uPA1707 DS - Renesas Electronics

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April 1st, 2010
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DATA SHEET
MOS FIELD EFFECT TRANSISTOR
µ PA1707
SWITCHING
N-CHANNEL POWER MOS FET
INDUSTRIAL USE
PACKAGE DRAWING (Unit: mm)
DESCRIPTION
The µPA1707 is N-Channel MOS Field Effect
8
Transistor designed for DC/DC converters and power
5
management applications of notebook computers.
1,2,3 ; Source
; Gate
4
5,6,7,8 ; Drain
FEATURES
• Low on-resistance
RDS(on)1 = 10.0 mΩ TYP. (VGS = 10 V, ID = 5.0 A)
0.05 MIN.
• Built-in G-S protection diode
• Small and surface mount package (Power SOP8)
4.4
5.37 MAX.
0.8
+0.10
–0.05
• Low Ciss: Ciss = 1400 pF TYP.
6.0 ±0.3
4
0.15
1.8 MAX.
RDS(on)3 = 14.0 mΩ TYP. (VGS = 4.0 V, ID = 5.0 A)
1.44
1
RDS(on)2 = 12.5 mΩ TYP. (VGS = 4.5 V, ID = 5.0 A)
0.5 ±0.2
0.10
1.27 0.78 MAX.
0.40
+0.10
–0.05
0.12 M
ORDERING INFORMATION
PART NUMBER
PACKAGE
µPA1707G
Power SOP8
ABSOLUTE MAXIMUM RATINGS (TA = 25°C, All terminals are connected.)
Drain to Source Voltage (VGS = 0 V)
VDSS
30
V
Gate to Source Voltage (VDS = 0 V)
VGSS
±20
V
Drain Current (DC) (TC= 25°C)
ID(DC)
±10
A
ID(pulse)
±40
A
PT
2.0
W
Channel Temperature
Tch
150
°C
Storage Temperature
Tstg
–55 to +150
°C
Drain Current (pulse)
Note1
Total Power Dissipation (TA = 25°C)
Note2
EQUIVALENT CIRCUIT
Drain
Body
Diode
Gate
Gate
Protection
Diode
Source
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1%
2
2. Mounted on ceramic substrate of 1200 mm x 1.7 mm
Remark
The diode connected between the gate and source of the transistor serves as a protector against ESD.
When this device actually used, an additional protection circuit is externally required if a voltage
exceeding the rated voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No.
G13084EJ3V0DS00 (3rd edition)
Date Published April 2001 NS CP(K)
Printed in Japan
The mark ★ shows major revised points.
©
1998
µ PA1707
ELECTRICAL CHARACTERISTICS (TA = 25°C, All terminals are connected.)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Zero Gate Voltage Drain Current
IDSS
VDS = 30 V, VGS = 0 V
10
µA
Gate Leakage Current
IGSS
VGS = ±20 V, VDS = 0 V
±10
µA
VGS(off)
VDS = 10 V, ID = 1 mA
1.5
2.0
2.5
V
| yfs |
VDS = 10 V, ID = 5.0 A
5.0
13
RDS(on)1
VGS = 10 V, ID = 5.0 A
10.0
13.5
mΩ
RDS(on)2
VGS = 4.5 V, ID = 5.0 A
12.5
18
mΩ
RDS(on)3
VGS = 4.0 V, ID = 5.0 A
14.0
21
mΩ
Gate Cut-off Voltage
Forward Transfer Admittance
Drain to Source On-state Resistance
S
Input Capacitance
Ciss
VDS = 10 V
1400
pF
Output Capacitance
Coss
VGS = 0 V
450
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
180
pF
Turn-on Delay Time
td(on)
ID = 5.0 A
20
ns
VGS(on) = 10 V
185
ns
td(off)
VDD = 15 V
65
ns
tf
RG = 10 Ω
40
ns
Total Gate Charge
QG
ID = 10 A
26
nC
Gate to Source Charge
QGS
VDD = 24 V
4.2
nC
Gate to Drain Charge
QGD
VGS = 10 V
6.5
nC
VF(S-D)
IF = 10 A, VGS = 0 V
0.8
V
Reverse Recovery Time
trr
IF = 10 A, VGS = 0 V
30
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/ µs
25
nC
Rise Time
tr
Turn-off Delay Time
Fall Time
Body Diode Forward Voltage
TEST CIRCUIT 1 SWITCHING TIME
TEST CIRCUIT 2 GATE CHARGE
D.U.T.
RL
RG
PG.
VGS
VGS
Wave Form
0
90%
90%
ID
VGS
0
ID
0 10%
10%
Wave Form
τ
τ = 1 µs
Duty Cycle ≤ 1%
D.U.T.
90%
IG = 2 mA
RL
50 Ω
VDD
VDD
ID
2
VGS(on)
10%
tr td(off)
td(on)
ton
tf
toff
Data Sheet G13084EJ3V0DS
PG.
µ PA1707
TYPICAL CHARACTERISTICS (TA = 25°C)
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
2.8
100
80
60
40
20
0
20
40
60
80
100 120 140 160
Mounted on ceramic
substrate of
1200mm 2 ×1.7mm
2.4
2.0
1.6
1.2
0.8
0.4
0
20
TA - Ambient Temperature - ˚C
★
40
60
80
100 120 140 160
TA - Ambient Temperature - ˚C
FORWARD BIAS SAFE OPERATING AREA
100
)
on
(
DS
d
ite )
Lim 0 V
=1
ID(pulse)
10
1m
s
10
ID(DC)
ms
10
0m
s
DC
Po
Lim wer
ite Dis
d
sip
a
1
Remark
2
tio
Mounted on ceramicsubstrate of 1200 mm × 1.7 mm
n
0.1
TC = 25˚C
0.01 Single Pulse
0.1
1
10
100
VDS - Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
1000
rth(t) - Transient Thermal Resistance - ˚C/W
ID - Drain Current - A
R VGS
(at
Rth(ch-a) = 62.5˚C/W
100
10
1
0.1
Mounted on ceramic
substrate of
1200 mm2 to 1.7 mm
Single Pulse
Channel to Ambient
0.01
0.001
100 µ
1m
10 m
100 m
1
10
100
1000
10000
PW - Pulse Width - s
Data Sheet G13084EJ3V0DS
3
µ PA1707
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD TRANSFER CHARACTERISTICS
100
Pulsed
Pulsed
1
TA = 125˚C
75˚C
25˚C
−25˚C
0.1
0
VDS = 10 V
3
4
2
1
0
0.4
0.2
0.8
0.6
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
10
TA = −25˚C
25˚C
75˚C
125˚C
1
VDS =10 V
Pulsed
1
10
100
ID- Drain Current - A
RDS(on) - Drain to Source On-state Resistance - mΩ
20
VDS - Drain to Source Voltage - V
0.1
4
30
VGS - Gate to Source Voltage - V
100
Pulsed
30
20
VGS = 4 V
4.5 V
10
10 V
1
10
100
Pulsed
35
30
25
20
15
ID = 5 A
10
5
5
0
10
15
20
25
VGS - Gate to Source Voltage - V
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
0
0.1
VGS = 10 V 4.5 V 4 V
40
10
RDS(on) - Drain to Source On-state Resistance - mΩ
0.01
|yfs| - Forward Transfer Admittance - S
ID - Drain Current - A
10
GATE CUT-OFF VOLTAGE vs.CHANNEL
TEMPERATURE
VGS(off) - Gate Cut-off Voltage - V
ID - Drain Current - A
50
VDS = 10 V
ID = 1 mA
2.2
1.8
1.4
1.0
0.6
−40
0
40
80
120
Tch - Channel Temperature - ˚C
ID - Drain Current - A
Data Sheet G13084EJ3V0DS
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
Pulsed
ID = 5 A
VGS = 4.0 V
4.5 V
15
10 V
10
5
0
−40
0
40
80
120
100
10
VGS = 4 V
0.1
0
140
Ciss
Coss
Crss
100
10
30
100
100
10
10
100
VDS - Drain to Source Voltage - V
trr - Reverse Recovery Time - ns
di/dt = 100A /µs
VGS = 0 V
1
1.2
1.4
100
td(off)
tf
td(on)
10
VDS = 15 V
VGS = 10 V
RG = 10 Ω
1
0.1
1
10
100
ID - Drain Current - A
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
1
0.1
1.0
tr
VDS - Drain to Source Voltage - V
1000
0.8
1000
td(on), tr, td(off), tf - Switching Time - ns
VGS = 0 V
f = 1 MHz
1
0.6
SWITCHING CHARACTERISTICS
1000
10
0.1
0.4
VSD - Source to Drain Voltage - V
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
Ciss, Coss, Crss - Capacitance - pF
0.2
Tch - Channel Temperature - ˚C
10000
0V
1
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
40
ID = 10 A
14
12
30
VDD = 24 V
15 V
6V
20
VGS
10
8
6
4
10
2
0
ID - Drain Current - A
0
4
8
12
16
20
24
28
0
32
QG - Gate Charge - nC
Data Sheet G13084EJ3V0DS
5
VGS - Gate to Source Voltage - V
20
IF - Diode Forward Current - A
RDS(on) - Drain to Source On-state Resistance - mΩ
µ PA1707
µ PA1707
[MEMO]
6
Data Sheet G13084EJ3V0DS
µ PA1707
[MEMO]
Data Sheet G13084EJ3V0DS
7
µ PA1707
• The information in this document is current as of April, 2001. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
• NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
• While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
• NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4