SWCX1 SWEPT QUARTZ CRYSTALS

SWCX1 SWEPT QUARTZ CRYSTALS
8 MHz to 250 MHz
Radiation Resistant, Miniature Surface Mount
and Leaded Quartz Crystals
DESCRIPTION
For applications that require resistance to radiation, Statek
offers our swept quartz AT-cut resonators. Made with cultured
quartz that is electrically "swept" at high temperature to
remove interstitial impurities within the crystalline structure,
these resonators are superior to those utilizing non-swept
quartz in maintaining their frequency and other electrical
characteristics under exposure to radiation levels of 100 krad
(1 kGy) and greater. As Rad-Hard applications typically
require various degrees of high-reliability components,
Statek offers these resonators in three distinct screening
options to meet mission critical program requirements from
Engineering to Flight.
e
rfac
Su
1
DIMENSIONS
Surface Mount
FEATURES
Radiation tolerance up to 100 kRad total dose
High shock and vibration resistance
Ultra high reliability
Custom designs available
Military and space screening avaialble
Low aging
Designed, manufactured and tested in the USA
Critical processes performed in class 10 cleanroom
ded
Lea
t
un
Mo
TYPICAL
Leaded
TYPICAL
DIM
inches
mm
inches
mm
A
0.315
8.00
0.315
8.00
B
0.140
3.56
0.140
3.56
C (max)
0.070
1.78
0.070
1.78
D
0.045
1.14
0.310
7.87
E
0.060
1.52
0.020
1.02
F
-
-
0.150
3.81
Leads 0.013’’ x 0.018’’ (0.33 x 0.46 mm) typical.
1. Other package options are available; contact factory.
APPLICATIONS
Military & Aerospace
Satellite
Space exploration systems
Deep space probes
Telemetry
PACKAGING OPTIONS
TERMINATIONS AVAILABLE
SM / LEADED
Designation
SM1
SM2
SM3 / 03
Termination
Gold Plated
Solder Plated
Solder Dipped
• Tray Pack (standard for Leaded, option for SM)
• 16mm tape, 7” or 13” reels (only for SM)
Per EIA 481 (see Tape and Reel data sheet 10109)
PACKAGE DIMENSIONS
SWCX1 SM
SWCX1 Leaded
SWCX1 10199 - Rev B
STATEK CORPORATION 512 N. MAIN ST., ORANGE, CA 92868 714-639-7810 FAX: 714-997-1256 www.statek.com
ELECTRICAL SPECIFICATIONS TABLE1 (Specifications shown are typical unless otherwise noted.)
SM or Leaded
Frequency
Range
Motional Resistance
R1 @ 25°C
Motional Capacitance
C1 @ 25°C
Shunt Capacitance
C0 @ 25°C
Quality Factor
Q @ 25°C
SWCX1 (SM)
SWCX1 (03)
8.0 MHz to
250 MHz
25 Ω @ 32 MHz
15 Ω @ 155.2 MHz
6.2 fF @ 32 MHz
4.0 fF @ 155.2 MHz
2.3 pF @ 32 MHz
30 k @ 32 MHz
2.3 pF @ 155.2 MHz 30 k @ 155.2 MHz
Load Capacitance
CL
Drive Level
20 pF, f ≤ 50 MHz
10 pF, f > 50 MHz
500 µW Max f ≤ 50 MHz
200 µW Max f > 50 MHz
GENERAL SPECIFICATIONS TABLE1 (Specifications shown are typical unless otherwise noted.)
SM or Leaded
Frequency
Range
Calibration Tolerance
@ 25°C
Frequency
Temperature Stability
SWCX1 (SM)
SWCX1 (03)
8.0 MHz to
250 MHz
± 100 ppm, or tighter
as required
Please refer to CX1 AT
data sheet
Aging, first year
Shock, survival2
Vibration, survival
Standard CX
data sheet
2 ppm Max
3,000 g peak 0.3 ms,
½ sine
20 g, 10-2,000 Hz
swept sine
10127 CX1 AT/
10107 CX1 SM AT
1. For more detailed specifications on crystals, refer to standard crystal datasheets.
2. Higher shock available.
STANDARD TESTS & SCREENING OPTIONS
Code
S
x
M
x
x
x
E
x
Item
Method
Comments
Made with swept quartz
Internal visual (pre-seal)
Statek internal standard
x
PIND testing
MIL-STD-883 Method 2020 Condition A
x
Radiographic inspection
MIL-STD-202 Method 209
Performed in both the width and thickness
directions.
x
x
Unwanted modes
MIL-PRF-3098
Spurious-mode ratio 2:1 or greater
x
x
Low temperature storage
MIL-PRF-3098
Resistance must meet specification at this low
x
x
Frequency and resistance over operating
MIL-PRF-3098
Measure every 2.5 degree C or tighter over
operating temperature range; frequency and
resistance must meet specification.
105 degree C for a minimum of 160 hours
Frequency and resistance must meet
temperature.
temperature range
x
x
Accelerated aging
specification after aging; maximum allowed
change in series frequency 5 ppm.
x
x
x
Seal test (fine leak)
MIL-STD-883 Method 1014 Condition A1
x
x
x
x
x
x
Seal test (gross leak)
Final electrical test
MIL-STD-883 Method 1014 Condition C
π-network measurement per IEC 60444
x
x
x
External visual (post-seal)
Statek internal standard
Measure Fs, R1, C1, C0, Q, and FL
S: For space-based applications.
M: For military applications.
E: For engineering prototypes and applications not requiring the additional screening.
HOW TO ORDER SWCX1 SWEPT CRYSTALS
SWCX1
Swept
Quartz
Crystal
S
Screening per
option code
S = Space
M = Military
E = Engineering
S
S = special or
custom design.
Blank = standard
C
C = Ceramic
Lid
SM1
–
Leaded
03
Surface Mount
SM1
SM2
SM3
NOTE : Example only. For Specific ordering requirements, call us at ++1 714-639-7810
20.0M
,
Frequency
M = MHz
100
/
100
/
–
/
I
Temp. Range:
C = -10OC to +70OC
I = -40OC to +85OC
M = -55OC to +125OC
S = Customer Specified
Calibration Frequency
Tolerance Stability over
@ 250C
Temp.Range
(in ppm)
(in ppm)
OR
—
/
—
/
200
Total
Frequency
Tolerance
(in ppm)
/
I
Operating Temp. Range:
C = -10OC to +70OC
I = -40OC to +85OC
M = -55OC to +125OC
S = Customer Specified
SWCX1 10199 - Rev B
STATEK CORPORATION 512 N. MAIN ST., ORANGE, CA 92868 714-639-7810 FAX: 714-997-1256 www.statek.com