RENESAS 2SK4146

Preliminary Data Sheet
2SK4146
R07DS0130EJ0100
Rev.1.00
Sep 24, 2010
MOS FIELD EFFECT TRANSISTOR
Description
The 2SK4146 is N-channel MOS Field Effect Transistor designed for high current switching applications.
Features
• Low on-state resistance
⎯ RDS(on) = 10.1 mΩ MAX. (VGS = 10 V, ID = 40 A)
• Low input capacitance
⎯ Ciss = 3500 pF TYP. (VDS = 10 V)
Ordering Information
Part No.
2SK4146-S19-AY ∗1
LEAD PLATING
Pure Sn (Tin)
PACKING
50 pcs/tube
Package
TO-220, S19 tube
Note: ∗1. Pb-free (This product does not contain Pb in the external electrode.)
Absolute Maximum Ratings (TA = 25°C)
Item
Drain to Source Voltage (VGS = 0 V)
Gate to Source Voltage (VDS = 0 V)
Drain Current (DC) (TC = 25°C)
Drain Current (pulse) ∗1
Total Power Dissipation (TC = 25°C)
Total Power Dissipation (TA = 25°C)
Channel Temperature
Storage Temperature
Repetitive Avalanche Current ∗2
Repetitive Avalanche Energy ∗2
Symbol
VDSS
VGSS
ID(DC)
ID(pulse)
PT1
PT2
Tch
Tstg
IAR
EAR
Ratings
75
±20
±80
±200
84
1.5
150
−55 to +150
33
109
Unit
V
V
A
A
W
W
°C
°C
A
mJ
Notes: ∗1. PW ≤ 10 μs, Duty Cycle ≤ 1%
∗
2. Starting Tch = 25°C, VDD = 38 V, RG = 25 Ω, VGS = 20 → 0 V, L = 100 μH
Thermal Resistance
Channel to Case Thermal Resistance
Channel to Ambient Thermal Resistance
R07DS0130EJ0100 Rev.1.00
Sep 24, 2010
Rth(ch-C)
Rth(ch-A)
1.49
83.3
°C/W
°C/W
Page 1 of 6
2SK4146
Chapter Title
Electrical Characteristics (TA = 25°C)
Item
Zero Gate Voltage Drain Current
Gate Leakage Current
Gate to Source Cut-off Voltage
Forward Transfer Admittance ∗1
Symbol
IDSS
IGSS
VGS(off)
| yfs |
Min
Typ
2.0
15
RDS(on)
3.0
32
7.8
Drain to Source On-state
Resistance ∗1
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
Total Gate Charge
Gate to Source Charge
Gate to Drain Charge
Body Diode Forward Voltage ∗1
Reverse Recovery Time
Reverse Recovery Charge
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
QG
QGS
QGD
VF(S-D)
trr
Qrr
3500
620
160
26
20
85
17
61
16
20
1.0
58
125
Max
10
±100
4.0
10.1
Unit
μA
nA
V
S
mΩ
Test Conditions
VDS = 75 V, VGS = 0 V
VGS = ±20 V, VDS = 0 V
VDS = 10 V, ID = 1 mA
VDS = 10 V, ID = 40 A
VGS = 10 V, ID = 40 A
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
V
ns
nC
VDS = 10 V,
VGS = 0 V,
f = 1 MHz
VDD = 38 V, ID = 40 A,
VGS = 10 V,
RG = 0 Ω
1.5
VDD = 60 V,
VGS = 10 V,
ID = 80 A
IF = 80 A, VGS = 0 V
IF = 80 A, VGS = 0 V,
di/dt = 100 A/μ s
Note: ∗1. Pulsed
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
RG = 25 Ω
PG.
VGS = 20 → 0 V
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
L
50 Ω
VGS
RL
Wave Form
RG
PG.
VDD
VGS
0
VGS
10%
90%
VDD
VDS
90%
BVDSS
IAS
90%
VDS
VGS
0
VDS
10%
0
10%
Wave Form
VDS
ID
τ
VDD
Starting Tch
τ = 1 μs
Duty Cycle ≤ 1%
td(on)
tr
ton
td(off)
tf
toff
TEST CIRCUIT 3 GATE CHARGE
PG.
D.U.T.
IG = 2 mA
RL
50 Ω
VDD
R07DS0130EJ0100 Rev.1.00
Sep 24, 2010
Page 2 of 6
2SK4146
Chapter Title
Typical Characteristics (TA = 25°C)
DERATING FACTOR OF FORWARD BIAS SAFE
TOTAL POWER DISSIPATION vs.
OPERATING AREA
CASE TEMPERATURE
100
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
120
100
80
60
40
20
0
80
60
40
20
0
0
25
50
75
100
125
150
175
0
TC - Case Temperature - °C
25
50
75
100
125 150
175
TC - Case Temperature - °C
FORWARD BIAS SAFE OPERATING AREA
d
it e
Lim V )
n)
(o
0
i
S
1
RD S =
G
ID(DC)
(V
100
ID(pul s e)
PW
=1
i
1i
m
00
μs
s
i
1i 0
m
i
10
s
w
Po
D
er
is
1
p
si
ID - Drain Current - A
1000
io
at
n
d
it e
m
Li
TC = 25°C
Single Pulse
0.1
0.1
1
10
100
VDS - Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
rth(t) - Transient Thermal Resistance - °C/W
100
Rth(ch-A) = 83.3 °C/W
10
Rth(ch-C) = 1.49 °C/W
1
0.1
0.001
1m
Single Pulse
0.01
10
m
0.1 m
100
11
10
10
100
100
1000
1000
PW - Pulse Width - s
R07DS0130EJ0100 Rev.1.00
Sep 24, 2010
Page 3 of 6
2SK4146
Chapter Title
DRAIN CURRENT vs.
FORWARD TRANSFER CHARACTERISTICS
250
1000
200
100
ID - Drain Current - A
ID - Drain Current - A
DRAIN TO SOURCE VOLTAGE
150
100
50
V GS = 10 V
Pulsed
0
0
1
2
3
4
5
TA = -55°C
25°C
75°C
150°C
10
1
0.1
V DS = 10 V
Pulsed
0.01
0
6
2
4
5
6
GATE TO SOURCE CUT-OFF VOLTAGE
FORWARD TRANSFER ADMITTANCE vs. DRAIN
vs. CHANNEL TEMPERATURE
CURRENT
100
| yfs | - Forward Transfer Admittance - S
4.0
3.5
3.0
2.5
2.0
1.5
1.0
V DS = 10 V
ID = 1 mA
Pulsed
0.5
0.0
-75
-25
25
75
125
175
TA = -55°C
25°C
75°C
150°C
10
V DS = 10 V
Pulsed
1
0.1
1
10
100
ID - Drain Current - A
Tch - Channel Temperature - °C
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
GATE TO SOURCE VOLTAGE
20
16
12
8
4
V GS = 10 V
Pulsed
0
0
1
10
100
ID - Drain Current - A
R07DS0130EJ0100 Rev.1.00
Sep 24, 2010
1000
RDS(on) - Drain to Source On-state Resistance - mΩ
RDS(on) - Drain to Source On-state Resistance - mΩ
3
VGS - Gate to Source Voltage - V
VDS - Drain to Source Voltage - V
VGS(off) - Gate to Source Cut-off Voltage - V
1
20
ID = 16 A
40 A
16
80 A
12
8
4
0
Pulsed
0
4
8
12
16
20
VGS - Gate to Source Voltage - V
Page 4 of 6
2SK4146
Chapter Title
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
20
10000
ID = 40 A
V GS = 10 V
Pulsed
16
Ciss, Coss, Crss - Capacitance - pF
12
8
4
0
1000
Coss
100
Crss
V GS = 0 V
f = 1 MHz
10
-75
-25
25
75
125
0.1
175
10
100
VDS - Drain to Source Voltage - V
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
16
80
td(off)
100
tf
td(on)
tr
10
V DD = 38 V
V GS = 10 V
RG = 0 Ω
1
0.1
1
10
VDS - Drain to Source Voltage - V
1000
V GS
15 V
40
8
4
20
ID = 80 A
0
100
0
10
20
30
40
50
60
0
70
QG - Gate Charge - nC
REVERSE RECOVERY TIME vs.
DIODE FORWARD CURRENT
1000
0V
V GS = 10 V
1
Pulsed
0.5
1.0
VF(S-D) - Source to Drain Voltage - V
R07DS0130EJ0100 Rev.1.00
Sep 24, 2010
1.5
trr - Reverse Recovery Time - ns
1000
100
0.1
0.0
12
38 V
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
10
V DD = 60 V
V DS
60
ID - Drain Current - A
IF - Diode Forward Current - A
1
Tch - Channel Temperature - °C
SWITCHING CHARACTERISTICS
td(on), tr, td(off), tf - Switching Time - ns
Ciss
100
10
di/dt = 100 A/μs
V GS = 0 V
1
0.1
1
10
100
IF - Diode Forward Current - A
Page 5 of 6
VGS - Gate to Source Voltage - V
RDS(on) - Drain to Source On-state Resistance - mΩ
CHANNEL TEMPERATURE
2SK4146
Chapter Title
Package Drawings (Unit: mm)
4.8 MAX.
10.2 MAX.
3.6±0.2
1.3±0.2
1 2 3
3.0 TYP.
1.52±0.2
0.8±0.1
12.7 MIN.
4
15.9 MAX.
8.7 TYP.
6.3 MIN.
2.8±0.3
TO-220 (Mass: 1.9 g TYP.)
0.5±0.2
2.4±0.2
2.54 TYP.
2.54 TYP.
1.Gate
2.Drain
3.Source
4.Fin (Drain)
Equivalent Circuit
Drain
Body
Diode
Gate
Source
Remark
Strong electric field, when exposed to this device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static
electricity as much as possible, and quickly dissipate it once, when it has occurred.
R07DS0130EJ0100 Rev.1.00
Sep 24, 2010
Page 6 of 6
Revision History
2SK4146
Rev.
Date
Page
1.00
Sep 24, 2010
−
Description
Summary
First Edition Issued
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C-1
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