RENESAS N0604N

Data Sheet
N0604N
R07DS0850EJ0100
Rev.1.00
Aug 27, 2012
N-channel MOSFET
60 V, 82 A, 6.5 mΩ
Description
The N0604N is N-channel MOS Field Effect Transistor designed for high current switching applications.
Features
• Low on-state resistance
RDS (on) = 6.5 mΩ MAX. (VGS = 10 V, ID = 41 A)
• Low input capacitance
Ciss = 4150 pF TYP. (VDS = 25 V, VGS = 0 V)
• High current
ID(DC) = ±82 A
• RoHS Compliant
Ordering Information
Part No.
N0604N-S19-AY ∗1
Lead Plating
Pure Sn (Tin)
Packing
Package
Tube
50 p/tube
TO-220
1.9 g TYP.
Note: ∗1. Pb-free (This product does not contain Pb in the external electrode.)
Absolute Maximum Ratings (TA = 25°C, all terminals are connected)
Item
Drain to Source Voltage (VGS = 0 V)
Gate to Source Voltage (VDS = 0 V)
Drain Current (DC)
Drain Current (pulse) ∗1
Total Power Dissipation (TC = 25°C)
Total Power Dissipation (TA = 25°C)
Channel Temperature
Storage Temperature
Single Avalanche Current ∗2
Single Avalanche Energy ∗2
Symbol
VDSS
VGSS
ID(DC)
ID(pulse)
PT1
PT2
Tch
Tstg
IAS
EAS
Ratings
60
±20
±82
±200
116
1.5
150
−55 to +150
35
125
Unit
V
V
A
A
W
W
°C
°C
A
mJ
Thermal Resistance
Channel to Case (Drain) Thermal Resistance
Channel to Ambient Thermal Resistance ∗2
Rth(ch-C)
Rth(ch-A)
1.08
83.3
°C/W
°C/W
Notes: ∗1. PW ≤ 10 μs, Duty Cycle ≤ 1%
∗
2. Starting Tch = 25°C, RG = 25 Ω, VDD = 30 V, VGS = 20 → 0 V, L = 100 μH
R07DS0850EJ0100 Rev.1.00
Aug 27, 2012
Page 1 of 6
N0604N
Chapter Title
Electrical Characteristics (TA = 25°C, all terminals are connected)
Item
Zero Gate Voltage Drain Current
Gate Leakage Current
Gate to Source Cut-off Voltage
Forward Transfer Admittance ∗1
Symbol
IDSS
IGSS
VGS(off)
| yfs |
Drain to Source On-state
Resistance ∗1
RDS(on)
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Ciss
Coss
Crss
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
Total Gate Charge
Gate to Source Charge
Gate to Drain Charge
Body Diode Forward Voltage ∗1
Reverse Recovery Time
Reverse Recovery Charge
MIN.
TYP.
MAX.
1
±100
4.0
5.1
6.5
2.0
30
Unit
μA
nA
V
S
mΩ
Test Conditions
VDS = 60 V, VGS = 0 V
VGS = ±20 V, VDS = 0 V
VDS = 10 V, ID = 1 mA
VDS = 5 V, ID = 41 A
VGS = 10 V, ID = 41 A
4150
310
165
pF
pF
pF
VDS = 25 V,
VGS = 0 V,
f = 1 MHz
td(on)
tr
td(off)
tf
QG
QGS
QGD
VF(S–D)
trr
24
8
64
7
75
21
21
VDD = 30 V, ID = 41 A,
VGS = 10 V,
RG = 0 Ω
38
ns
ns
ns
ns
nC
nC
nC
V
ns
Qrr
39
nC
1.5
VDD = 48 V,
VGS = 10 V,
ID = 82 A
IF = 82 A, VGS = 0 V
IF = 82 A, VGS = 0 V,
di/dt = 100 A/μ s
∗
Note: 1. Pulsed
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
RG = 25 Ω
D.U.T.
L
50 Ω
PG.
VGS = 20 → 0 V
TEST CIRCUIT 2 SWITCHING TIME
RL
RG
PG.
VDD
VGS
VGS
Wave Form
0
VGS
10%
90%
VDD
VDS
90%
BVDSS
IAS
VDS
ID
VDS
0
10%
10%
tr
td(off)
Wave Form
τ
VDD
Starting Tch
90%
VDS
VGS
0
τ = 1 μs
Duty Cycle ≤ 1%
td(on)
ton
tf
toff
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
IG = 2 mA
PG.
50 Ω
R07DS0850EJ0100 Rev.1.00
Aug 27, 2012
RL
VDD
Page 2 of 6
N0604N
Chapter Title
Typical Characteristics (TA = 25°C)
DERATING FACTOR OF FORWARD BIAS SAFE
TOTAL POWER DISSIPATION vs.
OPERATING AREA
CASE TEMPERATURE
150
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
140
120
100
80
60
40
20
0
100
50
0
0
25
50
75
100
125
150
175
0
TC - Case Temperature - °C
25
50
75
100
125
150
175
TC - Case Temperature - °C
FORWARD BIAS SAFE OPERATING AREA
1000
IDC(pulse) = 200 A
10 ms
PW
100
=
10
0
μ
s
10
RD
o
S(
n
d
ite
im
)L
s
1m
ID - Drain Current - A
IDC(DC) = 82 A
DC
1
Power Dissipation Limited
TC = 25°C
Single Pulse
0.1
0.1
1
10
100
VDS - Drain to Source Voltage - V
rth(t) - Transient Thermal Resistance - °C/W
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
1000
Rth(ch-A) = 83.3 °C/W
100
10
1
Rth(ch-C) = 1.08 °C/W
0.1
Single pulse
0.01
0.1 m
1m
10 m
100 m
1
10
100
1000
PW - Pulse Width - s
R07DS0850EJ0100 Rev.1.00
Aug 27, 2012
Page 3 of 6
N0604N
Chapter Title
DRAIN CURRENT vs.
FORWARD TRANSFER CHARACTERISTICS
DRAIN TO SOURCE VOLTAGE
100
300
Pulsed
10
ID - Drain Current - A
ID - Drain Current - A
VGS = 10 V
200
100
TA = 125 °C
75 °C
25 °C
–25 °C
1
0.1
Pulsed
VDS = 10 V
0.01
0
0.001
0
1
2
3
4
5
0
3
4
5
GATE TO SOURCE CUT-OFF VOLTAGE vs.
FORWARD TRANSFER ADMITTANCE vs.
CHANNEL TEMPERATURE
DRAIN CURRENT
| yfs | - Forward Transfer Admittance - S
4
3
2
1
VDS = 10 V
ID = 1.0 mA
0
-50
RDS(on) - Drain to Source On-state Resistance - mΩ
2
0
50
100
6
VGS - Gate to Source Voltage - V
100
TA = 125°C
75°C
25°C
–25°C
10
Pulsed
VDS = 5 V
1
150
0.1
1
10
100
Tch - Channel Temperature - °C
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
GATE TO SOURCE VOLTAGE
14
Pulsed
12
10
8
VGS = 10 V
6
4
2
0
1
10
100
ID - Drain Current - A
R07DS0850EJ0100 Rev.1.00
Aug 27, 2012
1000
RDS(on) - Drain to Source On-state Resistance - mΩ
VGS(off) - Gate to Source Cut-off Voltage - V
VDS - Drain to Source Voltage - V
1
20
Pulsed
ID = 41 A
15
10
5
0
0
5
10
15
20
VGS - Gate to Source Voltage - V
Page 4 of 6
N0604N
Chapter Title
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
14
10000
Ciss, Coss, Crss - Capacitance - pF
RDS(on) - Drain to Source On-state Resistance - mΩ
CHANNEL TEMPERATURE
12
10
8
6
Pulsed
V GS = 10 V
ID = 41 A
4
2
0
-50
1000
Coss
VGS = 0 V
f = 1 MHz
50
100
150
0.01
Tch - Channel Temperature - °C
0.1
1
10
100
VDS - Drain to Source Voltage - V
DYNAMIC INPUT CHARACTERISTICS
1000
VGS - Gate to Source Voltage - V
10
td(off)
100
td(on)
tr
10
VDD = 30 V
VGS =10 V
RG = 0 Ω
tf
1
VDD = 12 V
30 V
48 V
8
6
4
2
ID = 82 A
0
0.1
1
10
100
0
ID - Drain Current - A
20
40
60
80
QG - Gate Charge - nC
REVERSE RECOVERY TIME vs.
DIODE FORWARD CURRENT
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
100
1000
VGS = 10 V
100
trr - Reverse Recovery Time - ns
IF - Diode Forward Current - A
Crss
100
0
SWITCHING CHARACTERISTICS
td (on), tr, td (off), tf - Switching Time - ns
Ciss
10
0V
1
0.1
Pulsed
0.01
0
0.4
0.8
1.2
VF(S-D) - Source to Drain Voltage - V
R07DS0850EJ0100 Rev.1.00
Aug 27, 2012
1.6
10
VGS = 0 V
di/dt = 100 A/μ s
1
0.1
1
10
100
IF - Diode Forward Current - A
Page 5 of 6
N0604N
Chapter Title
Package Drawing (Unit: mm)
4.8 MAX.
10.2 MAX.
3.6±0.2
1.3±0.2
1.52±0.2
0.8±0.1
12.7 MIN.
3.0 TYP.
4
15.9 MAX.
8.7 TYP.
6.3 MIN.
2.8±0.3
TO-220
0.5±0.2
2.54 TYP.
2.4±0.2
2.54 TYP.
1. Gate
2. Drain
3. Source
4. Fin (Drain)
1 2 3
Equivalent Circuit
Drain
Body
Diode
Gate
Source
Remark
Strong electric field, when exposed to this device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static
electricity as much as possible, and quickly dissipate it once, when it has occurred.
R07DS0850EJ0100 Rev.1.00
Aug 27, 2012
Page 6 of 6
Revision History
N0604N Data Sheet
Rev.
Date
Page
1.00
Aug 27, 2012
−
Description
Summary
First Edition Issued
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