Project Number: Design Qualification Test Report Requested by: Kevin Meredith Tracking Code: 200542_Report_Rev_1 Date: 08/11/2012 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Product Rev: N/A Lot #: N/A Part description: SSH\ STH Test Start: 06/19/2012 Tech: Craig Ryan Eng: Eric Mings Troy Cook Qty to test: 80 Test Completed: 07/30/2012 DESIGN QUALIFICATION TEST REPORT SSH \ STH SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Page 1 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH CERTIFICATION All instruments and measuring equipment were calibrated to National Institute for Standards and Technology (NIST) traceable standards according to IS0 10012-l and ANSI/NCSL 2540-1, as applicable. All contents contained herein are the property of Samtec. No portion of this report, in part or in full shall be reproduced without prior written approval of Samtec. SCOPE To perform the following tests: Design Qualification test. Please see test plan. APPLICABLE DOCUMENTS Standards: EIA Publication 364 TEST SAMPLES AND PREPARATION 1) 2) 3) 4) 5) 6) 7) 8) 9) 10) All materials were manufactured in accordance with the applicable product specification. All test samples were identified and encoded to maintain traceability throughout the test sequences. After soldering, the parts to be used for LLCR testing were cleaned according to TLWI-0001. Either an automated cleaning procedure or an ultrasonic cleaning procedure may be used. The automated procedure is used with aqueous compatible soldering materials. Parts not intended for testing LLCR are visually inspected and cleaned if necessary. Any additional preparation will be noted in the individual test sequences. Solder Information: Lead Free Re-Flow Time/Temp: See accompanying profile. Samtec Test PCBs used: PCB-103763-TST-XX\ PCB-103588-FAM-XX\ PCB-103764-TST-XX Page 2 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH TYPICAL OVEN PROFILE (Soldering Parts to Test Boards) Page 3 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH FLOWCHARTS Gas Tight TEST GROUP A1 STEP 192 Points 01 LLCR-1 02 Gas Tight 03 LLCR-2 Gas Tight = EIA-364-36A LLCR = EIA-364-23, LLCR 20 mV Max, 100 mA Max Use Keithley 580 or 3706 in 4 wire dry circuit mode Norm al Force TEST GROUP A1 GROUP A2 01 Individual Contacts (8-10 m in) Contact Gaps Individual Contacts (8-10 m in) Contact Gaps 02 Setup Approved Thermal Aging (Mated and Undisturbed) 03 Normal Force (in the body and soldered on PCB unless otherwise specified) Contact Gaps STEP 04 Setup Approved 05 Normal Force (in the body and soldered on PCB unless otherwise specified) Thermal Aging = EIA-364-17, Test Condition 4 (105°C) Time Condition 'B' (250 Hours) Normal Force = EIA-364-04 (Perpendicular) Displacement Force = 12.7 mm/min ± 6 mm/min Spec is 50 N @ 1 mm displacement Contact Gaps / Height - No standard method. Usually measured optically Gaps to be taken on a minimum of 20% of each part tested Page 4 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH FLOWCHARTS Continued Thermal Aging TEST STEP GROUP A1 8 Boards Thermal Aging (Mated) 01 02 Contact Gaps Forces - Mating / Unmating 03 LLCR-1 04 Thermal Aging (Mated and Undisturbed) 05 LLCR-2 06 Forces - Mating / Unmating Contact Gaps 07 Thermal Aging = EIA-364-17, Test Condition 4 (105°C) Time Condition 'B' (250 Hours) Mating / Unmating Forces = EIA-364-13 Contact Gaps / Height - No standard method. Usually measured optically. Gaps to be taken on a minimum of 20% of each part tested LLCR = EIA-364-23, LLCR 20 mV Max, 100 mA Max Use Keithley 580 or 3706 in 4 wire dry circuit mode Current Carrying Capacity - Double Row TEST STEP GROUP B1 3 Mated Assemblies 2 Contacts Powered GROUP B2 3 Mated Assemblies 4 Contacts Powered GROUP B3 3 Mated Assemblies 6 Contacts Powered GROU P B4 3 Mated Assemblies 8 Contacts Powered GROUP B5 3 Mated Assem blies All Contacts Powered 01 CCC CCC CCC CCC CCC (TIN PLATING) - Tabulate calculated current at RT, 65°C, 75°C and 95°C after derating 20% and based on 105°C (GOLD PLATING) - Tabulate calculated current at RT, 85°C, 95°C and 115°C after derating 20% and based on 125°C CCC, Temp rise = EIA-364-70 Page 5 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH FLOWCHARTS Continued Durability/Mating/Unmating/Gaps TEST GROUP A1 GROUP A4 STEP 8 Boards 2mm Stack SSH-030-1.50-G-D-WT Mated STH-030-0.50-G-D-WT 8 Boards 2mm Stack (smallest position submitted) SSH-010-1.50-G-D-WT Mated STH-010-0.50-G-D-WT Contact Gaps Contact Gaps 03 LLCR-1 Forces - Mating / Unmating Forces - Mating / Unmating 25 Cycles 04 25 Cycles Forces - Mating / Unmating 05 Forces - Mating / Unmating Clean w/Compressed Air 01 02 06 07 08 Contact Gaps LLCR-2 09 Thermal Shock (Mated and Undisturbed) 10 LLCR-3 11 Cyclic Humidity (Mated and Undisturbed) 12 13 LLCR-4 Forces - Mating / Unmating Thermal Shock = EIA-364-32, Table II, Test Condition I: -55oC to +85 oC 1/2 hour dwell, 100 cycles Humidity = EIA-364-31, Test Condition B (240 Hours) and Method III (+25°C to +65°C @ 90% RH to 98% RH) ambient pre-condition and delete steps 7a and 7b Mating / Unmating Forces = EIA-364-13 Contact Gaps / Height - No standard method. Usually measured optically. Gaps to be taken on a minimum of 20% of each part tested LLCR = EIA-364-23, LLCR 20 mV Max, 100 mA Max Use Keithley 580 or 3706 in 4 wire dry circuit mode Page 6 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH FLOWCHARTS Continued IR & DWV TEST STEP 01 GROUP A1 GROUP A2 GROUP A3 GROUP B1 2 Mated Sets 2 Unm ated of Part # Being Tested 2 Unmated of Mating Part # 2 Mated Sets Break Down Pin-to-Pin Break Down Pin-to-Pin Break Down Pin-to-Pin Pin-to-Pin DW V/Break Down Voltage DWV/Break Down Voltage DW V/Break Down Voltage IR & DW V at test voltage (on both mated sets and on each connector unmated) 02 Thermal Shock (Mated and Undisturbed) 03 IR & DW V at test voltage (on both mated sets and on each connector unmated) 04 Cyclic Humidity (Mated and Undisturbed) 05 IR & DW V at test voltage (on both mated sets and on each connector unmated) DWV on Group B1 to be performed at Test Voltage DWV test voltage is equal to 75% of the lowest break down voltage from Groups A1, A2 or A3 Thermal Shock = EIA-364-32, Table II, Test Condition I: -55oC to +85 oC 1/2 hour dwell, 100 cycles Humidity = EIA-364-31, Test Condition B (240 Hours) and Method III (+25°C to +65°C @ 90% RH to 98% RH) ambient pre-condition and delete steps 7a and 7b IR = EIA-364-21 DWV = EIA-364-20, Test Condition 1 Page 7 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH FLOWCHARTS Continued Additional Groups Below May Be Needed Based Upon Part Options and Geometry TEST GROUP C1 STEP 2 Mated Sets 01 GROUP C2 2 Unm ated of Part # Being Tested GROUP C3 GROUP D1 2 Unmated of Mating Part # 2 Mated Sets Break Down Row-to-Row Break Down Row-to-Row Break Down Row-to-Row Row-to-Row DW V/Break Down Voltage DWV/Break Down Voltage DW V/Break Down Voltage IR & DW V at test voltage (on both mated sets and on each connector unmated) 02 Thermal Shock (Mated and Undisturbed) 03 IR & DW V at test voltage (on both mated sets and on each connector unmated) 04 Cyclic Humidity (Mated and Undisturbed) 05 IR & DW V at test voltage (on both mated sets and on each connector unmated) TEST GROUP G1 GROUP G2 GROUP G3 GROUP H1 STEP 2 Mated Sets 2 Unm ated of Part # Being Tested 2 Unmated of Mating Part # 2 Mated Sets Break Down Pin-to-Closest Metallic Hardware Break Down Pin-to-Closest Metallic Hardware Break Down Pin-to-Closest Metallic Hardware Pin-to-Closest Metallic Hardware DW V/Break Down Voltage DWV/Break Down Voltage DW V/Break Down Voltage IR & DW V at test voltage (on both mated sets and on each connector unmated) 01 02 Thermal Shock (Mated and Undisturbed) 03 IR & DW V at test voltage (on both mated sets and on each connector unmated) 04 Cyclic Humidity (Mated and Undisturbed) 05 IR & DW V at test voltage (on both mated sets and on each connector unmated) Page 8 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH FLOWCHARTS Continued Mechanical Shock / Vibration / LLCR TEST GROUP A1 STEP 192 Points 01 LLCR-1 Shock 02 03 04 Vibration LLCR-2 Mechanical Shock = EIA 364-27 Half Sine, 100 g's, 6 milliSeconds (Condition "C") each axis Vibration = EIA 364-28, Random Vibration 7.56 g RMS, Condition VB --- 2 hours/axis LLCR = EIA-364-23, LLCR 20 mV Max, 100 mA Max Use Keithley 580 or 3706 in 4 wire dry circuit mode Shock / Vibration / nanoSecond Event Detection TEST GROUP A1 STEP 60 Points 01 Event Detection, Shock 02 Event Detection, Vibration Mechanical Shock = EIA 364-27 Half Sine, 100 g's, 6 milliSeconds (Condition "C") each axis Vibration = EIA 364-28, Random Vibration 7.56 g RMS, Condition VB --- 2 hours/axis Event detection requirement during Shock / Vibration is 50 nanoseconds minimum Page 9 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH ATTRIBUTE DEFINITIONS The following is a brief, simplified description of attributes. THERMAL SHOCK: 1) 2) 3) 4) 5) 6) EIA-364-32, Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors. Test Condition 1: -55°C to +85°C Test Time: ½ hour dwell at each temperature extreme Number of Cycles: 100 All test samples are pre-conditioned at ambient. All test samples are exposed to environmental stressing in the mated condition. THERMAL: 1) 2) 3) 4) 5) EIA-364-17, Temperature Life with or without Electrical Load Test Procedure for Electrical Connectors. Test Condition 4 at 105° C. Test Time Condition B for 250 hours. All test samples are pre-conditioned at ambient. All test samples are exposed to environmental stressing in the mated condition. HUMIDITY: 1) 2) 3) 4) 5) Reference document: EIA-364-31, Humidity Test Procedure for Electrical Connectors. Test Condition B, 240 Hours. Method III, +25° C to + 65° C, 90% to 98% Relative Humidity excluding sub-cycles 7a and 7b. All samples are pre-conditioned at ambient. All test samples are exposed to environmental stressing in the mated condition. MECHANICAL SHOCK (Specified Pulse): 1) 2) 3) 4) 5) 6) 7) Reference document: EIA-364-27, Mechanical Shock Test Procedure for Electrical Connectors Test Condition C Peak Value: 100 G Duration: 6 Milliseconds Wave Form: Half Sine Velocity: 12.3 ft/s Number of Shocks: 3 Shocks / Direction, 3 Axis (18 Total) VIBRATION: 1) 2) 3) 4) 5) 6) Reference document: EIA-364-28, Vibration Test Procedure for Electrical Connectors Test Condition V, Letter B Power Spectral Density: 0.04 G² / Hz G ‘RMS’: 7.56 Frequency: 50 to 2000 Hz Duration: 2.0 Hours per axis (3 axis total) NANOSECOND-EVENT DETECTION: 1) Reference document: EIA-364-87, Nanosecond-Event Detection for Electrical Connectors 2) Prior to test, the samples were characterized to assure the low nanosecond event being monitored will trigger the detector. 3) After characterization it was determined the test samples could be monitored for 50 nanosecond events Page 10 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH ATTRIBUTE DEFINITIONS Continued The following is a brief, simplified description of attributes. TEMPERATURE RISE (Current Carrying Capacity, CCC): 1) EIA-364-70, Temperature Rise versus Current Test Procedure for Electrical Connectors and Sockets. 2 2) When current passes through a contact, the temperature of the contact increases as a result of I R (resistive) heating. 3) The number of contacts being investigated plays a significant part in power dissipation and therefore temperature rise. 4) The size of the temperature probe can affect the measured temperature. 5) Copper traces on PC boards will contribute to temperature rise: a. Self heating (resistive) b. Reduction in heat sink capacity affecting the heated contacts 6) A de-rating curve, usually 20%, is calculated. 7) Calculated de-rated currents at three temperature points are reported: a. Ambient о b. 80 C о c. 95 C о d. 115 C 8) Typically, neighboring contacts (in close proximity to maximize heat build up) are energized. 9) The thermocouple (or temperature measuring probe) will be positioned at a location to sense the maximum temperature in the vicinity of the heat generation area. 10) A computer program, TR 803.exe, ensures accurate stability for data acquisition. 11) Hook-up wire cross section is larger than the cross section of any connector leads/PC board traces, jumpers, etc. 12) Hook-up wire length is longer than the minimum specified in the referencing standard. MATING/UNMATING: 1) Reference document: EIA-364-13, Mating and Unmating Forces Test Procedure for Electrical Connectors. 2) The full insertion position was to within 0.003” to 0.004” of the plug bottoming out in the receptacle to prevent damage to the system under test. 3) One of the mating parts is secured to a floating X-Y table to prevent damage during cycling. LLCR: 1) EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. 2) A computer program, LLCR 221.exe, ensures repeatability for data acquisition. 3) The following guidelines are used to categorize the changes in LLCR as a result from stressing a. <= +5.0 mOhms: --------------------------- Stable b. +5.1 to +10.0 mOhms:--------------------- Minor c. +10.1 to +15.0 mOhms: ------------------- Acceptable d. +15.1 to +50.0 mOhms: ------------------- Marginal e. +50.1 to +2000 mOhms: ------------------ Unstable f. >+2000 mOhms:---------------------------- Open Failure Page 11 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH ATTRIBUTE DEFINITIONS Continued The following is a brief, simplified description of attributes NORMAL FORCE (FOR CONTACTS TESTED IN THE HOUSING): 1) Reference document: EIA-364-04, Normal Force Test Procedure for Electrical Connectors. 2) The contacts shall be tested in the connector housing. 3) If necessary, a “window” shall be made in the connector body to allow a probe to engage and deflect the contact at the same attitude and distance (plus 0.05 mm [0.002”]) as would occur in actual use. 4) The connector housing shall be placed in a holding fixture that does not interfere with or otherwise influence the contact force or deflection. 5) Said holding fixture shall be mounted on a floating, adjustable, X-Y table on the base of the Dillon TC2, computer controlled test stand with a deflection measurement system accuracy of 5.0 µm (0.0002”). 6) The nominal deflection rate shall be 5 mm (0.2”)/minute. 7) Unless otherwise noted a minimum of five contacts shall be tested. 8) The force/deflection characteristic to load and unload each contact shall be repeated five times. 9) The system shall utilize the TC2 software in order to acquire and record the test data. 10) The permanent set of each contact shall be measured within the TC2 software. 11) The acquired data shall be graphed with the deflection data on the X-axis and the force data on the Y-axis and a print out will be stored with the Tracking Code paperwork. INSULATION RESISTANCE (IR): To determine the resistance of insulation materials to leakage of current through or on the surface of these materials when a DC potential is applied. 1) PROCEDURE: a. Reference document: EIA-364-21, Insulation Resistance Test Procedure for Electrical Connectors. b. Test Conditions: i. Between Adjacent Contacts or Signal-to-Ground ii. Electrification Time 2.0 minutes iii. Test Voltage (500 VDC) corresponds to calibration settings for measuring resistances. 2) MEASUREMENTS: 3) When the specified test voltage is applied (VDC), the insulation resistance shall not be less than 1000 megohms. DIELECTRIC WITHSTANDING VOLTAGE (DWV): To determine if the sockets can operate at its rated voltage and withstand momentary over potentials due to switching, surges, and other similar phenomenon. Separate samples are used to evaluate the effect of environmental stresses so not to influence the readings from arcing that occurs during the measurement process. 1) PROCEDURE: a. Reference document: EIA-364-20, Withstanding Voltage Test Procedure for Electrical Connectors. b. Test Conditions: i. Between Adjacent Contacts or Signal-to-Ground ii. Barometric Test Condition 1 iii. Rate of Application 500 V/Sec iv. Test Voltage (VAC) until breakdown occurs 2) MEASUREMENTS/CALCULATIONS a. The breakdown voltage shall be measured and recorded. b. The dielectric withstanding voltage shall be recorded as 75% of the minimum breakdown voltage. c. The working voltage shall be recorded as one-third (1/3) of the dielectric withstanding voltage (onefourth of the breakdown voltage). Page 12 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH RESULTS Temperature Rise, CCC at a 20% de-rating CCC for a CCC for a CCC for a CCC for a CCC for a 30°C Temperature Rise------------------1.8A per contact 30°C Temperature Rise------------------1.4A per contact 30°C Temperature Rise ----- ------------1.1A per contact 30°C Temperature Rise------------------1.0A per contact 30°C Temperature Rise------------------0.5A per contact with 2 adjacent contacts powered with 4 adjacent contacts powered with 6 adjacent contacts powered with 8 adjacent contacts powered with all adjacent contacts powered Mating – Unmating Forces Thermal Aging Group (SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT) Initial o Mating Min --------------------------------------- 5.07 Lbs Max--------------------------------------- 6.70 Lbs o Unmating Min --------------------------------------- 3.96 Lbs Max--------------------------------------- 5.12 Lbs After Thermal o Mating Min --------------------------------------- 3.72 Lbs Max--------------------------------------- 4.27 Lbs o Unmating Min --------------------------------------- 4.37 Lbs Max--------------------------------------- 5.13 Lbs Mating/Unmating Durability Group (SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT) Initial o Mating Min --------------------------------------- 5.38 Lbs Max--------------------------------------- 7.76 Lbs o Unmating Min --------------------------------------- 3.14 Lbs Max--------------------------------------- 5.21 Lbs After 25 Cycles o Mating Min --------------------------------------- 5.33 Lbs Max--------------------------------------- 6.29 Lbs o Unmating Min --------------------------------------- 3.45 Lbs Max--------------------------------------- 5.46 Lbs After Humidity o Mating Min --------------------------------------- 3.12 Lbs Max--------------------------------------- 5.26 Lbs o Unmating Min --------------------------------------- 3.10 Lbs Max--------------------------------------- 4.66 Lbs Page 13 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH RESULTS Continued Mating – Unmating Forces Mating/Unmating Basic Group (SSH-010-1.50-G-D-WT \ STH-010-0.50-G-D-WT) Initial o Mating Min --------------------------------------- 1.46 Lbs Max--------------------------------------- 1.87 Lbs o Unmating Min --------------------------------------- 1.52 Lbs Max--------------------------------------- 1.84 Lbs After 25 Cycles o Mating Min --------------------------------------- 1.31 Lbs Max--------------------------------------- 2.23 Lbs o Unmating Min --------------------------------------- 1.62 Lbs Max--------------------------------------- 1.97 Lbs Normal Force at 0.0062 in deflection Initial o Min----------------------------------------------- 121.30 gf o Max ---------------------------------------------- 131.40 gf Thermal o Min-------------------------------------------------35.30 gf o Max ------------------------------------------------86.20 gf Page 14 of 31 Set ----- 0.0001 in Set ----- 0.0003 in Set ----- 0.0023 in Set ----- 0.0045 in Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH RESULTS Continued Insulation Resistance minimums, IR Pin to Pin Initial o Mated---------------------------------------------- 100000Meg Ω ------------------------- Passed o Unmated ------------------------------------------ 100000Meg Ω ------------------------ Passed Thermal Shock o Mated---------------------------------------------- 100000Meg Ω ------------------------ Passed o Unmated ------------------------------------------ 100000Meg Ω ------------------------ Passed Humidity o Mated---------------------------------------------- 100000Meg Ω ------------------------ Passed o Unmated ------------------------------------------ 100000Meg Ω ------------------------ Passed Row to Row Initial o Mated---------------------------------------------- 100000Meg Ω ------------------------- Passed o Unmated ------------------------------------------ 100000Meg Ω ------------------------ Passed Thermal Shock o Mated---------------------------------------------- 100000Meg Ω ------------------------ Passed o Unmated ------------------------------------------ 100000Meg Ω ------------------------ Passed Humidity o Mated---------------------------------------------- 100000Meg Ω ------------------------ Passed o Unmated ------------------------------------------ 100000Meg Ω ------------------------ Passed Pin to Closest Metallic Hardware Initial o Mated---------------------------------------------- 100000Meg Ω ------------------------- Passed o Unmated ------------------------------------------ 100000Meg Ω ------------------------ Passed Thermal Shock o Mated---------------------------------------------- 100000Meg Ω ------------------------ Passed o Unmated ------------------------------------------ 100000Meg Ω ------------------------ Passed Humidity o Mated---------------------------------------------- 100000Meg Ω ------------------------ Passed o Unmated ------------------------------------------ 100000Meg Ω ------------------------ Passed Dielectric Withstanding Voltage minimums, DWV Minimums o Breakdown Voltage ----------------------------------740 VAC o Test Voltage -------------------------------------------555 VAC o Working Voltage -------------------------------------185 VAC Pin to Pin Initial DWV --------------------------------------------------Passed Thermal DWV-----------------------------------------------Passed Humidity DWV----------------------------------------------Passed Row to Row Initial DWV --------------------------------------------------Passed Thermal DWV-----------------------------------------------Passed Humidity DWV----------------------------------------------Passed Pin to Closest Metallic Hardware Initial DWV --------------------------------------------------Passed Thermal DWV-----------------------------------------------Passed Humidity DWV----------------------------------------------Passed Page 15 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH RESULTS Continued LLCR Thermal Aging Group (192 LLCR test points) SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Initial --------------------------------------------------------------- 19.62mOhms Max Thermal o <= +5.0 mOhms ----------------------------------- 192 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure LLCR Mating/Unmating Durability Group (192 LLCR test points) SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Initial --------------------------------------------------------------- 19.67mOhms Max Durability, 25 Cycles o <= +5.0 mOhms ----------------------------------- 192 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure Thermal Shock o <= +5.0 mOhms ----------------------------------- 192 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure Humidity o <= +5.0 mOhms ----------------------------------- 192 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure LLCR Gas Tight Group (192 LLCR test points) SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Initial --------------------------------------------------------------- 20.31mOhms Max Gas-Tight o <= +5.0 mOhms ----------------------------------- 192 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure Page 16 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH RESULTS Continued LLCR Shock & Vibration Group (192 LLCR test points) SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Initial --------------------------------------------------------------- 19.91mOhms Max Shock &Vibration o <= +5.0 mOhms ----------------------------------- 192 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure Mechanical Shock & Random Vibration: o Shock No Damage ----------------------------------- ---------------------------------- Pass 50 Nanoseconds ------------------------------ ---------------------------------- Pass o Vibration No Damage ----------------------------------- ---------------------------------- Pass 50 Nanoseconds ------------------------------ ---------------------------------- Pass Page 17 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES TEMPERATURE RISE (Current Carrying Capacity, CCC): 1) High quality thermocouples whose temperature slopes track one another were used for temperature monitoring. 2) The thermocouples were placed at a location to sense the maximum temperature generated during testing. 3) Temperature readings recorded are those for which three successive readings, 15 minutes apart, differ less than 1° C (computer controlled data acquisition). 4) Adjacent contacts were powered: a. Linear configuration with 2 adjacent conductors/contacts powered Base Curve Derated 20 % 200542 2 (2x1) Contacts in Series Part Numbers: SSH-030-1.50-G-D-WT / STH-030-0.50-G-D-WT-EXP RT Peak Amp RT Derated Amp Measured Current Current Rating per Contact (30 Deg. Rise, 20% Derated) = 1.8 Amps 85 ° C 85 ° C Peak Amp 85 ° C Derated Amp Room Temp= 21.7 C 4.5 95 ° C 95 ° C Peak Amp 95 ° C Derated Amp 4.1 4.0 Limit Maximum Current, Amp per Contact 115 ° C Peak Amp 115 ° C Derated Amp 3.5 115 ° C Room Temp 3.3 3.0 2.5 2.5 2.0 2.0 125° C Limit 2.2 1.8 1.5 1.3 1.0 1.0 Useful Range 0.5 0.0 20 40 60 80 Ambient Temperature, ° C Page 18 of 31 100 120 140 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued b. Linear configuration with 4 adjacent conductors/contacts powered Base Curve Derated 20 % 200542 4 (2x2) Contacts in Series Part Numbers: SSH-030-1.50-G-D-WT / STH-030-0.50-G-D-WT-EXP RT Peak Amp RT Derated Amp Measured Current Current Rating per Contact (30 Deg. Rise, 20% Derated) = 1.4 Amps 85 ° C 85 ° C Peak Amp 85 ° C Derated Amp Room Temp= 22.4 C 3.5 95 ° C 95 ° C Peak Amp 95 ° C Derated Amp 3.2 Limit Maximum Current, Amp per Contact 3.0 115 ° C Peak Amp 115 ° C Derated Amp 115 ° C Room Temp 2.5 2.5 125° C Limit 2.0 2.0 1.7 1.6 1.5 1.4 1.0 1.0 0.8 Useful Range 0.5 0.0 20 40 60 80 Ambient Temperature, ° C Page 19 of 31 100 120 140 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued c. Linear configuration with 6 adjacent conductors/contacts powered Base Curve Derated 20 % 200542 6 (2x3) Contacts in Series Part Numbers: SSH-030-1.50-G-D-WT / STH-030-0.50-G-D-WT-EXP RT Peak Amp RT Derated Amp Measured Current Current Rating per Contact (30 Deg. Rise, 20% Derated) = 1.1 Amps 85 ° C 85 ° C Peak Amp 85 ° C Derated Amp Room Temp= 22.4 C 95 ° C 95 ° C Peak Amp 2.5 95 ° C Derated Amp 2.5 Limit Maximum Current, Amp per Contact 115 ° C Peak Amp 115 ° C Derated Amp 115 ° C 2.0 Room Temp 2.0 125° C Limit 1.6 1.5 1.3 1.2 1.1 1.0 0.8 0.6 0.5 Useful Range 0.0 20 40 60 80 Ambient Temperature, ° C Page 20 of 31 100 120 140 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued d. Linear configuration with 8 adjacent conductors/contacts powered Base Curve Derated 20 % 200542 8 (2x4) Contacts in Series Part Numbers: SSH-030-1.50-G-D-WT / STH-030-0.50-G-D-WT-EXP RT Peak Amp RT Derated Amp Measured Current Current Rating per Contact (30 Deg. Rise, 20% Derated) = 1.0 Amps 85 ° C 85 ° C Peak Amp 85 ° C Derated Amp Room Temp= 21.5 C 95 ° C 2.5 95 ° C Peak Amp 2.4 95 ° C Derated Amp Limit Maximum Current, Amp per Contact 115 ° C Peak Amp 115 ° C Derated Amp 2.0 115 ° C Room Temp 1.9 1.5 125° C Limit 1.5 1.3 1.2 1.0 1.0 0.7 0.6 0.5 Useful Range 0.0 20 40 60 80 Ambient Temperature, ° C Page 21 of 31 100 120 140 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued e. Linear configuration with all adjacent conductors/contacts powered Base Curve Derated 20 % 200542 60 (All Power) Contacts in Series Part Numbers: SSH-030-1.50-G-D-WT / STH-030-0.50-G-D-WT-EXP RT Peak Amp RT Derated Amp Measured Current Current Rating per Contact (30 Deg. Rise, 20% Derated) = 0.5 Amps 85 ° C 85 ° C Peak Amp 85 ° C Derated Amp Room Temp= 22.0 C 95 ° C 95 ° C Peak Amp 1.2 95 ° C Derated Amp 1.2 Limit Maximum Current, Amp per Contact 115 ° C Peak Amp 115 ° C Derated Amp 1.0 115 ° C Room Temp 0.9 125° C Limit 0.8 0.7 0.6 0.6 0.6 0.5 0.4 0.4 0.3 Useful Range 0.2 0.0 20 40 60 80 Ambient Temperature, ° C Page 22 of 31 100 120 140 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued Mating/Unmating Force: Thermal Aging Group (SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT) Initial Mating Minimum Maximum Average St Dev Count Unmating Mating After Thermals Unmating Newtons Force (Lbs) Newtons Force (Lbs) Newtons Force (Lbs) Newtons Force (Lbs) 22.55 29.80 27.02 2.61 8 5.07 6.70 6.07 0.59 8 17.61 22.77 20.49 2.02 8 3.96 5.12 4.61 0.45 8 16.55 18.99 17.43 0.81 8 3.72 4.27 3.92 0.18 8 19.44 22.82 21.08 1.05 8 4.37 5.13 4.74 0.24 8 Mating/Unmating Durability Group (SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT) Initial Mating Newtons Minimum Maximum Average St Dev Count Minimum Maximum Average St Dev Count Force (Lbs) 25 Cycles Unmating Newtons Force (Lbs) 23.93 34.52 26.42 3.41 8 5.38 13.97 3.14 7.76 23.17 5.21 5.94 3.95 17.56 0.77 3.00 0.67 8 8 8 After Humidity Mating Unmating Newtons Force (Lbs) Newtons Force (Lbs) 13.88 23.40 16.80 2.98 8 3.12 5.26 3.78 0.67 8 13.79 20.73 17.24 2.10 8 3.10 4.66 3.88 0.47 8 Page 23 of 31 Mating Unmating Newtons Force (Lbs) Newtons Force (Lbs) 23.71 27.98 25.45 1.46 8 5.33 6.29 5.72 0.33 8 15.35 24.29 20.39 3.10 8 3.45 5.46 4.58 0.70 8 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued Mating/Unmating Force: Mating/Unmating Basic Group (SSH-010-1.50-G-D-WT / STH-010-0.50-G-D-WT) Initial Mating Minimum Maximum Average St Dev Count 25 Cycles Unmating Mating Unmating Newtons Force (Lbs) Newtons Force (Lbs) Newtons Force (Lbs) Newtons Force (Lbs) 6.49 8.32 7.14 0.71 8 1.46 1.87 1.61 0.16 8 6.76 8.18 7.56 0.46 8 1.52 1.84 1.70 0.10 8 5.83 9.92 7.61 1.16 8 1.31 2.23 1.71 0.26 8 7.21 8.76 7.85 0.47 8 1.62 1.97 1.76 0.11 8 NORMAL FORCE (FOR CONTACTS TESTED IN THE HOUSING): 1) Calibrated force gauges are used along with computer controlled positioning equipment. 2) For Normal force 8-10 measurements are taken and the averages reported. Initial Averages Min Max St. Dev Count After Thermals Averages Min Max St. Dev Count 0.0006 12.41 11.20 14.10 0.770 12 0.0006 0.00 0.00 0.00 0.000 12 0.0012 25.61 22.80 28.10 1.379 12 0.0012 0.00 0.00 0.00 0.000 12 0.0019 38.92 37.00 42.10 1.636 12 0.0019 0.00 0.00 0.00 0.000 12 Deflections in inches Forces in Grams 0.0025 0.0031 0.0037 0.0043 0.0050 52.09 65.26 78.28 91.43 103.87 49.90 62.40 75.50 88.10 100.30 56.00 69.60 83.10 96.90 110.20 1.875 2.200 2.697 3.090 3.312 12 12 12 12 12 Deflections in inches Forces in Grams 0.0025 0.0031 0.0037 0.0043 0.0050 0.34 6.22 15.12 24.55 37.29 0.00 0.00 0.00 0.00 8.60 3.40 16.80 30.40 44.00 58.30 0.984 5.978 11.922 18.610 20.502 12 12 12 12 12 Page 24 of 31 0.0056 115.39 111.60 122.00 3.420 12 0.0056 51.17 22.30 71.60 20.464 12 0.0062 125.17 121.30 131.40 3.395 12 0.0062 65.56 35.30 86.20 20.651 12 SET 0.0002 0.0001 0.0003 0.0001 12 SET 0.0033 0.0023 0.0045 0.0009 12 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued INSULATION RESISTANCE (IR): Pin to Pin Mated Unmated Unmated SSH/STH SSH STH Initial Thermal 100000 100000 100000 100000 100000 100000 Humidity 100000 100000 100000 Minimum Row to Row Mated Minimum Unmated Unmated SSH/STH SSH STH 100000 100000 100000 100000 100000 100000 100000 100000 100000 Initial Thermal Humidity Pin to Closest Metallic Hardware Minimum Mated SSH/STH Unmated SSH Unmated STH 100000 100000 100000 100000 100000 100000 100000 100000 100000 Initial Thermal Humidity DIELECTRIC WITHSTANDING VOLTAGE (DWV): Voltage Rating Summ ary Minimum SSH/STH 740 Break Down Voltage Test Voltage Working Voltage 555 185 Pin to Pin Initial Test Voltage After Thermal Test Voltage After Humidity Test Voltage Passed Passed Passed Row to Row Initial Test Voltage After Thermal Test Voltage After Humidity Test Voltage Passed Passed Passed Pin to Closest Metallic Hardware Initial Test Voltage Passed After Thermal Test Voltage Passed After Humidity Test Voltage Passed Page 25 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued LLCR Thermal Aging Group (SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT) 1) 2) 3) 4) A total of 192 points were measured. EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. A computer program, LLCR 221.exe, ensures repeatability for data acquisition. The following guidelines are used to categorize the changes in LLCR as a result from stressing. a. <= +5.0 mOhms:--------------------------- Stable b. +5.1 to +10.0 mOhms: -------------------- Minor c. +10.1 to +15.0 mOhms: ------------------ Acceptable d. +15.1 to +50.0 mOhms: ------------------ Marginal e. +50.1 to +2000 mOhms------------------- Unstable f. >+2000 mOhms: --------------------------- Open Failure LLCR Measurement Summaries by Pin Type Date Room Temp (Deg C) Rel Humidity (%) Technician mOhm values Average St. Dev. Min Max Summary Count Total Count 7/13/2012 7/24/2012 22 22 47 48 Craig Ryan Craig Ryan Actual Delta Initial Thermal Pin Type 1: Signal 17.98 0.77 14.40 19.62 192 192 0.20 0.35 0.00 4.70 192 192 LLCR Delta Count by Category mOhms Thermal Stable <=5 192 Minor >5 & <=10 0 Acceptable >10 & <=15 0 Marginal >15 & <=50 0 Page 26 of 31 Unstable >50 & <=1000 0 Open >1000 0 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued LLCR Mating/Unmating Durability Group (SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT) 1). 2). 3). 4). A total of 192 points were measured. EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. A computer program, LLCR 221.exe, ensures repeatability for data acquisition. The following guidelines are used to categorize the changes in LLCR as a result from stressing. a. <= +5.0 mOhms: -------------------------- Stable b. +5.1 to +10.0 mOhms: -------------------- Minor c. +10.1 to +15.0 mOhms: ------------------- Acceptable d. +15.1 to +50.0 mOhms: ------------------- Marginal e. +50.1 to +2000 mOhms ------------------- Unstable f. > +2000 mOhms: -------------------------- Open Failure LLCR Measurement Summaries by Pin Type Date Room Temp (Deg C) Rel Humidity (%) Technician mOhm values Average St. Dev. Min Max Summary Count Total Count 7/13/2012 22 45 Craig Ryan Actual Initial 18.09 0.80 16.08 19.67 192 192 7/13/2012 7/18/2012 22 22 47 49 Craig Ryan Craig Ryan Delta Delta 25 Cycles Therm Shck Pin Type 1: Signal 0.42 0.44 0.00 3.34 192 192 7/30/2012 21 45 Craig Ryan Delta Humidity 0.48 0.40 0.00 2.56 192 192 0.61 0.42 0.01 2.57 192 192 LLCR Delta Count by Category mOhms 25 Cycles Therm Shck Humidity Stable <=5 192 192 192 Minor >5 & <=10 0 0 0 Acceptable >10 & <=15 0 0 0 Page 27 of 31 Marginal >15 & <=50 0 0 0 Unstable >50 & <=1000 0 0 0 Open >1000 0 0 0 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued LLCR Gas Tight Group (SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT) 1) 2) 3) 4) A total of 192 points were measured. EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. A computer program, LLCR 221.exe, ensures repeatability for data acquisition. The following guidelines are used to categorize the changes in LLCR as a result from stressing. a. <= +5.0 mOhms: --------------------------- Stable b. +5.1 to +10.0 mOhms:--------------------- Minor c. +10.1 to +15.0 mOhms: ------------------- Acceptable d. +15.1 to +50.0 mOhms: ------------------- Marginal e. +50.1 to +2000 mOhms: ------------------ Unstable f. >+2000 mOhms:---------------------------- Open Failure LLCR Measurement Summaries by Pin Type Date Room Temp (Deg C) Rel Humidity (%) Technician mOhm values Average St. Dev. Min Max Summary Count Total Count 7/12/2012 7/12/2012 21 22 44 41 Craig Ryan Craig Ryan Actual Delta Initial Acid Vapor Pin Type 1: Signal 18.31 0.88 14.35 20.31 192 192 0.12 0.11 0.00 0.63 192 192 LLCR Delta Count by Category mOhms Acid Vapor Stable <=5 192 Minor >5 & <=10 0 Acceptable >10 & <=15 0 Marginal >15 & <=50 0 Page 28 of 31 Unstable >50 & <=1000 0 Open >1000 0 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH DATA SUMMARIES Continued LLCR Shock & Vibration Group (SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT) 1) 2) 3) 4) A total of 192 points were measured. EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. A computer program, LLCR 221.exe, ensures repeatability for data acquisition. The following guidelines are used to categorize the changes in LLCR as a result from stressing. a. <= +5.0 mOhms:---------------------------- Stable b. +5.1 to +10.0 mOhms: --------------------- Minor c. +10.1 to +15.0 mOhms:-------------------- Acceptable d. +15.1 to +50.0 mOhms:-------------------- Marginal e. +50.1 to +2000 mOhms -------------------- Unstable f. >+2000 mOhms: ---------------------------- Open Failure LLCR Measurement Summaries by Pin Type Date Room Temp (Deg C) Rel Humidity (%) Technician mOhm values Average St. Dev. Min Max Summary Count Total Count 7/12/2012 7/13/2012 22 22 45 46 Craig Ryan Craig Ryan Actual Delta Initial Shock-Vib Pin Type 1: Signal 17.61 1.17 13.35 19.91 192 192 0.15 0.17 0.00 1.20 192 192 LLCR Delta Count by Category mOhms Shock-Vib Stable <=5 192 Minor >5 & <=10 0 Acceptable >10 & <=15 0 Marginal >15 & <=50 0 Unstable >50 & <=1000 0 Nanosecond Event Detection: Shock and Vibration Event Detection Summary Contacts tested Test Condition Shock Events Test Condition Vibration Events Total Events 60 C, 100g's, 6ms, Half-Sine 0 V-B, 7.56 rms g 0 0 Page 29 of 31 Open >1000 0 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH EQUIPMENT AND CALIBRATION SCHEDULES Equipment #: MO-04 Description: Multimeter /Data Acquisition System Manufacturer: Keithley Model: 2700 Serial #: 0798688 Accuracy: See Manual … Last Cal: 04/30/2012, Next Cal: 04/30/2013 Equipment #: TCT-04 Description: Dillon Quantrol TC2 Test Stand Manufacturer: Dillon Quantrol Model: TC2 Serial #: 04-1041-04 Accuracy: Speed Accuracy: +/- 5% of indicated speed; Displacement: +/- 5 micrometers. … Last Cal: 05/21/2012, Next Cal: 05/21/2013 Equipment #: THC-02 Description: Temperature/Humidity Chamber Manufacturer: Thermotron Model: SE-1000-6-6 Serial #: 31808 Accuracy: See Manual … Last Cal: 02/16/2012, Next Cal: 02/16/2013 Equipment #: TSC-01 Description: Vertical Thermal Shock Chamber Manufacturer: Cincinnatti Sub Zero Model: VTS-3-6-6-SC/AC Serial #: 10-VT14993 Accuracy: See Manual … Last Cal: 05/18/2012, Next Cal: 05/18/2013 Equipment #: HPM-01 Description: Hipot Megommeter Manufacturer: Hipotronics Model: H306B-A Serial #: M9905004 Accuracy: 2 % Full Scale Accuracy … Last Cal: 11/30/2011, Next Cal: 11/30/2012 Equipment #: OV-5 Description: Forced Air Oven, 5 Cu. Ft., 120 V Manufacturer: Sheldon Mfg. Model: CE5F Serial #: 02008008 Accuracy: +/- 5 deg. C … Last Cal: 02/16/2012, Next Cal: 02/16/2013 Page 30 of 31 Tracking Code: 200542_Report_Rev_1 Part #: SSH-030-1.50-G-D-WT \ STH-030-0.50-G-D-WT Part description: SSH\ STH EQUIPMENT AND CALIBRATION SCHEDULES Continued Equipment #: SVC-01 Description: Shock & Vibration Table Manufacturer: Data Physics Model: LE-DSA-10-20K Serial #: 10037 Accuracy: See Manual … Last Cal: 11/31/2011, Next Cal: 11/31/2012 Equipment #: ACLM-01 Description: Accelerometer Manufacturer: PCB Piezotronics Model: 352C03 Serial #: 115819 Accuracy: See Manual … Last Cal: 07/09/2012, Next Cal: 07/09/2013 Equipment #: ED-03 Description: Event Detector Manufacturer: Analysis Tech Model: 32EHD Serial #: 1100604 Accuracy: See Manual … Last Cal: 06/04/2012, Next Cal: 06/04/2013 Page 31 of 31