For complete product specifications, download Bourns’ data sheets: 4100R Series 4400P Series 4800P Series 4300H Series 4600H Series 4300M Series 4600M Series 4300R Series 4600X Series DRAM Applications ADDRESS ADDRESS DYNAMIC MEMORY CONTROL CPU RAS CAS WE DATA TIMING REFERENCE MEMORY CONTROL DATA DYNAMIC MEMORY ARRAY TIMING CONTROLLERS SYSTEM DATA BUS BLOCK DIAGRAM OF DRAM SYSTEM Use Bourns Networks To: • Match impedance between memory driver and the DRAM array. • Minimize reflections and ringing in DRAM inputs. • Prevent undershoot of RAS, CAS, and WE signals which may result in latch-up of DRAM inputs • Improve system performance by allowing faster setting times for DRAM inputs. EFFECT OF DAMPING RESISTOR WITHOUT DAMPING RESISTOR WITH DAMPING RESISTOR Courtesy of B. Narasimhan and J. Shaffer, Micron Techology Corporation. Need For Damping The address lines (RAS, CAS) and control lines (WE) of dynamic RAM arrays are driven in parallel, causing significant loading on the driver of the DRAM arrays. Each DRAM control input (WE) has capacitive loading between 5pF to 7pF, while each address line input has about a 10pF load. Thus each DRAM input can be modeled as a transmission line with distributed inductance and capacitance. If not properly terminated, signal reflections and ringing on the line will result, adversely affecting the performance of the memory system. The effects on signal transitions will be: 1. Increased settling time delay on low-to-high transitions. 2. Voltage undershoot on high-to-low transitions. Increased settling time due to ringing reduces system performance because the design has to allow for the settling delay before sampling the signal. Undershoot, by bringing the input voltage below 0 volts, can damage the driver IC as well as alter the DRAM’s internal address register contents, causing potential loss of data. V "HIGH" 1 LOGIC LEVEL COMPARISON OF UNDERSHOOTS WITHOUT DAMPING RESISTOR WITH DAMPING RESISTOR t1 t2 t1 - TIME TO ACCEPTABLE "LOW" LOGIC LEVEL FOR DRIVER WITHOUT DAMPING RESISTOR Specifications are subject to change without notice. t2 - TIME TO ACCEPTABLE "LOW" LOGIC LEVEL WITHDAMPING RESISTOR DRAM Applications Application Guidelines Termination of address and control lines is typically accomplished with low-valued resistors placed in series at the driver output. Selection of the proper resistance value is performed in two steps: approximation of the proper resistance using transmission line equations, and secondly, through trial and error, changing the resistance value to account for real world deviations such as PCB vias and bends. The appropriate transmission line equations are as follows: Zo = characteristic line impedance (microstrip) = 87 √ er + 1.41 In ( 5.98h 0.8w + t ) ohms Td = propagation delay of the line = 1.017 √0.475er + 0.67 ns/in. Co = trace capacitance = 1000 (Td/Zo) pF/in. Cd = equivalent trace capacitance associated with each DRAM. It takes 0.5 inch to interconnect one DRAM. = 3.5pF/0.5 in. = 7 pF/in. Zo’ = effective characteristic impedance, accounting for capacitive loading of the DRAMs. Zo = √1 + Cd/Co Td’ = effective propagation delay, accounting for the capacitive loading of the DRAMs √ Td = Td 1 + Cd/Co where er = relative dielectric constant of the PCB’s glass epoxy layer h = distance from the trace to the ground plane w = width of trace t = thickness of trace For example, for a trace with the following characteristics: er h = 5 (for G10 glass epoxy) w = 15 mils t = 3 mils = 30 mils then, Zo = 85 ohms Td = 0.15 ns/in. Co = 1.76 pF/in. Zo’ = 38 ohms Td’ = 0.35 ns/in. Thus on a theoretical basis, the design will require the resistance of 38 ohms to match the trace impedance of the PCB. However, the actual impedance will differ from this theoretical value due to the non-ideal characteristics of the PCB trace geometry (i.e., bends, curves and vias in the trace), as well as the manufacturing variations inherent in the components and materials. Therefore, a trial-and-error process must be employed in order to optimize the value of the damping resistor. The procedure involves selecting various values around the calculated value and observing the resulting waveforms on an oscilloscope. Choose the value that best balances the reduction in ringing/reflection and the reduction in speed: a large resistance value provides better damping, but will also add delay by slowing the edge rate. Typically, resistance values for memory damping will be in the range of 10 ohms to 50 ohms, with the most common values in the 20 ohm to 30 ohm range. Since memory damping is a type of series termination, distributed loading along the line will not be possible. That is, the entire lumped load must be located at the end of the line, with no other loads along the signal path. This will guarantee that the waveform will remain undisturbed as it travels along the line. For related reasons, the placement of the series damping resistor should be as close to the driving device as possible. (Ref. MMI Systems Design Handbook, pp. 10-5 and 10-6.) Specifications are subject to change without notice. DRAM Applications Bourns Networks For Memory Damping Bourns can supply a wide range of standard resistor networks for memory damping applications. Standard resistance values (see below) are normally in stock. However, any intermediate value within the range 10 ohms to 10 megohms can be supplied. The following package and pin count options are available: ... 1 4 6 10 12 14 9 16 R R R R R R R R 8 1 NUMBER OF LINES 2 MSIP* CSIP* PCC 4304M-102-RC 4604X-102-RC 3 4 5 4306R-102-RC 4308R-102-RC 4310R-102-RC 4606X-102-RC 4608X-102-RC 4610X-102-RC 4210P-102-RC 6 MSIP* CSIP* PCC DIP CSIP* SOM SOL SOL-J PCC 4612X-102-RC 7 8 9 10 4114R-1-RC 4614X-102-RC 4814P-1-RC 4116R-1-RC 4118R-1-RC 4120R-1-RC 4816P-1-RC 4416P-1-RC 4416J-1-RC 4420P-1-RC 4420J-1-RC 4420P-102-RC *MEDIUM PROFILE (.250” SEATED HEIGHT) AND HIGH PROFILE (.350” SEATED HEIGHT) ARE AVAILABLE BY PLACING THE LETTER “M” OR “H,” RESPECTIVELY, IN THE FIFTH POSITION OF THE PART NUMBER. Specifications are subject to change without notice.

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