5076 series VCXO Module IC with Built-in Varicap OVERVIEW The 5076 series are miniature VCXO ICs that provide a wide frequency pulling range, even when using miniature crystal units for which a wide pulling range is difficult to provide. They employ a recently developed varicap diode fabrication process that provides a wide frequency pulling range and good linearity without any external components. Also, they employ a regulated voltage drive oscillator circuit that significantly reduces current consumption, crystal current, and oscillation characteristics supply voltage dependency. The 5076 series are ideal for miniature, wide pulling range, low power consumption, VCXO modules. FEATURES ■ ■ ■ ■ ■ ■ VCXO with recently developed varicap diode built-in New fabrication process that significantly reduces parasitic capacitance and provides wide pulling range even when using miniature crystal units Regulated voltage drive oscillator circuit for reduced power consumption, crystal drive current, and oscillation characteristics voltage dependency Wide frequency pulling range • ± 160ppm (B1 version, f = 27MHz) (Crystal: γ = 300, C0 = 1.5pF) Operating supply voltage range: 1.6V to 2.0V Oscillation frequency range (for fundamental oscillation): 20MHz to 55MHz (varies with version) ■ ■ ■ ■ ■ ■ Low current consumption: 0.5mA (B1 version, f = 27MHz, no load, VDD = 1.8V) Frequency divider built-in • Selectable by version: fO, fO/2, fO/4, fO/8, fO/16 • Frequency divider output for 1.3MHz (min) low frequency output VC pin input resistance: 10MΩ (min) CMOS output Two types of pad layout selectable by mounting method • A× version: for Flip Chip Bonding • B× version: for Wire Bonding Package: Wafer form (WF5076××) Chip form (CF5076××) APPLICATIONS ■ 2.5 × 2.0mm, 3.2 × 2.5mm size miniature VCXO modules for digital mobile TV tuner, digital TV (PDP, LCD), PND (Personal Navigation Device), etc. ORDERING INFORMATION Device Package WF5076××−4 Wafer form CF5076××−4 Chip form SEIKO NPC CORPORATION —1 5076 series SERIES CONFIGURATION Operating supply voltage range [V] PAD layout Output frequency and version name*2 Recommended operating frequency range*1 [MHz] fO output fO/2 output fO/4 output fO/8 output fO/16 output 20 to 40 (5076A1) (5076A2) (5076A3) (5076A4) (5076A5) 40 to 55 (5076AJ) (5076AK) (5076AL) (5076AM) (5076AN) 20 to 40 5076B1 (5076B2) (5076B3) (5076B4) (5076B5) 40 to 55 (5076BJ) (5076BK) (5076BL) (5076BM) (5076BN) Flip Chip Bonding 1.6 to 2.0 Wire Bonding *1. The recommended operating frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. Versions in parentheses ( ) are under development. Please contact us for further details. VERSION NAME Device Package WF5076××–4 Wafer form CF5076××–4 Chip form Version name WF5076 Form WF: Wafer form CF: Chip (Die) form −4 Oscillation frequency range, frequency divider function Pad layout type A: for Flip Chip Bonding B: for Wire Bonding SEIKO NPC CORPORATION —2 5076 series PAD LAYOUT (Unit: µm) ■ 5076A× (for Flip Chip Bonding) ■ 5076B× (for Wire Bonding) (420, 345) Y VSS 5 VC 6 (0,0) 1 (−420, −345) 4 Q 3 VDD (420, 345) Q 5 Y VDD 6 2 XT (−420, −345) XTN X 2 XTN XT 3 VC Chip size: 0.84 × 0.69mm Chip thickness: 130µm ± 15µm PAD size: 90µm × 90µm Chip base: VSS level PIN DESCRIPTION Pad dimensions [µm] Pad No. 1 VSS X Chip size: 0.84 × 0.69mm Chip thickness: 130µm ± 15µm PAD size: 90µm × 90µm Chip base: VSS level PAD DIMENSIONS (0,0) 4 Pad No. Pin I/O 2 XT I Crystal connection pin (amplifier input) 2 1 XTN O Crystal connection pin (amplifier output) –21 3 6 VDD – (+) supply pin 315 225 4 5 Q O Clock output pin 5 –315 225 5 4 VSS – (−) supply pin 6 –315 –21 6 3 VC I Oscillation frequency control voltage input pin (positive polarity) (frequency increases with increasing voltage) X Y 5076A× 5076B× 1 –189 –240 1 2 189 –240 3 315 4 Description BLOCK DIAGRAM Voltage Regulator Rf VDD CIN Oscillation Detector XT RD COUT XTN RVC2 VC 1 N *1 RVC1 CVC1 Level Shifter CMOS ouput Buffer Q CVC2 VSS *1. N = 1, 2, 4, 8, 16 SEIKO NPC CORPORATION —3 5076 series ABSOLUTE MAXIMUM RATINGS VSS = 0V Parameter Symbol Conditions Rating Unit −0.5 to +5.0 V Supply voltage range VDD Between VDD and VSS Input voltage range*1 VIN Input pins −0.5 to VDD + 0.5 V −0.5 to VDD + 0.5 V −65 to +150 °C ± 20 mA Output voltage range*1 VOUT Output pins Storage temperature range TSTG Wafer form, chip form Output current IOUT Q pin *1. VDD is a VDD value of recommended operating conditions. Note. Absolute maximum ratings are the values that must never exceed even for a moment. This product may suffer breakdown if any one of these parameter ratings is exceeded. Operation and characteristics are guaranteed only when the product is operated at recommended supply voltage range. RECOMMENDED OPERATING CONDITIONS VSS = 0V Rating Parameter Symbol Conditions Unit Min Typ Max Operating supply voltage VDD CLOUT ≤ 15pF 1.6 – 2.0 V Input voltage VIN VC pin VSS – VDD V –40 – +85 °C 5076×1 to 5076×5 20 – 40 MHz 5076×J to 5076×N 40 – 55 MHz 5076×1 to 5076×5 1.25 – 40 MHz 5076×J to 5076×N 2.5 – 55 MHz Operating temperature TOPR Oscillation frequency*1 fO Output frequency fOUT CLOUT ≤ 15pF *1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. Note. Mount a ceramic chip capacitor that is larger than 0.01µF proximal to IC (within approximately 3mm) between VDD and VSS in order to obtain stable operation of 5076 series. In addition, the wiring pattern between IC and capacitor should be as wide as possible. SEIKO NPC CORPORATION —4 5076 series ELECTRICAL CHARACTERISTICS 5076×1 to 5076×5 VDD = 1.6 to 2.0V, VC = 0.5VDD, VSS = 0V, Ta = –40 to +85°C unless otherwise noted. Rating Parameter Current consumption Symbol IDD Conditions Unit Min Typ Max 5076×1 (fO), Measurement circuit 1, no load, fO = 27MHz, fOUT = 27MHz, VDD = 1.8V – 0.5 1.0 mA 5076×2 (fO/2), Measurement circuit 1, no load, fO = 27MHz, fOUT = 13.5MHz, VDD = 1.8V – 0.4 0.8 mA 5076×3 (fO/4), Measurement circuit 1, no load, fO = 27MHz, fOUT = 6.75MHz, VDD = 1.8V – 0.3 0.6 mA 5076×4 (fO/8), Measurement circuit 1, no load, fO = 27MHz, fOUT = 3.38MHz, VDD = 1.8V – 0.3 0.6 mA 5076×5 (fO/16), Measurement circuit 1, no load, fO = 27MHz, fOUT = 1.69MHz, VDD = 1.8V – 0.3 0.6 mA HIGH-level output voltage VOH Q pin, Measurement circuit 2, IOH = –2.0mA VDD – 0.4 – – V LOW-level output voltage VOL Q pin, Measurement circuit 2, IOL = 2.0mA – – 0.4 V Oscillator block built-in resistance RVC1 210 420 840 kΩ 210 420 840 kΩ VC = 0.2V – 4.7 – pF VC = 0.9V – 2.9 – pF VC = 1.6V – 1.7 – pF VC = 0.2V – 4.7 – pF VC = 0.9V – 2.9 – pF VC = 1.6V – 1.7 – pF Measurement circuit 4, Ta = 25°C 10 – – MΩ Measurement circuit 5, –3dB frequency, VDD = 1.8V, VC = 1.8Vp-p, Ta = 25°C, fO = 27MHz – 100 – kHz Measurement circuit 3 RVC2 CVC1 Design value (a monitor pattern on a wafer is tested), Excluding parasitic capacitance. Oscillator block built-in capacitance CVC2 VC input resistance Modulation characteristics*1 RVIN fm *1. The modulation characteristics may vary with the crystal used. SEIKO NPC CORPORATION —5 5076 series 5076×J to 5076×N VDD = 1.6 to 2.0V, VC = 0.5VDD, VSS = 0V, Ta = –40 to +85°C unless otherwise noted. Rating Parameter Current consumption Symbol IDD Conditions Unit Min Typ Max 5076×J (fO), Measurement circuit 1, no load, fO = 48MHz, fOUT = 48MHz, VDD = 1.8V – 0.9 1.8 mA 5076×K (fO/2), Measurement circuit 1, no load, fO = 48MHz, fOUT = 24MHz, VDD = 1.8V – 0.6 1.2 mA 5076×L (fO/4), Measurement circuit 1, no load, fO = 48MHz, fOUT = 12MHz, VDD = 1.8V – 0.5 1.0 mA 5076×M (fO/8), Measurement circuit 1, no load, fO = 48MHz, fOUT = 6MHz, VDD = 1.8V – 0.4 0.8 mA 5076×N (fO/16), Measurement circuit 1, no load, fO = 48MHz, fOUT = 3MHz, VDD = 1.8V – 0.4 0.8 mA HIGH-level output voltage VOH Q pin, Measurement circuit 2, IOH = –2.0mA VDD – 0.4 – – V LOW-level output voltage VOL Q pin, Measurement circuit 2, IOL = 2.0mA – – 0.4 V Oscillator block built-in resistance RVC1 210 420 840 kΩ 210 420 840 kΩ VC = 0.2V – 4.7 – pF VC = 0.9V – 2.9 – pF VC = 1.6V – 1.7 – pF VC = 0.2V – 4.7 – pF VC = 0.9V – 2.9 – pF VC = 1.6V – 1.7 – pF Measurement circuit 4, Ta = 25°C 10 – – MΩ Measurement circuit 5, –3dB frequency, VDD = 1.8V, VC = 1.8Vp-p, Ta = 25°C, fO = 48MHz – 35 – kHz Measurement circuit 3 RVC2 CVC1 Design value (a monitor pattern on a wafer is tested), Excluding parasitic capacitance. Oscillator block built-in capacitance CVC2 VC input resistance Modulation characteristics*1 RVIN fm *1. The modulation characteristics may vary with the crystal used. SEIKO NPC CORPORATION —6 5076 series SWITCHING CHARACTERISTICS VDD = 1.6 to 2.0V, VC = 0.5VDD, VSS = 0V, Ta = –40 to +85°C unless otherwise noted. Rating Parameter Symbol Conditions Unit Min Typ Max Output rise time tr Measurement circuit 6, 0.2VDD → 0.8VDD, CLOUT = 15pF – 3.1 6.0 ns Output fall time tf Measurement circuit 6, 0.8VDD → 0.2VDD, CLOUT = 15pF – 3.1 6.0 ns Measurement circuit 6, Ta = 25°C, CLOUT = 15pF, VDD = 1.8V 45 50 55 % Output duty cycle Duty Switching Time Measurement Waveform 0.8VDD TW 0.2VDD 0.2VDD DUTY measurement voltage (0.5VDD) DUTY= TW/ T 100 (%) T tr Q 0.8VDD tf SEIKO NPC CORPORATION —7 5076 series MEASUREMENT CIRCUITS Measurement Circuit 1 Measurement Circuit 4 Measurement parameter: IDD Measurement parameter: RVIN IDD A VDD XT IVIN A VDD XT Crystal XTN Q IVIN VC VSS VC 0.1µF VDD RVIN = XTN VSS Measurement Circuit 5 Measurement parameter: fm Measurement Circuit 2 Measurement parameter: VOH, VOL VDD XT Crystal Signal Generator 0.1µF VDD 0.001µF XT 0.1µF Gain-phase Analyzer (HP 4194A) 50Ω XTN 50Ω Q VOH VOL V VC VSS 0.1µF VOH VS VS adjusted such that ∆V = 50 × IOH. VS VOL ∆V VS adjusted such that ∆V = 50 × IOL. C1 XTN Q R1 VC VSS R2 CLOUT = 15pF VS Modulaiton Analyzer (HP 8901B) ∆V Modulation signal Demodulation signal C1 = 33µF, R1 = R2 = 1MΩ VC modulation signal: 100Hz to 100kHz, 0 to VDDp-p Measurement Circuit 6 Measurement parameter: Duty, tr , tf XT input signal: 1Vp-p, sine wave VDD Measurement Circuit 3 Crystal Measurement parameter: RVC1, RVC2 XT XTN Q VC 0.1µF IXT A VDD IXTN A CLOUT = 15pF (Including probe capacitance) VDD XT XT XTN XTN VC VSS VC VSS RVC1 = VSS VDD IXT RVC2 = VDD IXTN SEIKO NPC CORPORATION —8 5076 series FUNCTIONAL DESCRIPTION Oscillation Start-up Detector Function The devices also feature an oscillation start-up detector circuit. This circuit functions to disable the outputs until the oscillation starts. This prevents unstable oscillator output at oscillator start-up when power is applied. TYPICAL PERFORMANCE (5076B1) The following characteristics measured using the crystal below. Note that the characteristics will vary with the crystal used. ■ Crystal used for measurement ■ Parameter fO = 27MHz C0 [pF] 1.5 γ (= C0/C1) 300 Crystal equivalent circuit C1 L1 R1 C0 Frequency Pulling Range Pulling Sensitivity 250 250 200 200 Sensitivity [ppm/V] Pulling range [ppm] 150 100 50 0 −50 −100 −150 150 100 50 −200 −250 0.0 0 0.3 0.6 0.9 1.2 1.5 1.8 VC [V] VDD = 1.8V, fOUT = 27MHz, Ta = R.T. 0.0 0.3 0.6 0.9 VC [V] 1.2 1.5 1.8 VDD = 1.8V, fOUT = 27MHz, Ta = R.T. Measurement circuit VDD Crystal XT XTN Q VC 0.1µF VSS CLOUT = 15pF (Including probe capacitance) SEIKO NPC CORPORATION —9 5076 series Current Consumption Measurement circuit 3 IDD A 2.5 VDD IDD [mA] 2 VC = 0V VC = 0.9V VC = 1.8V XT Crystal XTN CLOUT = 15pF 1.5 Q VC 1 0.1µF VC = 0V VC = 0.9V VC = 1.8V 0.5 VSS CLOUT = No load 0 15 20 25 30 35 Frequency [MHz] 40 45 VDD = 1.8V, Ta = R.T. Frequency Stability by Supply Voltage Change Measurement circuit 3.0 VDD 2.0 Crystal ∆f/f [ppm] 1.0 XT XTN 0.0 Q 0.1µF VC = 0V VC = 1.8V VC = 0.9V VC CLOUT = 15pF (Including probe capacitance) VSS −1.0 −2.0 −3.0 1.6 1.7 1.8 1.9 2.0 VDD [V] fOUT = 27MHz, ± 0ppm at VDD = 1.8V, Ta = R.T. Drive Level Measurement circuit 30 25 VDD Drive level [µW] Crystal 0.1µF XT 20 Tektronix CT-6 Current Probe 15 XTN Q IX'tal VC VSS 10 CLOUT = 15pF 5 0 0.0 0.3 0.6 0.9 VC [V] 1.2 VDD = 1.8V, fOUT = 27MHz, Ta = R.T. 1.5 1.8 DL = (IX’tal)2 × Re DL: drive level IX’tal: current flowing to crystal (RMS value) Re: crystal effective resistance SEIKO NPC CORPORATION —10 5076 series Negative Resistance 15 Frequency [MHz] 25 30 35 20 Measurement circuit 40 45 Negative resistance [Ω] 0 Network Analyzer (Agilent 4396B) S-Parameter Test Set (Agilent 85046A) VC = 1.8V −200 −400 C0 = 2pF VDD 0.1µF XT XTN Q VC VC = 0.9V VSS −600 VC = 0V −800 VDD = 1.8V, C0 = 2pF, Ta = R.T. Note. "C0" value is set, concerning the actual crystal characteristics connected between XT and XTN. The data is measured with Agilent 4396B using NPC’s original measurement jig. The values may vary with measurement jig and conditions. Phase Noise Measurement circuit Phase noise [dBc/Hz] −60 VDD −80 Crystal XT 0.1µF 200Ω −100 XTN −120 VC Q 0.01µF VSS −140 Signal Source Analyzer (Agilent E5052A) CLOUT = 15pF VC = 1.8V VC = 0.9V VC = 0V −160 10 100 1,000 10,000 100,000 1,000,000 10,000,000 Offset Frequency [Hz] VDD = 1.8V, fOUT = 27MHz, Ta = R.T. SEIKO NPC CORPORATION —11 5076 series Modulation Characteristics Measurement circuit 3 VDD fm [dB] 0 Crystal −3 Gain-phase Analyzer (HP 4194A) −6 Modulaiton Analyzer (HP 8901B) −9 −12 0 1 10 Frequency [kHz] 100 1000 Modulation signal C1 XT 0.1µF XTN Q R1 VC VSS R2 CLOUT = 15pF Demodulation signal C1 = 33µF, R1 = R2 = 1MΩ VC modulation signal: 100Hz to 100kHz, 0 to VDDp-p VDD = 1.8V, fOUT = 27MHz, Ta = R.T. Output Waveform Measurement equipment: Oscilloscope; DSO80604B (Agilent) Measurement circuit VDD Crystal XT XTN Q VC 0.1µF VSS CLOUT = 15pF (Including probe capacitance) VDD = 1.8V, fOUT = 27MHz, VC = 0.5VDD, CLOUT = 15pF, Ta = R.T. SEIKO NPC CORPORATION —12 5076 series Please pay your attention to the following points at time of using the products shown in this document. 1. The products shown in this document (hereinafter “Products”) are designed and manufactured to the generally accepted standards of reliability as expected for use in general electronic and electrical equipment, such as personal equipment, machine tools and measurement equipment. The Products are not designed and manufactured to be used in any other special equipment requiring extremely high level of reliability and safety, such as aerospace equipment, nuclear power control equipment, medical equipment, transportation equipment, disaster prevention equipment, security equipment. The Products are not designed and manufactured to be used for the apparatus that exerts harmful influence on the human lives due to the defects, failure or malfunction of the Products. If you wish to use the Products in that apparatus, please contact our sales section in advance. In the event that the Products are used in such apparatus without our prior approval, we assume no responsibility whatsoever for any damages resulting from the use of that apparatus. 2. NPC reserves the right to change the specifications of the Products in order to improve the characteristics or reliability thereof. 3. The information described in this document is presented only as a guide for using the Products. No responsibility is assumed by us for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of the third parties. Then, we assume no responsibility whatsoever for any damages resulting from that infringements. 4. The constant of each circuit shown in this document is described as an example, and it is not guaranteed about its value of the massproduction products. 5. In the case of that the Products in this document falls under the foreign exchange and foreign trade control law or other applicable laws and regulations, approval of the export to be based on those laws and regulations are necessary. Customers are requested appropriately take steps to obtain required permissions or approvals form appropriate government agencies. SEIKO NPC CORPORATION 1-9-9, Hatchobori, Chuo-ku, Tokyo 104-0032, Japan Telephone: +81-3-5541-6501 Facsimile: +81-3-5541-6510 http://www.npc.co.jp/ Email: [email protected] NC0811BE 2010.02 SEIKO NPC CORPORATION —13