5052H_ND12015E00

5052H series
Crystal Oscillator Module ICs
OVERVIEW
The 5052H series are miniature crystal oscillator module ICs supported 20MHz to 80 MHz fundamental oscillation mode and 125°C
operation. The Oscillator circuit stage has voltage regulator drive, significantly reducing current consumption and crystal drive current,
compared with existing devices, and significantly reducing the oscillator characteristics supply voltage dependency. There are 3 pad layout
package options available for optimized mounting, making these devices ideal for miniature crystal oscillators.
FEATURES
▪ Wide range of operating supply voltage: 1.60 to 3.63V
▪ Regulated voltage drive oscillator circuit for reduced
power consumption and crystal drive current
▪ Optimized low crystal drive current oscillation for
miniature crystal units
▪ 3 pad layout options for mounting
5052HAx: for Flip Chip Bonding
5052HBx: for Wire Bonding (Type I)
5052HCx: for Wire Bonding (Type II)
▪ Recommended oscillation frequency range
(fundamental oscillator) :20 to 60MHz (Hx1~Hx5 ver.)
40 to 80MHz (HxP~HxT ver.)
▪ Multi-stage frequency divider for low-frequency
output support: 1.25MHz (Hx1~Hx5 ver.)
2.5MHz (HxP~HxT ver.)
▪ Frequency divider built-in
Selectable by version: fOSC,fOSC/2,fOSC/4,fOSC/8,fOSC/16
▪ Output drive capability: ±4mA
▪ -40 to 125°C operating temperature range
▪ Standby function
High impedance in standby mode, oscillator stops
▪ CMOS output duty level (1/2VDD)
▪ 50±5% output duty
▪ 15pF output drive capability
▪ Wafer form (WF5052Hxx), Chip form (CF5052Hxx)
APPLICATIONS
▪ 3.2 x 2.5 , 2.5 x 2.0 , 2.0 x 1.6 size miniature crystal oscillator modules
SERIES CONFIGURATION
Operating supply
voltage range[V]
PAD layout
Flip Chip Bonding
1.60 to 3.63
Output frequency and version name*2
Oscillation frequency
*1
range [MHz]
fOSC
fOSC/2
fOSC/4
fOSC/8
fOSC/16
20 to 60
5052HA1
5052HA2
5052HA3
5052HA4
5052HA5
40 to 80
5052HAP
5052HAQ
5052HAR
5052HAS
5052HAT
Wire Bonding
20 to 60
5052HB1
5052HB2
5052HB3
5052HB4
5052HB5
Type I
40 to 80
5052HBP
-
-
-
-
Wire Bonding
20 to 60
5052HC1
5052HC2
5052HC3
5052HC4
5052HC5
Type II
40 to 80
5052HCP
-
-
-
-
*1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency
range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation
characteristics of components must be carefully evaluated.
*2. It becomes WF5052Hxx in case of the wafer form and CF5052Hxx in case of the chip form.
ORDERING INFORMATION
Device
Package
WF5052Hxx-5
Wafer form
CF5052Hxx-5
Chip form
Version name
WF5052H□□-5
Form WF : Wafer form
CF : Chip(Die) form
Frequency divider function/Oscillation frequency range
PAD layout A: for Flip Chip Bonding
B: for Wire Bonding (Type I)
C: for Wire Bonding (Type II)
SEIKO NPC CORPORATION - 1
5052H series
PAD LAYOUT
▪ WF5052HAx
(for Flip Chip Bonding)
▪ CF5052HBx
(for Wire Bonding (Type I))
Y
INHN
(-300,-285)
5
4
(0,0)
6
3
1
2
XT
XTN
(300,285)
(300,285)
(300,285)
VSS
▪ CF5052HCx
(for Wire Bonding (Type II))
5
Q
Q
VDD
Y
VDD
4
(0,0)
6
(-300,-285)
INHN
3
1
2
XTN
XT
VDD
VSS
Y
INHN
5
4
(0,0)
6
XT
X
X
VSS
2
1
(-300,-285)
3
Q
XTN
X
Chip size : 0.60x0.57mm
Chip size : 0.60x0.57mm
Chip size : 0.60x0.57mm
Chip thickness : 100μm
Chip thickness : 100μm
Chip thickness : 100μm
PAD size : 80μm
PAD size : 80μm
PAD size : 80μm
Chip base : VSS level
Chip base : VSS level
Chip base : VSS level
· Coordinates at the chip center are (0,0).
PAD COORDINATES
PAD
No.
PIN DESCRIPTION
PAD coordinate[μm]
PAD No.
Pin
Function
X
Y
5052HAx
5052HBx
5052HCx
1
-145.2
-193.5
1
2
1
XT
2
145.2
-193.5
2
1
2
XTN
Crystal is connected between XT and XTN.
3
208.5
-1.1
3
6
5
VDD
(+)supply voltage
4
208.5
193.5
4
5
4
Q
5
-208.5
193.5
5
4
3
VSS
6
-208.5
-1.1
6
3
6
INHN
Crystal connection pins.
Output one of fOSC,fOSC/2,fOSC/4,fOSC/8,fOSC/16
(-)ground
Input pin controlled output state(oscillator stops when
LOW), Power-saving pull-up resistor built-in
BLOCK DIAGRAM
INHN
VRG
XT
RF
1
N
RD
CG
N=1,2,4,8,16
CD
CMOS
Q
VDD
VSS
XTN
SEIKO NPC CORPORATION - 2
5052H series
SPECIFICATIONS
Absolute Maximum Ratings
VSS=0V
Parameter
Symbol
Condition
Rating
Unit
-0.3 to +4.0
V
Input pins
-0.3 to VDD+0.3
V
-0.3 to VDD+0.3
V
±20
mA
150
°C
-65 to +150
°C
*1
VDD
Between VDD and VSS
*1*2
VIN
Supply voltage range
Input voltage range
*1*2
Output voltage range
VOUT
Output pins
Output current*3
IOUT
Q pin
Junction temperature*3
Tj
*4
Storage temperature range
TSTG
Chip form, Wafer form
*1. This parameter rating is the values that must never exceed even for a moment. This product may suffer breakdown if this parameter rating is exceeded.
Operation and characteristics are guaranteed only when the product is operated at recommended operating conditions.
*2. VDD is a VDD value of recommended operating conditions.
*3. Do not exceed the absolute maximum ratings. If they are exceeded, a characteristic and reliability will be degraded.
*4. When stored in nitrogen or vacuum atmosphere applied to IC itself only (excluding packaging materials).
Recommended Operating Conditions
VSS=0V
Parameter
Symbol
Oscillator frequency*1
fOSC
Output frequency
fOUT
Operating supply voltage
VDD
Input voltage
VIN
Operating temperature
Ta
Output load capacitance
CLOUT
Condition
Rating
MIN
TYP
MAX
Unit
5052Hx1 ~ Hx5 ver.
20
60
5052HxP ~ HxT ver.
40
80
VDD=1.60 to 3.63V
5052Hx1 ~ Hx5 ver.
1.25
60
CLOUT≤15pF
5052HxP ~ HxTver.
2.5
80
Between VDD and VSS*2
1.60
3.63
Input pins
VSS
VDD
V
-40
+125
°C
15
pF
VDD=1.60 to 3.63V
Q output
MHz
MHz
V
*1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency
range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation
characteristics of components must be carefully evaluated.
*2. Mount a ceramic chip capacitor that is larger than 0.01μF proximal to IC (within approximately 3mm) between VDD and VSS in order to obtain stable
operation of 5052H series. In addition, the wiring pattern between IC and capacitor should be as wide as possible.
Note. Since it may influence the reliability if it is used out of range of recommended operating conditions, this product should be used within this range.
SEIKO NPC CORPORATION - 3
5052H series
Electrical Characteristics
DC Characteristics (Hx1~Hx5 version)
VDD=1.60 to 3.63V, VSS=0V, Ta= -40 to +125°C unless otherwise noted.
Parameter
Symbol
Q pin
HIGH-level output voltage
Q pin
LOW-level output voltage
INHN pin
HIGH-level input voltage
INHN pin
LOW-level input voltage
Q pin
Output leakage current
*1
Current consumption
Condition
MIN
TYP
MAX
Unit
VOH
measurement circuit 3, IOH=-4mA
VDD-0.4
VDD
V
VOL
measurement circuit 3, IOL=4mA
0
0.4
V
VIH
measurement circuit 4
VIL
measurement circuit 4
IZ
measurement circuit 5,
INHN=“Low”
Q=VDD
5052Hx1(fOSC), measurement circuit 1,
no load, INHN=“OPEN”,
fOSC=48MHz, fOUT=48MHz
VDD=3.3V
1.4
2.8
VDD=2.5V
0.9
1.8
VDD=1.8V
0.7
1.4
5052Hx2(fOSC/2), measurement circuit 1,
no load, INHN=”OPEN”,
fOSC=48MHz, fOUT=24MHz
VDD=3.3V
1.2
2.4
VDD=2.5V
0.8
1.6
VDD=1.8V
0.6
1.2
5052Hx3(fOSC/4), measurement circuit 1,
no load, INHN=“OPEN”,
fOSC=48MHz, fOUT=12MHz
VDD=3.3V
1.0
2.0
VDD=2.5V
0.7
1.4
VDD=1.8V
0.5
1.0
5052Hx4(fOSC/8), measurement circuit 1,
no load, INHN=“OPEN”,
fOSC=48MHz, fOUT=6MHz
VDD=3.3V
1.0
2.0
VDD=2.5V
0.6
1.2
VDD=1.8V
0.5
1.0
5052Hx5(fOSC/16),measurement circuit 1, VDD=3.3V
no load, INHN=“OPEN”,
VDD=2.5V
fOSC=48MHz, fOUT=3MHz
VDD=1.8V
0.9
1.8
0.6
1.2
0.4
0.8
IDD
0.7VDD
V
0.3VDD
Q=VSS
10
-10
Ta=-40 to +85°C
10
Ta=-40 to +125°C
20
V
A
mA
mA
mA
mA
mA
Standby current
IST
Measurement circuit 1
INHN=“Low”
INHN pin
pull-up resistance
RPU1
Measurement circuit 6
0.8
3
24
M
RPU2
Measurement circuit 6
30
70
150
k
50
100
200
k
4.0
5.0
6.0
6.4
8.0
9.6
Oscillator feedback resistance
Oscillator capacitance
Rf
CG
CD
Design value (a monitor pattern on a wafer is tested),
Excluding parasitic capacitance.
A
pF
*1. The consumption current IDD(CLOUT) with a load capacitance(CLOUT) connected to the Q pin is given by the following equation, where IDD is the no-load
consumption current and fOUT is the output frequency.
IDD(CLOUT)[mA] = IDD[mA]+CLOUT[pF]×VDD[V]×fOUT[MHz]·10-3
SEIKO NPC CORPORATION - 4
5052H series
DC Characteristics (HxP~HxT version)
VDD=1.60 to 3.63V, VSS=0V, Ta= -40 to +125°C unless otherwise noted.
Parameter
Symbol
Q pin
HIGH-level output voltage
Q pin
LOW-level output voltage
INHN pin
HIGH-level input voltage
INHN pin
LOW-level input voltage
Q pin
Output leakage current
Condition
MIN
Current consumption
MAX
Unit
VOH
measurement circuit 3, IOH=-4mA
VDD-0.4
VDD
V
VOL
measurement circuit 3, IOL=4mA
0
0.4
V
VIH
measurement circuit 4
VIL
measurement circuit 4
IZ
measurement circuit 5,
INHN=“Low”
0.7VDD
IDD
V
0.3VDD
Q=VDD
Q=VSS
10
-10
VDD=3.3V
2.4
4.8
VDD=2.5V
1.7
3.4
VDD=1.8V
1.3
2.6
5052HxQ(fOSC/2), measurement circuit 1, VDD=3.3V
no load, INHN=”OPEN”,
VDD=2.5V
fOSC=80MHz, fOUT=40MHz
VDD=1.8V
2.0
4.0
1.3
2.6
0.9
1.8
VDD=3.3V
1.7
3.4
VDD=2.5V
1.1
2.2
VDD=1.8V
0.8
1.6
VDD=3.3V
1.5
3.0
VDD=2.5V
0.9
1.8
VDD=1.8V
0.7
1.4
5052HxT(fOSC/16),measurement circuit 1, VDD=3.3V
no load, INHN=“OPEN”,
VDD=2.5V
fOSC=80MHz, fOUT=5MHz
VDD=1.8V
1.4
2.8
0.9
1.8
0.7
1.4
5052HxP(fOSC), measurement circuit 1,
no load, INHN=“OPEN”,
fOSC=80MHz, fOUT=80MHz
*1
TYP
5052HxR(fOSC/4), measurement circuit 1,
no load, INHN=“OPEN”,
fOSC=80MHz, fOUT=20MHz
5052HxS(fOSC/8), measurement circuit 1,
no load, INHN=“OPEN”,
fOSC=80MHz, fOUT=10MHz
Ta=-40 to +85°C
10
Ta=-40 to +125°C
20
V
A
mA
mA
mA
mA
mA
Standby current
IST
Measurement circuit 1
INHN=“Low”
INHN pin
pull-up resistance
RPU1
Measurement circuit 6
0.8
3
24
M
RPU2
Measurement circuit 6
30
70
150
k
50
100
200
k
1.6
2.0
2.4
2.4
3.0
3.6
Oscillator feedback resistance
Oscillator capacitance
Rf
CG
CD
Design value (a monitor pattern on a wafer is tested),
Excluding parasitic capacitance.
A
pF
*1. The consumption current IDD(CLOUT) with a load capacitance(CLOUT) connected to the Q pin is given by the following equation, where IDD is the no-load
consumption current and fOUT is the output frequency.
IDD(CLOUT)[mA] = IDD[mA]+CLOUT[pF]×VDD[V]×fOUT[MHz]·10-3
SEIKO NPC CORPORATION - 5
5052H series
AC Characteristics (Hx1~Hx5 version)
VDD = 1.60 to 3.63V, VSS = 0V, Ta = -40 to +125°C unless otherwise noted
Parameter
Q pin
Output rise time
Q pin
Output fall time
Q pin
Output duty cycle
Q pin
Output disable delay time
Condition
Symbol
MIN
TYP
MAX
5.0
Unit
tr1
Measurement circuit 1, CLOUT=15pF,
0.1VDD  0.9VDD, VDD=2.25 to 3.63V
1.5
tr2
Measurement circuit 1, CLOUT=15pF,
0.1VDD  0.9VDD, VDD=1.60 to 2.25V
2.0
6.0
tf1
Measurement circuit 1, CLOUT=15pF,
0.9VDD  0.1VDD, VDD=2.25 to 3.63V
1.5
5.0
tf2
Measurement circuit 1, CLOUT=15pF,
0.9VDD  0.1VDD, VDD=1.60 to 2.25V
2.0
6.0
50
55
%
200
ns
DUTY
tOD
Measurement circuit 1, Ta=25°C,
CLOUT=15pF, VDD=1.60 to 3.63V
ns
ns
45
Measurement circuit 2, Ta=25°C, CLOUT≤15pF
AC Characteristics (HxP~HxTversion)
VDD = 1.60 to 3.63V, VSS = 0V, Ta = -40 to +125°C unless otherwise noted
Parameter
Q pin
Output rise time
Q pin
Output fall time
Q pin
Output duty cycle
Q pin
Output disable delay time
Symbol
Condition
MIN
TYP
MAX
3.5
Unit
tr1
Measurement circuit 1, CLOUT=15pF,
0.1VDD  0.9VDD, VDD=2.25 to 3.63V
1.0
tr2
Measurement circuit 1, CLOUT=15pF,
0.1VDD  0.9VDD, VDD=1.60 to 2.25V
1.5
5.0
tf1
Measurement circuit 1, CLOUT=15pF,
0.9VDD  0.1VDD, VDD=2.25 to 3.63V
1.0
3.5
tf2
Measurement circuit 1, CLOUT=15pF,
0.9VDD  0.1VDD, VDD=1.60 to 2.25V
1.5
5.0
50
55
%
200
ns
DUTY
tOD
Measurement circuit 1, Ta=25°C,
CLOUT=15pF, VDD=1.60 to 3.63V
Measurement circuit 2, Ta=25°C, CLOUT≤15pF
ns
ns
45
SEIKO NPC CORPORATION - 6
5052H series
Timing chart
0.9VD D
0.9VDD
Q
0.1VD D
DUTY measurement
voltage 0.5VDD
DUTY = Tw/T×100 (%)
0.1VD D
Tw
T
tr
tf
Figure 1. Output switching waveform
VDD
VIH
INHN
VIL
VSS
tOD
VDD
0.1V
Q
0.5VDD
VSS
0.1V
fOUT
Hi-Z
Low
fOUT
When INHN goes HIGH to LOW, the Q output becomes high impedance.
When INHN goes LOW to HIGH, the Q output goes LOW once and then becomes normal output operation after having detected oscillation signals.
Figure 2. Output disable and oscillation start timing chart
SEIKO NPC CORPORATION - 7
5052H series
FUNCTIONAL DESCRIPTION
INHN Function
Q output is stopped and becomes high impedance.
INHN
Q
Oscillator
HIGH or Open
fOUT
Operating
LOW
Hi-Z
Stopped
Power Saving Pull-up Resistor
The INHN pin pull-up resistance changes its value to RPU1 or RPU2 in response to the input level (HIGH or LOW).
When INHN is tied to LOW level, the pull-up resistance becomes large (RPU1), thus reducing the current consumed by the resistance.
When INHN is left open circuit or tied to HIGH level, the pull-up resistance becomes small (RPU2), thus internal circuit of INHN becomes
HIGH level.
Consequently, the IC is less susceptible to the effects of noise, helping to avoid problems such as the output stopping suddenly.
Oscillation Detection Function
The 5052H series have an oscillation detection circuit.
The oscillation detection circuit disables the output until crystal oscillation becomes stable when oscillation circuit starts up. This function
avoids the abnormal oscillation in the initial power up and in a reactivation by INHN.
SEIKO NPC CORPORATION - 8
5052H series
MEASUREMENT CIRCUITS
MEASUREMENT CIRCUIT 1
Measurement Parameter : IDD, IST, DUTY tr, tf
A
*AC characteristics observed on the Q pin
using an oscilloscope.
IDD,IST
VDD
0.1μF
SW1
XT
X'tal
Q
Parameter
SW1
SW2
IDD
OFF
OFF
IST
ON or OFF
ON
DUTY, tr, tf
ON
OFF
XTN
INHN
VSS
C LOUT
(Including probe capacitance)
SW2
MEASUREMENT CIRCUIT 2
Measurement Parameter : tOD
Input signal : 1Vp-p,sine wave
0.1μF
VDD
0.001μF
Signal
Generator
RL1=1kΩ
XTN
Q
50Ω
INHN
CLOUT
VSS
Function
Generator
RL2=1kΩ
(Including probe capacitance)
50Ω
Input signal ：VDD→VSS
MEASUREMENT CIRCUIT 3
Measurement Parameter : VOH ,VOL
0.1μF
VDD
50Ω
Q
0.001μF
Signal
Generator
XTN
50Ω
VOH
VOL
VSS
0.1μF
V
VS
XTN input signal : 1Vp-p,sine wave
Q
ΔV
VS adjusted so that ΔV=50×IOH
VOH
VS
Q
ΔV
VS
VOL
VS adjusted so that ΔV=50×IOL
SEIKO NPC CORPORATION - 9
5052H series
MEASUREMENT CIRCUIT 4
Measurement Parameter : VIH, VIL
VDD
0.1μF
XT
Q
X'tal
XTN
VSS
INHN
VIH,
VIL
V
VIH: VSS→VDD voltage that changes output state
VIL: VDD→VSS voltage that changes output state
MEASUREMENT CIRCUIT 5
Measurement Parameter : IZ
VDD
0.1μF
Q
IZ
VSS
INHN
VDD
or
VSS
A
MEASUREMENT CIRCUIT 6
Measurement Parameter : RPU1, RPU2
VDD
0.1μF
VSS
INHN
VIN
V
A
IPU
RPU1 = VDD (VIN = 0V)
IPU
RPU2 = VDD
0.7VDD
IPU
(VIN = 0.7VDD)
SEIKO NPC CORPORATION - 10
5052H series
REFERENCE DATA
The following characteristics are measured using the crystal below. Note that the characteristics will vary with the crystal used.
Crystal used for measurement
Crystal parameters
Parameter
40MHz
48MHz
80MHz
C0(pF)
1.4
1.8
3.2
R1(Ω)
8
7
13
L1
C1
R1
C0
4.0
4.0
3.5
3.5
3.0
3.0
2.5
2.5
IDD [mA]
IDD [mA]
Current Consumption
2.0
1.5
2.0
1.5
1.0
1.0
0.5
0.5
0.0
0.0
1.5
2.0
2.5
VDD [V]
3.0
3.5
4.0
1.5
5052Hx1, fOSC=48MHz, Ta=25C, no load
2.0
2.5
VDD [V]
3.0
3.5
4.0
5052HxP, fOSC=80MHz, Ta=25C, no load
Negative Resistance
0
Negative Resistance [Ω]
Negative Resistance [Ω]
0
-500
-1000
C0: 2pF
C0: 1pF
-1500
C0: none
-2000
-500
-1000
C0: 2pF
-1500
C0: 1pF
C0: none
-2000
10
20
30
40
Frequency [MHz]
50
60
5052Hx1, VDD=3.3V, Ta=25C
Measurement equipment: Agilent Impedance analyzer 4396B
20
30
40
50
60
Frequency [MHz]
70
80
5052HxP, VDD=3.3V, Ta=25C
The figures show the measurement result of the crystal equivalent circuit C0 capacitance, connected between the XT and XTN pins.
They were performed with Agilent 4396B using the NPC test jig.
They may vary in a measurement jig, and measurement environment.
SEIKO NPC CORPORATION - 11
5052H series
Frequency Deviation by Voltage
1.0
Frequency deviation [ppm]]
Frequency deviation [ppm]]
1.0
0.5
0.0
-0.5
-1.0
0.5
0.0
-0.5
-1.0
1.5
2.0
2.5
3.0
VDD[V]
3.5
4.0
1.5
5052Hx1, fOSC=40MHz, Ta=25C, 2.5V std.
2.0
2.5
3.0
VDD[V]
3.5
4.0
5052HxP, fOSC=80MHz, Ta=25C, 2.5V std.
Drive Level
80
80
Drive Level [μW]]
100
Drive Level [μW]]
100
60
40
20
0
60
40
20
0
1.5
2.0
2.5
3.0
VDD [V]
3.5
4.0
1.5
5052Hx1, fOSC=40MHz, Ta=25C
2.0
2.5
3.0
VDD [V]
3.5
4.0
5052HxP, fOSC=80MHz, Ta=25C
-60
-60
-80
-80
-100
-100
-120
-140
-160
-180
1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08
Offset Frequency [Hz]
5052Hx1, fOSC=40MHz, VDD=3.3V, Ta=25C
Measurement equipment: Signal Source Analyzer Agilent E5052B
Phase Noise [dBc/Hz]]
Phase Noise [dBc/Hz]]
Phase Noise
-120
-140
-160
-180
1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08
Offset Frequency [Hz]
5052HxP, fOSC=80MHz, VDD=3.3V, Ta=25C
SEIKO NPC CORPORATION - 12
5052H series
Output Waveform
550mV
5.00ns
5052Hx1 version, VDD=3.3V, fOUT=40MHz, CLOUT=15pF, Ta: Room temperature
550mV
2.50ns
5052HxP version, VDD=3.3V, fOUT=80MHz, CLOUT=15pF, Ta: Room temperature
Measurement equipment: Oscilloscope Agilent DSO80604B
SEIKO NPC CORPORATION - 13
5052H series
Please pay your attention to the following points at time of using the products shown in this document.
1. The products shown in this document (hereinafter ”Products”) are designed and manufactured to the generally accepted standards of
reliability as expected for use in general electronic and electrical equipment, such as personal equipment, machine tools and
measurement equipment. The Products are not designed and manufactured to be used in any other special equipment requiring
extremely high level of reliability and safety, such as aerospace equipment, nuclear power control equipment, medical equipment,
transportation equipment, disaster prevention equipment, security equipment. The Products are not designed and manufactured to be
used for the apparatus that exerts harmful influence on the human lives due to the defects, failure or malfunction of the Products.
If you wish to use the Products in that apparatus, please contact our sales section in advance.
In the event that the Products are used in such apparatus without our prior approval, we assume no responsibility whatsoever for any
damages resulting from the use of that apparatus.
2. NPC reserves the right to change the specifications of the Products in order to improve the characteristics or reliability thereof.
3. The information described in this document is presented only as a guide for using the Products. No responsibility is assumed by us for any
infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise
under any patents or other rights of the third parties. Then, we assume no responsibility whatsoever for any damages resulting from that
infringements.
4. The constant of each circuit shown in this document is described as an example, and it is not guaranteed about its value of the mass
production products.
5. In the case of that the Products in this document falls under the foreign exchange and foreign trade control law or other applicable laws and
regulations, approval of the export to be based on those laws and regulations are necessary. Customers are requested appropriately take
steps to obtain required permissions or approvals from appropriate government agencies.
SEIKO NPC CORPORATION
1-9-9, Hatchobori, Chuo-ku,
Tokyo 104-0032, Japan
Telephone: +81-3-5541-6501
Facsimile: +81-3-5541-6510
http://www.npc.co.jp/
Email:[email protected]
ND12015-E-00 2012.07
SEIKO NPC CORPORATION - 14