5056_ND13023E00

5056 series
Crystal Oscillator Module ICs
OVERVIEW
The 5056 series are 70 to 135MHz oscillation frequency, crystal oscillator module ICs optimized for 3rd overtone crystal elements with C0
2 to 4pF. They have built-in C0 cancelation circuit which provides high oscillation performance at high frequency. They also have CMOS
output buffer which can drive 30pF output load.
FEATURES
▪ Operating supply voltage range: 2.25 to 3.63V
▪ Recommended oscillation frequency range
(3rd overtone oscillator): 70 to 125MHz (2.5V±10%)
75 to 135MHz (3.3V±10%)
▪ Output load 30pF (VDD: 3.3V±10%, output frequency: 75 to 125MHz)
▪ Optimized oscillator circuit for large 3rd overtone crystal element with C0 2 to 4pF
▪ -40 to 85°C operating temperature range
▪ CMOS output
▪ Output drive capability: ±8mA
▪ Standby function
High impedance in standby mode, oscillator stops
▪ Power-saving pull-up resistor built-in (INHN pin)
▪ Wafer form (WF5056xx)
▪ Chip form (CF5056xx)
APPLICATIONS
▪ 7.0×5.0, 5.0×3.2 size crystal oscillator modules
SERIES CONFIGURATION
Recommended oscillation
Version name*1
frequency range*2[MHz]
5056CC
70 to 85
5056CE
100 to 135
Recommended C0 value[pF]
2< C0< 4
Oscillator capacitance*3[pF]
CG
CD
1
3
0
1
*1. It becomes WF5056xx in case of the wafer form and CF5056xx in case of the chip form.
*2. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency
range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation
characteristics of components must be carefully evaluated.
*3. The oscillator capacitance does not contain parasitic capacitance.
ORDERING INFORMATION
Device
Package
WF5056Cx-4
Wafer form
Version name
WF5056C□-4
Form WF : Wafer form
CF : Chip(Die) form
CF5056Cx-4
Oscillation frequency range
PAD layout C: for Wire Bonding
Chip form
SEIKO NPC CORPORATION - 1
5056 series
PAD LAYOUT
(Unit: μm)
(300,285)
VDD
INHN
Y
5
4
(0,0)
6
VSS
2
1
(-300,-285)
3
Q
XT
XTN
X
Chip size : 0.60×0.57mm
Chip thickness : 130μm
PAD size : 80μm
Chip base : Vss level
· Coordinates at the chip center are (0,0).
PIN DESCRIPTION and PAD COORDINATES
No.
I/O*1
Pin
PAD coordinates [μm]
Description
X
Y
1
XT
I
Crystal connection pins.
-145.2
-193.5
2
XTN
O
Crystal is connected between XT and XTN.
145.2
-193.5
3
VSS
-
(-) ground
208.5
-1.1
4
Q
O
Output pin
208.5
193.5
5
VDD
-
(+) supply voltage
-208.5
193.5
-208.5
-1.1
6
*1. I: Input pin
INHN
I
Input pin controlled output state (oscillator stops when LOW),
Power-saving pull-up resistor built-in
O: Output pin
BLOCK DIAGRAM
RPU
INHN
C0 Cancel
RF
CMOS
XT
CG
RD
CD
Q
VDD
VSS
XTN
SEIKO NPC CORPORATION - 2
5056 series
SPECIFICATIONS
Absolute Maximum Ratings
Vss=0V
Parameter
Symbol
Condition
Rating
Unit
-0.3 to +4.0
V
Input pins
-0.3 to VDD+0.3
V
-0.3 to VDD+0.3
V
±20
mA
125
°C
-55 to +125
°C
*1
VDD
Between VDD and VSS
*1*2
VIN
Supply voltage range
Input voltage range
*1*2
Output voltage range
VOUT
Output pins
Output current*3
IOUT
Q pin
Junction temperature*3
Tj
*4
Storage temperature range
TSTG
Chip form, Wafer form
*1. This parameter rating is the values that must never exceed even for a moment. This product may suffer breakdown if this parameter rating is exceeded.
Operation and characteristics are guaranteed only when the product is operated at recommended operating conditions.
*2. VDD is a VDD value of recommended operating conditions.
*3. Do not exceed the absolute maximum ratings. If they are exceeded, a characteristic and reliability will be degraded.
*4. When stored in nitrogen or vacuum atmosphere applied to IC itself only (excluding packaging materials).
Recommended Operating Conditions
Vss=0V
Parameter
Symbol
CC ver.
Oscillator frequency*1
fOSC
CE ver.
CC ver.
Output frequency
Rating
Condition
fOUT
CE ver.
MIN
TYP
MAX
VDD=2.97 to 3.63V
75
85
VDD=2.25 to 2.75V
70
80
VDD=2.97 to 3.63V
100
135
VDD=2.25 to 2.75V
100
125
VDD=2.97 to 3.63V
CLOUT≤30pF
75
85
VDD=2.25 to 2.75V
CLOUT≤15pF
70
80
CLOUT≤15pF
100
135
CLOUT≤30pF
100
125
CLOUT≤15pF
100
125
VDD=2.97 to 3.63V
VDD=2.25 to 2.75V
*2
Unit
MHz
MHz
MHz
Operating supply voltage
VDD
Between VDD and VSS
2.25
3.63
Input voltage
VIN
Input pins
VSS
VDD
V
Operating temperature
Ta
-40
+85
°C
CC ver.
Output load capacitance
(Q pin)
CLOUT
CE ver.
VDD=2.97 to 3.63V
and 75MHz≤fOUT≤85MHz
VDD=2.97 to 3.63V
and 100MHz≤fOUT≤125MHz
Condition except the above
V
30
30
pF
15
*1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency
range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation
characteristics of components must be carefully evaluated.
*2. Mount a ceramic chip capacitor that is larger than 0.01μF proximal to IC (within approximately 3mm) between VDD and VSS in order to obtain stable
operation of 5056 series. In addition, the wiring pattern between IC and capacitor should be as wide as possible.
Note. Since it may influence the reliability if it is used out of range of recommended operating conditions, this product should be used within this range.
SEIKO NPC CORPORATION - 3
5056 series
Electrical Characteristics
DC Characteristics
VDD=2.25 to 3.63V, VSS=0V, Ta= -40 to +85°C unless otherwise noted.
Parameter
Symbol
Rating
Condition
MIN
TYP
MAX
Unit
HIGH-level output voltage
VOH
Q pin, measurement circuit 3, IOH=-8mA
VDD-0.4
VDD
V
LOW-level output voltage
VOL
Q pin, measurement circuit 3, IOL=8mA
0
0.4
V
HIGH-level input voltage
VIH
INHN pin, measurement circuit 4
LOW-level input voltage
VIL
INHN pin, measurement circuit 4
Output leakage current
IZ
Q pin, measurement circuit 5
INHN=“Low”
Q=VDD
Measurement circuit 1, no load
INHN=“OPEN”, fOSC=80MHz
VDD=3.3V
15
30
VDD=2.5V
8
16
Measurement circuit 1, no load
INHN=“OPEN”, fOSC=125MHz
VDD=3.3V
17
34
VDD=2.5V
10
20
CC ver.
Current
consumption*1
CE ver.
Standby current
IDD_2.5V
IDD_3.3V
IDD_2.5V
IST
INHN pull-up resistance
Oscillator
feedback
resistance
IDD_3.3V
0.7VDD
V
0.3VDD
Q=VSS
10
-10
Measurement circuit 1, INHN=VSS
RPU1
Measurement circuit 6
0.8
3
24
MΩ
RPU2
Measurement circuit 6
30
70
150
kΩ
Design value
2.7
4.9
7.1
CE ver.
Rf
Design value
2.0
3.8
5.5
CG
Design value (a monitor pattern on a wafer is tested),
Excluding parasitic capacitance.
0.8
1
1.2
2.4
3
3.6
0
0
0
0.8
1
1.2
CE ver.
mA
μA
Rf
Oscillator
capacitance
μA
10
CC ver.
CC ver.
V
CD
CG
CD
Design value (a monitor pattern on a wafer is tested),
Excluding parasitic capacitance.
kΩ
pF
pF
*1. The consumption current IDD(CLOUT) with a load capacitance(CLOUT) connected to the Q pin is given by the following equation, where IDD is the no-load
consumption current and fOUT is the output frequency.
IDD(CLOUT)[mA] = IDD[mA]+CLOUT[pF]×VDD[V]×fOUT[MHz]·10-3
SEIKO NPC CORPORATION - 4
5056 series
AC Characteristics
VDD=2.25 to 3.63V, VSS=0V, Ta= -40 to +85°C unless otherwise noted.
Parameter
TYP
MAX
Measurement circuit 1, CLOUT=15pF,
0.1VDD → 0.9VDD, VDD=2.25 to 3.63V
1.0
2.0
tr2
Measurement circuit 1, CLOUT=30pF,
0.1VDD → 0.9VDD, VDD=2.97 to 3.63V
1.5
2.5
tf1
Measurement circuit 1, CLOUT=15pF,
0.9VDD → 0.1VDD, VDD=2.25 to 3.63V
1.0
2.0
tf2
Measurement circuit 1, CLOUT=30pF,
0.9VDD → 0.1VDD, VDD=2.97 to 3.63V
1.5
3.0
50
55
Output fall time
DUTY
Output disable delay time
MIN
tr1
Output rise time
Output duty cycle
Rating
Condition
Symbol
tOD
Unit
ns
ns
Measurement circuit 1, Ta=25°C,
CLOUT=15pF, VDD=2.25 to 3.63V
45
Measurement circuit 1, Ta=25°C,
CLOUT=30pF, VDD=2.97 to 3.63V
40
%
50
Measurement circuit 2, Ta=25°C, CLOUT≤15pF
60
200
ns
Note. The ratings above are measured by using the NPC standard crystal and jig. They may vary due to crystal characteristics, so they must be carefully
evaluated.
Timing chart
0.9VD D
0.9VDD
Q
0.1VD D
DUTY measurement
voltage 0.5VDD
DUTY = Tw/T×100 (%)
0.1VD D
Tw
T
tr
tf
Figure 1.Output switching waveform
VDD
VIH
INHN
VIL
VSS
tOD
VDD
0.1V
Q
VSS
0.1V
fOUT
Hi-Z
Low
fOUT
When INHN goes HIGH to LOW, the Q output becomes high impedance.
When INHN goes LOW to HIGH, the Q output goes LOW once and then becomes normal output operation after having detected oscillation signals.
Figure 2.Output disable and oscillation start timing chart
SEIKO NPC CORPORATION - 5
5056 series
FUNCTIONAL DESCRIPTION
Standby Function
When INHN goes LOW level, the Q output becomes high impedance.
INHN
Q
Oscillator
HIGH(Open)
fOUT
Operating
LOW
Hi-Z
Stopped
Power Saving Pull-up Resistor
The INHN pin pull-up resistance changes its value to RPU1 or RPU2 in response to the input level (HIGH or LOW).
When INHN is tied to LOW level, the pull-up resistance becomes large (RPU1), thus reducing the current consumed by the resistance.
When INHN is left open circuit or tied to HIGH level, the pull-up resistance becomes small (RPU2), thus internal circuit of INHN becomes
HIGH level. Consequently, the IC is less susceptible to the effects of noise, helping to avoid problems such as the output stopping suddenly.
Oscillation Detection Function
The 5056 series incorporate an oscillation detection circuit. The oscillation detection circuit disables the output until the oscillator circuit
starts up. This function avoids the problem where the oscillator does not start, due to abnormal oscillation conditions, where power is
applied or when the oscillator is restarted using INHN.
C0 cancellation circuit
Oscillation circuit with a built-in C0 cancellation circuit provides a fixed compensation amount to cancel the effect of the crystal C0. It
reduces the C0 parameter in the equivalent circuit, reducing the shallow negative resistance for increasing values of C0.
This cancellation circuit makes it easier to maintain the oscillation margin.
SEIKO NPC CORPORATION - 6
5056 series
MEASUREMENT CIRCUITS
MEASUREMENT CIRCUIT 1
Measurement Parameter: IDD, IST, DUTY, tr, tf
A
*AC characteristics observed on the Q pin
using an oscilloscope.
IDD, IST
VDD
0.1μF
SW1
XT
X'tal
Q
Parameter
SW1
SW2
IDD
OFF
OFF
IST
ON or OFF
ON
DUTY, tr, tf
ON
OFF
XTN
INHN
VSS
CLOUT=15pF or 30pF
(Including probe capacitance)
SW2
MEASUREMENT CIRCUIT 2
Measurement Parameter: tOD
Input signal : 1Vp-p, sine wave
0.1μF
VDD
0.001μF
Signal
Generator
RL1=1kΩ
XTN
Q
50Ω
INHN
15pF
VSS
RL2=1kΩ
Input signal : VDD→VSS
Function
Generator
50Ω
MEASUREMENT CIRCUIT 3
Measurement Parameter: VOH, VOL
Input signal : 1Vp-p, sine wave
0.1μF
VDD
0.001μF
Signal
Generator
XTN
50Ω
Q
50Ω
VOH
VOL
VSS
Q
ΔV
VS adjusted so that ΔV=50×IOH
VOH
VS
Q
0.1μF
V
ΔV
VS
VS
VOL
VS adjusted so that ΔV=50×IOL
SEIKO NPC CORPORATION - 7
5056 series
MEASUREMENT CIRCUIT 4
Measurement Parameter: VIH, VIL
VDD
0.1μF
XT
Q
X'tal
XTN
VSS
INHN
VIH,
VIL
V
VIH: VSS→VDD voltage that changes output state
VIL: VDD→VSS voltage that changes output state
INHN has an oscillation stop function.
MEASUREMENT CIRCUIT 5
Measurement Parameter: IZ
VDD
0.1μF
Q
IZ
VSS
INHN
VDD
or
VSS
A
MEASUREMENT CIRCUIT 6
Measurement Parameter: RPU1, RPU2
VDD
0.1μF
VSS
INHN
VIN
V
A
IPU
RPU1 =
RPU2 =
VDD
(VIN = 0V)
IPU
VDD
0.7VDD
IPU
(VIN = 0.7VDD)
SEIKO NPC CORPORATION - 8
5056 series
REFERENCE DATA
The following characteristics are measured using the crystal below. Note that the characteristics will vary with the crystal used.
Crystal used for measurement
Crystal parameters
Parameter
80MHz
125MHz
C0(pF)
2.4
2.0
R1(Ω)
42
33
C1
L1
R1
C0
30
.
.
Current Consumption
25
Current consumption [mA]
Current consumption [mA]
25
30
20
15
10
5
0
20
15
10
5
0
2.0
2.2
2.4
2.6
2.8
3.0
3.2
3.4
3.6
3.8
2.0
2.2
2.4
2.6
Supply voltage [V]
2.8
3.0
3.2
3.4
3.6
3.8
Supply voltage [V]
5056CC, fOSC=80MHz, Ta=25°C, no load
5056CE, fOSC=125MHz, Ta=25°C, no load
Negative Resistance
0
20
40
60
Frequency[MHz]
80
100 120 140
160
180
200
0
0
0
-100
-100
-200
-300
-400
-500
-600
40
60
Frequency[MHz]
80
100 120 140
160
180
100
C0=4pF
C0=3pF
C0=2pF
-700
-800
Negative Resistance [Ω]
Negative Resistance [Ω]
100
20
-200
-300
-400
-500
-600
C0=4pF
C0=3pF
C0=2pF
-700
-800
-900
-900
-1000
-1000
5056CC, VDD=3.3V, Ta=25°C
5056CC, VDD=2.5V, Ta=25°C
SEIKO NPC CORPORATION - 9
200
5056 series
0
20
40
60
Frequency[MHz]
80
100 120 140
160
180
0
200
40
60
Frequency[MHz]
80 100 120 140
160
180
200
100
100
0
0
-100
-100
Negative Resistance [Ω]
Negative Resistance [Ω]
20
-200
-300
C0=4pF
-400
C0=3pF
-500
C0=2pF
-600
-700
-200
-300
C0=4pF
-400
C0=3pF
-500
C0=2pF
-600
-700
-800
-800
-900
-900
-1000
-1000
5056CE, VDD=3.3V, Ta=25°C
5056CE, VDD=2.5V, Ta=25°C
Measurement equipment: Agilent 4396B Impedance Analyzer
The figures show the measurement result of the crystal equivalent circuit C0 capacitance, connected between the XT and XTN pins.
They were performed with Agilent 4396B using the NPC test jig.
They may vary in a measurement jig, and measurement environment.
10
10
8
8
6
6
Frequency deviation [ppm]
Frequency deviation [ppm]
Frequency Deviation by Voltage
4
2
0
-2
-4
-6
4
2
0
-2
-4
-6
-8
-8
-10
-10
2.0
2.2
2.4
2.6
2.8
3.0
3.2
3.4
3.6
3.8
Supply voltage [V]
5056CC, fOSC=80MHz, Ta=25°C, 2.5V and 3.3V std.
2.0
2.2
2.4
2.6
2.8
3.0
3.2
3.4
3.6
3.8
Supply voltage [V]
5056CE, fOSC=125MHz, Ta=25°C, 2.5V and 3.3V std.
Measurement equipment: Agilent 53132A Frequency Counter
SEIKO NPC CORPORATION - 10
5056 series
2.0
2.0
1.8
1.8
1.6
1.6
1.4
1.4
Drive level [mW]
Drive level [mW]
Drive Level
1.2
1.0
0.8
0.6
1.2
1.0
0.8
0.6
0.4
0.4
0.2
0.2
0.0
0.0
2.0
2.2
2.4
2.6
2.8
3.0
3.2
3.4
3.6
3.8
2.0
Supply voltage [V]
2.2
2.4
2.6
2.8
3.0
3.2
3.4
3.6
3.8
Supply voltage [V]
5056CC, fOSC=80MHz, Ta=25°C
5056CE, fOSC=125MHz, Ta=25°C
Measurement equipment: Agilent DSO80604B Digital Oscilloscope
Tektronix CT-6 Current probe
Agilent 53132A Frequency Counter
Phase Noise
-60
-60
-70
-70
-80
-80
Phase Noise [dBc/Hz]
Phase Noise [dBc/Hz]
-90
-100
-110
-120
-130
-140
-150
-90
-100
-110
-120
-130
-140
-150
-160
-160
-170
-170
-180
1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08
Offset Freqency [Hz]
-180
1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08
Offset Freqency [Hz]
5056CC, VDD=3.3V, fOSC=80MHz, Ta=25°C
5056CE, VDD=3.3V, fOSC=125MHz, Ta=25°C
Measurement equipment: Signal Source Analyzer Agilent E5052B
SEIKO NPC CORPORATION - 11
5056 series
Output Waveform
5056CC, VDD=3.3V, fOSC=80MHz, Ta=25°C, CLOUT=15pF
5056CC, VDD=3.3V, fOSC=80MHz, Ta=25°C, CLOUT=30pF
SEIKO NPC CORPORATION - 12
5056 series
5056CE, VDD=3.3V, fOSC=125MHz, Ta=25°C, CLOUT=15pF
5056CE, VDD=3.3V, fOSC=125MHz, Ta=25°C, CLOUT=30pF
Measurement equipment: Oscilloscope Agilent DSO80604B
Differential probe 1134A (Probe head E2678A)
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5056 series
Please pay your attention to the following points at time of using the products shown in this document.
1. The products shown in this document (hereinafter ”Products”) are designed and manufactured to the generally accepted standards of
reliability as expected for use in general electronic and electrical equipment, such as personal equipment, machine tools and
measurement equipment. The Products are not designed and manufactured to be used in any other special equipment requiring
extremely high level of reliability and safety, such as aerospace equipment, nuclear power control equipment, medical equipment,
transportation equipment, disaster prevention equipment, security equipment. The Products are not designed and manufactured to be
used for the apparatus that exerts harmful influence on the human lives due to the defects, failure or malfunction of the Products.
If you wish to use the Products in that apparatus, please contact our sales section in advance.
In the event that the Products are used in such apparatus without our prior approval, we assume no responsibility whatsoever for any
damages resulting from the use of that apparatus.
2. NPC reserves the right to change the specifications of the Products in order to improve the characteristics or reliability thereof.
3. The information described in this document is presented only as a guide for using the Products. No responsibility is assumed by us for any
infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise
under any patents or other rights of the third parties. Then, we assume no responsibility whatsoever for any damages resulting from that
infringements.
4. The constant of each circuit shown in this document is described as an example, and it is not guaranteed about its value of the mass
production products.
5. In the case of that the Products in this document falls under the foreign exchange and foreign trade control law or other applicable laws and
regulations, approval of the export to be based on those laws and regulations are necessary. Customers are requested appropriately take
steps to obtain required permissions or approvals from appropriate government agencies.
SEIKO NPC CORPORATION
1-9-9, Hatchobori, Chuo-ku,
Tokyo 104-0032, Japan
Telephone: +81-3-5541-6501
Facsimile: +81-3-5541-6510
http://www.npc.co.jp/
Email:sales@npc.co.jp
ND13023-E-00 2013.08
SEIKO NPC CORPORATION - 14