AOS Semiconductor
Product Reliability Report
AOZ1016AI/1017AI/1015AI/1019AI/1075AI/1081AI/
1017DI/1094DI, rev 8
Plastic Encapsulated Device
ALPHA & OMEGA Semiconductor, Inc
495 Mercury Drive
Sunnyvale, CA 94085
U.S.
Tel: (408)830-9742
www.aosmd.com
October 10, 2008
This AOS product reliability report summarizes the qualification result for AOZ1016AI/1017AI/1015AI/1019AI/
1075AI/1081AI/1017DI/1094DI.
Review of the electrical test results confirmed that
AOZ1016AI/1017AI/1015AI/1019AI/1075AI/1081AI/1017DI/1094DI pass AOS quality and reliability
requirements for final product and package release.
Table of Contents:
I.
II.
III.
IV.
V.
VI.
Product Description
Package and Die information
Qualification Test Requirements
Qualification Tests Result
Reliability Evaluation
Quality Assurance Information
I. Product Description:
The AOZ1016AI is a high frequency 2A buck regulator with internal Schottky diode. AOZ1017AI is a 3A buck regulator
and AOZ1017DI is a 4A buck regulator with external Schottky diode. AOZ1015AI is a 1.5A buck regulator with internal
Schottky diode. AOZ1019AI is a 2A buck regulator with external Schottky diode. AOZ1075AI is a 1.2A buck regulator
with internal Schottky diode. AOZ1081AI is a 1.8A buck regulator with internal Schottky diode. AOZ1094DI is a 5A
buck regulator with external Schottky diode. These products are offered in a SO-8 or 5x4DFN-8 package and are
rated over a -40°C to +85°C ambient temperature range.
Absolute Maximum Ratings
Parameter
Supply Voltage (V )
18V
IN
LX, EN to AGND
V +0.3V
IN
FB, COMP to AGND
Storage Temperature (TS)
Operating Junction Temperature (TJ)
Thermal Characteristics
Package Thermal Resistance (R )
ΘJA
6V
-65°C to +150°C
+150°C
87°C/W
II. Package and Die Information:
Product ID
Process
Package Type
Die Size
L/F material
Die attach material
Bond wire
Mold Material
AOZ1016AI/1017AI/1015AI/1019AI/1075AI/1081AI (AOZ1017DI/1094DI)
0.5um 5/18V 2P2M process
SO-8 (5x4DFN-8)
1532 x 970 um
A194FH
2
84-3J epoxy (IC), 84-1LMISR4 (Discrete)
Au, 1-mil/2-mil
MP8000CH4 or G700HC
III. Qualification Tests Requirements
•
•
•
•
•
•
2 lots of AOZ1016AI up to 500 hrs of Burn-In for new product final release.
AOZ1015AI/1017AI/1019AI/1075AI are either same IC die as AOZ1016AI or minor metal change from
AOZ1016AI and can be qualified by extension.
1 lot of AOZ1081AI up to 500 hrs of Burn-In for new product final release.
1 lot of AOZ1094DI 168 hrs of Burn-In for new product final release.
Waive package stress test as lead-frames for AOZ1016AI/1017AI/1015AI are the same as AOZ1010AI and
can be qual’d by extension. Lead-frame for AOZ1019AI is the same as AOZ1300AI and can be qual’d by
extension.
2 lots of AOZ1014DIL, 250 temperature cycles and 96 hrs Pressure Pot for 5x4DFN-8 package release.
IV. Qualification Tests Result
Test Item
Test Condition
Sample
Size
HTOL
Per JESD 22-A108-B
V =16V
3 lots
pass
One AOZ1016AI lot (BD004), 120
units passed HTOL 500 hrs test.
One AOZ1016AI lot (BD006), 60 units
passed HTOL 500 hrs test.
One AOZ1081AI lot (BA001), 60 units
passed HTOL 500 hrs test.
One AOZ1094DI lot (ZA8V11), 60
units passed HTOL 168 hrs test.
3 units
pass
3 units (BD008) AOZ1016AI passed
2KV HBM, 3 units (BD008)
AOZ1016AI passed 200V MM.
3 units (BD011) AOZ1017AI passed
2KV HBM, 3 units (BD011)
AOZ1017AI passed 200V MM.
3 units (BD004) AOZ1015AI passed
2KV HBM, 3 units (BD004)
AOZ1015AI passed 200V MM.
3 units (BD003) AOZ1019AI passed
2KV HBM. 3 units (BD003)
AOZ1019AI passed 200V MM.
3 units (BD002) AOZ1075AI passed
2KV HBM, 3 units (BD002)
AOZ1075AI passed 200V MM.
3 units (BA001) AOZ1081AI passed
2KV HBM, 3 units (BA001)
AOZ1081AI passed 200V MM.
3 units (ZA8T11) AOZ1017DI passed
2KV HBM, 3 units (ZA8T11)
AOZ1017DI passed 200V MM.
3 units (ZA8V11) AOZ1094DI passed
2KV HBM, 3 units (ZA8V11)
AOZ1094DI passed 200V MM.
pass
5 units (BD003) AOZ1016AI passed
latch-up test. 5 units (BD009)
AOZ1017AI passed latch-up test.
IN
Result
0
Tj = 125 C
ESD (HBM, MM)
Latch-up
Per JESD 22-A114,
JESD 22-A115-A,
JESD 22-C101-C
each
mode
Per JESD 78A
10 units
Comment
SO-8 Package Qualification Data (qual by extension using AOZ1010AI data)
Per JESD 22-A113
pass
One AOZ1010A lot (FA7C8), 170 units
3 lots
Pre-Conditioning
0
and 2 other AOZ1010A lots (F857N
and F856K), 144 units each, passed
preconditioning.
85C /85%RH, 3 cyc
0
reflow@260 C
0
HAST
130 +/- 2 C, 85%RH,
33.3 psi, at VCC min
power dissipation
Temperature
Cycle
-65 C to +150 C, air
to air (2cyc/hr)
Pressure Pot
121 C, 15+/-1 PSIG,
RH= 100%
0
0
0
1 lot (60
/lot)
pass
One AOZ1010A lot (FA7C8), 60 units,
passed.
(Only one lot of data is available but
there are many SO8 package qual.
HAST data available from discrete
FET for reference. (e.g.
AO4403/4413/4912/4446/4610/4800/48
18 etc.)
1 lot (55
/lot)
2 lots
(77 /lot)
1 lot (55
/lot)
2 lots
(77 /lot)
pass
One AOZ1010A lot (FA7C8), 55 units
and 2 other AOZ1010A lots (F857N
and F856K), 77 units each, passed
TC 500 hrs.
pass
One AOZ1010A lot (FA7C8), 55 units
and 2 other AOZ1010A lots (F857N
and F856K), 77 units each, passed
PCT 96 hrs.
2 lots
pass
Two AOZ1014DIL lots (BA003,
BA004), 82 units each, passed
preconditioning.
2 lots
pass
Two AOZ1014DIL lots (BA003,
BA004), 82 units each, passed 250
temperature cycles.
2 lots
pass
Two AOZ1014DIL lots (BA003,
BA004), 82 units each, passed 96 hrs
Pressure Pot.
5x4DFN-8 Package Qualification Data
Pre-Conditioning
Per JESD 22-A113
0
85C /85%RH, 3 cyc
0
reflow@260 C
V.
0
0
Temperature
Cycle
-65 C to +150 C, air
to air (2cyc/hr)
Pressure Pot
121 C, 15+/-1 PSIG,
RH= 100%
0
Reliability Evaluation
The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in sample size of the
product. Failure Rate Determination is based on JEDEC Standard JESD 85. FIT means one failure per billion hours.
FIT rate (per billion): 18
MTBF = 6342 years
The failure rate (λ) is calculated as follows:
λ = (χ2[CL,(2f+2)] /2)x(1/SS x t x AF) ……..[eqn 1] where CL = % of confidence level
f = number of failure
SS = sample size
t = stress time
Looking up the χ2 /2 table for zero failure (in HTOL) with 60% confidence, the value of (χ2[CL,(2f+2)] /2) is 0.92.
The Acceleration Factor (AF) is calculated from the following formula:
AF = exp{(Ea/k) x [1/T0-1/Ts]}
where Ea = activation energy
k = Boltzman constant
T0 = operating TJ
Ts = stress TJ
Taking the result of HTOL with SS (Total of 9 lots, 2 lots AOZ1010, 2 lots AOZ1014, 2 lots AOZ1016, 2 lots AOZ1020
and 1 lot AOZ1021) = 634 and t = 500 hr. and assuming under typical operating environment, T0 = 55°C; Ea = 0.7eV
and Ts = 140°C
AF = exp {(0.7/8.617x10-5) x [1/(273+55)-1/(273+140)]} = 164
Substituting the values in equation 1, we have
λ = 0.92 x {1/(634 x 500 x 164)} = 1.77E-8 hr -1 or 18 FIT [MTBF = (1000/ λ) million hrs.]
The calculation shows that under typical operating environment, the device failure rate is less than 18 FIT or an MTBF
of over 55.56 million hours.
The qualification test results confirm that AOZ1016AI/1017AI/1015AI/1019AI/1075AI/1081AI/1017DI/1094DI
passed AOS quality and reliability requirements for product manufacturing release.
VI.
Quality Assurance Information
Acceptable Quality Level for outgoing inspection: 0.1 % for electrical and visual. Guaranteed Outgoing
Defect Rate: < 50 ppm
Quality Sample Plan: conform to Mil-Std -105D