Application Bulletin 223

1.25Gbps, 850nm
VCSEL Transmitters
OPV200 Series Reliability Data
Description
The Optek Quality Assurance System provides a means to
monitor, control and correct product quality on a real-time
basis. Each product family that Optek produces is extensively tested prior to manufacturing release for quality and
reliability. An ongoing commitment to quality and product improvement insures that reliability will continue to progress
throughout the product’s life cycle.
The OPV200 series VCSEL transmitters were designed to
provide the high a degree of performance with equal level of
reliability. The data contained in this report serves to validate
the reliability of these components and stands as Optek’s
commitment to continuous product improvement.
OPV200 Series
Demonstrated Performance
Test Name
Total Units Total Device
Tested
Hours
Conditions
Failures
High Temperature TA = 100 C, IF = 20mA
Operating Life
VF(AVG) = 1.9 V
Predicted Failure Rate at If = 7.0 mA (typical)
Predicted Performance
90% Confidence
MTTF
FIT
Ambient
Temp.
Junction
Temp.
MTTF1
FIT2
( C)
( C)
(Hours)
(109 Hours)
!
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(
Optek Technology, Inc.
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!
(Hours)
(109 Hours)
Predicted Performance
60% Confidence
MTTF
FIT
(Hours)
(109 Hours)
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July 2003
Issue 4.0
Carrollton, Texas 75006
(972) 323-2200
Page 1 of 3
sensors@optekinc.com
www.optekinc.com
OPV200 Series Reliability Data
OPV200 Series
Mechanical and Environmental Tests
Results3
MIL-STD-883 (Unless otherwise stated)
Examination or Test
Method
Details
LTPD Reject Pass
11 Parts
Group 1
20
Mechanical Shock
2002
1,500 G at 0.5ms, 5 times per axis
Vibration
2007
Condition A
20-2,000 Hz, 4 min/cycle, 4 cycles/axis
End point testing for Group 1
11 Parts
Group 2
1011
0-100 C
Solderability
2003
Steam aging not required
End point testing for Group 2
Group 3
10 parts
Accelerated Aging Life Test
(Central Office Rating)
Output power maintained at 1.1mW. TC = 70 C (TA
may be adjusted to obtain TC value.
End point testing for Group 3
5,000 Hour read point
Group 4
25 parts
Accelerated Aging Life Test
(Uncontrolled Env. Rating)
Biased at rated power. TC = 85 C , 1.1mW
End point testing for Group 4
5,000 Hour read point
Group 5
11 Parts
1008
11
0
11
0
10
0
25
20
Thermal Shock
High Temp Storage
0
20
TA = 125 C (2,000 hours total)
Mid point testing for Group 5
1,000 Hours
0
11
End point testing for Group 5
2,000 Hours
0
11
Group 6
11 Parts
Low Temp Storage
TA = -40 C (2,000 hours total)
Mid point testing for Group 6
1,000 hour mid point
0
11
End point testing for Group 6
2,000 hour end point
0
11
20
July 2003
Issue 4.0
Optek Technology, Inc.
Carrollton, Texas 75006
(972) 323-2200
Page 2 of 3
sensors@optekinc.com
www.optekinc.com
OPV200 Series Reliability Data
OPV200 Series
Mechanical and Environmental Tests
Examination or Test
Results3
MIL-STD-883 (Unless otherwise stated)
Method
Details
LTPD Reject Pass
20
11 Parts
Group 7
Temperature Cycling
(Central office rating)
1011
-40 - 70 C, 500 cycles
End point testing for Group 7
Temperature Cycling
(Uncontrolled Env. Rating)
1010
5,000 Hour read point
Group 9
11 Parts
103
11
0
11
0
5
85 C/85% Relative Humidity; 1,000 hours
20
11 Parts
Moisture Resistance
20 cycles with 10 sub-cycles
End point testing for Group 10
5 Parts
1004
0
MIL-STD-202
Group 10
Water Vapor Content
11
20
End point testing for Group 9
Group 11
0
-40 - 85 C, 500 cycles
End point testing for Group 8
Damp Heat
11
20
11 Parts
Group 8
0
-
5,000 PPM Max H2O
End point testing for Group 11
Notes:
1. MTTF is the total devices hours divided by either the number of failures or unity if there are no failures.
2. Failure in time (FIT) is equal to the number of failures expected in one billion device hours. For example, 1 FIT = 1
failure per 1,000,000,000 devices hours.
3. End point failure criteria is a catastrophic failure or when the product demonstrates a drop in optical power of greater
than 2 dBm at IF = 12mA.
July 2003
Issue 4.0
Optek Technology, Inc.
Carrollton, Texas 75006
(972) 323-2200
Page 3 of 3
sensors@optekinc.com
www.optekinc.com