PDF document

AN309018
Application note
How to migrate from
S29GL256P to M29W256G Flash memories
Introduction
The objective of this application note is to explain how to migrate an application based on
the S29GL256P Flash memory to an M29W256GH/L Flash memory. The purpose of this
document is not to provide detailed information on the devices, but to highlight the
similarities and differences between them. The comparison takes into consideration the
signal descriptions, packages, architecture, software command set, performance, and block
protections.
The S29GL256P and M29W256GH/L are 256 Mbit (16 Mb x 16 or 32 Mb x 8) Flash
memories that can be read, erased and reprogrammed using a single low supply voltage.
Both memories are divided into blocks that can be erased independently so it is possible to
preserve valid data while old data is erased.
Program and erase commands are written to the command interface of the memory. An onchip program/erase controller simplifies the process of programming or erasing the memory
by taking care of all of the special operations that are required to update the memory
contents.
Groups of blocks can be protected to prevent accidental program or erase commands from
modifying the memory. On both devices, the highest or lowest memory block can also be
protected by using a hardware method.
All devices have an extra block, the extended block, of 128 words (256 bytes). It can be
accessed using a dedicated command. The extended block can be protected and so is
useful for storing security information. However the protection is not reversible, once
protected the protection cannot be undone.
In this document, the S29GL256P, highest and lowest block protected (01 and 02 model),
will be referred to as S29GL256P, and the M29W256GH (highest block protected) and the
M29W256GL (lowest block protected) will be referred to as M29W256G unless otherwise
specified.
Please refer to the S29GL256P and M29W256G datasheets for additional information on
devices.
July 2009
Rev 1
1/22
www.numonyx.com
Contents
AN309018
Contents
1
Memory architecture and protection groups . . . . . . . . . . . . . . . . . . . . . 5
2
Hardware migration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
3
4
5
2.1
Signal description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2.2
Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Software command set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3.1
Fast program commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3.2
Program operation fails detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3.3
Device codes and auto select codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3.4
Difference in CFI operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Performance and characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.1
Access time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.2
Page read mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.3
Program and erase times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Block protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
5.1
Temporary block unprotect . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
6
Power-up waiting timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
7
Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
8
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
2/22
AN309018
List of tables
List of tables
Table 1.
Table 2.
Table 3.
Table 4.
Table 5.
Table 6.
Table 7.
Table 8.
Table 9.
Table 10.
Table 11.
Table 12.
Table 13.
Table 14.
Table 15.
Table 16.
Signal Description for the S29GL256P and M29W256G Devices . . . . . . . . . . . . . . . . . . . . 6
Command Set. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
M29W256G, Write to Buffer Commands, 16-bit mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
S29GL256P, Write to Buffer Command (16-bit mode) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
M29W256G Enhanced Buffered Program Commands, 16-bit mode . . . . . . . . . . . . . . . . . 11
M29W256G, Write to Buffer Commands, 8-bit Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
S29GL256P, Write to Buffer Command (8-bit Mode) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Bus Operations for Accessing the Auto Select Codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Auto Select Codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
CFI Exit Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Program/erase Times and Program/erase Endurance Cycles . . . . . . . . . . . . . . . . . . . . . . 16
Comparison between S29GL256P and M29W256G Performance and Characteristics. . . 17
Block Protection Techniques, M29W256G / S29GL256P Memory Devices. . . . . . . . . . . . 18
Commands Cross Reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Power-up Waiting Timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Document Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3/22
List of figures
AN309018
List of figures
Figure 1.
Figure 2.
Figure 3.
Figure 4.
4/22
S29GL256P TSOP56 Connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
M29W256G TSOP56 Connections. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
S29GL256P FBGA64 Connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
M29W256G FBGA64 Connections. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
AN30918
1
Memory architecture and protection groups
Memory architecture and protection groups
The S29GL256P and the M29W256G memory arrays are divided into uniform blocks. In
particular, they have 256 blocks of 64 Kwords (128 Kbytes) each.
Both devices have an extended memory block of 128 words in x 16 mode or of 256 bytes in
x 8 mode. See Section 3: Software command set for a description of the extended memory
block commands.
On the S29GL256P and M29W256G, all blocks are protected individually. The protection
granularity is always 64 Kwords or 128 Kbytes.
5/22
Hardware migration
2
AN30918
Hardware migration
This section provides a detailed comparison between S29GL256P and M29W256G signals
and package pin-out.
2.1
Signal description
Table 1 gives a comparison between the S29GL256P and M29W256G signals.
On both devices, the VPP function allows the memory to use an external high voltage power
supply to reduce the time required for fast program operations. The Write Protect (WP)
function provides a hardware method of protecting the outermost memory block:
„
When (VPP/WP) is Low, VIL, the highest or lowest block is protected on both the
M29W256G and S29GL256P devices.
„
When VPP/WP is High, VIH, the memory reverts to the previous protection status of the
outermost block.
Upon customer request, on the M29W256G devices, applying 12 V to the VPP/WP pin will
temporarily unprotect any block previously protected (including the two outermost blocks).
In addition, the VPP/WP pin can be left floating or unconnected due to an internal pull-up.
In both devices, VCCQ provides the power supply to the I/O pins and enable all outputs to be
powered independently from VCC.
Table 1.
Signal Description for the S29GL256P and M29W256G Devices
Name
Description
S29GL256P
Direction
M29W256G
A0-A23
Address inputs
Inputs
DQ0-DQ7
Data inputs/outputs
I/O
DQ8-DQ14
Data inputs/outputs
I/O
DQ15A–1 (or DQ15)
Data input/output or address input (or data input/output)
I/O
CE#
E
Chip Enable
Input
OE#
G
Output Enable
Input
WE#
W
Write Enable
Input
RESET#
RP
Reset/Block Temporary Unprotect
Input
RY/BY#
RB
Ready/Busy output
BYTE#
Byte/word organization select
VCC
VPP/WP
WP#/ACC
6/22
Supply voltage
Supply voltage for fast program (optional) or write protect
Output
Input
Supply
Input
VSS
Ground
–
NC
Not connected internally
–
AN30918
2.2
Hardware migration
Packages
The S29GL256P and M29W256G are both delivered in TSOP56 - 14 x 20 mm and FBGA64
11x 13 mm. The M29W256G is also offered in the TBGA64 - 10 x 13 mm, 1 mm pitch
packages. Compared with FBGA, the TBGA64 is smaller and it has different ball size, the
TBGA ball size ranges from 0.35mm to 0.5mm while the FBGA ball size ranges from 0.5mm
to 0.7mm.
The M29W256G is fully pin-to-pin compatible with the S29GL256P. See Figure 1 and
Figure 2, in conjunction with Table 1.
Refer to the S29GL256P and M29W256G datasheets for details on the packages.
Figure 1.
A23
A22
A15
A14
A13
A12
A11
A10
A9
A8
A19
A20
WE
RESET
A21
WP/ACC
RY/BY
A18
A17
A7
A6
A5
A4
A3
A2
A1
NC
NC
S29GL256P TSOP56 Connections
1
56
14
15
43
42
28
29
NC
NC
A16
BYTE
VSS
DQ15A–1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE
VSS
CE
A0
NC
VIO(1)
Pinout_S29GL_256P
Figure 2.
A23
A22
A15
A14
A13
A12
A11
A10
A9
A8
A19
A20
W
RP
A21
VPP/WP
RB
A18
A17
A7
A6
A5
A4
A3
A2
A1
NC
NC
M29W256G TSOP56 Connections
1
56
14
15
43
42
28
29
NC
NC
A16
BYTE
VSS
DQ15A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
G
VSS
E
A0
NC
VCCQ (2)
Pinout_M29W256G
1. VIO = 1.65 V to VCC.
2. VCCQ = 1.65 V to VCC.
7/22
Hardware migration
Figure 3.
AN30918
S29GL256P FBGA64 Connections
1
2
3
4
5
6
7
8
A
NC
A3
A7
RY/BY#
WE#
A9
A13
NC
B
NC
A4
A17
WP#/
ACC
RESET
A8
A12
A22
C
NC
A2
A6
A18
A21
A10
A14
A23
D
NC
A1
A5
A20
A19
A11
A15
VIO(1)
E
NC
A0
DQ0
DQ2
DQ5
DQ7
A16
VSS
F
VIO
CE#
DQ8
DQ10
DQ12
DQ14
BYTE#
NC
G
NC
OE#
DQ9
DQ11
VCC
DQ13
DQ15
A–1
NC
H
NC
VSS
DQ1
DQ3
DQ4
DQ6
VSS
NC
Pin_Connections_FBGA64
8/22
AN30918
Figure 4.
Hardware migration
M29W256G FBGA64 Connections
1
2
3
4
5
6
7
8
A
NC
A3
A7
RB
W
A9
A13
NC
B
NC
A4
A17
VPP/WP
RP
A8
A12
A22
C
NC
A2
A6
A18
A21
A10
A14
A23
D
NC
A1
A5
A20
A19
A11
A15
VCCQ
E
NC
A0
DQ0
DQ2
DQ5
DQ7
A16
VSS
F
VCCQ
E
DQ8
DQ10
DQ12
DQ14
BYTE#
NC
G
NC
G
DQ9
DQ11
VCC
DQ13
DQ15
A-1
NC
H
NC
VSS
DQ1
DQ3
DQ4
DQ6
VSS
NC
Pin_Connections_M29W_256G
9/22
Software command set
3
AN30918
Software command set
The S29GL256P and M29W256G feature an identical set of standard commands. The
commands are compliant with the JEDEC standard.
Table 2.
Command Set
Command
3.1
S29GL256P
M29W256G
Read/Reset
X
X
Auto Select
X
X
Program
X
X
Write Buffer
X
X
Unlock Bypass
X
X
Unlock Bypass Program
X
X
Unlock Bypass Reset
X
X
Chip Erase
X
X
Block Erase
X
X
Program/Erase Suspend
X
X
Program/Erase Resume
X
X
Read CFI Query
X
X
Enter Extended Block
X
X
Exit Extended Block
X
X
Enhanced Buffered Program
-
X
Fast program commands
The S29GL256P and the M29W256G devices both feature fast program commands. Since
the write to buffer program is available on both devices, it is recommended to use this
command if a minimum number of changes is required for the migration. On the other side,
to reach the best programming speed with M29W256G devices, it is recommended to use
enhanced buffered program with VPP=VPPH (see Table 3: M29W256G, Write to Buffer
Commands, 16-bit mode and Table 6: M29W256G, Write to Buffer Commands, 8-bit Mode).
The Enhanced Buffered Program command is only available on M29W256G devices. It is
valid in x 16 mode only and makes use of the device’s 256-word write buffer to speed up
programming. To use the Enhanced Buffered Program command, all the 256 words must be
loaded into the write buffer in an increasing address order. Each write buffer has the same
A23-A8 addresses. The Enhanced Buffered Program command dramatically reduces
system programming time.
10/22
AN30918
M29W256G, Write to Buffer Commands, 16-bit mode
Bus write operations (1)
Length
Table 3.
Software command set
Command
1st
2nd
3rd
4th
5th
6th
Add
Data
Add
Data
Add
Data
Add
Data
Add
Data
Add
Data
PA (3)
PD
WBL(4)
PD
Write to Buffer Program
N+5
555
AA
2AA
55
BAd
25
BAd
N(2)
Unlock Bypass Write to
Buffer Program
N+3
BAd
25
BAd
N(2)
PA(3)
PD
WBL (6)
PD
Write to Buffer Program
Confirm
1
BAd(5)
29
Buffered Program
Abort Reset
3
555
AA
2AA
55
555
F0
1.
X don’t care, PA program address, PD program data, BAd any address in the block, WBL write buffer location. All values in the table are in
hexadecimal.
2.
The maximum number of cycles in the command sequence is 36. N+1 is the number of words to be programmed during the write to buffer
program operation.
3.
Each buffer has the same A23-A5 addresses. A0-A4 are used to select a word within the N+1 word page.
4.
The 6th cycle has to be issued N time. WBL scans the word inside the page.
5.
BAd must be identical to the address loaded during the write to buffer program 3rd and 4th cycles.
6.
The 4th cycle has to be issued N time. WBL scans the word inside the page.
Table 4.
S29GL256P, Write to Buffer Command (16-bit mode)
Bus write cycles
Command
Cycles
1st
Add
Write to
Buffer (1)
WC + 5
2nd
3rd
Data Add Data
555
AA
2AA
55
4th
Add
Data
BA(2)
25
Add
5th
6th
Data
Add
Data
Add
Data
BA (2) WC(2)
PA(2)
PD(2) WBL(2) PD(2)
1. The total number of cycles in the command sequence is determined by the number of words to be written to the write
buffer. The maximum number of cycles is 20.
2. BA Block Address, WC Number of words to be programmed - 1, PA Program Address, PD Program Data, WBL Write
Buffer Location (address must be within the same write buffer page as PA).
Table 5.
M29W256G Enhanced Buffered Program Commands, 16-bit mode
Command
Length
Bus write operations
1st
2nd
3rd
...
Add
Data
Add
Data
Add
Data
3
555
AA
2AA
55
555
38
258
BAd
33
BAd
(00)
Data
BAd
(01)
Data
Exit Enhanced Buffered
Program Command Set
2
X
90
X
00
Enhanced Buffered
Program Abort Reset
3
555
AA
2AA
55
555
F0
Enter Enhanced Buffered
Program Command Set
Enhanced Buffered
Program
256th
257th
258th
Add
Data
Add
Data
Add
Data
Add
Data
...
...
BAd
(FE)
Data
BAd
(FF)
Data
BAd
(00)
29
11/22
Software command set
M29W256G, Write to Buffer Commands, 8-bit Mode
Bus write operations(1)
Length
Table 6.
AN30918
Command
1st
2nd
3rd
4th
5th
6th
Add
Data
Add
Data
Add
Data
Add
Data
Add
Data
Add
Data
PA(3)
PD
WBL(4)
PD
Write to Buffer Program
N+5
AAA
AA
555
55
BAd
25
BAd
N(2)
Unlock Bypass Write to
Buffer Program
N+3
BAd
25
BAd
N(2)
PA(3)
PD
WBL(6)
PD
Write to Buffer Program
Confirm
1
BAd(5)
29
Buffered Program Abort
Reset
3
AAA
AA
555
55
AAA
F0
1.
X don’t care, PA program address, PD program data, BAd any address in the block, WBL write buffer location. All values in the table are in
hexadecimal.
2.
The maximum number of cycles in the command sequence is 68. N+1 is the number of bytes to be programmed during the write to buffer
program operation.
3.
Each buffer has the same A23-A5 addresses. A0-A4 and A-1 are used to select a byte within the N+1 byte page.
4.
The 6th cycle has to be issued N time. WBL scans the word inside the page.
5.
BAd must be identical to the address loaded during the write to buffer program 3rd and 4th cycles.
6.
The 4th cycle has to be issued N time. WBL scans the word inside the page.
Table 7.
S29GL256P, Write to Buffer Command (8-bit Mode)
Command
Write to Buffer(1)
Cycles
Bus write cycles
BC+5
1st
2nd
3rd
Add Data
Add
Data
Add
AAA
555
55
BA(2)
AA
4th
Data Add
25
BA
5th
6th
Data
Add
Data
Add
Data
BC(2)
PA(2)
PD(2)
WBL(2)
PD
1. The total number of cycles in the command sequence is determined by the number of bytes to be written to the write buffer.
The maximum number of cycles is 30.
2. BA Block Address, WC Number of bytes to be programmed - 1, PA Program Address, PD Program Data, WBL Write Buffer
Location (address must be within the same write buffer page as PA).
12/22
AN30918
3.2
Software command set
Program operation fails detection
In M29W256G devices, it is possible to detect program operation fails, even during a write
to buffer or enhanced buffered program, when changing programmed data from ‘0’ to ‘1’,
that is when reprogramming data in a portion of memory already programmed. The resulting
data will be the logical OR between the previous value and the current value.
In S29GL256P devices, this functionality is not available.
3.3
Device codes and auto select codes
The auto select codes are composed of the manufacturer code, the device code, the block
protection status, and the extended memory block verify code.
The S29GL256P and M29W256G devices have different manufacturer code, device code,
and extended memory block verify code.
The S29GL256P and M29W256G devices use identical commands and address inputs to
read the auto select codes. Two methods are available to access the auto select codes:
Table 8.
„
in the first method, an Auto Select command is issued (see Table 2: Command Set) to
place the device in auto select mode. The auto select codes can then be read by using
a bus read operation with addresses and control signals set as shown in Table 8: Bus
Operations for Accessing the Auto Select Codes.
„
in the high voltage method, the same sequence of bus read operations as in the first
method is issued, except that A9 is set at VID.
Bus Operations for Accessing the Auto Select Codes
Address inputs
Operation
E
G
W
x 8 mode
x 16 mode
DQ15A-1, A0-A23
A0-A23
Read
manufacturer
code
A0-A3 = VIL , A6 = VIL,
A9 = VID, others VIL or VIH
Read device
code
A0 = VIH, A1-A3 = VIL,
A6 = VIL, A9 = VID ,
others VIL or VIH
VIL
VIL
VIH
Block protection
status
A0,A2,A3, A6= VIL,
A1= VIH, A9 = VID,
A12-A21 = Block address,
others VIL or VIH
Extended
memory block
verify code
A0-A1 = VIH, A2-A3 = VIL,
A6 = VIL, A9 = VID ,
others VIL or VIH
Data inputs/outputs
x 8 mode
DQ14-DQ8
Hi-Z
x 16 mode
DQ7-DQ0
DQ15A-1,
DQ14-DQ0
see Table 9
13/22
Software command set
Table 9.
AN30918
Auto Select Codes
Spansion
Auto select
code
S29GL256P
(01 model)(1)
Numonyx
S29GL256P
(02 model)(2)
M29W256GH M29W256GL
Spansion
S29GL256P
(01 model)(1)
Numonyx
S29GL256P
(02 model)(2)
x 16 mode
0001h
Device code
227Eh 2222h 2201h
227Eh+2222h+2201h
Block protection
status
01h (protected)
00h (unprotected)(3)
0001h (protected)
0000h (unprotected)
XX99h
(factory
locked)
XX19h (not
factory
locked)(3)
0020h
XX89h
(factory
locked)
XX09h (not
factory
locked)(3)
0099h
(factory
locked)
0019h (not
factory
locked)
1.
Highest block protected by driving V PP/WP High.
2.
Lowest block protected by driving VPP/WP High.
3.
DQ8 to DQ15 are ‘don’t care’.
3.4
M29W256GL
x 8 mode
Manufacturer
code
Extended
memory block
verify indicator
M29W256GH
0020h
0089h
(factory
locked)
0009h (not
factory
locked)
01h
20h
7Eh+22h+01h
7Eh+22h+01h
01h (protected)
00h (unprotected)
99h (factory
locked)
19h (not
factory
locked) (3)
89h (factory
locked)
09h (not
factory
locked)(3)
99h (factory
89h (factory
locked)
locked)
19h (not
09h (not
factory locked) factory locked)
Difference in CFI operation
When exiting CFI mode on M29W256G device, Read/Reset command (0xF0h) is used to
return the device to the previous mode (Main Array Read or Auto Select Mode). Table 10:
CFI Exit Sequence shows the detail exiting command sequence on M29W256G device.
Table 10.
CFI Exit Sequence
Exiting from CFI to main array read command sequence
Entering CFI Sequence
S29GL256P
M29W256G
Main Array Read --> CFI
0xF0h
0xF0h
Main Array Read --> Auto Select
Mode --> CFI
0xF0h
0xF0h --> 0xF0h (twice command)
S29GL256P will enter main array read mode when it is issued Read/Reset command
(0xF0h).
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4
Performance and characteristics
Performance and characteristics
The S29GL256P and the M29W256G have almost compatible DC and AC characteristics
(see the respective datasheets for details). The M29W256G memory devices offer better
performance in terms of access, programming, and erase times than the S29GL256P
devices.
4.1
Access time
The M29W256G has a random access time of 70 ns or 90 ns, depending on the VCCQ
supply voltage, whereas the S29GL256P has an access time of 90 ns, 100 ns or 110 ns.
4.2
Page read mode
The page mode is available on the S29GL256P and M29W256G to speed up read
operations. The data is internally read and stored in a 8-word (or 16-byte) page buffer.
Using page read, the access time for subsequent read operations is reduced to 25 ns for
both devices with VCCQ = VCC, while it is reduced to 30 ns for the M29W256G with
VCCQ = 1.65 V.
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Performance and characteristics
4.3
AN30918
Program and erase times
The time required to program or erase the whole memory is lower on the M29W256G
compared to the S29GL256P. The memory can be programmed using a Fast Program, an
Enhanced Buffered Program command, or the word by word program command. Refer to
Section 3.1 for details.
Table 11.
Program/erase Times and Program/erase Endurance Cycles
Parameter
Min
Chip Erase
Typ(1)(2)
Max(2)
Unit
145(3)
400(4)
s
125
400(4)
s
0.5
2
s
25
35
μs
VPP /WP = VPPH
Chip Erase
Block Erase (128 kbytes)
(5)
Erase Suspend latency time
Block Erase timeout
50
Single Byte Program
Byte Program
16
Write to Buffer Program
(64 bytes at-a-time)
VPP /WP = VPPH
50
VPP /WP = VIH
70
Single Word Program
Word Program
μs
μs
200(4)
μs
μs
16
Write to Buffer Program
(32 words at-a-time)
VPP /WP = VPPH
50
VPP /WP = VIH
70
200(4)
μs
540
800(4)
s
Chip Program (word by word)
270
400(4)
s
Chip Program (Write to Buffer Program)(6)
25
200(4)
s
Chip Program (byte by byte)
Chip Program (Write to Buffer Program with VPP /WP = VPPH)
Chip Program (Enhanced Buffered Program)
(6)
13
(6)
(4)
50
s
15
60
s
Chip Program (Enhanced Buffered Program with VPP /WP = VPP )
10
40
s
Program Suspend latency time
5
15
μs
(6)
Program/Erase cycles (per block)
Data retention
100,000
Cycles
20
Years
1. Typical values measured at room temperature and nominal voltages and for not cycled devices.
2. Sampled, but not 100% tested.
3. Time needed to program the whole array at 0 is included.
4. Maximum value measured at worst case conditions for both temperature and V CC after 100,000 program/erase cycles.
5. Block erase polling cycle time.
6. Intrinsic program timing, that means without the time required to execute the bus cycles to load the program commands.
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Table 12.
Performance and characteristics
Comparison between S29GL256P and M29W256G Performance and Characteristics
Parameter
S29GL256P
M29W256G
Access time
90, 100, 110 ns
60 ns, 70 and 80 ns with VCCQ= 3 V (1)
Page Read
25 ns (8-word page)
Write to Buffer Program (32 Words/64 Bytes)
Fast Program
—
Enhanced Buffered Program (256 Words)
Chip Program time
246 s
(using the Write to Buffer Program)
Supply voltage
2.7 to 3.6 V
25 s (VPP /WP = VIH)
13 s (V PP/WP = VPPH)
(using the Write to Buffer Program)
15 s (VPP /WP = VIH)
10 s (VPP/WP = VPPH)
(using the Enhanced Buffered Program)
2.7 to 3.6 V
Temperature range
–40 to 85 °C
VCCQ or VIO
input/output supply
1.65 V to VCC
Chip Erase time
128 s (typical), except all 0000h
programmed prior to erasing
145 s (typical)
1. 60 ns available upon customer request.
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Block protection
5
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Block protection
The M29W256G memories, as the S29GL256P devices, feature three techniques to control
block protection. The table below shows how the three techniques are called in the
M29W256G and S29GL256P devices, respectively.
Table 13.
Block Protection Techniques, M29W256G / S29GL256P Memory Devices
M29W256G(1)
S29GL256P
Hardware method (VPP /WP)
Hardware Data Protection (WP/ACC)
Volatile/non-volatile protection
Advanced protection/unprotection
Password protection method
Password protection method
1. Please refer to the M29W256G datasheet for further details.
The S29GL256P and M29W256G both feature hardware protection. In particular in the
M29W256G memories, when:
„
VPP/WP = VIL, the highest or lowest blocks are protected
„
VPP/WP = VIH, the highest or lowest blocks are unprotected.
Advanced protection/unprotection in S29GL256P corresponds to volatile/non-volatile
protection in M29W256G:
„
In the volatile protection mode, each block can be protected/unprotected with powerdown or by a command
„
In the non-volatile protection mode, each block can be protected/unprotected by a
command. Power-down or hardware reset do not change the protection status.
The password protection method is available in both S29GL256P and M29W256G devices.
It is a high level security protection mode that requires a 64-bit password to unlock the
device. Read, program or erase operations are not allowed if the password is not correct.
The password protection method is a non-volatile protection.
The S29GL256P and M29W256G devices feature the same commands with the same
functions (see Table 14: Commands Cross Reference), so protection commands are fully
compatible.
Table 14.
Commands Cross Reference
M29W256G
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S29GL256P
Protection commands
Protection commands
Lock register
Lock register
Password protection
Password protection
Non-volatile protection
Global non-volatile
NVPB lock bit
Global volatile freeze (PPB Lock)
Volatile protection
Volatile
Exit protection command set
Command set exit
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5.1
Power-up waiting timing
Temporary block unprotect
In the M29W256G, when held at VID, the RP or VPP/WP pin, temporarily unprotects all the
blocks previously protected using a volatile/non-volatile protection with the NVPB lock bit
not set.
To unprotect blocks with a temporary block unprotect mode and a password mode, it is
necessary to provide the password and then put the RP or VPP/WP pin at VID.
In the M29W256G, this functionality is only available upon customer request, while it is not
available at all in S29GL256P devices.
6
Power-up waiting timing
The time needed to power up the M29W256G devices is different from the one needed by
S29GL256P devices. In particular, M29W256G needs 500 μs to accept commands
(program, erase, read CFI, etc.) and 50 μs to read content in memory cells after power-up.
The power-up waiting timing differences are shown in Table 15.
Table 15.
Power-up Waiting Timings
Waiting timing
M29W256G
S29GL256P
Unit
Time to accept commands after power-up
Min
500
Min
35
μs
Time to read memory cells after power-up
Min
50
Min
35
μs
Please refer to the M29W256G and S29GL256P datasheets for further details.
7
Conclusion
Applications can be easily migrated from an S29GL256P to an M29W256G Flash memory.
In addition, the M29W256G features better performance with respect to the S29GL256P
devices.
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Revision history
8
AN30918
Revision history
Table 16.
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Document Revision History
Date
Version
June 2009
1
Changes
Initial release.
AN309018
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