ESD Sensitivity Testing of Mini-Circuits ERA-5XSM

ESD Sensitivity Testing of Mini-Circuits ERA-5XSM
(AN-60-029)
1.0
Purpose: To determine the Electrostatic Discharge Sensitivity of Mini-Circuits Amplifier
ERA-5XSM in accordance with Human Body Model (HBM) and Machine Model (MM)
ESD sensitivity standards. The failure criterion is: 1dB change in gain and/or 10% change
in device voltage.
2.0
Ref.: ESD STM5.1-1993 (for HBM) and ESD STM5.2-1999 (for MM).
3.0
Human Body Model
Three (3) separate samples were used for each of the different values of ESD voltage:
150V, 200V, 240V, 499V, and 999V. Each sample was subjected to 3 ESD pulses of
each polarity at each of 3 pairs of pins: input – output, input – ground, and output –
ground, a total of 18 pulses.
Electrical performance testing was done for gain and DC device voltage at 65mA bias
current, before and after the ESD pulses. Using the failure criteria of 1dB change in gain
or 10% change in device voltage, all devices passed at 499V; at 999V, all 3 failed.
4.0
Machine Model
4.1
Testing per ESD STM5.2-1999
Three (3) separate samples were used for each of the different values of ESD
voltage: 50V, 70V, 100V, and 150V. Each sample was subjected to 3 ESD pulses
of each polarity at each of 3 pairs of pins: input – output, input – ground, and
output – ground, a total of 18 pulses.
Electrical performance testing was done for gain and DC device voltage at 65mA
bias current, before and after the ESD pulses. Data are presented in Table 2.
Using the failure criteria stated in 1.0, the devices passed at 50V; 2 of the 3 failed
at 70V.
AN-60-029 Rev.: A M150261 (04/14/15) File: AN60029.doc
This document and its contents are the property of Mini-Circuits.
Page 1 of 6
Table 1 – Human Body Model
ERA -5XSM
[150 v Human Body Model]
Units
1
Gain (dB) Frequency PRE-Test POST-Test
100
20.45
20.42
2000
17.44
17.47
Vdd(v)
Idd=65mA
4.81
4.81
[200 v HBM]
Units
4
Gain (dB) Frequency PRE-Test POST-Test
100
20.48
20.45
2000
17.45
17.85
Vdd(v)
Idd=65mA
4.81
Idd=65mA
4.81
Idd=65mA
4.81
4.84
[999 v HBM]
Units
25
Gain (dB) Frequency PRE-Test POST-Test
100
20.4
-14.63
2000
17.48
-15.18
Vdd(v)
Idd=65mA
4.81
2.15
0.00%
4.82
4.82
5
DIF % change PRE-Test POST-Test
-0.03
20.45
20.42
0.4
17.42
17.81
0
0.00%
4.82
4.82
8
DIF % change PRE-Test POST-Test
-0.05
20.45
20.42
-0.2
17.45
17.83
4.81
[499 v HBM]
Units
10
Gain (dB) Frequency PRE-Test POST-Test
100
20.67
20.57
2000
18.12
17.67
Vdd(v)
0
4.81
[240 v HBM]
Units
7
Gain (dB) Frequency PRE-Test POST-Test
100
20.42
20.37
2000
17.42
17.22
Vdd(v)
2
DIF % change PRE-Test POST-Test
-0.03
20.36
20.32
0.03
17.37
17.22
0
0.00%
4.82
4.82
11
DIF % change PRE-Test POST-Test
-0.1
20.63
20.53
-0.45
17.57
17.53
0.03
0.62%
4.82
4.84
26
DIF % change PRE-Test POST-Test
-35.03
20.5
-4.56
-32.66
17.48
-5.45
-2.66
AN-60-029 Rev.: A M150261 (04/14/15) File: AN60029.doc
This document and its contents are the property of Mini-Circuits.
-55.30%
4.82
3.42
3
DIF % change PRE-Test POST-Test
-0.04
20.43
20.4
-0.15
17.43
17.25
0
0.00%
4.81
4.81
6
DIF % change PRE-Test POST-Test
-0.03
20.44
20.33
0.39
17.44
17.97
0
0.00%
4.81
4.86
9
DIF % change PRE-Test POST-Test
-0.03
20.46
20.4
0.38
17.46
17.55
0
0.00%
4.81
4.81
12
DIF % change PRE-Test POST-Test
-0.1
20.59
20.48
-0.04
17.44
17.31
0.02
0.41%
4.81
4.84
DIF % change
-0.03
-0.18
0
0.00%
DIF % change
-0.11
0.53
0.05
1.04%
DIF % change
-0.06
0.09
0
0.00%
DIF % change
-0.11
-0.13
0.03
0.62%
27
DIF % change PRE-Test POST-Test
DIF % change
-25.06
20.49
1.08 -19.41
-22.93
17.44
3.49 -13.95
-1.4
-29.05%
4.81
3.74
-1.07
-22.25%
Page 2 of 6
Table 2 – Machine Model
ERA -5XSM
[50 v Machine Model]
Units
22
Gain (dB) Frequency PRE-Test POST-Test
100
20.47
20.42
2000
17.44
17.25
Vdd(v)
Idd=65mA
4.81
4.82
[70 v MM]
Units
19
Gain (dB) Frequency PRE-Test POST-Test
100
20.47
20.34
2000
17.46
17.16
Vdd(v)
Idd=65mA
4.81
4.86
[100 v MM]
Units
16
Gain (dB) Frequency PRE-Test POST-Test
100
20.31
16.7
2000
17.46
14.27
Vdd(v)
Idd=65mA
4.81
6.34
[150 v MM]
Units
13
Gain (dB) Frequency PRE-Test POST-Test
100
20.49
-8.98
2000
17.47
-12.79
Vdd(v)
Idd=65mA
4.81
2.66
23
DIF % change PRE-Test POST-Test
-0.05
20.48
20.4
-0.19
17.93
17.58
0.01
0.21%
4.82
4.85
20
DIF % change PRE-Test POST-Test
-0.13
20.41
16.41
-0.3
17.47
14.82
0.05
1.04%
4.82
5.34
17
DIF % change PRE-Test POST-Test
-3.61
20.59
15.91
-3.19
17.55
13.67
1.53
31.81%
4.82
6.34
14
DIF % change PRE-Test POST-Test
-29.47
20.26
-15.43
-30.26
17.56
-14.54
-2.15
AN-60-029 Rev.: A M150261 (04/14/15) File: AN60029.doc
This document and its contents are the property of Mini-Circuits.
-44.70%
4.82
3.49
24
DIF % change PRE-Test POST-Test
-0.08
20.5
20.45
-0.35
17.66
17.41
0.03
0.62%
4.81
4.83
21
DIF % change PRE-Test POST-Test
-4
20.47
19.69
-2.65
17.47
17.02
0.52
10.79%
4.81
5.82
18
DIF % change PRE-Test POST-Test
-4.68
20.41
-4.51
-3.88
17.45
-3.05
1.52
31.54%
4.81
6.34
15
DIF % change PRE-Test POST-Test
-35.69
20.51
-21.52
-32.1
17.92
-18.71
-1.33
-27.59%
4.81
5.34
DIF % change
-0.05
-0.25
0.02
0.42%
DIF
% change
-0.78
-0.45
1.01
21.00%
DIF
% change
-24.92
-20.5
1.53
31.81%
DIF
% change
-42.03
-36.63
0.53
11.02%
Page 3 of 6
4.2
Additional Machine Model testing was done in two steps, to evaluate how much
performance degradation occurs when progressively increasing ESD voltage is applied
to a given device, and when a given ESD voltage is applied repeatedly with
performance monitored after each pulse. Separate device samples were used for each of
the steps.
The most sensitive pin combination and polarity was determined for ERA-4XSM and
reported in AN-60-028: “-” to the input, “+” to the ground. Because the die topology of
ERA-5XSM is similar, the most sensitive case should be the same and the following
tests were therefore done only for that case.
1.
A sequence of ESD pulses with fixed amplitude of 70V was applied to each of 5 units
in order to determine cumulative effect of ESD stress.
2.
A sequence of ESD pulses with fixed amplitude of 100V was applied to 5 other units in
order to determine cumulative effect of ESD stress at that voltage.
Step 1 Test.
Five units were stressed repeatedly with 70V ESD pulses. Electrical tests for gain and device voltage
were done after each ESD pulse. The results are shown in Figures 1, 2, and 3. After 5 pulses all 5 units
passed the criteria of less than 1dB gain change, but failures occurred against the criterion of 10%
device voltage change at the 2nd pulse.
Step 2 Test.
Five units were stressed repeatedly with 100V ESD pulses. Electrical tests for gain and device voltage
were done after each ESD pulse. After the first pulse gain dropped by 0.44dB and device voltage
increased by 0.83V (that is more than 10%, which would be 0.5V). More 100V ESD pulses caused
more degradation in gain and device voltage. After the third pulse at 100V gain is less by 1.27dB, and
device voltage is higher by 1.9V.
Figure 1 - Gain at 1 MHz
vs. number of 70 V ESD pulses
21
Gain, dB
20.5
#-6
#-7
#-8
#-9
#-10
20
19.5
19
0
1
2
3
4
5
Number of 70V ESD pulses
AN-60-029 Rev.: A M150261 (04/14/15) File: AN60029.doc
This document and its contents are the property of Mini-Circuits.
Page 4 of 6
Figure 2 - Gain (low drive) at 2000 MHz
vs. number of 70 V ESD pulses
18
Gain, dB
17.5
#-6
#-7
#-8
#-9
#-10
17
16.5
16
0
1
2
3
4
5
Number of 70V ESD pulses
Figure 3 - Vdd at 65mA
vs. number of 70 V ESD pulses
6.5
6.25
6
5.75
Vdd, V
5.5
#-6
#-7
#-8
#-9
#-10
5.25
5
4.75
4.5
4.25
4
0
1
2
3
4
5
Number of 70V ESD pulses
AN-60-029 Rev.: A M150261 (04/14/15) File: AN60029.doc
This document and its contents are the property of Mini-Circuits.
Page 5 of 6
5.0
Conclusions
5.1
Human Body Model:
The new amplifier ERA-5XSM can withstand ESD up to 499V (Class 1A).
5.2
Machine Model:
The new amplifier ERA-5XSM shows gradual degradation in the gain and the device
voltage. That fact is not so bad. Even with the multiple stress a customer would rather
have gradual changes then catastrophic failure. The amplifier withstands a single 70V
ESD pulse, or 3 pulses at 50V.
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AN-60-029 Rev.: A M150261 (04/14/15) File: AN60029.doc
This document and its contents are the property of Mini-Circuits.
Page 6 of 6