Si1141-M01-GMR

S i 11 4 1 / 4 2 / 4 3 - M 0 1
P ROXIMITY / A M B I E N T L I G H T S E NS O R M O D U L E
WI TH
I2C INTERFACE
Features

Integrated infrared proximity detector  Industry's lowest power consumption
Proximity detection adjustable from
1.71 to 3.6 V supply voltage
under 1 cm to over 50 cm
25.6 µs LED “on” time keeps total
power consumption duty cycle low
Three independent LED drivers
without compromising performance
15 current settings from 5.6 mA to
or noise immunity
360 mA for each LED driver
25.6 µs LED driver pulse width
9 µA average current (LED pulsed
25.6 µs every 800 ms at 180 mA
50 cm proximity range with single
plus 3 µA Si1141/42/43-M01 supply)
pulse (<3 klx)
15 cm proximity range with single
< 500 nA standby current
pulse (>3 klx)
Internal and external wake support
Operates at up to 128 klx (direct
Built-in voltage supply monitor and
sunlight)
power-on reset controller
High reflectance sensitivity
 Single IR LED integrated inside the
module
< 1 µW/cm2
High EMI immunity without shielded  Serial communications
Up to 3.4 Mbps data rate
packaging
Slave mode hardware address
 Integrated ambient light sensor
decoding (0x5A)
100 mlx resolution possible, allowing

Small-outline
10-lead
operation under dark glass
4.9x2.85x1.2 mm QFN
1 to 128 klx dynamic range possible
 Temperature Range
across two ADC range settings
–40 to +85 °C
Accurate lux measurements with IR
Pin Assignments
Si1141/42/43-M01
DNC 1
10 LEDA
SDA 2
9 LED1
SCL 3
8 GND
VDD 4
7 LED3/CVDD
INT 5
6 LED2/CVDD
correction algorithm
Applications









Handsets
Heart rate monitoring
Pulse oximetry
E-book readers
Notebooks/Netbooks
Portable consumer electronics
Audio products
Security panels
Tamper detection circuits









Dispensers
Valve controls
Smoke detectors
Touchless switches
Touchless sliders
Occupancy sensors
Consumer electronics
Industrial automation
Display backlighting control
Description
The Si1141/42/43-M01 is a low-power, reflectance-based, infrared proximity and
ambient light module with integrated single IR LED, two additional LED driver outputs,
I2C digital interface, and programmable-event interrupt output. This touchless sensor
module includes an analog-to-digital converter, integrated high-sensitivity visible and
infrared photodiodes, digital signal processor, and three integrated infrared LED
drivers with fifteen selectable drive levels. The Si1141/42/43-M01 offers excellent
performance under a wide dynamic range and a variety of light sources including direct
sunlight. The Si1141/42/43-M01 can also work under dark glass covers. The
photodiode response and associated digital conversion circuitry provide excellent
immunity to artificial light flicker noise and natural light flutter noise. With two or more
LEDs, the Si1141/42/43-M01 is capable of supporting multiple-axis proximity motion
detection. The Si1141/42/43-M01 devices are provided in a 10-lead 4.9x2.85x1.2 mm
QFN package and are capable of operation from 1.71 to 3.6 V over the –40 to +85 °C
temperature range.
Rev. 1.1 12/14
Copyright © 2014 by Silicon Laboratories
Si1141/42/43-M01
Si1141/42/43-M01
Functional Block Diagram
Si1143-M01
Si1143 Proximity/Ambient Light Sensor IC
VDD
Regulator
Temp
Visible
LED1
A
M
U
X
LED
Drivers
Filter
ADC
LEDA
LED1
LED3
LED32
LED2
LED21
Digital Sequencer & Control Logic
Infrared
INT
SCL
I2C
SDA
Registers
Oscillator
GND
Notes:
1. Si1142-M01 and Si1143-M01 only. Must be tied to VDD with Si1141-M01.
2. Si1143-M01 only. Must be tied to VDD with Si1141-M01 and Si1142-M01.
Figure 1. Si1143-M01 Sensor Module
3.3 V
30 Ohm
5%, 1/16 W
Si1141-M01
Host
SDA
SCL
SCL
VDD
INT
INT
LEDA
LED1
Si1141
SDA
LED1
LED3
LED3
LED2
LED2
0.1 uF
22 µF, 20%, >6 V
GND
Figure 2. Si1141-M01 Module Basic Application Schematic for 1 LED
V BAT
3.3 V
(3.3 to 4.3V)
No
Pop
30 Ohm
5%, 1/16 W
Si1142-M01
Host
SDA
SCL
SCL
VDD
INT
INT
0.1 uF
LEDA
LED1
Si1142
SDA
LED1
LED3
LED3
LED2
LED2
22 µF, 20%, >6 V
GND
Figure 3. Si1142-M01 Module Application Schematic for Long-Range Proximity Detection
Note: For more application examples, refer to “AN498: Si114x Designer’s Guide”.
2
Rev. 1.1
Si1141/42/43-M01
VBAT
3.3 V
(3.3 to 4.3V)
No
Pop
5 Ohm
5%, 1/16 W
Si1143-M01
Host
SDA
SCL
SCL
VDD
INT
INT
0.1 uF
LEDA
LED1
Si1143
SDA
LED1
LED3
LED3
LED2
LED2
47 µF, 20%, >6 V
GND
Figure 4. Si1143-M01 Module Application Schematic with Three LEDs and
Separate LED Power Supply
Rev. 1.1
3
Si1141/42/43-M01
TABLE O F C ONTENTS
Section
Page
1. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5
1.1. Performance Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5
1.2. Typical Performance Graphs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2. Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.1. Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
2.2. Proximity Sensing (PS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.3. Ambient Light . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16
2.4. Host Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3. Operational Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3.1. Off Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3.2. Initialization Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3.3. Standby Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3.4. Forced Conversion Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
3.5. Autonomous Operation Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
4. Programming Guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
4.1. Command and Response Structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
4.2. Command Protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
4.3. Resource Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
4.4. Signal Path Software Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
4.5. I2C Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
4.6. Parameter RAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
5. Pin Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
6. Ordering Guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
7. Package Outline: 10-Pin QFN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
8. Suggested PCB Land Pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
9. Top Markings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
9.1. Si1141/42/43 Top Markings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
9.2. Top Marking Explanation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
Document Change List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78
Contact Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .79
4
Rev. 1.1
Si1141/42/43-M01
1. Electrical Specifications
1.1. Performance Tables
Table 1. Recommended Operating Conditions
Parameter
Symbol
VDD Supply Voltage
Test Condition
VDD
VDD OFF Supply Voltage
VDD_OFF
Min
Typ
Max
Unit
1.71
—
3.6
V
1.0
V
OFF mode
–0.3
VDD = 3.3 V
1 kHz–10 MHz
—
—
50
mVpp
T
–40
25
85
°C
SCL, SDA, Input High Logic
Voltage
I2CVIH
VDDx0.7
—
VDD
V
SCL, SDA Input Low Logic
Voltage
I2CVIL
0
—
VDDx0.3
V
Edc
—
—
128
klx
l
750
850
950
nm
IrLED VF = 1.0 V nominal
VDD
—
4.3
V
Applies if IrLEDs use
separate supply rail
0–30 kHz
30 kHz–100 MHz
—
—
—
—
250
100
mVpp
mVpp
Start-Up Time
VDD above 1.71 V
25
—
—
ms
LED3 Voltage
Start-up
VDDx0.77
—
—
V
VDD Supply Ripple Voltage
Operating Temperature
PS Operation under
Direct Sunlight
IrLED Emission Wavelength
IrLED Supply Voltage
VLED
IrLED Supply Ripple Voltage
Table 2. Performance Characteristics1
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
IDD OFF Mode
Ioff
VDD < VDD_OFF (leakage from SCL,
SDA, and INT not included)
—
240
1000
nA
IDD Standby Mode
Isb
No ALS / PS Conversions
No I2C Activity
VDD = 1.8 V
—
150
500
nA
Notes:
1. Unless specifically stated in "Conditions", electrical data assumes ambient light levels < 1 klx.
2. Proximity-detection performance may be degraded, especially when there is high optical crosstalk, if the LED supply
and voltage drop allow the driver to saturate and current regulation is lost.
3. Guaranteed by design and characterization.
4. Represents the time during which the device is drawing a current equal to Iactive for power estimation purposes.
Assumes default settings.
Rev. 1.1
5
Si1141/42/43-M01
Table 2. Performance Characteristics1 (Continued)
Parameter
IDD Standby Mode
IDD Actively Measuring
Symbol
Test Condition
Min
Typ
Max
Unit
Isb
No ALS / PS Conversions
No I2C Activity
VDD = 3.3 V
—
1.4
—
µA
Iactive
Without LED influence, VDD = 3.3 V
—
4.3
5.5
mA
VDD = 3.3 V
—
8
—
mA
Peak IDD while LED1,
LED2, or LED3 is Actively
Driven
LED Driver Saturation
Voltage2,3
LED1, LED2, LED3
Pulse Width
LED1, LED2, LED3, INT,
SCL, SDA
Leakage Current
Vdd = 1.71 to 3.6 V
PS_LEDn = 0001
PS_LEDn = 0010
PS_LEDn = 0011
PS_LEDn = 0100
PS_LEDn = 0101
PS_LEDn = 0110
PS_LEDn = 0111
PS_LEDn = 1000
PS_LEDn = 1010
PS_LEDn = 1010
PS_LEDn = 1011
PS_LEDn = 1100
PS_LEDn = 1101
PS_LEDn = 1110
PS_LEDn = 1111
tPS
VDD = 3.3 V
mV
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
50
60
70
80
115
150
185
220
255
290
315
340
360
385
410
70
105
105
105
450
450
450
450
450
450
600
600
600
600
600
—
25.6
30
µs
–1
—
1
µA
Notes:
1. Unless specifically stated in "Conditions", electrical data assumes ambient light levels < 1 klx.
2. Proximity-detection performance may be degraded, especially when there is high optical crosstalk, if the LED supply
and voltage drop allow the driver to saturate and current regulation is lost.
3. Guaranteed by design and characterization.
4. Represents the time during which the device is drawing a current equal to Iactive for power estimation purposes.
Assumes default settings.
6
Rev. 1.1
Si1141/42/43-M01
Table 2. Performance Characteristics1 (Continued)
Parameter
LED1, LED2, LED3
Active Current
Actively Measuring Time4
Visible Photodiode
Response
Symbol
Test Condition
Min
Typ
Max
Unit
ILEDx
VDD = 3.3 V, single drive
VLEDn = 1 V, PS_LEDn = 0001
VLEDn = 1 V, PS_LEDn = 0010
VLEDn = 1 V, PS_LEDn = 0011
VLEDn = 1 V, PS_LEDn = 0100
VLEDn = 1 V, PS_LEDn = 0101
VLEDn = 1 V, PS_LEDn = 0110
VLEDn = 1 V, PS_LEDn = 0111
VLEDn = 1 V, PS_LEDn = 1000
VLEDn = 1 V, PS_LEDn = 1001
VLEDn = 1 V, PS_LEDn = 1010
VLEDn = 1 V, PS_LEDn = 1011
VLEDn = 1 V, PS_LEDn = 1100
VLEDn = 1 V, PS_LEDn = 1101
VLEDn = 1 V, PS_LEDn = 1110
VLEDn = 1 V, PS_LEDn = 1111
3.5
—
13
—
—
—
—
—
—
—
—
—
—
—
—
5.6
11.2
22.4
45
67
90
112
135
157
180
202
224
269
314
359
7
—
29
—
—
—
—
—
—
—
—
—
—
—
—
Single PS
ALS VIS + ALS IR
Two ALS plus three PS
—
—
—
155
285
660
—
—
—
µs
µs
µs
Sunlight
ALS_VIS_ADC_GAIN = 0
VIS_RANGE = 0
—
0.282
—
ADC
counts/
lux
2500K incandescent bulb
ALS_VIS_ADC_GAIN = 0
VIS_RANGE = 0
—
0.319
—
ADC
counts/
lux
“Cool white” fluorescent
ALS_VIS_ADC_GAIN = 0
VIS_RANGE = 0
—
0.146
—
ADC
counts/
lux
Infrared LED (875 nm)
ALS_VIS_ADC_GAIN = 0
VIS_RANGE = 0
—
8.277
—
ADC
counts.
m2/W
mA
Notes:
1. Unless specifically stated in "Conditions", electrical data assumes ambient light levels < 1 klx.
2. Proximity-detection performance may be degraded, especially when there is high optical crosstalk, if the LED supply
and voltage drop allow the driver to saturate and current regulation is lost.
3. Guaranteed by design and characterization.
4. Represents the time during which the device is drawing a current equal to Iactive for power estimation purposes.
Assumes default settings.
Rev. 1.1
7
Si1141/42/43-M01
Table 2. Performance Characteristics1 (Continued)
Parameter
Test Condition
Min
Typ
Max
Unit
Sunlight
ALS_IR_ADC_GAIN = 0
IR_RANGE = 0
—
2.44
—
ADC
counts/
lux
2500K incandescent bulb
ALS_IR_ADC_GAIN = 0
IR_RANGE = 0
—
8.46
—
ADC
counts/
lux
“Cool white” fluorescent
ALS_IR_ADC_GAIN = 0
IR_RANGE = 0
—
0.71
—
ADC
counts/
lux
Infrared LED (875 nm)
ALS_IR_ADC_GAIN = 0
IR_RANGE = 0
—
452.38
—
ADC
counts.
m2/W
Sunlight
PS_ADC_GAIN = 0
PS_RANGE = 0
PS_ADC_MODE = 0
—
14.07
—
ADC
counts/
lux
2500K incandescent bulb
PS_ADC_GAIN = 0
PS_RANGE = 0
PS_ADC_MODE = 0
—
50.47
—
ADC
counts/
lux
“Cool white” fluorescent
PS_ADC_GAIN = 0
PS_RANGE = 0
PS_ADC_MODE = 0
—
3.97
—
ADC
counts/
lux
Infrared LED (875 nm)
PS_ADC_GAIN = 0
PS_RANGE = 0
PS_ADC_MODE = 0
—
2734
—
ADC
counts.
m2/W
Visible Photodiode Noise
All gain settings
—
7
—
ADC
counts
RMS
Small Infrared Photodiode
Noise
All gain settings
—
1
—
ADC
counts
RMS
Small Infrared Photodiode
Response
Large Infrared Photodiode Response
Symbol
Notes:
1. Unless specifically stated in "Conditions", electrical data assumes ambient light levels < 1 klx.
2. Proximity-detection performance may be degraded, especially when there is high optical crosstalk, if the LED supply
and voltage drop allow the driver to saturate and current regulation is lost.
3. Guaranteed by design and characterization.
4. Represents the time during which the device is drawing a current equal to Iactive for power estimation purposes.
Assumes default settings.
8
Rev. 1.1
Si1141/42/43-M01
Table 2. Performance Characteristics1 (Continued)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
All gain settings
—
10
—
ADC
counts
RMS
Visible Photodiode Offset
Drift
VIS_RANGE = 0
ALS_VIS_ADC_GAIN = 0
ALS_VIS_ADC_GAIN = 1
ALS_VIS_ADC_GAIN = 2
ALS_VIS_ADC_GAIN = 3
ALS_VIS_ADC_GAIN = 4
ALS_VIS_ADC_GAIN = 5
ALS_VIS_ADC_GAIN = 6
ALS_VIS_ADC_GAIN = 7
—
—
ADC
counts/
°C
Small Infrared Photodiode
Offset Drift
IR_RANGE = 0
IR_GAIN = 0
IR_GAIN = 1
IR_GAIN = 2
IR_GAIN = 3
—
—
ADC
counts/
°C
I = 4 mA, VDD > 2.0 V
I = 4 mA, VDD < 2.0 V
—
—
—
—
VDDx0.
2
0.4
V
V
25 °C
—
11136
—
ADC
counts
—
35
—
ADC
counts/
°C
Large Infrared Photodiode Noise
SCL, SDA, INT Output
Low Voltage
Temperature Sensor Offset
VOL
Temperature Sensor Gain
–0.3
–0.11
–0.06
–0.03
–0.01
–0.008
–0.007
–0.008
–0.3
–0.06
–0.03
–0.01
Notes:
1. Unless specifically stated in "Conditions", electrical data assumes ambient light levels < 1 klx.
2. Proximity-detection performance may be degraded, especially when there is high optical crosstalk, if the LED supply
and voltage drop allow the driver to saturate and current regulation is lost.
3. Guaranteed by design and characterization.
4. Represents the time during which the device is drawing a current equal to Iactive for power estimation purposes.
Assumes default settings.
Rev. 1.1
9
Si1141/42/43-M01
Table 3. I2C Timing Specifications
Parameter
Symbol
Min
Typ
Max
Unit
Clock Frequency
fSCL
0.09
—
3.4
MHz
Clock Pulse Width Low
tLOW
160
—
—
ns
Clock Pulse Width High
tHIGH
60
—
—
ns
Start Condition Hold Time
tHD.STA
160
—
—
ns
Start Condition Setup Time
tSU.STA
160
—
—
ns
Input Data Setup Time
tSU.DAT
10
—
—
ns
Input Data Hold Time
tHD.DAT
0
—
—
ns
Stop Condition Setup Time
tSU.STO
160
—
—
ns
Table 4. LED Electro-Optical Characteristics*
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Vf1
If = 10 µA
0.8
—
—
V
Vf2
If = 50 mA
—
1.6
1.9
V
Reverse current
Ir
Vr = 10 V
—
—
5.0
µA
Peak wavelength
p
If = 50 mA
840
855
870
nm
Spectral half-width

If = 50 mA
—
30
—
nm
Radiant flux
Po
If = 50 mA
12
—
—
mW
Radiant Intensity
Ie
If = 50 mA
17
23
30
mW/sr
Half Angle

—
25
—
Degrees
Forward voltage
*Note: All specifications measured at 25 °C.
10
Rev. 1.1
Si1141/42/43-M01
Table 5. Absolute Maximum Ratings*
Parameter
Min
Max
Unit
VDD Supply Voltage
–0.3
4
V
Operating Temperature
–40
85
°C
Storage Temperature
–65
85
°C
–0.5
3.6
V
–0.5
4.3
V
–0.5
3.6
V
Maximum Total Current Through LED1, LED2,
LED3 and LEDA
—
500
mA
Maximum Total Current Through GND
—
600
mA
TA = 25 °C
—
70
mA
Human Body Model
—
2
kV
Machine Model
—
225
V
Charged-Device Model
—
2
kV
LED1, LED2, LED3 Voltage
Test Condition
at VDD = 0 V, TA < 85 °C
LEDA Voltage
INT, SCL, SDA Voltage
Forward DC Current Through LEDA
ESD Rating
at VDD = 0 V, TA < 85 °C
*Note: Permanent device damage may occur if the absolute maximum ratings are exceeded.
Rev. 1.1
11
Si1141/42/43-M01
1.2. Typical Performance Graphs
1.6
1.0
1.4
0.8
X Orientation
0.7
Y Orientation
0.6
0.5
0.4
0.3
Relative Radiant Intensity
(normalized at 50 mA)
Relative Radiant Intensity
0.9
1.2
1.0
0.8
0.6
0.4
0.2
0.2
0.1
0.0
0.0
-80
-60
-40
-20
0
20
40
60
80
0
Angle (degrees)
Figure 5. LED Radiant Intensity vs. Angle
10
20
30
40
50
Forward Current (mA)
60
Figure 6. LED Radiant Intensity vs. Forward
Current
Figure 7. Proximity Response Using Kodak Gray Cards, PS_RANGE = 0, PS_ADC_GAIN = 0
(Single 25.6 µs LED Pulse), 22.5 mW/sr, No Overlay (Preliminary)
12
70
Rev. 1.1
Si1141/42/43-M01
Figure 8. ALS Variability with Different Light Sources
Transverse Axis
Lateral Axis
Figure 9. Module Axis Orientation
Rev. 1.1
13
Si1141/42/43-M01
Figure 10. Lateral Photodiode View Angle
Figure 11. Transverse Photodiode View Angle
14
Rev. 1.1
Si1141/42/43-M01
2. Functional Description
2.1. Introduction
The Si1141/42/43-M01 is an active optical reflectance proximity detector and ambient light sensor with an
integrated infrared LED in a single module. By combining the proximity detector and LED into a single module, the
Si1141/42/43-M01 delivers optimized optical performance in a single compact package. Unlike discrete
implementations, module-based proximity sensor designs include the necessary optical blocking between the
sensor and LED. This reduces “blind spots” that can occur in discrete implementations that lack proper optical
blocking.
The Si1141/42/43-M01’s operational state is controlled through registers accessible through the I2C interface. The
host can command the Si1141/42/43-M01 to initiate on-demand proximity detection or ambient light sensing. The
host can also place the Si1141/42/43-M01 in an autonomous operational state where it performs measurements at
set intervals and interrupts the host either after each measurement is completed or whenever a set threshold has
been crossed. This results in an overall system power saving allowing the host controller to operate longer in its
sleep state instead of polling the Si1141/42/43-M01. For more details, refer to “AN498: Si114x Designer's Guide”.
2.2. Proximity Sensing (PS)
The Si1141/42/43-M01 has been optimized for use as either a dual-port or single-port active reflection proximity
detector. Over distances of less than 50 cm, the dual-port active reflection proximity detector has significant
advantages over single-port, motion-based infrared systems, which are only good for triggered events. Motionbased infrared detectors identify objects within proximity, but only if they are moving. Single-port motion-based
infrared systems are ambiguous about stationary objects even if they are within the proximity field. The Si1141/42/
43-M01 can reliably detect an object entering or exiting a specified proximity field, even if the object is not moving
or is moving very slowly. However, beyond about 30–50 cm, even with good optical isolation, single-port signal
processing may be required due to static reflections from nearby objects, such as table tops, walls, etc. If motion
detection is acceptable, the Si1141/42/43-M01 can achieve ranges of up to 50 cm, through a single product
window.
For small objects, the drop in reflectance is as much as the fourth power of the distance. This means that there is
less range ambiguity than with passive motion-based devices. For example, a sixteenfold change in an object's
reflectance means only a fifty-percent drop in detection range.
The Si1141/42/43-M01 contains up to three LED drivers. For long-range proximity detection, the multiple LED
drivers can be connected in parallel to deliver high drive current for the internal LED. The LED drivers can also be
used to drive up to two external infrared LEDs, in addition to the LED integrated within the Si1141/42/43-M01.
When the three infrared LEDs are placed in an L-shaped configuration, it is possible to triangulate an object within
the three-dimensional proximity field. Thus, a touchless user interface can be implemented with the aid of host
software.
The Si1141/42/43-M01 can initiate proximity sense measurements when explicitly commanded by the host or
periodically through an autonomous process. Refer to "3. Operational Modes" on page 20 for additional details of
the Si1141/42/43-M01's Operational Modes.
Whenever it is time to make a PS measurement, the Si1141/42/43-M01 makes up to three measurements,
depending on what is enabled in the CHLIST parameter. Other ADC parameters for these measurements can also
be modified to allow proper operation under different ambient light conditions.
The LED choice is programmable for each of these three measurements. By default, each measurement turns on a
single LED driver. However, the order of measurements can be easily reversed or even have all LEDs turned on at
the same time. Optionally, each proximity measurement can be compared against a host-programmable threshold.
With threshold settings for each PS channel, it is also possible for the Si1141/42/43-M01 to notify the host
whenever the threshold has been crossed. This reduces the number of interrupts to the host, aiding in efficient
software algorithms.
The Si1141/42/43-M01 can also generate an interrupt after a complete set of proximity measurements, ignoring
any threshold settings.
To support different power usage cases dynamically, the infrared LED current of each output is independently
Rev. 1.1
15
Si1141/42/43-M01
programmable. The current can be programmed anywhere from a few to several hundred milliamps. Therefore, the
host can optimize for proximity detection performance or for power saving dynamically. This feature can be useful
since it allows the host to reduce the LED current once an object has entered a proximity sphere, and the object
can still be tracked at a lower current setting. Finally, the flexible current settings make it possible to control the
infrared LED currents with a controlled current sink, resulting in higher precision.
The ADC properties are programmable. For indoor operation, the ADC should be configured for low signal range
for best reflectance sensitivity. When under high ambient conditions, the ADC should be configured for high signal
level range operation.
When operating in the lower signal range, it is possible to saturate the ADC when the ambient light level is high.
Any overflow condition is reported in the RESPONSE register, and the corresponding data registers report a value
of 0xFFFF. The host can then adjust the ADC sensitivity. Note however that the overflow condition is not sticky. If
the light levels return to a range within the capabilities of the ADC, the corresponding data registers begin to
operate normally. However, the RESPONSE register will continue to hold the overflow condition until a NOP
command is received. Even if the RESPONSE register has an overflow condition, commands are still accepted
and processed.
Proximity detection ranges beyond 50 cm and up to several meters can be achieved without lensing by selecting a
longer integration time. The detection range may be increased further, even with high ambient light, by averaging
multiple measurements. Refer to “AN498: Si114x Designer's Guide” for more details.
2.3. Ambient Light
The Si1141/42/43-M01 has photodiodes capable of measuring both visible and infrared light. However, the visible
photodiode is also influenced by infrared light. The measurement of illuminance requires the same spectral
response as the human eye. If an accurate lux measurement is desired, the extra IR response of the visible-light
photodiode must be compensated. Therefore, to allow the host to make corrections to the infrared light’s influence,
the Si1141/42/43-M01 reports the infrared light measurement on a separate channel. The separate visible and IR
photodiodes lend themselves to a variety of algorithmic solutions. The host can then take these two measurements
and run an algorithm to derive an equivalent lux level as perceived by a human eye. Having the IR correction
algorithm running in the host allows for the most flexibility in adjusting for system-dependent variables. For
example, if the glass used in the system blocks visible light more than infrared light, the IR correction needs to be
adjusted.
If the host is not making any infrared corrections, the infrared measurement can be turned off in the CHLIST
parameter.
By default, the measurement parameters are optimized for indoor ambient light levels where it is possible to detect
light levels as low as 6 lx. For operation under direct sunlight, the ADC can be programmed to operate in a high
signal operation so that it is possible to measure direct sunlight without overflowing the 16-bit result.
For low-light applications, it is possible to increase the ADC integration time. Normally, the integration time is
25.6 µs. By increasing this integration time to 410 µs, the ADC can detect light levels as low as 1 lx. The ADC can
be programmed with an integration time as high as 3.28 ms, allowing measurement to 100 mlx light levels. The
ADC integration time for the Visible Light Ambient measurement can be programmed independently of the ADC
integration time of the Infrared Light Ambient measurement. The independent ADC parameters allow operation
under glass covers having a higher transmittance to Infrared Light than Visible Light.
When operating in the lower signal range, or when the integration time is increased, it is possible to saturate the
ADC when the ambient light suddenly increases. Any overflow condition is reported in the RESPONSE register,
and the corresponding data registers report a value of 0xFFFF. Based on either of these two overflow indicators,
the host can adjust the ADC sensitivity. However, the overflow condition is not sticky. If the light levels return to a
range within the capabilities of the ADC, the corresponding data registers begin to operate normally. The
RESPONSE register will continue to hold the overflow condition until a NOP command is received. Even if the
RESPONSE register has an overflow condition, commands are still accepted and processed.
The Si1141/42/43-M01 can initiate ALS measurements either when explicitly commanded by the host or
periodically through an autonomous process. Refer to "3. Operational Modes" on page 20 for additional details of
the Si1141/42/43-M01's Operational Modes. The conversion frequency setting is programmable and independent
of the Proximity Sensor. This allows the Proximity Sensor and Ambient Light sensor to operate at different
16
Rev. 1.1
Si1141/42/43-M01
conversion rates, increasing host control over the Si1141/42/43-M01.
When operating autonomously, the ALS has a slightly different interrupt structure compared to the Proximity
Sensor. An interrupt can be generated to the host on every sample, or when the ambient light has changed.
The “Ambient Light Changed” interrupt is accomplished through two thresholds working together to implement a
window. As long as the ambient light stays within the window defined by the two thresholds, the host is not
interrupted. When the ambient light changes and either threshold is crossed, an interrupt is sent to the host,
thereby allowing the host notification that the ambient light has changed. This can be used by the host to trigger a
recalculation of the lux values.
The window can be applied to either the Visible Ambient Measurement, or the Infrared Ambient Measurement, but
not both. However, monitoring the ambient change in either channel should allow notification that the ambient light
level has changed.
Normalized Photodiode Response
1
VIS
IR
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
250
350
450
550
650
750
850
950
1050
Wavelength (nm)
Figure 12. Photodiode Spectral Response to Visible and Infrared Light (Indicative)
Rev. 1.1
17
Si1141/42/43-M01
2.4. Host Interface
The host interface to the Si1141/42/43-M01 consists of three pins:
SCL
SDA
INT
SCL and SDA are standard open-drain pins as required for I2C operation.
The Si1141/42/43-M01 asserts the INT pin to interrupt the host processor. The INT pin is an open-drain output. A
pull-up resistor is needed for proper operation. As an open-drain output, it can be shared with other open-drain
interrupt sources in the system.
For proper operation, the Si1141/42/43-M01 is expected to fully complete its Initialization Mode prior to any activity
on the I2C.
The INT, SCL, and SDA pins are designed so that it is possible for the Si1141/42/43-M01 to enter the Off Mode by
software command without interfering with normal operation of other I2C devices on the bus.
The Si1141/42/43-M01 I2C slave address is 0x5A. The Si1141/42/43-M01 also responds to the global address
(0x00) and the global reset command (0x06). Only 7-bit I2C addressing is supported; 10-bit I2C addressing is not
supported.
Conceptually, the I2C interface allows access to the Si1141/42/43-M01 internal registers. Table 16 on page 32 is a
summary of these registers.
An I2C write access always begins with a start (or restart) condition. The first byte after the start condition is the I2C
address and a read-write bit. The second byte specifies the starting address of the Si1141/42/43-M01 internal
register. Subsequent bytes are written to the Si1141/42/43-M01 internal register sequentially until a stop condition
is encountered. An I2C write access with only two bytes is typically used to set up the Si1141/42/43-M01 internal
address in preparation for an I2C read.
The I2C read access, like the I2C write access, begins with a start or restart condition. In an I2C read, the I2C
master then continues to clock SCK to allow the Si1141/42/43-M01 to drive the I2C with the internal register
contents.
The Si1141/42/43-M01 also supports burst reads and burst writes. The burst read is useful in collecting contiguous,
sequential registers. The Si1141/42/43-M01 register map was designed to optimize for burst reads for interrupt
handlers, and the burst writes are designed to facilitate rapid programming of commonly used fields, such as
thresholds registers.
The internal register address is a six-bit (bit 5 to bit 0) plus an Autoincrement Disable (on bit 6). The Autoincrement
Disable is turned off by default. Disabling the autoincrementing feature allows the host to poll any single internal
register repeatedly without having to keep updating the Si1141/42/43-M01 internal address every time the register
is read.
It is recommended that the host should read PS or ALS measurements (in the I2C Register Map) when the Si1141/
42/43-M01 asserts INT. Although the host can read any of the Si1141/42/43-M01's I2C registers at any time, care
must be taken when reading 2-byte measurements outside the context of an interrupt handler. The host could be
reading part of the 2-byte measurement when the internal sequencer is updating that same measurement
coincidentally. When this happens, the host could be reading a hybrid 2-byte quantity whose high byte and low byte
are parts of different samples. If the host must read these 2-byte registers outside the context of an interrupt
handler, the host should “double-check” a measurement if the measurement deviates significantly from a previous
reading.
I2C Broadcast Reset: The I2C Broadcast Reset should be sent prior to any I2C register access to the Si1141/42/
43-M01. If any I2C register or parameter has already been written to the Si1141/42/43-M01 when the I2C Broadcast
Reset is issued, the host must send a reset command and reinitialize the Si1141/42/43-M01 completely.
18
Rev. 1.1
Si1141/42/43-M01
SCL
SDA
SLA6
START
SLA5-0
Slave Address + R/W
R/W
D7
ACK
D6-0
Data Byte
NACK
STOP
Figure 13. I2C Bit Timing Diagram
Figure 14. Host Interface Single Write
Figure 15. Host Interface Single Read
Figure 16. Host Interface Burst Write
Figure 17. Host Interface Burst Read
Figure 18. Si1141/42/43-M01 REG ADDRESS Format
Notes:
Gray
boxes are driven by the host to the Si1141/42/43-M01
White boxes are driven by the Si1141/42/43-M01 to the host
A = ACK or “acknowledge”
N = NACK or “no acknowledge”
S = START condition
Sr = repeat START condition
P = STOP condition
AI = Disable Auto Increment when set
Rev. 1.1
19
Si1141/42/43-M01
3. Operational Modes
The Si1141/42/43-M01 can be in one of many operational modes at any one time. It is important to consider the
operational mode since the mode has an impact on the overall power consumption of the Si1141/42/43-M01. The
various modes are:
Off
Mode
Initialization Mode
Standby Mode
Forced Conversion Mode
Autonomous Mode
3.1. Off Mode
The Si1141/42/43-M01 is in the Off Mode when VDD is either not connected to a power supply or if the VDD voltage
is below the stated VDD_OFF voltage described in the electrical specifications. As long as the parameters stated in
Table 4, “LED Electro-Optical Characteristics*,” on page 10 are not violated, no current will flow through the
Si1141/42/43-M01. In the Off Mode, the Si1141/42/43-M01 SCL and SDA pins do not interfere with other I2C
devices on the bus. The LED pins will not draw current through the infrared diodes. Keeping VDD less than
VDD_OFF is not intended as a method of achieving lowest system current draw. The reason is that the ESD
protection devices on the SCL, SDA and INT pins also from a current path through VDD. If VDD is grounded for
example, then, current flow from system power to system ground through the SCL, SDA and INT pull-up resistors
and the ESD protection devices.
Allowing VDD to be less than VDD_OFF is intended to serve as a hardware method of resetting the Si1141/42/43M01 without a dedicated reset pin.
The Si1141/42/43-M01 can also reenter the Off Mode upon receipt of either a general I2C reset or if a software
reset sequence is initiated. When one of these software methods is used to enter the Off Mode, the Si1141/42/43M01 typically proceeds directly from the Off Mode to the Initialization Mode.
3.2. Initialization Mode
When power is applied to VDD and is greater than the minimum VDD Supply Voltage stated in Table 1,
“Recommended Operating Conditions,” on page 5, the Si1141/42/43-M01 enters its Initialization Mode. In the
Initialization Mode, the Si1141/42/43-M01 performs its initial startup sequence. Since the I2C may not yet be active,
it is recommended that no I2C activity occur during this brief Initialization Mode period. The “Start-up time”
specification in Table 1 is the minimum recommended time the host needs to wait before sending any I2C accesses
following a power-up sequence. After Initialization Mode has completed, the Si1141/42/43-M01 enters Standby
Mode. The host must write 0x17 to the HW_KEY register for proper operation.
3.3. Standby Mode
The Si1141/42/43-M01 spends most of its time in Standby Mode. After the Si1141/42/43-M01 completes the
Initialization Mode sequence, it enters Standby mode. While in Standby Mode, the Si1141/42/43-M01 does not
perform any Ambient Light measurements or Proximity Detection functions. However, the I2C interface is active
and ready to accept reads and writes to the Si1141/42/43-M01 registers. The internal Digital Sequence Controller
is in its sleep state and does not draw much power. In addition, the INT output retains its state until it is cleared by
the host.
I2C accesses do not necessarily cause the Si1141/42/43-M01 to exit the Standby Mode. For example, reading
Si1141/42/43-M01 registers is accomplished without needing the Digital Sequence Controller to wake from its
sleep state.
20
Rev. 1.1
Si1141/42/43-M01
3.4. Forced Conversion Mode
The Si1141/42/43-M01 can operate in Forced Conversion Mode under the specific command of the host processor.
The Forced Conversion Mode is entered if either the ALS_FORCE or the PS_FORCE command is sent. Upon
completion of the conversion, the Si1141/42/43-M01 can generate an interrupt to the host if the corresponding
interrupt is enabled. It is possible to initiate both an ALS and multiple PS measurements with one command
register write access by using the PSALS_FORCE command.
3.5. Autonomous Operation Mode
The Si1141/42/43-M01 can be placed in the Autonomous Operation Mode where measurements are performed
automatically without requiring an explicit host command for every measurement. The PS_AUTO, ALS_AUTO and
PSALS_AUTO commands are used to place the Si1141/42/43-M01 in the Autonomous Operation Mode.
The Si1141/42/43-M01 updates the I2C registers for PS and ALS automatically. Each measurement is allocated a
16-bit register in the I2C map. It is possible to operate the Si1141/42/43-M01 without interrupts. When doing so, the
host poll rate must be at least twice the frequency of the conversion rates for the host to always receive a new
measurement. The host can also choose to be notified when these new measurements are available by enabling
interrupts.
The conversion frequencies for the PS and ALS measurements are set up by the host prior to the PS_AUTO,
ALS_AUTO, or PSALS_AUTO commands. The host can set a PS conversion frequency different from the ALS
conversion frequency. However, they both need to be a multiple of the base conversion frequency in the
MEAS_RATE register in the I2C map.
The Si1141/42/43-M01 can interrupt the host when the PS or ALS measurements reach a pre-set threshold. To
assist in the handling of interrupts the registers are arranged so that the interrupt handler can perform an I2C burst
read operation to read the necessary registers, beginning with the interrupt status register, and cycle through the
ALS data registers followed by the individual Proximity readings.
Rev. 1.1
21
Si1141/42/43-M01
4. Programming Guide
4.1. Command and Response Structure
All Si1141/42/43-M01 I2C registers (except writes to the COMMAND register) are read or written without waking up
the internal sequencer. A complete list of the I2C registers can be found in "4.5. I2C Registers" on page 32. In
addition to the I2C Registers, RAM parameters are memory locations maintained by the internal sequencer. These
RAM Parameters are accessible through a Command Protocol (see "4.6. Parameter RAM" on page 55). A
complete list of the RAM Parameters can be found in "4.6. Parameter RAM" on page 55.
The Si1141/42/43-M01 can operate either in Forced Measurement or Autonomous Mode. When in Forced
Measurement mode, the Si1141/42/43-M01 does not make any measurements unless the host specifically
requests the Si1141/42/43-M01 to do so via specific commands (refer to the Section 3.2). The CHLIST parameter
needs to be written so that the Si1141/42/43-M01 would know which measurements to make. The parameter
MEAS_RATE, when zero, places the internal sequencer in Forced Measurement mode. When in Forced
Measurement mode, the internal sequencer wakes up only when the host writes to the COMMAND register. The
power consumption is lowest in Forced Measurement mode (MEAS_RATE = 0).
The Si1141/42/43-M01 operates in Autonomous Operation mode when MEAS_RATE is non-zero. The
MEAS_RATE represents the time interval at which the Si1141/42/43-M01 wakes up periodically. Once the internal
sequencer has awoken, the sequencer manages an internal PS Counter and ALS Counter based on the PS_RATE
and ALS_RATE registers.
When the internal PS counter has expired, up to three proximity measurements are made (PS1, PS2 and PS3)
depending on which measurements are enabled via the upper bits of the CHLIST Parameter. All three PS
measurements are performed, in sequence, beginning with the PS1 measurement channel. In the same way, when
the ALS counter has expired, up to three measurements are made (ALS_VIS, ALS_IR and AUX) depending on
which measurements are enabled via the upper bits of the CHLIST Parameter. All three measurements are made
in the following sequence: ALS_VIS, ALS_IR and AUX.
PS_RATE and ALS_RATE are normally non-zero. A value of zero in PS_RATE or ALS_RATE causes the internal
sequencer to never perform that measurement group. Typically, PS_RATE or ALS_RATE represents a value of
one. A value of one essentially states that the specific measurement group is made every time the device wakes
up.
It is possible for both the PS Counter and ALS Counter to both expire at the same time. When that occurs, the PS
measurements are performed before the ALS measurements. When all measurements have been made, the
internal sequencer goes back to sleep until next time, as dictated by the MEAS_RATE parameter.
The operation of the Si1141/42/43-M01 can be described as two measurement groups bound by some common
factors. The PS Measurement group consists of the three PS measurements while the ALS Measurement group
consists of the Visible Light Ambient Measurement (ALS_VIS), the Infrared Light Ambient Measurement (ALS_IR)
and the Auxiliary measurement (AUX). Each measurement group has three measurements each. The Channel List
(CHLIST) parameter enables the specific measurements for that measurement grouping.
Each measurement (PS1, PS2, PS3, ALS_VIS, ALS_IR, AUX) are controlled through a combination of I2C
Register or Parameter RAM. Tables 7 to 9 below summarize the properties and resources used for each
measurement.
22
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Si1141/42/43-M01
4.2. Command Protocol
The I2C map implements a bidirectional message box between the host and the Si1141/42/43-M01 Sequencer.
Host-writable I2C registers facilitate host-to-Si1141/42/43-M01 communication, while read-only I2C registers are
used for Si1141/42/43-M01-to-host communication.
Unlike the other host-writable I2C registers, the COMMAND register causes the internal sequencer to wake up
from Standby mode to process the host request.
When a command is executed, the RESPONSE register is updated. Typically, when there is no error, the upper
four bits are zeroes. To allow command tracking, the lower four bits implement a 4-bit circular counter. In general, if
the upper nibble of the RESPONSE register is non-zero, this indicates an error or the need for special processing.
The PARAM_WR and PARAM_RD registers are additional mailbox registers.
In addition to the registers in the I2C map, there are environmental parameters accessible through the Command/
Response interface. These parameters are stored in the internal ram space. These parameters generally take
more I2C accesses to read and write. The Parameter RAM is described in "4.6. Parameter RAM" on page 55.
For every write to the Command register, the following sequence is required:
1. Write 0x00 to the Command register to clear the Response register.
2. Read the Response register and verify contents are 0x00.
3. Write Command value from Table 5 into the Command register.
4. Read the Response register and verify that the contents are now non-zero. If the contents are still 0x00, repeat
this step.
The Response register will be incremented upon the successful completion of a Command. If the Response
register remains 0x00 for over 25 ms after the Command write, the entire Command process should be repeated
from Step 1.
Step 4 above is not applicable to the Reset Command because the device will reset itself and does not increment
the Response register after reset. No Commands should be issued to the device for at least 1 ms after a Reset is
issued.
Table 6. Command Register Summary
COMMAND Register
Name
Encoding
PARAM_QUERY 100 aaaaa
PARAM_W
R Register
PARAM_RD
Register
Error Code in
RESPONSE
Register
—
nnnn nnnn

Reads the parameter pointed to by
bitfield [4:0] and writes value to
PARAM_RD.
See Table 11 for parameters.
Description
PARAM_SET
101 aaaaa
dddd
dddd
nnnn nnnn

Sets parameter pointed by bitfield
[4:0] with value in PARAM_WR, and
writes value out to PARAM_RD. See
Table 11 for parameters.
PARAM_AND
110 aaaaa
dddd
dddd
nnnn nnnn

Performs a bit-wise AND between
PARAM_WR and Parameter pointed
by bitfield [4:0], writes updated value
to PARAM_RD.
See Table 11 for parameters.
Rev. 1.1
23
Si1141/42/43-M01
Table 6. Command Register Summary (Continued)
COMMAND Register
PARAM_W
R Register
PARAM_RD
Register
Error Code in
RESPONSE
Register
Description
Name
Encoding
PARAM_OR
111 aaaaa
dddd
dddd
nnnn nnnn

Performs a bit-wise OR of
PARAM_WR and parameter pointed
by bitfield [4:0], writes updated value
to PARAM_RD. See Table 11 for
parameters.
NOP
000 00000
—
—

Forces a zero into the RESPONSE
register
RESET
000 00001
—
—

Performs a software reset of the
firmware
BUSADDR
000 00010
—
—
—
Modifies I2C address
Reserved
000 00011
—
—
—
—
Reserved
000 00100
—
—
—
—
PS_FORCE
000 00101
—
—

Forces a single PS measurement
ALS_FORCE
000 00110
—
—

Forces a single ALS measurement
PSALS_FORCE 000 00111
—
—

Forces a single PS and ALS
measurement
Reserved
000 01000
—
—
—
—
PS_PAUSE
000 01001
—
—

Pauses autonomous PS
ALS_PAUSE
000 01010
—
—

Pauses autonomous ALS
PSALS_PAUSE 000 01011
—
—

Pauses PS and ALS
Reserved
000 01100
—
—

PS_AUTO
000 01101
—
—

Starts/Restarts an autonomous PS
Loop
ALS_AUTO
000 01110
—
—

Starts/Restarts an autonomous
ALS Loop
PSALS_AUTO
000 01111
—
—

Starts/Restarts autonomous ALS
and PS loop
Reserved
000 1xxxx
—
—
—
24
Rev. 1.1
—
—
Si1141/42/43-M01
Table 7. Response Register Error Codes
RESPONSE Register
Description
0000 cccc
NO_ERROR. The lower bit is a circular counter and is incremented every time a
command has completed. This allows the host to keep track of commands sent to
the Si1141/42/43-M01. The circular counter may be cleared using the NOP command.
1000 0000
INVALID_SETTING. An invalid setting was encountered.
Clear using the NOP command.
1000 1000
PS1_ADC_OVERFLOW. Indicates proximity channel one conversion overflow.
1000 1001
PS2_ADC_OVERFLOW. Indicates proximity channel two conversion overflow.
1000 1010
PS3_ADC_OVERFLOW. Indicates proximity channel three conversion overflow.
1000 1100
ALS_VIS_ADC_OVERFLOW. Indicates visible ambient light channel conversion
overflow.
1000 1101
ALS_IR_ADC_OVERFLOW. Indicates infrared ambient light channel conversion
overflow.
1000 1110
AUX_ADC_OVERFLOW. Indicates auxiliary channel conversion overflow.
Rev. 1.1
25
Si1141/42/43-M01
4.3. Resource Summary
Table 8. Resource Summary for Interrupts and Threshold Checking
Measurement
Channel
Channel
Enable
Interrupt Status
Output
Interrupt Enable
Interrupt Mode
Proximity
Sense 1
EN_PS1 in
CHLIST[0]
PS1_INT in
IRQ_STATUS[2]
PS1_IE in
IRQ_ENABLE[2]
Proximity
Sense 2
EN_PS2 in
CHLIST[1]
PS2_INT in
IRQ_STATUS[3]
Proximity
Sense 3
EN_PS3 in
CHLIST[2]
PS3_INT in
IRQ_STATUS[4]
ALS Visible
Threshold
Hysteresis
History
Checking
PS1_IM[1:0] in
IRQ_MODE1[5:4]
PS1_TH[7:0]
PS_HYST[7:0]
PS_HISTORY[7:0]
PS2_IE in
IRQ_ENABLE[3]
PS2_IM[1:0] in
IRQ_MODE1[7:6]
PS2_TH[7:0]
PS3_EN in
IRQ_ENABLE[4]
PS3_IM[1:0] in
IRQ_MODE2[1:0]
PS3_TH[7:0]
EN_ALS_VIS ALS_INT[1:0] in
ALS_IE[1:0] in
in CHLIST[4] IRQ_STATUS[1:0] IRQ_ENABLE[1:0]
ALS IR
EN_ALS_IR
in CHLIST[5]
Auxiliary
Measurement
EN_AUX in
CHLIST[6]
26
Threshold
Registers
—
—
ALS_IM[2:0] in
IRQ_MODE1[2:0]
ALS_LOW_TH[7:0] ALS_HYST[7:0] ALS_HISTORY[7:0]
/ ALS_HI_TH[7:0]
—
—
Rev. 1.1
—
—
Autonomous Measurement
Time Base
MEAS_RATE[7:0]
PS_RATE[7:0]
ALS_RATE[7:0]
Si1141/42/43-M01
Table 9. Resource Summary for LED Choice and ADC Parameters
Measurement
Channel
LED
Selection
ADC Mode
ADC Output
ADC Input Source
Proximity
Sense 1
PS1_LED[2:0]
in PSLED12_
SELECT[2:0]
PS_ADC_MODE
in
PS_ADC_MISC[2]
PS1_DATA1[7:0] /
PS1_DATA0[7:0]
PS1_ADCMUX[7:0]
Proximity
Sense 2
PS2_LED[2:0]
in PSLED12_
SELECT[6:4]
PS2_DATA1[7:0] /
PS2_DATA0[7:0]
PS2_ADCMUX[7:0]
PS2_ALIGN in
PS_ENCODING[5]
Proximity
Sense 3
PS3_LED[2:0]
in PSLED3_
SELECT[2:0]
PS3_DATA1[7:0] /
PS3_DATA0[7:0]
PS3_ADCMUX[7:0]
PS3_ALIGN in
PS_ENCODING[6]
ALS Visible
—
—
ADC Recovery
Count
ADC High Signal
Mode
ADC Clock
Divider
ADC Alignment
PS_ADC_REC in
PS_ADC_
COUNTER [6:4]
PS_RANGE in
PS_ADC_MISC[5]
PS_ADC_
GAIN[3:0]
PS1_ALIGN in
PS_ENCODING[4]
ALS_VIS_DATA1 /
ALS_VIS_DATA0
VIS_ADC_REC in
ALS_VIS_ADC_
COUNTER [6:4]
VIS_RANGE in
ALS_VIS_ADC_MISC[5]
ALS_VIS_ADC_GAIN [3:0]
ALS_VIS_ALIGN in
ALS_ENCODING[4]
ALS IR
ALS_IR_DATA1[7:0] /
ALS_IR_DATA0[7:0]
IR_ADC_REC in
ALS_IR_ADC_
COUNTER [6:4]
IR_RANGE in
ALS_IR_ADC_MISC[5]
ALS_IR_ADC_
GAIN [3:0]
ALS_IR_ALIGN in
ALS_ENCODING[5]
Auxiliary
Measurement
AUX_DATA1[7:0] /
AUX_DATA0[7:0]
—
—
—
—
AUX_ADCMUX[7:0]
Rev. 1.1
ADC
Offset
ADC_
OFFSET
[7:0]
27
Si1141/42/43-M01
Table 10. Resource Summary for Hardware Pins
Pin Name
LED Current Drive
LED1
LED1_I in PSLED12[3:0]
LED2
LED2_I in PSLED12[7:4]
HW_KEY[7:0]
LED3
LED3_I in PSLED3[3:0]
HW_KEY[7:0]
INT
Output Drive Disable
Analog Voltage Input
Enable
ANA_IN_KEY[31:0]
INT_OE in INT_CFG[0]
ANA_IN_KEY[31:0]
ANA_IN_KEY[31:0]
The interrupts of the Si1141/42/43-M01 are controlled through the INT_CFG, IRQ_ENABLE, IRQ_MODE1,
IRQ_MODE2 and IRQ_STATUS registers.
The INT hardware pin is enabled through the INT_OE bit in the INT_CFG register. The hardware essentially
performs an AND function between the IRQ_ENABLE register and IRQ_STATUS register. After this AND function,
if any bits are set, the INT pin is asserted. The INT_MODE bit in the INT_CFG register is conceptually a method of
determining how the INT pin is deasserted. When INT_MODE = 0, the host is responsible for clearing the interrupt
by writing to the IRQ_STATUS register. When the specific bits of the IRQ_STATUS register is written with '1', that
specific IRQ_STATUS bit is cleared.
Typically, the host software is expected to read the IRQ_STATUS register, stores a local copy, and then writes the
same value back to the IRQ_STATUS to clear the interrupt source. Unless specifically stated, INT_MODE should
be zero for normal interrupt handling operation. In summary, the INT_CFG register is normally written with '1'.
The IRQ_MODE1, IRQ_MODE2 and IRQ_ENABLE registers work together to define how the internal sequencer
sets bits in the IRQ_STATUS register (and as a consequence, asserting the INT pin).
The PS1 interrupts are described in Table 10. The PS2 interrupts are described in Table 12. The PS3 interrupts are
described in Table 13. The ALS interrupts are described in Table 14, and the Command Interface interrupts are
described in Table 15.
28
Rev. 1.1
Si1141/42/43-M01
Table 11. PS1 Channel Interrupt Resources
IRQ_ENABLE[2] IRQ_MODE1[5:4]
PS1_IE
Description
PS1_IM[1:0]
0
0
0
No PS1 Interrupts
1
0
0
PS1_INT set after every PS1 sample
1
0
1
PS1_INT set whenever PS1 threshold (PS1_TH) is crossed
1
1
1
PS1_INT set whenever PS1 sample is above PS1 threshold (PS1_TH)
Note: There is hysteresis applied (PS_HYST) and history checking (PS_HISTORY). PS_HYST is encoded in 8-bit
compressed format. In the Si1141/42/43-M01, PS1_TH is also encoded in compressed format.
Table 12. PS2 Channel Interrupt Resources
IRQ_ENABLE[3] IRQ_MODE1[7:6]
PS2_IE
Description
PS2_IM[1:0]
0
0
0
No PS2 Interrupts
1
0
0
PS2_INT set after every PS2 sample
1
0
1
PS2_INT set whenever PS2 threshold (PS2_TH) is crossed
1
1
1
PS2_INT set when PS2 sample is above PS2 threshold (PS2_TH)
Note: There is hysteresis applied (PS_HYST) and history checking (PS_HISTORY). PS_HYST is encoded in 8-bit
compressed format. In the Si1141/42/43-M01, PS2_TH is also encoded in compressed format.
Table 13. PS3 Channel Interrupt Resources
IRQ_ENABLE[4] IRQ_MODE2[1:0]
PS3_IE
Description
PS3_IM[1:0]
0
0
0
No PS3 Interrupts
1
0
0
PS3_INT set after every PS3 sample
1
0
1
PS3_INT set whenever PS3 threshold (PS3_TH) is crossed
1
1
1
PS3_INT set whenever PS3 sample is above PS3 threshold (PS3_TH)
Note: There is hysteresis applied (PS_HYST) and history checking (PS_HISTORY). PS_HYST is encoded in 8-bit
compressed format. In the Si1141/42/43-M01, PS3_TH is also encoded in compressed format.
Rev. 1.1
29
Si1141/42/43-M01
Table 14. Ambient Light Sensing Interrupt Resources
IRQ_ENABLE[1:0]
IRQ_MODE1[2:0]
ALS_IE[1:0]
ALS_IM[2:0]
Description
0
0
0
0
0
No ALS Interrupts
0
1
0
0
0
ALS_INT [0] set after every ALS_VIS sample1
x
1
x
0
1
Monitors ALS_VIS, ALS_INT [0] upon exiting region
between low and high thresholds (ALS_LOW_TH and
ALS_HI_TH)
1
x
1
0
x
Monitors ALS_VIS, ALS_INT [1] set upon entering region
between low and high thresholds (ALS_LOW_TH and
ALS_HI_TH)
x
1
x
1
1
Monitors ALS_IR, ALS_INT [0] set upon exiting region
between low and high thresholds (ALS_LOW_TH and
ALS_HI_TH)
1
x
1
1
x
Monitors ALS_IR, ALS_INT [1] set upon entering region
between low and high thresholds (ALS_LOW_TH and
ALS_HI_TH)
Notes:
1. For ALS_IR channel, interrupts per sample is not possible without also enabling ALS_VIS
2. All other combinations are invalid and may result in unintended operation
3. There is hysteresis applied (ALS_TH) and history checking (ALS_HISTORY). ALS_HYST is encoded in 8-bit
compressed format.
4. In the Si1141/42/43-M01, ALS_LOW_TH and ALS_HI_TH are also encoded in compressed format.
Table 15. Command Interrupt Resources
IRQ_ENABLE[5]
IRQ_MODE2[3:2]
CMD_IE
CMD_IM[1:0]
Description
30
0
x
0
No CMD Interrupts
1
x
0
CMD_INT set when there is a new RESPONSE
1
x
1
CMD_INT set when there is a new error code in
RESPONSE
Rev. 1.1
Si1141/42/43-M01
4.4. Signal Path Software Model
The following diagram gives an overview of the signal paths, along with the I2C register and RAM Parameter bit
fields that control them. Sections with detailed descriptions of the I2C registers and Parameter RAM follow.
5
4
3
2
PS1_ADCMUX
ADC_OFFSET
D
Vdd
Analog
Range
Gain
Recov. time
Rate
Align
Select
0
2
3
6 Out
0x25
0x65
0x75
Ref.
1
PS1_ALIGN
PS_RATE
PS_ADC_REC
PS_ADC_GAIN
PS_RANGE
Offset
Sum
Digital
16
PS1_DATA
In
D
Enable
EN_PS1
GND
PS2_ALIGN
PS_RATE
PS_ADC_REC
PS_ADC_GAIN
PS_RANGE
PS2_ADCMUX
ADC_OFFSET
Ref.
Vdd
Analog
Range
Gain
Recov. time
Rate
Align
Select
0
2
3
6 Out
0x25
0x65
0x75
Offset
Sum
Digital
16
PS2_DATA
In
Enable
EN_PS2
GND
PS3_ALIGN
PS_RATE
PS_ADC_REC
PS_ADC_GAIN
PS_RANGE
PS3_ADCMUX
C
C
ADC_OFFSET
Ref.
Large IR
Vdd
Analog
Range
Gain
Recov. time
Rate
Align
Select
0
2
3
6 Out
0x25
0x65
0x75
Offset
Sum
Digital
16
PS3_DATA
In
Enable
EN_PS3
GND
ALS_VIS_ALIGN
ALS_RATE
ALS_VIS_ADC_REC
ALS_VIS_ADC_GAIN
VIS_RANGE
GND
B
Analog
Range
Gain
Recov. time
Rate
Align
ADC_OFFSET
Offset
Sum
Digital
16
ALS_VIS_DATA
B
In
Enable
Small visible
EN_ALS_VIS
ALS_IR_ALIGN
ALS_RATE
ALS_IR_ADC_REC
ALS_IR_ADC_GAIN
IR_RANGE
GND
ALS_IR_ADCMUX
0
Out
Analog
3
Range
Gain
Recov. time
Rate
Align
ADC_OFFSET
Select
Offset
Sum
Digital
16
ALS_IR_DATA
In
Enable
EN_ALS_IR
Small IR
AUX_ADCMUX
A
A
ADC_OFFSET
GND
Offset
Select
Sum
0x65
Temperature
sensor
Out
Vdd
Analog
Digital
16
16
AUX_DATA
In
0x75
Enable
EN_AUX
5
4
3
2
1
Figure 19. Signal Path Programming Model
Rev. 1.1
31
Si1141/42/43-M01
4.5. I2C Registers
Table 16. I2C Register Summary
I2C Register
Name
Address
PART_ID
0x00
PART_ID
REV_ID
0x01
REV_ID
SEQ_ID
0x02
SEQ_ID
INT_CFG
0x03
IRQ_ENABLE
0x04
IRQ_MODE1
0x05
IRQ_MODE2
0x06
HW_KEY
0x07
HW_KEY
MEAS_RATE
0x08
MEAS_RATE
ALS_RATE
0x09
ALS_RATE
PS_RATE
0x0A
PS_RATE
ALS_LOW_TH0
0x0B
ALS_LOW_TH0
ALS_LOW_TH1
0x0C
ALS_LOW_TH1
ALS_HI_TH0
0x0D
ALS_HI_TH0
ALS_HI_TH1
0x0E
ALS_HI_TH1
PS_LED21
0x0F
PS_LED3
0x10
PS1_TH0
0x11
PS1_TH0
PS1_TH1
0x12
PS1_TH1
PS2_TH0
0x13
PS2_TH0
PS2_TH1
0x14
PS2_TH1
PS3_TH0
0x15
PS3_TH0
PS3_TH1
0x16
PS3_TH1
PARAM_WR
0x17
PARAM_WR
COMMAND
0x18
COMMAND
RESPONSE
0x20
RESPONSE
32
7
6
5
4
3
2
1
0
INT_MODE INT_OE
CMD_IE
PS2_IM
PS3_IE
PS2_IE
PS1_IE
PS1_IM
ALS_IE
ALS_IM
CMD_IM
LED2_I
PS3_IM
LED1_I
LED3_I
Rev. 1.1
Si1141/42/43-M01
Table 16. I2C Register Summary (Continued)
I2C Register
Name
Address
IRQ_STATUS
0x21
ALS_VIS_DATA0
0x22
ALS_VIS_DATA0
ALS_VIS_DATA1
0x23
ALS_VIS_DATA1
ALS_IR_DATA0
0x24
ALS_IR_DATA0
ALS_IR_DATA1
0x25
ALS_IR_DATA1
PS1_DATA0
0x26
PS1_DATA0
PS1_DATA1
0x27
PS1_DATA1
PS2_DATA0
0x28
PS2_DATA0
PS2_DATA1
0x29
PS2_DATA1
PS3_DATA0
0x2A
PS3_DATA0
PS3_DATA1
0x2B
PS3_DATA1
AUX_DATA0
0x2C
AUX_DATA0
AUX_DATA1
0x2D
AUX_DATA1
PARAM_RD
0x2E
PARAM_RD
CHIP_STAT
0x30
ANA_IN_KEY
0x3B–
0x3E
7
6
5
4
3
2
CMD_INT PS3_INT PS2_INT PS1_INT
RUNNING
1
0
ALS_INT
SUSPEND
SLEEP
ANA_IN_KEY
Rev. 1.1
33
Si1141/42/43-M01
PART_ID @ 0x00
Bit
7
6
5
4
Name
PART_ID
Type
R
3
2
1
0
3
2
1
0
3
2
1
0
Reset value = 0100 0011 (Si1143)
REV_ID @ 0x1
Bit
7
6
5
4
Name
REV_ID
Type
R
Reset value = 0000 0000
SEQ_ID @ 0x02
Bit
7
6
5
4
Name
SEQ_ID
Type
R
Reset value = 0000 1000
Bit
7:0
Name
SEQ_ID
Function
Sequencer Revision.
0x09
34
Si1141/42/43-M01 (MAJOR_SEQ = 1, MINOR_SEQ = 1)
Rev. 1.1
Si1141/42/43-M01
INT_CFG @ 0x03
Bit
7
6
5
4
3
2
1
0
Name
INT_MODE
INT_OE
Type
RW
RW
Reset value = 0000 0000
Bit
Name
7:2
Reserved
1
INT_MODE
Function
Reserved.
Interrupt Mode.
The INT_MODE describes how the bits in the IRQ_STATUS Registers are cleared.
0: The IRQ_STATUS Register bits are set by the internal sequencer and are sticky. It
is the host's responsibility to clear the interrupt status bits in the IRQ_STATUS register
to clear the interrupt.
1: If the Parameter Field PSx_IM = 11, the internal sequencer clears the INT pin automatically.
0
INT_OE
INT Output Enable.
INT_OE controls the INT pin drive
0: INT pin is never driven
1: INT pin driven low whenever an IRQ_STATUS and its corresponding IRQ_ENABLE
bits match
Rev. 1.1
35
Si1141/42/43-M01
IRQ_ENABLE @ 0x04
Bit
7
6
5
4
3
2
1
0
Name
CMD_IE
PS3_IE
PS2_IE
PS1_IE
ALS_IE
Type
RW
RW
RW
RW
RW
Reset value = 0000 0000
Bit
Name
Function
7:6
Reserved
Reserved.
5
CMD_IE
Command Interrupt Enable.
Enables interrupts based on COMMAND/RESPONSE activity.
0: INT never asserts due to COMMAND/RESPONSE interface activity.
1: Assert INT pin whenever CMD_INT is set by the internal sequencer.
4
PS3_IE
PS3 Interrupt Enable.
Enables interrupts based on PS3 Channel Activity.
0: INT never asserts due to PS3 Channel activity.
1: Assert INT pin whenever PS3_INT is set by the internal sequencer.
3
PS2_IE
PS2 Interrupt Enable.
Enables interrupts based on PS2 Channel Activity.
0: INT never asserts due to PS2 Channel activity.
1: Assert INT pin whenever PS2_INT is set by the internal sequencer.
2
PS1_IE
PS1 Interrupt Enable.
Enables interrupts based on PS1 Channel Activity.
0: INT never asserts due to PS1 Channel activity.
1: Assert INT pin whenever PS1_INT is set by the internal sequencer.
1:0
ALS_IE
ALS Interrupt Enable.
Enables interrupts based on ALS Activity.
00: INT never asserts due to ALS activity.
1x: Assert INT pin whenever ALS_INT[1] bit is set by the internal sequencer.
x1: Assert INT pin whenever ALS_INT[0] is set by the internal sequencer.
36
Rev. 1.1
Si1141/42/43-M01
IRQ_MODE1 @ 0x05
Bit
7
6
5
4
3
2
1
Name
PS2_IM
PS1_IM
ALS_IM
Type
RW
RW
RW
0
Reset value = 0000 0000
Bit
Name
Function
7:6
PS2_IM
PS2 Interrupt Mode applies only when PS2_IE is also set.
00: PS2_INT is set whenever a PS2 measurement has completed.
01: PS2_INT is set whenever the current PS2 measurement crosses the PS2_TH
threshold.
11: PS2_INT is set whenever the current PS2 measurement is greater than the
PS2_TH threshold.
5:4
PS1_IM
PS1 Interrupt Mode applies only when PS1_IE is also set.
00: PS1_INT is set whenever a PS1 measurement has completed.
01: PS1_INT is set whenever the current PS1 measurement crosses the PS1_TH
threshold.
11: PS1_INT is set whenever the current PS1 measurement is greater than the
PS1_TH threshold.
3
Reserved
2:0
ALS_IM
Reserved.
ALS Interrupt Mode function is defined in conjunction with ALS_IE[1:0].
ALS_IE[1:0] / ALS_IM[2:0]:
00 / 000: Neither ALS_INT[1] nor ALS_INT[0] is ever set.
01 / 000: ALS_INT[0] sets after every ALS_VIS sample.
x1 / x01: Monitors ALS_VIS channel, ALS_INT[0] asserts if measurement exits window
between ALS_LOW_TH and ALS_HIGH_TH.
x1 / x11: Monitors ALS_IR channel, ALS_INT[0] asserts if measurement exits window
between ALS_LOW_TH and ALS_HIGH_TH.
1x /10x: Monitors ALS_VIS channel, ALS_INT[1] asserts if measurement enters window between ALS_LOW_TH and ALS_HIGH_TH.
1x /11x: Monitors ALS_IR channel, ALS_INT[1] asserts if measurement enters window
between ALS_LOW_TH and ALS_HIGH_TH.
Note: The ALS_IM description apples only to sequencer revisions A03 or later.
Rev. 1.1
37
Si1141/42/43-M01
IRQ_MODE2 @ 0x06
Bit
7
6
5
4
3
2
1
0
Name
CMD_IM
PS3_IM
Type
RW
RW
Reset value = 0000 0000
Bit
Name
Function
7:4
Reserved Reserved.
3:2
CMD_IM Command Interrupt Mode applies only when CMD_IE is also set.
00: CMD_INT is set whenever the RESPONSE register is written.
01: CMD_INT is set whenever the RESPONSE register is written with an error code (MSB
set).
1x: Reserved.
1:0
PS3_IM
PS3 Interrupt Mode applies only when PS3_IE is also set.
00: PS3_INT is set whenever a PS3 measurement has completed.
01: PS3_INT is set whenever the current PS3 measurement crosses the PS3_TH threshold.
11: PS3_INT is set whenever the current PS3 measurement is greater than the PS3_TH
threshold.
HW_KEY @ 0x07
Bit
7
6
5
4
3
Name
HW_KEY
Type
RW
2
1
0
Reset value = 0000 0000
38
Bit
Name
7:0
HW_KEY
Function
The system must write the value 0x17 to this register for proper Si1141/42/43-M01
operation.
Rev. 1.1
Si1141/42/43-M01
MEAS_RATE @ 0x08
Bit
7
6
5
4
3
Name
MEAS_RATE
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
MEAS_RATE MEAS_RATE is an 8-bit compressed value representing a 16-bit integer. The
uncompressed 16-bit value, when multiplied by 31.25 us, represents the time duration between wake-up periods where measurements are made.
Example Values:
0x00: Turns off any internal oscillator and disables autonomous measurement. Use
this setting to achieve lowest VDD current draw for systems making use of only
forced measurements.
0x01-0x17: These values are not allowed.
0x84: The device wakes up every 10 ms (0x140 x 31.25 µs)
0x94: The device wakes up every 20 ms (0x280 x 31.25 µs)
0xB9: The device wakes up every 100 ms (0x0C80 x 31.25 µs)
0xDF: The device wakes up every 496 ms (0x3E00 x 31.25 µs)
0xFF: The device wakes up every 1.984 seconds (0xF800 x 31.25 µs)
Please refer to “AN498: Si114x Designer's Guide”, Section 5.4 “Compression
Concept”.
Rev. 1.1
39
Si1141/42/43-M01
ALS_RATE @ 0x09
Bit
7
6
5
4
3
Name
ALS_RATE
Type
RW
2
1
0
Reset value = 0000 0000
40
Bit
Name
Function
7:0
ALS_RATE
ALS_RATE is an 8-bit compressed value representing a 16-bit multiplier. This multiplier, in conjunction with the MEAS_RATE time, represents how often ALS Measurements are made. For a given ALS measurement period, MEAS_RATE should be as
high as possible and ALS_RATE as low as possible in order to optimize power consumption.
Example Values:
0x00: Autonomous ALS Measurements are not made.
0x08: ALS Measurements made every time the device wakes up.
(0x0001 x timeValueOf(MEAS_RATE))
0x32: ALS Measurements made every 10 times the device wakes up.
(0x000A x timeValueOf(MEAS_RATE)
0x69: ALS Measurements made every 100 times the device wakes up.
(0x0064 x timeValueOf(MEAS_RATE)
Please refer to “AN498: Si114x Designer's Guide”, Section 5.4 “Compression
Concept”.
Rev. 1.1
Si1141/42/43-M01
PS_RATE @ 0x0A
Bit
7
6
5
4
3
Name
PS_RATE
Type
RW
2
1
0
Reset value = 0000 0000
Bit
Name
Function
7:0
PS_RATE
PS_RATE is an 8-bit compressed value representing a 16-bit multiplier. This multiplier,
in conjunction with the MEAS_RATE time, represents how often PS Measurements are
made. For a given proximity measurement period, MEAS_RATE should be as high as
possible and PS_RATE as low as possible in order to optimize power consumption.
Example Values:
0x00: Autonomous PS Measurements are not made
0x08: PS Measurements made every time the device wakes up
(0x0001 x timeValueOf(MEAS_RATE))
0x32: PS Measurements made every 10 times the device wakes up
(0x000A x timeValueOf(MEAS_RATE)
0x69: PS Measurements made every 100 times the device wakes up
(0x0064 x timeValueOf(MEAS_RATE)
Please refer to “AN498: Si114x Designer's Guide”, Section 5.4 “Compression Concept”.
ALS_LOW_TH0: ALS_LOW_TH Data Word Low Byte @ 0x0B
Bit
7
6
5
4
3
2
Name
ALS_LOW_TH[7:0]
Type
RW
1
0
Reset value = 0000 0000
Bit
Name
Function
7:0
ALS_LOW_TH[7:0]
ALS_LOW_TH is a 16-bit threshold value. When used in conjunction with
ALS_HI_TH, it forms a window region applied to either ALS_VIS or ALS_IR
measurements for interrupting the host. Once autonomous measurements have
started, modification to ALS_LOW_TH should be preceded by an ALS_PAUSE or
PSALS_PAUSE command. For revisions A10 and below, ALS_LOW_TH uses an 8bit compressed format. Refer to “AN498: Si114x Designer's Guide”, Section 5.4
“Compression Concept”.
Rev. 1.1
41
Si1141/42/43-M01
ALS_LOW_TH1:ALS_LOW_TH Data Word High Byte @ 0x0C
Bit
7
6
5
4
3
Name
ALS_LOW_TH[15:8]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
ALS_LOW_TH[15:8] ALS_LOW_TH is a 16-bit threshold value. When used in conjunction with
ALS_HI_TH, it forms a window region applied to either ALS_VIS or ALS_IR
measurements for interrupting the host. Once autonomous measurements
have started, modification to ALS_LOW_TH should be preceded by an
ALS_PAUSE or PSALS_PAUSE command. For revisions A10 and below,
ALS_LOW_TH uses an 8-bit compressed format. Refer to “AN498: Si114x
Designer's Guide”, Section 5.4 “Compression Concept”.
ALS_HI_TH0: ALS_HI_TH Data Word Low Byte @ 0x0D
Bit
7
6
5
4
3
Name
ALS_HI_TH[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
ALS_HI_TH[7:0] ALS_HI_TH is a 16-bit threshold value. When used in conjunction with
ALS_LOW_TH, it forms a window region applied to either ALS_VIS or ALS_IR measurements for interrupting the host. Once autonomous measurements have started,
modification to ALS_HI_TH should be preceded by an ALS_PAUSE or
PSALS_PAUSE command. For revisions A10 and below, ALS_HI_TH uses an 8-bit
compressed format. Refer to “AN498: Si114x Designer's Guide”, Section 5.4 “Compression Concept”.
Note: This register available for sequencer revisions A03 or later.
ALS_HI_TH1: ALS_HI_TH Data Word High Byte @ 0x0E
Bit
7
6
5
4
Name
ALS_HI_TH[15:8]
Type
RW
Reset value = 0000 0000
42
3
Rev. 1.1
2
1
0
Si1141/42/43-M01
Bit
7:0
Name
Function
ALS_HI_TH[15:8] ALS_HI_TH is a 16-bit threshold value. When used in conjunction with
ALS_LOW_TH, it forms a window region applied to either ALS_VIS or ALS_IR
measurements for interrupting the host. Once autonomous measurements have
started, modification to ALS_HI_TH should be preceded by an ALS_PAUSE or
PSALS_PAUSE command. For revisions A10 and below, ALS_HI_TH uses an 8-bit
compressed format. Refer to “AN498: Si114x Designer's Guide” Section 5.4 “Compression Concept”.
PS_LED21 @ 0x0F
Bit
7
6
5
4
3
2
1
Name
LED2_I
LED1_I
Type
RW
RW
0
Reset value = 0000 0000
Bit
Name
Function
7:4
LED2_I
LED2_I Represents the irLED current sunk by the LED2 pin during a PS measurement.
3:0
LED1_1
LED1_I Represents the irLED current sunk by the LED1 pin during a PS measurement.
LED3_I, LED2_I, and LED1_I current encoded as follows:
0000: No current
0001: Minimum current
1111: Maximum current
Refer to Table 2, “Performance Characteristics1,” on page 5 for LED current values.
PS_LED3 @ 0x10
Bit
7
6
5
4
3
2
1
Name
LED3_I
Type
RW
0
Reset value = 0000 0000
Bit
Name
7:4
Reserved
3:0
LED3_I
Function
Reserved.
LED3_I Represents the irLED current sunk by the LED3 pin during a PS measurement. See PS_LED21 Register for additional details.
Rev. 1.1
43
Si1141/42/43-M01
PS1_TH0: PS1_TH Data Word Low Byte @ 0x11
Bit
7
6
5
4
3
Name
PS1_TH[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
Name
7:0
Function
PS1_TH[7:0] PS1_TH is a 16-bit threshold value. It is compared to PS1 measurements during
autonomous operation for interrupting the host. If the threshold register is updated
while a measurement is in progress, it is possible that an invalid threshold will be
applied if the first new threshold byte has been written and not the second. Remedies
include ensuring no measurement during threshold updates and discarding measurements results immediately after threshold updates.Once autonomous measurements
have started, modification to PS1_TH should be preceded by a PS_PAUSE or
PSALS_PAUSE command. For Si1141/42/43-M01 revision A10 and below, PS1_TH
uses an 8-bit compressed format at address 0x11. Refer to “AN498: Si114x
Designer's Guide”, Section 5.4 “Compression Concept”.
PS1_TH1: PS1_TH Data Word High Byte @ 0x12
Bit
7
6
5
4
3
Name
PS1_TH[15:8]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
44
Name
Function
PS1_TH[15:8] PS1_TH is a 16-bit threshold value. It is compared to PS1 measurements during autonomous operation for interrupting the host. If the threshold register is updated while a
measurement is in progress, it is possible that an invalid threshold will be applied if the
first new threshold byte has been written and not the second. Remedies include ensuring no measurement during threshold updates and discarding measurements results
immediately after threshold updates. Once autonomous measurements have started,
modification to PS1_TH should be preceded by a PS_PAUSE or PSALS_PAUSE command. For Si1141/42/43-M01 revision A10 and below, PS1_TH uses an 8-bit compressed format at address 0x11. Refer to “AN498: Si114x Designer's Guide”, Section
5.4 “Compression Concept”.
Rev. 1.1
Si1141/42/43-M01
PS2_TH0: PS2_TH Data Word Low Byte @ 0x13
Bit
7
6
5
4
3
Name
PS2_TH[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
PS2_TH[7:0] PS2_TH is a 16-bit threshold value. It is compared to PS2 measurements during
autonomous operation for interrupting the host. If the threshold register is updated
while a measurement is in progress, it is possible that an invalid threshold will be
applied if the first new threshold byte has been written and not the second. Remedies
include ensuring no measurement during threshold updates and discarding measurements results immediately after threshold updates. Once autonomous measurements
have started, modification to PS2_TH should be preceded by a PS_PAUSE or
PSALS_PAUSE command. For Si1141/42/43-M01 revision A10 and below, PS2_TH
uses an 8-bit compressed format at address 0x13. Refer to “AN498: Si114x
Designer's Guide” Section 5.4 “Compression Concept”.
PS2_TH1: PS2_TH Data Word High Byte @ 0x14
Bit
7
6
5
4
3
Name
PS2_TH[15:8]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
PS2_TH[15:8] PS2_TH is a 16-bit threshold value. It is compared to PS2 measurements during
autonomous operation for interrupting the host. If the threshold register is updated
while a measurement is in progress, it is possible that an invalid threshold will be
applied if the first new threshold byte has been written and not the second. Remedies
include ensuring no measurement during threshold updates and discarding measurements results immediately after threshold updates.Once autonomous measurements
have started, modification to PS2_TH should be preceded by a PS_PAUSE or
PSALS_PAUSE command. For Si1141/42/43-M01 revision A10 and below, PS2_TH
uses an 8-bit compressed format at address 0x13. Refer to “AN498: Si114x Designer's
Guide”, Section 5.4 “Compression Concept”.
Rev. 1.1
45
Si1141/42/43-M01
PS3_TH0: PS3_TH Data Word Low Byte @ 0x15
Bit
7
6
5
4
3
Name
PS3_TH[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
Name
Function
7:0
PS3_TH[7:0]
PS3_TH is a 16-bit threshold value. It is compared to PS3 measurements during
autonomous operation for interrupting the host. If the threshold register is updated
while a measurement is in progress, it is possible that an invalid threshold will be
applied if the first new threshold byte has been written and not the second. Remedies
include ensuring no measurement during threshold updates and discarding measurements results immediately after threshold updates.Once autonomous measurements
have started, modification to PS3_TH should be preceded by a PS_PAUSE or
PSALS_PAUSE command. For Si1141/42/43-M01 revision A10 and below, PS3_TH
uses an 8-bit compressed format at address 0x15. Refer to “AN498: Si114x
Designer's Guide”, Section 5.4 “Compression Concept”.
PS3_TH1: PS3_TH Data Word High Byte @ 0x16
Bit
7
6
5
4
3
Name
PS3_TH[15:8]
Type
RW
2
1
0
Reset value = 0000 0000
46
Bit
Name
Function
7:0
PS3_TH[15:8]
PS3_TH is a 16-bit threshold value. It is compared to PS3 measurements during
autonomous operation for interrupting the host. If the threshold register is updated
while a measurement is in progress, it is possible that an invalid threshold will be
applied if the first new threshold byte has been written and not the second. Remedies include ensuring no measurement during threshold updates and discarding
measurements results immediately after threshold updates.Once autonomous measurements have started, modification to PS3_TH should be preceded by a
PS_PAUSE or PSALS_PAUSE command. For Si1141/42/43-M01 revision A10 and
below, PS3_TH uses an 8-bit compressed format at address 0x15. Refer to “AN498:
Si114x Designer's Guide”, Section 5.4 “Compression Concept”.
Rev. 1.1
Si1141/42/43-M01
PARAM_WR @ 0x17
Bit
7
6
5
4
3
Name
PARAM_WR
Type
RW
2
1
0
Reset value = 0000 0000
Bit
Name
7:0
Function
PARAM_WR Mailbox register for passing parameters from the host to the sequencer.
COMMAND @ 0x18
Bit
7
6
5
4
3
Name
COMMAND
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
COMMAND COMMAND Register.
The COMMAND Register is the primary mailbox register into the internal sequencer.
Writing to the COMMAND register is the only I2C operation that wakes the device from
standby mode.
Rev. 1.1
47
Si1141/42/43-M01
RESPONSE @ 0x20
Bit
7
6
5
4
3
Name
RESPONSE
Type
RW
2
1
0
Reset value = 0000 0000
48
Bit
Name
Function
7:0
RESPONSE
The Response register is used in conjunction with command processing. When an error
is encountered, the response register will be loaded with an error code. All error codes
will have the MSB is set.
The error code is retained until a RESET or NOP command is received by the
sequencer. Other commands other than RESET or NOP will be ignored. However, any
autonomous operation in progress continues normal operation despite any error.
0x00–0x0F: No Error. Bits 3:0 form an incrementing roll-over counter. The roll over
counter in bit 3:0 increments when a command has been executed by the Si1141/42/43M01. Once autonomous measurements have started, the execution timing of any command becomes non-deterministic since a measurement could be in progress when the
COMMAND register is written. The host software must make use of the rollover counter
to ensure that commands are processed.
0x80: Invalid Command Encountered during command processing
0x88: ADC Overflow encountered during PS1 measurement
0x89: ADC Overflow encountered during PS2 measurement
0x8A: ADC Overflow encountered during PS3 measurement
0x8C: ADC Overflow encountered during ALS-VIS measurement
0x8D: ADC Overflow encountered during ALS-IR measurement
0x8E: ADC Overflow encountered during AUX measurement
Rev. 1.1
Si1141/42/43-M01
IRQ_STATUS @ 0x21
Bit
7
6
5
4
3
2
1
0
Name
CMD_INT
PS3_INT
PS2_INT
PS1_INT
ALS_INT
Type
RW
RW
RW
RW
RW
Reset value = 0000 0000
Bit
Name
Function
7:6
Reserved
Reserved.
5
CMD_INT
Command Interrupt Status.
4
PS3_INT
PS3 Interrupt Status.
3
PS2_INT
PS3 Interrupt Status.
2
PS1_INT
PS1 Interrupt Status.
1:0
ALS_INT
ALS Interrupt Status. (Refer to Table 13 for encoding.)
Notes:
1. If the corresponding IRQ_ENABLE bit is also set when the IRQ_STATUS bit is set, the INT pin is asserted.
2. When INT_MODE = 0, the host must write '1' to the corresponding XXX_INT bit to clear the interrupt.
3. When INT_MODE = 1, the internal sequencer clears all the XXX_INT bits (and INT pin) automatically unless used with
PS (Parameter Field PSx_IM = 11). Use of INT_MODE = 0 is recommended.
ALS_VIS_DATA0: ALS_VIS_DATA Data Word Low Byte @ 0x22
Bit
7
6
5
4
3
Name
ALS_VIS_DATA[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
ALS_VIS_DATA[7:0] ALS VIS Data LSB. Once autonomous measurements have started, this register must be read after INT has asserted but before the next measurement is
made. Refer to AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt
Latency."
Rev. 1.1
49
Si1141/42/43-M01
ALS_VIS_DATA1: ALS_VIS_DATA Data Word High Byte @ 0x23
Bit
7
6
5
4
3
Name
ALS_VIS_DATA[15:8]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
ALS_VIS_DATA[15:8] ALS VIS Data MSB. Once autonomous measurements have started, this register must be read after INT has asserted but before the next measurement is
made. Refer to AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt
Latency."
ALS_IR_DATA0: ALS_IR_DATA Data Word Low Byte@ 0x24
Bit
7
6
5
4
3
Name
ALS_IR_DATA[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
ALS_IR_DATA[7:0] ALS IR Data LSB. Once autonomous measurements have started, this register
must be read after INT has asserted but before the next measurement is made.
Refer to AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt Latency."
ALS_IR_DATA1: ALS_IR_DATA Data Word High Byte @ 0x25
Bit
7
6
5
4
3
Name
ALS_IR_DATA[15:8]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
50
Name
Function
ALS_IR_DATA[15:8] ALS IR Data MSB. Once autonomous measurements have started, this register
must be read after INT has asserted but before the next measurement is made.
Refer to AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt Latency."
Rev. 1.1
Si1141/42/43-M01
PS1_DATA0: PS1_DATA Data Word Low Byte @ 0x26
Bit
7
6
5
4
3
Name
PS1_DATA[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
PS1_DATA[7:0] PS1 Data LSB. Once autonomous measurements have started, this register must be
read after INT has asserted but before the next measurement is made. Refer to
AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt Latency."
PS1_DATA1: PS1_DATA Data Word High Byte @ 0x27
Bit
7
6
5
4
3
Name
PS1_DATA[15:8]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
PS1_DATA[15:8] PS1 Data MSB. Once autonomous measurements have started, this register must
be read after INT has asserted but before the next measurement is made. Refer to
AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt Latency."
PS2_DATA0: PS2_DATA Data Word Low Byte @ 0x28
Bit
7
6
5
4
3
Name
PS2_DATA[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
PS2_DATA[7:0] PS2 Data LSB. Once autonomous measurements have started, this register must be
read after INT has asserted but before the next measurement is made. Refer to
AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt Latency."
Rev. 1.1
51
Si1141/42/43-M01
PS2_DATA1: PS2_DATA Data Word High Byte @ 0x29
Bit
7
6
5
4
3
Name
PS2_DATA[15:8]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
Name
7:0
Function
PS2_DATA[15:8] PS2 Data MSB. Once autonomous measurements have started, this register must
be read after INT has asserted but before the next measurement is made. Refer to
AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt Latency."
PS3_DATA0: PS3_DATA Data Word Low Byte @ 0x2A
Bit
7
6
5
4
3
Name
PS3_DATA[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
Name
7:0
Function
PS3_DATA[7:0] PS3 Data LSB. Once autonomous measurements have started, this register must be
read after INT has asserted but before the next measurement is made. Refer to
AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt Latency."
PS3_DATA1: PS3_DATA Data Word High Byte @ 0x2B
Bit
7
6
5
4
3
Name
PS3_DATA[15:8]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
52
Name
Function
PS3_DATA[15:8] PS3 Data MSB. Once autonomous measurements have started, this register must
be read after INT has asserted but before the next measurement is made. Refer to
AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt Latency."
Rev. 1.1
Si1141/42/43-M01
AUX_DATA0: AUX_DATA Data Word Low Byte @ 0x2C
Bit
7
6
5
4
3
Name
AUX_DATA[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
AUX_DATA[7:0] AUX Data LSB. Once autonomous measurements have started, this register must be
read after INT has asserted but before the next measurement is made. Refer to
AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt Latency."
AUX_DATA1: AUX_DATA Data Word High Byte @ 0x2D
Bit
7
6
5
4
3
Name
AUX_DATA[15:8]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
AUX_DATA[15:8] AUX Data MSB. Once autonomous measurements have started, this register
must be read after INT has asserted but before the next measurement is made.
Refer to AN498 "Designer's Guide" Section 5.6.2 "Host Interrupt Latency."
PARAM_RD @ 0x2E
Bit
7
6
5
4
3
Name
PARAM_RD
Type
RW
2
1
0
Reset value = 0000 0000
Bit
Name
7:0
PARAM_RD
Function
Mailbox register for passing parameters from the sequencer to the host.
Rev. 1.1
53
Si1141/42/43-M01
CHIP_STAT @ 0x30
Bit
7
6
5
4
3
2
1
0
Name
RUNNING
SUSPEND
SLEEP
Type
R
R
R
Reset value = 0000 0000
Bit
Name
Function
7:3
Reserved
Reserved
2
RUNNING
Device is awake.
1
SUSPEND
Device is in a low-power state, waiting for a measurement to complete.
0
SLEEP
Device is in its lowest power state.
ANA_IN_KEY @ 0x3B to 0x3E
Bit
7
6
5
4
3
2
0x3B
ANA_IN_KEY[31:24]
0x3C
ANA_IN_KEY[23:16]
0x3D
ANA_IN_KEY[15:8]
0x3E
ANA_IN_KEY[7:0]
Type
RW
Reset value = 0000 0000
54
Bit
Name
31:0
ANA_IN_KEY[31:0]
Function
Reserved.
Rev. 1.1
1
0
Si1141/42/43-M01
4.6. Parameter RAM
Parameters are located in internal memory and are not directly addressable over I2C. They must be indirectly
accessed using the PARAM_QUERY and PARAM_SET Commands described in "4.2. Command Protocol" on
page 23.
Table 17. Parameter RAM Summary Table
Parameter Name
Offset
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
I2C_ADDR
0x00
CHLIST
0x01
—
EN_AUX EN_ALS_IR EN_ALS_
VIS
—
PSLED12_SELECT
0x02
—
PS2_LED
—
PSLED3_SELECT
0x03
Reserved
0x04
PS_ENCODING
0x05
ALS_ENCODING
0x06
PS1_ADCMUX
0x07
PS1 ADC Input Selection
PS2_ADCMUX
0x08
PS2 ADC Input Selection
PS3_ADCMUX
0x09
PS3 ADC Input Selection
PS_ADC_COUNTER
0x0A
PS_ADC_GAIN
0x0B
PS_ADC_MISC
0x0C
Reserved
0x0D
Reserved (do not modify from default setting of 0x02)
ALS_IR_ADCMUX
0x0E
ALS_IR_ADCMUX
AUX_ADCMUX
0x0F
AUX ADC Input Selection
ALS_VIS_ADC_COUNTER
0x10
ALS_VIS_ADC_GAIN
0x11
ALS_VIS_ADC_MISC
0x12
Reserved
0x13
Reserved (do not modify from default setting of 0x40)
Reserved
0x14–
0x15
Reserved (do not modify from default setting of 0x00)
ALS_HYST
0x16
ALS Hysteresis
PS_HYST
0x17
PS Hysteresis
PS_HISTORY
0x18
PS History Setting
Bit 0
I2C Address
EN_PS3
EN_PS EN_P
2
S1
PS1_LED
—
PS3_LED
Reserved (always set to 0)
—
PS3_ALI PS2_ALIGN PS1_ALIG
GN
N
—
Reserved (always set to 0)
ALS_IR_ALI ALS_VIS_
GN
ALIGN
—
Reserved (always set to 0)
PS_ADC_REC
Reserved (always set to 0)
—
—
PS_ADC_GAIN
PS_RANGE
—
—
PS_ADC_MODE
VIS_ADC_REC
Reserved (always set to 0)
—
Reserved
(always set to 0)
VIS_RANG
E
Rev. 1.1
—
ALS_VIS_ADC_GAIN
Reserved (always set to 0)
55
Si1141/42/43-M01
Table 17. Parameter RAM Summary Table (Continued)
Parameter Name
Offset
ALS_HISTORY
0x19
ALS History Setting
ADC_OFFSET
0x1A
ADC Offset
Reserved
0x1B
Reserved (do not modify from default setting of 0x00)
LED_REC
0x1C
LED recovery time
ALS_IR_ADC_COUNTER
0x1D
ALS_IR_ADC_GAIN
0x1E
ALS_IR_ADC_MISC
0x1F
56
Bit 7
Bit 6
Bit 5
—
IR_ADC_REC
—
Reserved
(always set to 0)
Bit 4
IR_RANGE
Rev. 1.1
Bit 3
Bit 2
Bit 1
Bit 0
Reserved (always set to 0)
ALS_IR_ADC_GAIN
Reserved (always set to 0)
Si1141/42/43-M01
I2C @ 0x00
Bit
7
6
5
4
3
Name
I2C Address[7:0]
Type
RW
2
1
0
Reset value = 0000 0000
Bit
7:0
Name
Function
2
2
I C Address[7:0] Specifies a new I C Address for the device to respond to. The new address takes
effect when a BUSADDR command is received.
CHLIST @ 0x01
Bit
7
Name
6
EN_AUX
Type
5
4
3
EN_ALS_IR EN_ALS_VIS
RW
2
1
0
EN_PS3
EN_PS2
EN_PS1
RW
Reset value = 0000 0000
Bit
Name
7
Reserved
6
EN_AUX
5
EN_ALS_IR
4
Function
Enables Auxiliary Channel, data stored in AUX_DATA1[7:0] and AUX_DATA0[7:0].
Enables ALS IR Channel, data stored in ALS_IR_DATA1[7:0] and ALS_IR_DATA0[7:0].
EN_ALS_VIS Enables ALS Visible Channel, data stored in ALS_VIS_DATA1[7:0] and ALS_VIS_DATA0[7:0].
3
Reserved
2
EN_PS3
Enables PS Channel 3, data stored in PS3_DATA1[7:0] and PS3_DATA0[7:0].
1
EN_PS2
Enables PS Channel 2, data stored in PS2_DATA1[7:0] and PS2_DATA0[7:0].
0
EN_PS1
Enables PS Channel 1, data stored in PS1_DATA1[7:0] and PS1_DATA0[7:0].
Note: For proper operation, CHLIST must be written with a non-zero value before forced measurements or autonomous
operation is requested.
Rev. 1.1
57
Si1141/42/43-M01
PSLED12_SELECT @ 0x02
Bit
7
6
5
4
3
2
1
Name
PS2_LED[2:0]
PS1_LED[2:0]
Type
RW
RW
0
Reset value = 0010 0001
58
Bit
Name
7
Reserved
6:4
PS2_LED[2:0]
3
Reserved
2:0
PS1_LED[2:0]
Function
Specifies the LED pin driven during the PS2 Measurement. Note that any combination of irLEDs is possible.
000: NO LED DRIVE
xx1: LED1 Drive Enabled
x1x: LED2 Drive Enabled
1xx: LED3 Drive Enabled
Specifies the LED pin driven during the PS1 Measurement. Note that any combination of irLEDs is possible.
000: NO LED DRIVE
xx1: LED1 Drive Enabled
x1x: LED2 Drive Enabled
1xx: LED3 Drive Enabled
Rev. 1.1
Si1141/42/43-M01
PSLED3_SELECT @ 0x03
Bit
7
6
5
4
3
2
1
Name
PS3_LED[2:0]
Type
RW
0
Reset value = 0000 0100
Bit
Name
7:3
Reserved
2:0
Function
PS3_LED[2:0] Specifies the LED pin driven during the PS3 Measurement. Note that any combination
of irLEDs is possible.
000: No LED drive.
xx1: LED1 drive enabled.
x1x: LED2 drive enabled.
1xx: LED3 drive enabled.
PS_ENCODING @ 0x05
Bit
7
Name
6
5
4
3
2
1
0
PS3_ALIGN PS2_ALIGN PS1_ALIGN
Type
RW
R/W
R/W
Reset value = 0000 0000
Bit
Name
7
Reserved
Function
6
PS3_ALIGN When set, the ADC reports the least significant 16 bits of the 17-bit ADC when performing
PS3 Measurement. Reports the 16 MSBs when cleared.
5
PS2_ALIGN When set, the ADC reports the least significant 16 bits of the 17-bit ADC when performing
PS2 Measurement. Reports the 16 MSBs when cleared.
4
PS1_ALIGN When set, the ADC reports the least significant 16 bits of the 17-bit ADC when performing
PS1 Measurement. Reports the 16 MSBs when cleared.
3:0
Reserved
Always set to 0.
Rev. 1.1
59
Si1141/42/43-M01
ALS_ENCODING @ 0x06
Bit
7
6
Name
5
4
3
2
1
0
ALS_IR_ALIGN ALS_VIS_ALIGN
Type
RW
RW
Reset value = 0000 0000
Bit
Name
7:6
Reserved
5
ALS_IR_ALIGN
4
3:0
60
Function
When set, the ADC reports the least significant 16 bits of the 17-bit ADC when
performing ALS VIS Measurement. Reports the 16 MSBs when cleared.
ALS_VIS_ALIGN When set, the ADC reports the least significant 16 bits of the 17-bit ADC when
performing ALS IR Measurement. Reports the 16 MSBs when cleared.
Reserved
Always set to 0.
Rev. 1.1
Si1141/42/43-M01
PS1_ADCMUX @ 0x07
Bit
7
6
5
4
3
Name
PS1_ADCMUX[7:0]
Type
RW
2
1
0
Reset value = 0000 0011
Bit
7:0
Name
Function
PS1_ADCMUX[7:0] Selects ADC Input for PS1 Measurement.
The following selections are valid when PS_ADC_MODE = 1 (default). This setting is for normal Proximity Detection function.
0x03: Large IR Photodiode
0x00: Small IR Photodiode
In addition, the following selections are valid for PS_ADC_MODE = 0. With this
setting, irLED drives are disabled and the PS channels are no longer operating in
normal Proximity Detection function. The results have no reference and the references needs to be measured in a separate measurement.
0x02: Visible Photodiode
A separate 'No Photodiode' measurement should be subtracted from this reading.
Note that the result is a negative value. The result should therefore be negated to
arrive at the Ambient Visible Light reading.
0x03: Large IR Photodiode
A separate “No Photodiode” measurement should be subtracted to arrive at
Ambient IR reading.
0x00: Small IR Photodiode
A separate “No Photodiode” measurement should be subtracted to arrive at
Ambient IR reading.
0x06: No Photodiode
This is typically used as reference for reading ambient IR or visible light.
0x25: GND voltage
This is typically used as the reference for electrical measurements.
0x65: Temperature
(Should be used only for relative temperature measurement. Absolute Temperature not guaranteed) A separate GND measurement should be subtracted from
this reading.
0x75: VDD voltage
A separate GND measurement is needed to make the measurement meaningful.
Rev. 1.1
61
Si1141/42/43-M01
PS2_ADCMUX @ 0x08
Bit
7
6
5
4
3
Name
PS2_ADCMUX[7:0]
Type
R/W
2
1
0
Reset value = 0000 0011
Bit
7:0
Name
Function
PS2_ADCMUX[7:0] Selects input for PS2 measurement. See PS1_ADCMUX register description for
details.
PS3_ADCMUX @ 0x09
Bit
7
6
5
4
3
Name
PS3_ADCMUX[7:0]
Type
R/W
2
1
0
Reset value = 0000 0011
Bit
7:0
62
Name
Function
PS3_ADCMUX[7:0] Selects input for PS3 measurement. See PS1_ADCMUX register description for
details.
Rev. 1.1
Si1141/42/43-M01
PS_ADC_COUNTER @ 0x0A
Bit
7
6
Name
5
4
3
2
1
0
PS_ADC_REC[2:0]
Type
RW
R/W
R/W
Reset value = 0111 0000
Bit
Name
7
Reserved
6:4
3:0
Function
PS_ADC_REC[2:0] Recovery period the ADC takes before making a PS measurement.
000: 1 ADC Clock (50 ns times 2PS_ADC_GAIN)
001: 7 ADC Clock (350 ns times 2PS_ADC_GAIN)
010: 15 ADC Clock (750 ns times 2PS_ADC_GAIN)
011: 31 ADC Clock (1.55 µs times 2PS_ADC_GAIN)
100: 63 ADC Clock (3.15 µs times 2PS_ADC_GAIN)
101: 127 ADC Clock (6.35 µs times 2PS_ADC_GAIN)
110: 255 ADC Clock (12.75 µs times 2PS_ADC_GAIN)
111: 511 ADC Clock (25.55 µs times 2PS_ADC_GAIN)
The recommended PS_ADC_REC value is the one’s complement of PS_ADC_GAIN.
Reserved
Always set to 0.
Rev. 1.1
63
Si1141/42/43-M01
PS_ADC_GAIN @ 0x0B
Bit
7
6
5
4
3
2
1
Name
0
PS_ADC_GAIN[2:0]
Type
R/W
R/W
R/W
Reset value = 0000 0000
Bit
Name
Function
7:3
Reserved
2:0
PS_ADC_GAIN[2:0]
Increases the irLED pulse width and ADC integration time by a factor of
(2 ^ PS_ADC_GAIN) for all PS measurements.
Care must be taken when using this feature. At an extreme case, each of the
three PS measurements can be configured to drive three separate irLEDs,
each of which, are configured for 359 mA. The internal sequencer does not
protect the device from such an error. To prevent permanent damage to the
device, do not enter any value greater than 5 without consulting with Silicon
Labs.
For Example:
0x0: ADC Clock is divided by 1
0x4: ADC Clock is divided by 16
0x5: ADC Clock is divided by 32
PS_ADC_MISC @ 0x0C
Bit
7
6
5
4
3
2
Name
PS_RANGE
PS_ADC_MODE
Type
RW
RW
1
0
Reset value = 0000 0100
64
Bit
Name
7:6
Reserved
5
PS_RANGE
4:3
Reserved
Function
When performing PS measurements, the ADC can be programmed to operate in
high sensitivity operation or high signal range. The high signal range is useful in
operation under direct sunlight.
0: Normal Signal Range
1: High Signal Range (Gain divided by 14.5)
Rev. 1.1
Si1141/42/43-M01
2
1:0
PS_ADC_MODE PS Channels can either operate normally as PS channels, or it can be used to perform raw ADC measurements:
0: Raw ADC Measurement Mode
1: Normal Proximity Measurement Mode
Reserved
ALS_IR_ADCMUX @ 0x0E
Bit
7
6
5
4
3
Name
ALS_IR_ADCMUX
Type
RW
2
1
0
1
0
Reset value = 0000 0000
Bit
Name
Function
7:0
ALS_IR_ADCMUX
Selects ADC Input for ALS_IR Measurement.
0x00: Small IR photodiode
0x03: Large IR photodiode
AUX_ADCMUX @ 0x0F
Bit
7
6
5
4
3
Name
AUX_ADCMUX[7:0]
Type
RW
2
Reset value = 0110 0101
Bit
7:0
Name
Function
AUX_ADCMUX[7:0] Selects input for AUX Measurement. These measurements are referenced to
GND.
0x65: Temperature (Should be used only for relative temperature measurement.
Absolute Temperature not guaranteed)
0x75: VDD voltage
Rev. 1.1
65
Si1141/42/43-M01
ALS_VIS_ADC_COUNTER @ 0x10
Bit
7
6
5
Name
4
3
2
1
0
VIS_ADC_REC[2:0]
Type
RW
R/W
R/W
Reset value = 0111 0000
Bit
Name
Function
7
Reserved
6:4
VIS_ADC_REC[2:0]
3:0
Reserved
Recovery period the ADC takes before making a ALS-VIS measurement.
000: 1 ADC Clock (50 ns times 2ALS_VIS_ADC_GAIN)
001: 7 ADC Clock (350 ns times 2ALS_VIS_ADC_GAIN)
010: 15 ADC Clock (750 ns times 2ALS_VIS_ADC_GAIN)
011: 31 ADC Clock (1.55 µs times 2ALS_VIS_ADC_GAIN)
100: 63 ADC Clock (3.15 µs times 2ALS_VIS_ADC_GAIN)
101: 127 ADC Clock (6.35 µs times 2ALS_VIS_ADC_GAIN)
110: 255 ADC Clock (12.75 µs times 2ALS_VIS_ADC_GAIN)
111: 511 ADC Clock (25.55 µs times 2ALS_VIS_ADC_GAIN)
The recommended VIS_ADC_REC value is the one’s complement of
ALS_VIS_ADC_GAIN.
Always set to 0.
Note: For A02 and earlier, this parameter also controls ALS-IR measurements.
ALS_VIS_ADC_GAIN @ 0x11
Bit
7
6
5
4
3
2
Name
1
0
ALS_VIS_ADC_GAIN[2:0]
Type
RW
R/W
RW
Reset value = 0000 0000
Bit
Name
7:3
Reserved
2:0
Function
ALS_VIS_ADC_GAIN[2:0] Increases the ADC integration time for ALS Visible measurements by a
factor of (2 ^ ALS_VIS_ADC_GAIN). This allows visible light measurement under dark glass. The maximum gain is 128 (0x7).
For Example:
0x0: ADC Clock is divided by 1
0x4: ADC Clock is divided by 16
0x6: ADC Clock is divided by 64
Note: For A02 and earlier, this parameter also controls ALS-IR measurements.
66
Rev. 1.1
Si1141/42/43-M01
ALS_VIS_ADC_MISC @ 0x12
Bit
7
6
5
Name
VIS_RANGE
Type
RW
4
3
2
1
0
Reset value = 0000 0000
Bit
Name
7:6
Reserved
5
4:0
Function
VIS_RANGE When performing ALS-VIS measurements, the ADC can be programmed to operate in
high sensitivity operation or high signal range.
The high signal range is useful in operation under direct sunlight.
0: Normal Signal Range
1: High Signal Range (Gain divided by 14.5)
Reserved
Note: For A02 and earlier, this parameter also controls ALS-IR measurements.
ALS_HYST @ 0x16
Bit
7
6
5
4
3
Name
ALS_HYST[7:0]
Type
RW
2
1
0
Reset value = 0100 1000
Bit
7:0
Name
Function
ALS_HYST[7:0] ALS_HYST represents a hysteresis applied to the ALS_LOW_TH and ALS_HIGH_TH
thresholds. This is in an 8-bit compressed format, representing a 16-bit value. For
example:
0x48: 24 ADC Codes
Please refer to “AN498: Si114x Designer's Guide”, Section 5.4 “Compression Concept”.
Rev. 1.1
67
Si1141/42/43-M01
PS_HYST @ 0x17
Bit
7
6
5
4
3
Name
PS_HYST[7:0]
Type
RW
2
1
0
Reset value = 0100 1000
Bit
7:0
Name
Function
PS_HYST[7:0] PS_HYST represents a hysteresis applied to the PS1_TH, PS2_TH and PS3_TH
thresholds. This is in an 8-bit compressed format, representing a 16-bit value. For
example: 0x48: 24 ADC Codes.
Please refer to “AN498: Si114x Designer's Guide”, Section 5.4 “Compression Concept”.
PS_HISTORY @ 0x18
Bit
7
6
5
4
3
Name
PS_HISTORY[7:0]
Type
RW
2
1
Reset value = 0000 0011
Bit
7:0
68
Name
Function
PS_HISTORY[7:0] PS_HISTORY is a bit-field representing the number of consecutive samples
exceeding the threshold and hysteresis to change status.
For example:
0x03: 2 consecutive samples
0x07: 3 consecutive samples
0xFF: 8 consecutive samples
Rev. 1.1
0
Si1141/42/43-M01
ALS_HISTORY @ 0x19
Bit
7
6
5
4
3
2
Name
ALS_HISTORY[7:0]
Type
RW
1
0
Reset value = 0000 0011
Bit
7:0
Name
Function
ALS_HISTORY[7:0] ALS_HISTORY is a bit-field representing the number of consecutive samples
exceeding the threshold and hysteresis to change status.
For example:
0x03: Two consecutive samples
0x07: Three consecutive samples
0xFF: Eight consecutive samples
ADC_OFFSET @ 0x1A
Bit
7
6
5
4
3
Name
ADC_OFFSET[7:0]
Type
RW
2
1
0
Reset value = 1000 0000
Bit
7:0
Name
Function
ADC_OFFSET[7:0] ADC_OFFSET is an 8-bit compressed value representing a 16-bit value added to all
measurements. Since most measurements are relative measurements involving a
arithmetic subtraction and can result in a negative value. Since 0xFFFF is treated as
an overrange indicator, the ADC_OFFSET is added so that the values reported in
the I2C register map are never confused with the 0xFFFF overrange indicator.
For example:
0x60: Measurements have a 64-code offset
0x70: Measurements have a 128-code offset
0x80: Measurements have a 256-code offset
Please refer to “AN498: Si114x Designer's Guide”, Section 5.4 “Compression
Concept”.
Rev. 1.1
69
Si1141/42/43-M01
LED_REC @ 0x1C
Bit
7
6
5
4
3
Name
LED_REC[7:0]
Type
RW
2
1
0
2
1
0
Reset value = 0000 0000
Bit
Name
7:0
Function
LED_REC[7:0] Reserved.
ALS_IR_ADC_COUNTER @ 0x1D
Bit
7
6
5
4
Name
IR_ADC_REC[2:0]
Type
RW
3
Reset value = 0111 0000
Bit
Name
7
Reserved
6:4
IR_ADC_REC[2:0]
3:0
Reserved
Function
Recovery period the ADC takes before making a ALS-IR measurement.
000: 1 ADC Clock (50 ns times 2ALS_IR_ADC_GAIN)
001: 7 ADC Clock (350 ns times 2ALS_IR_ADC_GAIN)
010: 15 ADC Clock (750 ns times 2ALS_IR_ADC_GAIN)
011: 31 ADC Clock (1.55 µs times 2ALS_IR_ADC_GAIN)
100: 63 ADC Clock (3.15 µs times 2ALS_IR_ADC_GAIN)
101: 127 ADC Clock (6.35 µs times 2ALS_IR_ADC_GAIN)
110: 255 ADC Clock (12.75 µs times 2ALS_IR_ADC_GAIN)
111: 511 ADC Clock (25.55 µs times 2ALS_IR_ADC_GAIN)
The recommended IR_ADC_REC value is the one’s complement of
ALS_IR_ADC_GAIN.
Always set to 0.
Note: This parameter available for sequencer revisions A03 or later.
70
Rev. 1.1
Si1141/42/43-M01
ALS_IR_ADC_GAIN @ 0x1E
Bit
7
6
5
4
3
2
Name
1
0
ALS_IR_ADC_GAIN[2:0]
Type
R/W
R/W
R/W
Reset value = 0000 0000
Bit
Name
7:3
Reserved
2:0
Function
ALS_IR_ADC_GAIN[2:0] Increases the ADC integration time for IR Ambient measurements by a factor of (2 ^ ALS_IR_ADC_GAIN). The maximum gain is 128 (0x7).
For Example:
0x0: ADC Clock is divided by 1
0x4: ADC Clock is divided by 16
0x6: ADC Clock is divided by 64
Note: This parameter available for sequencer revisions A03 or later.
ALS_IR_ADC_MISC @ 0x1F
Bit
7
6
5
Name
IR_RANGE
Type
RW
4
3
2
1
0
Reset value = 0000 0000
Bit
Name
7:6
Reserved
5
4:0
Function
IR_RANGE When performing ALS-IR measurements, the ADC can be programmed to operate in
high sensitivity operation or high signal range.
The high signal range is useful in operation under direct sunlight.
0: Normal Signal Range
1: High Signal Range (Gain divided by 14.5)
Reserved
Write operations to this RAM parameter must preserve this bit-field value using
read-modify-write.
Note: This parameter is available for sequencer revisions A03 or later.
Rev. 1.1
71
Si1141/42/43-M01
5. Pin Descriptions
Si1141/42/43-M01
DNC 1
10 LEDA
SDA 2
9 LED1
SCL 3
8 GND
VDD 4
7 LED3/CVDD
INT 5
6 LED2/CVDD
Table 18. Pin Descriptions
Pin
Name
Type
Description
1
DNC
2
SDA
3
SCL
Input
4
VDD
Power
5
INT
6
LED2/CVDD1
Output
LED2 Output/Connect to VDD1
Programmable constant current sink normally connected to an infrared
LED cathode. Connect directly to VDD when not in use.
7
LED3/CVDD2
Output
LED3 Output/Connect to VDD2
Programmable constant current sink normally connected to an infrared
LED cathode. If VLED < (VDD + 0.5 V), a 47 k pull-up resistor from LED3
to VDD is needed for proper operation. Connect directly to VDD when not
in use.
8
GND
Power
Ground.
Reference voltage.
9
LED1
Output
LED1 Output.
Programmable constant current sink connected to the internal LED cathode. For long-range proximity detection, connect LED1 to LED2 and LED3.
10
LEDA
Input
Do Not Connect.
This pin is electrically connected to an internal Si1141/42/43-M01 node. It
should remain unconnected.
Bidirectional I2C Data.
I2C Clock.
Power Supply.
Voltage source.
Bidirectional Interrupt Output.
Open-drain interrupt output pin. Must be at logic level high during power-up
sequence to enable low power operation.
Internal LED anode.
Connect to external resistor and capacitor.
Notes:
1. Si1142 and Si1143 only. Must connect to VDD in Si1141.
2. Si1143 only. Must connect to VDD in Si1141 and Si1142.
72
Rev. 1.1
Si1141/42/43-M01
6. Ordering Guide
Part Number
Package
LED Drivers
Si1143-M01-GMR
4.9 x 2.85 x 1.2 mm QFN
3 LED drivers, 1 LED integrated
Si1142-M01-GMR
4.9 x 2.85 x 1.2 mm QFN
2 LED drivers, 1 LED integrated
Si1141-M01-GMR
4.9 x 2.85 x 1.2 mm QFN
1 LED drivers, 1 LED integrated
Rev. 1.1
73
Si1141/42/43-M01
7. Package Outline: 10-Pin QFN
Figure 20 illustrates the package details for the Si1141/42/43-M01 QFN package. Talbe 19 lists the values for the
dimensions shown in the illustration.
LED
Photodiode
Figure 20. QFN Package Diagram Dimensions
Table 19. QFN Package Diagram Dimensions
Dimension
Min
Nom
Max
A
1.10
1.20
1.30
A1
0.28
0.30
0.32
b
0.55
0.60
0.65
D
4.90 BSC
D1
4.00 BSC
e
1.00 BSC
E
2.85 BSC
E1
1.95 BSC
f
1.56 BSC
g
1.44 BSC
H1
0.98
1.03
1.08
H2
1.19
1.24
1.29
L
0.55
0.60
0.65
y
74
3° REF
Rev. 1.1
Si1141/42/43-M01
Table 19. QFN Package Diagram Dimensions (Continued)
Dimension
Min
Nom
aaa
0.10
bbb
0.10
ccc
0.08
ddd
0.10
eee
0.10
fff
0.10
Max
Notes:
1. All dimensions shown are in millimeters (mm) unless otherwise noted.
2. Dimensioning and tolerancing per ANSI Y14.5M-1994.
3. Recommended card reflow profile is per the JEDEC/IPC J-STD-020
specification for Small Body Components.
Rev. 1.1
75
Si1141/42/43-M01
8. Suggested PCB Land Pattern
Table 20. PCB Land Pattern Dimensions
Dimension
mm
C
2.20
E
1.00
X
1.15
Y
0.65
Notes:
General
1. All dimensions shown are in millimeters (mm).
2. This Land Pattern Design is based on the IPC-7351 guidelines.
3. All dimensions shown are at Maximum Material Condition (MMC). Least Material
Condition (LMC) is calculated based on a Fabrication Allowance of 0.05 mm.
Solder Mask Design
4. All metal pads are to be non-solder mask defined (NSMD). Clearance between the
solder mask and the metal pad is to be 60 µm minimum, all the way around the pad.
Stencil Design
5. A stainless steel, laser-cut and electro-polished stencil with trapezoidal walls should
be used to assure good solder paste release.
6. The stencil thickness should be 0.125 mm (5 mils).
7. The ratio of stencil aperture to land pad size should be 1:1 for all pads.
Card Assembly
8. A No-Clean, Type-3 solder paste is recommended.
9. The recommended card reflow profile is per the JEDEC/IPC J-STD-020
specification for Small Body Components.
76
Rev. 1.1
Si1141/42/43-M01
9. Top Markings
9.1. Si1141/42/43 Top Markings
Figure 21. Si1141/42/43 Top Markings
9.2. Top Marking Explanation
Mark Method:
YAG Laser
Line 1 Marking:
Device Identifier
Line 2 Marking:
TTTT = Manufacturing
code
Line 3 Marking:
Y = Year
WW = Workweek
1141: Si141-M01-GMR, 1142: Si1142-M01-GMR,
1143: Si1143-M01-GMR
Assigned by the Assembly House. Corresponds to the last
significant digit of the year and work week of the mold date.
Rev. 1.1
77
Si1141/42/43-M01
DOCUMENT CHANGE LIST
Revision 0.1 to Revision 0.2

Revised pin numbering.
Added Figures 9, 10 and 11.
 Updated "7. Package Outline: 10-Pin QFN" on page
74.
 Updated "8. Suggested PCB Land Pattern" on page
76.

Revision 0.2 to Revision 1.0

Updated orderable part numbers
Revision 1.0 to Revision 1.1

Clarified usage of Command Register and
Parameter RAM.
 Clarified LED2 and LED3 connection when using
Si1142 and Si1143.
78
Rev. 1.1
Si1141/42/43-M01
CONTACT INFORMATION
Silicon Laboratories Inc.
400 West Cesar Chavez
Austin, TX 78701
Tel: 1+(512) 416-8500
Fax: 1+(512) 416-9669
Toll Free: 1+(877) 444-3032
Please visit the Silicon Labs Technical Support web page:
https://www.silabs.com/support/pages/contacttechnicalsupport.aspx
and register to submit a technical support request.
Patent Notice
Silicon Labs invests in research and development to help our customers differentiate in the market with innovative low-power, small size, analogintensive mixed-signal solutions. Silicon Labs' extensive patent portfolio is a testament to our unique approach and world-class engineering team.
The information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice.
Silicon Laboratories assumes no responsibility for errors and omissions, and disclaims responsibility for any consequences resulting from
the use of information included herein. Additionally, Silicon Laboratories assumes no responsibility for the functioning of undescribed features or parameters. Silicon Laboratories reserves the right to make changes without further notice. Silicon Laboratories makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Silicon Laboratories assume any
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consequential or incidental damages. Silicon Laboratories products are not designed, intended, or authorized for use in applications intended to support or sustain life, or for any other application in which the failure of the Silicon Laboratories product could create a situation where
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application, Buyer shall indemnify and hold Silicon Laboratories harmless against all claims and damages.
Silicon Laboratories and Silicon Labs are trademarks of Silicon Laboratories Inc.
Other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders.
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