PBGA-SD - STATS ChipPAC Ltd.

PBGA-SD
Plastic Ball Grid Array - Stacked Die
HIGHLIGHTS
• Stacking of die enables more functionality and
integration in a conventional PBGA package
FEATURES
• Increased sub-system performance achieved by integrating multiple chips into a single package
• Die to die bonding capability for device/signal integration • 15 x 15mm to 40 x 40mm body sizes available
• Ball counts up to >1000 balls
• 0.65, 0.80, 1.00, 1.27 and 1.5mm ball pitch
• SnPb and Pb-free balls available
• Full in-house design capability with wide range of custom and
open tool designs
• Full in-house electrical, thermal and mechanical simulation and
measurements capability
• Multiple chip design and optional passive/discrete components
available
• Standard 2, 4 and 6 layer substrates as well as high density substrate options
• Pb-free and green material set options
• Multiple routing layers and dedicated ground/power planes available for improved electrical and thermal performance
APPLICATIONS
• DSPs and Memory
• Gate Arrays
• ASICs
• PC Chipsets and Peripherals
• Microprocessors/Controllers
• Others
www.statschippac.com
DESCRIPTION
STATS ChipPAC’s chip stack technology offers the flexibility of
stacking 2 to 7 die in a single package. The Stacked Die Plastic
Ball Grid Array (PBGA-SD) package takes advantage of the proven
high electrical and thermal performance of STATS ChipPAC’s PBGA
packages, with efficient use of space made possible through die
stacking technology. STATS ChipPAC’s PBGA-SD packages using
laminate substrates are available in a variety of body sizes and ball
counts, combining advanced assembly processes and proven material
sets for enhanced yield, reliability and performance.
PBGA-SD
Plastic Ball Grid Array - Stacked Die
SPECIFICATIONS
Die Thickness
Gold Wire
Pd/Cu Wire
Bond Pad Pitch
Mold Cap Thickness
Marking
Packing Options
RELIABILITY
Moisture Sensitivity Level
Temperature Cycling
High Temperature Storage
Pressure Cooker Test
Temperature/Humidity Test
Unbiased HAST
150-381µm (6-15mils)
15-30µm (0.6/0.7/0.8/0.9/1.0/1.1/1.2mils) diameter
15-30µm (0.6/0.7/0.8/1.0mils) diameter
45µm inline or 25/50µm staggered capable
0.7~1.17mm
Laser
JEDEC tray/tape and reel
JEDEC Level 3, 260°C reflow
Condition C (-65°C to 150°C),
1000 cycles
150°C, 1000 hrs
121°C/100% RH/2 atm, 168 hrs
85°C/85% RH, 1000 hrs
130°C/85% RH, 2 atm, 96 hrs
ELECTRICAL PERFORMANCE
Electrical parasitic data is highly dependent on the package layout. 3D electrical simulation can be used on the specific package design to provide the best prediction of electrical behavior. First order approximations can be calculated using parasitics per unit length for the constituents of the signal path. Data
below is for a frequency of 100MHz and assumes 1.0 mil gold bonding wire.
onductor
C
Length
Component
(mm)
Wire 2
Net (2L)
2 - 7
Total (2L)
Wire 2
Net (4L)
2 - 7
Total (4L)
Resistance
(mOhms)
120
34 - 119
154 - 239
120
34 - 119
154 - 239
Inductance
(nH)
1.65
1.3 - 4.55
2.95 - 6.2
1.65
0.9 - 3.15
2.55 - 4.80
Inductance
Mutual (nH)
0.45 - 0.85
0.26 - 2.28
0.71 - 3.13
0.45 - 0.85
0.18 - 1.58
0.63 - 2.43
Capacitance
(pF)
0.1
0.25 - 0.95
0.35 - 1.05
0.1
0.35 - 1.1
0.45 - 1.2
Capacitance
Mutual (pF)
0.01 - 0.02
0.06 - 0.42
0.07 - 0.44
0.01 - 0.02
0.06 - 0.42
0.07 - 0.44
Note: Net = Total Trace Length + Via + Solder Ball.
THERMAL PERFORMANCE
The thermal performance of each die in the stack is influenced by other die in the stack. Thermal performance is highly dependent on package size, die size, substrate
layers and thickness, and solder ball configuration. Simulation for specific applications should be performed.
CROSS-SECTION
PACKAGE CONFIGURATIONS
Body Size (mm) Ball Count
15 x 15
17 x 17
17.2 x 17.2
19 x 19
21 x 21
23 x 23
2 die
3 die
(2 functional die + 1 spacer die)
27 x 27
31 x 31
35 x 35
4 die
(3 functional die + 1 spacer die)
37.5 x 37.5
40 x 40
Corporate Office
Global Offices
160, 176, 196
192, 196, 208, 217, 252, 256
512
272, 289, 292, 296, 297, 300, 301, 305, 324, 376
400, 456, 484
169, 192, 208, 217, 233, 241, 288, 301, 304, 305, 318, 320,
324, 338, 340, 348, 352, 360, 376, 385, 388, 420, 456, 480,
484, 492
225, 256, 272, 277, 292, 300, 312, 316, 320, 324, 336, 352,
384, 388, 400, 416, 456, 472, 480, 484, 496, 508, 512, 544,
580, 585, 636, 650, 676
304, 320, 353, 385, 421, 433, 434, 448, 458, 460, 480, 540,
556, 560, 564, 604, 608, 609, 640, 644, 652, 676, 688, 692,
701, 721, 772, 896
304, 312, 313, 340, 352, 385, 388, 400, 420, 426, 432, 448,
452, 454, 456, 458, 474, 480, 484, 492, 496, 512, 516, 532,
542, 544, 548, 556, 564, 573, 580, 611, 624, 640, 648, 661,
665, 676, 680, 688, 700, 716, 729, 736, 740, 748, 756, 792,
816, 824, 840, 867, 868, 1012, 1156
435, 480, 552, 600, 601, 625, 627, 685, 701, 785, 788, 804,
840, 841
503, 557, 569, 596, 600, 745, 776, 928, 961, 1253
10 Ang Mo Kio St. 65, #05-17/20 Techpoint, Singapore 569059 Tel: 65-6824-7777 Fax: 65-6720-7823
USA 510-979-8000
CHINA 86-21-5976-5858
KOREA 82-31-639-8915
TAIWAN 886-3-593-6565
SWITZERLAND 41-21-8047-200
The STATS ChipPAC logo is a registered trademark of STATS ChipPAC Ltd. Trademark registered in United States. Singapore company registration number 199407932D. All other product names and other company names herein are for identification purposes
only and may be the trademarks or registered trademarks of their respective owners. STATS ChipPAC disclaims any and all rights in those marks. STATS ChipPAC makes no guarantee or warranty of its accuracy in the information given, or that the use of such
information will not infringe on intellectual rights of third parties. Under no circumstances shall STATS ChipPAC be liable for any damages whatsoever arising out of the use of, or inability to use the materials in this document. STATS ChipPAC reserves the right
to change the information at any time and without notice.
©Copyright 2014. STATS ChipPAC Ltd. All rights reserved.
December 2014