5056 series Crystal Oscillator Module ICs OVERVIEW The 5056 series are 70 to 135MHz oscillation frequency, crystal oscillator module ICs optimized for 3rd overtone crystal elements with C0 2 to 4pF. They have built-in C0 cancelation circuit which provides high oscillation performance at high frequency. They also have CMOS output buffer which can drive 30pF output load. FEATURES ▪ Operating supply voltage range: 2.25 to 3.63V ▪ Recommended oscillation frequency range (3rd overtone oscillator): 70 to 125MHz (2.5V±10%) 75 to 135MHz (3.3V±10%) ▪ Output load 30pF (VDD: 3.3V±10%, output frequency: 75 to 125MHz) ▪ Optimized oscillator circuit for large 3rd overtone crystal element with C0 2 to 4pF ▪ -40 to 85°C operating temperature range ▪ CMOS output ▪ Output drive capability: ±8mA ▪ Standby function High impedance in standby mode, oscillator stops ▪ Power-saving pull-up resistor built-in (INHN pin) ▪ Wafer form (WF5056xx) ▪ Chip form (CF5056xx) APPLICATIONS ▪ 7.0×5.0, 5.0×3.2 size crystal oscillator modules SERIES CONFIGURATION Recommended oscillation Version name*1 frequency range*2[MHz] 5056CC 70 to 85 5056CE 100 to 135 Recommended C0 value[pF] 2< C0< 4 Oscillator capacitance*3[pF] CG CD 1 3 0 1 *1. It becomes WF5056xx in case of the wafer form and CF5056xx in case of the chip form. *2. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *3. The oscillator capacitance does not contain parasitic capacitance. ORDERING INFORMATION Device Package WF5056Cx-4 Wafer form Version name WF5056C□-4 Form WF : Wafer form CF : Chip(Die) form CF5056Cx-4 Oscillation frequency range PAD layout C: for Wire Bonding Chip form SEIKO NPC CORPORATION - 1 5056 series PAD LAYOUT (Unit: μm) (300,285) VDD INHN Y 5 4 (0,0) 6 VSS 2 1 (-300,-285) 3 Q XT XTN X Chip size : 0.60×0.57mm Chip thickness : 130μm PAD size : 80μm Chip base : Vss level · Coordinates at the chip center are (0,0). PIN DESCRIPTION and PAD COORDINATES No. I/O*1 Pin PAD coordinates [μm] Description X Y 1 XT I Crystal connection pins. -145.2 -193.5 2 XTN O Crystal is connected between XT and XTN. 145.2 -193.5 3 VSS - (-) ground 208.5 -1.1 4 Q O Output pin 208.5 193.5 5 VDD - (+) supply voltage -208.5 193.5 -208.5 -1.1 6 *1. I: Input pin INHN I Input pin controlled output state (oscillator stops when LOW), Power-saving pull-up resistor built-in O: Output pin BLOCK DIAGRAM RPU INHN C0 Cancel RF CMOS XT CG RD CD Q VDD VSS XTN SEIKO NPC CORPORATION - 2 5056 series SPECIFICATIONS Absolute Maximum Ratings Vss=0V Parameter Symbol Condition Rating Unit -0.3 to +4.0 V Input pins -0.3 to VDD+0.3 V -0.3 to VDD+0.3 V ±20 mA 125 °C -55 to +125 °C *1 VDD Between VDD and VSS *1*2 VIN Supply voltage range Input voltage range *1*2 Output voltage range VOUT Output pins Output current*3 IOUT Q pin Junction temperature*3 Tj *4 Storage temperature range TSTG Chip form, Wafer form *1. This parameter rating is the values that must never exceed even for a moment. This product may suffer breakdown if this parameter rating is exceeded. Operation and characteristics are guaranteed only when the product is operated at recommended operating conditions. *2. VDD is a VDD value of recommended operating conditions. *3. Do not exceed the absolute maximum ratings. If they are exceeded, a characteristic and reliability will be degraded. *4. When stored in nitrogen or vacuum atmosphere applied to IC itself only (excluding packaging materials). Recommended Operating Conditions Vss=0V Parameter Symbol CC ver. Oscillator frequency*1 fOSC CE ver. CC ver. Output frequency Rating Condition fOUT CE ver. MIN TYP MAX VDD=2.97 to 3.63V 75 85 VDD=2.25 to 2.75V 70 80 VDD=2.97 to 3.63V 100 135 VDD=2.25 to 2.75V 100 125 VDD=2.97 to 3.63V CLOUT≤30pF 75 85 VDD=2.25 to 2.75V CLOUT≤15pF 70 80 CLOUT≤15pF 100 135 CLOUT≤30pF 100 125 CLOUT≤15pF 100 125 VDD=2.97 to 3.63V VDD=2.25 to 2.75V *2 Unit MHz MHz MHz Operating supply voltage VDD Between VDD and VSS 2.25 3.63 Input voltage VIN Input pins VSS VDD V Operating temperature Ta -40 +85 °C CC ver. Output load capacitance (Q pin) CLOUT CE ver. VDD=2.97 to 3.63V and 75MHz≤fOUT≤85MHz VDD=2.97 to 3.63V and 100MHz≤fOUT≤125MHz Condition except the above V 30 30 pF 15 *1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. Mount a ceramic chip capacitor that is larger than 0.01μF proximal to IC (within approximately 3mm) between VDD and VSS in order to obtain stable operation of 5056 series. In addition, the wiring pattern between IC and capacitor should be as wide as possible. Note. Since it may influence the reliability if it is used out of range of recommended operating conditions, this product should be used within this range. SEIKO NPC CORPORATION - 3 5056 series Electrical Characteristics DC Characteristics VDD=2.25 to 3.63V, VSS=0V, Ta= -40 to +85°C unless otherwise noted. Parameter Symbol Rating Condition MIN TYP MAX Unit HIGH-level output voltage VOH Q pin, measurement circuit 3, IOH=-8mA VDD-0.4 VDD V LOW-level output voltage VOL Q pin, measurement circuit 3, IOL=8mA 0 0.4 V HIGH-level input voltage VIH INHN pin, measurement circuit 4 LOW-level input voltage VIL INHN pin, measurement circuit 4 Output leakage current IZ Q pin, measurement circuit 5 INHN=“Low” Q=VDD Measurement circuit 1, no load INHN=“OPEN”, fOSC=80MHz VDD=3.3V 15 30 VDD=2.5V 8 16 Measurement circuit 1, no load INHN=“OPEN”, fOSC=125MHz VDD=3.3V 17 34 VDD=2.5V 10 20 CC ver. Current consumption*1 CE ver. Standby current IDD_2.5V IDD_3.3V IDD_2.5V IST INHN pull-up resistance Oscillator feedback resistance IDD_3.3V 0.7VDD V 0.3VDD Q=VSS 10 -10 Measurement circuit 1, INHN=VSS RPU1 Measurement circuit 6 0.8 3 24 MΩ RPU2 Measurement circuit 6 30 70 150 kΩ Design value 2.7 4.9 7.1 CE ver. Rf Design value 2.0 3.8 5.5 CG Design value (a monitor pattern on a wafer is tested), Excluding parasitic capacitance. 0.8 1 1.2 2.4 3 3.6 0 0 0 0.8 1 1.2 CE ver. mA μA Rf Oscillator capacitance μA 10 CC ver. CC ver. V CD CG CD Design value (a monitor pattern on a wafer is tested), Excluding parasitic capacitance. kΩ pF pF *1. The consumption current IDD(CLOUT) with a load capacitance(CLOUT) connected to the Q pin is given by the following equation, where IDD is the no-load consumption current and fOUT is the output frequency. IDD(CLOUT)[mA] = IDD[mA]+CLOUT[pF]×VDD[V]×fOUT[MHz]·10-3 SEIKO NPC CORPORATION - 4 5056 series AC Characteristics VDD=2.25 to 3.63V, VSS=0V, Ta= -40 to +85°C unless otherwise noted. Parameter TYP MAX Measurement circuit 1, CLOUT=15pF, 0.1VDD → 0.9VDD, VDD=2.25 to 3.63V 1.0 2.0 tr2 Measurement circuit 1, CLOUT=30pF, 0.1VDD → 0.9VDD, VDD=2.97 to 3.63V 1.5 2.5 tf1 Measurement circuit 1, CLOUT=15pF, 0.9VDD → 0.1VDD, VDD=2.25 to 3.63V 1.0 2.0 tf2 Measurement circuit 1, CLOUT=30pF, 0.9VDD → 0.1VDD, VDD=2.97 to 3.63V 1.5 3.0 50 55 Output fall time DUTY Output disable delay time MIN tr1 Output rise time Output duty cycle Rating Condition Symbol tOD Unit ns ns Measurement circuit 1, Ta=25°C, CLOUT=15pF, VDD=2.25 to 3.63V 45 Measurement circuit 1, Ta=25°C, CLOUT=30pF, VDD=2.97 to 3.63V 40 % 50 Measurement circuit 2, Ta=25°C, CLOUT≤15pF 60 200 ns Note. The ratings above are measured by using the NPC standard crystal and jig. They may vary due to crystal characteristics, so they must be carefully evaluated. Timing chart 0.9VD D 0.9VDD Q 0.1VD D DUTY measurement voltage 0.5VDD DUTY = Tw/T×100 (%) 0.1VD D Tw T tr tf Figure 1.Output switching waveform VDD VIH INHN VIL VSS tOD VDD 0.1V Q VSS 0.1V fOUT Hi-Z Low fOUT When INHN goes HIGH to LOW, the Q output becomes high impedance. When INHN goes LOW to HIGH, the Q output goes LOW once and then becomes normal output operation after having detected oscillation signals. Figure 2.Output disable and oscillation start timing chart SEIKO NPC CORPORATION - 5 5056 series FUNCTIONAL DESCRIPTION Standby Function When INHN goes LOW level, the Q output becomes high impedance. INHN Q Oscillator HIGH(Open) fOUT Operating LOW Hi-Z Stopped Power Saving Pull-up Resistor The INHN pin pull-up resistance changes its value to RPU1 or RPU2 in response to the input level (HIGH or LOW). When INHN is tied to LOW level, the pull-up resistance becomes large (RPU1), thus reducing the current consumed by the resistance. When INHN is left open circuit or tied to HIGH level, the pull-up resistance becomes small (RPU2), thus internal circuit of INHN becomes HIGH level. Consequently, the IC is less susceptible to the effects of noise, helping to avoid problems such as the output stopping suddenly. Oscillation Detection Function The 5056 series incorporate an oscillation detection circuit. The oscillation detection circuit disables the output until the oscillator circuit starts up. This function avoids the problem where the oscillator does not start, due to abnormal oscillation conditions, where power is applied or when the oscillator is restarted using INHN. C0 cancellation circuit Oscillation circuit with a built-in C0 cancellation circuit provides a fixed compensation amount to cancel the effect of the crystal C0. It reduces the C0 parameter in the equivalent circuit, reducing the shallow negative resistance for increasing values of C0. This cancellation circuit makes it easier to maintain the oscillation margin. SEIKO NPC CORPORATION - 6 5056 series MEASUREMENT CIRCUITS MEASUREMENT CIRCUIT 1 Measurement Parameter: IDD, IST, DUTY, tr, tf A *AC characteristics observed on the Q pin using an oscilloscope. IDD, IST VDD 0.1μF SW1 XT X'tal Q Parameter SW1 SW2 IDD OFF OFF IST ON or OFF ON DUTY, tr, tf ON OFF XTN INHN VSS CLOUT=15pF or 30pF (Including probe capacitance) SW2 MEASUREMENT CIRCUIT 2 Measurement Parameter: tOD Input signal : 1Vp-p, sine wave 0.1μF VDD 0.001μF Signal Generator RL1=1kΩ XTN Q 50Ω INHN 15pF VSS RL2=1kΩ Input signal : VDD→VSS Function Generator 50Ω MEASUREMENT CIRCUIT 3 Measurement Parameter: VOH, VOL Input signal : 1Vp-p, sine wave 0.1μF VDD 0.001μF Signal Generator XTN 50Ω Q 50Ω VOH VOL VSS Q ΔV VS adjusted so that ΔV=50×IOH VOH VS Q 0.1μF V ΔV VS VS VOL VS adjusted so that ΔV=50×IOL SEIKO NPC CORPORATION - 7 5056 series MEASUREMENT CIRCUIT 4 Measurement Parameter: VIH, VIL VDD 0.1μF XT Q X'tal XTN VSS INHN VIH, VIL V VIH: VSS→VDD voltage that changes output state VIL: VDD→VSS voltage that changes output state INHN has an oscillation stop function. MEASUREMENT CIRCUIT 5 Measurement Parameter: IZ VDD 0.1μF Q IZ VSS INHN VDD or VSS A MEASUREMENT CIRCUIT 6 Measurement Parameter: RPU1, RPU2 VDD 0.1μF VSS INHN VIN V A IPU RPU1 = RPU2 = VDD (VIN = 0V) IPU VDD 0.7VDD IPU (VIN = 0.7VDD) SEIKO NPC CORPORATION - 8 5056 series REFERENCE DATA The following characteristics are measured using the crystal below. Note that the characteristics will vary with the crystal used. Crystal used for measurement Crystal parameters Parameter 80MHz 125MHz C0(pF) 2.4 2.0 R1(Ω) 42 33 C1 L1 R1 C0 30 . . Current Consumption 25 Current consumption [mA] Current consumption [mA] 25 30 20 15 10 5 0 20 15 10 5 0 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 2.0 2.2 2.4 2.6 Supply voltage [V] 2.8 3.0 3.2 3.4 3.6 3.8 Supply voltage [V] 5056CC, fOSC=80MHz, Ta=25°C, no load 5056CE, fOSC=125MHz, Ta=25°C, no load Negative Resistance 0 20 40 60 Frequency[MHz] 80 100 120 140 160 180 200 0 0 0 -100 -100 -200 -300 -400 -500 -600 40 60 Frequency[MHz] 80 100 120 140 160 180 100 C0=4pF C0=3pF C0=2pF -700 -800 Negative Resistance [Ω] Negative Resistance [Ω] 100 20 -200 -300 -400 -500 -600 C0=4pF C0=3pF C0=2pF -700 -800 -900 -900 -1000 -1000 5056CC, VDD=3.3V, Ta=25°C 5056CC, VDD=2.5V, Ta=25°C SEIKO NPC CORPORATION - 9 200 5056 series 0 20 40 60 Frequency[MHz] 80 100 120 140 160 180 0 200 40 60 Frequency[MHz] 80 100 120 140 160 180 200 100 100 0 0 -100 -100 Negative Resistance [Ω] Negative Resistance [Ω] 20 -200 -300 C0=4pF -400 C0=3pF -500 C0=2pF -600 -700 -200 -300 C0=4pF -400 C0=3pF -500 C0=2pF -600 -700 -800 -800 -900 -900 -1000 -1000 5056CE, VDD=3.3V, Ta=25°C 5056CE, VDD=2.5V, Ta=25°C Measurement equipment: Agilent 4396B Impedance Analyzer The figures show the measurement result of the crystal equivalent circuit C0 capacitance, connected between the XT and XTN pins. They were performed with Agilent 4396B using the NPC test jig. They may vary in a measurement jig, and measurement environment. 10 10 8 8 6 6 Frequency deviation [ppm] Frequency deviation [ppm] Frequency Deviation by Voltage 4 2 0 -2 -4 -6 4 2 0 -2 -4 -6 -8 -8 -10 -10 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 Supply voltage [V] 5056CC, fOSC=80MHz, Ta=25°C, 2.5V and 3.3V std. 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 Supply voltage [V] 5056CE, fOSC=125MHz, Ta=25°C, 2.5V and 3.3V std. Measurement equipment: Agilent 53132A Frequency Counter SEIKO NPC CORPORATION - 10 5056 series 2.0 2.0 1.8 1.8 1.6 1.6 1.4 1.4 Drive level [mW] Drive level [mW] Drive Level 1.2 1.0 0.8 0.6 1.2 1.0 0.8 0.6 0.4 0.4 0.2 0.2 0.0 0.0 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 2.0 Supply voltage [V] 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 Supply voltage [V] 5056CC, fOSC=80MHz, Ta=25°C 5056CE, fOSC=125MHz, Ta=25°C Measurement equipment: Agilent DSO80604B Digital Oscilloscope Tektronix CT-6 Current probe Agilent 53132A Frequency Counter Phase Noise -60 -60 -70 -70 -80 -80 Phase Noise [dBc/Hz] Phase Noise [dBc/Hz] -90 -100 -110 -120 -130 -140 -150 -90 -100 -110 -120 -130 -140 -150 -160 -160 -170 -170 -180 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08 Offset Freqency [Hz] -180 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08 Offset Freqency [Hz] 5056CC, VDD=3.3V, fOSC=80MHz, Ta=25°C 5056CE, VDD=3.3V, fOSC=125MHz, Ta=25°C Measurement equipment: Signal Source Analyzer Agilent E5052B SEIKO NPC CORPORATION - 11 5056 series Output Waveform 5056CC, VDD=3.3V, fOSC=80MHz, Ta=25°C, CLOUT=15pF 5056CC, VDD=3.3V, fOSC=80MHz, Ta=25°C, CLOUT=30pF SEIKO NPC CORPORATION - 12 5056 series 5056CE, VDD=3.3V, fOSC=125MHz, Ta=25°C, CLOUT=15pF 5056CE, VDD=3.3V, fOSC=125MHz, Ta=25°C, CLOUT=30pF Measurement equipment: Oscilloscope Agilent DSO80604B Differential probe 1134A (Probe head E2678A) SEIKO NPC CORPORATION - 13 5056 series Please pay your attention to the following points at time of using the products shown in this document. 1. The products shown in this document (hereinafter ”Products”) are designed and manufactured to the generally accepted standards of reliability as expected for use in general electronic and electrical equipment, such as personal equipment, machine tools and measurement equipment. The Products are not designed and manufactured to be used in any other special equipment requiring extremely high level of reliability and safety, such as aerospace equipment, nuclear power control equipment, medical equipment, transportation equipment, disaster prevention equipment, security equipment. The Products are not designed and manufactured to be used for the apparatus that exerts harmful influence on the human lives due to the defects, failure or malfunction of the Products. If you wish to use the Products in that apparatus, please contact our sales section in advance. In the event that the Products are used in such apparatus without our prior approval, we assume no responsibility whatsoever for any damages resulting from the use of that apparatus. 2. NPC reserves the right to change the specifications of the Products in order to improve the characteristics or reliability thereof. 3. The information described in this document is presented only as a guide for using the Products. No responsibility is assumed by us for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of the third parties. Then, we assume no responsibility whatsoever for any damages resulting from that infringements. 4. The constant of each circuit shown in this document is described as an example, and it is not guaranteed about its value of the mass production products. 5. In the case of that the Products in this document falls under the foreign exchange and foreign trade control law or other applicable laws and regulations, approval of the export to be based on those laws and regulations are necessary. Customers are requested appropriately take steps to obtain required permissions or approvals from appropriate government agencies. SEIKO NPC CORPORATION 1-9-9, Hatchobori, Chuo-ku, Tokyo 104-0032, Japan Telephone: +81-3-5541-6501 Facsimile: +81-3-5541-6510 http://www.npc.co.jp/ Email:[email protected] ND13023-E-00 2013.08 SEIKO NPC CORPORATION - 14