WF5028 series 0.8V operation Crystal Oscillator Module ICs OVERVIEW The WF5028 series are miniature crystal oscillator module ICs. The devices are fabricated using a proprietary low voltage process, enabling 0.8V operation. The pad layouts are selective from 3 types depending on package structures, mounting methods, which are suitable for miniature crystal oscillators. The WF5028 series can be used to realize ultra miniature, ultra low voltage crystal oscillators. FEATURES ■ ■ ■ ■ ■ Wide range of operating supply voltage: 0.8 to 2.0V Optimized low crystal drive current oscillation for miniature crystal units 3 pad layout options for mounting • WF5028A× series: for Flip Chip Bonding • CF5028B× series: for Wire Bonding (type I) • CF5028C× series: for Wire Bonding (type II) Recommended oscillation frequency range: 20MHz to 50MHz Multi-stage frequency divider for low-frequency output support: 0.75MHz (min) ■ ■ ■ ■ ■ ■ ■ Frequency divider built-in • Selectable by version: fO, fO/2, fO/4, fO/8, fO/16, fO/32, fO/64 −40 to 85°C operating temperature range Standby function • High impedance in standby mode, oscillator stops CMOS output duty level (1/2VDD) 50 ± 5% output duty 15pF output drive capability Wafer form (WF5028××) Chip form (CF5028××) APPLICATIONS ■ 3.2 × 2.5, 2.5 × 2.0, 2.0 × 1.6 size miniature crystal oscillator modules ORDERING INFORMATION Device Package WF5028××–4 Wafer form CF5028××–4 Chip form SEIKO NPC CORPORATION —1 WF5028 series SERIES CONFIGURATION Version*1 Operating supply voltage range [V] Oscillation mode Recommended oscillation frequency range*2 [MHz] Output frequency WF5028×1 fO (oscillation frequency) WF5028×2 fO/2 WF5028×3 WF5028×4 Standby mode Output drive capability [mA] Oscillator stop Output state (VDD = 1.2V) function fO/4 0.8 to 2.0 Fundamental 20 to 50 ±3 fO/8 WF5028×5 fO/16 WF5028×6 fO/32 WF5028×7 fO/64 Yes Hi-Z *1. Chip form devices have designation CF5028××. *2. The recommended oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. VERSION NAME Device Package WF5028××–4 Wafer form Version name WF5028 Form WF: Wafer form CF: Chip (Die) form CF5028××–4 Chip form −4 Frequency divider function Pad layout type A: for Flip Chip Bonding B: for Wire Bonding (type I) C: for Wire Bonding (type II) SEIKO NPC CORPORATION —2 WF5028 series PAD LAYOUT (Unit: µm) ■ WF5028A× (for Flip Chip Bonding) ■ CF5028B× (for Wire Bonding (type I)) (750,690) VSS 5 4 Q Y INHN 6 3 VDD (0,0) 1 2 XT XTN ■ CF5028C× (for Wire Bonding (type II)) (750,690) Y Q 5 4 VSS VDD 6 3 INHN (0,0) 1 2 XTN XT (750,690) VDD 5 4 Q Y INHN 6 3 VSS (0,0) 1 2 XT XTN X X X Chip size: 0.75 × 0.69mm Chip thickness: 130 ± 15µm PAD size: 90µm Chip base: VSS level Chip size: 0.75 × 0.69mm Chip thickness: 130 ± 15µm PAD size: 90µm Chip base: VSS level Chip size: 0.75 × 0.69mm Chip thickness: 130 ± 15µm PAD size: 90µm Chip base: VSS level PAD DIMENSIONS PIN DESCRIPTION Pad dimensions [µm] Pad No. Pad No. 5028A× 5028B× 5028C× Pin Name Description X Y 1 229 114 1 2 1 XT Amplifier input 2 520 114 2 1 2 XTN Amplifier output Crystal connection pins. Crystal is connected between XT and XTN. 3 636 304 3 6 5 VDD (+) supply voltage – 4 636 531 4 5 4 Q Output Output frequency determined by internal circuit to one of fO, fO/2, fO/4, fO/8, fO/16, fO/32, fO/64 5 114 531 5 4 3 VSS (–) ground – 6 114 304 6 3 6 INHN Output state control input High impedance when LOW (oscillator stops). Power-saving pull-up resistor built-in. BLOCK DIAGRAM VDD VSS INHN RF DIVIDER CMOS Q XT RD CG CD XTN SEIKO NPC CORPORATION —3 WF5028 series VERSION DISCRIMINATION INTERNAL COMPONENTS The WF5028 series device version is not determined solely by the mask pattern, but can also be determined by the trimming of internal trimming fuses. ■ Version determined by laser trimming: These chips are produced from a common device by the laser trimming of fuses corresponding to the ordered version, shown in table 1. These devices are shipped for electrical characteristics testing. Laser-trimmed versions are identified externally by the combination of the version name marking (1) and the locations of trimmed fuses (2). ■ Version determined by mask pattern: These chips are fabricated using the mask corresponding to the ordered version, and do not require trimming. Mask-fabricated versions are identified externally by the version name marking (1) only. Since the WF5028 series devices are manufactured using 2 methods, there are 2 types of IC chip available (identified externally) for the same version name. The identification markings for all WF5028 series device versions is shown in table 2. (750,690) 5028 (1) Version code on die (2) Trimming fuses F1 F2 F3 NPC Table 1. Version and trimming fuses F4 F5 F6 F7 F8 F9 ■ 5028×1 trimming fuses (untrimmed) ■ 5028×2 trimming fuses (F1 link trimmed) ■ 5028×3 trimming fuses (F2 link trimmed) ■ 5028×4 trimming fuses (F1 and F2 links trimmed) Trimming fuse number*1 Version F1 F2 F3 WF5028×1 – – – WF5028×2 × – – WF5028×3 – × – WF5028×4 × × – WF5028×5 – – × WF5028×6 × – × WF5028×7 – × × *1. –: untrimmed, ×: trimmed, F4 to F9 not used : trimmed device SEIKO NPC CORPORATION —4 WF5028 series Table 2. Version identification by version name and chip markings Version set by trimming fuses Version name Version set by mask pattern Trimming fuses*1 Version name chip marking F1 F2 F3 5028A1 AX − − − AX 5028A2 AX × − − A2 5028A3 AX − × − A3 5028A4 AX × × − A4 5028A5 AX − − × A5 5028A6 AX × − × A6 5028A7 AX − × × A7 5028B1 BX − − − BX 5028B2 BX × − − B2 5028B3 BX − × − B3 5028B4 BX × × − 5028B5 BX − − × B5 5028B6 BX × − × B6 5028B7 BX − × × B7 5028C1 CX − − − CX 5028C2 CX × − − C2 5028C3 CX − × − C3 5028C4 CX × × − C4 5028C5 CX − − × C5 5028C6 CX × − × C6 5028C7 CX − × × C7 F4 F5 F6 F7 Untrimmed F8 F9 Version name chip marking B4 Trimming fuses F1 to F9 Untrimmed *1. −: untrimmed, ×: trimmed SEIKO NPC CORPORATION —5 WF5028 series SPECIFICATIONS Absolute Maximum Ratings VSS = 0V Parameter Symbol Condition Rating Unit −0.5 to +4.0 V Supply voltage range VDD Between VDD and VSS Input voltage range VIN Input pins −0.5 to VDD + 0.5 V Output voltage range VOUT Output pins −0.5 to VDD + 0.5 V Storage temperature range TSTG Wafer form −65 to +150 °C Output current IOUT Q pin ± 20 mA Recommended Operating Conditions VSS = 0V Rating Parameter Symbol Condition Unit min typ max Operating supply voltage VDD CL ≤ 15pF 0.8 – 2.0 V Input voltage VIN Input pins VSS – VDD V −40 – +85 °C 20 – 50 MHz 0.75 – 50 MHz Operating temperature TOPR Oscillation frequency*1 fO Output frequency fOUT 5028×1 to 5028×7 5028×1 to 5028×7, CL ≤ 15pF *1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. SEIKO NPC CORPORATION —6 WF5028 series Electrical Characteristics DC Characteristics VDD = 0.8 to 2.0V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Parameter HIGH-level output voltage Symbol VOH Rating Condition Q: Measurement cct 3 LOW-level output voltage VOL Q: Measurement cct 3 HIGH-level input voltage VIH INHN, Measurement cct 4 LOW-level input voltage VIL INHN, Measurement cct 4 typ max IOH = – 0.7mA, VDD = 0.8V 0.6 – – V IOH = – 3mA, VDD = 1.1V 0.8 – – V IOH = – 5mA, VDD = 1.4V 1.0 – – V IOL = 0.7mA, VDD = 0.8V – – 0.2 V IOL = 3mA, VDD = 1.1V – – 0.3 V IOL = 5mA, VDD = 1.4V Output leakage current Current consumption*1 IZ IDD INHN pull-up resistance Oscillator feedback resistance Oscillator capacitance IST RUP1 RUP2 CD – 0.4 V – – V – – 0.3VDD V – – 20 µA VOL = VSS 20 – – µA 5028×1 (fO), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 48MHz VDD = 1.5V – 1.7 2.6 mA VDD = 1.2V – 1.3 2.0 mA VDD = 0.9V – 0.9 1.4 mA 5028×2 (fO/2), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 24MHz VDD = 1.5V – 1.5 2.3 mA VDD = 1.2V – 1.1 1.7 mA VDD = 0.9V – 0.8 1.2 mA 5028×3 (fO/4), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 12MHz VDD = 1.5V – 1.3 2.0 mA VDD = 1.2V – 1.0 1.5 mA VDD = 0.9V – 0.6 0.9 mA 5028×4 (fO/8), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 6MHz VDD = 1.5V – 1.2 1.8 mA VDD = 1.2V – 0.9 1.4 mA VDD = 0.9V – 0.55 0.9 mA 5028×5 (fO/16), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 3MHz VDD = 1.5V – 1.1 1.7 mA VDD = 1.2V – 0.8 1.2 mA VDD = 0.9V – 0.5 0.8 mA 5028×6 (fO/32), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 1.5MHz VDD = 1.5V – 1.1 1.7 mA VDD = 1.2V – 0.8 1.2 mA VDD = 0.9V – 0.5 0.8 mA VDD = 1.5V – 1.1 1.7 mA VDD = 1.2V – 0.8 1.2 mA VDD = 0.9V – 0.5 0.8 mA Q: Measurement cct 5, INHN = LOW, Ta = 25°C Measurement cct 1, INHN = LOW, Ta = 25°C Measurement cct 6 Rf CG – 0.7VDD VOH = VDD 5028×7 (fO/64), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 0.75MHz Standby current Unit min Design value (a monitor pattern on a wafer is tested), Excluding parasitic capacitance. – – 100 µA 0.4 2 10 MΩ 30 70 150 kΩ 50 100 200 kΩ – 2 – pF – 12 – pF *1. When loading the capacitance to Q pin, the charge and discharge current (ICL) consumed by load capacitance (CL) is given by the following equation. (output frequency: fOUT) ICL = CL × VDD × fOUT SEIKO NPC CORPORATION —7 WF5028 series AC Characteristics VDD = 0.8 to 2.0V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol Condition tr1 Output rise time tr2 tf1 Output fall time tf2 Unit min typ max Measurement cct 1, CL = 15pF, 0.2VDD to 0.8VDD VDD = 1.1 to 2.0V – 1.3 3.0 ns VDD = 0.8 to 1.1V – 1.7 4.0 ns Measurement cct 1, CL = 15pF, 0.8VDD to 0.2VDD VDD = 1.1 to 2.0V – 1.3 3.0 ns VDD = 0.8 to 1.1V – 1.7 4.0 ns Output duty cycle Duty Measurement cct 1, Ta = 25°C, CL = 15pF 45 50 55 % Output disable delay time tOD Measurement cct 2, Ta = 25°C, CL ≤ 15pF – – 50 µs Timing chart 0.8VDD Q 0.8VDD TW 0.2VDD DUTY measurement voltage (0.5V DD ) 0.2VDD DUTY= TW/ T T tr 100 (%) tf Figure 1. Output switching waveform INHN VIH VIL tOD tSTR 0.1V Q Normal operation Output stopped Hi-Z* Normal operation When INHN goes HIGH to LOW, the Q output goes HIGH once and then becomes high impedance. When INHN goes LOW to HIGH, the Q output goes from high impedance to normal output operation when the oscillation starts (oscillation is detected). *) The high-impedance interval in the figure is shown as a LOW level due to the 1kΩ pull-down resistor connected to the Q pin (see "Measurement circuit 2" in the "Measurement Circuits" section). Figure 2. Output disable and oscillation start timing chart SEIKO NPC CORPORATION —8 WF5028 series FUNCTIONAL DESCRIPTION Standby Function When INHN goes LOW, the Q output becomes high impedance. INHN Q Oscillator HIGH (or open) Frequency output Normal operation LOW High impedance Stopped Power-saving Pull-up Resistor The INHN pin pull-up resistance RUP1 or RUP2 changes in response to the input level (HIGH or LOW). When INHN is tied LOW level, the pull-up resistance is large (RUP1), reducing the current consumed by the resistance. When INHN is left open circuit, the pull-up resistance is small (RUP2), which increases the input susceptibility to external noise. However, the pull-up resistance ties the INHN pin HIGH level to prevent external noise from unexpectedly stopping the output. Oscillation Detector Function The WF5028 series also feature an oscillation detector circuit. This circuit functions to disable the outputs until the oscillator circuit starts and oscillation becomes stable. This alleviates the danger of abnormal oscillator output at oscillator start-up when power is applied or when INHN is switched. SEIKO NPC CORPORATION —9 WF5028 series MEASUREMENT CIRCUITS Measurement cct 1 Measurement cct 4 Measurement parameter: IDD, IST, Duty, tr , tf Measurement parameter: VIH, VIL IDD IST A VDD VDD XT XT X'tal IDD: Open X'tal XTN XTN INHN VSS INHN VSS CL = 15pF (Including probe capacitance) IDD: Open IST: Short Note: The AC characteristics are observed using an oscilloscope on pin Q. VIH V VIL VIH: Voltage in VSS to VDD transition that changes the output state. VIL: Voltage in VDD to VSS transition that changes the output state. INHN has an oscillation stop function. Measurement cct 2 Measurement cct 5 Measurement parameter: tOD Measurement parameter: IZ VDD VDD 0.1µF VDD 0.1µF Q C1 Signal Generator 0.1µF Q Q 0.1µF A Q or VSS XTN CL INHN VSS RL IZ INHN VSS R1 VDD or VSS XTN input signal: 1Vp-p, sine wave C1: 0.001µF CL: 15pF R1: 50Ω RL: 1kΩ Measurement cct 6 Measurement parameter: RUP1, RUP2 Measurement cct 3 Measurement parameter: VOH, VOL VDD 0.1µF 0.1µF VDD INHN VSS 50Ω Signal Generator Q 0.001µF XTN VOH V VOL VSS 50Ω ∆V VOH VS VS adjusted such that ∆V = 50 × IOH. VS VOL VIN V 0.1µF VS A IUP RUP1 = VDD IUP (VIN = 0V) RUP2 = VDD 0.7V DD (VIN = 0.7V DD) IUP ∆V VS adjusted such that ∆V = 50 × IOL. XTN input signal: 1Vp-p, sine wave SEIKO NPC CORPORATION —10 WF5028 series TYPICAL PERFORMANCE The following characteristics measured using the crystal below. Note that the characteristics will vary with the crystal used. ■ Crystal used for measurement ■ Parameter fO = 48MHz C0 [pF] 1.6 R1 [Ω] 12 Crystal parameters C1 L1 R1 C0 Current Consumption Negative Resistance 5 0 CL = 15pF 3 2 No load 1 0 0.5 1.0 1.5 2.0 VDD [V] Negative resistance [Ω] 4 IDD [mA] 20 Frequency [MHz] 40 60 80 100 0 −200 C0 = 2pF −400 −600 C0 = 1pF −800 C0 = 0pF −1000 5028×1, fOSC = 48MHz, fOUT = 48MHz, Ta = 25°C 5028×1, VDD = 0.9V, Ta = 25°C Characteristics are measured with a capacitance C0, representing the crystal equivalent circuit C0 capacitance, connected between the XT and XTN pins. Measurements are performed with Agilent 4396B using the NPC test jig. Characteristics may vary with measurement jig and measurement conditions. Drive Level 12 200 8 f = 48MHz Drive level [µW] Frequency deviation [ppm] Frequency Deviation by Supply Voltage Change 4 0 −4 −8 −12 0.5 1.0 1.5 2.0 VDD [V] 5028×1, CL = 15pF, 1.2V standard, Ta = 25°C f = 48MHz 150 100 50 0 0.5 1.0 1.5 2.0 VDD [V] 5028×1, fOSC = 48MHz, Ta = 25°C SEIKO NPC CORPORATION —11 WF5028 series Phase Noise Output Waveform Measurement equipment: Agilent E5052 Signal Source Analyzer Measurement equipment: Agilent DSO80604B Oscilloscope Phase noise [dBc/Hz] −40 −60 −80 −100 −120 −140 0.9V 1.2V 1.5V 1.8V −160 −180 10 100 1,000 10,000 100,000 1,000,000 10,000,000 Offset frequency [Hz] 5028×1, fOSC = 48MHz, fOUT = 48MHz, Ta = 25°C 5028×1, VDD = 0.9V, fOUT = 48MHz, CL = 15pF, Ta = RT SEIKO NPC CORPORATION —12 WF5028 series Please pay your attention to the following points at time of using the products shown in this document. The products shown in this document (hereinafter “Products”) are not intended to be used for the apparatus that exerts harmful influence on human lives due to the defects, failure or malfunction of the Products. Customers are requested to obtain prior written agreement for such use from SEIKO NPC CORPORATION (hereinafter “NPC”). Customers shall be solely responsible for, and indemnify and hold NPC free and harmless from, any and all claims, damages, losses, expenses or lawsuits, due to such use without such agreement. NPC reserves the right to change the specifications of the Products in order to improve the characteristic or reliability thereof. NPC makes no claim or warranty that the contents described in this document dose not infringe any intellectual property right or other similar right owned by third parties. Therefore, NPC shall not be responsible for such problems, even if the use is in accordance with the descriptions provided in this document. Any descriptions including applications, circuits, and the parameters of the Products in this document are for reference to use the Products, and shall not be guaranteed free from defect, inapplicability to the design for the mass-production products without further testing or modification. Customers are requested not to export or re-export, directly or indirectly, the Products to any country or any entity not in compliance with or in violation of the national export administration laws, treaties, orders and regulations. Customers are requested appropriately take steps to obtain required permissions or approvals from appropriate government agencies. SEIKO NPC CORPORATION 1-9-9, Hatchobori, Chuo-ku, Tokyo 104-0032, Japan Telephone: +81-3-5541-6501 Facsimile: +81-3-5541-6510 http://www.npc.co.jp/ Email: [email protected] NC0606AE 2008.01 SEIKO NPC CORPORATION —13