IDT IDT74FCT574CSO


IDT54/74FCT374/A/C
IDT54/74FCT534/A/C
IDT54/74FCT574/A/C
FAST CMOS OCTAL D
REGISTERS (3-STATE)
Integrated Device Technology, Inc.
FEATURES:
DESCRIPTION:
• IDT54/74FCT374/534/574 equivalent to FAST speed
and drive
• IDT54/74FCT374A/534A/574A up to 30% faster than
FAST
• IDT54/74FCT374C/534C/574C up to 50% faster than
FAST
• IOL = 48mA (commercial) and 32mA (military)
• CMOS power levels (1mW typ. static)
• Edge triggered master/slave, D-type flip-flops
• Buffered common clock and buffered common threestate control
• Product available in Radiation Tolerant and Radiation
Enhanced versions
• Military product compliant to MIL-STD-883, Class B
• Meets or exceeds JEDEC Standard 18 specifications
The IDT54/74FCT374/A/C, IDT54/74FCT534/A/C and
IDT54/74FCT574/A/C are 8-bit registers built using an advanced dual metal CMOS technology. These registers consist
of eight D-type flip-flops with a buffered common clock and
buffered 3-state output control. When the output enable (OE)
is LOW, the eight outputs are enabled. When the OE input is
HIGH, the outputs are in the high-impedance state.
Input data meeting the set-up and hold time requirements
of the D inputs is transferred to the O outputs on the LOW-toHIGH transition of the clock input.
The IDT54/74FCT374/A/C and IDT54/74FCT574/A/ C have
non-inverting outputs with respect to the data at the D inputs.
The IDT54/74FCT534/A/C have inverting outputs.
FUNCTIONAL BLOCK DIAGRAM IDT54/74FCT374 AND IDT54/74FCT574
D0
D1
D2
D3
D4
D5
D6
D7
CP
CP D
CP D
CP D
CP D
CP D
CP D
CP D
CP D
Q
Q
Q
Q
Q
Q
Q
Q
O0
O1
O2
O3
O4
O5
O6
O7
OE
2603 cnv* 01
FUNCTIONAL BLOCK DIAGRAM IDT54/74FCT534
D0
D1
D2
D3
D4
D5
D6
D7
CP
CP D
CP D
CP D
CP D
CP D
CP D
CP D
CP D
Q
Q
Q
Q
Q
Q
Q
Q
O0
O1
O2
O3
O4
O5
O6
O7
OE
2603 cnv* 02
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FAST is a trademark of National Semiconductor, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
1992 Integrated Device Technology, Inc.
7.13
MAY 1992
DSC-4622/2
1
IDT54/74FCT374/534/574/A/C
FAST CMOS OCTAL D REGISTERS (3-STATE)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
D5
6
D2
7
D3
8
13
D4
O3
GND
9
12
10
11
O4
CP
O1
O2
6
D2
D3
7
2
1
20
VCC
2
3
19
O0
5
D4
6
17
16
15
O6
15
O5
14
D5
O3
2603 cnv* 04
D1
5
1
O2
6
1
O3
7
1
O4
8
1
O5
O3
O4
D4
D5
D6
D6
8
13
O5
O6
D7
GND
9
12
O7
10
11
CP
2 1
O1
D3
7
1
1
O1
O2
4
D5
14
3 2
D2
L20-2
9 1 1 1 1
D7
GND
D3
P20-1
D20-1
SO20-2
&
E20-1
16
LCC
TOP VIEW
INDEX
4
D6
9 10 11 12 13
IDT54/74FCT574
18
D7
17
L20-2
DIP/SOIC/CERPACK
TOP VIEW
D1
D2
20 19
18
8
2603 cnv* 03
OE
D0
1
D4
14
O2
5
3
O4
15
O6
O5
5
4
VCC
O0
16
O1
D1
2603 cnv* 05
O7
D6
P20-1
D20-1
SO20-2
&
E20-1
O6
17
4
OE
VCC
O7
D7
CP
O7
18
OE
19
CP
2
3
INDEX
VCC
D0
20
GND
D0
D1
1
D0
OE
O0
O0
IDT54/74FCT374
2603 cnv* 06
LCC
TOP VIEW
DIP/SOIC/CERPACK
TOP VIEW
19
O7
18
D7
D1
4
D6
O1
5
O2
6
D2
7
P20-1 17
D20-1 16
SO20-2
15
&
E20-1 14
D3
8
13
D4
O3
GND
9
12
O4
10
11
CP
3 2
O6
O5
D5
D1
4
O1
5
O2
D2
D3
6
VCC
O7
2
3
1
20 19
18
17
D7
D6
16
O6
7
15
8
14
O5
D5
L20-2
9 10 11 12 13
2603 cnv* 07
DIP/SOIC/CERPACK
TOP VIEW
D4
O0
D0
VCC
CP
O4
20
O0
1
O3
GND
OE
D0
INDEX
OE
IDT54/74FCT534
2603 cnv* 08
LCC
TOP VIEW
7.13
2
IDT54/74FCT374/534/574/A/C
FAST CMOS OCTAL D REGISTERS (3-STATE)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN DESCRIPTION
Pin Names
DN
CP
Description
D flip-flop data inputs.
Clock Pulse for the register. Enters data on
LOW-to-HIGH transition.
3-state outputs, (true).
ON
ON
OE
3-state outputs, (inverted).
Active LOW 3-state Output Enable input.
2603 tbl 06
FUNCTION TABLE(1)
FCT534
Outputs
Internal
Inputs
Function
Hi-Z
Load Register
OE
CP
DN
ON
QN
ON
QN
H
H
L
L
H
H
L
H
X
X
L
H
L
H
Z
Z
H
L
Z
Z
NC
NC
L
H
L
H
Z
Z
L
H
Z
Z
NC
NC
H
L
H
L
u
u
u
u
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
2603 tbl 05
Z = High Impedance
NC = No Change
= LOW-to-HIGH transition
u
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Rating
Commercial
VTERM(2) Terminal Voltage
–0.5 to +7.0
with Respect to
GND
(3)
VTERM
Terminal Voltage
–0.5 to VCC
with Respect to
GND
TA
Operating
0 to +70
Temperature
TBIAS
Temperature
–55 to +125
Under Bias
TSTG
Storage
–55 to +125
Temperature
PT
Power Dissipation
0.5
IOUT
DC Output
Current
FCT374/574
Outputs
Internal
120
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Military
–0.5 to +7.0
Unit
V
–0.5 to VCC
V
–55 to +125
°C
–65 to +135
°C
–65 to +150
°C
0.5
W
120
mA
Symbol
Parameter(1)
CIN
Input
Capacitance
COUT
Output
Capacitance
Conditions
VIN = 0V
Typ.
6
Max.
10
Unit
VOUT = 0V
8
12
pF
pF
NOTE:
2603 tbl 02
1. This parameter is measured at characterization but not tested.
NOTES:
2603 tbl 01
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may
exceed VCC by +0.5V unless otherwise noted.
2. Input and VCC terminals only.
3. Outputs and I/O terminals only.
7.13
3
IDT54/74FCT374/534/574/A/C
FAST CMOS OCTAL D REGISTERS (3-STATE)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Parameter
Input HIGH Level
Test Conditions(1)
Guaranteed Logic HIGH Level
VIL
Input LOW Level
Guaranteed Logic LOW Level
II H
Input HIGH Current
VCC = Max.
VI = VCC
VI = 2.7V
Symbol
VIH
II L
IOZH
Input LOW Current
Off State (High Impedance)
VCC = Max.
Output Current
IOZL
Typ.(2)
—
Max.
—
—
—
0.8
V
—
—
5
µA
—
—
5(4)
VI = 0.5V
—
—
–5(4)
VI = GND
—
—
–5
VO = VCC
—
—
10
Min.
2.0
VO = 2.7V
—
—
10(4)
VO = 0.5V
—
—
–10(4)
VO = GND
—
—
–10
Unit
V
µA
VIK
Clamp Diode Voltage
VCC = Min., IN = –18mA
—
–0.7
–1.2
V
IOS
Short Circuit Current
VCC = Max.(3) , VO = GND
–60
–120
—
mA
VOH
Output HIGH Voltage
VCC = 3V, VIN = VLC or VHC, IOH = –32µA
VHC
VCC
—
V
VOL
Output LOW Voltage
VCC = Min.
IOH = –300µA
VHC
VCC
—
VIN = VIH or VIL
IOH = –12mA MIL.
2.4
4.3
—
IOH = –15mA COM'L.
2.4
4.3
—
VCC = 3V, VIN = VLC or VHC, IOL = 300µA
—
GND
VLC
VCC = Min.
IOL = 300µA
—
GND
VLC(4)
VIN = VIH or VIL
IOL = 32mA MIL.
—
0.3
0.5
IOL = 48mA COM'L.
—
0.3
0.5
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. This parameter is guaranteed but not tested.
7.13
V
2603 tbl 03
4
IDT54/74FCT374/534/574/A/C
FAST CMOS OCTAL D REGISTERS (3-STATE)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
VLC = 0.2V; VHC = VCC – 0.2V
Symbol
ICC
Test Conditions(1)
Parameter
Quiescent Power Supply Current
VCC = Max.
VIN ≥ VHC; V
IN
≤ V LC
Min.
Typ.(2)
Max.
Unit
—
0.2
1.5
mA
—
0.5
2.0
mA
∆ICC
Quiescent Power Supply Current
TTL Inputs HIGH
VCC = Max.
VIN = 3.4V(3)
ICCD
Dynamic Power Supply
Current(4)
VCC = Max.
Outputs Open
OE = GND
One Input Toggling
50% Duty Cycle
VIN ≥ VHC
VIN ≤ VLC
—
0.15
0.25
mA/
MHz
IC
Total Power Supply Current (6)
VCC = Max.
Outputs Open
fCP = 10MHz
50% Duty Cycle
OE = GND
fi = 5MHz
50% Duty Cycle
One Bit Toggling
VIN ≥ VHC
VIN ≤ VLC
(FCT)
—
1.7
4.0
mA
VIN = 3.4V
VIN = GND
—
2.2
6.0
VCC = Max.
Outputs Open
fCP = 10MHz
50% Duty Cycle
OE = GND
Eight Bits Toggling
fi = 2.5MHz
50% Duty Cycle
VIN ≥ VHC
VIN ≤ VLC
(FCT)
—
4.0
7.8 (5)
VIN = 3.4V
VIN = GND
—
6.2
16.8 (5)
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V); all other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCP/2 + fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Input Frequency
Ni = Number of Inputs at fi
All currents are in milliamps and all frequencies are in megahertz.
7.13
2603 tbl 04
5
IDT54/74FCT374/534/574/A/C
FAST CMOS OCTAL D REGISTERS (3-STATE)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT374/534/574
Com'l.
Symbol
Parameter
tPLH
tPHL
Propagation Delay
CP to ON(3)
tPZH
tPZL
tPHZ
tPLZ
tSU
Output Enable Time
tH
tW
Output Disable Time
Set-up Time HIGH
or LOW, DN to CP
Hold Time HIGH
or LOW, DN to CP
CP Pulse Width
HIGH or LOW
Conditions(1)
CL = 50pF
RL = 500Ω
Min.(2)
Mil.
Max.
Min.(2)
2.0
10.0
1.5
FCT374A/534A/574A
FCT374C/534C/574C
Com'l.
Com'l.
Max.
Min.(2)
2.0
11.0
12.5
1.5
1.5
8.0
2.0
Mil.
Max.
Min.(2)
Max.
Min.(2)
2.0
6.5
2.0
7.2
14.0
1.5
6.5
1.5
1.5
8.0
1.5
5.5
—
2.0
—
2.0
1.5
—
1.5
—
7.0
—
7.0
—
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. ON for FCT374 and FCT574, ON for FCT534.
Mil.
Max.
Min.(2)
Max.
Unit
2.0
5.2
2.0
6.2
ns
7.5
1.5
5.5
1.5
6.2
ns
1.5
6.5
1.5
5.0
1.5
5.7
ns
—
2.0
—
2.0
—
2.0
—
ns
1.5
—
1.5
—
1.5
—
1.5
—
ns
5.0
—
6.0
—
5.0
—
6.0
—
ns
2603 tbl 07
7.13
6
IDT54/74FCT374/534/574/A/C
FAST CMOS OCTAL D REGISTERS (3-STATE)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
SWITCH POSITION
TEST CIRCUITS FOR ALL OUTPUTS
VCC
7.0V
500Ω
V OUT
VIN
Pulse
Generator
D.U.T.
50pF
RT
500Ω
SET-UP, HOLD AND RELEASE TIMES
Closed
All Other Tests
Open
3V
1.5V
0V
tH
TIMING
INPUT
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
tW
t REM
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
Open Drain
Disable Low
Enable Low
PULSE WIDTH
DATA
INPUT
ASYNCHRONOUS CONTROL
Switch
DEFINITIONS:
2603 tbl 08
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse
Generator.
CL
t SU
Test
t SU
1.5V
3V
1.5V
0V
tH
PROPAGATION DELAY
ENABLE AND DISABLE TIMES
ENABLE
DISABLE
3V
3V
1.5V
SAME PHASE
INPUT TRANSITION
t PLH
t PHL
CONTROL
INPUT
OUTPUT
NORMALLY SWITCH
LOW CLOSED
t PZH
VOL
t PLH
t PHL
OUTPUT SWITCH
NORMALLY OPEN
HIGH
3V
OPPOSITE PHASE
INPUT TRANSITION
1.5V
0V
t PLZ
t PZL
0V
VOH
1.5V
OUTPUT
1.5V
3.5V
1.5V
3.5V
0.3V
V OL
t PHZ
0.3V
1.5V
0V
V OH
0V
0V
NOTES
2603 drw 15
1. Diagram shown for input Control Enable-LOW and input Control
Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0 MHz; ZO ≤ 50Ω; tF ≤ 2.5ns;
tR ≤ 2.5ns.
7.13
7
IDT54/74FCT374/534/574/A/C
FAST CMOS OCTAL D REGISTERS (3-STATE)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT
FCT
XX
XXXX
Temp. Range
Device Type
X
Package
X
Process
Blank
B
Commercial
MIL-STD-883, Class B
P
D
SO
L
E
Plastic DIP
CERDIP
Small Outline IC
Leadless Chip Carrier
CERPACK
374
574
534
374A
574A
534A
374C
574C
534C
Non-Inverting Octal D Register
Non-Inverting Octal D Register
Inverting Octal D Register
Fast Non-Inverting Octal D Register
Fast Non-Inverting Octal D Register
Fast Inverting Octal D Register
Super Fast Non-Inverting Octal D Register
Super Fast Non-Inverting Octal D Register
Super Fast Inverting Octal D Register
54
74
–55°C to +125°C
0°C to +70°C
2603 cnv* 14
7.13
8