High Speed Characterization Report QTH-030-02-L-D-A Mated With QSH-030-01-L-D-A Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Table of Contents Connector Overview........................................................................................................ 1 Connector System Speed Rating .................................................................................... 1 Frequency Domain Data Summary ................................................................................. 2 Table 1 - Single-Ended Connector System Performance ............................................ 2 Table 2 - Differential Connector System Bandwidth .................................................... 2 Time Domain Data Summary .......................................................................................... 3 Table 3 - Single-Ended Impedance (Ω) ....................................................................... 3 Table 4 - Differential Impedance (Ω)............................................................................ 3 Table 5 - Single-Ended Crosstalk (%).......................................................................... 4 Table 6 - Differential Crosstalk (%) .............................................................................. 4 Table 7 - Propagation Delay (Mated Connector) ......................................................... 4 Characterization Details .................................................................................................. 5 Differential and Single-Ended Data.............................................................................. 5 Connector Signal to Ground Ratio ............................................................................... 5 Frequency Domain Data.............................................................................................. 7 Time Domain Data....................................................................................................... 7 Appendix A – Frequency Domain Response Graphs ...................................................... 9 Single-Ended Application – Insertion Loss .................................................................. 9 Single-Ended Application – Return Loss ..................................................................... 9 Single-Ended Application – NEXT ............................................................................. 10 Single-Ended Application – FEXT.............................................................................. 10 Differential Application – Insertion Loss..................................................................... 11 Differential Application – Return Loss........................................................................ 11 Differential Application – NEXT ................................................................................. 12 Differential Application – FEXT .................................................................................. 12 Appendix B – Time Domain Response Graphs............................................................. 13 Single-Ended Application – Input Pulse..................................................................... 13 Single-Ended Application – Impedance ..................................................................... 14 Single-Ended Application – Propagation Delay ......................................................... 14 Single-Ended Application – NEXT, “Worst Case” Configuration................................ 15 Single-Ended Application – FEXT, “Worst Case” Configuration ................................ 15 Single-Ended Application – NEXT, “Best Case” Configuration .................................. 16 Single-Ended Application – FEXT, “Best Case” Configuration .................................. 16 Single-Ended Application – NEXT, Across Power/Ground Blade .............................. 17 Single-Ended Application – FEXT, Across Power/Ground Blade .............................. 17 Differential Application – Input Pulse ......................................................................... 18 Differential Application – Impedance ......................................................................... 19 Differential Application – Propagation Delay.............................................................. 19 Differential Application – NEXT, “Worst Case” Configuration .................................... 20 Differential Application – FEXT, “Worst Case” Configuration..................................... 20 Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:ii Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Differential Application – NEXT, “Best Case” Configuration ...................................... 21 Differential Application – FEXT, “Best Case” Configuration....................................... 21 Differential Application – NEXT, Across Power/Ground Blade .................................. 22 Differential Application – FEXT, Across Power/Ground Blade................................... 22 Appendix C – Product and Test System Descriptions ................................................... 23 Product Description ................................................................................................... 23 Test System Description............................................................................................ 23 Single-Ended PCB Fixture ..................................................................................... 23 Differential PCB Fixture.......................................................................................... 23 Appendix D – Test and Measurement Setup................................................................. 25 Test Instruments ........................................................................................................ 26 Measurement Station Accessories ............................................................................ 26 Test Cables & Adapters............................................................................................. 26 Appendix E - Frequency and Time Domain Measurements .......................................... 27 Frequency (S-Parameter) Domain Procedures ......................................................... 27 CSA8000 Setup ..................................................................................................... 27 Insertion Loss......................................................................................................... 28 Return Loss............................................................................................................ 28 Near-End Crosstalk (NEXT) ................................................................................... 29 Far-End Crosstalk (FEXT)...................................................................................... 29 Time Domain Procedures .......................................................................................... 30 Impedance ............................................................................................................. 30 Propagation Delay.................................................................................................. 30 Crosstalk ................................................................................................................ 30 Appendix F – Glossary of Terms................................................................................... 31 Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:iii Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Connector Overview Q Strip® .5mm (.0197”) pitch interfaces (QSH/QTH Series) are available with up to 300 I/Os and with standard board-to-board spacing of 5mm (0.197"), 8mm (0.315"), 11mm (0.433"), and 16mm (0.630") between boards. Data in this report is applicable only to the 8mm (0.315") board-to-board stack height version. Connector System Speed Rating QSH/QTH Series, Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Signaling Single-Ended: Differential: Speed Rating 8.5 GHz / 17 Gbps 8.0 GHz / 16 Gbps The Speed Rating is based on the -3 dB insertion loss point of the connector system. The -3 dB point can be used to estimate usable system bandwidth in a typical, two-level signaling environment. To calculate the Speed Rating, the measured -3 dB point is rounded up to the nearest half-GHz level. The up-rounding corrects for a portion of the test board’s trace loss, since trace losses are included in the loss data in this report. The resulting loss value is then doubled to determine the approximate maximum data rate in Gigabits per second (Gbps). For example, a connector with a -3 dB point of 7.8 GHz would have a Speed Rating of 8 GHz/ 16 Gbps. A connector with a -3 dB point of 7.2 GHz would have a Speed Rating of 7.5 GHz/ 15 Gbps. Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:1 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Frequency Domain Data Summary Table 1 - Single-Ended Connector System Performance Test Parameter Configuration Insertion Loss GSG Return Loss GSG ≤ -5dB to 8.40 GHz GAQG ≤ - 5dB to 8.40 GHz GAGQG ≤ -15dB to 8.40 GHz Xrow, GAG to GQG ≤ -25dB to 8.40 GHz GAQG ≤ -10dB to 8.40 GHz Near-End Crosstalk Far-End Crosstalk -3dB @ 8.40 GHz GAGQG ≤ -8dB to 8.40 GHz Xrow, GAG to GQG ≤ -20dB to 8.40 GHz Table 2 - Differential Connector System Bandwidth Test Parameter Configuration Insertion Loss GSSG -3dB @ 7.82 GHz Return Loss GSSG ≤ -5dB to 7.82 GHz GAAQQG ≤ -18dB to 7.82 GHz GAAGQQG ≤ -28dB to 7.82 GHz Near-End Crosstalk Far-End Crosstalk Xrow, GAAG to GQQG ≤ -40dB to 7.82 GHz GAQG ≤ -25dB to 7.82 GHz GAGQG ≤ -22dB to 7.82 GHz Xrow, GAAG to GQQG ≤ -38dB to 7.82 GHz PCB/Connector Test System Single Ended & Differential Signal Response QSH-01/QTH-02 Series (8mm Stack Height) 1 0 -1 Insertion Loss (dB) -2 -3 -4 Single Ended -5 Differential -6 -7 -8 -9 0 1 2 3 4 5 6 7 8 9 Frequency (GHz) Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:2 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Time Domain Data Summary Table 3 - Single-Ended Impedance (Ω) Signal Risetime Maximum Impedance Minimum Impedance 30±5ps 50 ps 100 ps 250 ps 500 ps 750 ps 1 ns 55.0 53.3 53.2 52.9 51.6 50.9 50.8 40.9 45.3 47.8 48.9 49.7 50.0 50.0 Single Ended Application Impedance vs. Risetime Impedance (ohms) 80 70 60 maximum 7 50 minimum 40 30 20 35 50 100 250 500 Risetime (pSec) 750 1000 Table 4 - Differential Impedance (Ω) Signal Risetime Maximum Impedance Minimum Impedance 30±5ps 50 ps 100 ps 250 ps 500 ps 750 ps 1 ns 105.6 104.5 104.0 102.7 101.1 100.5 100.0 66.9 73.6 75.9 84.8 92.3 95.0 96.5 Differential Application Impedance vs. Risetime Impedance (ohms) 140 130 120 110 maximum 100 7 90 minimum 80 70 60 50 40 35 Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 50 100 250 500 Risetime (pSec) 750 1000 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:3 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Table 5 - Single-Ended Crosstalk (%) Input (tr) NEXT FEXT 30±5ps 50 ps 100 ps 250 ps 500 ps 750 ps 1 ns GAQG 18.8 18.0 16.4 10.0 5.8 4.0 3.1 GAGQG 6.0 3.2 2.5 1.7 1.0 < 1.0% < 1.0% Xrowse < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% GAQG 6.0 3.8 2.1 < 1.0% < 1.0% < 1.0% < 1.0% GAGQG 3.5 2.3 1.6 < 1.0% < 1.0% < 1.0% < 1.0% Xrowse < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% Table 6 - Differential Crosstalk (%) Input (tr) NEXT 30±5ps 50 ps 100 ps 250 ps 500 ps 750 ps 1 ns GAAQQG 5.5 5.1 4.7 3.2 1.9 1.4 1.1 GAAGQQG 1.3 < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% GAAQQG 1.9 1.6 1.3 1.0 < 1.0% < 1.0% < 1.0% GAAGQQG 1.1 < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% < 1.0% Xrow FEXT Xrow diff diff Table 7 - Propagation Delay (Mated Connector) Single-Ended Differential Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 87.0 ps 87.0 ps WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:4 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Characterization Details This report presents data which characterizes the signal integrity response of a connector pair in a controlled printed circuit board (PCB) environment. All efforts are made to reveal typical best-case responses inherent to the system under test (SUT). In this report, the SUT includes the test PCB from drive side probe tips to receive side probe tips. PCB effects are not removed or de-embedded from the test data. PCB designs with impedance mismatch, large losses, skew, cross talk, or similar impairments can have a significant impact on observed test data. Therefore, great design effort is put forth to limit these effects in the PCB utilized in these tests. Some board related effects, such as pad-to-ground capacitance and trace loss, are included in the data presented in this report. But other effects, such as via coupling or stub resonance, are not evaluated here. Such effects are addressed and characterized fully by the Samtec Final Inch® products. Additionally, intermediate test signal connections can mask the connectors’ true performance. Such connection effects are minimized by using high performance test cables, adapters, and microwave probes. Where appropriate, calibration and deembedding routines are also used to reduce residual effects. Differential and Single-Ended Data Most Samtec connectors can be used successfully in both differential and single-ended applications. However, electrical performance will differ depending on the signal drive type. In this report, data is presented for both differential and single-ended drive scenarios. Connector Signal to Ground Ratio Samtec connectors are most often designed for generic applications, and can be implemented using various signal and ground pin assignments. In high speed systems, provisions must be made in the interconnect for signal return currents. Such paths are often referred to as “ground”. In some connectors, a ground plane or blade, or an outer shield is used as the signal return, while in others, connector pins are used as signal returns. Various combinations of signal pins, ground blades, and shields can also be utilized. Electrical performance can vary significantly depending upon the number and location of ground pins. In general, the more pins dedicated to ground, the better electrical performance will be. But dedicating pins to ground reduces signal density of a connector. So care must be taken when choosing signal/ground ratios in cost- or density-sensitive applications. Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:5 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height For this connector, the following configurations were evaluated: Single-Ended Impedance: • GSG (ground-signal-ground) Single-Ended Crosstalk: • Electrical “worst case”: GAQG (ground-active-quiet-ground) • Electrical “best case”: GAGQG (ground-active-ground-quiet-ground) • Across row: Xrowse (from one row of terminals to the other row across the ground blade) Differential Impedance: • GSSG (Ground-positive signal-negative signal-ground) Differential Crosstalk: • Electrical “worst case”: GAAQQG (ground-active-active-quiet-quiet-ground) • Electrical “best case”: GAAGQQG (ground-active-active-ground-quiet-quietground) • Across row:Xrowdiff (from one row of terminals to the other row across the ground blade) In all cases in this report, the center ground blade of the connector was grounded to the PCB. Only one single-ended signal or differential pair was driven for crosstalk measurements. Other configurations can be evaluated upon request. Please contact [email protected] for more information. In a real system environment, active signals might be located at the outer edges of the signal contacts of concern, as opposed to the ground signals utilized in laboratory testing. For example, in a single-ended system, a pin-out of “SSSS”, or four adjacent single-ended signals, might be encountered as opposed to the “GSG” and “GSSG” configurations tested in the laboratory. Electrical characteristics in such applications could vary slightly from laboratory results. But in most applications, performance can safely be considered equivalent. Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:6 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Signal Edge Speed (Rise Time): In pulse signaling applications, the perceived performance of an interconnect can vary significantly depending on the edge rate or rise time of the exciting signal. For this report, the fastest rise time used was 30 +/-5 ps. Generally, this should demonstrate worst case performance. In many systems, the signal edge rate will be significantly slower at the connector than at the driver launch point. To estimate interconnect performance at other edge rates, data is provided for several rise times between 30 ps and 1.0 ns. For this report, rise times were measured at 10%-90% signal levels. Frequency Domain Data Frequency domain parameters are helpful in evaluating the connector system’s signal loss and crosstalk characteristics across a range of sinusoidal frequencies. In this report, parameters presented in the frequency domain are insertion loss, return loss, and near-end and far-end crosstalk. Other parameters or formats, such as VSWR or Sparameters, may be available upon request. Please contact our Signal Integrity Group at [email protected] for more information. Frequency performance characteristics for the SUT are generated from time domain measurements using Fourier Transform calculations. Procedures and methods used in generating the SUT’s frequency domain data are provided in the frequency domain test procedures in Appendix E of this report. Time Domain Data Time Domain parameters indicate impedance mismatch versus length, signal propagation time, and crosstalk in a pulsed signal environment. Time Domain data is provided in Appendix E of this report. Parameters or formats not included in this report may be available upon request. Please contact our Signal Integrity Group at [email protected] for more information. Reference plane impedance is 50 ohms for single-ended measurements and 100 ohms for differential measurements. The fastest risetime signal exciting the SUT is 30 ± 5 picoseconds. In this report, propagation delay is defined as the signal propagation time through the PCB connector pads and connector pair. It does not include PCB traces. Delay is measured at 30 ± 5 picoseconds signal risetime. Delay is calculated as the difference in time measured between the 50% amplitude levels of the input and output pulses. Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:7 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Crosstalk or coupled noise data is provided for various signal configurations. All measurements are single disturber. Crosstalk is calculated as a ratio of the input line voltage to the coupled line voltage. The input line is sometimes described as the active or drive line. The coupled line is sometimes described as the quiet or victim line. Crosstalk ratio is tabulated in this report as a percentage. Measurements are made at both the nearend and far-end of the SUT. Data for other configurations may be available. Please contact our Signal Integrity Group at [email protected] for further information. As a rule of thumb, 10% crosstalk levels are often used as a general first pass limit for determining acceptable interconnect performance. But modern system crosstalk tolerance can vary greatly. For advice on connector suitability for specific applications, please contact our Signal Integrity Group at [email protected]. Additional information concerning test conditions and procedures is located in the appendices of this report. Further information may be obtained by contacting our Signal Integrity Group at [email protected]. Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:8 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Appendix A – Frequency Domain Response Graphs Single-Ended Application – Insertion Loss PCB/Connector Test System Single Ended Application QSH-01/QTH-02 Series (8mm Stack Height) 1 0 -1 Insertion Loss (dB) -2 -3 -4 Single Ended -5 -6 -7 -8 -9 0 1 2 3 4 5 6 7 8 9 Frequency (GHz) Single-Ended Application – Return Loss PCB/Connector Test System Single Ended Application QSH-01/QTH-02 Series (8mm Stack Height) 0 -10 -20 Return Loss (dB) -30 -40 Single Ended -50 -60 -70 -80 -90 0 1 2 3 4 5 6 7 8 9 Frequency (GHz) Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:9 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Single-Ended Application – NEXT PCB/Connector Test System Single Ended Application QSH-01/QTH-02 Series (8mm Stack Height) 0 -10 Near-End Crosstalk (dB) -20 -30 -40 ACROSS GROUND BLADE Worst Case -50 Best Case -60 -70 -80 -90 0 1 2 3 4 5 6 7 8 9 Frequency (GHz) Single-Ended Application – FEXT PCB/Connector Test System Single Ended Application QSH-01/QTH-02 Series (8mm Stack Height) 0 -10 Far-End Crosstalk (dB) -20 -30 -40 ACROSS GROUND BLADE -50 Worst Case -60 Best Case -70 -80 -90 0 1 2 3 4 5 6 7 8 9 Frequency (GHz) Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:10 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Differential Application – Insertion Loss PCB/Connector Test System Differential Application QSH-01/QTH-02 Series (8mm Stack Height) 1 0 -1 Insertion Loss (dB) -2 -3 -4 Differential -5 -6 -7 -8 -9 0 1 2 3 4 5 6 7 8 9 Frequency (GHz) Differential Application – Return Loss PCB/Connector Test System Differential Application QSH-01/QTH-02 Series (8mm Stack Height) 0 -10 -20 Return Loss (dB) -30 -40 -50 Differential -60 -70 -80 -90 0 1 2 3 4 5 6 7 8 9 Frequency (GHz) Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:11 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Differential Application – NEXT PCB/Connector Test System Differential Application QSH-01/QTH-02 Series (8mm Stack Height) 0 -10 Near-End Crosstalk (dB) -20 -30 ACROSS GROUND BLADE Worst Case -40 -50 Best Case -60 -70 -80 -90 0 1 2 3 4 5 6 7 8 9 Frequency (GHz) Differential Application – FEXT PCB/Connector Test System Differential Application QSH-01/QTH-02 Series (8mm Stack Height) 0 -10 Far-End Crosstalk (dB) -20 -30 ACROSS GROUND BLADE -40 Worst Case -50 Best Case -60 -70 -80 -90 0 1 2 3 4 5 6 7 8 9 Frequency (GHz) Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:12 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Appendix B – Time Domain Response Graphs Single-Ended Application – Input Pulse Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:13 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Single-Ended Application – Impedance Single-Ended Application – Propagation Delay Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:14 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Single-Ended Application – NEXT, “Worst Case” Configuration Single-Ended Application – FEXT, “Worst Case” Configuration Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:15 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Single-Ended Application – NEXT, “Best Case” Configuration Single-Ended Application – FEXT, “Best Case” Configuration Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:16 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Single-Ended Application – NEXT, Across Power/Ground Blade Single-Ended Application – FEXT, Across Power/Ground Blade Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:17 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Differential Application – Input Pulse Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:18 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Differential Application – Impedance Differential Application – Propagation Delay Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:19 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Differential Application – NEXT, “Worst Case” Configuration Differential Application – FEXT, “Worst Case” Configuration Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:20 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Differential Application – NEXT, “Best Case” Configuration Differential Application – FEXT, “Best Case” Configuration Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:21 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Differential Application – NEXT, Across Power/Ground Blade Differential Application – FEXT, Across Power/Ground Blade Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:22 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Appendix C – Product and Test System Descriptions Product Description Product samples are the .5mm (.0197”) Q Strip® High Speed QSH Series socket (P/N QSH-030-01-L-D-A) and the QTH Series header (P/N QTH-030-02-L-D-A) Each connector structure consists of 2 rows of 30 positions mounted into a plastic housing with a surface mount design. A conductive ground/power blade lies lengthwise between terminal rows in the housing. The contacts are evenly spaced at a .5mm (.0197”) pitch Test System Description Single-Ended PCB Fixture Single-ended signal board fixtures are identified as P/N QSH-XXX-01-X-D-XX and QTH-XXX-01-X-D-XX. Single-ended test systems consist of a QSH Series socket (Figure 1) and a QTH Series header (Figure 2 – opposite the PCB side pictured) mounted to the footprint of the appropriate PCB utilizing suitable soldering techniques. A mated microprobe test systems utilizes five GSG microprobe signal path combinations. Test point signal paths are J4 to J4’, J7 to J7’, J8 to J8’, J56 to J56” and J58 to J58’. Differential PCB Fixture Differential signal board fixtures are recognized by the prefix “differential” preceding P/N QSH-XXX-01-X-D-XX and QTH-XXX-01-X-D-XX respectively. Differential test systems consist of the same QSH Series socket (Figure 3) and QTH Series header (Figure 4 – opposite the PCB side pictured) mounted to the footprint of the appropriate PCB utilizing suitable soldering techniques. A mated microprobe test systems utilizes five GSGSG Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:23 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height microprobe signal path combinations. Test point signal paths are J46 to J46’, J79 to J79’, J1012 to J1012’, J5254 to J5254’ and J5658 to J5658’. For both the single-ended and differential fixtures, the “J” number represents each terminal’s designated position within the connector. Signals are launched from the socket and header side for both fixture types. Received signals are monitored at probe pads from both sides dependent on the test being performed. All data and waveforms presented in the report are results from a socket side signal launch. Figure 5 Mated Single-Ended Test Fixture Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 Figure 6 Mated Differential Test Fixture WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:24 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Appendix D – Test and Measurement Setup Test instruments are a Tektronix CSA8000 Communication Signal Analyzer Mainframe and the Agilent 8720ES Vector Network Analyzer. Four bays of the CSA8000 are occupied with three Tektronix 80E04 TDR/Sampling Heads and one Tektronix 80E03 Sampling Head. For this series of tests, four of the eight TDR/Sampling Head capability is used (Figure 7). The 8720ES serves as a supporting test instrument for verification or troubleshooting results obtained from the TDA Systems IConnect Software package. IConnect is a TDR based measurement software tool used in generating frequency domain related responses from high speed interconnects. The probe stations illuminated video microscopy system, microprobe positioners, and 40GHz capable probes provide both the mechanical properties and electrical characteristics for obtaining the precise signal launch and calibrations that are critical in obtaining accurate high speed measurements. The 450 micron pitch probes are easily located to PCB launch points with 25X to 175X magnification and XYZ fine positioning adjustments available from both the probe table and micro-probe positioners. Electrically the microwave probes rate a < 1.0 dB insertion loss, a < 18 dB return loss, and an isolation of 38 dB to 40 GHz (Figure 8). Test cables and interconnect adapters are high quality and insure high-bandwidth and low parasitic measurements. Figure 7 – Probe Station Measurements Capability Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:25 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Test Instruments QTY Description 1 Tektronix CSA8000 Communication Signal Analyzer 2 Tektronix 80E04 Dual Channel 20 GHz TDR Sampling Module 1 Tektronix 80E03 Dual Channel 20 GHz Sampling Module Measurement Station Accessories QTY Description 1 GigaTest Labs Model (GTL3030) Probe Station 4 GTL Micro-Probe Positioners 2 Picoprobe by GGB Ind. Dual Model 40A GSG-GSG (differential applications) 1 Keyence VH-5910 High Resolution Video Microscope 1 Keyence VH-W100 Fixed Magnification Lens 100 X 1 Keyence VH-Z25 Standard Zoom Lens 25X-175X Figure 8 – 40 GHz High Performance Microwave Probes Test Cables & Adapters QTY Description 4 Micro-Coax Cable Assembly 6” 2.9mm Male to 2.9mm Male, 34.0 GHz Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:26 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Appendix E - Frequency and Time Domain Measurements It is important to note before gathering measurement data that TDA Systems IConnect measurements and CSA8000 measurements are virtually the same measurements with diverse formats. This means that the operator, being extremely aware, can obtain SI time and frequency characteristics in an almost simultaneous fashion. Since IConnect setup procedures are specific to the frequency information sought, it is mandatory that the sample preparation and CSA8000 functional setups be consistent throughout the waveform gathering process. If the operators test equipment permits recall sequencing between the various test parameter setups, it insures IConnect functional setups remain consistent with the TDR/TDT waveforms previously recorded. Related time and frequency test parameter data recorded for this report were gathered simultaneously. Frequency (S-Parameter) Domain Procedures Frequency data extraction involves two steps that first measure the frequency related time domain waveform followed by post-processing of the time domain waveforms into loss and crosstalk response parameters versus frequency. The first step utilizes the Tektronix CSA8000 time based instrument to capture frequency related single-ended or differential signal types propagating through an appropriately prepared SUT. The second step involves a correlation of the time based waveforms using the TDA Systems IConnect software tool to post-process these waveforms into frequency response parameters. TDA Systems labels these frequency related waveform relationships as the Step and DUT reference. This report establishes the setup procedures for defining the Step and DUT reference for frequency parameters of interest. Once established, the Step and DUT references are post-processed in IConnect’s S-parameter computations window. CSA8000 Setup Below is CSA 8000 functional menu setups used for single-ended and differential frequency response extractions. Both signal types utilize the 2001 data points generated between DC and 100 GHz with frequency increments at 50 MHz steps. Once menu functions are set, they are to be maintained while time domain waveforms are recorded to avoid seriously corrupting the S-parameter extraction process. Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:27 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Vertical Scale: Offset: Horizontal Scale: Max. Record Length: Averages: Single-Ended Signal 100 mV/ Div: Default / Scroll 2nSec/ Div = 50 MHz step frequency 4000 = Min. Resolution ≥ 128 Differential Signal 100 mV/ Div: Default / Scroll 2nSec/ Div = 50 MHz step frequency 4000 = Min. Resolution ≥ 128 Insertion Loss SUT Preparation – Establish J8 to J8’ as the serial transmission path (Figures 1, 2 & 5) and J1012 to J1012’ as the differential transmission path (Figures 3, 4 & 6 ). Adjacent transmission paths not active are terminated 50Ω to GND single-ended or 100Ω differential. (Note: SUT preparation utilizes the 50Ω to GND termination for all signal path instances.) Step Reference - Establish this waveform by making a TDT transmission measurement that includes all cables, adapters, and probes connected in the test systems transmission path. The transmission path is completed by inserting a negligible length of transmission standard (Figure 8) between the microwave probes. DUT Reference - Establish this waveform by making an active TDT transmission measurement that includes all cables, adapters, and probes connected in the test systems transmission path. Manually insert the SUT between the probes in place of the transmission standard (Figure 7). Return Loss SUT Preparation – Establish J8 to J8’ as the serial transmission path (Figures 1, 2 & 5) and J1012 to J1012’ as the differential transmission path (Figures 3, 4 & 6 ). Adjacent inactive transmission paths are terminated 50Ω to GND single-ended or 100Ω differential. Step Reference - Establish the waveform by making an active TDR reflection measurement that includes all cables, adapters, and probes connected in the test systems electrical path to the open standard (Figure 9). DUT Reference - Establish the waveform by making a TDT (matched) transmission measurement that includes all cables, adapters, and probes connected in the test systems transmission path (Figure 7). Cables and adapters located on the far-end of the inserted SUT providing a resistive load impedance that matches the test system input impedance condition. (i.e.; 50Ω single-ended or 100Ω differential) Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:28 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Near-End Crosstalk (NEXT) SUT Preparation - Establish 50Ω to GND terminations at J4’, J7’, J8’, J56’, & J58’ on the single-ended PCB header fixture (Figure 2) and 50Ω to GND terminations at J46’, J911’, J1012’, J5254’, & J5658’on the differential PCB header fixture (Figure 4). Step Reference - Establish this waveform by making an active measurement that includes all cables, adapters, and probes connected in the test systems electrical path to the open standard (Figure 9). DUT Reference - Establish these waveforms by driving an active signal line (i.e.; J8) and recording the TDR coupled energy at the adjacent near-end (i.e.; J4). Maintain same procedures to establish the waveforms for worse case, best case, and across row (xrow) crosstalk conditions. These conditions are present for both single-ended and differential configurations. Far-End Crosstalk (FEXT) SUT Preparation - Establish 50Ω to GND terminations at J4, J7, & J56 of the socket fixture (Figure 1) and at J8’& J58’ of the header fixture (Figure 2). Differential fixtures are terminated 50Ω to GND at J46, J911, & J5254 of the socket fixture (Figure 3) and at J1012’& J5658’ (Figure 4.) Step Reference - Establish this waveform by making a TDT transmission measurement that includes all cables, adapters, and probes connected in the test systems transmission path. The transmission path is completed by inserting a negligible length of transmission standard (Figure 8) between the microwave probes. DUT Reference - Establish these waveforms by driving an active signal line (i.e.; J8) and recording the TDR coupled energy at the adjacent near-end (i.e., J4). Maintain same procedures to establish the waveforms for worse case, best case, and across row (xrow) crosstalk conditions. These conditions are present for both single-ended and differential configurations. Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:29 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Time Domain Procedures Measurements involving digital type pulses are performed utilizing either Time Domain Reflectometer (TDR) or Time Domain Transmission (TDT) methods. For this series of tests, TDR methods are employed for the impedance and propagation delay measurements. Crosstalk measurements utilize TDT methods. The Tektronix 80E04 TDR/ Sampling Head provide both the signaling type and sampling capability necessary to accurately and fully characterize the SUT. Impedance The signal line(s) of the SUT’s signal configuration is energized with a TDR pulse. The far-end of the energized signal line is terminated in the test systems characteristic impedance (e.g.; 50Ω or 100Ω terminations). By terminating the adjacent signal lines in the test systems characteristic impedance, the effects on the resultant impedance shape of the waveform is limited. Propagation Delay This connector series uses the fastest edge rate (30ps) of the TDR impedance waveform to measure propagation delay. Delay is determined by measuring the propagation time that occurs between the input mismatch response & the output mismatch response of the surface mount terminals of a mated connector. Since TDR waveform results are two-way travel, the results are halved to represent one-way travel delay. Termination of the adjacent signal lines into the test systems characteristic impedance reduce alternate current paths providing for better measurement accuracy. Crosstalk An active pulsed waveform is transmitted through a selected SUT signal line. The adjacent quiet signal lines are monitored for the coupled energy at the near-end and far-end. Active and quiet lines not being monitored are terminated in the test systems characteristic impedance. Signal lines adjacent to the quiet lines remain terminated on both ends throughout the test sequence. Failing to terminate the active near or far end, quiet lines, or in some cases, signal lines adjacent to the quiet line may have an effect on amplitude and shape of the coupled energy. Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:30 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved High Speed Characterization Report Series: QTH / QSH Description: Parallel Board-to-Board, 0.5mm Pitch, 8mm (0.315”) Stack Height Appendix F – Glossary of Terms BC – Best Case crosstalk configuration DP – Differential Pair signal configuration DUT – Device under test; TDA IConnect reference waveform FEXT – Far-End Crosstalk GSG – Ground–Signal-Ground; geometric configuration NEXT – Near-End Crosstalk PCB – Printed Circuit Board SE – Single-Ended SI – Signal Integrity SUT – System under test TDR – Time Domain Reflectometry TDT – Time Domain Transmission WC – Worse Case crosstalk configuration Xrowse – Cross ground/ power bar crosstalk, single-ended signal Xrowdiff – Cross ground/ power bar crosstalk, differential signal Z – Impedance (expressed in ohms) Samtec Inc. 520 Park East Blvd. New Albany IN 47151-1147 USA ©Samtec, Inc. 2005 WWW.SAMTEC.COM 1-800-SAMTEC-9 (US & Canada) [email protected] Page:31 Phone: 812-944-6733 Fax: 812-948-5047 Report Revision: 3/1/2007 All Rights Reserved