DLZ Series, H1 - Unidirectional

MIL PROCESSING TEST PLAN FOR DLZ SERIES – H1 VERSIONS
(Unidirectional)
TEST
CONDITION
Internal Visual
MIL-STD-750
TEST METHOD
2072
Storage
TA = +150°C for 24 hours
1032
Temp Cycle
10 cycles, 15 minutes each extreme @ min/max rated temps
1051
Acceleration
20KG, Y1 axis, no hold time
2006
Electrical
Reverse Current (IR) @ rated VWM
Breakdown Voltage (V(BR)) @ IT
4016
4022
Pulse
20 pulses @ IPP = 10A, tp = 8 x 20µs
Electrical
Reverse Current (IR) @ rated VWM
4016
Burn-in(HTRB)
TA = +125°C @ rated VWM for 160 hours
1038
Electrical
Reverse Current (IR) @ rated VWM, D-IR = 100% or 20% of Group A
limit, whichever is greater
Breakdown Voltage (V(BR)) @ IT, D-V(BR) ±2% from initial reading
4016
-8
atmcc/sec
4022
Fine Leak
1 x 10
1071G/H
Gross Leak
TA = +125°C, no bubbles
1071C/D
Reverse Current (IR) @ rated VWM
Breakdown Voltage (V(BR)) @ IT
Clamping Voltage (VC) @ IPP, tp = 8 x 20µs
Capacitance @ 0V
4016
4022
Marking
Group A
Attributes Data Supplied
DLZ – H1 Screening
05227.R0 11/04
ProTek Devices
2929 S. Fair Lane ● Tempe, Arizona ● 85282
Tel: 602-431-8101 ● Fax: 602-431-2288
Email: sales@protekdevices.com ● Web: www.protekdevices.com
4001
1