65E-08 1.72E-08 1.33E-08
-2.71E-07 -2.83E-07 -2.91E-07 -3.07E-07 -3.32E-07 -3.07E-07 -2.86E-07
-3.45E-07 -3.57E-07 -3.80E-07 -4.02E-07 -4.23E-07 -4.02E-07 -3.59E-07
-2.98E-07
1.14E-08
-2.67E-07
-3.29E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.11E-07
1.13E-08
-2.80E-07
-3.42E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.30E-07
1.29E-08
-2.95E-07
-3.65E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.55E-07
1.84E-08
-3.04E-07
-4.05E-07
-9.15E-07
PASS
9.15E-07
PASS
-3.89E-07
1.66E-08
-3.44E-07
-4.35E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DLA Certified Company
28
-3.76E-07
1.53E-08
-3.34E-07
-4.17E-07
-9.65E-07
PASS
9.65E-07
PASS
-3.25E-07
1.21E-08
-2.92E-07
-3.58E-07
-9.65E-07
PASS
9.65E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.11. Plot of Input Offset Voltage2_1 15V (V) @ VS=+/-15V, VCM=15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
29
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.11. Raw data for Input Offset Voltage2_1 15V (V) @ VS=+/-15V, VCM=15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage2_1 15V (V)
@ VS=+/-15V, VCM=15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
4.11E-04
-1.19E-04
2.12E-05
2.27E-04
8.72E-05
1.09E-04
-1.30E-06
6.54E-05
2.21E-04
1.17E-04
-1.21E-04
-5.00E-05
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
20
50
100
200
225
250
4.17E-04 4.28E-04 4.55E-04 4.43E-04 4.38E-04 3.91E-04
-1.41E-04 -1.42E-04 -1.41E-04 -1.41E-04 -1.43E-04 -1.28E-04
8.10E-06 1.05E-05 1.34E-05 1.43E-05 1.49E-05 -1.12E-05
2.17E-04 2.23E-04 2.30E-04 2.42E-04 2.28E-04 2.12E-04
8.18E-05 9.21E-05 1.02E-04 1.05E-04 1.03E-04 9.21E-05
1.04E-04 9.82E-05 9.98E-05 1.07E-04 9.54E-05 9.05E-05
-2.86E-06 -5.03E-06 2.67E-06 4.22E-06 -3.95E-06 -2.86E-05
5.29E-05 5.38E-05 5.23E-05 4.88E-05 4.90E-05 4.01E-05
2.02E-04 1.92E-04 1.82E-04 1.81E-04 1.72E-04 1.70E-04
9.73E-05 9.35E-05 9.21E-05 9.40E-05 8.93E-05 7.84E-05
-1.20E-04 -1.20E-04 -1.19E-04 -1.18E-04 -1.19E-04 -1.17E-04
-4.90E-05 -4.93E-05 -4.89E-05 -4.86E-05 -4.88E-05 -4.79E-05
1.25E-04 1.17E-04 1.22E-04 1.32E-04 1.33E-04 1.28E-04 1.11E-04
2.03E-04 2.12E-04 2.16E-04 2.26E-04 2.22E-04 2.20E-04 2.01E-04
6.81E-04 6.98E-04 7.15E-04 7.51E-04 7.42E-04 7.30E-04 6.61E-04
-4.30E-04 -4.65E-04 -4.71E-04 -4.87E-04 -4.77E-04 -4.74E-04 -4.39E-04
1.02E-04
8.13E-05
3.25E-04
-1.21E-04
-8.00E-04
PASS
8.00E-04
PASS
9.07E-05
7.56E-05
2.98E-04
-1.17E-04
-9.50E-04
PASS
9.50E-04
PASS
8.64E-05
7.19E-05
2.83E-04
-1.11E-04
-9.50E-04
PASS
9.50E-04
PASS
8.58E-05
6.63E-05
2.68E-04
-9.60E-05
-9.50E-04
PASS
9.50E-04
PASS
8.69E-05
6.62E-05
2.68E-04
-9.45E-05
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DLA Certified Company
30
8.03E-05
6.47E-05
2.58E-04
-9.72E-05
-9.50E-04
PASS
9.50E-04
PASS
7.01E-05
7.26E-05
2.69E-04
-1.29E-04
-9.50E-04
PASS
9.50E-04
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.12. Plot of Input Offset Voltage2_2 15V (V) @ VS=+/-15V, VCM=15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
31
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.12. Raw data for Input Offset Voltage2_2 15V (V) @ VS=+/-15V, VCM=15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage2_2 15V (V)
@ VS=+/-15V, VCM=15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.81E-05
1.39E-04
7.86E-05
1.51E-04
4.55E-04
3.04E-04
1.58E-04
1.30E-04
1.08E-04
2.12E-04
-3.06E-05
3.24E-04
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
20
50
100
200
225
250
9.88E-06 2.62E-05 3.95E-05 3.85E-05 3.54E-05 9.17E-06
1.33E-04 1.44E-04 1.53E-04 1.60E-04 1.63E-04 1.28E-04
6.45E-05 7.50E-05 8.44E-05 9.66E-05 9.38E-05 5.93E-05
1.47E-04 1.61E-04 1.74E-04 1.87E-04 1.80E-04 1.62E-04
4.55E-04 4.62E-04 4.72E-04 4.85E-04 4.79E-04 4.75E-04
2.90E-04 2.80E-04 2.74E-04 2.72E-04 2.76E-04 2.67E-04
1.48E-04 1.39E-04 1.37E-04 1.31E-04 1.34E-04 1.26E-04
1.12E-04 1.06E-04 1.06E-04 9.93E-05 1.01E-04 1.00E-04
9.88E-05 1.00E-04 1.00E-04 1.00E-04 9.86E-05 8.46E-05
2.01E-04 1.82E-04 1.80E-04 1.82E-04 1.75E-04 1.82E-04
-3.25E-05 -3.19E-05 -2.96E-05 -3.12E-05 -2.78E-05 -3.38E-05
3.24E-04 3.24E-04 3.25E-04 3.26E-04 3.28E-04 3.26E-04
1.68E-04 1.62E-04 1.74E-04 1.85E-04 1.93E-04 1.90E-04 1.67E-04
1.69E-04 1.73E-04 1.70E-04 1.70E-04 1.73E-04 1.71E-04 1.82E-04
6.31E-04 6.36E-04 6.40E-04 6.50E-04 6.68E-04 6.60E-04 6.67E-04
-2.95E-04 -3.12E-04 -2.92E-04 -2.80E-04 -2.81E-04 -2.80E-04 -3.33E-04
1.83E-04
7.83E-05
3.97E-04
-3.22E-05
-8.00E-04
PASS
8.00E-04
PASS
1.70E-04
7.79E-05
3.84E-04
-4.35E-05
-9.50E-04
PASS
9.50E-04
PASS
1.61E-04
7.37E-05
3.64E-04
-4.08E-05
-9.50E-04
PASS
9.50E-04
PASS
1.59E-04
7.14E-05
3.55E-04
-3.65E-05
-9.50E-04
PASS
9.50E-04
PASS
1.57E-04
7.28E-05
3.56E-04
-4.27E-05
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DLA Certified Company
32
1.57E-04
7.31E-05
3.57E-04
-4.36E-05
-9.50E-04
PASS
9.50E-04
PASS
1.52E-04
7.42E-05
3.56E-04
-5.15E-05
-9.50E-04
PASS
9.50E-04
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.13. Plot of Input Offset Current2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
33
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.13. Raw data for Input Offset Current2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current2_1 15V (A)
@ VS=+/-15V, VCM=15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
0.00E+00
-3.73E-09
-1.15E-08
-3.39E-09
6.74E-09
1.06E-08
7.62E-09
1.30E-08
-3.90E-10
2.46E-08
2.21E-09
1.37E-08
Total Dose (krad(Si))
20
50
100
4.49E-09 6.87E-09 1.23E-08
-3.97E-09 -4.18E-09 -1.07E-09
-1.30E-08 -9.80E-09 -1.29E-08
-4.23E-09 -3.68E-09 -4.06E-09
5.98E-09 6.74E-09 7.83E-09
8.81E-09 7.83E-09 1.13E-08
6.31E-09 5.54E-09 6.67E-09
1.52E-08 1.66E-08 1.70E-08
-2.01E-09 -3.41E-09 -2.27E-09
2.48E-08 2.28E-08 2.41E-08
2.89E-09 3.25E-09 3.42E-09
1.46E-08 1.47E-08 1.50E-08
200
8.85E-09
-1.65E-09
-1.36E-08
-1.52E-09
5.70E-09
1.00E-08
7.13E-09
1.74E-08
-2.94E-09
2.51E-08
3.65E-09
1.50E-08
24-hr
Anneal
225
1.19E-08
6.60E-10
-9.82E-09
-1.91E-09
9.90E-09
1.50E-08
8.61E-09
2.23E-08
-5.90E-10
2.83E-08
3.80E-09
1.51E-08
168-hr
Anneal
250
2.70E-09
-4.77E-09
-1.29E-08
-5.37E-09
4.49E-09
8.32E-09
1.89E-09
1.22E-08
-3.91E-09
2.31E-08
4.24E-09
1.55E-08
-2.38E-09 -2.14E-09 -8.10E-10 4.18E-10 -4.38E-10 2.15E-09 -3.16E-09
6.61E-09 7.67E-09 7.36E-09 9.94E-09 8.65E-09 8.90E-09 6.98E-09
1.58E-08 1.89E-08 1.94E-08 2.77E-08 2.33E-08 2.66E-08 1.60E-08
-2.05E-08 -2.32E-08 -2.10E-08 -2.68E-08 -2.41E-08 -2.23E-08 -2.23E-08
1.11E-08
9.09E-09
3.60E-08
-1.38E-08
-7.00E-08
PASS
7.00E-08
PASS
1.06E-08
1.00E-08
3.81E-08
-1.69E-08
-1.00E-07
PASS
1.00E-07
PASS
9.87E-09
1.01E-08
3.77E-08
-1.80E-08
-1.00E-07
PASS
1.00E-07
PASS
1.13E-08
1.00E-08
3.88E-08
-1.61E-08
-1.00E-07
PASS
1.00E-07
PASS
1.13E-08
1.06E-08
4.04E-08
-1.77E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DLA Certified Company
34
1.47E-08
1.13E-08
4.57E-08
-1.63E-08
-1.00E-07
PASS
1.00E-07
PASS
8.31E-09
1.03E-08
3.66E-08
-1.99E-08
-1.00E-07
PASS
1.00E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.14. Plot of Input Offset Current2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
35
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.14. Raw data for Input Offset Current2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current2_2 15V (A)
@ VS=+/-15V, VCM=15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.11E-09
2.25E-08
2.21E-08
1.71E-08
2.26E-08
9.39E-09
1.02E-08
2.71E-09
8.27E-09
2.70E-09
1.50E-08
2.54E-08
Total Dose (krad(Si))
20
50
100
1.07E-09 4.16E-09 9.55E-09
2.12E-08 2.10E-08 2.02E-08
2.08E-08 2.18E-08 2.33E-08
1.67E-08 1.65E-08 1.56E-08
2.29E-08 2.27E-08 2.32E-08
9.13E-09 1.10E-08 1.17E-08
1.10E-08 9.35E-09 1.19E-08
2.91E-09 3.76E-09 4.42E-09
9.19E-09 8.56E-09 1.05E-08
4.84E-09 4.04E-09 5.30E-09
1.61E-08 1.72E-08 1.79E-08
2.59E-08 2.61E-08 2.70E-08
1.71E-08 1.65E-08 1.72E-08
9.21E-09 8.94E-09 7.67E-09
4.23E-08 4.10E-08 3.83E-08
-8.18E-09 -7.98E-09 -3.83E-09
6.65E-09
3.67E-09
1.67E-08
-3.40E-09
-7.00E-08
PASS
7.00E-08
PASS
7.42E-09
3.39E-09
1.67E-08
-1.88E-09
-1.00E-07
PASS
1.00E-07
PASS
7.33E-09
3.25E-09
1.62E-08
-1.58E-09
-1.00E-07
PASS
1.00E-07
PASS
200
4.96E-09
1.75E-08
2.30E-08
1.69E-08
2.41E-08
1.17E-08
1.18E-08
1.11E-09
1.01E-08
3.91E-09
1.89E-08
2.77E-08
1.84E-08 1.73E-08
5.83E-09 7.61E-09
3.43E-08 3.82E-08
2.40E-09 -3.57E-09
8.76E-09
3.61E-09
1.87E-08
-1.15E-09
-1.00E-07
PASS
1.00E-07
PASS
7.72E-09
4.91E-09
2.12E-08
-5.73E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DLA Certified Company
36
24-hr
Anneal
225
8.55E-09
2.22E-08
2.69E-08
1.97E-08
2.52E-08
1.59E-08
1.46E-08
5.78E-09
1.26E-08
7.96E-09
2.00E-08
2.79E-08
168-hr
Anneal
250
7.30E-10
2.02E-08
2.20E-08
1.54E-08
2.19E-08
8.62E-09
6.92E-09
1.34E-09
8.27E-09
1.76E-09
2.11E-08
2.79E-08
2.05E-08 1.60E-08
7.22E-09 8.97E-09
4.03E-08 4.07E-08
7.09E-10 -8.55E-09
1.14E-08
4.34E-09
2.33E-08
-5.26E-10
-1.00E-07
PASS
1.00E-07
PASS
5.38E-09
3.56E-09
1.51E-08
-4.37E-09
-1.00E-07
PASS
1.00E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.15. Plot of +Input Bias Current2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
37
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.15. Raw data for +Input Bias Current2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Input Bias Current2_1 15V (A)
24-hr
168-hr
@ VS=+/-15V, VCM=15V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.48E-07 5.05E-07 5.81E-07 6.50E-07 7.38E-07 6.84E-07 5.26E-07
681 4.32E-07 4.87E-07 5.54E-07 6.26E-07 7.09E-07 6.53E-07 5.09E-07
682 4.67E-07 5.25E-07 5.93E-07 6.65E-07 7.55E-07 6.97E-07 5.48E-07
683 3.96E-07 4.49E-07 5.16E-07 5.82E-07 6.55E-07 6.04E-07 4.68E-07
684 4.45E-07 4.98E-07 5.70E-07 6.39E-07 7.22E-07 6.67E-07 5.24E-07
685 4.31E-07 4.88E-07 5.60E-07 6.31E-07 7.11E-07 6.84E-07 5.36E-07
686 4.38E-07 4.98E-07 5.70E-07 6.40E-07 7.26E-07 6.94E-07 5.38E-07
688 3.77E-07 4.39E-07 5.03E-07 5.69E-07 6.51E-07 6.23E-07 4.80E-07
689 4.00E-07 4.60E-07 5.30E-07 5.95E-07 6.69E-07 6.43E-07 5.06E-07
690 4.51E-07 5.08E-07 5.96E-07 6.66E-07 7.52E-07 7.24E-07 5.66E-07
691 4.37E-07 4.37E-07 4.40E-07 4.39E-07 4.41E-07 4.41E-07 4.42E-07
692 4.37E-07 4.35E-07 4.37E-07 4.37E-07 4.36E-07 4.38E-07 4.40E-07
Biased Statistics
Average Biased
4.38E-07 4.93E-07 5.63E-07 6.32E-07 7.16E-07 6.61E-07 5.15E-07
Std Dev Biased
2.65E-08 2.81E-08 3.00E-08 3.17E-08 3.82E-08 3.59E-08 2.98E-08
Ps90%/90% (+KTL) Biased
5.10E-07 5.70E-07 6.45E-07 7.19E-07 8.21E-07 7.59E-07 5.97E-07
Ps90%/90% (-KTL) Biased
3.65E-07 4.16E-07 4.81E-07 5.45E-07 6.11E-07 5.63E-07 4.33E-07
Un-Biased Statistics
Average Un-Biased
4.19E-07 4.79E-07 5.52E-07 6.20E-07 7.02E-07 6.73E-07 5.25E-07
Std Dev Un-Biased
3.04E-08 2.87E-08 3.62E-08 3.81E-08 4.13E-08 4.04E-08 3.31E-08
Ps90%/90% (+KTL) Un-Biased
5.03E-07 5.57E-07 6.51E-07 7.25E-07 8.15E-07 7.84E-07 6.16E-07
Ps90%/90% (-KTL) Un-Biased
3.36E-07 4.00E-07 4.52E-07 5.15E-07 5.88E-07 5.63E-07 4.34E-07
Specification MIN
-7.15E-07 -8.15E-07 -8.65E-07 -9.15E-07 -9.65E-07 -9.65E-07 -9.65E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
7.15E-07 8.15E-07 8.65E-07 9.15E-07 9.65E-07 9.65E-07 9.65E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
38
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.16. Plot of +Input Bias Current2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
39
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.16. Raw data for +Input Bias Current2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Input Bias Current2_2 15V (A)
24-hr
168-hr
@ VS=+/-15V, VCM=15V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.48E-07 5.07E-07 5.82E-07 6.53E-07 7.43E-07 6.86E-07 5.27E-07
681 4.57E-07 5.12E-07 5.77E-07 6.45E-07 7.27E-07 6.74E-07 5.33E-07
682 4.87E-07 5.44E-07 6.12E-07 6.87E-07 7.81E-07 7.21E-07 5.67E-07
683 4.05E-07 4.58E-07 5.24E-07 5.90E-07 6.62E-07 6.16E-07 4.77E-07
684 4.61E-07 5.19E-07 5.89E-07 6.62E-07 7.40E-07 6.86E-07 5.45E-07
685 4.28E-07 4.86E-07 5.56E-07 6.27E-07 7.09E-07 6.80E-07 5.33E-07
686 4.39E-07 4.99E-07 5.70E-07 6.41E-07 7.25E-07 6.95E-07 5.41E-07
688 3.59E-07 4.16E-07 4.78E-07 5.43E-07 6.25E-07 6.00E-07 4.61E-07
689 4.02E-07 4.60E-07 5.25E-07 5.91E-07 6.64E-07 6.41E-07 5.07E-07
690 4.26E-07 4.86E-07 5.70E-07 6.40E-07 7.23E-07 6.97E-07 5.40E-07
691 4.51E-07 4.50E-07 4.52E-07 4.53E-07 4.53E-07 4.55E-07 4.56E-07
692 4.46E-07 4.46E-07 4.46E-07 4.47E-07 4.48E-07 4.46E-07 4.48E-07
Biased Statistics
Average Biased
4.51E-07 5.08E-07 5.77E-07 6.47E-07 7.30E-07 6.76E-07 5.30E-07
Std Dev Biased
2.99E-08 3.13E-08 3.26E-08 3.58E-08 4.33E-08 3.82E-08 3.33E-08
Ps90%/90% (+KTL) Biased
5.34E-07 5.94E-07 6.66E-07 7.45E-07 8.49E-07 7.81E-07 6.21E-07
Ps90%/90% (-KTL) Biased
3.69E-07 4.22E-07 4.87E-07 5.49E-07 6.12E-07 5.72E-07 4.39E-07
Un-Biased Statistics
Average Un-Biased
4.11E-07 4.70E-07 5.40E-07 6.09E-07 6.89E-07 6.63E-07 5.16E-07
Std Dev Un-Biased
3.21E-08 3.29E-08 3.91E-08 4.16E-08 4.34E-08 4.18E-08 3.40E-08
Ps90%/90% (+KTL) Un-Biased
4.99E-07 5.60E-07 6.47E-07 7.22E-07 8.08E-07 7.77E-07 6.09E-07
Ps90%/90% (-KTL) Un-Biased
3.23E-07 3.79E-07 4.33E-07 4.95E-07 5.70E-07 5.48E-07 4.23E-07
Specification MIN
-7.15E-07 -8.15E-07 -8.65E-07 -9.15E-07 -9.65E-07 -9.65E-07 -9.65E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
7.15E-07 8.15E-07 8.65E-07 9.15E-07 9.65E-07 9.65E-07 9.65E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
40
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.17. Plot of -Input Bias Current2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
41
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.17. Raw data for -Input Bias Current2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
-Input Bias Current2_1 15V (A)
24-hr
168-hr
@ VS=+/-15V, VCM=15V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.42E-07 4.98E-07 5.71E-07 6.35E-07 7.27E-07 6.68E-07 5.20E-07
681 4.31E-07 4.88E-07 5.53E-07 6.22E-07 7.06E-07 6.49E-07 5.09E-07
682 4.75E-07 5.35E-07 6.02E-07 6.76E-07 7.68E-07 7.03E-07 5.55E-07
683 3.94E-07 4.49E-07 5.15E-07 5.82E-07 6.54E-07 6.03E-07 4.69E-07
684 4.34E-07 4.90E-07 5.60E-07 6.29E-07 7.11E-07 6.55E-07 5.15E-07
685 4.19E-07 4.78E-07 5.50E-07 6.16E-07 6.98E-07 6.67E-07 5.25E-07
686 4.29E-07 4.91E-07 5.64E-07 6.32E-07 7.16E-07 6.84E-07 5.34E-07
688 3.61E-07 4.21E-07 4.83E-07 5.49E-07 6.29E-07 6.00E-07 4.65E-07
689 3.98E-07 4.59E-07 5.30E-07 5.94E-07 6.69E-07 6.43E-07 5.05E-07
690 4.25E-07 4.83E-07 5.71E-07 6.39E-07 7.25E-07 6.93E-07 5.38E-07
691 4.32E-07 4.33E-07 4.32E-07 4.31E-07 4.33E-07 4.34E-07 4.33E-07
692 4.19E-07 4.19E-07 4.19E-07 4.19E-07 4.19E-07 4.20E-07 4.20E-07
Biased Statistics
Average Biased
4.35E-07 4.92E-07 5.60E-07 6.29E-07 7.13E-07 6.56E-07 5.14E-07
Std Dev Biased
2.87E-08 3.05E-08 3.13E-08 3.35E-08 4.10E-08 3.61E-08 3.05E-08
Ps90%/90% (+KTL) Biased
5.14E-07 5.76E-07 6.46E-07 7.21E-07 8.25E-07 7.54E-07 5.98E-07
Ps90%/90% (-KTL) Biased
3.56E-07 4.08E-07 4.74E-07 5.37E-07 6.01E-07 5.57E-07 4.30E-07
Un-Biased Statistics
Average Un-Biased
4.06E-07 4.66E-07 5.39E-07 6.06E-07 6.87E-07 6.57E-07 5.13E-07
Std Dev Un-Biased
2.78E-08 2.79E-08 3.52E-08 3.60E-08 3.92E-08 3.74E-08 3.00E-08
Ps90%/90% (+KTL) Un-Biased
4.82E-07 5.43E-07 6.36E-07 7.05E-07 7.95E-07 7.60E-07 5.95E-07
Ps90%/90% (-KTL) Un-Biased
3.30E-07 3.90E-07 4.43E-07 5.07E-07 5.80E-07 5.55E-07 4.31E-07
Specification MIN
-7.15E-07 -8.15E-07 -8.65E-07 -9.15E-07 -9.65E-07 -9.65E-07 -9.65E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
7.15E-07 8.15E-07 8.65E-07 9.15E-07 9.65E-07 9.65E-07 9.65E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
42
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.18. Plot of -Input Bias Current2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
43
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.18. Raw data for -Input Bias Current2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
-Input Bias Current2_2 15V (A)
24-hr
168-hr
@ VS=+/-15V, VCM=15V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.42E-07 5.02E-07 5.76E-07 6.41E-07 7.33E-07 6.76E-07 5.23E-07
681 4.31E-07 4.87E-07 5.55E-07 6.23E-07 7.07E-07 6.52E-07 5.10E-07
682 4.61E-07 5.21E-07 5.88E-07 6.62E-07 7.55E-07 6.92E-07 5.43E-07
683 3.86E-07 4.40E-07 5.04E-07 5.73E-07 6.45E-07 5.93E-07 4.59E-07
684 4.38E-07 4.94E-07 5.65E-07 6.32E-07 7.16E-07 6.64E-07 5.20E-07
685 4.16E-07 4.73E-07 5.44E-07 6.12E-07 6.92E-07 6.62E-07 5.21E-07
686 4.25E-07 4.86E-07 5.57E-07 6.28E-07 7.12E-07 6.79E-07 5.30E-07
688 3.53E-07 4.11E-07 4.74E-07 5.38E-07 6.22E-07 5.92E-07 4.55E-07
689 3.91E-07 4.49E-07 5.16E-07 5.78E-07 6.52E-07 6.25E-07 4.95E-07
690 4.21E-07 4.79E-07 5.63E-07 6.29E-07 7.14E-07 6.86E-07 5.33E-07
691 4.32E-07 4.31E-07 4.32E-07 4.32E-07 4.32E-07 4.33E-07 4.33E-07
692 4.16E-07 4.16E-07 4.17E-07 4.17E-07 4.16E-07 4.17E-07 4.17E-07
Biased Statistics
Average Biased
4.32E-07 4.89E-07 5.57E-07 6.26E-07 7.11E-07 6.55E-07 5.11E-07
Std Dev Biased
2.78E-08 3.02E-08 3.24E-08 3.32E-08 4.13E-08 3.77E-08 3.13E-08
Ps90%/90% (+KTL) Biased
5.08E-07 5.71E-07 6.46E-07 7.17E-07 8.24E-07 7.59E-07 5.97E-07
Ps90%/90% (-KTL) Biased
3.55E-07 4.06E-07 4.69E-07 5.35E-07 5.98E-07 5.52E-07 4.25E-07
Un-Biased Statistics
Average Un-Biased
4.01E-07 4.59E-07 5.31E-07 5.97E-07 6.79E-07 6.49E-07 5.07E-07
Std Dev Un-Biased
2.99E-08 3.03E-08 3.66E-08 3.86E-08 4.05E-08 3.93E-08 3.24E-08
Ps90%/90% (+KTL) Un-Biased
4.83E-07 5.43E-07 6.31E-07 7.03E-07 7.89E-07 7.56E-07 5.96E-07
Ps90%/90% (-KTL) Un-Biased
3.19E-07 3.76E-07 4.31E-07 4.91E-07 5.68E-07 5.41E-07 4.18E-07
Specification MIN
-7.15E-07 -8.15E-07 -8.65E-07 -9.15E-07 -9.65E-07 -9.65E-07 -9.65E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
7.15E-07 8.15E-07 8.65E-07 9.15E-07 9.65E-07 9.65E-07 9.65E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
44
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.19. Plot of Input Offset Voltage3_1 15V (V) @ VS=+/-15V, VCM=-15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
45
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.19. Raw data for Input Offset Voltage3_1 15V (V) @ VS=+/-15V, VCM=-15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage3_1 15V (V)
@ VS=+/-15V, VCM=-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.15E-04
-2.99E-04
-1.48E-04
-3.04E-05
7.79E-05
9.26E-05
1.12E-04
-2.26E-04
1.83E-04
1.06E-04
-1.50E-04
-2.53E-04
Total Dose (krad(Si))
20
50
100
3.11E-04 3.13E-04 3.26E-04
-3.22E-04 -3.26E-04 -3.28E-04
-1.64E-04 -1.75E-04 -1.78E-04
-3.27E-05 -2.72E-05 -1.37E-05
7.38E-05 7.98E-05 8.37E-05
8.17E-05 6.47E-05 5.61E-05
1.06E-04 9.61E-05 9.59E-05
-2.46E-04 -2.52E-04 -2.62E-04
1.62E-04 1.50E-04 1.36E-04
8.43E-05 6.95E-05 6.79E-05
-1.49E-04 -1.50E-04 -1.49E-04
-2.51E-04 -2.52E-04 -2.54E-04
200
3.12E-04
-3.34E-04
-1.89E-04
-1.16E-05
8.27E-05
5.14E-05
8.95E-05
-2.74E-04
1.36E-04
6.25E-05
-1.50E-04
-2.52E-04
24-hr
Anneal
225
3.09E-04
-3.35E-04
-1.82E-04
-2.43E-05
7.65E-05
3.95E-05
7.73E-05
-2.80E-04
1.18E-04
5.52E-05
-1.51E-04
-2.53E-04
168-hr
Anneal
250
3.03E-04
-3.14E-04
-1.66E-04
-2.69E-05
7.60E-05
4.30E-05
7.43E-05
-2.56E-04
1.35E-04
5.28E-05
-1.49E-04
-2.54E-04
-1.69E-05 -2.66E-05 -2.69E-05 -2.20E-05 -2.79E-05 -3.11E-05 -2.56E-05
2.33E-04 2.40E-04 2.44E-04 2.50E-04 2.49E-04 2.46E-04 2.35E-04
6.21E-04 6.32E-04 6.42E-04 6.64E-04 6.54E-04 6.44E-04 6.20E-04
-6.55E-04 -6.85E-04 -6.96E-04 -7.08E-04 -7.10E-04 -7.06E-04 -6.71E-04
5.37E-05
1.60E-04
4.93E-04
-3.85E-04
-8.00E-04
PASS
8.00E-04
PASS
3.75E-05
1.62E-04
4.82E-04
-4.07E-04
-9.50E-04
PASS
9.50E-04
PASS
2.55E-05
1.59E-04
4.61E-04
-4.10E-04
-9.50E-04
PASS
9.50E-04
PASS
1.88E-05
1.60E-04
4.58E-04
-4.20E-04
-9.50E-04
PASS
9.50E-04
PASS
1.31E-05
1.64E-04
4.63E-04
-4.36E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DLA Certified Company
46
2.09E-06
1.60E-04
4.42E-04
-4.38E-04
-9.50E-04
PASS
9.50E-04
PASS
9.68E-06
1.53E-04
4.29E-04
-4.10E-04
-9.50E-04
PASS
9.50E-04
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.20. Plot of Input Offset Voltage3_2 15V (V) @ VS=+/-15V, VCM=-15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
47
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.20. Raw data for Input Offset Voltage3_2 15V (V) @ VS=+/-15V, VCM=-15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage3_2 15V (V)
@ VS=+/-15V, VCM=-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-7.07E-05
5.38E-05
-1.25E-04
1.02E-04
2.33E-04
3.36E-04
1.27E-04
1.96E-04
1.65E-04
2.05E-04
1.46E-05
1.81E-04
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
20
50
100
200
225
250
-7.56E-05 -6.46E-05 -6.90E-05 -6.05E-05 -7.09E-05 -7.81E-05
4.44E-05 4.84E-05 4.84E-05 4.95E-05 5.21E-05 4.11E-05
-1.39E-04 -1.30E-04 -1.24E-04 -1.20E-04 -1.25E-04 -1.37E-04
8.83E-05 8.97E-05 9.46E-05 9.62E-05 8.90E-05 9.74E-05
2.26E-04 2.28E-04 2.25E-04 2.30E-04 2.26E-04 2.33E-04
3.19E-04 2.98E-04 2.81E-04 2.74E-04 2.69E-04 2.89E-04
1.09E-04 9.39E-05 8.15E-05 6.69E-05 6.49E-05 7.89E-05
1.70E-04 1.60E-04 1.55E-04 1.46E-04 1.44E-04 1.49E-04
1.50E-04 1.46E-04 1.37E-04 1.36E-04 1.29E-04 1.29E-04
1.84E-04 1.59E-04 1.53E-04 1.46E-04 1.32E-04 1.53E-04
1.23E-05 1.09E-05 1.41E-05 1.06E-05 1.29E-05 5.98E-06
1.78E-04 1.78E-04 1.81E-04 1.79E-04 1.79E-04 1.81E-04
3.86E-05 2.90E-05 3.43E-05 3.49E-05 3.89E-05 3.42E-05 3.13E-05
1.42E-04 1.43E-04 1.39E-04 1.38E-04 1.37E-04 1.39E-04 1.46E-04
4.28E-04 4.21E-04 4.15E-04 4.13E-04 4.14E-04 4.14E-04 4.32E-04
-3.51E-04 -3.63E-04 -3.47E-04 -3.43E-04 -3.37E-04 -3.46E-04 -3.69E-04
2.06E-04
7.89E-05
4.22E-04
-1.06E-05
-8.00E-04
PASS
8.00E-04
PASS
1.86E-04
7.94E-05
4.04E-04
-3.12E-05
-9.50E-04
PASS
9.50E-04
PASS
1.71E-04
7.57E-05
3.79E-04
-3.63E-05
-9.50E-04
PASS
9.50E-04
PASS
1.61E-04
7.30E-05
3.62E-04
-3.88E-05
-9.50E-04
PASS
9.50E-04
PASS
1.54E-04
7.50E-05
3.59E-04
-5.20E-05
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DLA Certified Company
48
1.48E-04
7.46E-05
3.52E-04
-5.67E-05
-9.50E-04
PASS
9.50E-04
PASS
1.60E-04
7.80E-05
3.73E-04
-5.42E-05
-9.50E-04
PASS
9.50E-04
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.21. Plot of Input Offset Current3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
49
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.21. Raw data for Input Offset Current3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current3_1 15V (A)
@ VS=+/-15V, VCM=-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
2.86E-09
-4.98E-09
-6.70E-10
1.61E-09
-8.80E-10
-3.32E-09
-1.60E-09
-2.81E-09
3.82E-09
-2.96E-09
-2.01E-09
-6.87E-09
Total Dose (krad(Si))
20
50
100
2.73E-09 1.85E-09 -2.54E-09
-5.37E-09 -5.87E-09 -5.48E-09
-9.00E-10 -1.22E-09 -2.61E-09
2.22E-09 3.21E-09 4.62E-09
-1.17E-09 -1.00E-10 -8.90E-10
-3.24E-09 -4.69E-09 -5.60E-09
-1.40E-09 -1.74E-09 -2.09E-09
-3.40E-09 -3.24E-09 -4.55E-09
3.42E-09 4.07E-09 3.74E-09
-3.70E-09 -3.33E-09 -1.25E-09
-2.08E-09 -2.16E-09 -2.28E-09
-6.89E-09 -7.00E-09 -7.07E-09
200
-7.00E-11
-5.26E-09
-3.70E-09
4.58E-09
-8.40E-10
-6.14E-09
-6.30E-10
-6.45E-09
2.38E-09
-8.60E-10
-2.39E-09
-7.10E-09
24-hr
Anneal
225
4.00E-10
-7.27E-09
-3.81E-09
1.39E-09
-1.88E-09
-7.14E-09
-4.83E-09
-7.12E-09
6.30E-10
-5.18E-09
-2.40E-09
-7.17E-09
168-hr
Anneal
250
2.24E-09
-4.71E-09
-1.46E-09
1.91E-09
-2.00E-10
-3.47E-09
-1.69E-09
-3.80E-09
3.93E-09
-4.10E-09
-2.47E-09
-7.15E-09
-4.12E-10 -4.98E-10 -4.26E-10 -1.38E-09 -1.06E-09 -2.23E-09 -4.44E-10
3.00E-09 3.25E-09 3.49E-09 3.74E-09 3.79E-09 3.47E-09 2.83E-09
7.81E-09 8.40E-09 9.15E-09 8.87E-09 9.33E-09 7.27E-09 7.32E-09
-8.63E-09 -9.40E-09 -1.00E-08 -1.16E-08 -1.14E-08 -1.17E-08 -8.20E-09
-1.37E-09
2.97E-09
6.78E-09
-9.53E-09
-7.00E-08
PASS
7.00E-08
PASS
-1.66E-09
2.98E-09
6.51E-09
-9.84E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.79E-09
3.44E-09
7.64E-09
-1.12E-08
-1.00E-07
PASS
1.00E-07
PASS
-1.95E-09
3.64E-09
8.03E-09
-1.19E-08
-1.00E-07
PASS
1.00E-07
PASS
-2.34E-09
3.83E-09
8.17E-09
-1.28E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DLA Certified Company
50
-4.73E-09
3.18E-09
3.99E-09
-1.34E-08
-1.00E-07
PASS
1.00E-07
PASS
-1.83E-09
3.35E-09
7.36E-09
-1.10E-08
-1.00E-07
PASS
1.00E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.22. Plot of Input Offset Current3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
51
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.22. Raw data for Input Offset Current3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current3_2 15V (A)
@ VS=+/-15V, VCM=-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-5.50E-10
5.10E-10
-8.70E-10
-1.64E-09
4.79E-09
4.16E-09
-1.84E-09
1.38E-09
1.91E-09
-9.00E-10
-4.81E-09
-1.51E-09
Total Dose (krad(Si))
20
50
100
9.90E-10 7.40E-10 -3.74E-09
1.50E-10 -1.10E-09 -1.25E-09
-7.90E-10 -8.10E-10 -9.00E-10
-1.03E-09 -1.13E-09 2.60E-10
4.84E-09 5.43E-09 5.41E-09
4.00E-09 2.97E-09 2.28E-09
-1.27E-09 -2.90E-10 -7.70E-10
1.16E-09 1.85E-09 2.00E-09
2.09E-09 2.20E-09 1.10E-09
-1.20E-09 -2.47E-09 -2.41E-09
-4.89E-09 -5.00E-09 -5.05E-09
-1.57E-09 -1.66E-09 -1.69E-09
200
8.90E-10
6.70E-10
1.18E-09
8.00E-10
4.60E-09
3.09E-09
-2.02E-09
2.19E-09
3.13E-09
-3.24E-09
-5.12E-09
-1.75E-09
24-hr
Anneal
225
-3.00E-09
-2.87E-09
-2.44E-09
-2.31E-09
1.78E-09
-5.10E-10
-4.30E-09
-6.70E-10
1.90E-10
-6.62E-09
-5.19E-09
-1.73E-09
168-hr
Anneal
250
-5.30E-10
-1.02E-09
-1.64E-09
4.00E-10
5.59E-09
3.54E-09
-1.81E-09
8.70E-10
1.60E-09
-2.51E-09
-5.28E-09
-1.77E-09
4.48E-10 8.32E-10 6.26E-10 -4.40E-11 1.63E-09 -1.77E-09 5.60E-10
2.55E-09 2.38E-09 2.79E-09 3.38E-09 1.67E-09 2.00E-09 2.91E-09
7.43E-09 7.36E-09 8.29E-09 9.22E-09 6.21E-09 3.73E-09 8.54E-09
-6.54E-09 -5.69E-09 -7.03E-09 -9.31E-09 -2.96E-09 -7.26E-09 -7.42E-09
9.42E-10
2.38E-09
7.46E-09
-5.58E-09
-7.00E-08
PASS
7.00E-08
PASS
9.56E-10
2.25E-09
7.12E-09
-5.21E-09
-1.00E-07
PASS
1.00E-07
PASS
8.52E-10
2.22E-09
6.93E-09
-5.22E-09
-1.00E-07
PASS
1.00E-07
PASS
4.40E-10
1.99E-09
5.90E-09
-5.02E-09
-1.00E-07
PASS
1.00E-07
PASS
6.30E-10
3.03E-09
8.94E-09
-7.68E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DLA Certified Company
52
-2.38E-09
2.94E-09
5.69E-09
-1.05E-08
-1.00E-07
PASS
1.00E-07
PASS
3.38E-10
2.49E-09
7.17E-09
-6.50E-09
-1.00E-07
PASS
1.00E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.23. Plot of +Input Bias Current3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
53
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.23. Raw data for +Input Bias Current3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Input Bias Current3_1 15V (A)
@ VS=+/-15V, VCM=-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.72E-07
-3.66E-07
-3.89E-07
-3.41E-07
-3.72E-07
-3.53E-07
-3.68E-07
-3.62E-07
-3.32E-07
-3.69E-07
-3.68E-07
-3.65E-07
Total Dose (krad(Si))
20
50
100
-3.84E-07 -3.99E-07 -4.15E-07
-3.79E-07 -3.97E-07 -4.15E-07
-4.04E-07 -4.21E-07 -4.42E-07
-3.60E-07 -3.76E-07 -3.95E-07
-3.86E-07 -4.05E-07 -4.25E-07
-3.68E-07 -3.91E-07 -4.14E-07
-3.86E-07 -4.05E-07 -4.26E-07
-3.82E-07 -4.03E-07 -4.33E-07
-3.56E-07 -3.77E-07 -4.03E-07
-3.79E-07 -4.08E-07 -4.31E-07
-3.67E-07 -3.68E-07 -3.67E-07
-3.67E-07 -3.65E-07 -3.64E-07
200
-4.39E-07
-4.41E-07
-4.71E-07
-4.16E-07
-4.50E-07
-4.49E-07
-4.62E-07
-4.78E-07
-4.39E-07
-4.70E-07
-3.69E-07
-3.65E-07
24-hr
Anneal
225
-4.17E-07
-4.17E-07
-4.44E-07
-3.94E-07
-4.27E-07
-4.38E-07
-4.52E-07
-4.61E-07
-4.26E-07
-4.58E-07
-3.69E-07
-3.66E-07
168-hr
Anneal
250
-3.87E-07
-3.83E-07
-4.08E-07
-3.63E-07
-3.91E-07
-3.83E-07
-4.00E-07
-3.99E-07
-3.71E-07
-4.05E-07
-3.67E-07
-3.65E-07
-3.68E-07 -3.83E-07 -4.00E-07 -4.19E-07 -4.43E-07 -4.20E-07 -3.86E-07
1.74E-08 1.59E-08 1.60E-08 1.73E-08 1.99E-08 1.82E-08 1.60E-08
-3.20E-07 -3.39E-07 -3.56E-07 -3.71E-07 -3.89E-07 -3.70E-07 -3.42E-07
-4.16E-07 -4.26E-07 -4.44E-07 -4.66E-07 -4.98E-07 -4.70E-07 -4.30E-07
-3.57E-07
1.52E-08
-3.15E-07
-3.98E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.74E-07
1.20E-08
-3.41E-07
-4.07E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.97E-07
1.30E-08
-3.61E-07
-4.32E-07
-8.65E-07
PASS
8.65E-07
PASS
-4.21E-07
1.25E-08
-3.87E-07
-4.56E-07
-9.15E-07
PASS
9.15E-07
PASS
-4.60E-07
1.57E-08
-4.17E-07
-5.02E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DLA Certified Company
54
-4.47E-07
1.49E-08
-4.06E-07
-4.88E-07
-9.65E-07
PASS
9.65E-07
PASS
-3.92E-07
1.40E-08
-3.53E-07
-4.30E-07
-9.65E-07
PASS
9.65E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.24. Plot of +Input Bias Current3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
55
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.24. Raw data for +Input Bias Current3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Input Bias Current3_2 15V (A)
@ VS=+/-15V, VCM=-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.71E-07
-3.64E-07
-3.91E-07
-3.49E-07
-3.64E-07
-3.46E-07
-3.69E-07
-3.66E-07
-3.35E-07
-3.65E-07
-3.71E-07
-3.56E-07
Total Dose (krad(Si))
20
50
100
-3.83E-07 -4.00E-07 -4.16E-07
-3.79E-07 -3.96E-07 -4.13E-07
-4.04E-07 -4.21E-07 -4.41E-07
-3.62E-07 -3.79E-07 -3.95E-07
-3.79E-07 -3.97E-07 -4.14E-07
-3.62E-07 -3.82E-07 -4.03E-07
-3.87E-07 -4.05E-07 -4.30E-07
-3.84E-07 -4.05E-07 -4.34E-07
-3.57E-07 -3.76E-07 -4.01E-07
-3.74E-07 -4.05E-07 -4.27E-07
-3.70E-07 -3.72E-07 -3.71E-07
-3.56E-07 -3.56E-07 -3.57E-07
200
-4.40E-07
-4.38E-07
-4.67E-07
-4.15E-07
-4.38E-07
-4.35E-07
-4.63E-07
-4.75E-07
-4.33E-07
-4.65E-07
-3.73E-07
-3.57E-07
24-hr
Anneal
225
-4.18E-07
-4.16E-07
-4.43E-07
-3.96E-07
-4.18E-07
-4.26E-07
-4.52E-07
-4.60E-07
-4.23E-07
-4.54E-07
-3.73E-07
-3.57E-07
168-hr
Anneal
250
-3.87E-07
-3.82E-07
-4.08E-07
-3.64E-07
-3.83E-07
-3.77E-07
-3.99E-07
-4.03E-07
-3.73E-07
-3.99E-07
-3.72E-07
-3.58E-07
-3.68E-07 -3.81E-07 -3.98E-07 -4.16E-07 -4.40E-07 -4.18E-07 -3.85E-07
1.51E-08 1.51E-08 1.50E-08 1.63E-08 1.83E-08 1.68E-08 1.54E-08
-3.26E-07 -3.40E-07 -3.57E-07 -3.71E-07 -3.89E-07 -3.72E-07 -3.43E-07
-4.09E-07 -4.23E-07 -4.39E-07 -4.60E-07 -4.90E-07 -4.64E-07 -4.27E-07
-3.56E-07
1.50E-08
-3.15E-07
-3.98E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.73E-07
1.31E-08
-3.37E-07
-4.09E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.95E-07
1.47E-08
-3.54E-07
-4.35E-07
-8.65E-07
PASS
8.65E-07
PASS
-4.19E-07
1.55E-08
-3.76E-07
-4.61E-07
-9.15E-07
PASS
9.15E-07
PASS
-4.54E-07
1.90E-08
-4.02E-07
-5.06E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DLA Certified Company
56
-4.43E-07
1.71E-08
-3.96E-07
-4.90E-07
-9.65E-07
PASS
9.65E-07
PASS
-3.90E-07
1.43E-08
-3.51E-07
-4.29E-07
-9.65E-07
PASS
9.65E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.25. Plot of -Input Bias Current3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
57
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.25. Raw data for -Input Bias Current3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
-Input Bias Current3_1 15V (A)
@ VS=+/-15V, VCM=-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.76E-07
-3.63E-07
-3.90E-07
-3.49E-07
-3.72E-07
-3.51E-07
-3.68E-07
-3.61E-07
-3.37E-07
-3.69E-07
-3.68E-07
-3.59E-07
Total Dose (krad(Si))
20
50
100
-3.89E-07 -4.05E-07 -4.13E-07
-3.77E-07 -3.94E-07 -4.12E-07
-4.07E-07 -4.23E-07 -4.41E-07
-3.65E-07 -3.82E-07 -4.01E-07
-3.89E-07 -4.09E-07 -4.27E-07
-3.67E-07 -3.88E-07 -4.10E-07
-3.85E-07 -4.07E-07 -4.26E-07
-3.81E-07 -4.03E-07 -4.30E-07
-3.60E-07 -3.82E-07 -4.07E-07
-3.79E-07 -4.07E-07 -4.30E-07
-3.68E-07 -3.68E-07 -3.68E-07
-3.60E-07 -3.61E-07 -3.61E-07
200
-4.42E-07
-4.37E-07
-4.70E-07
-4.22E-07
-4.53E-07
-4.44E-07
-4.65E-07
-4.71E-07
-4.40E-07
-4.69E-07
-3.67E-07
-3.60E-07
24-hr
Anneal
225
-4.19E-07
-4.12E-07
-4.43E-07
-3.98E-07
-4.27E-07
-4.32E-07
-4.49E-07
-4.56E-07
-4.29E-07
-4.55E-07
-3.68E-07
-3.61E-07
168-hr
Anneal
250
-3.92E-07
-3.80E-07
-4.07E-07
-3.65E-07
-3.91E-07
-3.81E-07
-3.99E-07
-3.99E-07
-3.77E-07
-4.01E-07
-3.68E-07
-3.59E-07
-3.70E-07 -3.86E-07 -4.02E-07 -4.19E-07 -4.45E-07 -4.20E-07 -3.87E-07
1.53E-08 1.57E-08 1.55E-08 1.55E-08 1.78E-08 1.67E-08 1.57E-08
-3.28E-07 -3.42E-07 -3.60E-07 -3.77E-07 -3.96E-07 -3.74E-07 -3.44E-07
-4.12E-07 -4.29E-07 -4.45E-07 -4.61E-07 -4.94E-07 -4.65E-07 -4.30E-07
-3.57E-07
1.36E-08
-3.20E-07
-3.95E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.75E-07
1.04E-08
-3.46E-07
-4.03E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.97E-07
1.14E-08
-3.66E-07
-4.29E-07
-8.65E-07
PASS
8.65E-07
PASS
-4.21E-07
1.14E-08
-3.89E-07
-4.52E-07
-9.15E-07
PASS
9.15E-07
PASS
-4.58E-07
1.47E-08
-4.18E-07
-4.98E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DLA Certified Company
58
-4.44E-07
1.28E-08
-4.09E-07
-4.79E-07
-9.65E-07
PASS
9.65E-07
PASS
-3.91E-07
1.15E-08
-3.60E-07
-4.23E-07
-9.65E-07
PASS
9.65E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.26. Plot of -Input Bias Current3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
59
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.26. Raw data for -Input Bias Current3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
-Input Bias Current3_2 15V (A)
@ VS=+/-15V, VCM=-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.71E-07
-3.64E-07
-3.91E-07
-3.48E-07
-3.71E-07
-3.52E-07
-3.70E-07
-3.70E-07
-3.37E-07
-3.66E-07
-3.69E-07
-3.57E-07
Total Dose (krad(Si))
20
50
100
-3.86E-07 -4.04E-07 -4.14E-07
-3.81E-07 -3.97E-07 -4.14E-07
-4.06E-07 -4.23E-07 -4.40E-07
-3.63E-07 -3.78E-07 -3.97E-07
-3.86E-07 -4.03E-07 -4.21E-07
-3.69E-07 -3.86E-07 -4.08E-07
-3.88E-07 -4.09E-07 -4.30E-07
-3.87E-07 -4.11E-07 -4.38E-07
-3.60E-07 -3.80E-07 -4.01E-07
-3.76E-07 -4.03E-07 -4.26E-07
-3.68E-07 -3.68E-07 -3.67E-07
-3.57E-07 -3.57E-07 -3.57E-07
200
-4.42E-07
-4.39E-07
-4.70E-07
-4.18E-07
-4.45E-07
-4.38E-07
-4.66E-07
-4.79E-07
-4.35E-07
-4.63E-07
-3.68E-07
-3.58E-07
24-hr
Anneal
225
-4.17E-07
-4.13E-07
-4.41E-07
-3.95E-07
-4.21E-07
-4.27E-07
-4.50E-07
-4.62E-07
-4.25E-07
-4.51E-07
-3.68E-07
-3.57E-07
168-hr
Anneal
250
-3.89E-07
-3.83E-07
-4.08E-07
-3.66E-07
-3.90E-07
-3.82E-07
-4.00E-07
-4.06E-07
-3.76E-07
-3.99E-07
-3.68E-07
-3.56E-07
-3.69E-07 -3.85E-07 -4.01E-07 -4.17E-07 -4.43E-07 -4.18E-07 -3.87E-07
1.52E-08 1.56E-08 1.60E-08 1.57E-08 1.84E-08 1.66E-08 1.51E-08
-3.27E-07 -3.42E-07 -3.57E-07 -3.74E-07 -3.92E-07 -3.72E-07 -3.46E-07
-4.11E-07 -4.27E-07 -4.45E-07 -4.60E-07 -4.93E-07 -4.63E-07 -4.29E-07
-3.59E-07
1.41E-08
-3.20E-07
-3.98E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.76E-07
1.19E-08
-3.43E-07
-4.09E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.98E-07
1.39E-08
-3.60E-07
-4.36E-07
-8.65E-07
PASS
8.65E-07
PASS
-4.21E-07
1.53E-08
-3.79E-07
-4.62E-07
-9.15E-07
PASS
9.15E-07
PASS
-4.56E-07
1.88E-08
-4.05E-07
-5.08E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DLA Certified Company
60
-4.43E-07
1.61E-08
-3.99E-07
-4.87E-07
-9.65E-07
PASS
9.65E-07
PASS
-3.92E-07
1.30E-08
-3.57E-07
-4.28E-07
-9.65E-07
PASS
9.65E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.27. Plot of Output Voltage Swing High1_1 15V (V) @ VS=+/-15V, IL=0mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
61
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.27. Raw data for Output Voltage Swing High1_1 15V (V) @ VS=+/-15V, IL=0mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High1_1 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=0mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 3.99E-03 4.09E-03 4.37E-03 4.62E-03 5.10E-03 4.90E-03 4.35E-03
681 4.06E-03 4.37E-03 4.48E-03 4.69E-03 5.03E-03 4.88E-03 4.49E-03
682 3.87E-03 4.03E-03 4.10E-03 4.45E-03 4.81E-03 4.64E-03 4.19E-03
683 4.03E-03 4.26E-03 4.50E-03 4.77E-03 5.11E-03 5.06E-03 4.59E-03
684 3.91E-03 4.03E-03 4.24E-03 4.52E-03 4.89E-03 4.71E-03 4.15E-03
685 3.92E-03 4.08E-03 4.39E-03 4.76E-03 5.16E-03 5.05E-03 4.36E-03
686 3.95E-03 4.05E-03 4.33E-03 4.63E-03 5.29E-03 5.03E-03 4.34E-03
688 3.69E-03 3.89E-03 4.05E-03 4.37E-03 4.87E-03 4.73E-03 4.16E-03
689 3.89E-03 4.03E-03 4.21E-03 4.63E-03 5.11E-03 4.99E-03 4.32E-03
690 3.96E-03 4.22E-03 4.41E-03 4.83E-03 5.48E-03 5.31E-03 4.35E-03
691 3.82E-03 3.76E-03 3.80E-03 3.76E-03 3.82E-03 3.87E-03 3.89E-03
692 4.07E-03 4.16E-03 4.16E-03 4.11E-03 4.18E-03 4.23E-03 4.16E-03
Biased Statistics
Average Biased
3.97E-03 4.16E-03 4.34E-03 4.61E-03 4.99E-03 4.84E-03 4.35E-03
Std Dev Biased
8.01E-05 1.52E-04 1.69E-04 1.28E-04 1.33E-04 1.66E-04 1.89E-04
Ps90%/90% (+KTL) Biased
4.19E-03 4.57E-03 4.80E-03 4.96E-03 5.35E-03 5.29E-03 4.87E-03
Ps90%/90% (-KTL) Biased
3.75E-03 3.74E-03 3.88E-03 4.26E-03 4.62E-03 4.38E-03 3.84E-03
Un-Biased Statistics
Average Un-Biased
3.88E-03 4.05E-03 4.28E-03 4.64E-03 5.18E-03 5.02E-03 4.31E-03
Std Dev Un-Biased
1.11E-04 1.18E-04 1.49E-04 1.76E-04 2.26E-04 2.06E-04 8.29E-05
Ps90%/90% (+KTL) Un-Biased
4.19E-03 4.38E-03 4.69E-03 5.13E-03 5.80E-03 5.59E-03 4.53E-03
Ps90%/90% (-KTL) Un-Biased
3.58E-03 3.73E-03 3.87E-03 4.16E-03 4.56E-03 4.46E-03 4.08E-03
Specification MAX
1.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
62
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.28. Plot of Output Voltage Swing High1_2 15V (V) @ VS=+/-15V, IL=0mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
63
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.28. Raw data for Output Voltage Swing High1_2 15V (V) @ VS=+/-15V, IL=0mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High1_2 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=0mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.00E-03 4.31E-03 4.46E-03 4.75E-03 5.13E-03 4.94E-03 4.43E-03
681 4.10E-03 4.34E-03 4.58E-03 4.77E-03 5.13E-03 5.00E-03 4.61E-03
682 3.90E-03 4.11E-03 4.37E-03 4.61E-03 4.89E-03 4.64E-03 4.30E-03
683 4.04E-03 4.36E-03 4.72E-03 4.93E-03 5.26E-03 5.07E-03 4.75E-03
684 3.97E-03 4.18E-03 4.53E-03 4.68E-03 5.06E-03 4.84E-03 4.46E-03
685 4.33E-03 4.50E-03 4.80E-03 5.20E-03 5.62E-03 5.52E-03 4.83E-03
686 3.87E-03 4.10E-03 4.50E-03 4.93E-03 5.34E-03 5.23E-03 4.46E-03
688 3.75E-03 3.89E-03 4.15E-03 4.43E-03 5.05E-03 4.90E-03 4.15E-03
689 3.95E-03 4.15E-03 4.46E-03 4.71E-03 5.20E-03 5.04E-03 4.37E-03
690 3.97E-03 4.27E-03 4.50E-03 4.87E-03 5.62E-03 5.33E-03 4.59E-03
691 3.91E-03 3.97E-03 3.96E-03 3.99E-03 3.94E-03 4.00E-03 4.01E-03
692 4.08E-03 4.13E-03 4.13E-03 4.21E-03 4.22E-03 4.24E-03 4.15E-03
Biased Statistics
Average Biased
4.00E-03 4.26E-03 4.53E-03 4.75E-03 5.09E-03 4.90E-03 4.51E-03
Std Dev Biased
7.50E-05 1.09E-04 1.31E-04 1.20E-04 1.35E-04 1.67E-04 1.74E-04
Ps90%/90% (+KTL) Biased
4.21E-03 4.56E-03 4.89E-03 5.08E-03 5.46E-03 5.36E-03 4.99E-03
Ps90%/90% (-KTL) Biased
3.80E-03 3.96E-03 4.17E-03 4.42E-03 4.72E-03 4.44E-03 4.03E-03
Un-Biased Statistics
Average Un-Biased
3.97E-03 4.18E-03 4.48E-03 4.83E-03 5.37E-03 5.20E-03 4.48E-03
Std Dev Un-Biased
2.17E-04 2.25E-04 2.30E-04 2.84E-04 2.54E-04 2.43E-04 2.53E-04
Ps90%/90% (+KTL) Un-Biased
4.57E-03 4.80E-03 5.11E-03 5.61E-03 6.06E-03 5.87E-03 5.17E-03
Ps90%/90% (-KTL) Un-Biased
3.38E-03 3.57E-03 3.85E-03 4.05E-03 4.67E-03 4.54E-03 3.79E-03
Specification MAX
1.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
64
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.29. Plot of Output Voltage Swing High2_1 15V (V) @ VS=+/-15V, IL=1mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
65
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.29. Raw data for Output Voltage Swing High2_1 15V (V) @ VS=+/-15V, IL=1mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High2_1 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=1mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 7.14E-02 7.36E-02 7.48E-02 7.65E-02 7.68E-02 7.63E-02 7.46E-02
681 7.28E-02 7.52E-02 7.63E-02 7.72E-02 7.77E-02 7.75E-02 7.61E-02
682 7.02E-02 7.22E-02 7.31E-02 7.42E-02 7.47E-02 7.43E-02 7.30E-02
683 7.38E-02 7.60E-02 7.71E-02 7.81E-02 7.90E-02 7.84E-02 7.70E-02
684 7.14E-02 7.35E-02 7.46E-02 7.55E-02 7.62E-02 7.55E-02 7.43E-02
685 7.11E-02 7.21E-02 7.29E-02 7.39E-02 7.52E-02 7.47E-02 7.29E-02
686 7.07E-02 7.17E-02 7.26E-02 7.35E-02 7.52E-02 7.47E-02 7.25E-02
688 6.97E-02 7.06E-02 7.11E-02 7.17E-02 7.30E-02 7.25E-02 7.14E-02
689 7.14E-02 7.21E-02 7.30E-02 7.40E-02 7.52E-02 7.49E-02 7.31E-02
690 7.24E-02 7.40E-02 7.45E-02 7.57E-02 7.70E-02 7.67E-02 7.44E-02
691 6.84E-02 6.84E-02 6.83E-02 6.83E-02 6.84E-02 6.84E-02 6.84E-02
692 7.24E-02 7.22E-02 7.25E-02 7.26E-02 7.25E-02 7.24E-02 7.23E-02
Biased Statistics
Average Biased
7.19E-02 7.41E-02 7.52E-02 7.63E-02 7.69E-02 7.64E-02 7.50E-02
Std Dev Biased
1.41E-03 1.50E-03 1.56E-03 1.53E-03 1.60E-03 1.63E-03 1.57E-03
Ps90%/90% (+KTL) Biased
7.58E-02 7.82E-02 7.95E-02 8.05E-02 8.13E-02 8.09E-02 7.93E-02
Ps90%/90% (-KTL) Biased
6.80E-02 7.00E-02 7.09E-02 7.21E-02 7.25E-02 7.19E-02 7.07E-02
Un-Biased Statistics
Average Un-Biased
7.10E-02 7.21E-02 7.28E-02 7.38E-02 7.51E-02 7.47E-02 7.28E-02
Std Dev Un-Biased
9.91E-04 1.23E-03 1.23E-03 1.42E-03 1.42E-03 1.47E-03 1.10E-03
Ps90%/90% (+KTL) Un-Biased
7.38E-02 7.54E-02 7.62E-02 7.77E-02 7.90E-02 7.87E-02 7.58E-02
Ps90%/90% (-KTL) Un-Biased
6.83E-02 6.87E-02 6.94E-02 6.99E-02 7.12E-02 7.07E-02 6.98E-02
Specification MAX
1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
66
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.30. Plot of Output Voltage Swing High2_2 15V (V) @ VS=+/-15V, IL=1mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
67
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.30. Raw data for Output Voltage Swing High2_2 15V (V) @ VS=+/-15V, IL=1mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High2_2 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=1mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 7.17E-02 7.38E-02 7.50E-02 7.67E-02 7.70E-02 7.63E-02 7.47E-02
681 7.27E-02 7.49E-02 7.58E-02 7.68E-02 7.74E-02 7.71E-02 7.58E-02
682 7.05E-02 7.24E-02 7.34E-02 7.41E-02 7.48E-02 7.45E-02 7.30E-02
683 7.37E-02 7.58E-02 7.70E-02 7.79E-02 7.87E-02 7.83E-02 7.67E-02
684 7.19E-02 7.40E-02 7.50E-02 7.58E-02 7.65E-02 7.59E-02 7.46E-02
685 7.12E-02 7.19E-02 7.26E-02 7.37E-02 7.50E-02 7.43E-02 7.28E-02
686 7.11E-02 7.19E-02 7.28E-02 7.37E-02 7.52E-02 7.47E-02 7.28E-02
688 6.99E-02 7.05E-02 7.12E-02 7.19E-02 7.28E-02 7.27E-02 7.14E-02
689 7.12E-02 7.20E-02 7.27E-02 7.38E-02 7.48E-02 7.48E-02 7.29E-02
690 7.24E-02 7.39E-02 7.44E-02 7.56E-02 7.70E-02 7.65E-02 7.44E-02
691 6.88E-02 6.89E-02 6.88E-02 6.88E-02 6.88E-02 6.90E-02 6.89E-02
692 7.24E-02 7.22E-02 7.21E-02 7.21E-02 7.22E-02 7.20E-02 7.21E-02
Biased Statistics
Average Biased
7.21E-02 7.42E-02 7.52E-02 7.62E-02 7.69E-02 7.64E-02 7.50E-02
Std Dev Biased
1.21E-03 1.30E-03 1.34E-03 1.44E-03 1.43E-03 1.42E-03 1.37E-03
Ps90%/90% (+KTL) Biased
7.54E-02 7.77E-02 7.89E-02 8.02E-02 8.08E-02 8.03E-02 7.87E-02
Ps90%/90% (-KTL) Biased
6.88E-02 7.06E-02 7.16E-02 7.23E-02 7.29E-02 7.25E-02 7.12E-02
Un-Biased Statistics
Average Un-Biased
7.11E-02 7.20E-02 7.27E-02 7.37E-02 7.50E-02 7.46E-02 7.29E-02
Std Dev Un-Biased
8.64E-04 1.19E-03 1.12E-03 1.31E-03 1.48E-03 1.33E-03 1.07E-03
Ps90%/90% (+KTL) Un-Biased
7.35E-02 7.53E-02 7.58E-02 7.73E-02 7.90E-02 7.82E-02 7.58E-02
Ps90%/90% (-KTL) Un-Biased
6.88E-02 6.88E-02 6.97E-02 7.02E-02 7.09E-02 7.09E-02 6.99E-02
Specification MAX
1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
68
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.31. Plot of Output Voltage Swing High3_1 15V (V) @ VS=+/-15V, IL=10mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
69
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.31. Raw data for Output Voltage Swing High3_1 15V (V) @ VS=+/-15V, IL=10mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High3_1 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=10mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 3.66E-01 3.74E-01 3.83E-01 3.94E-01 4.05E-01 3.98E-01 3.82E-01
681 3.74E-01 3.84E-01 3.93E-01 4.03E-01 4.13E-01 4.08E-01 3.93E-01
682 3.59E-01 3.65E-01 3.72E-01 3.78E-01 3.84E-01 3.81E-01 3.72E-01
683 3.80E-01 3.91E-01 4.01E-01 4.12E-01 4.24E-01 4.18E-01 4.00E-01
684 3.65E-01 3.73E-01 3.80E-01 3.88E-01 3.96E-01 3.92E-01 3.79E-01
685 3.65E-01 3.69E-01 3.76E-01 3.84E-01 3.98E-01 3.93E-01 3.77E-01
686 3.63E-01 3.66E-01 3.73E-01 3.81E-01 3.95E-01 3.91E-01 3.73E-01
688 3.58E-01 3.61E-01 3.65E-01 3.70E-01 3.78E-01 3.76E-01 3.67E-01
689 3.66E-01 3.71E-01 3.77E-01 3.85E-01 3.96E-01 3.93E-01 3.78E-01
690 3.71E-01 3.78E-01 3.84E-01 3.94E-01 4.11E-01 4.06E-01 3.85E-01
691 3.49E-01 3.49E-01 3.49E-01 3.50E-01 3.49E-01 3.50E-01 3.49E-01
692 3.71E-01 3.70E-01 3.71E-01 3.71E-01 3.71E-01 3.71E-01 3.71E-01
Biased Statistics
Average Biased
3.69E-01 3.77E-01 3.86E-01 3.95E-01 4.05E-01 3.99E-01 3.85E-01
Std Dev Biased
8.40E-03 9.93E-03 1.14E-02 1.31E-02 1.54E-02 1.42E-02 1.13E-02
Ps90%/90% (+KTL) Biased
3.92E-01 4.04E-01 4.17E-01 4.31E-01 4.47E-01 4.38E-01 4.16E-01
Ps90%/90% (-KTL) Biased
3.46E-01 3.50E-01 3.55E-01 3.59E-01 3.62E-01 3.60E-01 3.54E-01
Un-Biased Statistics
Average Un-Biased
3.65E-01 3.69E-01 3.75E-01 3.83E-01 3.96E-01 3.92E-01 3.76E-01
Std Dev Un-Biased
4.53E-03 6.04E-03 6.86E-03 8.48E-03 1.19E-02 1.06E-02 6.46E-03
Ps90%/90% (+KTL) Un-Biased
3.77E-01 3.86E-01 3.94E-01 4.06E-01 4.28E-01 4.21E-01 3.94E-01
Ps90%/90% (-KTL) Un-Biased
3.52E-01 3.52E-01 3.56E-01 3.60E-01 3.63E-01 3.63E-01 3.58E-01
Specification MAX
8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
70
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.32. Plot of Output Voltage Swing High3_2 15V (V) @ VS=+/-15V, IL=10mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
71
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.32. Raw data for Output Voltage Swing High3_2 15V (V) @ VS=+/-15V, IL=10mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High3_2 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=10mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 3.66E-01 3.75E-01 3.84E-01 3.96E-01 4.06E-01 4.00E-01 3.84E-01
681 3.71E-01 3.81E-01 3.89E-01 3.98E-01 4.08E-01 4.03E-01 3.89E-01
682 3.59E-01 3.66E-01 3.72E-01 3.79E-01 3.85E-01 3.82E-01 3.72E-01
683 3.80E-01 3.90E-01 4.00E-01 4.11E-01 4.23E-01 4.17E-01 4.00E-01
684 3.67E-01 3.75E-01 3.83E-01 3.91E-01 4.00E-01 3.95E-01 3.82E-01
685 3.63E-01 3.67E-01 3.73E-01 3.81E-01 3.95E-01 3.90E-01 3.75E-01
686 3.64E-01 3.68E-01 3.74E-01 3.83E-01 3.96E-01 3.92E-01 3.75E-01
688 3.58E-01 3.61E-01 3.65E-01 3.70E-01 3.77E-01 3.76E-01 3.67E-01
689 3.65E-01 3.69E-01 3.75E-01 3.83E-01 3.94E-01 3.91E-01 3.76E-01
690 3.69E-01 3.76E-01 3.82E-01 3.92E-01 4.09E-01 4.04E-01 3.83E-01
691 3.51E-01 3.51E-01 3.51E-01 3.52E-01 3.51E-01 3.52E-01 3.52E-01
692 3.69E-01 3.69E-01 3.70E-01 3.70E-01 3.69E-01 3.69E-01 3.69E-01
Biased Statistics
Average Biased
3.69E-01 3.77E-01 3.86E-01 3.95E-01 4.04E-01 3.99E-01 3.85E-01
Std Dev Biased
7.45E-03 8.80E-03 1.01E-02 1.18E-02 1.38E-02 1.28E-02 1.01E-02
Ps90%/90% (+KTL) Biased
3.89E-01 4.01E-01 4.13E-01 4.27E-01 4.42E-01 4.34E-01 4.13E-01
Ps90%/90% (-KTL) Biased
3.48E-01 3.53E-01 3.58E-01 3.62E-01 3.66E-01 3.64E-01 3.58E-01
Un-Biased Statistics
Average Un-Biased
3.64E-01 3.68E-01 3.74E-01 3.82E-01 3.94E-01 3.91E-01 3.75E-01
Std Dev Un-Biased
3.89E-03 5.27E-03 6.12E-03 7.82E-03 1.13E-02 1.00E-02 5.68E-03
Ps90%/90% (+KTL) Un-Biased
3.75E-01 3.83E-01 3.91E-01 4.03E-01 4.25E-01 4.18E-01 3.91E-01
Ps90%/90% (-KTL) Un-Biased
3.53E-01 3.54E-01 3.57E-01 3.60E-01 3.63E-01 3.63E-01 3.60E-01
Specification MAX
8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
72
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.33. Plot of Output Voltage Swing Low1_1 15V (V) @ VS=+/-15V, IL=0mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
73
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.33. Raw data for Output Voltage Swing Low1_1 15V (V) @ VS=+/-15V, IL=0mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low1_1 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=0mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 1.91E-02 1.93E-02 1.98E-02 2.07E-02 2.10E-02 2.10E-02 2.01E-02
681 1.93E-02 1.94E-02 1.99E-02 2.06E-02 2.09E-02 2.09E-02 2.03E-02
682 1.83E-02 1.89E-02 1.90E-02 1.94E-02 1.98E-02 1.99E-02 1.92E-02
683 1.97E-02 1.99E-02 2.05E-02 2.06E-02 2.15E-02 2.11E-02 2.04E-02
684 1.91E-02 1.92E-02 1.99E-02 2.03E-02 2.07E-02 2.04E-02 1.99E-02
685 1.94E-02 1.97E-02 2.00E-02 2.06E-02 2.13E-02 2.11E-02 2.00E-02
686 1.89E-02 1.93E-02 1.97E-02 2.02E-02 2.09E-02 2.06E-02 1.98E-02
688 1.82E-02 1.87E-02 1.91E-02 1.93E-02 1.98E-02 1.97E-02 1.88E-02
689 1.95E-02 1.96E-02 2.00E-02 2.07E-02 2.10E-02 2.09E-02 2.03E-02
690 1.86E-02 1.94E-02 1.93E-02 2.01E-02 2.08E-02 2.06E-02 1.97E-02
691 1.92E-02 1.91E-02 1.92E-02 1.94E-02 1.92E-02 1.94E-02 1.91E-02
692 1.93E-02 1.94E-02 1.94E-02 1.93E-02 1.93E-02 1.93E-02 1.94E-02
Biased Statistics
Average Biased
1.91E-02 1.93E-02 1.98E-02 2.03E-02 2.07E-02 2.07E-02 2.00E-02
Std Dev Biased
4.95E-04 3.82E-04 5.46E-04 5.40E-04 6.28E-04 4.77E-04 4.53E-04
Ps90%/90% (+KTL) Biased
2.05E-02 2.04E-02 2.13E-02 2.18E-02 2.25E-02 2.20E-02 2.12E-02
Ps90%/90% (-KTL) Biased
1.77E-02 1.83E-02 1.83E-02 1.88E-02 1.90E-02 1.94E-02 1.87E-02
Un-Biased Statistics
Average Un-Biased
1.89E-02 1.93E-02 1.96E-02 2.02E-02 2.08E-02 2.06E-02 1.97E-02
Std Dev Un-Biased
5.58E-04 3.95E-04 4.30E-04 5.45E-04 5.78E-04 5.41E-04 5.65E-04
Ps90%/90% (+KTL) Un-Biased
2.05E-02 2.04E-02 2.08E-02 2.17E-02 2.23E-02 2.21E-02 2.13E-02
Ps90%/90% (-KTL) Un-Biased
1.74E-02 1.82E-02 1.85E-02 1.87E-02 1.92E-02 1.91E-02 1.82E-02
Specification MAX
3.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
74
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.34. Plot of Output Voltage Swing Low1_2 15V (V) @ VS=+/-15V, IL=0mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
75
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.34. Raw data for Output Voltage Swing Low1_2 15V (V) @ VS=+/-15V, IL=0mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low1_2 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=0mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 1.94E-02 1.97E-02 2.01E-02 2.11E-02 2.13E-02 2.10E-02 2.04E-02
681 1.96E-02 1.97E-02 2.01E-02 2.05E-02 2.13E-02 2.10E-02 2.02E-02
682 1.88E-02 1.93E-02 1.96E-02 1.97E-02 2.04E-02 2.01E-02 1.96E-02
683 1.96E-02 1.98E-02 2.05E-02 2.06E-02 2.13E-02 2.11E-02 2.06E-02
684 1.92E-02 2.00E-02 2.03E-02 2.06E-02 2.11E-02 2.11E-02 2.02E-02
685 1.96E-02 2.00E-02 2.05E-02 2.07E-02 2.16E-02 2.14E-02 2.05E-02
686 1.93E-02 1.98E-02 2.00E-02 2.08E-02 2.14E-02 2.11E-02 2.02E-02
688 1.83E-02 1.86E-02 1.88E-02 1.94E-02 2.00E-02 1.98E-02 1.91E-02
689 1.96E-02 1.98E-02 2.03E-02 2.07E-02 2.14E-02 2.13E-02 2.02E-02
690 1.92E-02 1.98E-02 1.98E-02 2.02E-02 2.10E-02 2.10E-02 1.97E-02
691 1.95E-02 1.96E-02 1.96E-02 1.96E-02 1.96E-02 1.96E-02 1.96E-02
692 1.93E-02 1.94E-02 1.95E-02 1.93E-02 1.94E-02 1.97E-02 1.97E-02
Biased Statistics
Average Biased
1.93E-02 1.97E-02 2.01E-02 2.05E-02 2.11E-02 2.09E-02 2.02E-02
Std Dev Biased
3.42E-04 2.29E-04 3.37E-04 5.22E-04 3.90E-04 4.45E-04 3.76E-04
Ps90%/90% (+KTL) Biased
2.02E-02 2.03E-02 2.10E-02 2.19E-02 2.21E-02 2.21E-02 2.12E-02
Ps90%/90% (-KTL) Biased
1.84E-02 1.91E-02 1.92E-02 1.90E-02 2.00E-02 1.96E-02 1.91E-02
Un-Biased Statistics
Average Un-Biased
1.92E-02 1.96E-02 1.99E-02 2.04E-02 2.11E-02 2.09E-02 1.99E-02
Std Dev Un-Biased
5.51E-04 5.80E-04 6.57E-04 5.99E-04 6.42E-04 6.29E-04 5.79E-04
Ps90%/90% (+KTL) Un-Biased
2.07E-02 2.12E-02 2.17E-02 2.20E-02 2.28E-02 2.26E-02 2.15E-02
Ps90%/90% (-KTL) Un-Biased
1.77E-02 1.80E-02 1.81E-02 1.87E-02 1.93E-02 1.92E-02 1.83E-02
Specification MAX
3.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
76
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.35. Plot of Output Voltage Swing Low2_1 15V (V) @ VS=+/-15V, IL=1mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
77
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.35. Raw data for Output Voltage Swing Low2_1 15V (V) @ VS=+/-15V, IL=1mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low2_1 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=1mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 5.32E-02 5.36E-02 5.41E-02 5.55E-02 5.55E-02 5.54E-02 5.42E-02
681 5.39E-02 5.45E-02 5.49E-02 5.55E-02 5.60E-02 5.58E-02 5.51E-02
682 5.23E-02 5.30E-02 5.35E-02 5.36E-02 5.43E-02 5.41E-02 5.37E-02
683 5.46E-02 5.51E-02 5.56E-02 5.61E-02 5.69E-02 5.67E-02 5.56E-02
684 5.35E-02 5.44E-02 5.46E-02 5.52E-02 5.54E-02 5.55E-02 5.48E-02
685 5.36E-02 5.42E-02 5.46E-02 5.48E-02 5.58E-02 5.58E-02 5.47E-02
686 5.35E-02 5.39E-02 5.39E-02 5.48E-02 5.52E-02 5.53E-02 5.44E-02
688 5.22E-02 5.26E-02 5.29E-02 5.34E-02 5.36E-02 5.35E-02 5.28E-02
689 5.38E-02 5.42E-02 5.45E-02 5.51E-02 5.57E-02 5.57E-02 5.47E-02
690 5.34E-02 5.41E-02 5.41E-02 5.47E-02 5.55E-02 5.52E-02 5.40E-02
691 5.29E-02 5.29E-02 5.27E-02 5.28E-02 5.29E-02 5.31E-02 5.29E-02
692 5.41E-02 5.41E-02 5.41E-02 5.41E-02 5.38E-02 5.40E-02 5.40E-02
Biased Statistics
Average Biased
5.35E-02 5.41E-02 5.45E-02 5.52E-02 5.56E-02 5.55E-02 5.47E-02
Std Dev Biased
8.24E-04 8.20E-04 7.96E-04 9.20E-04 9.35E-04 9.22E-04 7.72E-04
Ps90%/90% (+KTL) Biased
5.58E-02 5.64E-02 5.67E-02 5.77E-02 5.82E-02 5.80E-02 5.68E-02
Ps90%/90% (-KTL) Biased
5.12E-02 5.19E-02 5.23E-02 5.27E-02 5.31E-02 5.30E-02 5.25E-02
Un-Biased Statistics
Average Un-Biased
5.33E-02 5.38E-02 5.40E-02 5.45E-02 5.52E-02 5.51E-02 5.41E-02
Std Dev Un-Biased
6.20E-04 6.49E-04 6.83E-04 6.85E-04 9.16E-04 9.32E-04 7.98E-04
Ps90%/90% (+KTL) Un-Biased
5.50E-02 5.56E-02 5.59E-02 5.64E-02 5.77E-02 5.76E-02 5.63E-02
Ps90%/90% (-KTL) Un-Biased
5.16E-02 5.20E-02 5.21E-02 5.27E-02 5.26E-02 5.25E-02 5.19E-02
Specification MAX
1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
78
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.36. Plot of Output Voltage Swing Low2_2 15V (V) @ VS=+/-15V, IL=1mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
79
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.36. Raw data for Output Voltage Swing Low2_2 15V (V) @ VS=+/-15V, IL=1mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low2_2 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=1mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 5.42E-02 5.45E-02 5.52E-02 5.64E-02 5.65E-02 5.61E-02 5.49E-02
681 5.42E-02 5.53E-02 5.56E-02 5.60E-02 5.67E-02 5.65E-02 5.60E-02
682 5.29E-02 5.39E-02 5.41E-02 5.46E-02 5.49E-02 5.47E-02 5.42E-02
683 5.49E-02 5.56E-02 5.58E-02 5.64E-02 5.73E-02 5.71E-02 5.60E-02
684 5.41E-02 5.46E-02 5.51E-02 5.56E-02 5.59E-02 5.61E-02 5.53E-02
685 5.44E-02 5.48E-02 5.54E-02 5.59E-02 5.65E-02 5.62E-02 5.55E-02
686 5.41E-02 5.45E-02 5.48E-02 5.51E-02 5.67E-02 5.62E-02 5.51E-02
688 5.27E-02 5.30E-02 5.34E-02 5.34E-02 5.41E-02 5.41E-02 5.35E-02
689 5.44E-02 5.47E-02 5.53E-02 5.56E-02 5.62E-02 5.60E-02 5.51E-02
690 5.40E-02 5.50E-02 5.51E-02 5.57E-02 5.64E-02 5.63E-02 5.50E-02
691 5.37E-02 5.36E-02 5.37E-02 5.38E-02 5.35E-02 5.36E-02 5.39E-02
692 5.49E-02 5.43E-02 5.47E-02 5.47E-02 5.46E-02 5.47E-02 5.46E-02
Biased Statistics
Average Biased
5.40E-02 5.48E-02 5.52E-02 5.58E-02 5.63E-02 5.61E-02 5.53E-02
Std Dev Biased
7.48E-04 6.49E-04 6.80E-04 7.63E-04 9.00E-04 8.85E-04 7.80E-04
Ps90%/90% (+KTL) Biased
5.61E-02 5.66E-02 5.70E-02 5.79E-02 5.87E-02 5.85E-02 5.74E-02
Ps90%/90% (-KTL) Biased
5.20E-02 5.30E-02 5.33E-02 5.37E-02 5.38E-02 5.37E-02 5.31E-02
Un-Biased Statistics
Average Un-Biased
5.39E-02 5.44E-02 5.48E-02 5.51E-02 5.60E-02 5.58E-02 5.48E-02
Std Dev Un-Biased
6.98E-04 7.87E-04 8.30E-04 1.04E-03 1.05E-03 9.33E-04 7.87E-04
Ps90%/90% (+KTL) Un-Biased
5.58E-02 5.65E-02 5.71E-02 5.80E-02 5.88E-02 5.83E-02 5.70E-02
Ps90%/90% (-KTL) Un-Biased
5.20E-02 5.22E-02 5.25E-02 5.23E-02 5.31E-02 5.32E-02 5.27E-02
Specification MAX
1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
80
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.37. Plot of Output Voltage Swing Low3_1 15V (V) @ VS=+/-15V, IL=10mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
81
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.37. Raw data for Output Voltage Swing Low3_1 15V (V) @ VS=+/-15V, IL=10mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low3_1 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=10mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 2.16E-01 2.19E-01 2.19E-01 2.23E-01 2.21E-01 2.19E-01 2.19E-01
681 2.21E-01 2.22E-01 2.23E-01 2.23E-01 2.23E-01 2.23E-01 2.23E-01
682 2.16E-01 2.19E-01 2.19E-01 2.20E-01 2.20E-01 2.21E-01 2.20E-01
683 2.21E-01 2.23E-01 2.24E-01 2.23E-01 2.25E-01 2.24E-01 2.23E-01
684 2.21E-01 2.22E-01 2.23E-01 2.24E-01 2.24E-01 2.24E-01 2.23E-01
685 2.18E-01 2.20E-01 2.20E-01 2.20E-01 2.21E-01 2.21E-01 2.20E-01
686 2.17E-01 2.17E-01 2.18E-01 2.20E-01 2.20E-01 2.20E-01 2.19E-01
688 2.20E-01 2.20E-01 2.21E-01 2.21E-01 2.22E-01 2.22E-01 2.21E-01
689 2.21E-01 2.21E-01 2.21E-01 2.22E-01 2.23E-01 2.23E-01 2.21E-01
690 2.19E-01 2.22E-01 2.20E-01 2.22E-01 2.23E-01 2.22E-01 2.21E-01
691 2.15E-01 2.14E-01 2.14E-01 2.15E-01 2.15E-01 2.15E-01 2.15E-01
692 2.21E-01 2.22E-01 2.22E-01 2.22E-01 2.22E-01 2.22E-01 2.22E-01
Biased Statistics
Average Biased
2.19E-01 2.21E-01 2.21E-01 2.23E-01 2.23E-01 2.22E-01 2.22E-01
Std Dev Biased
2.61E-03 2.11E-03 2.25E-03 1.59E-03 2.22E-03 2.08E-03 1.95E-03
Ps90%/90% (+KTL) Biased
2.26E-01 2.27E-01 2.28E-01 2.27E-01 2.29E-01 2.28E-01 2.27E-01
Ps90%/90% (-KTL) Biased
2.12E-01 2.15E-01 2.15E-01 2.18E-01 2.16E-01 2.17E-01 2.16E-01
Un-Biased Statistics
Average Un-Biased
2.19E-01 2.20E-01 2.20E-01 2.21E-01 2.22E-01 2.22E-01 2.20E-01
Std Dev Un-Biased
1.32E-03 1.88E-03 1.43E-03 1.12E-03 9.80E-04 1.21E-03 7.38E-04
Ps90%/90% (+KTL) Un-Biased
2.23E-01 2.25E-01 2.24E-01 2.24E-01 2.25E-01 2.25E-01 2.22E-01
Ps90%/90% (-KTL) Un-Biased
2.16E-01 2.15E-01 2.16E-01 2.18E-01 2.19E-01 2.18E-01 2.18E-01
Specification MAX
5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
82
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.38. Plot of Output Voltage Swing Low3_2 15V (V) @ VS=+/-15V, IL=10mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
83
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.38. Raw data for Output Voltage Swing Low3_2 15V (V) @ VS=+/-15V, IL=10mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low3_2 15V (V)
24-hr
168-hr
@ VS=+/-15V, IL=10mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 2.20E-01 2.21E-01 2.21E-01 2.25E-01 2.23E-01 2.23E-01 2.22E-01
681 2.24E-01 2.24E-01 2.24E-01 2.25E-01 2.26E-01 2.25E-01 2.25E-01
682 2.21E-01 2.22E-01 2.22E-01 2.22E-01 2.23E-01 2.22E-01 2.22E-01
683 2.24E-01 2.25E-01 2.26E-01 2.26E-01 2.27E-01 2.27E-01 2.27E-01
684 2.24E-01 2.25E-01 2.25E-01 2.26E-01 2.27E-01 2.26E-01 2.25E-01
685 2.21E-01 2.22E-01 2.23E-01 2.22E-01 2.24E-01 2.23E-01 2.22E-01
686 2.21E-01 2.20E-01 2.21E-01 2.21E-01 2.22E-01 2.23E-01 2.21E-01
688 2.22E-01 2.22E-01 2.22E-01 2.23E-01 2.23E-01 2.24E-01 2.23E-01
689 2.23E-01 2.24E-01 2.24E-01 2.25E-01 2.25E-01 2.25E-01 2.25E-01
690 2.22E-01 2.25E-01 2.23E-01 2.23E-01 2.25E-01 2.24E-01 2.24E-01
691 2.17E-01 2.17E-01 2.17E-01 2.18E-01 2.18E-01 2.18E-01 2.18E-01
692 2.25E-01 2.25E-01 2.24E-01 2.25E-01 2.25E-01 2.24E-01 2.25E-01
Biased Statistics
Average Biased
2.23E-01 2.24E-01 2.24E-01 2.25E-01 2.25E-01 2.24E-01 2.24E-01
Std Dev Biased
1.90E-03 2.11E-03 1.94E-03 1.61E-03 1.97E-03 1.94E-03 2.15E-03
Ps90%/90% (+KTL) Biased
2.28E-01 2.29E-01 2.29E-01 2.29E-01 2.30E-01 2.30E-01 2.30E-01
Ps90%/90% (-KTL) Biased
2.18E-01 2.18E-01 2.18E-01 2.20E-01 2.20E-01 2.19E-01 2.18E-01
Un-Biased Statistics
Average Un-Biased
2.22E-01 2.23E-01 2.23E-01 2.23E-01 2.24E-01 2.24E-01 2.23E-01
Std Dev Un-Biased
8.69E-04 1.64E-03 1.11E-03 1.29E-03 1.19E-03 9.81E-04 1.34E-03
Ps90%/90% (+KTL) Un-Biased
2.24E-01 2.27E-01 2.26E-01 2.26E-01 2.27E-01 2.27E-01 2.26E-01
Ps90%/90% (-KTL) Un-Biased
2.19E-01 2.18E-01 2.20E-01 2.19E-01 2.21E-01 2.21E-01 2.19E-01
Specification MAX
5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
84
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.39. Plot of Large Signal Voltage Gain1_1 15V (V/mV) @ VS=+/-15V, VO=+/-14.5V, RL=10kΩ versus
total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
85
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.39. Raw data for Large Signal Voltage Gain1_1 15V (V/mV) @ VS=+/-15V, VO=+/-14.5V, RL=10kΩ
versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain1_1 15V (V/mV)
@ VS=+/-15V, VO=+/-14.5V, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
4.00E+03
4.12E+03
3.52E+03
3.77E+03
3.63E+03
2.97E+03
3.19E+03
3.35E+03
3.54E+03
3.92E+03
4.30E+03
3.91E+03
24-hr
Anneal
225
4.10E+03
4.16E+03
3.62E+03
3.99E+03
3.95E+03
3.46E+03
3.81E+03
3.46E+03
3.81E+03
4.40E+03
4.25E+03
3.89E+03
168-hr
Anneal
250
4.48E+03
4.29E+03
3.92E+03
4.29E+03
4.10E+03
4.20E+03
3.94E+03
4.07E+03
3.91E+03
4.56E+03
4.27E+03
3.93E+03
4.10E+03
2.41E+02
4.77E+03
3.44E+03
3.81E+03
2.49E+02
4.49E+03
3.12E+03
3.96E+03
2.09E+02
4.53E+03
3.39E+03
4.22E+03
2.14E+02
4.80E+03
3.63E+03
3.65E+03
1.97E+02
4.19E+03
3.11E+03
5.00E+02
PASS
3.39E+03
3.61E+02
4.38E+03
2.40E+03
5.00E+02
PASS
3.79E+03
3.84E+02
4.84E+03
2.73E+03
5.00E+02
PASS
4.14E+03
2.64E+02
4.86E+03
3.41E+03
5.00E+02
PASS
0
4.95E+03
4.69E+03
4.06E+03
4.77E+03
4.37E+03
3.76E+03
4.22E+03
4.31E+03
4.35E+03
4.49E+03
4.26E+03
3.91E+03
Total Dose (krad(Si))
20
50
100
4.61E+03 4.61E+03 4.36E+03
4.58E+03 4.14E+03 4.30E+03
3.94E+03 3.73E+03 3.76E+03
4.23E+03 4.14E+03 4.10E+03
4.23E+03 4.19E+03 4.00E+03
3.59E+03 3.57E+03 3.44E+03
4.02E+03 4.06E+03 3.56E+03
4.02E+03 3.84E+03 3.69E+03
4.35E+03 4.29E+03 3.96E+03
4.54E+03 4.39E+03 3.58E+03
4.36E+03 4.34E+03 4.24E+03
3.92E+03 3.91E+03 3.97E+03
4.57E+03
3.52E+02
5.53E+03
3.60E+03
4.32E+03
2.80E+02
5.08E+03
3.55E+03
4.16E+03
3.11E+02
5.01E+03
3.31E+03
4.23E+03
2.79E+02
4.99E+03
3.46E+03
1.00E+03
PASS
4.11E+03
3.62E+02
5.10E+03
3.11E+03
5.00E+02
PASS
4.03E+03
3.33E+02
4.94E+03
3.12E+03
5.00E+02
PASS
An ISO 9001:2008 and DLA Certified Company
86
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.40. Plot of Large Signal Voltage Gain1_2 15V (V/mV) @ VS=+/-15V, VO=+/-14.5V, RL=10kΩ versus
total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
87
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.40. Raw data for Large Signal Voltage Gain1_2 15V (V/mV) @ VS=+/-15V, VO=+/-14.5V, RL=10kΩ
versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain1_2 15V (V/mV)
@ VS=+/-15V, VO=+/-14.5V, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
4.32E+03
4.27E+03
4.54E+03
4.75E+03
4.44E+03
4.13E+03
5.05E+03
5.40E+03
5.12E+03
3.96E+03
5.68E+03
5.91E+03
24-hr
Anneal
225
4.79E+03
4.73E+03
4.57E+03
4.77E+03
5.09E+03
5.28E+03
4.60E+03
4.82E+03
4.97E+03
5.25E+03
5.60E+03
6.36E+03
168-hr
Anneal
250
5.23E+03
5.40E+03
5.13E+03
5.29E+03
4.70E+03
5.58E+03
5.62E+03
5.47E+03
5.44E+03
5.59E+03
5.62E+03
5.34E+03
4.87E+03
3.56E+02
5.85E+03
3.89E+03
4.46E+03
1.93E+02
4.99E+03
3.93E+03
4.79E+03
1.90E+02
5.31E+03
4.27E+03
5.15E+03
2.70E+02
5.89E+03
4.41E+03
5.44E+03
4.41E+02
6.65E+03
4.23E+03
5.00E+02
PASS
4.73E+03
6.41E+02
6.49E+03
2.97E+03
5.00E+02
PASS
4.98E+03
2.90E+02
5.78E+03
4.19E+03
5.00E+02
PASS
5.54E+03
8.02E+01
5.76E+03
5.32E+03
5.00E+02
PASS
0
5.65E+03
5.64E+03
5.63E+03
5.96E+03
5.63E+03
6.00E+03
5.90E+03
6.98E+03
5.81E+03
6.48E+03
5.57E+03
5.94E+03
Total Dose (krad(Si))
20
50
100
5.46E+03 5.50E+03 5.41E+03
5.58E+03 5.51E+03 4.51E+03
4.95E+03 4.77E+03 4.62E+03
5.65E+03 5.08E+03 4.79E+03
5.58E+03 5.08E+03 5.02E+03
6.42E+03 5.44E+03 5.41E+03
6.04E+03 5.31E+03 4.80E+03
5.94E+03 6.07E+03 6.01E+03
5.82E+03 5.41E+03 5.36E+03
5.97E+03 6.13E+03 5.63E+03
5.53E+03 5.40E+03 5.63E+03
6.12E+03 6.20E+03 6.43E+03
5.70E+03
1.45E+02
6.10E+03
5.30E+03
5.44E+03
2.84E+02
6.22E+03
4.67E+03
5.19E+03
3.17E+02
6.06E+03
4.32E+03
6.23E+03
4.93E+02
7.59E+03
4.88E+03
1.00E+03
PASS
6.04E+03
2.26E+02
6.66E+03
5.42E+03
5.00E+02
PASS
5.67E+03
3.94E+02
6.75E+03
4.59E+03
5.00E+02
PASS
An ISO 9001:2008 and DLA Certified Company
88
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.41. Plot of Large Signal Voltage Gain2_1 15V (V/mV) @ VS=+/-15V, VO=+/-10V, RL=2kΩ versus
total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
89
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.41. Raw data for Large Signal Voltage Gain2_1 15V (V/mV) @ VS=+/-15V, VO=+/-10V, RL=2kΩ
versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain2_1 15V (V/mV)
@ VS=+/-15V, VO=+/-10V, RL=2kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
1.56E+03
1.75E+03
1.54E+03
1.65E+03
1.61E+03
1.49E+03
1.64E+03
1.63E+03
1.73E+03
1.72E+03
1.98E+03
1.89E+03
24-hr
Anneal
225
1.71E+03
1.83E+03
1.63E+03
1.74E+03
1.66E+03
1.39E+03
1.75E+03
1.80E+03
1.70E+03
1.68E+03
2.01E+03
1.89E+03
168-hr
Anneal
250
1.86E+03
1.95E+03
1.75E+03
1.92E+03
1.81E+03
1.64E+03
1.83E+03
1.98E+03
1.84E+03
1.89E+03
2.01E+03
1.93E+03
1.73E+03
1.12E+02
2.04E+03
1.43E+03
1.62E+03
8.34E+01
1.85E+03
1.39E+03
1.71E+03
7.98E+01
1.93E+03
1.50E+03
1.86E+03
8.21E+01
2.08E+03
1.63E+03
1.72E+03
9.26E+01
1.98E+03
1.47E+03
2.50E+02
PASS
1.64E+03
9.90E+01
1.91E+03
1.37E+03
2.50E+02
PASS
1.66E+03
1.60E+02
2.10E+03
1.23E+03
2.50E+02
PASS
1.84E+03
1.24E+02
2.18E+03
1.50E+03
2.50E+02
PASS
0
2.01E+03
2.23E+03
2.00E+03
2.23E+03
2.07E+03
1.78E+03
1.95E+03
2.13E+03
2.18E+03
2.30E+03
2.03E+03
1.90E+03
Total Dose (krad(Si))
20
50
100
1.92E+03 1.86E+03 1.72E+03
2.15E+03 1.99E+03 1.89E+03
1.82E+03 1.78E+03 1.60E+03
1.88E+03 2.00E+03 1.79E+03
1.96E+03 1.86E+03 1.68E+03
1.75E+03 1.60E+03 1.63E+03
1.92E+03 1.67E+03 1.64E+03
2.05E+03 1.97E+03 1.84E+03
2.02E+03 1.92E+03 1.79E+03
1.95E+03 1.79E+03 1.71E+03
2.01E+03 2.03E+03 2.03E+03
1.91E+03 1.90E+03 1.89E+03
2.11E+03
1.14E+02
2.42E+03
1.79E+03
1.94E+03
1.25E+02
2.29E+03
1.60E+03
1.90E+03
9.31E+01
2.15E+03
1.64E+03
2.07E+03
2.04E+02
2.63E+03
1.51E+03
5.00E+02
PASS
1.94E+03
1.19E+02
2.26E+03
1.61E+03
2.50E+02
PASS
1.79E+03
1.56E+02
2.22E+03
1.36E+03
2.50E+02
PASS
An ISO 9001:2008 and DLA Certified Company
90
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.42. Plot of Large Signal Voltage Gain2_2 15V (V/mV) @ VS=+/-15V, VO=+/-10V, RL=2kΩ versus
total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
91
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.42. Raw data for Large Signal Voltage Gain2_2 15V (V/mV) @ VS=+/-15V, VO=+/-10V, RL=2kΩ
versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain2_2 15V (V/mV)
@ VS=+/-15V, VO=+/-10V, RL=2kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
1.60E+03
1.76E+03
1.66E+03
1.68E+03
1.65E+03
1.67E+03
1.81E+03
1.85E+03
1.80E+03
1.76E+03
2.15E+03
2.22E+03
24-hr
Anneal
225
1.75E+03
1.70E+03
1.74E+03
1.88E+03
1.82E+03
1.78E+03
1.72E+03
1.86E+03
1.97E+03
1.78E+03
2.09E+03
2.19E+03
168-hr
Anneal
250
1.93E+03
2.01E+03
2.04E+03
1.91E+03
1.88E+03
1.89E+03
1.99E+03
2.21E+03
2.05E+03
2.01E+03
2.07E+03
2.35E+03
1.79E+03
4.85E+01
1.92E+03
1.65E+03
1.67E+03
5.80E+01
1.83E+03
1.51E+03
1.78E+03
7.11E+01
1.97E+03
1.58E+03
1.95E+03
6.59E+01
2.13E+03
1.77E+03
1.95E+03
1.31E+02
2.31E+03
1.59E+03
2.50E+02
PASS
1.78E+03
6.86E+01
1.96E+03
1.59E+03
2.50E+02
PASS
1.82E+03
9.84E+01
2.09E+03
1.55E+03
2.50E+02
PASS
2.03E+03
1.15E+02
2.35E+03
1.71E+03
2.50E+02
PASS
0
2.30E+03
2.27E+03
2.15E+03
2.29E+03
2.21E+03
2.30E+03
2.24E+03
2.46E+03
2.23E+03
2.27E+03
2.11E+03
2.26E+03
Total Dose (krad(Si))
20
50
100
2.08E+03 1.67E+03 1.73E+03
2.00E+03 1.90E+03 1.79E+03
1.96E+03 1.87E+03 1.79E+03
2.02E+03 1.96E+03 1.86E+03
1.99E+03 1.93E+03 1.77E+03
2.14E+03 2.00E+03 1.88E+03
2.20E+03 2.17E+03 2.04E+03
2.24E+03 2.29E+03 2.10E+03
2.21E+03 2.12E+03 1.95E+03
2.20E+03 1.85E+03 1.77E+03
2.11E+03 2.12E+03 2.12E+03
2.29E+03 2.13E+03 2.13E+03
2.24E+03
6.13E+01
2.41E+03
2.07E+03
2.01E+03
4.55E+01
2.13E+03
1.88E+03
1.87E+03
1.13E+02
2.18E+03
1.56E+03
2.30E+03
9.23E+01
2.55E+03
2.04E+03
5.00E+02
PASS
2.20E+03
3.59E+01
2.30E+03
2.10E+03
2.50E+02
PASS
2.08E+03
1.66E+02
2.54E+03
1.63E+03
2.50E+02
PASS
An ISO 9001:2008 and DLA Certified Company
92
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.43. Plot of Common Mode Rejection Ratio1_1 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total
dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical
bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all
pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
93
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.43. Raw data for Common Mode Rejection Ratio1_1 15V (dB) @ VS=+/-15V, VCM=+/-15V versus
total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio1_1 15V (dB)
@ VS=+/-15V, VCM=+/-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
1.07E+02
1.04E+02
1.03E+02
1.01E+02
1.20E+02
1.14E+02
1.11E+02
9.93E+01
1.16E+02
1.19E+02
1.21E+02
1.03E+02
24-hr
Anneal
225
1.08E+02
1.04E+02
1.04E+02
1.02E+02
1.23E+02
1.15E+02
1.11E+02
9.94E+01
1.16E+02
1.20E+02
1.21E+02
1.03E+02
168-hr
Anneal
250
1.11E+02
1.04E+02
1.06E+02
1.02E+02
1.29E+02
1.17E+02
1.09E+02
1.00E+02
1.20E+02
1.24E+02
1.21E+02
1.03E+02
1.08E+02
9.19E+00
1.33E+02
8.29E+01
1.07E+02
7.56E+00
1.28E+02
8.62E+01
1.08E+02
8.79E+00
1.32E+02
8.40E+01
1.11E+02
1.10E+01
1.41E+02
8.05E+01
1.13E+02
8.55E+00
1.36E+02
8.94E+01
8.60E+01
PASS
1.12E+02
7.67E+00
1.33E+02
9.10E+01
8.60E+01
PASS
1.12E+02
7.88E+00
1.34E+02
9.07E+01
8.60E+01
PASS
1.14E+02
9.25E+00
1.39E+02
8.86E+01
8.60E+01
PASS
0
1.10E+02
1.04E+02
1.05E+02
1.01E+02
1.40E+02
1.29E+02
1.08E+02
1.00E+02
1.19E+02
1.40E+02
1.21E+02
1.03E+02
Total Dose (krad(Si))
20
50
100
1.09E+02 1.08E+02 1.08E+02
1.04E+02 1.04E+02 1.04E+02
1.04E+02 1.04E+02 1.04E+02
1.01E+02 1.01E+02 1.02E+02
1.38E+02 1.30E+02 1.24E+02
1.23E+02 1.19E+02 1.17E+02
1.08E+02 1.09E+02 1.10E+02
9.98E+01 9.97E+01 9.95E+01
1.18E+02 1.17E+02 1.17E+02
1.32E+02 1.24E+02 1.22E+02
1.21E+02 1.21E+02 1.21E+02
1.03E+02 1.03E+02 1.03E+02
1.12E+02
1.61E+01
1.56E+02
6.80E+01
1.11E+02
1.50E+01
1.52E+02
7.02E+01
1.09E+02
1.16E+01
1.41E+02
7.77E+01
1.19E+02
1.60E+01
1.63E+02
7.54E+01
9.00E+01
PASS
1.16E+02
1.25E+01
1.50E+02
8.17E+01
8.60E+01
PASS
1.14E+02
9.67E+00
1.40E+02
8.74E+01
8.60E+01
PASS
An ISO 9001:2008 and DLA Certified Company
94
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.44. Plot of Common Mode Rejection Ratio1_2 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total
dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical
bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all
pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
95
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.44. Raw data for Common Mode Rejection Ratio1_2 15V (dB) @ VS=+/-15V, VCM=+/-15V versus
total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio1_2 15V (dB)
@ VS=+/-15V, VCM=+/-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
1.08E+02
1.08E+02
1.02E+02
1.09E+02
1.01E+02
1.33E+02
1.13E+02
1.18E+02
1.22E+02
1.16E+02
1.17E+02
1.06E+02
24-hr
Anneal
225
1.09E+02
1.09E+02
1.03E+02
1.10E+02
1.01E+02
1.33E+02
1.13E+02
1.17E+02
1.20E+02
1.16E+02
1.17E+02
1.06E+02
168-hr
Anneal
250
1.10E+02
1.11E+02
1.03E+02
1.13E+02
1.02E+02
1.23E+02
1.16E+02
1.16E+02
1.17E+02
1.19E+02
1.17E+02
1.06E+02
1.07E+02
4.16E+00
1.18E+02
9.52E+01
1.06E+02
3.82E+00
1.16E+02
9.53E+01
1.06E+02
4.06E+00
1.17E+02
9.52E+01
1.08E+02
4.98E+00
1.21E+02
9.41E+01
1.23E+02
1.32E+01
1.59E+02
8.65E+01
8.60E+01
PASS
1.20E+02
7.79E+00
1.42E+02
9.90E+01
8.60E+01
PASS
1.20E+02
7.90E+00
1.42E+02
9.82E+01
8.60E+01
PASS
1.18E+02
3.10E+00
1.26E+02
1.09E+02
8.60E+01
PASS
0
1.11E+02
1.11E+02
1.04E+02
1.16E+02
1.03E+02
1.20E+02
1.20E+02
1.14E+02
1.15E+02
1.30E+02
1.17E+02
1.06E+02
Total Dose (krad(Si))
20
50
100
1.11E+02 1.10E+02 1.09E+02
1.11E+02 1.10E+02 1.09E+02
1.04E+02 1.03E+02 1.03E+02
1.14E+02 1.12E+02 1.11E+02
1.02E+02 1.02E+02 1.01E+02
1.22E+02 1.26E+02 1.46E+02
1.18E+02 1.16E+02 1.14E+02
1.15E+02 1.16E+02 1.16E+02
1.16E+02 1.17E+02 1.19E+02
1.26E+02 1.20E+02 1.18E+02
1.17E+02 1.17E+02 1.17E+02
1.06E+02 1.06E+02 1.06E+02
1.09E+02
5.66E+00
1.25E+02
9.35E+01
1.08E+02
5.10E+00
1.22E+02
9.42E+01
1.08E+02
4.60E+00
1.20E+02
9.49E+01
1.19E+02
6.33E+00
1.37E+02
1.02E+02
9.00E+01
PASS
1.19E+02
4.55E+00
1.31E+02
1.07E+02
8.60E+01
PASS
1.19E+02
4.47E+00
1.31E+02
1.07E+02
8.60E+01
PASS
An ISO 9001:2008 and DLA Certified Company
96
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.45. Plot of CMRR Match1 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
97
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.45. Raw data for CMRR Match1 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
CMRR Match1 15V (dB)
@ VS=+/-15V, VCM=+/-15V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
1.21E+02
1.11E+02
1.25E+02
1.06E+02
1.02E+02
1.15E+02
1.06E+02
9.83E+01
1.12E+02
1.28E+02
1.13E+02
1.15E+02
24-hr
Anneal
225
1.22E+02
1.12E+02
1.23E+02
1.05E+02
1.02E+02
1.16E+02
1.06E+02
9.82E+01
1.12E+02
1.26E+02
1.13E+02
1.15E+02
168-hr
Anneal
250
1.35E+02
1.09E+02
1.17E+02
1.05E+02
1.02E+02
1.14E+02
1.06E+02
9.88E+01
1.12E+02
1.27E+02
1.13E+02
1.15E+02
1.13E+02
9.78E+00
1.40E+02
8.60E+01
1.13E+02
9.63E+00
1.39E+02
8.64E+01
1.13E+02
9.33E+00
1.38E+02
8.71E+01
1.14E+02
1.31E+01
1.50E+02
7.76E+01
1.12E+02
1.09E+01
1.42E+02
8.19E+01
8.30E+01
PASS
1.12E+02
1.10E+01
1.42E+02
8.18E+01
8.30E+01
PASS
1.11E+02
1.04E+01
1.40E+02
8.29E+01
8.30E+01
PASS
1.11E+02
1.04E+01
1.40E+02
8.29E+01
8.30E+01
PASS
0
1.38E+02
1.10E+02
1.19E+02
1.03E+02
1.03E+02
1.17E+02
1.06E+02
9.86E+01
1.10E+02
1.33E+02
1.13E+02
1.15E+02
Total Dose (krad(Si))
20
50
100
1.25E+02 1.22E+02 1.22E+02
1.10E+02 1.11E+02 1.11E+02
1.20E+02 1.22E+02 1.24E+02
1.04E+02 1.04E+02 1.05E+02
1.02E+02 1.02E+02 1.02E+02
1.17E+02 1.16E+02 1.16E+02
1.06E+02 1.06E+02 1.06E+02
9.85E+01 9.85E+01 9.84E+01
1.11E+02 1.11E+02 1.12E+02
1.31E+02 1.28E+02 1.27E+02
1.13E+02 1.13E+02 1.13E+02
1.15E+02 1.15E+02 1.15E+02
1.14E+02
1.46E+01
1.54E+02
7.44E+01
1.12E+02
9.89E+00
1.39E+02
8.51E+01
1.12E+02
9.45E+00
1.38E+02
8.63E+01
1.13E+02
1.31E+01
1.49E+02
7.70E+01
8.40E+01
PASS
1.13E+02
1.23E+01
1.46E+02
7.87E+01
8.30E+01
PASS
1.12E+02
1.10E+01
1.42E+02
8.17E+01
8.30E+01
PASS
An ISO 9001:2008 and DLA Certified Company
98
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.46. Plot of Power Supply Rejection Ratio1_1 (dB) @ VS=+/-2V to +/-16V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
99
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.46. Raw data for Power Supply Rejection Ratio1_1 (dB) @ VS=+/-2V to +/-16V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio1_1 (dB)
@ VS=+/-2V to +/-16V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
1.26E+02
1.06E+02
1.06E+02
1.38E+02
1.14E+02
1.11E+02
1.17E+02
1.12E+02
1.13E+02
1.09E+02
1.30E+02
1.14E+02
24-hr
Anneal
225
1.25E+02
1.06E+02
1.06E+02
1.37E+02
1.14E+02
1.11E+02
1.17E+02
1.11E+02
1.13E+02
1.09E+02
1.30E+02
1.14E+02
168-hr
Anneal
250
1.22E+02
1.06E+02
1.06E+02
1.38E+02
1.14E+02
1.11E+02
1.17E+02
1.11E+02
1.13E+02
1.09E+02
1.30E+02
1.14E+02
1.17E+02
1.35E+01
1.54E+02
8.01E+01
1.18E+02
1.39E+01
1.56E+02
8.01E+01
1.18E+02
1.35E+01
1.54E+02
8.07E+01
1.17E+02
1.34E+01
1.54E+02
8.02E+01
1.12E+02
2.92E+00
1.20E+02
1.04E+02
9.00E+01
PASS
1.12E+02
2.92E+00
1.20E+02
1.04E+02
9.00E+01
PASS
1.12E+02
3.06E+00
1.21E+02
1.04E+02
9.00E+01
PASS
1.12E+02
3.03E+00
1.20E+02
1.04E+02
9.00E+01
PASS
0
1.20E+02
1.06E+02
1.06E+02
1.41E+02
1.14E+02
1.11E+02
1.17E+02
1.11E+02
1.12E+02
1.09E+02
1.30E+02
1.14E+02
Total Dose (krad(Si))
20
50
100
1.21E+02 1.22E+02 1.22E+02
1.06E+02 1.06E+02 1.06E+02
1.06E+02 1.06E+02 1.06E+02
1.40E+02 1.38E+02 1.38E+02
1.14E+02 1.14E+02 1.14E+02
1.11E+02 1.11E+02 1.11E+02
1.17E+02 1.17E+02 1.17E+02
1.11E+02 1.11E+02 1.11E+02
1.13E+02 1.13E+02 1.13E+02
1.09E+02 1.09E+02 1.09E+02
1.30E+02 1.30E+02 1.30E+02
1.14E+02 1.14E+02 1.14E+02
1.17E+02
1.44E+01
1.57E+02
7.76E+01
1.17E+02
1.41E+01
1.56E+02
7.85E+01
1.17E+02
1.34E+01
1.54E+02
8.02E+01
1.12E+02
3.02E+00
1.20E+02
1.04E+02
9.00E+01
PASS
1.12E+02
3.00E+00
1.20E+02
1.04E+02
9.00E+01
PASS
1.12E+02
3.01E+00
1.20E+02
1.04E+02
9.00E+01
PASS
An ISO 9001:2008 and DLA Certified Company
100
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.47. Plot of Power Supply Rejection Ratio1_2 (dB) @ VS=+/-2V to +/-16V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
101
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.47. Raw data for Power Supply Rejection Ratio1_2 (dB) @ VS=+/-2V to +/-16V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio1_2 (dB)
@ VS=+/-2V to +/-16V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
1.17E+02
1.16E+02
1.14E+02
1.11E+02
1.19E+02
1.16E+02
1.41E+02
1.11E+02
1.12E+02
1.12E+02
1.08E+02
1.21E+02
24-hr
Anneal
225
1.17E+02
1.16E+02
1.14E+02
1.11E+02
1.19E+02
1.16E+02
1.42E+02
1.11E+02
1.12E+02
1.12E+02
1.08E+02
1.22E+02
168-hr
Anneal
250
1.17E+02
1.16E+02
1.15E+02
1.11E+02
1.18E+02
1.15E+02
1.61E+02
1.11E+02
1.12E+02
1.12E+02
1.08E+02
1.21E+02
1.15E+02
2.93E+00
1.23E+02
1.07E+02
1.15E+02
3.17E+00
1.24E+02
1.07E+02
1.15E+02
3.01E+00
1.24E+02
1.07E+02
1.15E+02
2.84E+00
1.23E+02
1.07E+02
1.20E+02
1.70E+01
1.67E+02
7.36E+01
9.00E+01
PASS
1.18E+02
1.28E+01
1.54E+02
8.34E+01
9.00E+01
PASS
1.19E+02
1.33E+01
1.55E+02
8.23E+01
9.00E+01
PASS
1.22E+02
2.16E+01
1.81E+02
6.30E+01
9.00E+01
PASS
0
1.17E+02
1.16E+02
1.15E+02
1.10E+02
1.17E+02
1.15E+02
1.50E+02
1.11E+02
1.12E+02
1.12E+02
1.08E+02
1.21E+02
Total Dose (krad(Si))
20
50
100
1.17E+02 1.17E+02 1.17E+02
1.16E+02 1.16E+02 1.16E+02
1.15E+02 1.14E+02 1.14E+02
1.10E+02 1.11E+02 1.11E+02
1.18E+02 1.18E+02 1.18E+02
1.15E+02 1.15E+02 1.16E+02
1.58E+02 1.75E+02 1.51E+02
1.11E+02 1.11E+02 1.11E+02
1.12E+02 1.12E+02 1.12E+02
1.12E+02 1.12E+02 1.12E+02
1.08E+02 1.08E+02 1.08E+02
1.21E+02 1.21E+02 1.21E+02
1.15E+02
2.75E+00
1.22E+02
1.07E+02
1.15E+02
2.80E+00
1.23E+02
1.07E+02
1.15E+02
2.85E+00
1.23E+02
1.07E+02
1.20E+02
1.67E+01
1.66E+02
7.41E+01
9.00E+01
PASS
1.22E+02
2.06E+01
1.78E+02
6.53E+01
9.00E+01
PASS
1.25E+02
2.77E+01
2.01E+02
4.90E+01
9.00E+01
PASS
An ISO 9001:2008 and DLA Certified Company
102
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.48. Plot of PSRR Match1 15V (dB) @ VS=+/-2V to +/-16V versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
103
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.48. Raw data for PSRR Match1 15V (dB) @ VS=+/-2V to +/-16V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
PSRR Match1 15V (dB)
@ VS=+/-2V to +/-16V
Device
680
681
682
683
684
685
686
688
689
690
691
692
0
1.28E+02
1.09E+02
1.09E+02
1.11E+02
1.24E+02
1.07E+02
1.17E+02
1.44E+02
1.40E+02
1.21E+02
1.09E+02
1.11E+02
Biased Statistics
Average Biased
1.16E+02
Std Dev Biased
9.17E+00
Ps90%/90% (+KTL) Biased
1.41E+02
Ps90%/90% (-KTL) Biased
9.11E+01
Un-Biased Statistics
Average Un-Biased
1.26E+02
Std Dev Un-Biased
1.57E+01
Ps90%/90% (+KTL) Un-Biased 1.69E+02
Ps90%/90% (-KTL) Un-Biased
8.26E+01
Specification MIN
8.30E+01
Status
PASS
200
1.20E+02
1.09E+02
1.11E+02
1.11E+02
1.21E+02
1.07E+02
1.17E+02
1.41E+02
1.33E+02
1.21E+02
1.09E+02
1.11E+02
24-hr
Anneal
225
1.21E+02
1.09E+02
1.10E+02
1.11E+02
1.21E+02
1.07E+02
1.17E+02
1.45E+02
1.37E+02
1.21E+02
1.09E+02
1.11E+02
168-hr
Anneal
250
1.24E+02
1.09E+02
1.10E+02
1.11E+02
1.23E+02
1.07E+02
1.17E+02
1.44E+02
1.37E+02
1.21E+02
1.09E+02
1.11E+02
1.15E+02
7.00E+00
1.34E+02
9.59E+01
1.14E+02
5.52E+00
1.30E+02
9.93E+01
1.15E+02
5.97E+00
1.31E+02
9.82E+01
1.15E+02
7.38E+00
1.36E+02
9.51E+01
1.24E+02
1.37E+01
1.62E+02
8.64E+01
8.30E+01
PASS
1.24E+02
1.35E+01
1.60E+02
8.66E+01
8.30E+01
PASS
1.25E+02
1.57E+01
1.68E+02
8.24E+01
8.30E+01
PASS
1.25E+02
1.51E+01
1.67E+02
8.35E+01
8.30E+01
PASS
Total Dose (krad(Si))
20
50
100
1.26E+02 1.24E+02 1.24E+02
1.09E+02 1.09E+02 1.09E+02
1.10E+02 1.10E+02 1.10E+02
1.11E+02 1.11E+02 1.11E+02
1.23E+02 1.22E+02 1.22E+02
1.07E+02 1.07E+02 1.07E+02
1.17E+02 1.17E+02 1.17E+02
1.43E+02 1.40E+02 1.39E+02
1.41E+02 1.42E+02 1.38E+02
1.20E+02 1.21E+02 1.21E+02
1.09E+02 1.09E+02 1.09E+02
1.11E+02 1.11E+02 1.11E+02
1.16E+02
8.09E+00
1.38E+02
9.35E+01
1.15E+02
7.46E+00
1.36E+02
9.49E+01
1.25E+02
1.56E+01
1.68E+02
8.27E+01
8.30E+01
PASS
1.25E+02
1.52E+01
1.67E+02
8.36E+01
8.30E+01
PASS
An ISO 9001:2008 and DLA Certified Company
104
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.49. Plot of +Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
105
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.49. Raw data for +Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Short-Circuit Current1_1 15V (A)
@ VS=+/-15V, VOUT=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-2.99E-02
-2.94E-02
-3.19E-02
-2.94E-02
-3.18E-02
-2.95E-02
-2.97E-02
-3.56E-02
-3.11E-02
-3.01E-02
-3.03E-02
-3.02E-02
Total Dose (krad(Si))
20
50
100
-2.83E-02 -2.70E-02 -2.59E-02
-2.79E-02 -2.67E-02 -2.56E-02
-3.03E-02 -2.93E-02 -2.82E-02
-2.79E-02 -2.66E-02 -2.55E-02
-3.03E-02 -2.90E-02 -2.79E-02
-2.89E-02 -2.78E-02 -2.67E-02
-2.88E-02 -2.78E-02 -2.67E-02
-3.48E-02 -3.39E-02 -3.30E-02
-3.02E-02 -2.92E-02 -2.82E-02
-2.94E-02 -2.80E-02 -2.68E-02
-3.03E-02 -3.02E-02 -3.03E-02
-3.02E-02 -3.02E-02 -3.02E-02
200
-2.45E-02
-2.45E-02
-2.72E-02
-2.45E-02
-2.68E-02
-2.53E-02
-2.52E-02
-3.15E-02
-2.67E-02
-2.51E-02
-3.03E-02
-3.02E-02
24-hr
Anneal
225
-2.50E-02
-2.50E-02
-2.75E-02
-2.49E-02
-2.72E-02
-2.54E-02
-2.54E-02
-3.18E-02
-2.70E-02
-2.54E-02
-3.02E-02
-3.01E-02
168-hr
Anneal
250
-2.71E-02
-2.68E-02
-2.92E-02
-2.67E-02
-2.92E-02
-2.76E-02
-2.77E-02
-3.37E-02
-2.91E-02
-2.79E-02
-3.03E-02
-3.02E-02
-3.05E-02 -2.89E-02 -2.77E-02 -2.66E-02 -2.55E-02 -2.59E-02 -2.78E-02
1.27E-03 1.26E-03 1.32E-03 1.31E-03 1.37E-03 1.33E-03 1.30E-03
-2.70E-02 -2.55E-02 -2.41E-02 -2.30E-02 -2.17E-02 -2.22E-02 -2.42E-02
-3.40E-02 -3.24E-02 -3.13E-02 -3.02E-02 -2.93E-02 -2.95E-02 -3.14E-02
-3.12E-02
2.55E-03
-2.42E-02
-3.82E-02
-1.50E-02
PASS
-3.04E-02
2.50E-03
-2.36E-02
-3.73E-02
-1.00E-02
PASS
-2.93E-02
2.61E-03
-2.22E-02
-3.65E-02
-1.00E-02
PASS
-2.83E-02
2.70E-03
-2.09E-02
-3.57E-02
-1.00E-02
PASS
-2.68E-02
2.76E-03
-1.92E-02
-3.43E-02
-1.00E-02
PASS
An ISO 9001:2008 and DLA Certified Company
106
-2.70E-02
2.77E-03
-1.94E-02
-3.46E-02
-1.00E-02
PASS
-2.92E-02
2.57E-03
-2.21E-02
-3.62E-02
-1.00E-02
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.50. Plot of +Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
107
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.50. Raw data for +Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Short-Circuit Current1_2 15V (A)
@ VS=+/-15V, VOUT=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-3.04E-02
-3.06E-02
-3.25E-02
-3.01E-02
-3.21E-02
-3.07E-02
-3.01E-02
-3.64E-02
-3.21E-02
-3.09E-02
-3.06E-02
-3.11E-02
Total Dose (krad(Si))
20
50
100
-2.87E-02 -2.74E-02 -2.63E-02
-2.90E-02 -2.78E-02 -2.66E-02
-3.08E-02 -2.97E-02 -2.87E-02
-2.86E-02 -2.73E-02 -2.61E-02
-3.05E-02 -2.93E-02 -2.81E-02
-2.99E-02 -2.89E-02 -2.77E-02
-2.92E-02 -2.81E-02 -2.70E-02
-3.55E-02 -3.46E-02 -3.36E-02
-3.11E-02 -3.01E-02 -2.90E-02
-3.03E-02 -2.88E-02 -2.76E-02
-3.07E-02 -3.06E-02 -3.07E-02
-3.11E-02 -3.11E-02 -3.11E-02
200
-2.48E-02
-2.55E-02
-2.76E-02
-2.51E-02
-2.70E-02
-2.62E-02
-2.55E-02
-3.22E-02
-2.75E-02
-2.57E-02
-3.07E-02
-3.11E-02
24-hr
Anneal
225
-2.53E-02
-2.59E-02
-2.80E-02
-2.55E-02
-2.74E-02
-2.63E-02
-2.57E-02
-3.24E-02
-2.78E-02
-2.60E-02
-3.05E-02
-3.09E-02
168-hr
Anneal
250
-2.75E-02
-2.78E-02
-2.98E-02
-2.74E-02
-2.94E-02
-2.86E-02
-2.80E-02
-3.43E-02
-3.00E-02
-2.87E-02
-3.06E-02
-3.11E-02
-3.11E-02 -2.95E-02 -2.83E-02 -2.72E-02 -2.60E-02 -2.64E-02 -2.84E-02
1.08E-03 1.07E-03 1.13E-03 1.16E-03 1.24E-03 1.19E-03 1.12E-03
-2.82E-02 -2.66E-02 -2.52E-02 -2.40E-02 -2.26E-02 -2.31E-02 -2.53E-02
-3.41E-02 -3.25E-02 -3.14E-02 -3.03E-02 -2.94E-02 -2.97E-02 -3.15E-02
-3.20E-02
2.54E-03
-2.50E-02
-3.90E-02
-1.50E-02
PASS
-3.12E-02
2.49E-03
-2.44E-02
-3.80E-02
-1.00E-02
PASS
-3.01E-02
2.61E-03
-2.29E-02
-3.72E-02
-1.00E-02
PASS
-2.90E-02
2.71E-03
-2.16E-02
-3.64E-02
-1.00E-02
PASS
-2.74E-02
2.77E-03
-1.98E-02
-3.50E-02
-1.00E-02
PASS
An ISO 9001:2008 and DLA Certified Company
108
-2.76E-02
2.78E-03
-2.00E-02
-3.53E-02
-1.00E-02
PASS
-2.99E-02
2.57E-03
-2.29E-02
-3.70E-02
-1.00E-02
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.51. Plot of -Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
109
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.51. Raw data for -Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
-Short-Circuit Current1_1 15V (A)
24-hr
168-hr
@ VS=+/-15V, VOUT=0V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 5.12E-02 5.08E-02 5.06E-02 5.00E-02 4.99E-02 5.03E-02 5.05E-02
681 5.10E-02 5.05E-02 5.04E-02 5.01E-02 4.99E-02 5.02E-02 5.03E-02
682 5.13E-02 5.09E-02 5.06E-02 5.04E-02 5.01E-02 5.04E-02 5.06E-02
683 5.14E-02 5.10E-02 5.08E-02 5.06E-02 5.01E-02 5.06E-02 5.07E-02
684 5.07E-02 5.02E-02 5.00E-02 4.98E-02 4.94E-02 4.98E-02 5.00E-02
685 5.07E-02 5.03E-02 5.02E-02 5.00E-02 4.95E-02 5.00E-02 5.02E-02
686 5.08E-02 5.06E-02 5.04E-02 5.02E-02 4.96E-02 5.00E-02 5.04E-02
688 5.53E-02 5.51E-02 5.50E-02 5.46E-02 5.43E-02 5.45E-02 5.49E-02
689 5.16E-02 5.14E-02 5.12E-02 5.08E-02 5.05E-02 5.08E-02 5.11E-02
690 5.15E-02 5.08E-02 5.09E-02 5.05E-02 5.02E-02 5.05E-02 5.09E-02
691 5.14E-02 5.13E-02 5.14E-02 5.13E-02 5.14E-02 5.16E-02 5.14E-02
692 5.04E-02 5.04E-02 5.05E-02 5.05E-02 5.04E-02 5.06E-02 5.05E-02
Biased Statistics
Average Biased
5.11E-02 5.07E-02 5.05E-02 5.02E-02 4.99E-02 5.03E-02 5.04E-02
Std Dev Biased
2.76E-04 3.12E-04 2.99E-04 2.81E-04 2.72E-04 2.80E-04 2.97E-04
Ps90%/90% (+KTL) Biased
5.19E-02 5.15E-02 5.13E-02 5.09E-02 5.06E-02 5.10E-02 5.12E-02
Ps90%/90% (-KTL) Biased
5.04E-02 4.98E-02 4.96E-02 4.94E-02 4.91E-02 4.95E-02 4.96E-02
Un-Biased Statistics
Average Un-Biased
5.19E-02 5.17E-02 5.15E-02 5.12E-02 5.08E-02 5.11E-02 5.15E-02
Std Dev Un-Biased
1.89E-03 1.99E-03 1.96E-03 1.93E-03 1.97E-03 1.90E-03 1.94E-03
Ps90%/90% (+KTL) Un-Biased
5.71E-02 5.71E-02 5.69E-02 5.65E-02 5.62E-02 5.64E-02 5.69E-02
Ps90%/90% (-KTL) Un-Biased
4.68E-02 4.62E-02 4.62E-02 4.59E-02 4.54E-02 4.59E-02 4.62E-02
Specification MIN
1.50E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
110
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.52. Plot of -Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
111
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.52. Raw data for -Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
-Short-Circuit Current1_2 15V (A)
24-hr
168-hr
@ VS=+/-15V, VOUT=0V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.93E-02 4.89E-02 4.88E-02 4.83E-02 4.81E-02 4.85E-02 4.87E-02
681 4.91E-02 4.86E-02 4.85E-02 4.82E-02 4.80E-02 4.83E-02 4.84E-02
682 4.92E-02 4.88E-02 4.86E-02 4.84E-02 4.81E-02 4.84E-02 4.86E-02
683 4.95E-02 4.90E-02 4.88E-02 4.86E-02 4.82E-02 4.86E-02 4.88E-02
684 4.89E-02 4.83E-02 4.81E-02 4.80E-02 4.75E-02 4.80E-02 4.81E-02
685 4.88E-02 4.84E-02 4.83E-02 4.81E-02 4.76E-02 4.81E-02 4.84E-02
686 4.90E-02 4.89E-02 4.87E-02 4.85E-02 4.79E-02 4.83E-02 4.87E-02
688 5.33E-02 5.31E-02 5.30E-02 5.27E-02 5.23E-02 5.26E-02 5.30E-02
689 4.97E-02 4.95E-02 4.94E-02 4.90E-02 4.87E-02 4.89E-02 4.92E-02
690 4.93E-02 4.87E-02 4.88E-02 4.85E-02 4.80E-02 4.84E-02 4.89E-02
691 4.98E-02 4.97E-02 4.98E-02 4.97E-02 4.97E-02 5.00E-02 4.98E-02
692 4.87E-02 4.87E-02 4.87E-02 4.87E-02 4.87E-02 4.90E-02 4.88E-02
Biased Statistics
Average Biased
4.92E-02 4.87E-02 4.86E-02 4.83E-02 4.80E-02 4.84E-02 4.85E-02
Std Dev Biased
2.31E-04 2.84E-04 2.69E-04 2.31E-04 2.65E-04 2.42E-04 2.69E-04
Ps90%/90% (+KTL) Biased
4.98E-02 4.95E-02 4.93E-02 4.89E-02 4.87E-02 4.90E-02 4.92E-02
Ps90%/90% (-KTL) Biased
4.86E-02 4.80E-02 4.78E-02 4.77E-02 4.73E-02 4.77E-02 4.78E-02
Un-Biased Statistics
Average Un-Biased
5.00E-02 4.97E-02 4.96E-02 4.93E-02 4.89E-02 4.93E-02 4.96E-02
Std Dev Un-Biased
1.87E-03 1.93E-03 1.91E-03 1.90E-03 1.94E-03 1.86E-03 1.90E-03
Ps90%/90% (+KTL) Un-Biased
5.52E-02 5.50E-02 5.49E-02 5.45E-02 5.43E-02 5.44E-02 5.48E-02
Ps90%/90% (-KTL) Un-Biased
4.49E-02 4.44E-02 4.44E-02 4.41E-02 4.36E-02 4.42E-02 4.44E-02
Specification MIN
1.50E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
112
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.53. Plot of Gain-Bandwidth Product1_1 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
113
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.53. Raw data for Gain-Bandwidth Product1_1 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Gain-Bandwidth Product1_1 15V (MHz)
@ VS=+/-15V, f=100kHz
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.35E+01
1.33E+01
1.40E+01
1.29E+01
1.36E+01
1.29E+01
1.32E+01
1.38E+01
1.31E+01
1.34E+01
1.34E+01
1.32E+01
Total Dose (krad(Si))
20
50
100
1.32E+01 1.30E+01 1.28E+01
1.30E+01 1.28E+01 1.26E+01
1.38E+01 1.36E+01 1.34E+01
1.26E+01 1.24E+01 1.22E+01
1.33E+01 1.31E+01 1.29E+01
1.28E+01 1.27E+01 1.25E+01
1.31E+01 1.30E+01 1.28E+01
1.37E+01 1.36E+01 1.35E+01
1.30E+01 1.28E+01 1.27E+01
1.32E+01 1.31E+01 1.29E+01
1.35E+01 1.34E+01 1.35E+01
1.32E+01 1.32E+01 1.32E+01
200
1.25E+01
1.24E+01
1.33E+01
1.20E+01
1.27E+01
1.23E+01
1.26E+01
1.34E+01
1.25E+01
1.26E+01
1.35E+01
1.32E+01
24-hr
Anneal
225
1.26E+01
1.25E+01
1.33E+01
1.21E+01
1.28E+01
1.24E+01
1.27E+01
1.34E+01
1.25E+01
1.27E+01
1.34E+01
1.33E+01
168-hr
Anneal
250
1.30E+01
1.28E+01
1.35E+01
1.24E+01
1.31E+01
1.26E+01
1.30E+01
1.36E+01
1.28E+01
1.31E+01
1.35E+01
1.33E+01
1.35E+01 1.32E+01 1.30E+01 1.28E+01 1.26E+01 1.26E+01 1.29E+01
4.15E-01 4.21E-01 4.30E-01 4.54E-01 4.65E-01 4.58E-01 4.28E-01
1.46E+01 1.43E+01 1.42E+01 1.40E+01 1.39E+01 1.39E+01 1.41E+01
1.23E+01 1.20E+01 1.18E+01 1.15E+01 1.13E+01 1.14E+01 1.18E+01
1.33E+01
3.30E-01
1.42E+01
1.24E+01
6.80E+00
PASS
1.32E+01
3.50E-01
1.41E+01
1.22E+01
4.50E+00
PASS
1.30E+01
3.56E-01
1.40E+01
1.21E+01
4.50E+00
PASS
1.29E+01
3.77E-01
1.39E+01
1.19E+01
4.50E+00
PASS
An ISO 9001:2008 and DLA Certified Company
114
1.27E+01
4.07E-01
1.38E+01
1.15E+01
4.50E+00
PASS
1.27E+01
3.89E-01
1.38E+01
1.17E+01
4.50E+00
PASS
1.30E+01
3.49E-01
1.40E+01
1.20E+01
4.50E+00
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.54. Plot of Gain-Bandwidth Product1_2 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
115
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.54. Raw data for Gain-Bandwidth Product1_2 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Gain-Bandwidth Product1_2 15V (MHz)
@ VS=+/-15V, f=100kHz
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.33E+01
1.33E+01
1.40E+01
1.28E+01
1.36E+01
1.29E+01
1.32E+01
1.40E+01
1.30E+01
1.34E+01
1.34E+01
1.33E+01
Total Dose (krad(Si))
20
50
100
1.31E+01 1.28E+01 1.26E+01
1.30E+01 1.28E+01 1.26E+01
1.37E+01 1.35E+01 1.34E+01
1.26E+01 1.24E+01 1.21E+01
1.33E+01 1.32E+01 1.30E+01
1.28E+01 1.27E+01 1.25E+01
1.31E+01 1.30E+01 1.28E+01
1.39E+01 1.38E+01 1.37E+01
1.29E+01 1.28E+01 1.27E+01
1.33E+01 1.31E+01 1.29E+01
1.34E+01 1.34E+01 1.34E+01
1.33E+01 1.33E+01 1.33E+01
200
1.23E+01
1.24E+01
1.32E+01
1.19E+01
1.28E+01
1.23E+01
1.25E+01
1.36E+01
1.25E+01
1.27E+01
1.33E+01
1.33E+01
24-hr
Anneal
225
1.24E+01
1.24E+01
1.32E+01
1.20E+01
1.28E+01
1.23E+01
1.26E+01
1.36E+01
1.25E+01
1.27E+01
1.34E+01
1.33E+01
168-hr
Anneal
250
1.28E+01
1.27E+01
1.35E+01
1.23E+01
1.31E+01
1.26E+01
1.29E+01
1.38E+01
1.28E+01
1.31E+01
1.33E+01
1.33E+01
1.34E+01 1.31E+01 1.29E+01 1.27E+01 1.25E+01 1.26E+01 1.29E+01
4.24E-01 4.27E-01 4.38E-01 4.62E-01 4.86E-01 4.65E-01 4.49E-01
1.45E+01 1.43E+01 1.41E+01 1.40E+01 1.39E+01 1.39E+01 1.41E+01
1.22E+01 1.20E+01 1.17E+01 1.15E+01 1.12E+01 1.13E+01 1.16E+01
1.33E+01
4.34E-01
1.45E+01
1.21E+01
6.80E+00
PASS
1.32E+01
4.36E-01
1.44E+01
1.20E+01
4.50E+00
PASS
1.31E+01
4.54E-01
1.43E+01
1.18E+01
4.50E+00
PASS
1.29E+01
4.71E-01
1.42E+01
1.16E+01
4.50E+00
PASS
An ISO 9001:2008 and DLA Certified Company
116
1.27E+01
5.07E-01
1.41E+01
1.13E+01
4.50E+00
PASS
1.28E+01
4.96E-01
1.41E+01
1.14E+01
4.50E+00
PASS
1.30E+01
4.56E-01
1.43E+01
1.18E+01
4.50E+00
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.55. Plot of +Slew Rate1_1 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
117
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.55. Raw data for +Slew Rate1_1 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Slew Rate1_1 15V (V/µs)
@ VS=+/-15V, AV=1, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
5.88E+00
5.74E+00
6.32E+00
5.77E+00
6.07E+00
5.60E+00
5.81E+00
6.23E+00
5.86E+00
6.09E+00
5.91E+00
5.83E+00
Total Dose (krad(Si))
20
50
100
5.79E+00 5.65E+00 5.47E+00
5.73E+00 5.60E+00 5.54E+00
6.11E+00 6.11E+00 6.01E+00
5.56E+00 5.39E+00 5.29E+00
5.97E+00 5.67E+00 5.65E+00
5.60E+00 5.54E+00 5.44E+00
5.61E+00 5.74E+00 5.55E+00
6.30E+00 6.22E+00 6.12E+00
5.51E+00 5.62E+00 5.53E+00
5.98E+00 5.77E+00 5.67E+00
5.84E+00 5.89E+00 5.90E+00
5.87E+00 5.88E+00 5.87E+00
200
5.26E+00
5.35E+00
5.75E+00
5.07E+00
5.53E+00
5.31E+00
5.33E+00
6.13E+00
5.36E+00
5.47E+00
6.01E+00
5.98E+00
24-hr
Anneal
225
5.39E+00
5.37E+00
5.88E+00
5.15E+00
5.66E+00
5.35E+00
5.50E+00
6.12E+00
5.45E+00
5.54E+00
5.86E+00
5.89E+00
168-hr
Anneal
250
5.63E+00
5.53E+00
5.85E+00
5.35E+00
5.86E+00
5.53E+00
5.62E+00
6.17E+00
5.59E+00
5.78E+00
6.00E+00
5.79E+00
5.96E+00 5.83E+00 5.68E+00 5.59E+00 5.39E+00 5.49E+00 5.64E+00
2.41E-01 2.14E-01 2.63E-01 2.68E-01 2.60E-01 2.83E-01 2.17E-01
6.62E+00 6.42E+00 6.40E+00 6.33E+00 6.10E+00 6.27E+00 6.24E+00
5.29E+00 5.25E+00 4.96E+00 4.86E+00 4.68E+00 4.71E+00 5.05E+00
5.92E+00
2.47E-01
6.59E+00
5.24E+00
3.50E+00
PASS
5.80E+00
3.33E-01
6.71E+00
4.89E+00
3.00E+00
PASS
5.78E+00
2.64E-01
6.50E+00
5.05E+00
3.00E+00
PASS
5.66E+00
2.69E-01
6.40E+00
4.92E+00
3.00E+00
PASS
5.52E+00
3.47E-01
6.47E+00
4.57E+00
3.00E+00
PASS
An ISO 9001:2008 and DLA Certified Company
118
5.59E+00
3.04E-01
6.42E+00
4.76E+00
3.00E+00
PASS
5.74E+00
2.59E-01
6.45E+00
5.03E+00
3.00E+00
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.56. Plot of +Slew Rate1_2 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
119
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.56. Raw data for +Slew Rate1_2 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Slew Rate1_2 15V (V/µs)
@ VS=+/-15V, AV=1, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
6.07E+00
5.82E+00
6.38E+00
5.74E+00
6.28E+00
5.72E+00
5.86E+00
6.53E+00
5.77E+00
6.09E+00
5.91E+00
5.98E+00
Total Dose (krad(Si))
20
50
100
5.97E+00 5.73E+00 5.55E+00
5.79E+00 5.78E+00 5.62E+00
6.20E+00 6.21E+00 6.03E+00
5.64E+00 5.44E+00 5.38E+00
6.05E+00 5.80E+00 5.90E+00
5.79E+00 5.63E+00 5.55E+00
5.82E+00 5.76E+00 5.78E+00
6.58E+00 6.36E+00 6.38E+00
5.81E+00 5.83E+00 5.60E+00
5.95E+00 5.83E+00 5.74E+00
5.88E+00 6.00E+00 5.98E+00
6.08E+00 6.01E+00 5.93E+00
200
5.47E+00
5.50E+00
6.00E+00
5.18E+00
5.78E+00
5.48E+00
5.64E+00
6.37E+00
5.53E+00
5.52E+00
5.95E+00
5.96E+00
24-hr
Anneal
225
5.47E+00
5.44E+00
6.03E+00
5.23E+00
5.73E+00
5.47E+00
5.69E+00
6.40E+00
5.60E+00
5.69E+00
5.93E+00
5.99E+00
168-hr
Anneal
250
5.72E+00
5.66E+00
6.13E+00
5.38E+00
6.01E+00
5.61E+00
5.89E+00
6.54E+00
5.75E+00
5.78E+00
6.04E+00
6.05E+00
6.06E+00 5.93E+00 5.79E+00 5.70E+00 5.59E+00 5.58E+00 5.78E+00
2.79E-01 2.19E-01 2.75E-01 2.65E-01 3.14E-01 3.08E-01 2.97E-01
6.82E+00 6.53E+00 6.55E+00 6.42E+00 6.45E+00 6.42E+00 6.60E+00
5.29E+00 5.33E+00 5.04E+00 4.97E+00 4.72E+00 4.74E+00 4.96E+00
5.99E+00
3.32E-01
6.90E+00
5.08E+00
3.50E+00
PASS
5.99E+00
3.36E-01
6.91E+00
5.07E+00
3.00E+00
PASS
5.88E+00
2.79E-01
6.65E+00
5.12E+00
3.00E+00
PASS
5.81E+00
3.33E-01
6.72E+00
4.90E+00
3.00E+00
PASS
5.71E+00
3.75E-01
6.74E+00
4.68E+00
3.00E+00
PASS
An ISO 9001:2008 and DLA Certified Company
120
5.77E+00
3.64E-01
6.77E+00
4.77E+00
3.00E+00
PASS
5.91E+00
3.64E-01
6.91E+00
4.92E+00
3.00E+00
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.57. Plot of -Slew Rate1_1 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
121
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.57. Raw data for -Slew Rate1_1 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
-Slew Rate1_1 15V (V/µs)
@ VS=+/-15V, AV=1, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-5.69E+00
-5.48E+00
-5.99E+00
-5.20E+00
-5.68E+00
-5.30E+00
-5.50E+00
-5.88E+00
-5.40E+00
-5.57E+00
-5.50E+00
-5.40E+00
Total Dose (krad(Si))
20
50
100
-5.45E+00 -5.25E+00 -5.24E+00
-5.17E+00 -5.18E+00 -5.00E+00
-5.72E+00 -5.63E+00 -5.59E+00
-5.13E+00 -4.95E+00 -4.86E+00
-5.45E+00 -5.43E+00 -5.32E+00
-5.17E+00 -5.07E+00 -5.11E+00
-5.36E+00 -5.35E+00 -5.20E+00
-5.78E+00 -5.84E+00 -5.67E+00
-5.30E+00 -5.23E+00 -5.11E+00
-5.52E+00 -5.32E+00 -5.30E+00
-5.61E+00 -5.50E+00 -5.53E+00
-5.47E+00 -5.49E+00 -5.42E+00
200
-4.97E+00
-5.01E+00
-5.56E+00
-4.70E+00
-5.20E+00
-4.91E+00
-4.96E+00
-5.65E+00
-5.10E+00
-4.99E+00
-5.58E+00
-5.46E+00
24-hr
Anneal
225
-5.06E+00
-4.94E+00
-5.54E+00
-4.82E+00
-5.08E+00
-4.88E+00
-5.11E+00
-5.69E+00
-5.03E+00
-5.12E+00
-5.55E+00
-5.44E+00
168-hr
Anneal
250
-5.26E+00
-5.04E+00
-5.64E+00
-4.90E+00
-5.37E+00
-5.10E+00
-5.34E+00
-5.69E+00
-5.23E+00
-5.30E+00
-5.54E+00
-5.44E+00
-5.61E+00 -5.38E+00 -5.29E+00 -5.20E+00 -5.09E+00 -5.09E+00 -5.24E+00
2.92E-01 2.41E-01 2.57E-01 2.84E-01 3.19E-01 2.73E-01 2.88E-01
-4.81E+00 -4.72E+00 -4.58E+00 -4.42E+00 -4.21E+00 -4.34E+00 -4.45E+00
-6.41E+00 -6.04E+00 -5.99E+00 -5.98E+00 -5.96E+00 -5.84E+00 -6.03E+00
-5.53E+00
2.21E-01
-4.92E+00
-6.14E+00
-3.50E+00
PASS
-5.43E+00
2.34E-01
-4.78E+00
-6.07E+00
-3.00E+00
PASS
-5.36E+00
2.89E-01
-4.57E+00
-6.15E+00
-3.00E+00
PASS
-5.28E+00
2.33E-01
-4.64E+00
-5.92E+00
-3.00E+00
PASS
-5.12E+00
3.03E-01
-4.29E+00
-5.95E+00
-3.00E+00
PASS
An ISO 9001:2008 and DLA Certified Company
122
-5.17E+00
3.08E-01
-4.32E+00
-6.01E+00
-3.00E+00
PASS
-5.33E+00
2.20E-01
-4.73E+00
-5.94E+00
-3.00E+00
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.58. Plot of -Slew Rate1_2 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
123
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.58. Raw data for -Slew Rate1_2 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
-Slew Rate1_2 15V (V/µs)
@ VS=+/-15V, AV=1, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-5.73E+00
-5.61E+00
-6.05E+00
-5.36E+00
-5.68E+00
-5.37E+00
-5.58E+00
-6.12E+00
-5.47E+00
-5.70E+00
-5.60E+00
-5.74E+00
Total Dose (krad(Si))
20
50
100
-5.41E+00 -5.24E+00 -5.25E+00
-5.50E+00 -5.28E+00 -5.10E+00
-5.83E+00 -5.74E+00 -5.60E+00
-5.22E+00 -5.09E+00 -4.94E+00
-5.50E+00 -5.52E+00 -5.45E+00
-5.28E+00 -5.26E+00 -5.29E+00
-5.57E+00 -5.42E+00 -5.24E+00
-6.04E+00 -6.05E+00 -5.99E+00
-5.35E+00 -5.39E+00 -5.31E+00
-5.70E+00 -5.56E+00 -5.41E+00
-5.57E+00 -5.65E+00 -5.63E+00
-5.67E+00 -5.70E+00 -5.66E+00
200
-5.07E+00
-5.10E+00
-5.54E+00
-4.78E+00
-5.24E+00
-5.14E+00
-5.23E+00
-5.98E+00
-5.13E+00
-5.15E+00
-5.65E+00
-5.73E+00
24-hr
Anneal
225
-4.99E+00
-5.16E+00
-5.63E+00
-4.98E+00
-5.29E+00
-5.12E+00
-5.19E+00
-6.10E+00
-5.24E+00
-5.26E+00
-5.64E+00
-5.63E+00
168-hr
Anneal
250
-5.24E+00
-5.22E+00
-5.69E+00
-5.20E+00
-5.57E+00
-5.24E+00
-5.40E+00
-5.98E+00
-5.32E+00
-5.55E+00
-5.60E+00
-5.61E+00
-5.69E+00 -5.49E+00 -5.37E+00 -5.27E+00 -5.15E+00 -5.21E+00 -5.38E+00
2.48E-01 2.21E-01 2.56E-01 2.64E-01 2.77E-01 2.68E-01 2.29E-01
-5.01E+00 -4.89E+00 -4.67E+00 -4.54E+00 -4.39E+00 -4.48E+00 -4.76E+00
-6.37E+00 -6.10E+00 -6.08E+00 -5.99E+00 -5.90E+00 -5.94E+00 -6.01E+00
-5.65E+00
2.91E-01
-4.85E+00
-6.45E+00
-3.50E+00
PASS
-5.59E+00
3.04E-01
-4.76E+00
-6.42E+00
-3.00E+00
PASS
-5.54E+00
3.06E-01
-4.70E+00
-6.38E+00
-3.00E+00
PASS
-5.45E+00
3.09E-01
-4.60E+00
-6.30E+00
-3.00E+00
PASS
-5.33E+00
3.68E-01
-4.32E+00
-6.33E+00
-3.00E+00
PASS
An ISO 9001:2008 and DLA Certified Company
124
-5.38E+00
4.05E-01
-4.27E+00
-6.49E+00
-3.00E+00
PASS
-5.50E+00
2.93E-01
-4.70E+00
-6.30E+00
-3.00E+00
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.59. Plot of +Supply Current 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence
limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s)
are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DLA Certified Company
125
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.59. Raw data for +Supply Current 5V (A) @ VS=+5V versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+Supply Current 5V (A)
@ VS=+5V
Device
680
681
682
683
684
685
686
688
689
690
691
692
0
3.57E-03
3.54E-03
3.67E-03
3.56E-03
3.62E-03
3.50E-03
3.52E-03
3.76E-03
3.55E-03
3.57E-03
3.57E-03
3.55E-03
Total Dose (krad(Si))
20
50
100
3.50E-03 3.43E-03 3.40E-03
3.47E-03 3.41E-03 3.36E-03
3.61E-03 3.55E-03 3.50E-03
3.50E-03 3.45E-03 3.39E-03
3.56E-03 3.50E-03 3.45E-03
3.48E-03 3.44E-03 3.38E-03
3.49E-03 3.44E-03 3.40E-03
3.74E-03 3.71E-03 3.68E-03
3.53E-03 3.49E-03 3.45E-03
3.58E-03 3.49E-03 3.44E-03
3.57E-03 3.57E-03 3.57E-03
3.56E-03 3.55E-03 3.56E-03
200
3.28E-03
3.28E-03
3.44E-03
3.34E-03
3.39E-03
3.32E-03
3.32E-03
3.63E-03
3.38E-03
3.35E-03
3.57E-03
3.56E-03
24-hr
Anneal
225
3.31E-03
3.31E-03
3.45E-03
3.35E-03
3.40E-03
3.34E-03
3.35E-03
3.65E-03
3.41E-03
3.38E-03
3.57E-03
3.55E-03
168-hr
Anneal
250
3.43E-03
3.41E-03
3.54E-03
3.44E-03
3.50E-03
3.42E-03
3.44E-03
3.70E-03
3.48E-03
3.49E-03
3.57E-03
3.56E-03
Biased Statistics
Average Biased
3.59E-03 3.53E-03 3.47E-03 3.42E-03 3.34E-03 3.36E-03 3.46E-03
Std Dev Biased
5.39E-05 5.33E-05 5.85E-05 5.55E-05 6.82E-05 6.32E-05 5.52E-05
Ps90%/90% (+KTL) Biased
3.74E-03 3.67E-03 3.63E-03 3.57E-03 3.53E-03 3.54E-03 3.61E-03
Ps90%/90% (-KTL) Biased
3.44E-03 3.38E-03 3.31E-03 3.27E-03 3.16E-03 3.19E-03 3.31E-03
Un-Biased Statistics
Average Un-Biased
3.58E-03 3.56E-03 3.51E-03 3.47E-03 3.40E-03 3.42E-03 3.51E-03
Std Dev Un-Biased
1.03E-04 1.07E-04 1.13E-04 1.20E-04 1.30E-04 1.29E-04 1.13E-04
Ps90%/90% (+KTL) Un-Biased
3.86E-03 3.85E-03 3.82E-03 3.80E-03 3.76E-03 3.78E-03 3.82E-03
Ps90%/90% (-KTL) Un-Biased
3.30E-03 3.27E-03 3.20E-03 3.14E-03 3.04E-03 3.07E-03 3.20E-03
Specification MAX
4.40E-03 4.40E-03 4.40E-03 4.40E-03 4.40E-03 4.40E-03 4.40E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
126
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.60. Plot of -Supply Current 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence
limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s)
are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DLA Certified Company
127
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.60. Raw data for -Supply Current 5V (A) @ VS=+5V versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-Supply Current 5V (A)
@ VS=+5V
Device
680
681
682
683
684
685
686
688
689
690
691
692
0
-3.59E-03
-3.56E-03
-3.69E-03
-3.58E-03
-3.64E-03
-3.52E-03
-3.54E-03
-3.77E-03
-3.57E-03
-3.59E-03
-3.58E-03
-3.57E-03
Biased Statistics
Average Biased
-3.61E-03
Std Dev Biased
5.17E-05
Ps90%/90% (+KTL) Biased
-3.47E-03
Ps90%/90% (-KTL) Biased
-3.75E-03
Un-Biased Statistics
Average Un-Biased
-3.60E-03
Std Dev Un-Biased
1.03E-04
Ps90%/90% (+KTL) Un-Biased -3.32E-03
Ps90%/90% (-KTL) Un-Biased
-3.88E-03
Specification MIN
-4.40E-03
Status
PASS
Total Dose (krad(Si))
20
50
100
-3.51E-03 -3.43E-03 -3.41E-03
-3.48E-03 -3.42E-03 -3.37E-03
-3.61E-03 -3.56E-03 -3.51E-03
-3.51E-03 -3.45E-03 -3.40E-03
-3.57E-03 -3.51E-03 -3.45E-03
-3.48E-03 -3.44E-03 -3.39E-03
-3.49E-03 -3.45E-03 -3.40E-03
-3.74E-03 -3.71E-03 -3.69E-03
-3.53E-03 -3.49E-03 -3.46E-03
-3.58E-03 -3.50E-03 -3.45E-03
-3.58E-03 -3.57E-03 -3.58E-03
-3.56E-03 -3.56E-03 -3.56E-03
200
-3.28E-03
-3.29E-03
-3.45E-03
-3.34E-03
-3.39E-03
-3.33E-03
-3.33E-03
-3.64E-03
-3.39E-03
-3.35E-03
-3.58E-03
-3.56E-03
24-hr
Anneal
225
-3.31E-03
-3.31E-03
-3.46E-03
-3.35E-03
-3.41E-03
-3.34E-03
-3.35E-03
-3.65E-03
-3.41E-03
-3.38E-03
-3.57E-03
-3.56E-03
168-hr
Anneal
250
-3.43E-03
-3.41E-03
-3.55E-03
-3.45E-03
-3.50E-03
-3.43E-03
-3.45E-03
-3.71E-03
-3.49E-03
-3.49E-03
-3.58E-03
-3.56E-03
-3.53E-03 -3.47E-03 -3.43E-03 -3.35E-03 -3.37E-03 -3.47E-03
5.36E-05 5.76E-05 5.54E-05 6.78E-05 6.49E-05 5.55E-05
-3.39E-03 -3.31E-03 -3.28E-03 -3.16E-03 -3.19E-03 -3.32E-03
-3.68E-03 -3.63E-03 -3.58E-03 -3.54E-03 -3.55E-03 -3.62E-03
-3.57E-03
1.06E-04
-3.28E-03
-3.86E-03
-4.40E-03
PASS
-3.52E-03
1.12E-04
-3.21E-03
-3.83E-03
-4.40E-03
PASS
-3.48E-03
1.20E-04
-3.15E-03
-3.81E-03
-4.40E-03
PASS
-3.41E-03
1.32E-04
-3.05E-03
-3.77E-03
-4.40E-03
PASS
An ISO 9001:2008 and DLA Certified Company
128
-3.43E-03
1.29E-04
-3.08E-03
-3.78E-03
-4.40E-03
PASS
-3.51E-03
1.13E-04
-3.20E-03
-3.82E-03
-4.40E-03
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.61. Plot of Input Offset Voltage1_1 5V (V) @ VS=+5V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
129
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.61. Raw data for Input Offset Voltage1_1 5V (V) @ VS=+5V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage1_1 5V (V)
@ VS=+5V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.61E-04
-1.69E-04
-4.19E-05
1.61E-05
1.46E-04
4.21E-05
1.29E-04
-1.57E-04
2.59E-04
1.91E-04
-1.49E-04
-2.60E-04
Total Dose (krad(Si))
20
50
100
3.46E-04 3.47E-04 3.54E-04
-1.94E-04 -1.99E-04 -2.01E-04
-6.10E-05 -7.05E-05 -7.69E-05
1.11E-05 1.66E-05 3.03E-05
1.38E-04 1.44E-04 1.49E-04
2.79E-05 1.22E-05 3.36E-06
1.20E-04 1.13E-04 1.08E-04
-1.82E-04 -1.90E-04 -1.99E-04
2.36E-04 2.23E-04 2.13E-04
1.68E-04 1.53E-04 1.51E-04
-1.48E-04 -1.50E-04 -1.48E-04
-2.58E-04 -2.59E-04 -2.60E-04
200
3.38E-04
-2.08E-04
-8.96E-05
3.24E-05
1.48E-04
-2.00E-07
1.05E-04
-2.13E-04
2.09E-04
1.40E-04
-1.50E-04
-2.60E-04
24-hr
Anneal
225
3.36E-04
-2.09E-04
-8.21E-05
1.93E-05
1.41E-04
-1.33E-05
9.23E-05
-2.17E-04
1.94E-04
1.34E-04
-1.50E-04
-2.60E-04
168-hr
Anneal
250
3.36E-04
-1.87E-04
-6.32E-05
1.70E-05
1.41E-04
-9.52E-06
8.85E-05
-1.92E-04
2.09E-04
1.36E-04
-1.49E-04
-2.61E-04
6.25E-05 4.80E-05 4.77E-05 5.13E-05 4.41E-05 4.10E-05 4.85E-05
2.01E-04 2.05E-04 2.09E-04 2.13E-04 2.11E-04 2.09E-04 2.00E-04
6.15E-04 6.10E-04 6.20E-04 6.36E-04 6.23E-04 6.15E-04 5.97E-04
-4.90E-04 -5.14E-04 -5.25E-04 -5.33E-04 -5.35E-04 -5.33E-04 -5.00E-04
9.26E-05
1.61E-04
5.34E-04
-3.49E-04
-8.00E-04
PASS
8.00E-04
PASS
7.38E-05
1.62E-04
5.18E-04
-3.70E-04
-9.50E-04
PASS
9.50E-04
PASS
6.24E-05
1.60E-04
5.02E-04
-3.77E-04
-9.50E-04
PASS
9.50E-04
PASS
5.53E-05
1.61E-04
4.98E-04
-3.88E-04
-9.50E-04
PASS
9.50E-04
PASS
4.84E-05
1.64E-04
4.99E-04
-4.02E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DLA Certified Company
130
3.78E-05
1.61E-04
4.80E-04
-4.05E-04
-9.50E-04
PASS
9.50E-04
PASS
4.63E-05
1.55E-04
4.72E-04
-3.80E-04
-9.50E-04
PASS
9.50E-04
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.62. Plot of Input Offset Voltage1_2 5V (V) @ VS=+5V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
131
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.62. Raw data for Input Offset Voltage1_2 5V (V) @ VS=+5V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage1_2 5V (V)
@ VS=+5V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-1.23E-05
9.93E-05
-5.04E-05
1.38E-04
2.87E-04
4.03E-04
1.44E-04
2.87E-04
2.15E-04
2.75E-04
4.60E-05
1.94E-04
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
20
50
100
200
225
250
-1.84E-05 -6.76E-06 -8.32E-06 -1.98E-06 -1.44E-05 -1.97E-05
8.95E-05 9.24E-05 9.26E-05 9.28E-05 9.55E-05 8.56E-05
-6.48E-05 -5.41E-05 -4.69E-05 -4.04E-05 -4.95E-05 -6.19E-05
1.24E-04 1.25E-04 1.27E-04 1.31E-04 1.23E-04 1.31E-04
2.79E-04 2.79E-04 2.76E-04 2.79E-04 2.75E-04 2.85E-04
3.86E-04 3.64E-04 3.45E-04 3.41E-04 3.34E-04 3.54E-04
1.26E-04 1.11E-04 9.70E-05 8.31E-05 7.88E-05 9.43E-05
2.60E-04 2.50E-04 2.44E-04 2.31E-04 2.32E-04 2.38E-04
1.99E-04 1.98E-04 1.86E-04 1.86E-04 1.79E-04 1.80E-04
2.53E-04 2.29E-04 2.22E-04 2.10E-04 2.02E-04 2.22E-04
4.57E-05 4.54E-05 4.75E-05 4.60E-05 4.63E-05 3.98E-05
1.91E-04 1.91E-04 1.93E-04 1.92E-04 1.93E-04 1.96E-04
9.23E-05 8.18E-05 8.69E-05 8.82E-05 9.20E-05 8.60E-05 8.41E-05
1.34E-04 1.34E-04 1.29E-04 1.27E-04 1.25E-04 1.28E-04 1.37E-04
4.58E-04 4.51E-04 4.41E-04 4.36E-04 4.36E-04 4.37E-04 4.59E-04
-2.74E-04 -2.87E-04 -2.68E-04 -2.60E-04 -2.52E-04 -2.65E-04 -2.91E-04
2.65E-04
9.60E-05
5.28E-04
1.53E-06
-8.00E-04
PASS
8.00E-04
PASS
2.45E-04
9.56E-05
5.07E-04
-1.72E-05
-9.50E-04
PASS
9.50E-04
PASS
2.30E-04
9.18E-05
4.82E-04
-2.12E-05
-9.50E-04
PASS
9.50E-04
PASS
2.19E-04
9.00E-05
4.65E-04
-2.82E-05
-9.50E-04
PASS
9.50E-04
PASS
2.10E-04
9.27E-05
4.64E-04
-4.39E-05
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DLA Certified Company
132
2.05E-04
9.22E-05
4.58E-04
-4.75E-05
-9.50E-04
PASS
9.50E-04
PASS
2.18E-04
9.44E-05
4.77E-04
-4.10E-05
-9.50E-04
PASS
9.50E-04
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.63. Plot of Input Offset Current1_1 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
133
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.63. Raw data for Input Offset Current1_1 5V (A) @ VS=+5V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current1_1 5V (A)
@ VS=+5V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.10E-09
-3.95E-09
2.00E-10
2.00E-09
-4.00E-10
-3.82E-09
-1.53E-09
-2.40E-09
4.46E-09
-2.33E-09
-2.07E-09
-7.11E-09
Total Dose (krad(Si))
20
50
100
3.00E-09 2.19E-09 -2.14E-09
-4.55E-09 -4.60E-09 -3.70E-09
9.00E-11 -3.20E-10 -1.41E-09
2.82E-09 3.81E-09 5.75E-09
-4.50E-10 7.60E-10 7.00E-11
-3.63E-09 -4.68E-09 -5.66E-09
-1.30E-09 -1.59E-09 -1.66E-09
-2.60E-09 -2.38E-09 -4.00E-09
4.61E-09 4.84E-09 3.61E-09
-3.00E-09 -3.19E-09 -6.90E-10
-2.13E-09 -2.23E-09 -2.33E-09
-7.10E-09 -7.20E-09 -7.28E-09
200
1.08E-09
-3.34E-09
-2.07E-09
6.17E-09
6.30E-10
-6.24E-09
-3.30E-10
-5.02E-09
3.58E-09
-4.80E-10
-2.45E-09
-7.33E-09
24-hr
Anneal
225
8.40E-10
-6.02E-09
-2.78E-09
2.25E-09
-1.10E-09
-7.36E-09
-4.34E-09
-6.45E-09
1.12E-09
-4.16E-09
-2.48E-09
-7.37E-09
168-hr
Anneal
250
2.53E-09
-3.60E-09
-5.50E-10
2.39E-09
2.90E-10
-4.00E-09
-1.69E-09
-3.31E-09
4.23E-09
-2.87E-09
-2.57E-09
-7.35E-09
1.90E-10 1.82E-10 3.68E-10 -2.86E-10 4.94E-10 -1.36E-09 2.12E-10
2.70E-09 3.07E-09 3.18E-09 3.64E-09 3.67E-09 3.23E-09 2.51E-09
7.60E-09 8.60E-09 9.09E-09 9.69E-09 1.06E-08 7.49E-09 7.10E-09
-7.22E-09 -8.24E-09 -8.35E-09 -1.03E-08 -9.57E-09 -1.02E-08 -6.68E-09
-1.12E-09
3.23E-09
7.73E-09
-9.98E-09
-6.50E-08
PASS
6.50E-08
PASS
-1.18E-09
3.35E-09
8.00E-09
-1.04E-08
-6.50E-08
PASS
6.50E-08
PASS
-1.40E-09
3.67E-09
8.67E-09
-1.15E-08
-6.50E-08
PASS
6.50E-08
PASS
-1.68E-09
3.54E-09
8.03E-09
-1.14E-08
-6.50E-08
PASS
6.50E-08
PASS
-1.70E-09
3.96E-09
9.17E-09
-1.26E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2008 and DLA Certified Company
134
-4.24E-09
3.29E-09
4.79E-09
-1.33E-08
-6.50E-08
PASS
6.50E-08
PASS
-1.53E-09
3.33E-09
7.59E-09
-1.06E-08
-6.50E-08
PASS
6.50E-08
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.64. Plot of Input Offset Current1_2 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
135
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.64. Raw data for Input Offset Current1_2 5V (A) @ VS=+5V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current1_2 5V (A)
@ VS=+5V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-7.00E-11
8.40E-10
-3.00E-10
-1.56E-09
5.26E-09
4.68E-09
-1.80E-09
2.05E-09
2.30E-09
-4.50E-10
-4.67E-09
-1.50E-09
Total Dose (krad(Si))
20
50
100
1.33E-09 1.24E-09 -2.95E-09
4.00E-10 -8.20E-10 -8.30E-10
-1.10E-10 -1.10E-10 -1.90E-10
-9.70E-10 -1.17E-09 3.40E-10
5.30E-09 5.61E-09 6.40E-09
4.57E-09 3.20E-09 3.08E-09
-1.47E-09 -3.10E-10 -1.05E-09
2.19E-09 2.10E-09 3.09E-09
2.33E-09 2.00E-09 1.67E-09
-7.00E-10 -2.40E-09 -1.83E-09
-4.73E-09 -4.82E-09 -4.88E-09
-1.53E-09 -1.62E-09 -1.66E-09
200
1.71E-09
1.17E-09
1.98E-09
1.31E-09
5.42E-09
3.49E-09
-1.26E-09
1.90E-09
3.35E-09
-3.04E-09
-4.94E-09
-1.69E-09
24-hr
Anneal
225
-2.36E-09
-2.30E-09
-1.70E-09
-2.07E-09
2.00E-09
4.80E-10
-4.80E-09
2.40E-10
5.80E-10
-5.62E-09
-5.01E-09
-1.69E-09
168-hr
Anneal
250
0.00E+00
-6.10E-10
-9.80E-10
6.50E-10
6.10E-09
3.97E-09
-1.76E-09
1.60E-09
2.00E-09
-1.77E-09
-5.11E-09
-1.73E-09
8.34E-10 1.19E-09 9.50E-10 5.54E-10 2.32E-09 -1.29E-09 1.03E-09
2.62E-09 2.44E-09 2.76E-09 3.50E-09 1.76E-09 1.86E-09 2.90E-09
8.01E-09 7.89E-09 8.53E-09 1.01E-08 7.15E-09 3.80E-09 8.98E-09
-6.35E-09 -5.51E-09 -6.63E-09 -9.04E-09 -2.52E-09 -6.37E-09 -6.92E-09
1.36E-09
2.53E-09
8.30E-09
-5.59E-09
-6.50E-08
PASS
6.50E-08
PASS
1.38E-09
2.46E-09
8.13E-09
-5.36E-09
-6.50E-08
PASS
6.50E-08
PASS
9.18E-10
2.25E-09
7.09E-09
-5.26E-09
-6.50E-08
PASS
6.50E-08
PASS
9.92E-10
2.31E-09
7.33E-09
-5.34E-09
-6.50E-08
PASS
6.50E-08
PASS
8.88E-10
2.91E-09
8.87E-09
-7.09E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2008 and DLA Certified Company
136
-1.82E-09
3.11E-09
6.70E-09
-1.03E-08
-6.50E-08
PASS
6.50E-08
PASS
8.08E-10
2.51E-09
7.70E-09
-6.09E-09
-6.50E-08
PASS
6.50E-08
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.65. Plot of +Input Bias Current1_1 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
137
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.65. Raw data for +Input Bias Current1_1 5V (A) @ VS=+5V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
+Input Bias Current1_1 5V (A)
@ VS=+5V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.75E-07
-3.72E-07
-3.91E-07
-3.66E-07
-3.75E-07
-3.60E-07
-3.72E-07
-3.67E-07
-3.38E-07
-3.74E-07
-3.71E-07
-3.70E-07
Total Dose (krad(Si))
20
50
100
-3.86E-07 -4.01E-07 -4.14E-07
-3.83E-07 -3.98E-07 -4.14E-07
-4.03E-07 -4.19E-07 -4.36E-07
-3.80E-07 -3.96E-07 -4.14E-07
-3.90E-07 -4.07E-07 -4.25E-07
-3.73E-07 -3.93E-07 -4.16E-07
-3.86E-07 -4.05E-07 -4.25E-07
-3.85E-07 -4.06E-07 -4.33E-07
-3.61E-07 -3.80E-07 -4.02E-07
-3.86E-07 -4.11E-07 -4.29E-07
-3.70E-07 -3.72E-07 -3.70E-07
-3.69E-07 -3.70E-07 -3.70E-07
200
-4.31E-07
-4.36E-07
-4.62E-07
-4.33E-07
-4.45E-07
-4.47E-07
-4.56E-07
-4.72E-07
-4.36E-07
-4.66E-07
-3.72E-07
-3.70E-07
24-hr
Anneal
225
-4.13E-07
-4.15E-07
-4.38E-07
-4.14E-07
-4.26E-07
-4.38E-07
-4.48E-07
-4.63E-07
-4.28E-07
-4.58E-07
-3.71E-07
-3.70E-07
168-hr
Anneal
250
-3.88E-07
-3.84E-07
-4.06E-07
-3.84E-07
-3.92E-07
-3.89E-07
-4.00E-07
-4.04E-07
-3.75E-07
-4.08E-07
-3.72E-07
-3.69E-07
-3.76E-07 -3.88E-07 -4.04E-07 -4.21E-07 -4.41E-07 -4.21E-07 -3.91E-07
9.12E-09 8.90E-09 9.18E-09 9.88E-09 1.25E-08 1.06E-08 9.19E-09
-3.51E-07 -3.64E-07 -3.79E-07 -3.94E-07 -4.07E-07 -3.92E-07 -3.65E-07
-4.01E-07 -4.13E-07 -4.29E-07 -4.48E-07 -4.76E-07 -4.50E-07 -4.16E-07
-3.62E-07
1.46E-08
-3.22E-07
-4.02E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.78E-07
1.10E-08
-3.48E-07
-4.08E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.99E-07
1.25E-08
-3.65E-07
-4.33E-07
-8.00E-07
PASS
8.00E-07
PASS
-4.21E-07
1.22E-08
-3.88E-07
-4.54E-07
-8.50E-07
PASS
8.50E-07
PASS
-4.55E-07
1.46E-08
-4.15E-07
-4.95E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DLA Certified Company
138
-4.47E-07
1.41E-08
-4.08E-07
-4.86E-07
-9.00E-07
PASS
9.00E-07
PASS
-3.95E-07
1.32E-08
-3.59E-07
-4.31E-07
-9.00E-07
PASS
9.00E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.66. Plot of +Input Bias Current1_2 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
139
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.66. Raw data for +Input Bias Current1_2 5V (A) @ VS=+5V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
+Input Bias Current1_2 5V (A)
@ VS=+5V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.75E-07
-3.70E-07
-3.93E-07
-3.70E-07
-3.69E-07
-3.53E-07
-3.74E-07
-3.72E-07
-3.46E-07
-3.70E-07
-3.75E-07
-3.63E-07
Total Dose (krad(Si))
20
50
100
-3.85E-07 -4.01E-07 -4.15E-07
-3.82E-07 -3.99E-07 -4.13E-07
-4.04E-07 -4.20E-07 -4.37E-07
-3.82E-07 -3.99E-07 -4.16E-07
-3.81E-07 -3.96E-07 -4.14E-07
-3.67E-07 -3.84E-07 -4.05E-07
-3.88E-07 -4.05E-07 -4.26E-07
-3.88E-07 -4.10E-07 -4.36E-07
-3.61E-07 -3.80E-07 -4.04E-07
-3.81E-07 -4.08E-07 -4.30E-07
-3.74E-07 -3.75E-07 -3.76E-07
-3.64E-07 -3.62E-07 -3.63E-07
200
-4.34E-07
-4.33E-07
-4.58E-07
-4.34E-07
-4.34E-07
-4.33E-07
-4.57E-07
-4.74E-07
-4.32E-07
-4.63E-07
-3.75E-07
-3.62E-07
24-hr
Anneal
225
-4.15E-07
-4.13E-07
-4.37E-07
-4.15E-07
-4.15E-07
-4.27E-07
-4.50E-07
-4.66E-07
-4.25E-07
-4.55E-07
-3.76E-07
-3.63E-07
168-hr
Anneal
250
-3.87E-07
-3.84E-07
-4.06E-07
-3.83E-07
-3.84E-07
-3.81E-07
-4.02E-07
-4.08E-07
-3.78E-07
-4.03E-07
-3.76E-07
-3.61E-07
-3.75E-07 -3.87E-07 -4.03E-07 -4.19E-07 -4.38E-07 -4.19E-07 -3.89E-07
9.93E-09 9.80E-09 9.70E-09 1.00E-08 1.08E-08 9.98E-09 9.57E-09
-3.48E-07 -3.60E-07 -3.76E-07 -3.92E-07 -4.09E-07 -3.92E-07 -3.63E-07
-4.03E-07 -4.14E-07 -4.29E-07 -4.47E-07 -4.68E-07 -4.46E-07 -4.15E-07
-3.63E-07
1.25E-08
-3.29E-07
-3.97E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.77E-07
1.23E-08
-3.43E-07
-4.11E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.98E-07
1.42E-08
-3.59E-07
-4.37E-07
-8.00E-07
PASS
8.00E-07
PASS
-4.20E-07
1.48E-08
-3.80E-07
-4.61E-07
-8.50E-07
PASS
8.50E-07
PASS
-4.52E-07
1.88E-08
-4.00E-07
-5.03E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DLA Certified Company
140
-4.45E-07
1.79E-08
-3.96E-07
-4.94E-07
-9.00E-07
PASS
9.00E-07
PASS
-3.94E-07
1.37E-08
-3.57E-07
-4.32E-07
-9.00E-07
PASS
9.00E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.67. Plot of -Input Bias Current1_1 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
141
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.67. Raw data for -Input Bias Current1_1 5V (A) @ VS=+5V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
-Input Bias Current1_1 5V (A)
@ VS=+5V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.80E-07
-3.69E-07
-3.92E-07
-3.72E-07
-3.77E-07
-3.58E-07
-3.73E-07
-3.66E-07
-3.50E-07
-3.75E-07
-3.71E-07
-3.65E-07
Total Dose (krad(Si))
20
50
100
-3.92E-07 -4.07E-07 -4.13E-07
-3.81E-07 -3.98E-07 -4.15E-07
-4.07E-07 -4.23E-07 -4.40E-07
-3.87E-07 -4.03E-07 -4.24E-07
-3.94E-07 -4.11E-07 -4.27E-07
-3.73E-07 -3.92E-07 -4.12E-07
-3.89E-07 -4.06E-07 -4.26E-07
-3.85E-07 -4.04E-07 -4.33E-07
-3.67E-07 -3.88E-07 -4.10E-07
-3.85E-07 -4.09E-07 -4.34E-07
-3.71E-07 -3.72E-07 -3.71E-07
-3.66E-07 -3.67E-07 -3.66E-07
200
-4.33E-07
-4.35E-07
-4.62E-07
-4.42E-07
-4.49E-07
-4.43E-07
-4.59E-07
-4.70E-07
-4.42E-07
-4.66E-07
-3.72E-07
-3.66E-07
24-hr
Anneal
225
-4.15E-07
-4.11E-07
-4.38E-07
-4.19E-07
-4.26E-07
-4.32E-07
-4.47E-07
-4.58E-07
-4.31E-07
-4.56E-07
-3.71E-07
-3.65E-07
168-hr
Anneal
250
-3.93E-07
-3.85E-07
-4.08E-07
-3.89E-07
-3.94E-07
-3.84E-07
-4.01E-07
-4.03E-07
-3.83E-07
-4.07E-07
-3.73E-07
-3.66E-07
-3.78E-07 -3.92E-07 -4.08E-07 -4.24E-07 -4.44E-07 -4.22E-07 -3.94E-07
9.18E-09 9.74E-09 9.50E-09 1.06E-08 1.19E-08 1.06E-08 8.91E-09
-3.53E-07 -3.66E-07 -3.82E-07 -3.95E-07 -4.12E-07 -3.93E-07 -3.69E-07
-4.03E-07 -4.19E-07 -4.34E-07 -4.53E-07 -4.77E-07 -4.51E-07 -4.18E-07
-3.64E-07
1.06E-08
-3.35E-07
-3.93E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.80E-07
9.23E-09
-3.54E-07
-4.05E-07
-7.50E-07
PASS
7.50E-07
PASS
-4.00E-07
9.36E-09
-3.74E-07
-4.26E-07
-8.00E-07
PASS
8.00E-07
PASS
-4.23E-07
1.13E-08
-3.92E-07
-4.54E-07
-8.50E-07
PASS
8.50E-07
PASS
-4.56E-07
1.32E-08
-4.20E-07
-4.92E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DLA Certified Company
142
-4.45E-07
1.27E-08
-4.10E-07
-4.79E-07
-9.00E-07
PASS
9.00E-07
PASS
-3.96E-07
1.12E-08
-3.65E-07
-4.26E-07
-9.00E-07
PASS
9.00E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.68. Plot of -Input Bias Current1_2 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
143
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.68. Raw data for -Input Bias Current1_2 5V (A) @ VS=+5V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
-Input Bias Current1_2 5V (A)
@ VS=+5V, VCM=0V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.77E-07
-3.72E-07
-3.95E-07
-3.71E-07
-3.77E-07
-3.60E-07
-3.75E-07
-3.77E-07
-3.53E-07
-3.73E-07
-3.74E-07
-3.64E-07
Total Dose (krad(Si))
20
50
100
-3.90E-07 -4.06E-07 -4.16E-07
-3.86E-07 -4.00E-07 -4.15E-07
-4.08E-07 -4.22E-07 -4.40E-07
-3.84E-07 -3.99E-07 -4.18E-07
-3.90E-07 -4.05E-07 -4.22E-07
-3.74E-07 -3.90E-07 -4.10E-07
-3.90E-07 -4.08E-07 -4.29E-07
-3.93E-07 -4.15E-07 -4.41E-07
-3.68E-07 -3.86E-07 -4.06E-07
-3.83E-07 -4.07E-07 -4.26E-07
-3.74E-07 -3.74E-07 -3.73E-07
-3.62E-07 -3.64E-07 -3.63E-07
200
-4.38E-07
-4.38E-07
-4.64E-07
-4.36E-07
-4.43E-07
-4.37E-07
-4.57E-07
-4.78E-07
-4.38E-07
-4.59E-07
-3.75E-07
-3.62E-07
24-hr
Anneal
225
-4.15E-07
-4.13E-07
-4.39E-07
-4.15E-07
-4.20E-07
-4.28E-07
-4.46E-07
-4.66E-07
-4.27E-07
-4.53E-07
-3.74E-07
-3.62E-07
168-hr
Anneal
250
-3.90E-07
-3.86E-07
-4.08E-07
-3.86E-07
-3.93E-07
-3.87E-07
-4.01E-07
-4.11E-07
-3.82E-07
-4.04E-07
-3.73E-07
-3.63E-07
-3.78E-07 -3.92E-07 -4.07E-07 -4.22E-07 -4.44E-07 -4.21E-07 -3.93E-07
9.58E-09 9.48E-09 9.21E-09 1.02E-08 1.13E-08 1.04E-08 9.17E-09
-3.52E-07 -3.66E-07 -3.81E-07 -3.94E-07 -4.13E-07 -3.92E-07 -3.68E-07
-4.05E-07 -4.18E-07 -4.32E-07 -4.50E-07 -4.75E-07 -4.49E-07 -4.18E-07
-3.68E-07
1.05E-08
-3.39E-07
-3.96E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.81E-07
1.06E-08
-3.52E-07
-4.11E-07
-7.50E-07
PASS
7.50E-07
PASS
-4.01E-07
1.23E-08
-3.67E-07
-4.35E-07
-8.00E-07
PASS
8.00E-07
PASS
-4.22E-07
1.42E-08
-3.84E-07
-4.61E-07
-8.50E-07
PASS
8.50E-07
PASS
-4.54E-07
1.69E-08
-4.07E-07
-5.00E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DLA Certified Company
144
-4.44E-07
1.65E-08
-3.99E-07
-4.89E-07
-9.00E-07
PASS
9.00E-07
PASS
-3.97E-07
1.20E-08
-3.64E-07
-4.30E-07
-9.00E-07
PASS
9.00E-07
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.69. Plot of Input Offset Voltage2_1 5V (V) @ VS=+5V, VCM=5V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
145
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.69. Raw data for Input Offset Voltage2_1 5V (V) @ VS=+5V, VCM=5V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage2_1 5V (V)
@ VS=+5V, VCM=5V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
4.15E-04
-1.18E-05
9.66E-05
2.68E-04
1.23E-04
1.42E-05
-2.53E-05
9.46E-05
2.72E-04
1.70E-04
-1.48E-04
-9.36E-05
Total Dose (krad(Si))
20
50
100
4.21E-04 4.30E-04 4.47E-04
-3.03E-05 -3.44E-05 -3.22E-05
8.48E-05 8.73E-05 8.93E-05
2.60E-04 2.66E-04 2.74E-04
1.20E-04 1.29E-04 1.38E-04
1.03E-05 7.07E-06 6.92E-06
-2.59E-05 -2.63E-05 -2.22E-05
8.39E-05 8.18E-05 8.19E-05
2.54E-04 2.41E-04 2.32E-04
1.52E-04 1.47E-04 1.48E-04
-1.47E-04 -1.47E-04 -1.46E-04
-9.35E-05 -9.29E-05 -9.22E-05
200
4.40E-04
-3.72E-05
8.69E-05
2.84E-04
1.45E-04
1.46E-05
-1.20E-05
8.05E-05
2.25E-04
1.48E-04
-1.46E-04
-9.26E-05
24-hr
Anneal
225
4.33E-04
-3.69E-05
9.15E-05
2.71E-04
1.40E-04
3.48E-06
-2.42E-05
8.02E-05
2.21E-04
1.44E-04
-1.45E-04
-9.27E-05
168-hr
Anneal
250
3.94E-04
-1.73E-05
6.49E-05
2.56E-04
1.29E-04
-3.70E-06
-5.11E-05
6.98E-05
2.20E-04
1.35E-04
-1.45E-04
-9.22E-05
1.78E-04 1.71E-04 1.76E-04 1.83E-04 1.84E-04 1.80E-04 1.65E-04
1.66E-04 1.74E-04 1.78E-04 1.84E-04 1.84E-04 1.79E-04 1.62E-04
6.33E-04 6.48E-04 6.64E-04 6.88E-04 6.88E-04 6.72E-04 6.10E-04
-2.77E-04 -3.06E-04 -3.13E-04 -3.21E-04 -3.21E-04 -3.12E-04 -2.80E-04
1.05E-04
1.20E-04
4.33E-04
-2.23E-04
-8.00E-04
PASS
8.00E-04
PASS
9.48E-05
1.12E-04
4.03E-04
-2.13E-04
-9.50E-04
PASS
9.50E-04
PASS
9.01E-05
1.08E-04
3.86E-04
-2.05E-04
-9.50E-04
PASS
9.50E-04
PASS
8.93E-05
1.04E-04
3.74E-04
-1.95E-04
-9.50E-04
PASS
9.50E-04
PASS
9.12E-05
9.71E-05
3.57E-04
-1.75E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DLA Certified Company
146
8.50E-05
1.01E-04
3.62E-04
-1.91E-04
-9.50E-04
PASS
9.50E-04
PASS
7.40E-05
1.08E-04
3.70E-04
-2.22E-04
-9.50E-04
PASS
9.50E-04
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.70. Plot of Input Offset Voltage2_2 5V (V) @ VS=+5V, VCM=5V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
147
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.70. Raw data for Input Offset Voltage2_2 5V (V) @ VS=+5V, VCM=5V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage2_2 5V (V)
@ VS=+5V, VCM=5V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
4.81E-05
1.50E-04
1.22E-04
1.31E-04
4.72E-04
3.38E-04
1.39E-04
1.86E-04
1.23E-04
2.48E-04
-3.82E-05
3.08E-04
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
20
50
100
200
225
250
4.14E-05 5.51E-05 6.98E-05 7.37E-05 6.48E-05 4.19E-05
1.45E-04 1.57E-04 1.66E-04 1.74E-04 1.77E-04 1.41E-04
1.10E-04 1.23E-04 1.34E-04 1.47E-04 1.41E-04 1.07E-04
1.28E-04 1.41E-04 1.58E-04 1.71E-04 1.63E-04 1.42E-04
4.74E-04 4.79E-04 4.89E-04 4.99E-04 4.93E-04 4.93E-04
3.28E-04 3.17E-04 3.14E-04 3.13E-04 3.11E-04 3.02E-04
1.32E-04 1.24E-04 1.23E-04 1.16E-04 1.16E-04 1.10E-04
1.70E-04 1.65E-04 1.62E-04 1.56E-04 1.58E-04 1.58E-04
1.14E-04 1.19E-04 1.17E-04 1.18E-04 1.17E-04 1.02E-04
2.35E-04 2.22E-04 2.23E-04 2.16E-04 2.15E-04 2.23E-04
-3.93E-05 -3.90E-05 -3.66E-05 -3.75E-05 -3.46E-05 -3.96E-05
3.09E-04 3.09E-04 3.11E-04 3.11E-04 3.11E-04 3.14E-04
1.85E-04 1.80E-04 1.91E-04 2.04E-04 2.13E-04 2.08E-04 1.85E-04
1.65E-04 1.69E-04 1.66E-04 1.64E-04 1.65E-04 1.65E-04 1.77E-04
6.38E-04 6.44E-04 6.46E-04 6.54E-04 6.65E-04 6.61E-04 6.70E-04
-2.68E-04 -2.84E-04 -2.63E-04 -2.47E-04 -2.39E-04 -2.45E-04 -3.00E-04
2.07E-04
8.77E-05
4.47E-04
-3.36E-05
-8.00E-04
PASS
8.00E-04
PASS
1.96E-04
8.72E-05
4.35E-04
-4.35E-05
-9.50E-04
PASS
9.50E-04
PASS
1.89E-04
8.24E-05
4.15E-04
-3.67E-05
-9.50E-04
PASS
9.50E-04
PASS
1.88E-04
8.22E-05
4.13E-04
-3.76E-05
-9.50E-04
PASS
9.50E-04
PASS
1.84E-04
8.27E-05
4.11E-04
-4.31E-05
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DLA Certified Company
148
1.83E-04
8.18E-05
4.08E-04
-4.09E-05
-9.50E-04
PASS
9.50E-04
PASS
1.79E-04
8.41E-05
4.10E-04
-5.15E-05
-9.50E-04
PASS
9.50E-04
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.71. Plot of Input Offset Current2_1 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
149
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.71. Raw data for Input Offset Current2_1 5V (A) @ VS=+5V, VCM=5V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current2_1 5V (A)
@ VS=+5V, VCM=5V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
2.30E-09
-2.44E-09
-1.02E-08
-2.92E-09
7.50E-09
1.00E-08
7.43E-09
1.35E-08
9.00E-11
2.54E-08
2.14E-09
1.38E-08
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
20
50
100
200
225
250
4.38E-09 7.01E-09 1.28E-08 1.09E-08 1.22E-08 2.89E-09
-1.70E-09 -1.50E-09 1.58E-09 2.16E-09 1.81E-09 -2.94E-09
-1.10E-08 -9.37E-09 -1.07E-08 -1.23E-08 -7.84E-09 -1.09E-08
-4.23E-09 -1.87E-09 -2.51E-09 7.00E-10 -1.10E-09 -5.01E-09
6.54E-09 8.10E-09 7.85E-09 8.51E-09 9.75E-09 5.07E-09
7.85E-09 8.42E-09 1.01E-08 1.06E-08 1.32E-08 7.54E-09
6.29E-09 5.43E-09 5.72E-09 6.65E-09 8.24E-09 1.91E-09
1.58E-08 1.71E-08 1.74E-08 1.97E-08 2.24E-08 1.28E-08
-5.00E-10 -1.71E-09 -9.60E-10 -2.89E-09 -1.80E-10 -3.27E-09
2.60E-08 2.40E-08 2.50E-08 2.61E-08 2.88E-08 2.39E-08
2.88E-09 3.17E-09 3.41E-09 3.64E-09 3.79E-09 4.25E-09
1.47E-08 1.49E-08 1.51E-08 1.52E-08 1.53E-08 1.56E-08
-1.15E-09 -1.20E-09 4.74E-10 1.80E-09 2.00E-09 2.96E-09 -2.18E-09
6.58E-09 7.00E-09 7.20E-09 9.11E-09 9.05E-09 8.14E-09 6.38E-09
1.69E-08 1.80E-08 2.02E-08 2.68E-08 2.68E-08 2.53E-08 1.53E-08
-1.92E-08 -2.04E-08 -1.93E-08 -2.32E-08 -2.28E-08 -1.94E-08 -1.97E-08
1.13E-08
9.31E-09
3.68E-08
-1.42E-08
-6.50E-08
PASS
6.50E-08
PASS
1.11E-08
1.01E-08
3.89E-08
-1.67E-08
-6.50E-08
PASS
6.50E-08
PASS
1.07E-08
1.01E-08
3.83E-08
-1.70E-08
-6.50E-08
PASS
6.50E-08
PASS
1.15E-08
1.01E-08
3.92E-08
-1.62E-08
-6.50E-08
PASS
6.50E-08
PASS
1.20E-08
1.13E-08
4.30E-08
-1.90E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2008 and DLA Certified Company
150
1.45E-08
1.14E-08
4.59E-08
-1.69E-08
-6.50E-08
PASS
6.50E-08
PASS
8.58E-09
1.05E-08
3.73E-08
-2.01E-08
-6.50E-08
PASS
6.50E-08
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.72. Plot of Input Offset Current2_2 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
151
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.72. Raw data for Input Offset Current2_2 5V (A) @ VS=+5V, VCM=5V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current2_2 5V (A)
@ VS=+5V, VCM=5V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.51E-09
2.33E-08
2.29E-08
1.81E-08
2.23E-08
1.02E-08
1.02E-08
3.29E-09
8.64E-09
3.20E-09
1.77E-08
2.71E-08
Total Dose (krad(Si))
20
50
100
2.59E-09 4.98E-09 1.04E-08
2.27E-08 2.32E-08 2.19E-08
2.17E-08 2.26E-08 2.52E-08
1.79E-08 1.86E-08 1.88E-08
2.30E-08 2.40E-08 2.48E-08
1.09E-08 1.19E-08 1.48E-08
1.12E-08 1.00E-08 1.26E-08
3.75E-09 4.75E-09 4.63E-09
8.65E-09 9.25E-09 1.12E-08
5.42E-09 5.19E-09 6.46E-09
1.78E-08 1.81E-08 1.83E-08
2.72E-08 2.72E-08 2.74E-08
1.76E-08 1.76E-08 1.87E-08
9.25E-09 8.61E-09 7.93E-09
4.30E-08 4.12E-08 4.04E-08
-7.72E-09 -6.06E-09 -3.08E-09
7.11E-09
3.59E-09
1.70E-08
-2.73E-09
-6.50E-08
PASS
6.50E-08
PASS
7.98E-09
3.30E-09
1.70E-08
-1.07E-09
-6.50E-08
PASS
6.50E-08
PASS
8.21E-09
3.11E-09
1.67E-08
-3.19E-10
-6.50E-08
PASS
6.50E-08
PASS
200
7.40E-09
1.89E-08
2.53E-08
1.86E-08
2.43E-08
1.39E-08
1.19E-08
2.28E-09
1.01E-08
5.55E-09
1.85E-08
2.76E-08
2.02E-08 1.89E-08
6.08E-09 7.13E-09
3.69E-08 3.85E-08
3.55E-09 -6.29E-10
9.94E-09
4.26E-09
2.16E-08
-1.74E-09
-6.50E-08
PASS
6.50E-08
PASS
8.75E-09
4.76E-09
2.18E-08
-4.30E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2008 and DLA Certified Company
152
24-hr
Anneal
225
8.80E-09
2.20E-08
2.76E-08
1.95E-08
2.59E-08
1.64E-08
1.53E-08
6.02E-09
1.24E-08
8.44E-09
1.88E-08
2.77E-08
168-hr
Anneal
250
1.39E-09
2.06E-08
2.28E-08
1.66E-08
2.33E-08
9.47E-09
7.01E-09
2.44E-09
8.80E-09
2.69E-09
1.90E-08
2.77E-08
2.08E-08 1.70E-08
7.40E-09 9.10E-09
4.11E-08 4.19E-08
4.49E-10 -7.98E-09
1.17E-08
4.43E-09
2.39E-08
-4.34E-10
-6.50E-08
PASS
6.50E-08
PASS
6.08E-09
3.34E-09
1.52E-08
-3.06E-09
-6.50E-08
PASS
6.50E-08
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.73. Plot of +Input Bias Current2_1 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
153
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.73. Raw data for +Input Bias Current2_1 5V (A) @ VS=+5V, VCM=5V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
+Input Bias Current2_1 5V (A)
24-hr
168-hr
@ VS=+5V, VCM=5V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.64E-07 5.18E-07 5.93E-07 6.61E-07 7.40E-07 6.91E-07 5.39E-07
681 4.51E-07 5.04E-07 5.68E-07 6.38E-07 7.14E-07 6.64E-07 5.24E-07
682 4.81E-07 5.36E-07 6.03E-07 6.72E-07 7.55E-07 7.00E-07 5.57E-07
683 4.29E-07 4.84E-07 5.55E-07 6.23E-07 6.99E-07 6.47E-07 5.05E-07
684 4.61E-07 5.14E-07 5.85E-07 6.50E-07 7.28E-07 6.79E-07 5.38E-07
685 4.51E-07 5.07E-07 5.79E-07 6.47E-07 7.26E-07 7.00E-07 5.55E-07
686 4.53E-07 5.13E-07 5.81E-07 6.51E-07 7.30E-07 7.05E-07 5.51E-07
688 3.91E-07 4.53E-07 5.16E-07 5.81E-07 6.64E-07 6.38E-07 4.94E-07
689 4.18E-07 4.79E-07 5.48E-07 6.14E-07 6.83E-07 6.61E-07 5.24E-07
690 4.70E-07 5.31E-07 6.11E-07 6.81E-07 7.60E-07 7.37E-07 5.82E-07
691 4.53E-07 4.53E-07 4.54E-07 4.54E-07 4.55E-07 4.56E-07 4.57E-07
692 4.55E-07 4.54E-07 4.54E-07 4.54E-07 4.55E-07 4.55E-07 4.56E-07
Biased Statistics
Average Biased
4.57E-07 5.11E-07 5.81E-07 6.49E-07 7.27E-07 6.76E-07 5.33E-07
Std Dev Biased
1.90E-08 1.91E-08 1.92E-08 1.91E-08 2.18E-08 2.14E-08 1.94E-08
Ps90%/90% (+KTL) Biased
5.10E-07 5.64E-07 6.33E-07 7.01E-07 7.87E-07 7.35E-07 5.86E-07
Ps90%/90% (-KTL) Biased
4.05E-07 4.59E-07 5.28E-07 5.96E-07 6.67E-07 6.17E-07 4.80E-07
Un-Biased Statistics
Average Un-Biased
4.37E-07 4.97E-07 5.67E-07 6.35E-07 7.12E-07 6.88E-07 5.41E-07
Std Dev Un-Biased
3.17E-08 3.08E-08 3.62E-08 3.84E-08 3.87E-08 3.91E-08 3.33E-08
Ps90%/90% (+KTL) Un-Biased
5.24E-07 5.81E-07 6.66E-07 7.40E-07 8.19E-07 7.96E-07 6.33E-07
Ps90%/90% (-KTL) Un-Biased
3.49E-07 4.12E-07 4.68E-07 5.29E-07 6.06E-07 5.81E-07 4.50E-07
Specification MIN
-6.50E-07 -7.50E-07 -8.00E-07 -8.50E-07 -9.00E-07 -9.00E-07 -9.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
6.50E-07 7.50E-07 8.00E-07 8.50E-07 9.00E-07 9.00E-07 9.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
154
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.74. Plot of +Input Bias Current2_2 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
155
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.74. Raw data for +Input Bias Current2_2 5V (A) @ VS=+5V, VCM=5V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
+Input Bias Current2_2 5V (A)
24-hr
168-hr
@ VS=+5V, VCM=5V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.65E-07 5.22E-07 5.95E-07 6.64E-07 7.44E-07 6.96E-07 5.41E-07
681 4.75E-07 5.28E-07 5.94E-07 6.58E-07 7.33E-07 6.87E-07 5.50E-07
682 5.00E-07 5.56E-07 6.22E-07 6.95E-07 7.80E-07 7.24E-07 5.77E-07
683 4.43E-07 4.96E-07 5.63E-07 6.33E-07 7.04E-07 6.57E-07 5.17E-07
684 4.81E-07 5.38E-07 6.02E-07 6.72E-07 7.48E-07 6.99E-07 5.54E-07
685 4.49E-07 5.06E-07 5.76E-07 6.45E-07 7.22E-07 6.97E-07 5.52E-07
686 4.55E-07 5.14E-07 5.83E-07 6.51E-07 7.33E-07 7.07E-07 5.55E-07
688 3.73E-07 4.31E-07 4.94E-07 5.57E-07 6.36E-07 6.14E-07 4.76E-07
689 4.21E-07 4.79E-07 5.44E-07 6.09E-07 6.77E-07 6.59E-07 5.25E-07
690 4.45E-07 5.05E-07 5.85E-07 6.53E-07 7.33E-07 7.09E-07 5.57E-07
691 4.69E-07 4.68E-07 4.69E-07 4.69E-07 4.70E-07 4.71E-07 4.71E-07
692 4.64E-07 4.63E-07 4.64E-07 4.64E-07 4.64E-07 4.64E-07 4.65E-07
Biased Statistics
Average Biased
4.73E-07 5.28E-07 5.95E-07 6.64E-07 7.42E-07 6.93E-07 5.48E-07
Std Dev Biased
2.11E-08 2.21E-08 2.10E-08 2.24E-08 2.76E-08 2.42E-08 2.18E-08
Ps90%/90% (+KTL) Biased
5.31E-07 5.89E-07 6.53E-07 7.26E-07 8.18E-07 7.59E-07 6.08E-07
Ps90%/90% (-KTL) Biased
4.15E-07 4.67E-07 5.38E-07 6.03E-07 6.66E-07 6.26E-07 4.88E-07
Un-Biased Statistics
Average Un-Biased
4.29E-07 4.87E-07 5.56E-07 6.23E-07 7.00E-07 6.77E-07 5.33E-07
Std Dev Un-Biased
3.37E-08 3.37E-08 3.87E-08 4.09E-08 4.26E-08 4.06E-08 3.46E-08
Ps90%/90% (+KTL) Un-Biased
5.21E-07 5.80E-07 6.62E-07 7.35E-07 8.17E-07 7.88E-07 6.28E-07
Ps90%/90% (-KTL) Un-Biased
3.36E-07 3.95E-07 4.50E-07 5.11E-07 5.83E-07 5.66E-07 4.38E-07
Specification MIN
-6.50E-07 -7.50E-07 -8.00E-07 -8.50E-07 -9.00E-07 -9.00E-07 -9.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
6.50E-07 7.50E-07 8.00E-07 8.50E-07 9.00E-07 9.00E-07 9.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
156
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.75. Plot of -Input Bias Current2_1 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
157
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.75. Raw data for -Input Bias Current2_1 5V (A) @ VS=+5V, VCM=5V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
-Input Bias Current2_1 5V (A)
24-hr
168-hr
@ VS=+5V, VCM=5V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.59E-07 5.13E-07 5.86E-07 6.47E-07 7.28E-07 6.79E-07 5.35E-07
681 4.49E-07 5.04E-07 5.69E-07 6.34E-07 7.11E-07 6.62E-07 5.26E-07
682 4.89E-07 5.45E-07 6.09E-07 6.81E-07 7.64E-07 7.09E-07 5.66E-07
683 4.31E-07 4.88E-07 5.56E-07 6.23E-07 6.96E-07 6.46E-07 5.10E-07
684 4.52E-07 5.06E-07 5.75E-07 6.41E-07 7.18E-07 6.69E-07 5.32E-07
685 4.39E-07 4.99E-07 5.67E-07 6.35E-07 7.12E-07 6.86E-07 5.45E-07
686 4.43E-07 5.05E-07 5.75E-07 6.43E-07 7.22E-07 6.95E-07 5.48E-07
688 3.77E-07 4.35E-07 4.98E-07 5.60E-07 6.40E-07 6.14E-07 4.80E-07
689 4.17E-07 4.78E-07 5.47E-07 6.11E-07 6.84E-07 6.59E-07 5.26E-07
690 4.43E-07 5.03E-07 5.84E-07 6.54E-07 7.33E-07 7.09E-07 5.54E-07
691 4.50E-07 4.49E-07 4.50E-07 4.49E-07 4.49E-07 4.50E-07 4.50E-07
692 4.38E-07 4.37E-07 4.37E-07 4.37E-07 4.37E-07 4.38E-07 4.38E-07
Biased Statistics
Average Biased
4.56E-07 5.11E-07 5.79E-07 6.45E-07 7.23E-07 6.73E-07 5.34E-07
Std Dev Biased
2.11E-08 2.12E-08 2.00E-08 2.19E-08 2.56E-08 2.33E-08 2.08E-08
Ps90%/90% (+KTL) Biased
5.14E-07 5.69E-07 6.34E-07 7.05E-07 7.94E-07 7.37E-07 5.91E-07
Ps90%/90% (-KTL) Biased
3.98E-07 4.53E-07 5.24E-07 5.85E-07 6.53E-07 6.09E-07 4.77E-07
Un-Biased Statistics
Average Un-Biased
4.24E-07 4.84E-07 5.54E-07 6.20E-07 6.98E-07 6.73E-07 5.31E-07
Std Dev Un-Biased
2.85E-08 2.94E-08 3.44E-08 3.73E-08 3.76E-08 3.73E-08 3.04E-08
Ps90%/90% (+KTL) Un-Biased
5.02E-07 5.65E-07 6.48E-07 7.22E-07 8.01E-07 7.75E-07 6.14E-07
Ps90%/90% (-KTL) Un-Biased
3.46E-07 4.03E-07 4.60E-07 5.18E-07 5.95E-07 5.70E-07 4.47E-07
Specification MIN
-6.50E-07 -7.50E-07 -8.00E-07 -8.50E-07 -9.00E-07 -9.00E-07 -9.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
6.50E-07 7.50E-07 8.00E-07 8.50E-07 9.00E-07 9.00E-07 9.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
158
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.76. Plot of -Input Bias Current2_2 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
159
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.76. Raw data for -Input Bias Current2_2 5V (A) @ VS=+5V, VCM=5V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
-Input Bias Current2_2 5V (A)
24-hr
168-hr
@ VS=+5V, VCM=5V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.61E-07 5.18E-07 5.88E-07 6.54E-07 7.34E-07 6.85E-07 5.38E-07
681 4.49E-07 5.05E-07 5.71E-07 6.35E-07 7.14E-07 6.63E-07 5.27E-07
682 4.75E-07 5.32E-07 5.97E-07 6.68E-07 7.52E-07 6.96E-07 5.54E-07
683 4.22E-07 4.77E-07 5.44E-07 6.12E-07 6.84E-07 6.36E-07 4.99E-07
684 4.55E-07 5.10E-07 5.80E-07 6.46E-07 7.24E-07 6.75E-07 5.35E-07
685 4.37E-07 4.94E-07 5.62E-07 6.30E-07 7.05E-07 6.81E-07 5.42E-07
686 4.42E-07 5.01E-07 5.71E-07 6.38E-07 7.18E-07 6.90E-07 5.47E-07
688 3.68E-07 4.26E-07 4.88E-07 5.51E-07 6.31E-07 6.06E-07 4.71E-07
689 4.11E-07 4.69E-07 5.32E-07 5.95E-07 6.68E-07 6.45E-07 5.14E-07
690 4.40E-07 5.00E-07 5.79E-07 6.47E-07 7.24E-07 6.99E-07 5.52E-07
691 4.49E-07 4.49E-07 4.50E-07 4.49E-07 4.50E-07 4.50E-07 4.49E-07
692 4.36E-07 4.37E-07 4.36E-07 4.36E-07 4.35E-07 4.37E-07 4.36E-07
Biased Statistics
Average Biased
4.52E-07 5.09E-07 5.76E-07 6.43E-07 7.21E-07 6.71E-07 5.30E-07
Std Dev Biased
1.96E-08 2.04E-08 2.05E-08 2.11E-08 2.51E-08 2.32E-08 2.02E-08
Ps90%/90% (+KTL) Biased
5.06E-07 5.64E-07 6.32E-07 7.01E-07 7.90E-07 7.35E-07 5.86E-07
Ps90%/90% (-KTL) Biased
3.99E-07 4.53E-07 5.20E-07 5.85E-07 6.53E-07 6.07E-07 4.75E-07
Un-Biased Statistics
Average Un-Biased
4.20E-07 4.78E-07 5.46E-07 6.12E-07 6.89E-07 6.64E-07 5.25E-07
Std Dev Un-Biased
3.13E-08 3.16E-08 3.73E-08 3.93E-08 3.90E-08 3.84E-08 3.34E-08
Ps90%/90% (+KTL) Un-Biased
5.05E-07 5.65E-07 6.49E-07 7.20E-07 7.96E-07 7.69E-07 6.17E-07
Ps90%/90% (-KTL) Un-Biased
3.34E-07 3.92E-07 4.44E-07 5.04E-07 5.82E-07 5.59E-07 4.34E-07
Specification MIN
-6.50E-07 -7.50E-07 -8.00E-07 -8.50E-07 -9.00E-07 -9.00E-07 -9.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
6.50E-07 7.50E-07 8.00E-07 8.50E-07 9.00E-07 9.00E-07 9.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
160
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.77. Plot of Output Voltage Swing High1_1 5V (V) @ VS=+5V, IL=0mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
161
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.77. Raw data for Output Voltage Swing High1_1 5V (V) @ VS=+5V, IL=0mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High1_1 5V (V)
24-hr
168-hr
@ VS=+5V, IL=0mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 2.54E-03 2.70E-03 2.90E-03 3.10E-03 3.39E-03 3.22E-03 2.83E-03
681 2.54E-03 2.69E-03 2.85E-03 3.10E-03 3.39E-03 3.27E-03 2.90E-03
682 2.37E-03 2.60E-03 2.77E-03 2.93E-03 3.17E-03 3.12E-03 2.70E-03
683 2.41E-03 2.70E-03 2.85E-03 3.14E-03 3.23E-03 3.13E-03 2.89E-03
684 2.39E-03 2.75E-03 2.80E-03 3.00E-03 3.23E-03 3.15E-03 2.81E-03
685 2.48E-03 2.75E-03 2.81E-03 3.22E-03 3.66E-03 3.52E-03 2.87E-03
686 2.48E-03 2.76E-03 2.95E-03 3.24E-03 3.77E-03 3.70E-03 2.91E-03
688 2.47E-03 2.50E-03 2.70E-03 3.03E-03 3.54E-03 3.37E-03 2.79E-03
689 2.50E-03 2.64E-03 2.83E-03 3.30E-03 3.51E-03 3.56E-03 2.82E-03
690 2.54E-03 2.62E-03 2.95E-03 3.30E-03 3.90E-03 3.86E-03 3.10E-03
691 2.40E-03 2.48E-03 2.53E-03 2.52E-03 2.53E-03 2.52E-03 2.55E-03
692 2.75E-03 2.71E-03 2.80E-03 2.75E-03 2.78E-03 2.80E-03 2.86E-03
Biased Statistics
Average Biased
2.45E-03 2.69E-03 2.83E-03 3.05E-03 3.28E-03 3.18E-03 2.83E-03
Std Dev Biased
8.34E-05 5.45E-05 5.03E-05 8.65E-05 1.02E-04 6.46E-05 8.02E-05
Ps90%/90% (+KTL) Biased
2.68E-03 2.84E-03 2.97E-03 3.29E-03 3.56E-03 3.36E-03 3.05E-03
Ps90%/90% (-KTL) Biased
2.22E-03 2.54E-03 2.70E-03 2.82E-03 3.00E-03 3.00E-03 2.61E-03
Un-Biased Statistics
Average Un-Biased
2.49E-03 2.65E-03 2.85E-03 3.22E-03 3.68E-03 3.60E-03 2.90E-03
Std Dev Un-Biased
2.79E-05 1.07E-04 1.05E-04 1.11E-04 1.62E-04 1.86E-04 1.22E-04
Ps90%/90% (+KTL) Un-Biased
2.57E-03 2.95E-03 3.14E-03 3.52E-03 4.12E-03 4.11E-03 3.23E-03
Ps90%/90% (-KTL) Un-Biased
2.42E-03 2.36E-03 2.56E-03 2.91E-03 3.23E-03 3.09E-03 2.56E-03
Specification MAX
1.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
162
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.78. Plot of Output Voltage Swing High1_2 5V (V) @ VS=+5V, IL=0mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
163
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.78. Raw data for Output Voltage Swing High1_2 5V (V) @ VS=+5V, IL=0mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High1_2 5V (V)
24-hr
168-hr
@ VS=+5V, IL=0mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 2.71E-03 2.85E-03 3.05E-03 3.13E-03 3.51E-03 3.35E-03 2.91E-03
681 2.57E-03 2.77E-03 3.02E-03 3.13E-03 3.48E-03 3.39E-03 2.92E-03
682 2.54E-03 2.60E-03 2.96E-03 3.00E-03 3.23E-03 3.23E-03 2.97E-03
683 2.55E-03 2.76E-03 2.92E-03 3.08E-03 3.40E-03 3.23E-03 2.85E-03
684 2.53E-03 2.82E-03 2.88E-03 3.10E-03 3.42E-03 3.34E-03 2.87E-03
685 2.59E-03 2.67E-03 2.92E-03 3.24E-03 3.75E-03 3.68E-03 2.98E-03
686 2.58E-03 2.77E-03 3.11E-03 3.25E-03 3.86E-03 3.70E-03 3.02E-03
688 2.58E-03 2.60E-03 2.75E-03 3.08E-03 3.53E-03 3.35E-03 2.90E-03
689 2.50E-03 2.69E-03 2.95E-03 3.17E-03 3.68E-03 3.55E-03 2.94E-03
690 2.54E-03 2.70E-03 3.05E-03 3.32E-03 3.88E-03 3.79E-03 3.01E-03
691 2.56E-03 2.60E-03 2.63E-03 2.65E-03 2.62E-03 2.63E-03 2.65E-03
692 2.69E-03 2.69E-03 2.73E-03 2.79E-03 2.77E-03 2.75E-03 2.79E-03
Biased Statistics
Average Biased
2.58E-03 2.76E-03 2.97E-03 3.09E-03 3.41E-03 3.31E-03 2.90E-03
Std Dev Biased
7.42E-05 9.67E-05 6.99E-05 5.36E-05 1.09E-04 7.36E-05 4.67E-05
Ps90%/90% (+KTL) Biased
2.78E-03 3.03E-03 3.16E-03 3.23E-03 3.71E-03 3.51E-03 3.03E-03
Ps90%/90% (-KTL) Biased
2.38E-03 2.49E-03 2.77E-03 2.94E-03 3.11E-03 3.11E-03 2.78E-03
Un-Biased Statistics
Average Un-Biased
2.56E-03 2.69E-03 2.96E-03 3.21E-03 3.74E-03 3.61E-03 2.97E-03
Std Dev Un-Biased
3.77E-05 6.11E-05 1.38E-04 9.09E-05 1.43E-04 1.71E-04 5.00E-05
Ps90%/90% (+KTL) Un-Biased
2.66E-03 2.85E-03 3.33E-03 3.46E-03 4.13E-03 4.08E-03 3.11E-03
Ps90%/90% (-KTL) Un-Biased
2.45E-03 2.52E-03 2.58E-03 2.96E-03 3.35E-03 3.15E-03 2.83E-03
Specification MAX
1.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
164
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.79. Plot of Output Voltage Swing High2_1 5V (V) @ VS=+5V, IL=1mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
165
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.79. Raw data for Output Voltage Swing High2_1 5V (V) @ VS=+5V, IL=1mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High2_1 5V (V)
24-hr
168-hr
@ VS=+5V, IL=1mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 6.98E-02 7.20E-02 7.33E-02 7.51E-02 7.59E-02 7.50E-02 7.31E-02
681 7.08E-02 7.33E-02 7.45E-02 7.58E-02 7.68E-02 7.63E-02 7.46E-02
682 6.85E-02 7.08E-02 7.18E-02 7.29E-02 7.37E-02 7.33E-02 7.19E-02
683 7.07E-02 7.31E-02 7.41E-02 7.52E-02 7.63E-02 7.54E-02 7.39E-02
684 6.95E-02 7.18E-02 7.32E-02 7.40E-02 7.51E-02 7.45E-02 7.29E-02
685 6.92E-02 7.02E-02 7.11E-02 7.22E-02 7.36E-02 7.31E-02 7.12E-02
686 6.92E-02 7.00E-02 7.10E-02 7.21E-02 7.39E-02 7.32E-02 7.11E-02
688 6.77E-02 6.85E-02 6.92E-02 7.00E-02 7.13E-02 7.09E-02 6.93E-02
689 6.92E-02 7.02E-02 7.13E-02 7.23E-02 7.35E-02 7.33E-02 7.15E-02
690 7.05E-02 7.21E-02 7.29E-02 7.41E-02 7.57E-02 7.51E-02 7.27E-02
691 6.68E-02 6.68E-02 6.69E-02 6.69E-02 6.68E-02 6.67E-02 6.69E-02
692 7.06E-02 7.06E-02 7.06E-02 7.07E-02 7.05E-02 7.05E-02 7.05E-02
Biased Statistics
Average Biased
6.99E-02 7.22E-02 7.34E-02 7.46E-02 7.56E-02 7.49E-02 7.33E-02
Std Dev Biased
9.41E-04 1.00E-03 1.03E-03 1.13E-03 1.20E-03 1.09E-03 1.03E-03
Ps90%/90% (+KTL) Biased
7.24E-02 7.49E-02 7.62E-02 7.77E-02 7.88E-02 7.79E-02 7.61E-02
Ps90%/90% (-KTL) Biased
6.73E-02 6.95E-02 7.06E-02 7.15E-02 7.23E-02 7.19E-02 7.04E-02
Un-Biased Statistics
Average Un-Biased
6.92E-02 7.02E-02 7.11E-02 7.21E-02 7.36E-02 7.31E-02 7.12E-02
Std Dev Un-Biased
1.01E-03 1.30E-03 1.32E-03 1.46E-03 1.55E-03 1.48E-03 1.24E-03
Ps90%/90% (+KTL) Un-Biased
7.19E-02 7.38E-02 7.47E-02 7.61E-02 7.79E-02 7.72E-02 7.46E-02
Ps90%/90% (-KTL) Un-Biased
6.64E-02 6.66E-02 6.75E-02 6.81E-02 6.93E-02 6.90E-02 6.78E-02
Specification MAX
1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
166
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.80. Plot of Output Voltage Swing High2_2 5V (V) @ VS=+5V, IL=1mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
167
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.80. Raw data for Output Voltage Swing High2_2 5V (V) @ VS=+5V, IL=1mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High2_2 5V (V)
24-hr
168-hr
@ VS=+5V, IL=1mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 6.99E-02 7.21E-02 7.35E-02 7.52E-02 7.61E-02 7.52E-02 7.33E-02
681 7.10E-02 7.31E-02 7.43E-02 7.54E-02 7.65E-02 7.59E-02 7.41E-02
682 6.87E-02 7.10E-02 7.19E-02 7.30E-02 7.40E-02 7.34E-02 7.17E-02
683 7.05E-02 7.28E-02 7.39E-02 7.49E-02 7.60E-02 7.54E-02 7.38E-02
684 7.01E-02 7.22E-02 7.35E-02 7.43E-02 7.55E-02 7.49E-02 7.32E-02
685 6.90E-02 6.99E-02 7.10E-02 7.19E-02 7.35E-02 7.27E-02 7.10E-02
686 6.94E-02 7.04E-02 7.13E-02 7.23E-02 7.40E-02 7.35E-02 7.12E-02
688 6.78E-02 6.87E-02 6.92E-02 7.01E-02 7.13E-02 7.08E-02 6.95E-02
689 6.92E-02 7.02E-02 7.10E-02 7.20E-02 7.34E-02 7.30E-02 7.12E-02
690 7.05E-02 7.19E-02 7.27E-02 7.38E-02 7.56E-02 7.50E-02 7.28E-02
691 6.72E-02 6.72E-02 6.71E-02 6.73E-02 6.72E-02 6.71E-02 6.71E-02
692 7.04E-02 7.03E-02 7.03E-02 7.02E-02 7.04E-02 7.03E-02 7.03E-02
Biased Statistics
Average Biased
7.00E-02 7.22E-02 7.34E-02 7.46E-02 7.56E-02 7.50E-02 7.32E-02
Std Dev Biased
8.58E-04 8.02E-04 9.04E-04 9.61E-04 9.84E-04 9.60E-04 9.28E-04
Ps90%/90% (+KTL) Biased
7.24E-02 7.44E-02 7.59E-02 7.72E-02 7.83E-02 7.76E-02 7.57E-02
Ps90%/90% (-KTL) Biased
6.77E-02 7.00E-02 7.09E-02 7.19E-02 7.29E-02 7.23E-02 7.07E-02
Un-Biased Statistics
Average Un-Biased
6.92E-02 7.02E-02 7.10E-02 7.20E-02 7.36E-02 7.30E-02 7.11E-02
Std Dev Un-Biased
9.62E-04 1.15E-03 1.26E-03 1.33E-03 1.55E-03 1.52E-03 1.16E-03
Ps90%/90% (+KTL) Un-Biased
7.18E-02 7.34E-02 7.45E-02 7.56E-02 7.78E-02 7.72E-02 7.43E-02
Ps90%/90% (-KTL) Un-Biased
6.66E-02 6.70E-02 6.76E-02 6.84E-02 6.93E-02 6.88E-02 6.80E-02
Specification MAX
1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
168
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.81. Plot of Output Voltage Swing High3_1 5V (V) @ VS=+5V, IL=2.5mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
169
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.81. Raw data for Output Voltage Swing High3_1 5V (V) @ VS=+5V, IL=2.5mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High3_1 5V (V)
24-hr
168-hr
@ VS=+5V, IL=2.5mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 1.24E-01 1.27E-01 1.28E-01 1.31E-01 1.32E-01 1.30E-01 1.28E-01
681 1.26E-01 1.29E-01 1.30E-01 1.32E-01 1.33E-01 1.32E-01 1.30E-01
682 1.23E-01 1.26E-01 1.27E-01 1.28E-01 1.29E-01 1.29E-01 1.27E-01
683 1.26E-01 1.29E-01 1.30E-01 1.31E-01 1.33E-01 1.32E-01 1.30E-01
684 1.25E-01 1.27E-01 1.28E-01 1.30E-01 1.31E-01 1.30E-01 1.28E-01
685 1.24E-01 1.25E-01 1.26E-01 1.27E-01 1.29E-01 1.28E-01 1.26E-01
686 1.24E-01 1.25E-01 1.26E-01 1.27E-01 1.29E-01 1.28E-01 1.26E-01
688 1.23E-01 1.24E-01 1.25E-01 1.25E-01 1.27E-01 1.26E-01 1.25E-01
689 1.24E-01 1.25E-01 1.26E-01 1.28E-01 1.29E-01 1.29E-01 1.27E-01
690 1.26E-01 1.28E-01 1.28E-01 1.30E-01 1.32E-01 1.31E-01 1.28E-01
691 1.20E-01 1.20E-01 1.20E-01 1.20E-01 1.20E-01 1.20E-01 1.20E-01
692 1.26E-01 1.26E-01 1.26E-01 1.26E-01 1.26E-01 1.25E-01 1.26E-01
Biased Statistics
Average Biased
1.25E-01 1.27E-01 1.29E-01 1.30E-01 1.32E-01 1.31E-01 1.29E-01
Std Dev Biased
1.32E-03 1.39E-03 1.34E-03 1.44E-03 1.45E-03 1.42E-03 1.42E-03
Ps90%/90% (+KTL) Biased
1.29E-01 1.31E-01 1.32E-01 1.34E-01 1.36E-01 1.35E-01 1.33E-01
Ps90%/90% (-KTL) Biased
1.21E-01 1.24E-01 1.25E-01 1.26E-01 1.28E-01 1.27E-01 1.25E-01
Un-Biased Statistics
Average Un-Biased
1.24E-01 1.25E-01 1.26E-01 1.27E-01 1.29E-01 1.29E-01 1.26E-01
Std Dev Un-Biased
1.11E-03 1.57E-03 1.36E-03 1.57E-03 1.82E-03 1.69E-03 1.33E-03
Ps90%/90% (+KTL) Un-Biased
1.27E-01 1.30E-01 1.30E-01 1.32E-01 1.34E-01 1.33E-01 1.30E-01
Ps90%/90% (-KTL) Un-Biased
1.21E-01 1.21E-01 1.22E-01 1.23E-01 1.24E-01 1.24E-01 1.23E-01
Specification MAX
2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
170
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.82. Plot of Output Voltage Swing High3_2 5V (V) @ VS=+5V, IL=2.5mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
171
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.82. Raw data for Output Voltage Swing High3_2 5V (V) @ VS=+5V, IL=2.5mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High3_2 5V (V)
24-hr
168-hr
@ VS=+5V, IL=2.5mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 1.25E-01 1.27E-01 1.28E-01 1.31E-01 1.32E-01 1.31E-01 1.28E-01
681 1.26E-01 1.29E-01 1.30E-01 1.31E-01 1.32E-01 1.32E-01 1.30E-01
682 1.23E-01 1.26E-01 1.27E-01 1.28E-01 1.29E-01 1.29E-01 1.27E-01
683 1.26E-01 1.28E-01 1.30E-01 1.31E-01 1.32E-01 1.31E-01 1.30E-01
684 1.25E-01 1.28E-01 1.29E-01 1.30E-01 1.32E-01 1.31E-01 1.29E-01
685 1.23E-01 1.25E-01 1.26E-01 1.27E-01 1.29E-01 1.28E-01 1.26E-01
686 1.24E-01 1.25E-01 1.26E-01 1.27E-01 1.29E-01 1.29E-01 1.26E-01
688 1.23E-01 1.24E-01 1.25E-01 1.26E-01 1.27E-01 1.27E-01 1.25E-01
689 1.24E-01 1.25E-01 1.26E-01 1.27E-01 1.29E-01 1.29E-01 1.26E-01
690 1.26E-01 1.27E-01 1.28E-01 1.30E-01 1.32E-01 1.31E-01 1.28E-01
691 1.21E-01 1.21E-01 1.20E-01 1.21E-01 1.20E-01 1.20E-01 1.21E-01
692 1.25E-01 1.25E-01 1.25E-01 1.25E-01 1.25E-01 1.25E-01 1.25E-01
Biased Statistics
Average Biased
1.25E-01 1.27E-01 1.29E-01 1.30E-01 1.32E-01 1.31E-01 1.29E-01
Std Dev Biased
1.07E-03 1.15E-03 1.21E-03 1.20E-03 1.21E-03 1.10E-03 1.21E-03
Ps90%/90% (+KTL) Biased
1.28E-01 1.31E-01 1.32E-01 1.34E-01 1.35E-01 1.34E-01 1.32E-01
Ps90%/90% (-KTL) Biased
1.22E-01 1.24E-01 1.25E-01 1.27E-01 1.28E-01 1.28E-01 1.25E-01
Un-Biased Statistics
Average Un-Biased
1.24E-01 1.25E-01 1.26E-01 1.27E-01 1.29E-01 1.29E-01 1.26E-01
Std Dev Un-Biased
1.09E-03 1.36E-03 1.25E-03 1.55E-03 1.65E-03 1.51E-03 1.18E-03
Ps90%/90% (+KTL) Un-Biased
1.27E-01 1.29E-01 1.29E-01 1.32E-01 1.34E-01 1.33E-01 1.29E-01
Ps90%/90% (-KTL) Un-Biased
1.21E-01 1.21E-01 1.23E-01 1.23E-01 1.25E-01 1.24E-01 1.23E-01
Specification MAX
2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
172
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.83. Plot of Output Voltage Swing Low1_1 5V (V) @ VS=+5V, IL=0mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
173
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.83. Raw data for Output Voltage Swing Low1_1 5V (V) @ VS=+5V, IL=0mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low1_1 5V (V)
24-hr
168-hr
@ VS=+5V, IL=0mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 1.57E-02 1.60E-02 1.65E-02 1.70E-02 1.75E-02 1.70E-02 1.62E-02
681 1.58E-02 1.61E-02 1.65E-02 1.67E-02 1.73E-02 1.72E-02 1.68E-02
682 1.53E-02 1.58E-02 1.58E-02 1.62E-02 1.67E-02 1.67E-02 1.60E-02
683 1.57E-02 1.59E-02 1.64E-02 1.67E-02 1.72E-02 1.73E-02 1.64E-02
684 1.58E-02 1.60E-02 1.62E-02 1.67E-02 1.72E-02 1.70E-02 1.64E-02
685 1.56E-02 1.60E-02 1.62E-02 1.68E-02 1.75E-02 1.74E-02 1.64E-02
686 1.56E-02 1.58E-02 1.62E-02 1.67E-02 1.76E-02 1.73E-02 1.63E-02
688 1.53E-02 1.53E-02 1.57E-02 1.58E-02 1.68E-02 1.66E-02 1.57E-02
689 1.57E-02 1.62E-02 1.63E-02 1.68E-02 1.73E-02 1.72E-02 1.66E-02
690 1.57E-02 1.58E-02 1.61E-02 1.67E-02 1.76E-02 1.73E-02 1.64E-02
691 1.56E-02 1.55E-02 1.54E-02 1.56E-02 1.57E-02 1.56E-02 1.56E-02
692 1.59E-02 1.59E-02 1.58E-02 1.58E-02 1.57E-02 1.57E-02 1.57E-02
Biased Statistics
Average Biased
1.57E-02 1.60E-02 1.63E-02 1.67E-02 1.72E-02 1.70E-02 1.64E-02
Std Dev Biased
1.97E-04 1.22E-04 2.90E-04 2.86E-04 2.75E-04 2.35E-04 2.86E-04
Ps90%/90% (+KTL) Biased
1.62E-02 1.63E-02 1.71E-02 1.75E-02 1.79E-02 1.77E-02 1.71E-02
Ps90%/90% (-KTL) Biased
1.51E-02 1.56E-02 1.55E-02 1.59E-02 1.64E-02 1.64E-02 1.56E-02
Un-Biased Statistics
Average Un-Biased
1.56E-02 1.58E-02 1.61E-02 1.65E-02 1.73E-02 1.71E-02 1.63E-02
Std Dev Un-Biased
1.55E-04 3.34E-04 2.15E-04 4.45E-04 3.32E-04 3.24E-04 3.26E-04
Ps90%/90% (+KTL) Un-Biased
1.60E-02 1.67E-02 1.67E-02 1.78E-02 1.82E-02 1.80E-02 1.72E-02
Ps90%/90% (-KTL) Un-Biased
1.51E-02 1.49E-02 1.55E-02 1.53E-02 1.64E-02 1.62E-02 1.54E-02
Specification MAX
3.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
174
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.84. Plot of Output Voltage Swing Low1_2 5V (V) @ VS=+5V, IL=0mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
175
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.84. Raw data for Output Voltage Swing Low1_2 5V (V) @ VS=+5V, IL=0mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low1_2 5V (V)
24-hr
168-hr
@ VS=+5V, IL=0mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 1.58E-02 1.62E-02 1.67E-02 1.72E-02 1.79E-02 1.73E-02 1.65E-02
681 1.59E-02 1.63E-02 1.65E-02 1.71E-02 1.75E-02 1.74E-02 1.69E-02
682 1.57E-02 1.59E-02 1.61E-02 1.65E-02 1.70E-02 1.70E-02 1.64E-02
683 1.57E-02 1.60E-02 1.63E-02 1.67E-02 1.73E-02 1.71E-02 1.63E-02
684 1.59E-02 1.65E-02 1.66E-02 1.70E-02 1.73E-02 1.74E-02 1.69E-02
685 1.60E-02 1.62E-02 1.67E-02 1.69E-02 1.75E-02 1.76E-02 1.70E-02
686 1.57E-02 1.61E-02 1.65E-02 1.71E-02 1.79E-02 1.78E-02 1.66E-02
688 1.55E-02 1.55E-02 1.58E-02 1.59E-02 1.65E-02 1.66E-02 1.58E-02
689 1.58E-02 1.63E-02 1.63E-02 1.69E-02 1.76E-02 1.76E-02 1.67E-02
690 1.58E-02 1.64E-02 1.64E-02 1.72E-02 1.77E-02 1.77E-02 1.70E-02
691 1.58E-02 1.56E-02 1.59E-02 1.59E-02 1.57E-02 1.58E-02 1.59E-02
692 1.59E-02 1.59E-02 1.61E-02 1.60E-02 1.60E-02 1.60E-02 1.60E-02
Biased Statistics
Average Biased
1.58E-02 1.62E-02 1.64E-02 1.69E-02 1.74E-02 1.72E-02 1.66E-02
Std Dev Biased
9.15E-05 2.40E-04 2.53E-04 2.86E-04 3.06E-04 1.81E-04 2.70E-04
Ps90%/90% (+KTL) Biased
1.61E-02 1.68E-02 1.71E-02 1.77E-02 1.82E-02 1.77E-02 1.73E-02
Ps90%/90% (-KTL) Biased
1.56E-02 1.55E-02 1.58E-02 1.61E-02 1.66E-02 1.67E-02 1.58E-02
Un-Biased Statistics
Average Un-Biased
1.58E-02 1.61E-02 1.63E-02 1.68E-02 1.74E-02 1.75E-02 1.66E-02
Std Dev Un-Biased
1.90E-04 3.40E-04 3.38E-04 5.26E-04 5.64E-04 4.76E-04 4.79E-04
Ps90%/90% (+KTL) Un-Biased
1.63E-02 1.70E-02 1.72E-02 1.83E-02 1.90E-02 1.88E-02 1.79E-02
Ps90%/90% (-KTL) Un-Biased
1.52E-02 1.52E-02 1.54E-02 1.54E-02 1.59E-02 1.62E-02 1.53E-02
Specification MAX
3.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
176
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.85. Plot of Output Voltage Swing Low2_1 5V (V) @ VS=+5V, IL=1mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
177
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.85. Raw data for Output Voltage Swing Low2_1 5V (V) @ VS=+5V, IL=1mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low2_1 5V (V)
24-hr
168-hr
@ VS=+5V, IL=1mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 3.48E-02 3.57E-02 3.59E-02 3.68E-02 3.74E-02 3.71E-02 3.63E-02
681 3.53E-02 3.60E-02 3.66E-02 3.70E-02 3.77E-02 3.73E-02 3.67E-02
682 3.45E-02 3.52E-02 3.54E-02 3.59E-02 3.66E-02 3.63E-02 3.57E-02
683 3.53E-02 3.60E-02 3.64E-02 3.68E-02 3.74E-02 3.72E-02 3.64E-02
684 3.51E-02 3.57E-02 3.61E-02 3.68E-02 3.71E-02 3.71E-02 3.64E-02
685 3.53E-02 3.59E-02 3.59E-02 3.65E-02 3.74E-02 3.69E-02 3.62E-02
686 3.51E-02 3.57E-02 3.59E-02 3.65E-02 3.74E-02 3.71E-02 3.60E-02
688 3.40E-02 3.44E-02 3.47E-02 3.52E-02 3.58E-02 3.54E-02 3.45E-02
689 3.53E-02 3.56E-02 3.58E-02 3.66E-02 3.70E-02 3.70E-02 3.62E-02
690 3.51E-02 3.55E-02 3.58E-02 3.65E-02 3.73E-02 3.70E-02 3.58E-02
691 3.47E-02 3.48E-02 3.45E-02 3.48E-02 3.47E-02 3.47E-02 3.46E-02
692 3.57E-02 3.54E-02 3.56E-02 3.55E-02 3.53E-02 3.56E-02 3.54E-02
Biased Statistics
Average Biased
3.50E-02 3.57E-02 3.61E-02 3.67E-02 3.72E-02 3.70E-02 3.63E-02
Std Dev Biased
3.61E-04 3.29E-04 4.68E-04 4.12E-04 4.15E-04 3.98E-04 3.84E-04
Ps90%/90% (+KTL) Biased
3.60E-02 3.66E-02 3.74E-02 3.78E-02 3.84E-02 3.81E-02 3.74E-02
Ps90%/90% (-KTL) Biased
3.40E-02 3.48E-02 3.48E-02 3.55E-02 3.61E-02 3.59E-02 3.53E-02
Un-Biased Statistics
Average Un-Biased
3.49E-02 3.54E-02 3.56E-02 3.63E-02 3.70E-02 3.67E-02 3.57E-02
Std Dev Un-Biased
5.49E-04 5.66E-04 5.35E-04 5.84E-04 6.82E-04 7.12E-04 7.20E-04
Ps90%/90% (+KTL) Un-Biased
3.65E-02 3.70E-02 3.71E-02 3.79E-02 3.89E-02 3.86E-02 3.77E-02
Ps90%/90% (-KTL) Un-Biased
3.34E-02 3.39E-02 3.42E-02 3.47E-02 3.51E-02 3.47E-02 3.37E-02
Specification MAX
1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
178
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.86. Plot of Output Voltage Swing Low2_2 5V (V) @ VS=+5V, IL=1mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
179
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.86. Raw data for Output Voltage Swing Low2_2 5V (V) @ VS=+5V, IL=1mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low2_2 5V (V)
24-hr
168-hr
@ VS=+5V, IL=1mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 3.54E-02 3.61E-02 3.67E-02 3.73E-02 3.81E-02 3.77E-02 3.68E-02
681 3.57E-02 3.65E-02 3.68E-02 3.71E-02 3.78E-02 3.81E-02 3.72E-02
682 3.51E-02 3.55E-02 3.60E-02 3.65E-02 3.69E-02 3.71E-02 3.62E-02
683 3.56E-02 3.60E-02 3.63E-02 3.68E-02 3.74E-02 3.73E-02 3.66E-02
684 3.55E-02 3.61E-02 3.67E-02 3.69E-02 3.73E-02 3.79E-02 3.70E-02
685 3.57E-02 3.63E-02 3.67E-02 3.69E-02 3.78E-02 3.75E-02 3.67E-02
686 3.56E-02 3.64E-02 3.63E-02 3.70E-02 3.80E-02 3.78E-02 3.67E-02
688 3.43E-02 3.44E-02 3.49E-02 3.54E-02 3.59E-02 3.57E-02 3.51E-02
689 3.54E-02 3.61E-02 3.63E-02 3.68E-02 3.74E-02 3.73E-02 3.66E-02
690 3.53E-02 3.63E-02 3.63E-02 3.71E-02 3.78E-02 3.76E-02 3.68E-02
691 3.52E-02 3.54E-02 3.55E-02 3.54E-02 3.52E-02 3.52E-02 3.53E-02
692 3.60E-02 3.57E-02 3.58E-02 3.57E-02 3.60E-02 3.60E-02 3.57E-02
Biased Statistics
Average Biased
3.55E-02 3.60E-02 3.65E-02 3.69E-02 3.75E-02 3.76E-02 3.67E-02
Std Dev Biased
2.62E-04 3.78E-04 3.31E-04 2.88E-04 4.49E-04 3.99E-04 3.72E-04
Ps90%/90% (+KTL) Biased
3.62E-02 3.71E-02 3.74E-02 3.77E-02 3.87E-02 3.87E-02 3.78E-02
Ps90%/90% (-KTL) Biased
3.47E-02 3.50E-02 3.56E-02 3.61E-02 3.63E-02 3.65E-02 3.57E-02
Un-Biased Statistics
Average Un-Biased
3.53E-02 3.59E-02 3.61E-02 3.67E-02 3.74E-02 3.72E-02 3.64E-02
Std Dev Un-Biased
5.47E-04 8.34E-04 6.98E-04 6.98E-04 8.51E-04 8.44E-04 7.35E-04
Ps90%/90% (+KTL) Un-Biased
3.68E-02 3.82E-02 3.80E-02 3.86E-02 3.97E-02 3.95E-02 3.84E-02
Ps90%/90% (-KTL) Un-Biased
3.38E-02 3.36E-02 3.42E-02 3.47E-02 3.50E-02 3.49E-02 3.43E-02
Specification MAX
1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
180
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.87. Plot of Output Voltage Swing Low3_1 5V (V) @ VS=+5V, IL=2.5mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
181
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.87. Raw data for Output Voltage Swing Low3_1 5V (V) @ VS=+5V, IL=2.5mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low3_1 5V (V)
24-hr
168-hr
@ VS=+5V, IL=2.5mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 7.46E-02 7.58E-02 7.64E-02 7.78E-02 7.82E-02 7.77E-02 7.67E-02
681 7.60E-02 7.67E-02 7.74E-02 7.80E-02 7.84E-02 7.88E-02 7.77E-02
682 7.41E-02 7.57E-02 7.57E-02 7.65E-02 7.74E-02 7.67E-02 7.59E-02
683 7.57E-02 7.66E-02 7.74E-02 7.77E-02 7.86E-02 7.80E-02 7.75E-02
684 7.55E-02 7.67E-02 7.68E-02 7.76E-02 7.83E-02 7.82E-02 7.73E-02
685 7.54E-02 7.61E-02 7.64E-02 7.71E-02 7.80E-02 7.77E-02 7.68E-02
686 7.54E-02 7.58E-02 7.62E-02 7.72E-02 7.80E-02 7.78E-02 7.62E-02
688 7.44E-02 7.46E-02 7.51E-02 7.53E-02 7.60E-02 7.59E-02 7.53E-02
689 7.58E-02 7.61E-02 7.66E-02 7.75E-02 7.80E-02 7.79E-02 7.69E-02
690 7.56E-02 7.64E-02 7.63E-02 7.74E-02 7.79E-02 7.79E-02 7.65E-02
691 7.43E-02 7.45E-02 7.45E-02 7.43E-02 7.46E-02 7.44E-02 7.44E-02
692 7.61E-02 7.62E-02 7.63E-02 7.63E-02 7.62E-02 7.61E-02 7.64E-02
Biased Statistics
Average Biased
7.52E-02 7.63E-02 7.67E-02 7.75E-02 7.82E-02 7.78E-02 7.70E-02
Std Dev Biased
8.03E-04 5.19E-04 6.97E-04 5.91E-04 4.87E-04 7.66E-04 7.04E-04
Ps90%/90% (+KTL) Biased
7.74E-02 7.77E-02 7.87E-02 7.91E-02 7.95E-02 7.99E-02 7.89E-02
Ps90%/90% (-KTL) Biased
7.30E-02 7.49E-02 7.48E-02 7.59E-02 7.68E-02 7.57E-02 7.51E-02
Un-Biased Statistics
Average Un-Biased
7.53E-02 7.58E-02 7.61E-02 7.69E-02 7.76E-02 7.74E-02 7.64E-02
Std Dev Un-Biased
5.38E-04 7.27E-04 6.06E-04 8.96E-04 8.67E-04 8.72E-04 6.27E-04
Ps90%/90% (+KTL) Un-Biased
7.68E-02 7.78E-02 7.78E-02 7.94E-02 8.00E-02 7.98E-02 7.81E-02
Ps90%/90% (-KTL) Un-Biased
7.38E-02 7.38E-02 7.44E-02 7.44E-02 7.52E-02 7.51E-02 7.46E-02
Specification MAX
2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
182
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.88. Plot of Output Voltage Swing Low3_2 5V (V) @ VS=+5V, IL=2.5mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
183
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.88. Raw data for Output Voltage Swing Low3_2 5V (V) @ VS=+5V, IL=2.5mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low3_2 5V (V)
24-hr
168-hr
@ VS=+5V, IL=2.5mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 7.62E-02 7.71E-02 7.76E-02 7.87E-02 7.90E-02 7.89E-02 7.76E-02
681 7.70E-02 7.76E-02 7.82E-02 7.86E-02 7.95E-02 7.90E-02 7.83E-02
682 7.54E-02 7.63E-02 7.65E-02 7.71E-02 7.82E-02 7.78E-02 7.68E-02
683 7.66E-02 7.72E-02 7.76E-02 7.81E-02 7.92E-02 7.86E-02 7.79E-02
684 7.67E-02 7.74E-02 7.78E-02 7.83E-02 7.93E-02 7.90E-02 7.82E-02
685 7.65E-02 7.67E-02 7.75E-02 7.78E-02 7.88E-02 7.83E-02 7.73E-02
686 7.65E-02 7.69E-02 7.72E-02 7.78E-02 7.86E-02 7.84E-02 7.72E-02
688 7.48E-02 7.49E-02 7.55E-02 7.60E-02 7.69E-02 7.66E-02 7.59E-02
689 7.66E-02 7.73E-02 7.75E-02 7.80E-02 7.85E-02 7.84E-02 7.77E-02
690 7.66E-02 7.75E-02 7.79E-02 7.82E-02 7.90E-02 7.87E-02 7.75E-02
691 7.55E-02 7.56E-02 7.56E-02 7.55E-02 7.55E-02 7.54E-02 7.54E-02
692 7.70E-02 7.71E-02 7.71E-02 7.73E-02 7.73E-02 7.70E-02 7.70E-02
Biased Statistics
Average Biased
7.64E-02 7.71E-02 7.75E-02 7.82E-02 7.90E-02 7.87E-02 7.78E-02
Std Dev Biased
6.05E-04 5.08E-04 6.18E-04 6.63E-04 5.29E-04 5.11E-04 5.89E-04
Ps90%/90% (+KTL) Biased
7.80E-02 7.85E-02 7.92E-02 8.00E-02 8.05E-02 8.01E-02 7.94E-02
Ps90%/90% (-KTL) Biased
7.47E-02 7.57E-02 7.58E-02 7.63E-02 7.76E-02 7.73E-02 7.62E-02
Un-Biased Statistics
Average Un-Biased
7.62E-02 7.66E-02 7.72E-02 7.76E-02 7.84E-02 7.81E-02 7.71E-02
Std Dev Un-Biased
8.04E-04 1.03E-03 9.32E-04 9.01E-04 8.57E-04 8.36E-04 7.42E-04
Ps90%/90% (+KTL) Un-Biased
7.84E-02 7.95E-02 7.97E-02 8.00E-02 8.07E-02 8.04E-02 7.92E-02
Ps90%/90% (-KTL) Un-Biased
7.40E-02 7.38E-02 7.46E-02 7.51E-02 7.60E-02 7.58E-02 7.51E-02
Specification MAX
2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
184
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.89. Plot of Large Signal Voltage Gain1_1 5V (V/mV) @ VS=+5V, VO=75mV TO 4.8V, RL=10kΩ
versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
185
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.89. Raw data for Large Signal Voltage Gain1_1 5V (V/mV) @ VS=+5V, VO=75mV TO 4.8V,
RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain1_1 5V (V/mV)
@ VS=+5V, VO=75mV TO 4.8V, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
8.02E+03
1.02E+04
5.49E+03
5.49E+03
8.63E+03
7.19E+03
8.53E+03
4.68E+03
5.22E+03
1.24E+04
1.05E+04
4.35E+03
Total Dose (krad(Si))
20
50
100
1.58E+04 9.82E+03 8.26E+03
8.83E+03 1.25E+04 1.18E+04
5.56E+03 6.89E+03 4.38E+03
5.83E+03 4.51E+03 4.07E+03
1.44E+04 4.23E+03 1.12E+04
1.40E+04 3.53E+03 1.32E+04
3.99E+03 3.98E+03 3.45E+03
5.22E+03 4.94E+03 3.43E+03
6.20E+03 4.29E+03 4.60E+03
1.46E+04 8.77E+04 9.54E+03
1.00E+04 1.02E+04 1.07E+04
4.50E+03 4.62E+03 4.39E+03
200
5.97E+03
2.59E+04
5.03E+03
8.72E+03
9.52E+03
6.50E+03
3.65E+03
7.90E+03
1.35E+04
1.69E+04
9.75E+03
4.37E+03
24-hr
Anneal
225
8.22E+03
5.23E+03
4.53E+03
4.50E+03
9.61E+03
5.33E+03
1.32E+04
1.17E+04
6.93E+03
9.18E+03
9.96E+03
4.22E+03
168-hr
Anneal
250
4.82E+03
9.53E+03
7.68E+03
4.54E+03
5.95E+03
5.44E+03
8.71E+03
3.31E+03
4.49E+03
4.97E+03
1.14E+04
4.52E+03
7.56E+03
2.06E+03
1.32E+04
1.93E+03
1.01E+04
4.80E+03
2.32E+04
-3.06E+03
7.58E+03
3.54E+03
1.73E+04
-2.12E+03
7.93E+03
3.63E+03
1.79E+04
-2.04E+03
1.10E+04
8.54E+03
3.44E+04
-1.24E+04
6.42E+03
2.35E+03
1.29E+04
-3.08E+01
6.50E+03
2.10E+03
1.23E+04
7.52E+02
7.60E+03
3.08E+03
1.60E+04
-8.51E+02
6.00E+02
PASS
8.81E+03
5.10E+03
2.28E+04
-5.16E+03
3.00E+02
PASS
2.09E+04
3.74E+04
1.23E+05
-8.15E+04
3.00E+02
PASS
6.84E+03
4.35E+03
1.88E+04
-5.09E+03
3.00E+02
PASS
9.67E+03
5.37E+03
2.44E+04
-5.06E+03
3.00E+02
PASS
9.26E+03
3.25E+03
1.82E+04
3.47E+02
3.00E+02
PASS
5.38E+03
2.02E+03
1.09E+04
-1.61E+02
3.00E+02
PASS
An ISO 9001:2008 and DLA Certified Company
186
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.90. Plot of Large Signal Voltage Gain1_2 5V (V/mV) @ VS=+5V, VO=75mV TO 4.8V, RL=10kΩ
versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
187
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.90. Raw data for Large Signal Voltage Gain1_2 5V (V/mV) @ VS=+5V, VO=75mV TO 4.8V,
RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain1_2 5V (V/mV)
@ VS=+5V, VO=75mV TO 4.8V, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
5.45E+03
4.48E+03
3.66E+03
2.10E+03
1.94E+03
3.18E+03
3.23E+03
3.66E+03
2.03E+03
1.88E+03
2.72E+03
3.57E+03
24-hr
Anneal
225
3.25E+03
2.94E+03
3.48E+03
2.51E+03
2.82E+03
1.61E+03
2.55E+03
1.74E+03
2.63E+03
1.41E+03
2.62E+03
2.56E+03
168-hr
Anneal
250
2.99E+03
2.65E+03
3.77E+03
3.84E+03
2.59E+03
2.46E+03
2.42E+03
4.57E+03
3.40E+03
1.97E+03
1.96E+03
2.73E+03
0
3.69E+03
3.58E+03
4.29E+03
3.52E+03
3.07E+03
2.62E+03
2.60E+03
2.99E+03
4.44E+03
2.15E+03
2.73E+03
3.77E+03
Total Dose (krad(Si))
20
50
100
3.92E+03 2.54E+03 2.88E+03
2.67E+03 2.90E+03 2.74E+03
4.25E+03 2.68E+03 2.30E+03
3.50E+03 3.22E+03 4.51E+03
3.24E+03 3.24E+03 5.04E+03
2.55E+03 3.14E+03 2.47E+03
3.41E+03 3.08E+03 2.87E+03
2.26E+03 1.86E+03 2.21E+03
3.33E+03 2.88E+03 2.83E+03
2.24E+03 2.11E+03 1.45E+03
2.81E+03 2.65E+03 2.67E+03
2.36E+03 3.06E+03 2.67E+03
3.63E+03
4.38E+02
4.83E+03
2.43E+03
3.52E+03
6.11E+02
5.19E+03
1.84E+03
2.92E+03
3.14E+02
3.78E+03
2.06E+03
3.49E+03
1.20E+03
6.79E+03
1.99E+02
3.52E+03
1.51E+03
7.68E+03
-6.29E+02
3.00E+03
3.78E+02
4.04E+03
1.96E+03
3.17E+03
6.02E+02
4.82E+03
1.52E+03
2.96E+03
8.78E+02
5.37E+03
5.50E+02
6.00E+02
PASS
2.76E+03
5.72E+02
4.32E+03
1.19E+03
3.00E+02
PASS
2.61E+03
5.89E+02
4.23E+03
1.00E+03
3.00E+02
PASS
2.37E+03
5.77E+02
3.95E+03
7.86E+02
3.00E+02
PASS
2.79E+03
7.92E+02
4.96E+03
6.21E+02
3.00E+02
PASS
1.99E+03
5.63E+02
3.53E+03
4.44E+02
3.00E+02
PASS
2.96E+03
1.04E+03
5.81E+03
1.14E+02
3.00E+02
PASS
An ISO 9001:2008 and DLA Certified Company
188
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.91. Plot of Common Mode Rejection Ratio1_1 5V (dB) @ VS=+5V, VCM=0 TO 5V versus total dose.
The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied
to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by
KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
189
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.91. Raw data for Common Mode Rejection Ratio1_1 5V (dB) @ VS=+5V, VCM=0 TO 5V versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio1_1 5V (dB)
@ VS=+5V, VCM=0 TO 5V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
9.32E+01
8.92E+01
8.90E+01
8.62E+01
1.14E+02
1.07E+02
9.38E+01
8.50E+01
1.06E+02
1.10E+02
1.17E+02
8.94E+01
24-hr
Anneal
225
9.43E+01
8.98E+01
8.98E+01
8.67E+01
1.25E+02
1.09E+02
9.38E+01
8.53E+01
1.05E+02
1.11E+02
1.17E+02
8.94E+01
168-hr
Anneal
250
9.87E+01
9.03E+01
9.25E+01
8.73E+01
1.20E+02
1.15E+02
9.23E+01
8.65E+01
1.11E+02
1.23E+02
1.17E+02
8.94E+01
9.84E+01
2.00E+01
1.53E+02
4.35E+01
9.42E+01
1.11E+01
1.25E+02
6.39E+01
9.72E+01
1.59E+01
1.41E+02
5.35E+01
9.77E+01
1.30E+01
1.33E+02
6.21E+01
1.03E+02
1.35E+01
1.40E+02
6.54E+01
7.00E+01
PASS
1.00E+02
1.04E+01
1.29E+02
7.16E+01
7.00E+01
PASS
1.01E+02
1.10E+01
1.31E+02
7.08E+01
7.00E+01
PASS
1.06E+02
1.56E+01
1.49E+02
6.28E+01
7.00E+01
PASS
0
9.59E+01
8.87E+01
8.96E+01
8.47E+01
1.10E+02
1.06E+02
8.94E+01
8.47E+01
1.09E+02
1.10E+02
1.17E+02
8.94E+01
Total Dose (krad(Si))
20
50
100
9.42E+01 9.40E+01 9.39E+01
8.81E+01 8.88E+01 8.90E+01
8.88E+01 8.91E+01 8.90E+01
8.44E+01 8.52E+01 8.62E+01
1.11E+02 1.17E+02 1.34E+02
1.08E+02 1.25E+02 1.14E+02
8.93E+01 9.08E+01 9.24E+01
8.40E+01 8.46E+01 8.50E+01
1.06E+02 1.05E+02 1.05E+02
1.14E+02 1.29E+02 1.16E+02
1.17E+02 1.17E+02 1.17E+02
8.94E+01 8.94E+01 8.94E+01
9.37E+01
9.75E+00
1.20E+02
6.70E+01
9.32E+01
1.04E+01
1.22E+02
6.48E+01
9.48E+01
1.28E+01
1.30E+02
5.97E+01
9.97E+01
1.18E+01
1.32E+02
6.74E+01
7.60E+01
PASS
1.00E+02
1.27E+01
1.35E+02
6.52E+01
7.00E+01
PASS
1.07E+02
1.98E+01
1.61E+02
5.26E+01
7.00E+01
PASS
An ISO 9001:2008 and DLA Certified Company
190
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.92. Plot of Common Mode Rejection Ratio1_2 5V (dB) @ VS=+5V, VCM=0 TO 5V versus total dose.
The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied
to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by
KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
191
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.92. Raw data for Common Mode Rejection Ratio1_2 5V (dB) @ VS=+5V, VCM=0 TO 5V versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio1_2 5V (dB)
@ VS=+5V, VCM=0 TO 5V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
9.48E+01
9.45E+01
8.79E+01
9.91E+01
8.66E+01
1.11E+02
1.01E+02
9.81E+01
9.91E+01
1.08E+02
9.59E+01
9.22E+01
24-hr
Anneal
225
9.56E+01
9.53E+01
8.82E+01
1.01E+02
8.70E+01
1.10E+02
1.02E+02
9.75E+01
9.83E+01
1.08E+02
9.59E+01
9.22E+01
168-hr
Anneal
250
9.74E+01
9.87E+01
8.92E+01
1.11E+02
8.74E+01
1.01E+02
1.09E+02
9.64E+01
9.64E+01
1.15E+02
9.59E+01
9.22E+01
9.38E+01
6.19E+00
1.11E+02
7.68E+01
9.26E+01
5.22E+00
1.07E+02
7.83E+01
9.34E+01
5.79E+00
1.09E+02
7.75E+01
9.68E+01
9.42E+00
1.23E+02
7.09E+01
1.04E+02
6.53E+00
1.21E+02
8.56E+01
7.00E+01
PASS
1.03E+02
5.54E+00
1.19E+02
8.82E+01
7.00E+01
PASS
1.03E+02
5.56E+00
1.18E+02
8.78E+01
7.00E+01
PASS
1.03E+02
8.25E+00
1.26E+02
8.09E+01
7.00E+01
PASS
0
9.83E+01
9.93E+01
8.92E+01
1.16E+02
8.88E+01
9.88E+01
1.35E+02
9.47E+01
9.49E+01
1.10E+02
9.58E+01
9.22E+01
Total Dose (krad(Si))
20
50
100
9.78E+01 9.73E+01 9.58E+01
9.85E+01 9.70E+01 9.57E+01
8.90E+01 8.88E+01 8.83E+01
1.17E+02 1.07E+02 1.02E+02
8.80E+01 8.76E+01 8.71E+01
9.98E+01 1.02E+02 1.06E+02
1.14E+02 1.09E+02 1.04E+02
9.56E+01 9.63E+01 9.68E+01
9.57E+01 9.65E+01 9.79E+01
1.15E+02 1.23E+02 1.13E+02
9.58E+01 9.58E+01 9.59E+01
9.22E+01 9.22E+01 9.22E+01
9.84E+01
1.11E+01
1.29E+02
6.79E+01
9.81E+01
1.18E+01
1.31E+02
6.58E+01
9.55E+01
7.83E+00
1.17E+02
7.41E+01
1.07E+02
1.72E+01
1.54E+02
5.98E+01
7.60E+01
PASS
1.04E+02
9.74E+00
1.31E+02
7.73E+01
7.00E+01
PASS
1.05E+02
1.12E+01
1.36E+02
7.48E+01
7.00E+01
PASS
An ISO 9001:2008 and DLA Certified Company
192
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.93. Plot of CMRR Match1 5V (dB) @ VS=+5V versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence
limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s)
are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DLA Certified Company
193
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.93. Raw data for CMRR Match1 5V (dB) @ VS=+5V versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
CMRR Match1 5V (dB)
@ VS=+5V
Device
680
681
682
683
684
685
686
688
689
690
691
692
0
1.21E+02
9.28E+01
1.05E+02
8.54E+01
8.79E+01
1.03E+02
9.03E+01
8.31E+01
9.33E+01
1.32E+02
9.49E+01
1.01E+02
Biased Statistics
Average Biased
9.84E+01
Std Dev Biased
1.47E+01
Ps90%/90% (+KTL) Biased
1.39E+02
Ps90%/90% (-KTL) Biased
5.80E+01
Un-Biased Statistics
Average Un-Biased
1.00E+02
Std Dev Un-Biased
1.91E+01
Ps90%/90% (+KTL) Un-Biased 1.53E+02
Ps90%/90% (-KTL) Un-Biased
4.80E+01
Specification MIN
7.50E+01
Status
PASS
200
1.05E+02
9.45E+01
1.15E+02
8.75E+01
8.70E+01
1.02E+02
9.03E+01
8.27E+01
9.55E+01
1.29E+02
9.49E+01
1.01E+02
24-hr
Anneal
225
1.07E+02
9.46E+01
1.11E+02
8.74E+01
8.72E+01
1.03E+02
9.02E+01
8.27E+01
9.47E+01
1.20E+02
9.51E+01
1.01E+02
168-hr
Anneal
250
1.35E+02
9.27E+01
1.03E+02
8.67E+01
8.73E+01
9.92E+01
9.01E+01
8.33E+01
9.49E+01
1.21E+02
9.52E+01
1.01E+02
9.73E+01
1.11E+01
1.28E+02
6.69E+01
9.79E+01
1.22E+01
1.31E+02
6.45E+01
9.74E+01
1.10E+01
1.27E+02
6.72E+01
1.01E+02
2.01E+01
1.56E+02
4.58E+01
9.91E+01
1.60E+01
1.43E+02
5.53E+01
7.00E+01
PASS
9.99E+01
1.78E+01
1.49E+02
5.12E+01
7.00E+01
PASS
9.81E+01
1.42E+01
1.37E+02
5.91E+01
7.00E+01
PASS
9.76E+01
1.41E+01
1.36E+02
5.89E+01
7.00E+01
PASS
Total Dose (krad(Si))
20
50
100
1.09E+02 1.06E+02 1.07E+02
9.33E+01 9.39E+01 9.43E+01
1.06E+02 1.10E+02 1.11E+02
8.60E+01 8.65E+01 8.73E+01
8.75E+01 8.73E+01 8.71E+01
1.03E+02 1.03E+02 1.03E+02
9.01E+01 9.02E+01 9.01E+01
8.30E+01 8.30E+01 8.28E+01
9.36E+01 9.40E+01 9.47E+01
1.48E+02 1.29E+02 1.24E+02
9.52E+01 9.51E+01 9.51E+01
1.01E+02 1.01E+02 1.00E+02
9.64E+01
1.06E+01
1.26E+02
6.73E+01
9.66E+01
1.06E+01
1.26E+02
6.75E+01
1.04E+02
2.60E+01
1.75E+02
3.22E+01
7.00E+01
PASS
9.99E+01
1.79E+01
1.49E+02
5.07E+01
7.00E+01
PASS
An ISO 9001:2008 and DLA Certified Company
194
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.94. Plot of Power Supply Rejection Ratio1_1 5V (dB) @ VS=+4.5V TO +12V versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
195
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.94. Raw data for Power Supply Rejection Ratio1_1 5V (dB) @ VS=+4.5V TO +12V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio1_1 5V (dB)
@ VS=+4.5V TO +12V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
1.25E+02
1.06E+02
1.08E+02
1.18E+02
1.12E+02
1.11E+02
1.35E+02
1.12E+02
1.11E+02
1.10E+02
1.26E+02
1.22E+02
24-hr
Anneal
225
1.24E+02
1.06E+02
1.08E+02
1.18E+02
1.13E+02
1.11E+02
1.42E+02
1.12E+02
1.10E+02
1.10E+02
1.26E+02
1.23E+02
168-hr
Anneal
250
1.22E+02
1.06E+02
1.08E+02
1.18E+02
1.13E+02
1.11E+02
1.45E+02
1.12E+02
1.11E+02
1.10E+02
1.25E+02
1.22E+02
1.14E+02
7.38E+00
1.34E+02
9.33E+01
1.14E+02
7.66E+00
1.35E+02
9.29E+01
1.14E+02
7.41E+00
1.34E+02
9.33E+01
1.13E+02
6.81E+00
1.32E+02
9.46E+01
1.17E+02
1.30E+01
1.52E+02
8.12E+01
8.80E+01
PASS
1.16E+02
1.08E+01
1.45E+02
8.61E+01
8.80E+01
PASS
1.17E+02
1.39E+01
1.55E+02
7.89E+01
8.80E+01
PASS
1.18E+02
1.52E+01
1.59E+02
7.59E+01
8.80E+01
PASS
0
1.20E+02
1.06E+02
1.08E+02
1.19E+02
1.12E+02
1.11E+02
1.40E+02
1.12E+02
1.11E+02
1.10E+02
1.26E+02
1.22E+02
Total Dose (krad(Si))
20
50
100
1.20E+02 1.22E+02 1.23E+02
1.05E+02 1.06E+02 1.05E+02
1.08E+02 1.08E+02 1.08E+02
1.18E+02 1.19E+02 1.18E+02
1.13E+02 1.12E+02 1.12E+02
1.11E+02 1.11E+02 1.11E+02
1.41E+02 1.39E+02 1.40E+02
1.12E+02 1.12E+02 1.12E+02
1.10E+02 1.11E+02 1.11E+02
1.10E+02 1.10E+02 1.10E+02
1.26E+02 1.26E+02 1.26E+02
1.23E+02 1.22E+02 1.22E+02
1.13E+02
6.26E+00
1.30E+02
9.55E+01
1.13E+02
6.35E+00
1.30E+02
9.54E+01
1.13E+02
6.86E+00
1.32E+02
9.43E+01
1.17E+02
1.32E+01
1.53E+02
8.06E+01
8.80E+01
PASS
1.17E+02
1.36E+01
1.54E+02
7.96E+01
8.80E+01
PASS
1.17E+02
1.26E+01
1.51E+02
8.20E+01
8.80E+01
PASS
An ISO 9001:2008 and DLA Certified Company
196
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.95. Plot of Power Supply Rejection Ratio1_2 5V (dB) @ VS=+4.5V TO +12V versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
197
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.95. Raw data for Power Supply Rejection Ratio1_2 5V (dB) @ VS=+4.5V TO +12V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio1_2 5V (dB)
@ VS=+4.5V TO +12V
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
200
1.14E+02
1.17E+02
1.10E+02
1.22E+02
1.14E+02
1.13E+02
1.33E+02
1.09E+02
1.15E+02
1.12E+02
1.19E+02
1.50E+02
24-hr
Anneal
225
1.14E+02
1.17E+02
1.10E+02
1.22E+02
1.14E+02
1.12E+02
1.42E+02
1.09E+02
1.14E+02
1.12E+02
1.19E+02
1.58E+02
168-hr
Anneal
250
1.13E+02
1.17E+02
1.10E+02
1.21E+02
1.14E+02
1.12E+02
1.37E+02
1.09E+02
1.15E+02
1.12E+02
1.19E+02
1.58E+02
1.15E+02
4.38E+00
1.27E+02
1.03E+02
1.15E+02
4.51E+00
1.28E+02
1.03E+02
1.15E+02
4.51E+00
1.28E+02
1.03E+02
1.15E+02
4.14E+00
1.26E+02
1.04E+02
1.17E+02
1.17E+01
1.49E+02
8.51E+01
8.80E+01
PASS
1.16E+02
9.67E+00
1.43E+02
8.98E+01
8.80E+01
PASS
1.18E+02
1.35E+01
1.55E+02
8.07E+01
8.80E+01
PASS
1.17E+02
1.15E+01
1.48E+02
8.52E+01
8.80E+01
PASS
0
1.14E+02
1.17E+02
1.10E+02
1.20E+02
1.13E+02
1.12E+02
1.34E+02
1.09E+02
1.15E+02
1.11E+02
1.19E+02
1.52E+02
Total Dose (krad(Si))
20
50
100
1.14E+02 1.15E+02 1.14E+02
1.17E+02 1.17E+02 1.18E+02
1.10E+02 1.10E+02 1.10E+02
1.20E+02 1.20E+02 1.21E+02
1.13E+02 1.14E+02 1.14E+02
1.12E+02 1.12E+02 1.12E+02
1.34E+02 1.38E+02 1.38E+02
1.09E+02 1.09E+02 1.09E+02
1.15E+02 1.15E+02 1.15E+02
1.12E+02 1.13E+02 1.12E+02
1.19E+02 1.19E+02 1.19E+02
1.53E+02 1.55E+02 1.53E+02
1.15E+02
3.66E+00
1.25E+02
1.04E+02
1.15E+02
3.81E+00
1.25E+02
1.04E+02
1.15E+02
3.86E+00
1.26E+02
1.04E+02
1.16E+02
1.00E+01
1.44E+02
8.86E+01
8.80E+01
PASS
1.16E+02
1.01E+01
1.44E+02
8.83E+01
8.80E+01
PASS
1.17E+02
1.16E+01
1.49E+02
8.53E+01
8.80E+01
PASS
An ISO 9001:2008 and DLA Certified Company
198
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.96. Plot of PSRR Match1 5V (dB) @ VS=+4.5V to +12V versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
199
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.96. Raw data for PSRR Match1 5V (dB) @ VS=+4.5V to +12V versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
PSRR Match1 5V (dB)
@ VS=+4.5V to +12V
Device
680
681
682
683
684
685
686
688
689
690
691
692
0
1.19E+02
1.08E+02
1.20E+02
1.38E+02
1.43E+02
1.06E+02
1.38E+02
1.18E+02
1.19E+02
1.25E+02
1.16E+02
1.22E+02
Biased Statistics
Average Biased
1.26E+02
Std Dev Biased
1.43E+01
Ps90%/90% (+KTL) Biased
1.65E+02
Ps90%/90% (-KTL) Biased
8.65E+01
Un-Biased Statistics
Average Un-Biased
1.21E+02
Std Dev Un-Biased
1.18E+01
Ps90%/90% (+KTL) Un-Biased 1.53E+02
Ps90%/90% (-KTL) Un-Biased
8.87E+01
Specification MIN
8.20E+01
Status
PASS
200
1.16E+02
1.09E+02
1.23E+02
1.26E+02
1.27E+02
1.06E+02
1.49E+02
1.20E+02
1.18E+02
1.23E+02
1.16E+02
1.22E+02
24-hr
Anneal
225
1.17E+02
1.08E+02
1.22E+02
1.27E+02
1.31E+02
1.06E+02
1.70E+02
1.18E+02
1.19E+02
1.24E+02
1.16E+02
1.23E+02
168-hr
Anneal
250
1.18E+02
1.08E+02
1.20E+02
1.29E+02
1.31E+02
1.06E+02
1.42E+02
1.18E+02
1.19E+02
1.23E+02
1.16E+02
1.22E+02
1.21E+02
9.32E+00
1.47E+02
9.57E+01
1.20E+02
7.72E+00
1.41E+02
9.90E+01
1.21E+02
8.77E+00
1.45E+02
9.68E+01
1.21E+02
9.23E+00
1.47E+02
9.59E+01
1.23E+02
1.61E+01
1.67E+02
7.92E+01
8.20E+01
PASS
1.23E+02
1.58E+01
1.66E+02
7.98E+01
8.20E+01
PASS
1.27E+02
2.47E+01
1.95E+02
5.95E+01
8.20E+01
PASS
1.22E+02
1.30E+01
1.57E+02
8.58E+01
8.20E+01
PASS
Total Dose (krad(Si))
20
50
100
1.19E+02 1.20E+02 1.17E+02
1.08E+02 1.08E+02 1.08E+02
1.21E+02 1.21E+02 1.22E+02
1.33E+02 1.34E+02 1.29E+02
1.35E+02 1.31E+02 1.31E+02
1.05E+02 1.06E+02 1.06E+02
1.39E+02 1.53E+02 1.49E+02
1.19E+02 1.18E+02 1.18E+02
1.18E+02 1.19E+02 1.18E+02
1.24E+02 1.22E+02 1.25E+02
1.16E+02 1.16E+02 1.16E+02
1.23E+02 1.22E+02 1.23E+02
1.23E+02
1.08E+01
1.53E+02
9.35E+01
1.23E+02
1.03E+01
1.51E+02
9.44E+01
1.21E+02
1.20E+01
1.54E+02
8.80E+01
8.20E+01
PASS
1.23E+02
1.76E+01
1.72E+02
7.50E+01
8.20E+01
PASS
An ISO 9001:2008 and DLA Certified Company
200
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.97. Plot of +Short-Circuit Current1_1 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
201
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.97. Raw data for +Short-Circuit Current1_1 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Short-Circuit Current1_1 5V (A)
@ VS=+5V, VOUT=1/2 SUPPLY
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-2.34E-02
-2.29E-02
-2.42E-02
-2.32E-02
-2.38E-02
-2.35E-02
-2.35E-02
-2.48E-02
-2.38E-02
-2.32E-02
-2.42E-02
-2.33E-02
Total Dose (krad(Si))
20
50
100
-2.25E-02 -2.17E-02 -2.10E-02
-2.21E-02 -2.14E-02 -2.07E-02
-2.34E-02 -2.28E-02 -2.22E-02
-2.25E-02 -2.19E-02 -2.12E-02
-2.31E-02 -2.25E-02 -2.19E-02
-2.31E-02 -2.25E-02 -2.17E-02
-2.30E-02 -2.24E-02 -2.17E-02
-2.45E-02 -2.42E-02 -2.38E-02
-2.33E-02 -2.28E-02 -2.22E-02
-2.28E-02 -2.22E-02 -2.15E-02
-2.43E-02 -2.42E-02 -2.43E-02
-2.33E-02 -2.33E-02 -2.33E-02
200
-1.98E-02
-1.98E-02
-2.14E-02
-2.06E-02
-2.11E-02
-2.07E-02
-2.06E-02
-2.31E-02
-2.14E-02
-2.04E-02
-2.43E-02
-2.33E-02
24-hr
Anneal
225
-2.03E-02
-2.02E-02
-2.17E-02
-2.09E-02
-2.14E-02
-2.09E-02
-2.08E-02
-2.33E-02
-2.16E-02
-2.06E-02
-2.42E-02
-2.33E-02
168-hr
Anneal
250
-2.18E-02
-2.14E-02
-2.28E-02
-2.19E-02
-2.26E-02
-2.23E-02
-2.24E-02
-2.41E-02
-2.28E-02
-2.21E-02
-2.42E-02
-2.33E-02
-2.35E-02 -2.27E-02 -2.21E-02 -2.14E-02 -2.05E-02 -2.09E-02 -2.21E-02
5.12E-04 5.23E-04 5.73E-04 6.13E-04 7.09E-04 6.55E-04 5.60E-04
-2.21E-02 -2.13E-02 -2.05E-02 -1.97E-02 -1.86E-02 -1.91E-02 -2.06E-02
-2.49E-02 -2.41E-02 -2.36E-02 -2.31E-02 -2.25E-02 -2.27E-02 -2.36E-02
-2.38E-02
6.29E-04
-2.20E-02
-2.55E-02
-1.25E-02
PASS
-2.33E-02
6.69E-04
-2.15E-02
-2.52E-02
-8.00E-03
PASS
-2.28E-02
8.04E-04
-2.06E-02
-2.50E-02
-8.00E-03
PASS
-2.22E-02
9.30E-04
-1.96E-02
-2.47E-02
-8.00E-03
PASS
-2.12E-02
1.12E-03
-1.82E-02
-2.43E-02
-8.00E-03
PASS
An ISO 9001:2008 and DLA Certified Company
202
-2.14E-02
1.09E-03
-1.84E-02
-2.44E-02
-8.00E-03
PASS
-2.27E-02
7.98E-04
-2.05E-02
-2.49E-02
-8.00E-03
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.98. Plot of +Short-Circuit Current1_2 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
203
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.98. Raw data for +Short-Circuit Current1_2 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Short-Circuit Current1_2 5V (A)
@ VS=+5V, VOUT=1/2 SUPPLY
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-2.31E-02
-2.30E-02
-2.40E-02
-2.32E-02
-2.36E-02
-2.35E-02
-2.32E-02
-2.48E-02
-2.38E-02
-2.32E-02
-2.38E-02
-2.33E-02
Total Dose (krad(Si))
20
50
100
-2.22E-02 -2.14E-02 -2.06E-02
-2.22E-02 -2.15E-02 -2.08E-02
-2.32E-02 -2.26E-02 -2.19E-02
-2.24E-02 -2.18E-02 -2.11E-02
-2.28E-02 -2.21E-02 -2.15E-02
-2.31E-02 -2.25E-02 -2.17E-02
-2.27E-02 -2.20E-02 -2.12E-02
-2.44E-02 -2.41E-02 -2.37E-02
-2.33E-02 -2.28E-02 -2.22E-02
-2.28E-02 -2.21E-02 -2.14E-02
-2.38E-02 -2.38E-02 -2.38E-02
-2.33E-02 -2.33E-02 -2.33E-02
200
-1.95E-02
-1.99E-02
-2.11E-02
-2.05E-02
-2.07E-02
-2.07E-02
-2.02E-02
-2.30E-02
-2.13E-02
-2.02E-02
-2.38E-02
-2.33E-02
24-hr
Anneal
225
-1.99E-02
-2.03E-02
-2.14E-02
-2.08E-02
-2.10E-02
-2.09E-02
-2.04E-02
-2.32E-02
-2.15E-02
-2.05E-02
-2.38E-02
-2.33E-02
168-hr
Anneal
250
-2.15E-02
-2.15E-02
-2.26E-02
-2.18E-02
-2.22E-02
-2.23E-02
-2.19E-02
-2.40E-02
-2.27E-02
-2.20E-02
-2.38E-02
-2.33E-02
-2.34E-02 -2.25E-02 -2.19E-02 -2.12E-02 -2.03E-02 -2.07E-02 -2.19E-02
4.15E-04 4.20E-04 4.79E-04 5.31E-04 6.46E-04 5.79E-04 4.66E-04
-2.22E-02 -2.14E-02 -2.06E-02 -1.97E-02 -1.85E-02 -1.91E-02 -2.06E-02
-2.45E-02 -2.37E-02 -2.32E-02 -2.26E-02 -2.21E-02 -2.23E-02 -2.32E-02
-2.37E-02
6.63E-04
-2.19E-02
-2.55E-02
-1.25E-02
PASS
-2.33E-02
7.09E-04
-2.13E-02
-2.52E-02
-8.00E-03
PASS
-2.27E-02
8.45E-04
-2.04E-02
-2.50E-02
-8.00E-03
PASS
-2.20E-02
9.82E-04
-1.93E-02
-2.47E-02
-8.00E-03
PASS
-2.11E-02
1.18E-03
-1.78E-02
-2.43E-02
-8.00E-03
PASS
An ISO 9001:2008 and DLA Certified Company
204
-2.13E-02
1.16E-03
-1.81E-02
-2.45E-02
-8.00E-03
PASS
-2.26E-02
8.38E-04
-2.03E-02
-2.49E-02
-8.00E-03
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.99. Plot of -Short-Circuit Current1_1 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
205
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.99. Raw data for -Short-Circuit Current1_1 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
-Short-Circuit Current1_1 5V (A)
24-hr
168-hr
@ VS=+5V, VOUT=1/2 SUPPLY
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.47E-02 4.44E-02 4.42E-02 4.38E-02 4.36E-02 4.40E-02 4.42E-02
681 4.43E-02 4.39E-02 4.38E-02 4.36E-02 4.34E-02 4.36E-02 4.37E-02
682 4.49E-02 4.45E-02 4.43E-02 4.41E-02 4.38E-02 4.41E-02 4.43E-02
683 4.45E-02 4.42E-02 4.40E-02 4.38E-02 4.35E-02 4.38E-02 4.40E-02
684 4.41E-02 4.37E-02 4.35E-02 4.34E-02 4.30E-02 4.34E-02 4.35E-02
685 4.49E-02 4.46E-02 4.45E-02 4.43E-02 4.39E-02 4.43E-02 4.46E-02
686 4.50E-02 4.49E-02 4.47E-02 4.45E-02 4.40E-02 4.43E-02 4.47E-02
688 4.67E-02 4.65E-02 4.64E-02 4.61E-02 4.58E-02 4.60E-02 4.64E-02
689 4.51E-02 4.49E-02 4.48E-02 4.45E-02 4.42E-02 4.44E-02 4.47E-02
690 4.46E-02 4.41E-02 4.41E-02 4.38E-02 4.35E-02 4.37E-02 4.42E-02
691 4.63E-02 4.62E-02 4.63E-02 4.62E-02 4.63E-02 4.64E-02 4.63E-02
692 4.41E-02 4.41E-02 4.42E-02 4.41E-02 4.41E-02 4.43E-02 4.41E-02
Biased Statistics
Average Biased
4.45E-02 4.41E-02 4.40E-02 4.37E-02 4.34E-02 4.38E-02 4.39E-02
Std Dev Biased
3.06E-04 3.40E-04 3.24E-04 2.70E-04 3.10E-04 3.09E-04 3.27E-04
Ps90%/90% (+KTL) Biased
4.54E-02 4.51E-02 4.49E-02 4.45E-02 4.43E-02 4.46E-02 4.48E-02
Ps90%/90% (-KTL) Biased
4.37E-02 4.32E-02 4.31E-02 4.30E-02 4.26E-02 4.29E-02 4.30E-02
Un-Biased Statistics
Average Un-Biased
4.53E-02 4.50E-02 4.49E-02 4.46E-02 4.43E-02 4.46E-02 4.49E-02
Std Dev Un-Biased
8.17E-04 9.06E-04 8.75E-04 8.69E-04 8.97E-04 8.49E-04 8.51E-04
Ps90%/90% (+KTL) Un-Biased
4.75E-02 4.75E-02 4.73E-02 4.70E-02 4.67E-02 4.69E-02 4.72E-02
Ps90%/90% (-KTL) Un-Biased
4.30E-02 4.25E-02 4.25E-02 4.23E-02 4.18E-02 4.22E-02 4.26E-02
Specification MIN
1.25E-02 8.00E-03 8.00E-03 8.00E-03 8.00E-03 8.00E-03 8.00E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
206
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.100. Plot of -Short-Circuit Current1_2 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
207
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.100. Raw data for -Short-Circuit Current1_2 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
-Short-Circuit Current1_2 5V (A)
24-hr
168-hr
@ VS=+5V, VOUT=1/2 SUPPLY
Total Dose (krad(Si))
Anneal
Anneal
Device
0
20
50
100
200
225
250
680 4.41E-02 4.38E-02 4.36E-02 4.32E-02 4.30E-02 4.34E-02 4.36E-02
681 4.36E-02 4.32E-02 4.31E-02 4.29E-02 4.27E-02 4.29E-02 4.30E-02
682 4.42E-02 4.38E-02 4.36E-02 4.34E-02 4.31E-02 4.34E-02 4.36E-02
683 4.38E-02 4.35E-02 4.33E-02 4.31E-02 4.28E-02 4.31E-02 4.33E-02
684 4.35E-02 4.31E-02 4.29E-02 4.27E-02 4.24E-02 4.27E-02 4.29E-02
685 4.42E-02 4.39E-02 4.38E-02 4.36E-02 4.32E-02 4.36E-02 4.38E-02
686 4.45E-02 4.44E-02 4.42E-02 4.40E-02 4.35E-02 4.38E-02 4.42E-02
688 4.61E-02 4.60E-02 4.59E-02 4.56E-02 4.53E-02 4.54E-02 4.58E-02
689 4.44E-02 4.43E-02 4.41E-02 4.38E-02 4.36E-02 4.37E-02 4.40E-02
690 4.38E-02 4.33E-02 4.33E-02 4.30E-02 4.27E-02 4.29E-02 4.33E-02
691 4.58E-02 4.57E-02 4.58E-02 4.57E-02 4.57E-02 4.59E-02 4.58E-02
692 4.36E-02 4.36E-02 4.36E-02 4.36E-02 4.36E-02 4.37E-02 4.36E-02
Biased Statistics
Average Biased
4.38E-02 4.35E-02 4.33E-02 4.31E-02 4.28E-02 4.31E-02 4.33E-02
Std Dev Biased
3.05E-04 3.41E-04 3.21E-04 2.56E-04 2.91E-04 3.03E-04 3.31E-04
Ps90%/90% (+KTL) Biased
4.47E-02 4.44E-02 4.42E-02 4.38E-02 4.36E-02 4.39E-02 4.42E-02
Ps90%/90% (-KTL) Biased
4.30E-02 4.25E-02 4.24E-02 4.24E-02 4.20E-02 4.23E-02 4.24E-02
Un-Biased Statistics
Average Un-Biased
4.46E-02 4.44E-02 4.43E-02 4.40E-02 4.36E-02 4.39E-02 4.42E-02
Std Dev Un-Biased
8.91E-04 9.94E-04 9.62E-04 9.55E-04 9.70E-04 9.27E-04 9.32E-04
Ps90%/90% (+KTL) Un-Biased
4.70E-02 4.71E-02 4.69E-02 4.66E-02 4.63E-02 4.64E-02 4.68E-02
Ps90%/90% (-KTL) Un-Biased
4.22E-02 4.16E-02 4.16E-02 4.14E-02 4.10E-02 4.14E-02 4.17E-02
Specification MIN
1.25E-02 8.00E-03 8.00E-03 8.00E-03 8.00E-03 8.00E-03 8.00E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DLA Certified Company
208
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.101. Plot of +Slew Rate1_1 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
209
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.101. Raw data for +Slew Rate1_1 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Slew Rate1_1 5V (V/µs)
@ VS=+/-2.5V, AV=1, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
3.95E+00
3.92E+00
4.10E+00
3.95E+00
3.98E+00
3.79E+00
3.79E+00
4.20E+00
3.89E+00
3.90E+00
3.90E+00
3.87E+00
Total Dose (krad(Si))
20
50
100
3.79E+00 3.59E+00 3.46E+00
3.74E+00 3.57E+00 3.48E+00
4.00E+00 3.81E+00 3.70E+00
3.82E+00 3.69E+00 3.51E+00
3.90E+00 3.74E+00 3.60E+00
3.77E+00 3.71E+00 3.54E+00
3.74E+00 3.73E+00 3.60E+00
4.18E+00 4.14E+00 4.06E+00
3.79E+00 3.77E+00 3.67E+00
3.84E+00 3.76E+00 3.69E+00
3.94E+00 3.91E+00 3.87E+00
3.86E+00 3.90E+00 3.88E+00
200
3.32E+00
3.37E+00
3.62E+00
3.43E+00
3.49E+00
3.47E+00
3.49E+00
3.97E+00
3.56E+00
3.60E+00
3.90E+00
3.88E+00
24-hr
Anneal
225
3.43E+00
3.46E+00
3.63E+00
3.49E+00
3.60E+00
3.46E+00
3.57E+00
3.97E+00
3.57E+00
3.60E+00
3.90E+00
3.85E+00
168-hr
Anneal
250
3.65E+00
3.60E+00
3.83E+00
3.69E+00
3.77E+00
3.62E+00
3.65E+00
4.09E+00
3.75E+00
3.78E+00
3.88E+00
3.89E+00
3.98E+00 3.85E+00 3.68E+00 3.55E+00 3.45E+00 3.52E+00 3.71E+00
7.04E-02 1.02E-01 1.01E-01 9.95E-02 1.16E-01 8.81E-02 9.23E-02
4.17E+00 4.13E+00 3.96E+00 3.82E+00 3.76E+00 3.76E+00 3.96E+00
3.79E+00 3.57E+00 3.40E+00 3.28E+00 3.13E+00 3.28E+00 3.45E+00
3.91E+00
1.68E-01
4.38E+00
3.45E+00
2.60E+00
PASS
3.86E+00
1.80E-01
4.36E+00
3.37E+00
2.00E+00
PASS
3.82E+00
1.79E-01
4.31E+00
3.33E+00
2.00E+00
PASS
3.71E+00
2.03E-01
4.27E+00
3.15E+00
2.00E+00
PASS
3.62E+00
2.04E-01
4.18E+00
3.06E+00
2.00E+00
PASS
An ISO 9001:2008 and DLA Certified Company
210
3.63E+00
1.95E-01
4.17E+00
3.10E+00
2.00E+00
PASS
3.78E+00
1.87E-01
4.29E+00
3.27E+00
2.00E+00
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.102. Plot of +Slew Rate1_2 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
211
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.102. Raw data for +Slew Rate1_2 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
+Slew Rate1_2 5V (V/µs)
@ VS=+/-2.5V, AV=1, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
3.92E+00
3.87E+00
4.10E+00
3.91E+00
4.03E+00
3.76E+00
3.81E+00
4.32E+00
3.84E+00
3.90E+00
3.89E+00
3.88E+00
Total Dose (krad(Si))
20
50
100
3.75E+00 3.56E+00 3.45E+00
3.73E+00 3.62E+00 3.48E+00
3.98E+00 3.82E+00 3.72E+00
3.74E+00 3.66E+00 3.50E+00
3.90E+00 3.74E+00 3.60E+00
3.66E+00 3.66E+00 3.57E+00
3.81E+00 3.73E+00 3.63E+00
4.24E+00 4.22E+00 4.18E+00
3.81E+00 3.72E+00 3.67E+00
3.84E+00 3.77E+00 3.71E+00
3.88E+00 3.86E+00 3.85E+00
3.90E+00 3.90E+00 3.90E+00
200
3.38E+00
3.37E+00
3.58E+00
3.38E+00
3.55E+00
3.46E+00
3.49E+00
4.01E+00
3.54E+00
3.52E+00
3.87E+00
3.89E+00
24-hr
Anneal
225
3.41E+00
3.45E+00
3.68E+00
3.45E+00
3.54E+00
3.52E+00
3.55E+00
4.04E+00
3.58E+00
3.54E+00
3.88E+00
3.93E+00
168-hr
Anneal
250
3.69E+00
3.60E+00
3.82E+00
3.71E+00
3.77E+00
3.66E+00
3.72E+00
4.16E+00
3.74E+00
3.73E+00
3.85E+00
3.88E+00
3.97E+00 3.82E+00 3.68E+00 3.55E+00 3.45E+00 3.51E+00 3.72E+00
9.56E-02 1.13E-01 1.02E-01 1.10E-01 1.04E-01 1.08E-01 8.35E-02
4.23E+00 4.13E+00 3.96E+00 3.85E+00 3.74E+00 3.80E+00 3.95E+00
3.70E+00 3.51E+00 3.40E+00 3.25E+00 3.17E+00 3.21E+00 3.49E+00
3.93E+00
2.26E-01
4.55E+00
3.31E+00
2.60E+00
PASS
3.87E+00
2.17E-01
4.47E+00
3.28E+00
2.00E+00
PASS
3.82E+00
2.27E-01
4.44E+00
3.20E+00
2.00E+00
PASS
3.75E+00
2.45E-01
4.42E+00
3.08E+00
2.00E+00
PASS
3.60E+00
2.29E-01
4.23E+00
2.98E+00
2.00E+00
PASS
An ISO 9001:2008 and DLA Certified Company
212
3.65E+00
2.21E-01
4.25E+00
3.04E+00
2.00E+00
PASS
3.80E+00
2.03E-01
4.36E+00
3.25E+00
2.00E+00
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.103. Plot of -Slew Rate1_1 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
213
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.103. Raw data for -Slew Rate1_1 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
-Slew Rate1_1 5V (V/µs)
@ VS=+/-2.5V, AV=1, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-5.06E+00
-4.94E+00
-5.33E+00
-4.99E+00
-5.08E+00
-4.80E+00
-4.87E+00
-5.34E+00
-4.90E+00
-5.12E+00
-5.06E+00
-4.99E+00
Total Dose (krad(Si))
20
50
100
-4.91E+00 -4.77E+00 -4.57E+00
-4.75E+00 -4.68E+00 -4.56E+00
-5.12E+00 -5.02E+00 -4.81E+00
-4.87E+00 -4.80E+00 -4.55E+00
-4.91E+00 -4.71E+00 -4.69E+00
-4.81E+00 -4.69E+00 -4.56E+00
-4.84E+00 -4.77E+00 -4.67E+00
-5.36E+00 -5.25E+00 -5.15E+00
-4.93E+00 -4.83E+00 -4.70E+00
-5.00E+00 -4.96E+00 -4.78E+00
-5.05E+00 -5.04E+00 -5.04E+00
-5.08E+00 -5.06E+00 -5.03E+00
200
-4.39E+00
-4.39E+00
-4.75E+00
-4.50E+00
-4.56E+00
-4.54E+00
-4.48E+00
-5.05E+00
-4.63E+00
-4.59E+00
-5.06E+00
-5.03E+00
24-hr
Anneal
225
-4.49E+00
-4.45E+00
-4.75E+00
-4.59E+00
-4.63E+00
-4.42E+00
-4.53E+00
-5.12E+00
-4.59E+00
-4.68E+00
-5.10E+00
-4.97E+00
168-hr
Anneal
250
-4.69E+00
-4.71E+00
-5.08E+00
-4.75E+00
-4.88E+00
-4.67E+00
-4.76E+00
-5.18E+00
-4.75E+00
-4.86E+00
-5.10E+00
-5.04E+00
-5.08E+00 -4.91E+00 -4.80E+00 -4.64E+00 -4.52E+00 -4.58E+00 -4.82E+00
1.50E-01 1.33E-01 1.34E-01 1.13E-01 1.49E-01 1.19E-01 1.62E-01
-4.67E+00 -4.55E+00 -4.43E+00 -4.33E+00 -4.11E+00 -4.26E+00 -4.38E+00
-5.49E+00 -5.28E+00 -5.16E+00 -4.94E+00 -4.93E+00 -4.91E+00 -5.27E+00
-5.01E+00
2.22E-01
-4.40E+00
-5.61E+00
-2.60E+00
PASS
-4.99E+00
2.21E-01
-4.38E+00
-5.59E+00
-2.00E+00
PASS
-4.90E+00
2.19E-01
-4.30E+00
-5.50E+00
-2.00E+00
PASS
-4.77E+00
2.26E-01
-4.15E+00
-5.39E+00
-2.00E+00
PASS
-4.66E+00
2.26E-01
-4.04E+00
-5.28E+00
-2.00E+00
PASS
An ISO 9001:2008 and DLA Certified Company
214
-4.67E+00
2.70E-01
-3.93E+00
-5.41E+00
-2.00E+00
PASS
-4.84E+00
2.00E-01
-4.30E+00
-5.39E+00
-2.00E+00
PASS
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.104. Plot of -Slew Rate1_2 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
215
TID Report
15-0091 03/20/15 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.104. Raw data for -Slew Rate1_2 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
-Slew Rate1_2 5V (V/µs)
@ VS=+/-2.5V, AV=1, RL=10kΩ
Device
680
681
682
683
684
685
686
688
689
690
691
692
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-4.90E+00
-4.88E+00
-5.24E+00
-4.96E+00
-5.10E+00
-4.77E+00
-4.87E+00
-5.46E+00
-4.93E+00
-4.98E+00
-4.89E+00
-4.95E+00
Total Dose (krad(Si))
20
50
100
-4.70E+00 -4.55E+00 -4.37E+00
-4.74E+00 -4.54E+00 -4.44E+00
-5.01E+00 -4.93E+00 -4.72E+00
-4.72E+00 -4.60E+00 -4.55E+00
-4.94E+00 -4.71E+00 -4.66E+00
-4.71E+00 -4.69E+00 -4.46E+00
-4.72E+00 -4.68E+00 -4.64E+00
-5.40E+00 -5.29E+00 -5.28E+00
-4.75E+00 -4.81E+00 -4.55E+00
-4.92E+00 -4.86E+00 -4.69E+00
-4.95E+00 -4.95E+00 -4.94E+00
-4.98E+00 -4.91E+00 -4.95E+00
200
-4.15E+00
-4.27E+00
-4.66E+00
-4.34E+00
-4.57E+00
-4.49E+00
-4.46E+00
-5.14E+00
-4.44E+00
-4.47E+00
-4.91E+00
-4.96E+00
24-hr
Anneal
225
-4.26E+00
-4.32E+00
-4.66E+00
-4.42E+00
-4.54E+00
-4.40E+00
-4.45E+00
-5.14E+00
-4.54E+00
-4.52E+00
-4.92E+00
-5.00E+00
168-hr
Anneal
250
-4.57E+00
-4.62E+00
-4.98E+00
-4.62E+00
-4.75E+00
-4.67E+00
-4.71E+00
-5.32E+00
-4.75E+00
-4.86E+00
-4.95E+00
-4.95E+00
-5.02E+00 -4.82E+00 -4.67E+00 -4.55E+00 -4.40E+00 -4.44E+00 -4.71E+00
1.52E-01 1.43E-01 1.62E-01 1.46E-01 2.12E-01 1.62E-01 1.66E-01
-4.60E+00 -4.43E+00 -4.22E+00 -4.15E+00 -3.82E+00 -3.99E+00 -4.25E+00
-5.43E+00 -5.21E+00 -5.11E+00 -4.95E+00 -4.98E+00 -4.89E+00 -5.16E+00
-5.00E+00
2.68E-01
-4.27E+00
-5.74E+00
-2.60E+00
PASS
-4.90E+00
2.92E-01
-4.10E+00
-5.70E+00
-2.00E+00
PASS
-4.87E+00
2.49E-01
-4.18E+00
-5.55E+00
-2.00E+00
PASS
-4.72E+00
3.23E-01
-3.84E+00
-5.61E+00
-2.00E+00
PASS
-4.60E+00
3.02E-01
-3.77E+00
-5.43E+00
-2.00E+00
PASS
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-4.61E+00
3.01E-01
-3.78E+00
-5.44E+00
-2.00E+00
PASS
-4.86E+00
2.66E-01
-4.13E+00
-5.59E+00
-2.00E+00
PASS
TID Report
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Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
6.0. Summary / Conclusions
The total ionizing dose testing described in this final report was performed using the facilities at
Aeroflex RAD's Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose
(TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are
held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised
by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in
this configuration ranges from <1rad(Si)/s to a maximum of approximately 300rad(Si)/s, determined by
the distance from the source.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the total ionizing dose test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet
specification limits, then the lot could be logged as a failure.
Based on this criterion the RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp
(from the lot traceability information provided on the first page of this test report) the units-under-test:
 PASSED the total ionizing dose test to the 200krad(Si) dose level
 PASSED following 24-hour room temperature anneal
 PASSED following 168-hour 100°C anneal
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Appendix A: Photograph of Packing Label and a Sample Unit-Under-Test to Show Part
Traceability
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Appendix B: Radiation Bias Connections and Absolute Maximum Ratings
TID Radiation Biased Conditions: Extracted from Linear Technology RH1498M Datasheet
Revision F.
Pin
Function
Connection / Bias
1
OUTPUT A
To Pin 2 via 5kΩ & 40pF, in Parallel
2
-INPUT A
To Pin 1 via 5kΩ & 40pF, in Parallel
3
+INPUT A
To 8V via 5kΩ Resistor
4
NC
NC
5
V-
To -15V Decoupled to GND W/0.1µF
6
NC
NC
7
+INPUT B
To 8V via 5kΩ Resistor
8
-INPUT B
To Pin 9 via 5kΩ & 40pF, in Parallel
9
OUTPUT B
To Pin 8 via 5kΩ & 40pF, in Parallel
10
V+
To +15V Decoupled to GND W/0.1µF
Figure B.1. Irradiation bias circuit. This figure was extracted from Linear Technology RH1498M Datasheet
Revision F.
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TID Radiation Unbiased Conditions: All pins grounded.
Pin
1
Function
Connection / Bias
OUTPUT A GND
2
-INPUT A
GND
3
+INPUT A
GND
4
NC
GND
5
V-
GND
6
NC
GND
7
+INPUT B
GND
8
-INPUT B
GND
9
OUTPUT B GND
10
V+
GND
Figure B.2. W package drawing (for reference only). This figure was extracted from Linear Technology
RH1498M Datasheet Revision F.
Absolute Maximum Ratings:
Parameter
Max Rating
Total Supply Voltage (V+ to V-) 36V
Input Current
±10mA
Output Short-Circuit Duration
Continuous
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Appendix C: Electrical Test Parameters and Conditions
The expected ranges of values as well as the measurement conditions are taken from Linear Technology
RH1498M Datasheet Revision F. All electrical tests for this device are performed on one of Aeroflex
RAD's LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that
provides parameter measurements for a variety of digital, analog and mixed signal products including
voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test System
achieves accuracy and sensitivity through the use of software self-calibration and an internal relay
matrix with separate family boards and custom personality adapter boards. The tester uses this relay
matrix to connect the required test circuits, select the appropriate voltage / current sources and establish
the needed measurement loops for all the tests performed. The measured parameters and test conditions
are shown in Table C.1.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained from test data or from the DAC resolution of the LTS-2020
for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table
C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between
tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90
KTL statistics were applied to the measured standard deviation to generate the final measurement range.
This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020
mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the
measurement resolution is limited by the internal DACs, which results in a measured standard deviation
of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify
these parameters using an “attributes” approach.
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Table C.1. Measured parameters and test conditions for the RH1498MW Dual Rail-to-Rail Input and Output
Precision C-Load Op Amp.
Parameter
Symbol
Test Conditions
+Supply Current 15V (A)
+ICC_15V
VS=+/-15V
-Supply Current 15V (A)
-IEE_15V
VS=+/-15V
Input Offset Voltage1 15V (V)
VOS1 15V
VS=+/-15V, VCM=0V
Input Offset Current1 15V (A)
IOS1 15V
VS=+/-15V, VCM=0V
+Input Bias Current BIAS1 15V (A)
+IBIAS1 15V
VS=+/-15V, VCM=0V
-Input Bias Current BIAS1 15V (A)
-IBIAS1 15V
VS=+/-15V, VCM=0V
Input Offset Voltage2 15V (V)
VOS2 15V
VS=+/-15V, VCM=15V
Input Offset Current2 15V (A)
IOS2 15V
VS=+/-15V, VCM=15V
+Input Bias Current BIAS2 15V (A)
+IBIAS2 15V
VS=+/-15V, VCM=15V
-Input Bias Current BIAS2 15V (A)
-IBIAS2 15V
VS=+/-15V, VCM=15V
Input Offset Voltage3 15V (V)
VOS3 15V
VS=+/-15V, VCM=-15V
Input Offset Current3 15V (A)
IOS3 15V
VS=+/-15V, VCM=-15V
+Input Bias Current BIAS3 15V (A)
+IBIAS3 15V
VS=+/-15V, VCM=-15V
-Input Bias Current BIAS3 15V (A)
-IBIAS3 15V
VS=+/-15V, VCM=-15V
Output Voltage Swing High1 15V (V)
+VOUT1 15V
VS=+/-15V, IL=0mA
Output Voltage Swing High2 15V (V)
+VOUT2 15V
VS=+/-15V, IL=1mA
Output Voltage Swing High3 15V (V)
+VOUT3 15V
VS=+/-15V, IL=10mA
Output Voltage Swing Low1 15V (V)
-VOUT1 15V
VS=+/-15V, IL=0mA
Output Voltage Swing Low2 15V (V)
-VOUT2 15V
VS=+/-15V, IL=1mA
Output Voltage Swing Low3 15V (V)
-VOUT3 15V
VS=+/-15V, IL=10mA
Large Signal Voltage Gain1 15V (V/mV)
AVOL1 15V
VS=+/-15V, VO=+/-14.5V, RL=10kΩ
Large Signal Voltage Gain2 15V (V/mV)
AVOL2 15V
VS=+/-15V, VO=+/-10V, RL=2kΩ
Common Mode Rejection Ratio1 15V (dB) CMRR1 15V
VS=+/-15V, VCM=+/-15V
CMRR Match1 15V (dB)
CMRR1 MATCH 15V VS=+/-15V, VCM=+/-15V
Power Supply Rejection Ratio1 (dB)
PSRR1 15V
VS=+/-2V to +/-16V
PSRR Match1 15V (dB)
PSRR1 MATCH 15V
VS=+/-2V to +/-16V
+Short-Circuit Current1 15V (A)
+ISC1 15V
VS=+/-15V, VOUT=0V
-Short-Circuit Current1 15V (A)
-ISC1 15V
VS=+/-15V, VOUT=0V
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Gain-Bandwidth Product1 15V (MHz)
GBWP1 15V
VS=+/-15V, f=100kHz
+Slew Rate1 15V (V/µs)
+SR1 15V
VS=+/-15V, AV=1, RL=10kΩ
-Slew Rate1 15V (V/µs)
-SR1 15V
VS=+/-15V, AV=1, RL=10kΩ
+Supply Current 5V (A)
+ICC_5V
VS=+5V
-Supply Current 5V (A)
-IEE_5V
VS=+5V
Input Offset Voltage1 5V (V)
VOS1 5V
VS=+5V, VCM=0V
Input Offset Current1 5V (A)
IOS1 5V
VS=+5V, VCM=0V
+Input Bias Current BIAS1 5V (A)
+IBIAS1 5V
VS=+5V, VCM=0V
-Input Bias Current BIAS1 5V (A)
-IBIAS1 5V
VS=+5V, VCM=0V
Input Offset Voltage2 5V (V)
VOS2 5V
VS=+5V, VCM=5V
Input Offset Current2 5V (A)
IOS2 5V
VS=+5V, VCM=5V
+Input Bias Current BIAS2 5V (A)
+IBIAS2 5V
VS=+5V, VCM=5V
-Input Bias Current BIAS2 5V (A)
-IBIAS2 5V
VS=+5V, VCM=5V
Output Voltage Swing High1 5V (V)
+VOUT1 5V
VS=+5V, IL=0mA
Output Voltage Swing High2 5V (V)
+VOUT2 5V
VS=+5V, IL=1mA
Output Voltage Swing High3 5V (V)
+VOUT3 5V
VS=+5V, IL=2.5mA
Output Voltage Swing Low1 5V (V)
-VOUT1 5V
VS=+5V, IL=0mA
Output Voltage Swing Low2 5V (V)
-VOUT2 5V
VS=+5V, IL=1mA
Output Voltage Swing Low3 5V (V)
-VOUT3 5V
VS=+5V, IL=2.5mA
Large Signal Voltage Gain1 5V (V/mV)
AVOL1 5V
VS=+5V, VO=75mV TO 4.8V, RL=10kΩ
Common Mode Rejection Ratio1 5V (dB)
CMRR1 5V
VS=+5V, VCM=0 TO 5V
CMRR Match1 5V (dB)
CMRR1 MATCH 5V
VS=+5V
Power Supply Rejection Ratio1 5V (dB)
PSRR1 5V
VS=+4.5V TO +12V
PSRR Match1 5V (dB)
PSRR1 MATCH 5V
VS=+4.5V to +12V
+Short-Circuit Current1 5V (A)
+ISC1 5V
VS=+5V, VOUT=1/2 SUPPLY
-Short-Circuit Current1 5V (A)
-ISC1 5V
VS=+5V, VOUT=1/2 SUPPLY
+Slew Rate1 5V (V/µs)
+SR1 5V
VS=+/-2.5V, AV=1, RL=10kΩ
-Slew Rate1 5V (V/µs)
-SR1 5V
VS=+/-2.5V, AV=1, RL=10kΩ
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Table C.2. Measured parameters, pre-irradiation specifications and measurement precision for the RH1498MW
Dual Rail-to-Rail Input and Output Precision C-Load Op Amp.
Pre-Irradiation
Specification
MIN
MAX
Parameter
+Supply Current 15V (A)
5.00E-03
Measurement
Precision/Resolution
±5.05E-05
-Supply Current 15V (A)
-5.00E-03
±4.92E-05
Input Offset Voltage1 15V (V)
-8.00E-04
8.00E-04
±1.08E-05
Input Offset Current1 15V (A)
-7.00E-08
7.00E-08
±3.78E-10
+Input Bias Current1 15V (A)
-7.15E-07
7.15E-07
±4.85E-09
-Input Bias Current1 15V (A)
-7.15E-07
7.15E-07
±4.93E-09
Input Offset Voltage2 15V (V)
-8.00E-04
8.00E-04
±9.55E-06
Input Offset Current2 15V (A)
-7.00E-08
7.00E-08
±1.36E-09
+Input Bias Current2 15V (A)
-7.15E-07
7.15E-07
±4.01E-09
-Input Bias Current2 15V (A)
-7.15E-07
7.15E-07
±3.41E-09
Input Offset Voltage3 15V (V)
-8.00E-04
8.00E-04
±7.87E-06
Input Offset Current3 15V (A)
-7.00E-08
7.00E-08
±3.66E-10
+Input Bias Current3 15V (A)
-7.15E-07
7.15E-07
±3.60E-09
-Input Bias Current3 15V (A)
-7.15E-07
7.15E-07
±3.65E-09
Output Voltage Swing High1 15V (V)
1.00E-02
±1.38E-04
Output Voltage Swing High2 15V (V)
1.50E-01
±5.50E-04
Output Voltage Swing High3 15V (V)
8.00E-01
±1.89E-03
Output Voltage Swing Low1 15V (V)
3.00E-02
±3.92E-04
Output Voltage Swing Low2 15V (V)
1.00E-01
±5.38E-04
Output Voltage Swing Low3 15V (V)
5.00E-01
±1.65E-03
Large Signal Voltage Gain1 15V (V/mV)
1.00E+03
±2.19E+01%
Large Signal Voltage Gain2 15V (V/mV)
5.00E+02
±8.58E+00%
Common Mode Rejection Ratio1 15V (dB)
9.00E+01
±1.44E-01
CMRR Match1 15V (dB)
8.40E+01
±6.76E-01
Power Supply Rejection Ratio1 (dB)
9.00E+01
±3.29E-01
PSRR Match1 15V (dB)
8.30E+01
±1.74E-01
+Short-Circuit Current1 15V (A)
-1.50E-02
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-Short-Circuit Current1 15V (A)
1.50E-02
±1.81E-04
Gain-Bandwidth Product1 15V (MHz)
6.80E+00
±3.11E-02
+Slew Rate1 15V (V/µs)
3.50E+00
±1.34E-01
-Slew Rate1 15V (V/µs)
-3.50E+00
±1.01E-01
+Supply Current 5V (A)
4.40E-03
±2.59E-05
-Supply Current 5V (A)
-4.40E-03
±2.53E-05
Input Offset Voltage1 5V (V)
-8.00E-04
8.00E-04
±8.15E-06
Input Offset Current1 5V (A)
-6.50E-08
6.50E-08
±3.89E-10
+Input Bias Current1 5V (A)
-6.50E-07
6.50E-07
±3.03E-09
-Input Bias Current1 5V (A)
-6.50E-07
6.50E-07
±3.38E-09
Input Offset Voltage2 5V (V)
-8.00E-04
8.00E-04
±5.82E-06
Input Offset Current2 5V (A)
-6.50E-08
6.50E-08
±1.42E-09
+Input Bias Current2 5V (A)
-6.50E-07
6.50E-07
±2.92E-09
-Input Bias Current2 5V (A)
-6.50E-07
6.50E-07
±1.84E-09
Output Voltage Swing High1 5V (V)
1.00E-02
±1.05E-04
Output Voltage Swing High2 5V (V)
1.50E-01
±3.18E-04
Output Voltage Swing High3 5V (V)
2.50E-01
±7.39E-04
Output Voltage Swing Low1 5V (V)
3.00E-02
±2.74E-04
Output Voltage Swing Low2 5V (V)
1.00E-01
±5.19E-04
Output Voltage Swing Low3 5V (V)
2.00E-01
±4.21E-04
Large Signal Voltage Gain1 5V (V/mV)
6.00E+02
±7.28E+01%
Common Mode Rejection Ratio1 5V (dB)
7.60E+01
±1.96E-01
CMRR Match1 5V (dB)
7.50E+01
±7.17E-01
Power Supply Rejection Ratio1 5V (dB)
8.80E+01
±9.96E+00
PSRR Match1 5V (dB)
8.20E+01
±7.10E-01
+Short-Circuit Current1 5V (A)
-1.25E-02
±3.74E-05
-Short-Circuit Current1 5V (A)
1.25E-02
±1.32E-04
+Slew Rate1 5V(V/µs)
2.60E+00
±5.40E-02
-Slew Rate1 5V (V/µs)
-2.60E+00
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Appendix D: List of Figures Used in the Results Section (Section 5)
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
5.8.
5.9.
5.10.
5.11.
5.12.
5.13.
5.14.
5.15.
5.16.
5.17.
5.18.
5.19.
5.20.
5.21.
5.22.
5.23.
5.24.
5.25.
5.26.
5.27.
5.28.
5.29.
5.30.
5.31.
5.32.
5.33.
5.34.
5.35.
5.36.
5.37.
5.38.
5.39.
5.40.
+Supply Current 15V (A) @ VS=+/-15V
-Supply Current 15V (A) @ VS=+/-15V
Input Offset Voltage1_1 15V (V) @ VS=+/-15V, VCM=0V
Input Offset Voltage1_2 15V (V) @ VS=+/-15V, VCM=0V
Input Offset Current1_1 15V (A) @ VS=+/-15V, VCM=0V
Input Offset Current1_2 15V (A) @ VS=+/-15V, VCM=0V
+Input Bias Current1_1 15V (A) @ VS=+/-15V, VCM=0V
+Input Bias Current1_2 15V (A) @ VS=+/-15V, VCM=0V
-Input Bias Current1_1 15V (A) @ VS=+/-15V, VCM=0V
-Input Bias Current1_2 15V (A) @ VS=+/-15V, VCM=0V
Input Offset Voltage2_1 15V (V) @ VS=+/-15V, VCM=15V
Input Offset Voltage2_2 15V (V) @ VS=+/-15V, VCM=15V
Input Offset Current2_1 15V (A) @ VS=+/-15V, VCM=15V
Input Offset Current2_2 15V (A) @ VS=+/-15V, VCM=15V
+Input Bias Current2_1 15V (A) @ VS=+/-15V, VCM=15V
+Input Bias Current2_2 15V (A) @ VS=+/-15V, VCM=15V
-Input Bias Current2_1 15V (A) @ VS=+/-15V, VCM=15V
-Input Bias Current2_2 15V (A) @ VS=+/-15V, VCM=15V
Input Offset Voltage3_1 15V (V) @ VS=+/-15V, VCM=-15V
Input Offset Voltage3_2 15V (V) @ VS=+/-15V, VCM=-15V
Input Offset Current3_1 15V (A) @ VS=+/-15V, VCM=-15V
Input Offset Current3_2 15V (A) @ VS=+/-15V, VCM=-15V
+Input Bias Current3_1 15V (A) @ VS=+/-15V, VCM=-15V
+Input Bias Current3_2 15V (A) @ VS=+/-15V, VCM=-15V
-Input Bias Current3_1 15V (A) @ VS=+/-15V, VCM=-15V
-Input Bias Current3_2 15V (A) @ VS=+/-15V, VCM=-15V
Output Voltage Swing High1_1 15V (V) @ VS=+/-15V, IL=0mA
Output Voltage Swing High1_2 15V (V) @ VS=+/-15V, IL=0mA
Output Voltage Swing High2_1 15V (V) @ VS=+/-15V, IL=1mA
Output Voltage Swing High2_2 15V (V) @ VS=+/-15V, IL=1mA
Output Voltage Swing High3_1 15V (V) @ VS=+/-15V, IL=10mA
Output Voltage Swing High3_2 15V (V) @ VS=+/-15V, IL=10mA
Output Voltage Swing Low1_1 15V (V) @ VS=+/-15V, IL=0mA
Output Voltage Swing Low1_2 15V (V) @ VS=+/-15V, IL=0mA
Output Voltage Swing Low2_1 15V (V) @ VS=+/-15V, IL=1mA
Output Voltage Swing Low2_2 15V (V) @ VS=+/-15V, IL=1mA
Output Voltage Swing Low3_1 15V (V) @ VS=+/-15V, IL=10mA
Output Voltage Swing Low3_2 15V (V) @ VS=+/-15V, IL=10mA
Large Signal Voltage Gain1_1 15V (V/mV) @ VS=+/-15V, VO=+/-14.5V, RL=10kΩ
Large Signal Voltage Gain1_2 15V (V/mV) @ VS=+/-15V, VO=+/-14.5V, RL=10kΩ
An ISO 9001:2008 and DLA Certified Company
226
TID Report
15-0091 03/20/15 R1.0
5.41.
5.42.
5.43.
5.44.
5.45.
5.46.
5.47.
5.48.
5.49.
5.50.
5.51.
5.52.
5.53.
5.54.
5.55.
5.56.
5.57.
5.58.
5.59.
5.60.
5.61.
5.62.
5.63.
5.64.
5.65.
5.66.
5.67.
5.68.
5.69.
5.70.
5.71.
5.72.
5.73.
5.74.
5.75.
5.76.
5.77.
5.78.
5.79.
5.80.
5.81.
5.82.
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain2_1 15V (V/mV) @ VS=+/-15V, VO=+/-10V, RL=2kΩ
Large Signal Voltage Gain2_2 15V (V/mV) @ VS=+/-15V, VO=+/-10V, RL=2kΩ
Common Mode Rejection Ratio1_1 15V (dB) @ VS=+/-15V, VCM=+/-15V
Common Mode Rejection Ratio1_2 15V (dB) @ VS=+/-15V, VCM=+/-15V
CMRR Match1 15V (dB) @ VS=+/-15V, VCM=+/-15V
Power Supply Rejection Ratio1_1 (dB) @ VS=+/-2V to +/-16V
Power Supply Rejection Ratio1_2 (dB) @ VS=+/-2V to +/-16V
PSRR Match1 15V (dB) @ VS=+/-2V to +/-16V
+Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V
+Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V
-Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V
-Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V
Gain-Bandwidth Product1_1 15V (MHz) @ VS=+/-15V, f=100kHz
Gain-Bandwidth Product1_2 15V (MHz) @ VS=+/-15V, f=100kHz
+Slew Rate1_1 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ
+Slew Rate1_2 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ
-Slew Rate1_1 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ
-Slew Rate1_2 15V (V/µs) @ VS=+/-15V, AV=1, RL=10kΩ
+Supply Current 5V (A) @ VS=+5V
-Supply Current 5V (A) @ VS=+5V
Input Offset Voltage1_1 5V (V) @ VS=+5V, VCM=0V
Input Offset Voltage1_2 5V (V) @ VS=+5V, VCM=0V
Input Offset Current1_1 5V (A) @ VS=+5V, VCM=0V
Input Offset Current1_2 5V (A) @ VS=+5V, VCM=0V
+Input Bias Current1_1 5V (A) @ VS=+5V, VCM=0V
+Input Bias Current1_2 5V (A) @ VS=+5V, VCM=0V
-Input Bias Current1_1 5V (A) @ VS=+5V, VCM=0V
-Input Bias Current1_2 5V (A) @ VS=+5V, VCM=0V
Input Offset Voltage2_1 5V (V) @ VS=+5V, VCM=5V
Input Offset Voltage2_2 5V (V) @ VS=+5V, VCM=5V
Input Offset Current2_1 5V (A) @ VS=+5V, VCM=5V
Input Offset Current2_2 5V (A) @ VS=+5V, VCM=5V
+Input Bias Current2_1 5V (A) @ VS=+5V, VCM=5V
+Input Bias Current2_2 5V (A) @ VS=+5V, VCM=5V
-Input Bias Current2_1 5V (A) @ VS=+5V, VCM=5V
-Input Bias Current2_2 5V (A) @ VS=+5V, VCM=5V
Output Voltage Swing High1_1 5V (V) @ VS=+5V, IL=0mA
Output Voltage Swing High1_2 5V (V) @ VS=+5V, IL=0mA
Output Voltage Swing High2_1 5V (V) @ VS=+5V, IL=1mA
Output Voltage Swing High2_2 5V (V) @ VS=+5V, IL=1mA
Output Voltage Swing High3_1 5V (V) @ VS=+5V, IL=2.5mA
Output Voltage Swing High3_2 5V (V) @ VS=+5V, IL=2.5mA
An ISO 9001:2008 and DLA Certified Company
227
TID Report
15-0091 03/20/15 R1.0
5.83.
5.84.
5.85.
5.86.
5.87.
5.88.
5.89.
5.90.
5.91.
5.92.
5.93.
5.94.
5.95.
5.96.
5.97.
5.98.
5.99.
5.100.
5.101.
5.102.
5.103.
5.104.
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low1_1 5V (V) @ VS=+5V, IL=0mA
Output Voltage Swing Low1_2 5V (V) @ VS=+5V, IL=0mA
Output Voltage Swing Low2_1 5V (V) @ VS=+5V, IL=1mA
Output Voltage Swing Low2_2 5V (V) @ VS=+5V, IL=1mA
Output Voltage Swing Low3_1 5V (V) @ VS=+5V, IL=2.5mA
Output Voltage Swing Low3_2 5V (V) @ VS=+5V, IL=2.5mA
Large Signal Voltage Gain1_1 5V (V/mV) @ VS=+5V, VO=75mV TO 4.8V, RL=10kΩ
Large Signal Voltage Gain1_2 5V (V/mV) @ VS=+5V, VO=75mV TO 4.8V, RL=10kΩ
Common Mode Rejection Ratio1_1 5V (dB) @ VS=+5V, VCM=0 TO 5V
Common Mode Rejection Ratio1_2 5V (dB) @ VS=+5V, VCM=0 TO 5V
CMRR Match1 5V (dB) @ VS=+5V
Power Supply Rejection Ratio1_1 5V (dB) @ VS=+4.5V TO +12V
Power Supply Rejection Ratio1_2 5V (dB) @ VS=+4.5V TO +12V
PSRR Match1 5V (dB) @ VS=+4.5V to +12V
+Short-Circuit Current1_1 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY
+Short-Circuit Current1_2 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY
-Short-Circuit Current1_1 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY
-Short-Circuit Current1_2 5V (A) @ VS=+5V, VOUT=1/2 SUPPLY
+Slew Rate1_1 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ
+Slew Rate1_2 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ
-Slew Rate1_1 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ
-Slew Rate1_2 5V (V/µs) @ VS=+/-2.5V, AV=1, RL=10kΩ
An ISO 9001:2008 and DLA Certified Company
228