5028_nc0606ae

WF5028 series
0.8V operation Crystal Oscillator Module ICs
OVERVIEW
The WF5028 series are miniature crystal oscillator module ICs. The devices are fabricated using a proprietary
low voltage process, enabling 0.8V operation. The pad layouts are selective from 3 types depending on package structures, mounting methods, which are suitable for miniature crystal oscillators. The WF5028 series can
be used to realize ultra miniature, ultra low voltage crystal oscillators.
FEATURES
■
■
■
■
■
Wide range of operating supply voltage: 0.8 to 2.0V
Optimized low crystal drive current oscillation for
miniature crystal units
3 pad layout options for mounting
• WF5028A× series: for Flip Chip Bonding
• CF5028B× series: for Wire Bonding (type I)
• CF5028C× series: for Wire Bonding (type II)
Recommended oscillation frequency range:
20MHz to 50MHz
Multi-stage frequency divider for low-frequency
output support: 0.75MHz (min)
■
■
■
■
■
■
■
Frequency divider built-in
• Selectable by version: fO, fO/2, fO/4, fO/8, fO/16,
fO/32, fO/64
−40 to 85°C operating temperature range
Standby function
• High impedance in standby mode, oscillator
stops
CMOS output duty level (1/2VDD)
50 ± 5% output duty
15pF output drive capability
Wafer form (WF5028××)
Chip form (CF5028××)
APPLICATIONS
■
3.2 × 2.5, 2.5 × 2.0, 2.0 × 1.6 size miniature crystal oscillator modules
ORDERING INFORMATION
Device
Package
WF5028××–4
Wafer form
CF5028××–4
Chip form
SEIKO NPC CORPORATION —1
WF5028 series
SERIES CONFIGURATION
Version*1
Operating
supply voltage
range [V]
Oscillation
mode
Recommended
oscillation frequency
range*2 [MHz]
Output
frequency
WF5028×1
fO (oscillation
frequency)
WF5028×2
fO/2
WF5028×3
WF5028×4
Standby mode
Output drive
capability [mA] Oscillator stop
Output state
(VDD = 1.2V)
function
fO/4
0.8 to 2.0
Fundamental
20 to 50
±3
fO/8
WF5028×5
fO/16
WF5028×6
fO/32
WF5028×7
fO/64
Yes
Hi-Z
*1. Chip form devices have designation CF5028××.
*2. The recommended oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the
oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated.
VERSION NAME
Device
Package
WF5028××–4
Wafer form
Version name
WF5028
Form WF: Wafer form
CF: Chip (Die) form
CF5028××–4
Chip form
−4
Frequency divider function
Pad layout type A: for Flip Chip Bonding
B: for Wire Bonding (type I)
C: for Wire Bonding (type II)
SEIKO NPC CORPORATION —2
WF5028 series
PAD LAYOUT
(Unit: µm)
■
WF5028A×
(for Flip Chip Bonding)
■
CF5028B×
(for Wire Bonding (type I))
(750,690)
VSS
5
4
Q
Y INHN
6
3
VDD
(0,0)
1
2
XT
XTN
■
CF5028C×
(for Wire Bonding (type II))
(750,690)
Y
Q
5
4
VSS
VDD
6
3
INHN
(0,0)
1
2
XTN
XT
(750,690)
VDD
5
4
Q
Y INHN
6
3
VSS
(0,0)
1
2
XT
XTN
X
X
X
Chip size: 0.75 × 0.69mm
Chip thickness: 130 ± 15µm
PAD size: 90µm
Chip base: VSS level
Chip size: 0.75 × 0.69mm
Chip thickness: 130 ± 15µm
PAD size: 90µm
Chip base: VSS level
Chip size: 0.75 × 0.69mm
Chip thickness: 130 ± 15µm
PAD size: 90µm
Chip base: VSS level
PAD DIMENSIONS
PIN DESCRIPTION
Pad dimensions [µm]
Pad No.
Pad No.
5028A× 5028B× 5028C×
Pin
Name
Description
X
Y
1
229
114
1
2
1
XT
Amplifier input
2
520
114
2
1
2
XTN
Amplifier output
Crystal connection pins. Crystal is connected
between XT and XTN.
3
636
304
3
6
5
VDD
(+) supply voltage
–
4
636
531
4
5
4
Q
Output
Output frequency determined by internal circuit
to one of fO, fO/2, fO/4, fO/8, fO/16, fO/32, fO/64
5
114
531
5
4
3
VSS
(–) ground
–
6
114
304
6
3
6
INHN
Output state
control input
High impedance when LOW (oscillator stops).
Power-saving pull-up resistor built-in.
BLOCK DIAGRAM
VDD VSS
INHN
RF
DIVIDER
CMOS
Q
XT
RD
CG
CD
XTN
SEIKO NPC CORPORATION —3
WF5028 series
VERSION DISCRIMINATION INTERNAL COMPONENTS
The WF5028 series device version is not determined solely by the mask pattern, but can also be determined by
the trimming of internal trimming fuses.
■
Version determined by laser trimming:
These chips are produced from a common device by the laser trimming of fuses corresponding to the ordered
version, shown in table 1. These devices are shipped for electrical characteristics testing. Laser-trimmed versions are identified externally by the combination of the version name marking (1) and the locations of
trimmed fuses (2).
■
Version determined by mask pattern:
These chips are fabricated using the mask corresponding to the ordered version, and do not require trimming.
Mask-fabricated versions are identified externally by the version name marking (1) only.
Since the WF5028 series devices are manufactured using 2 methods, there are 2 types of IC chip available
(identified externally) for the same version name. The identification markings for all WF5028 series device
versions is shown in table 2.
(750,690)
5028
(1) Version code on die
(2) Trimming fuses
F1
F2
F3
NPC
Table 1. Version and trimming fuses
F4
F5
F6
F7
F8
F9
■
5028×1 trimming fuses (untrimmed)
■
5028×2 trimming fuses (F1 link trimmed)
■
5028×3 trimming fuses (F2 link trimmed)
■
5028×4 trimming fuses (F1 and F2 links trimmed)
Trimming fuse number*1
Version
F1
F2
F3
WF5028×1
–
–
–
WF5028×2
×
–
–
WF5028×3
–
×
–
WF5028×4
×
×
–
WF5028×5
–
–
×
WF5028×6
×
–
×
WF5028×7
–
×
×
*1. –: untrimmed, ×: trimmed, F4 to F9 not used
: trimmed device
SEIKO NPC CORPORATION —4
WF5028 series
Table 2. Version identification by version name and chip markings
Version set by trimming fuses
Version
name
Version set by mask pattern
Trimming fuses*1
Version
name chip
marking
F1
F2
F3
5028A1
AX
−
−
−
AX
5028A2
AX
×
−
−
A2
5028A3
AX
−
×
−
A3
5028A4
AX
×
×
−
A4
5028A5
AX
−
−
×
A5
5028A6
AX
×
−
×
A6
5028A7
AX
−
×
×
A7
5028B1
BX
−
−
−
BX
5028B2
BX
×
−
−
B2
5028B3
BX
−
×
−
B3
5028B4
BX
×
×
−
5028B5
BX
−
−
×
B5
5028B6
BX
×
−
×
B6
5028B7
BX
−
×
×
B7
5028C1
CX
−
−
−
CX
5028C2
CX
×
−
−
C2
5028C3
CX
−
×
−
C3
5028C4
CX
×
×
−
C4
5028C5
CX
−
−
×
C5
5028C6
CX
×
−
×
C6
5028C7
CX
−
×
×
C7
F4
F5
F6
F7
Untrimmed
F8
F9
Version
name chip
marking
B4
Trimming
fuses
F1 to F9
Untrimmed
*1. −: untrimmed, ×: trimmed
SEIKO NPC CORPORATION —5
WF5028 series
SPECIFICATIONS
Absolute Maximum Ratings
VSS = 0V
Parameter
Symbol
Condition
Rating
Unit
−0.5 to +4.0
V
Supply voltage range
VDD
Between VDD and VSS
Input voltage range
VIN
Input pins
−0.5 to VDD + 0.5
V
Output voltage range
VOUT
Output pins
−0.5 to VDD + 0.5
V
Storage temperature range
TSTG
Wafer form
−65 to +150
°C
Output current
IOUT
Q pin
± 20
mA
Recommended Operating Conditions
VSS = 0V
Rating
Parameter
Symbol
Condition
Unit
min
typ
max
Operating supply voltage
VDD
CL ≤ 15pF
0.8
–
2.0
V
Input voltage
VIN
Input pins
VSS
–
VDD
V
−40
–
+85
°C
20
–
50
MHz
0.75
–
50
MHz
Operating temperature
TOPR
Oscillation frequency*1
fO
Output frequency
fOUT
5028×1 to 5028×7
5028×1 to 5028×7, CL ≤ 15pF
*1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency
range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation
characteristics of components must be carefully evaluated.
SEIKO NPC CORPORATION —6
WF5028 series
Electrical Characteristics
DC Characteristics
VDD = 0.8 to 2.0V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Parameter
HIGH-level output voltage
Symbol
VOH
Rating
Condition
Q: Measurement cct 3
LOW-level output voltage
VOL
Q: Measurement cct 3
HIGH-level input voltage
VIH
INHN, Measurement cct 4
LOW-level input voltage
VIL
INHN, Measurement cct 4
typ
max
IOH = – 0.7mA, VDD = 0.8V
0.6
–
–
V
IOH = – 3mA, VDD = 1.1V
0.8
–
–
V
IOH = – 5mA, VDD = 1.4V
1.0
–
–
V
IOL = 0.7mA, VDD = 0.8V
–
–
0.2
V
IOL = 3mA, VDD = 1.1V
–
–
0.3
V
IOL = 5mA, VDD = 1.4V
Output leakage current
Current consumption*1
IZ
IDD
INHN pull-up resistance
Oscillator feedback
resistance
Oscillator capacitance
IST
RUP1
RUP2
CD
–
0.4
V
–
–
V
–
–
0.3VDD
V
–
–
20
µA
VOL = VSS
20
–
–
µA
5028×1 (fO), Measurement cct 1,
no load, INHN = open, fO = 48MHz,
fOUT = 48MHz
VDD = 1.5V
–
1.7
2.6
mA
VDD = 1.2V
–
1.3
2.0
mA
VDD = 0.9V
–
0.9
1.4
mA
5028×2 (fO/2), Measurement cct 1,
no load, INHN = open, fO = 48MHz,
fOUT = 24MHz
VDD = 1.5V
–
1.5
2.3
mA
VDD = 1.2V
–
1.1
1.7
mA
VDD = 0.9V
–
0.8
1.2
mA
5028×3 (fO/4), Measurement cct 1,
no load, INHN = open, fO = 48MHz,
fOUT = 12MHz
VDD = 1.5V
–
1.3
2.0
mA
VDD = 1.2V
–
1.0
1.5
mA
VDD = 0.9V
–
0.6
0.9
mA
5028×4 (fO/8), Measurement cct 1,
no load, INHN = open, fO = 48MHz,
fOUT = 6MHz
VDD = 1.5V
–
1.2
1.8
mA
VDD = 1.2V
–
0.9
1.4
mA
VDD = 0.9V
–
0.55
0.9
mA
5028×5 (fO/16), Measurement cct 1,
no load, INHN = open, fO = 48MHz,
fOUT = 3MHz
VDD = 1.5V
–
1.1
1.7
mA
VDD = 1.2V
–
0.8
1.2
mA
VDD = 0.9V
–
0.5
0.8
mA
5028×6 (fO/32), Measurement cct 1,
no load, INHN = open, fO = 48MHz,
fOUT = 1.5MHz
VDD = 1.5V
–
1.1
1.7
mA
VDD = 1.2V
–
0.8
1.2
mA
VDD = 0.9V
–
0.5
0.8
mA
VDD = 1.5V
–
1.1
1.7
mA
VDD = 1.2V
–
0.8
1.2
mA
VDD = 0.9V
–
0.5
0.8
mA
Q: Measurement cct 5,
INHN = LOW, Ta = 25°C
Measurement cct 1, INHN = LOW, Ta = 25°C
Measurement cct 6
Rf
CG
–
0.7VDD
VOH = VDD
5028×7 (fO/64), Measurement cct 1,
no load, INHN = open, fO = 48MHz,
fOUT = 0.75MHz
Standby current
Unit
min
Design value (a monitor pattern on a wafer is tested),
Excluding parasitic capacitance.
–
–
100
µA
0.4
2
10
MΩ
30
70
150
kΩ
50
100
200
kΩ
–
2
–
pF
–
12
–
pF
*1. When loading the capacitance to Q pin, the charge and discharge current (ICL) consumed by load capacitance (CL) is given by the following equation.
(output frequency: fOUT)
ICL = CL × VDD × fOUT
SEIKO NPC CORPORATION —7
WF5028 series
AC Characteristics
VDD = 0.8 to 2.0V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Symbol
Condition
tr1
Output rise time
tr2
tf1
Output fall time
tf2
Unit
min
typ
max
Measurement cct 1, CL = 15pF,
0.2VDD to 0.8VDD
VDD = 1.1 to 2.0V
–
1.3
3.0
ns
VDD = 0.8 to 1.1V
–
1.7
4.0
ns
Measurement cct 1, CL = 15pF,
0.8VDD to 0.2VDD
VDD = 1.1 to 2.0V
–
1.3
3.0
ns
VDD = 0.8 to 1.1V
–
1.7
4.0
ns
Output duty cycle
Duty
Measurement cct 1, Ta = 25°C, CL = 15pF
45
50
55
%
Output disable delay time
tOD
Measurement cct 2, Ta = 25°C, CL ≤ 15pF
–
–
50
µs
Timing chart
0.8VDD
Q
0.8VDD
TW
0.2VDD
DUTY measurement
voltage (0.5V DD )
0.2VDD
DUTY= TW/ T
T
tr
100 (%)
tf
Figure 1. Output switching waveform
INHN
VIH
VIL
tOD
tSTR
0.1V
Q
Normal
operation
Output
stopped
Hi-Z*
Normal
operation
When INHN goes HIGH to LOW, the Q output goes HIGH once and then becomes high impedance.
When INHN goes LOW to HIGH, the Q output goes from high impedance to normal output operation when the oscillation starts (oscillation is detected).
*) The high-impedance interval in the figure is shown as a LOW level due to the 1kΩ pull-down resistor connected to the Q pin (see "Measurement circuit
2" in the "Measurement Circuits" section).
Figure 2. Output disable and oscillation start timing chart
SEIKO NPC CORPORATION —8
WF5028 series
FUNCTIONAL DESCRIPTION
Standby Function
When INHN goes LOW, the Q output becomes high impedance.
INHN
Q
Oscillator
HIGH (or open)
Frequency output
Normal operation
LOW
High impedance
Stopped
Power-saving Pull-up Resistor
The INHN pin pull-up resistance RUP1 or RUP2 changes in response to the input level (HIGH or LOW). When
INHN is tied LOW level, the pull-up resistance is large (RUP1), reducing the current consumed by the resistance. When INHN is left open circuit, the pull-up resistance is small (RUP2), which increases the input susceptibility to external noise. However, the pull-up resistance ties the INHN pin HIGH level to prevent external
noise from unexpectedly stopping the output.
Oscillation Detector Function
The WF5028 series also feature an oscillation detector circuit. This circuit functions to disable the outputs until
the oscillator circuit starts and oscillation becomes stable. This alleviates the danger of abnormal oscillator output at oscillator start-up when power is applied or when INHN is switched.
SEIKO NPC CORPORATION —9
WF5028 series
MEASUREMENT CIRCUITS
Measurement cct 1
Measurement cct 4
Measurement parameter: IDD, IST, Duty, tr , tf
Measurement parameter: VIH, VIL
IDD
IST
A
VDD
VDD
XT
XT
X'tal
IDD: Open
X'tal
XTN
XTN
INHN VSS
INHN VSS
CL = 15pF
(Including probe
capacitance)
IDD: Open
IST: Short
Note: The AC characteristics are observed using an oscilloscope on
pin Q.
VIH
V
VIL
VIH: Voltage in VSS to VDD transition that changes the output state.
VIL: Voltage in VDD to VSS transition that changes the output state.
INHN has an oscillation stop function.
Measurement cct 2
Measurement cct 5
Measurement parameter: tOD
Measurement parameter: IZ
VDD
VDD
0.1µF
VDD
0.1µF
Q
C1
Signal
Generator
0.1µF
Q
Q
0.1µF
A
Q
or
VSS
XTN
CL
INHN VSS
RL
IZ
INHN VSS
R1
VDD
or
VSS
XTN input signal: 1Vp-p, sine wave
C1: 0.001µF
CL: 15pF
R1: 50Ω
RL: 1kΩ
Measurement cct 6
Measurement parameter: RUP1, RUP2
Measurement cct 3
Measurement parameter: VOH, VOL
VDD
0.1µF
0.1µF
VDD
INHN VSS
50Ω
Signal
Generator
Q
0.001µF
XTN
VOH
V
VOL
VSS
50Ω
∆V
VOH
VS
VS adjusted such that ∆V =
50 × IOH.
VS
VOL
VIN V
0.1µF
VS
A IUP
RUP1 =
VDD
IUP
(VIN = 0V)
RUP2 = VDD 0.7V DD (VIN = 0.7V DD)
IUP
∆V
VS adjusted such that ∆V =
50 × IOL.
XTN input signal: 1Vp-p, sine wave
SEIKO NPC CORPORATION —10
WF5028 series
TYPICAL PERFORMANCE
The following characteristics measured using the crystal below. Note that the characteristics will vary with the
crystal used.
■
Crystal used for measurement
■
Parameter
fO = 48MHz
C0 [pF]
1.6
R1 [Ω]
12
Crystal parameters
C1
L1
R1
C0
Current Consumption
Negative Resistance
5
0
CL = 15pF
3
2
No load
1
0
0.5
1.0
1.5
2.0
VDD [V]
Negative resistance [Ω]
4
IDD [mA]
20
Frequency [MHz]
40
60
80
100
0
−200
C0 = 2pF
−400
−600
C0 = 1pF
−800
C0 = 0pF
−1000
5028×1, fOSC = 48MHz, fOUT = 48MHz, Ta = 25°C
5028×1, VDD = 0.9V, Ta = 25°C
Characteristics are measured with a capacitance C0, representing
the crystal equivalent circuit C0 capacitance, connected between
the XT and XTN pins. Measurements are performed with Agilent
4396B using the NPC test jig. Characteristics may vary with
measurement jig and measurement conditions.
Drive Level
12
200
8
f = 48MHz
Drive level [µW]
Frequency deviation [ppm]
Frequency Deviation by Supply Voltage
Change
4
0
−4
−8
−12
0.5
1.0
1.5
2.0
VDD [V]
5028×1, CL = 15pF, 1.2V standard, Ta = 25°C
f = 48MHz
150
100
50
0
0.5
1.0
1.5
2.0
VDD [V]
5028×1, fOSC = 48MHz, Ta = 25°C
SEIKO NPC CORPORATION —11
WF5028 series
Phase Noise
Output Waveform
Measurement equipment: Agilent E5052
Signal Source Analyzer
Measurement equipment: Agilent DSO80604B
Oscilloscope
Phase noise [dBc/Hz]
−40
−60
−80
−100
−120
−140
0.9V
1.2V
1.5V
1.8V
−160
−180
10
100
1,000
10,000
100,000
1,000,000
10,000,000
Offset frequency [Hz]
5028×1, fOSC = 48MHz, fOUT = 48MHz, Ta = 25°C
5028×1, VDD = 0.9V, fOUT = 48MHz,
CL = 15pF, Ta = RT
SEIKO NPC CORPORATION —12
WF5028 series
Please pay your attention to the following points at time of using the products shown in this document.
The products shown in this document (hereinafter “Products”) are not intended to be used for the apparatus that exerts harmful influence on
human lives due to the defects, failure or malfunction of the Products. Customers are requested to obtain prior written agreement for such
use from SEIKO NPC CORPORATION (hereinafter “NPC”). Customers shall be solely responsible for, and indemnify and hold NPC free and
harmless from, any and all claims, damages, losses, expenses or lawsuits, due to such use without such agreement. NPC reserves the right
to change the specifications of the Products in order to improve the characteristic or reliability thereof. NPC makes no claim or warranty that
the contents described in this document dose not infringe any intellectual property right or other similar right owned by third parties.
Therefore, NPC shall not be responsible for such problems, even if the use is in accordance with the descriptions provided in this document.
Any descriptions including applications, circuits, and the parameters of the Products in this document are for reference to use the Products,
and shall not be guaranteed free from defect, inapplicability to the design for the mass-production products without further testing or
modification. Customers are requested not to export or re-export, directly or indirectly, the Products to any country or any entity not in
compliance with or in violation of the national export administration laws, treaties, orders and regulations. Customers are requested
appropriately take steps to obtain required permissions or approvals from appropriate government agencies.
SEIKO NPC CORPORATION
1-9-9, Hatchobori, Chuo-ku,
Tokyo 104-0032, Japan
Telephone: +81-3-5541-6501
Facsimile: +81-3-5541-6510
http://www.npc.co.jp/
Email: sales@npc.co.jp
NC0606AE
2008.01
SEIKO NPC CORPORATION —13