Test Procedure for the NCN5192GEVB Evaluation Board Author: Koenraad Van den Eeckhout Date: Revision: v3 May 5, 2014 Test equipment required Oscilloscope, Power supply, Signal generator, Multimeter, communication over SPI General remarks When performing measurements on an oscilloscope capture the oscilloscope must be set so that a stable trigger is achieved. Average over the largest possible number of measurements, and limit the bandwidth to eliminate noise. Stop acquisition when taking measurements, so that all measurements are of the same waveform. A test result page is provided on the end of this document. Fill in the result of each test and print out the page for each board. When connector pin numberings are supplies, look for a square pad. This is pin 1. The connector pin numbering follows the numbering in figure 1 All SPI communication is done at 100kHz, with all signals active high and data clocked in on the falling clock edge. Figure 1: Connector pin numbering TEST 0: Visual inspection Perform a brief visual inspection of the board Check if the board is properly etched Check solder connections (loose pins, tombstoning, etc ) 5/8/2015 1 www.onsemi.com TEST 1: Idle Operation Power the board by applying VDD (nominal 3V3) and GND to the test bench. Connect a multimeter in series with the power to measure the current consumption Send the following SPI commands: o [0x42, 0x1B, 0xE4] (setting the GCR to 0xE4) o [0x46, 0xFD, 0x02] (setting the ACR to 0x02) Measure the current consumption of the board Measure AREF (IDC4 pin 9). Use a GND pin on IDC3 pin8 for the negative measure point. Measure nRTS (IDC3 pin 9). TEST 2: Transmit Operation Place a jumper connecting nRTS to GND (IDC 3 pin 9 to IDC3 pin8) Connect an oscilloscope to TxA (IDC2 pin 7) of the test bench. An image similar to figure 2 should be visible. 5/8/2015 2 www.onsemi.com Figure 2: Output waveform (mark) Measure peak-to-peak amplitude VPP,MARK of the waveform Measure the cycle time TMARK of the waveform. Measure between two points with the greatest slope so as to provide the most accurate measurement. Place a jumper connecting TxD (IDC3 pin 7) to GND (IDC3 pin 8) Measure again peak-to-peak amplitude VPP,SPACE and cycle time TSPACE TEST 3: Receive Operation Remove jumper connecting nRTS to GND (IDC 3 pin 9 to IDC3 pin8) Using a signal generator, apply a 1200Hz sine wave to IDC2 pin 3. Set the amplitude to 200mV peak-to-peak. Connect a probe to IDC3 pin 5. You should see a 1200 Hz sine wave. Measure the peak-to-peak voltage RXF,MARK Measure the delay TD,MARK between the applied sine wave and the measured wave. Measure CD,MARK on IDC3 pin 3 Measure RXD,MARK on IDC3 pin 5 Reduce the applied wave amplitude to 40mV. Pin CD should now be low. Repeat the above measurements for the space frequency 2200Hz. TEST 3: DAC Operation Send the SPI Command [0x54, 0x40, 0x00, 0x00] to set the DAC at VDD/4 Measure the average value of the output of pin 5 of IDC1. 5/8/2015 3 www.onsemi.com Test Report NCP5193 Test performed by: NAME MIN VDD 2V85 IDD,Q 300uA AREF 1V20 nRTS 2V4 NOM 3V 350uA 1V25 3V MAX MEASURED 3V30 370uA 1V30 3V15 Date: PASS/FAIL NAME VPP,MARK TMARK VPP,SPACE TSPACE MIN NOM 490mV 828us 835us 490mV 452us 455us MAX MEASURED 500mV 510mV 843us 500mV 510mV 460us PASS/FAIL NAME VDD,MIN nRST MIN MAX 2V7 1V MEASURED 2V78 PASS/FAIL NAME RXF,MARK TD,MARK CD,MARK RXD,MARK VDET,MARK RXF,SPACE TD,SPACE CD,MARK RXD,MARK VDET,SPACE MIN MAX 350mV 700us 3V 3V 160mV 350mV 420us 3V 0V 160mV MEASURED 370mV 720us 3V15 3V15 PASS/FAIL NAME DACOUT MIN 5/8/2015 0V NOM 2V62 0V NOM 330mV 680us 2V4 2V4 140mV 150mV 330mV 400us 2V4 0V 140mV 150mV 370mV 440us 3V15 0V4 NOM MAX MEASURED 712mV 750mV 825mV 4 PASS/FAIL www.onsemi.com