AME8855

Reliability Report
for
AME8855 Series Product
______________________________________________________________________
Prepared by Jess Lin, Supervisor of Quality & Reliability Dept.
Approved by Amy Shen, Manager of Production Management Dept.
REL-TM001-F-A
Table of Contents:
Ⅰ、General Description
Ⅱ、Product Information
Ⅲ、Failures In Time Calculation
Ⅳ、Product Reliability Test Result
Ⅴ、Package Reliability Test Result
Ⅵ、IR-reflow Test Result
REL-TM001-F-A
Ⅰ、General Description:
The AME8855 family of positive, CMOS linear regulators provide low dropout voltage(420mV@600mA),
low quiescent current, and low noise CMOS LDO. These rugged devices have both Thermal Shutdown,
and Current limit to prevent device failure under the "Worst" of operating conditions.
Ⅱ、Product Information:
Pin Configuration
A 1. GND
1. IN
2. OUT
2. GND
3. IN
3. OUT
4. BYP
5. OUT
(SOT-223)
(SOT-23)
(SOT-25)
(SOT-89)
A
B
1. GND
2. OUT
3. IN
(SOT-223)
(SOT-23)
(SOT-89)
C
1. GND
2. IN
3. OUT
A
1. IN
2. GND
3. GND
4. OUT
5. NC
6. GND
7. GND
8. EN
Package Type
E: SOT-2X
F: SOT-89
G: SOT-223
H: SOP
Number of Pins
A: 8
T: 3
V: 5
Output Voltage
080: 0.8V
090: 0.9V
100: 1.0V
110: 1.1V
120: 1.2V
130: 1.3V
140: 1.4V
150: 1.5V
： ：
： ：
420: 4.2V
430: 4.3V
(SOP-8)
(SOT-89)
REL-TM001-F-A
Ⅲ、Failures In Time Calculation:
Use HTOL test information mentioned in sectionⅣ, FIT (Failures In Time) can be calculated as below:
FIT  ( x 2 ( ,
CL )
 10 9 ) /( 2  S  H  AF )  ( 4 .61  10 9 ) /( 2  77  1000  280 .59 )
=106.69 (pieces per 109 hours) @ 40℃ with 90% Confidence Level.
Where AF is acceleration factor setting activation energy to 1.0eV as zero failure.
Ⅳ、Product Reliability Test Result:
Test Item
Test Condition
Sample Size / Failures
Result
HTOL
TSTRESS=125℃
77 pcs / 0 pcs
Pass
3 pcs per pin pair / 0 pcs
Pass
3 pcs per pin pair / 0 pcs
Pass
3 pcs package pair / 0 pcs
Pass
3 pcs per pin pair / 0 pcs
Pass
Duration=1000hrs
Biased, Read at
168/504/1000 hours
ESD
Human Body Model
Pin-to-Pin test
Class 2, 2kV minimum
Machine Model
Pin-to-Pin test
Class B, 200V minimum
Charged Device Model
Class II, 200V minimum
Latch-up
Level A, 100mA minimum
REL-TM001-F-A
Ⅴ、Package Reliability Test Result:
Test Item
Test Condition
Sample Size / Failures
Result
MSL
85/85 168 hours
22 pcs / 0 pcs
Level 1
77 pcs / 0 pcs
Pass
77 pcs / 0 pcs
Pass
77 pcs / 0 pcs
Pass
77 pcs / 0 pcs
Pass
5 pcs / 0 pcs
Pass
IR-reflow 3 cycles
Peak Temp.= 260℃
IPC/JEDEC J-STD-020C
HTS
Precondition NOTE 1
Temp.=150℃
Duration=1000 hours
Unbiased, Read at
1000 hours
THT
Precondition NOTE 1
Temp.=85℃, R.H.=85%
Duration=1000 hours
Unbiased,
Read at 1000 hours
PCT
Precondition NOTE 1
Temp.=121℃, R.H.=100%
15PSIG, Unbiased
Duration=168 hours
Read at 168 hours
TCT
Precondition NOTE 1
-65℃ ~ 150℃
500 cycles Unbiased,
Read at 500 cycles
Solderability
Temp.=245℃ (lead-free)
Duration=5sec
NOTE 1: 85/85 168 hours + IR-reflow 3 cycles with Peak Temp.= 260℃
REL-TM001-F-A
Ⅵ、IR-reflow Test Result:
Test Item
Test Condition
Sample Size / Failures
Result
IR-reflow
See IR reflow Profile
22 pcs / 0 pcs
Pass
Perform 3 cycles test
IR reflow Profile:
Profile Feature
Average Ramp-Up Rate
(Tsmax to Tp)
Preheat
- Temperature Min (Tsmin)
- Temperature Max (Tsmax)
- Time (tsmin to tsmax)
Time maintained above
- Temperature (TL)
- Time (tL)
Peak/Classification Temperature
(Tp)
Time within 5C of actual Peak
Temperature (tp)
Ramp-Down Rate
Time 25C to Peak Temperature
Sn-Pb Eutectic Assembly
Pb-Free Assembly
3C /second max.
3C /second max.
100C
150C
60~120 seconds
150C
200C
60~180 seconds
183C
60~150 seconds
245C
217C
60~150 seconds
260C
10~30 seconds
20~40 seconds
6C /second max.
6 minutes max.
6C /second max.
8 minutes max.
REL-TM001-F-A
The product has successfully met AME’s reliability standard that is required on all AME, Inc products.
Furthermore, QRA Dept. of AME, Inc monitors the reliability continuously to make sure that all product
will still meet AME’s reliability standard in the future.
REL-TM001-F-A